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G01R 1/00
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Details of instruments or arrangements of the types covered by groups or |
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G01R 1/02
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General constructional details |
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G01R 1/04
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HousingsSupporting membersArrangements of terminals |
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G01R 1/06
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Measuring leadsMeasuring probes |
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G01R 1/07
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Non contact-making probes |
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G01R 1/08
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PointersScales Scale illumination |
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G01R 1/10
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Arrangements of bearings |
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G01R 1/12
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Arrangements of bearings of strip or wire bearings |
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G01R 1/14
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Braking arrangementsDamping arrangements |
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G01R 1/16
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Magnets |
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G01R 1/18
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Screening arrangements against electric or magnetic fields, e.g. against earth's field |
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G01R 1/20
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Modifications of basic electric elements for use in electric measuring instrumentsStructural combinations of such elements with such instruments |
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G01R 1/22
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Tong testers acting as secondary windings of current transformers |
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G01R 1/24
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Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section |
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G01R 1/26
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Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section with linear movement of probe |
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G01R 1/28
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Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform |
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G01R 1/30
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Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier |
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G01R 1/36
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Overload-protection arrangements or circuits for electric measuring instruments |
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G01R 1/38
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Arrangements for altering the indicating characteristic, e.g. by modifying the air gap |
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G01R 1/40
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Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer |
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G01R 1/42
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Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer thermally operated |
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G01R 1/44
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Modifications of instruments for temperature compensation |
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G01R 1/067
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Measuring probes |
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G01R 1/073
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Multiple probes |
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G01R 3/00
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Apparatus or processes specially adapted for the manufacture of measuring instruments |
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G01R 5/00
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Instruments for converting a single current or a single voltage into a mechanical displacement |
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G01R 5/02
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Moving-coil instruments |
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G01R 5/04
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Moving-coil instruments with magnet external to the coil |
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G01R 5/06
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Moving-coil instruments with core magnet |
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G01R 5/08
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Moving-coil instruments specially adapted for wide angle deflectionMoving-coil instruments with eccentrically-pivoted moving coil |
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G01R 5/10
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String galvanometers |
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G01R 5/12
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Loop galvanometers |
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G01R 5/14
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Moving-iron instruments |
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G01R 5/16
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Moving-iron instruments with pivoting magnet |
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G01R 5/18
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Moving-iron instruments with pivoting soft iron, e.g. needle galvanometer |
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G01R 5/20
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Induction instruments e.g. Ferraris instruments |
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G01R 5/22
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Thermoelectric instruments |
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G01R 5/24
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Thermoelectric instruments operated by elongation of a strip or wire or by expansion of a gas or fluid |
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G01R 5/26
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Thermoelectric instruments operated by deformation of a bimetallic element |
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G01R 5/28
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Electrostatic instruments |
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G01R 5/30
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Leaf electrometers |
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G01R 5/32
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Wire electrometersNeedle electrometers |
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G01R 5/34
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Quadrant electrometers |
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G01R 7/00
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement |
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G01R 7/02
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a sum or a difference |
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G01R 7/04
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient |
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G01R 7/06
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-iron type |
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G01R 7/08
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-coil type, e.g. crossed-coil type |
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G01R 7/10
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-coil type, e.g. crossed-coil type having more than two moving coils |
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G01R 7/12
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product |
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G01R 7/14
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product moving-iron type |
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G01R 7/16
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Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product having both fixed and moving coils, i.e. dynamometers |
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G01R 7/18
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product having both fixed and moving coils, i.e. dynamometers with iron core magnetically coupling fixed and moving coils |
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G01R 9/00
|
Instruments employing mechanical resonance |
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G01R 9/02
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Vibration galvanometers, e.g. for measuring current |
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G01R 9/04
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Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency |
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G01R 9/06
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Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency magnetically driven |
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G01R 9/08
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Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency piezoelectrically driven |
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G01R 11/00
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Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption |
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G01R 11/02
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Constructional details |
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G01R 11/04
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HousingsSupporting racksArrangements of terminals |
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G01R 11/06
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Magnetic circuits of induction meters |
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G01R 11/09
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Disc armatures |
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G01R 11/10
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Braking magnetsDamping arrangements |
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G01R 11/12
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Arrangements of bearings |
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G01R 11/14
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Arrangements of bearings with magnetic relief |
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G01R 11/16
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Adaptations of counters to electricity meters |
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G01R 11/17
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Compensating for errorsAdjusting or regulating means therefor |
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G01R 11/18
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Compensating for variations in ambient conditions |
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G01R 11/19
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Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters |
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G01R 11/20
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Compensating for phase errors in induction meters |
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G01R 11/21
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Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range |
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G01R 11/22
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Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques |
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G01R 11/23
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Compensating for errors caused by friction, e.g. adjustment in the light-load range |
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G01R 11/24
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Arrangements for avoiding or indicating fraudulent use |
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G01R 11/25
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Arrangements for indicating or signalling faults |
|
G01R 11/30
|
Dynamo-electric motor meters |
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G01R 11/32
|
Watt-hour meters |
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G01R 11/34
|
Ampère-hour meters |
|
G01R 11/36
|
Induction meters, e.g. Ferraris meters |
|
G01R 11/38
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Induction meters, e.g. Ferraris meters for single-phase operation |
|
G01R 11/40
|
Induction meters, e.g. Ferraris meters for polyphase operation |
|
G01R 11/42
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Circuitry therefor |
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G01R 11/46
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Electrically-operated clockwork metersOscillatory metersPendulum meters |
|
G01R 11/48
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Meters specially adapted for measuring real or reactive componentsMeters specially adapted for measuring apparent energy |
|
G01R 11/50
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Meters specially adapted for measuring real or reactive componentsMeters specially adapted for measuring apparent energy for measuring real component |
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G01R 11/52
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Meters specially adapted for measuring real or reactive componentsMeters specially adapted for measuring apparent energy for measuring reactive component |
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G01R 11/54
|
Meters specially adapted for measuring real or reactive componentsMeters specially adapted for measuring apparent energy for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy |
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G01R 11/56
|
Special tariff meters |
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G01R 11/57
|
Multi-rate meters |
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G01R 11/58
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Tariff-switching devices therefor |
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G01R 11/60
|
Subtraction metersMeters measuring maximum or minimum-load hours |
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G01R 11/63
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Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded |
|
G01R 11/64
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Maximum meters, e.g. tariff for a period is based on maximum demand within that period |
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G01R 11/66
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Circuitry |
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G01R 11/067
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Coils therefor |
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G01R 11/073
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Armatures therefor |
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G01R 11/185
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Temperature compensation |
|
G01R 13/00
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Arrangements for displaying electric variables or waveforms |
|
G01R 13/02
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Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form |
|
G01R 13/04
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Arrangements for displaying electric variables or waveforms for producing permanent records |
|
G01R 13/06
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Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium |
|
G01R 13/08
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Electromechanical recording system using a mechanical direct-writing method |
|
G01R 13/10
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Electromechanical recording system using a mechanical direct-writing method with intermittent recording by representing the variable by the length of a stroke or by the position of a dot |
|
G01R 13/12
|
Chemical recording, e.g. clydonographs |
|
G01R 13/14
|
Recording on a light-sensitive material |
|
G01R 13/16
|
Recording on a magnetic medium |
|
G01R 13/18
|
Recording on a magnetic medium using boundary displacement |
|
G01R 13/20
|
Cathode-ray oscilloscopes |
|
G01R 13/22
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Circuits therefor |
|
G01R 13/24
|
Time-base deflection circuits |
|
G01R 13/26
|
Circuits for controlling the intensity of the electron beam |
|
G01R 13/28
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Circuits for simultaneous or sequential presentation of more than one variable |
|
G01R 13/30
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Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking |
|
G01R 13/32
|
Circuits for displaying non-recurrent functions such as transientsCircuits for triggeringCircuits for synchronisationCircuits for time-base expansion |
|
G01R 13/34
|
Circuits for representing a single waveform by sampling, e.g. for very high frequencies |
|
G01R 13/36
|
Arrangements for displaying electric variables or waveforms using length of glow discharge, e.g. glowlight oscilloscopes |
|
G01R 13/38
|
Arrangements for displaying electric variables or waveforms using the steady or oscillatory displacement of a light beam by an electromechanical measuring system |
|
G01R 13/40
|
Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect |
|
G01R 13/42
|
Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark |
|
G01R 15/00
|
Details of measuring arrangements of the types provided for in groups , or |
|
G01R 15/04
|
Voltage dividers |
|
G01R 15/06
|
Voltage dividers having reactive components, e.g. capacitive transformer |
|
G01R 15/08
|
Circuits for altering the measuring range |
|
G01R 15/09
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Autoranging circuits |
|
G01R 15/12
|
Circuits for multi-testers, e.g. for measuring voltage, current, or impedance at will |
|
G01R 15/14
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks |
|
G01R 15/16
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices |
|
G01R 15/18
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers |
|
G01R 15/20
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices |
|
G01R 15/22
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers |
|
G01R 15/24
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices |
|
G01R 15/26
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using modulation of waves other than light, e.g. radio or acoustic waves |
|
G01R 17/00
|
Measuring arrangements involving comparison with a reference value, e.g. bridge |
|
G01R 17/02
|
Arrangements in which the value to be measured is automatically compared with a reference value |
|
G01R 17/04
|
Arrangements in which the value to be measured is automatically compared with a reference value in which the reference value is continuously or periodically swept over the range of values to be measured |
|
G01R 17/06
|
Automatic balancing arrangements |
|
G01R 17/08
|
Automatic balancing arrangements in which a force or torque representing the measured value is balanced by a force or torque representing the reference value |
|
G01R 17/10
|
AC or DC measuring bridges |
|
G01R 17/12
|
AC or DC measuring bridges using comparison of currents, e.g. bridges with differential current output |
|
G01R 17/14
|
AC or DC measuring bridges with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge |
|
G01R 17/16
|
AC or DC measuring bridges with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier |
|
G01R 17/18
|
AC or DC measuring bridges with more than four branches |
|
G01R 17/20
|
AC or DC potentiometric measuring arrangements |
|
G01R 17/22
|
AC or DC potentiometric measuring arrangements with indication of measured value by calibrated null indicator |
|
G01R 19/00
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof |
|
G01R 19/02
|
Measuring effective values, i.e. root-mean-square values |
|
G01R 19/03
|
Measuring effective values, i.e. root-mean-square values using thermoconverters |
|
G01R 19/04
|
Measuring peak values of AC or of pulses |
|
G01R 19/06
|
Measuring real componentMeasuring reactive component |
|
G01R 19/08
|
Measuring current density |
|
G01R 19/10
|
Measuring sum, difference, or ratio |
|
G01R 19/12
|
Measuring rate of change |
|
G01R 19/14
|
Indicating direction of currentIndicating polarity of voltage |
|
G01R 19/15
|
Indicating the presence of current |
|
G01R 19/17
|
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values giving an indication of the number of times this occurs |
|
G01R 19/18
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of DC into AC, e.g. with choppers |
|
G01R 19/20
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of DC into AC, e.g. with choppers using transductors |
|
G01R 19/22
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of AC into DC |
|
G01R 19/25
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques |
|
G01R 19/28
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof adapted for measuring in circuits having distributed constants |
|
G01R 19/30
|
Measuring the maximum or the minimum value of current or voltage reached in a time interval |
|
G01R 19/32
|
Compensating for temperature change |
|
G01R 19/145
|
Indicating the presence of current or voltage |
|
G01R 19/155
|
Indicating the presence of voltage |
|
G01R 19/165
|
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values |
|
G01R 19/175
|
Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero |
|
G01R 19/252
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency |
|
G01R 19/255
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency |
|
G01R 19/257
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method |
|
G01R 21/00
|
Arrangements for measuring electric power or power factor |
|
G01R 21/01
|
Arrangements for measuring electric power or power factor in circuits having distributed constants |
|
G01R 21/02
|
Arrangements for measuring electric power or power factor by thermal methods |
|
G01R 21/04
|
Arrangements for measuring electric power or power factor by thermal methods in circuits having distributed constants |
|
G01R 21/06
|
Arrangements for measuring electric power or power factor by measuring current and voltage |
|
G01R 21/07
|
Arrangements for measuring electric power or power factor by measuring current and voltage in circuits having distributed constants |
|
G01R 21/08
|
Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices |
|
G01R 21/09
|
Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices in circuits having distributed constants |
|
G01R 21/10
|
Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance |
|
G01R 21/12
|
Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants |
|
G01R 21/14
|
Compensating for temperature change |
|
G01R 21/127
|
Arrangements for measuring electric power or power factor by using pulse modulation |
|
G01R 21/133
|
Arrangements for measuring electric power or power factor by using digital technique |
|
G01R 22/00
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters |
|
G01R 22/02
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electrolytic methods |
|
G01R 22/04
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by calorimetric methods |
|
G01R 22/06
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods |
|
G01R 22/08
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using analogue techniques |
|
G01R 22/10
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using digital techniques |
|
G01R 23/00
|
Arrangements for measuring frequenciesArrangements for analysing frequency spectra |
|
G01R 23/02
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage |
|
G01R 23/04
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage adapted for measuring in circuits having distributed constants |
|
G01R 23/06
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage |
|
G01R 23/07
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned on resonance, e.g. grid-drip meter |
|
G01R 23/08
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned off resonance |
|
G01R 23/09
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage |
|
G01R 23/10
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted |
|
G01R 23/12
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by converting frequency into phase shift |
|
G01R 23/14
|
Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by heterodyningArrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by beat-frequency comparison |
|
G01R 23/15
|
Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements |
|
G01R 23/16
|
Spectrum analysisFourier analysis |
|
G01R 23/17
|
Spectrum analysisFourier analysis with optical auxiliary devices |
|
G01R 23/18
|
Spectrum analysisFourier analysis with provision for recording frequency spectrum |
|
G01R 23/20
|
Measurement of non-linear distortion |
|
G01R 23/163
|
Spectrum analysisFourier analysis adapted for measuring in circuits having distributed constants |
|
G01R 23/165
|
Spectrum analysisFourier analysis using filters |
|
G01R 23/167
|
Spectrum analysisFourier analysis using filters with digital filters |
|
G01R 23/173
|
Wobbulating devices similar to swept panoramic receivers |
|
G01R 23/175
|
Spectrum analysisFourier analysis by delay means, e.g. tapped delay lines |
|
G01R 23/177
|
Analysis of very low frequencies |
|
G01R 25/00
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents |
|
G01R 25/02
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents in circuits having distributed constants |
|
G01R 25/04
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference |
|
G01R 25/06
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents employing quotient instrument |
|
G01R 25/08
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents by counting of standard pulses |
|
G01R 27/00
|
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom |
|
G01R 27/02
|
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant |
|
G01R 27/04
|
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants |
|
G01R 27/06
|
Measuring reflection coefficientsMeasuring standing-wave ratio |
|
G01R 27/08
|
Measuring resistance by measuring both voltage and current |
|
G01R 27/10
|
Measuring resistance by measuring both voltage and current using two-coil or crossed-coil instruments forming quotient |
|
G01R 27/12
|
Measuring resistance by measuring both voltage and current using two-coil or crossed-coil instruments forming quotient using hand generators, e.g. meggers |
|
G01R 27/14
|
Measuring resistance by measuring current or voltage obtained from a reference source |
|
G01R 27/16
|
Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line |
|
G01R 27/18
|
Measuring resistance to earth |
|
G01R 27/20
|
Measuring earth resistanceMeasuring contact resistance of earth connections, e.g. plates |
|
G01R 27/22
|
Measuring resistance of fluids |
|
G01R 27/26
|
Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants |
|
G01R 27/28
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response |
|
G01R 27/30
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response with provision for recording characteristics, e.g. by plotting Nyquist diagram |
|
G01R 27/32
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants |
|
G01R 29/00
|
Arrangements for measuring or indicating electric quantities not covered by groups |
|
G01R 29/02
|
Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration |
|
G01R 29/04
|
Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous valueMeasuring peak factor, i.e. quotient of maximum value and root-mean-square value |
|
G01R 29/06
|
Measuring depth of modulation |
|
G01R 29/08
|
Measuring electromagnetic field characteristics |
|
G01R 29/10
|
Radiation diagrams of antennas |
|
G01R 29/12
|
Measuring electrostatic fields |
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G01R 29/14
|
Measuring field distribution |
|
G01R 29/16
|
Measuring asymmetry of polyphase networks |
|
G01R 29/18
|
Indicating phase sequenceIndicating synchronism |
|
G01R 29/20
|
Measuring number of turnsMeasuring transformation ratio or coupling factor of windings |
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G01R 29/22
|
Measuring piezoelectric properties |
|
G01R 29/24
|
Arrangements for measuring quantities of charge |
|
G01R 29/26
|
Measuring noise figureMeasuring signal-to-noise ratio |
|
G01R 29/027
|
Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values |
|
G01R 29/033
|
Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values giving an indication of the number of times this occurs |
|
G01R 31/00
|
Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere |
|
G01R 31/01
|
Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass productionTesting objects at points as they pass through a testing station |
|
G01R 31/02
|
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection |
|
G01R 31/04
|
Testing connections, e.g. of plugs or non-disconnectable joints |
|
G01R 31/06
|
Testing of electric windings, e.g. for polarity |
|
G01R 31/07
|
Testing of fuses |
|
G01R 31/08
|
Locating faults in cables, transmission lines, or networks |
|
G01R 31/10
|
Locating faults in cables, transmission lines, or networks by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme |
|
G01R 31/11
|
Locating faults in cables, transmission lines, or networks using pulse-reflection methods |
|
G01R 31/12
|
Testing dielectric strength or breakdown voltage |
|
G01R 31/14
|
Circuits therefor |
|
G01R 31/16
|
Construction of testing vesselsElectrodes therefor |
|
G01R 31/18
|
Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production |
|
G01R 31/20
|
Preparation of articles or specimens to facilitate testing |
|
G01R 31/24
|
Testing of discharge tubes |
|
G01R 31/25
|
Testing of vacuum tubes |
|
G01R 31/26
|
Testing of individual semiconductor devices |
|
G01R 31/27
|
Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements |
|
G01R 31/28
|
Testing of electronic circuits, e.g. by signal tracer |
|
G01R 31/30
|
Marginal testing, e.g. by varying supply voltage |
|
G01R 31/34
|
Testing dynamo-electric machines |
|
G01R 31/36
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] |
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G01R 31/40
|
Testing power supplies |
|
G01R 31/42
|
AC power supplies |
|
G01R 31/44
|
Testing lamps |
|
G01R 31/50
|
Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections |
|
G01R 31/52
|
Testing for short-circuits, leakage current or ground faults |
|
G01R 31/54
|
Testing for continuity |
|
G01R 31/55
|
Testing for incorrect line connections |
|
G01R 31/56
|
Testing of electric apparatus |
|
G01R 31/58
|
Testing of lines, cables or conductors |
|
G01R 31/59
|
Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture |
|
G01R 31/60
|
Identification of wires in a multicore cable |
|
G01R 31/62
|
Testing of transformers |
|
G01R 31/64
|
Testing of capacitors |
|
G01R 31/66
|
Testing of connections, e.g. of plugs or non-disconnectable joints |
|
G01R 31/67
|
Testing the correctness of wire connections in electric apparatus or circuits |
|
G01R 31/68
|
Testing of releasable connections, e.g. of terminals mounted on a printed circuit board |
|
G01R 31/69
|
Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harnessTesting of releasable connections, e.g. of terminals mounted on a printed circuit board of plugsTesting of releasable connections, e.g. of terminals mounted on a printed circuit board of sockets, e.g. wall sockets or power sockets in appliances |
|
G01R 31/70
|
Testing of connections between components and printed circuit boards |
|
G01R 31/71
|
Testing of solder joints |
|
G01R 31/72
|
Testing of electric windings |
|
G01R 31/74
|
Testing of fuses |
|
G01R 31/265
|
Contactless testing |
|
G01R 31/302
|
Contactless testing |
|
G01R 31/303
|
Contactless testing of integrated circuits |
|
G01R 31/304
|
Contactless testing of printed or hybrid circuits |
|
G01R 31/305
|
Contactless testing using electron beams |
|
G01R 31/306
|
Contactless testing using electron beams of printed or hybrid circuits |
|
G01R 31/307
|
Contactless testing using electron beams of integrated circuits |
|
G01R 31/308
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation |
|
G01R 31/309
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits |
|
G01R 31/311
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits |
|
G01R 31/312
|
Contactless testing by capacitive methods |
|
G01R 31/315
|
Contactless testing by inductive methods |
|
G01R 31/316
|
Testing of analog circuits |
|
G01R 31/317
|
Testing of digital circuits |
|
G01R 31/319
|
Tester hardware, i.e. output processing circuits |
|
G01R 31/327
|
Testing of circuit interrupters, switches or circuit-breakers |
|
G01R 31/333
|
Testing of the switching capacity of high-voltage circuit-breakers |
|
G01R 31/364
|
Battery terminal connectors with integrated measuring arrangements |
|
G01R 31/367
|
Software therefor, e.g. for battery testing using modelling or look-up tables |
|
G01R 31/371
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with remote indication, e.g. on external chargers |
|
G01R 31/374
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with means for correcting the measurement for temperature or ageing |
|
G01R 31/378
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator |
|
G01R 31/379
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator for lead-acid batteries |
|
G01R 31/382
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC |
|
G01R 31/385
|
Arrangements for measuring battery or accumulator variables |
|
G01R 31/387
|
Determining ampere-hour charge capacity or SoC |
|
G01R 31/388
|
Determining ampere-hour charge capacity or SoC involving voltage measurements |
|
G01R 31/389
|
Measuring internal impedance, internal conductance or related variables |
|
G01R 31/392
|
Determining battery ageing or deterioration, e.g. state of health |
|
G01R 31/396
|
Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery |
|
G01R 31/3161
|
Marginal testing |
|
G01R 31/3163
|
Functional testing |
|
G01R 31/3167
|
Testing of combined analog and digital circuits |
|
G01R 31/3173
|
Marginal testing |
|
G01R 31/3177
|
Testing of logic operation, e.g. by logic analysers |
|
G01R 31/3181
|
Functional testing |
|
G01R 31/3183
|
Generation of test inputs, e.g. test vectors, patterns or sequences |
|
G01R 31/3185
|
Reconfiguring for testing, e.g. LSSD, partitioning |
|
G01R 31/3187
|
Built-in tests |
|
G01R 31/3193
|
Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response |
|
G01R 31/3828
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration |
|
G01R 31/3832
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration without measurement of battery voltage |
|
G01R 31/3835
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements |
|
G01R 31/3842
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements |
|
G01R 33/00
|
Arrangements or instruments for measuring magnetic variables |
|
G01R 33/02
|
Measuring direction or magnitude of magnetic fields or magnetic flux |
|
G01R 33/04
|
Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle |
|
G01R 33/05
|
Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle in thin-film element |
|
G01R 33/06
|
Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices |
|
G01R 33/07
|
Hall-effect devices |
|
G01R 33/09
|
Magneto-resistive devices |
|
G01R 33/10
|
Plotting field distribution |
|
G01R 33/12
|
Measuring magnetic properties of articles or specimens of solids or fluids |
|
G01R 33/14
|
Measuring or plotting hysteresis curves |
|
G01R 33/16
|
Measuring susceptibility |
|
G01R 33/18
|
Measuring magnetostrictive properties |
|
G01R 33/20
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance |
|
G01R 33/022
|
Measuring gradient |
|
G01R 33/24
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux |
|
G01R 33/025
|
Compensating stray fields |
|
G01R 33/26
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping |
|
G01R 33/028
|
Electrodynamic magnetometers |
|
G01R 33/30
|
Sample handling arrangements, e.g. sample cells, spinning mechanisms |
|
G01R 33/31
|
Temperature control thereof |
|
G01R 33/032
|
Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday |
|
G01R 33/34
|
Constructional details, e.g. resonators |
|
G01R 33/035
|
Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices |
|
G01R 33/36
|
Electrical details, e.g. matching or coupling of the coil to the receiver |
|
G01R 33/038
|
Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices |
|
G01R 33/42
|
Screening |
|
G01R 33/44
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR] |
|
G01R 33/46
|
NMR spectroscopy |
|
G01R 33/48
|
NMR imaging systems |
|
G01R 33/50
|
NMR imaging systems based on the determination of relaxation times |
|
G01R 33/54
|
Signal processing systems, e.g. using pulse sequences |
|
G01R 33/56
|
Image enhancement or correction, e.g. subtraction or averaging techniques |
|
G01R 33/58
|
Calibration of imaging systems, e.g. using test probes |
|
G01R 33/60
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance |
|
G01R 33/62
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using double resonance |
|
G01R 33/64
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using cyclotron resonance |
|
G01R 33/341
|
Constructional details, e.g. resonators comprising surface coils |
|
G01R 33/343
|
Constructional details, e.g. resonators of slotted-tube or loop-gap type |
|
G01R 33/345
|
Constructional details, e.g. resonators of waveguide type |
|
G01R 33/381
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets |
|
G01R 33/383
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using permanent magnets |
|
G01R 33/385
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using gradient magnetic field coils |
|
G01R 33/387
|
Compensation of inhomogeneities |
|
G01R 33/389
|
Field stabilisation |
|
G01R 33/421
|
Screening of main or gradient magnetic field |
|
G01R 33/422
|
Screening of the radiofrequency field |
|
G01R 33/465
|
NMR spectroscopy applied to biological material, e.g. in vitro testing |
|
G01R 33/483
|
NMR imaging systems with selection of signal or spectra from particular regions of the volume, e.g. in vivo spectroscopy |
|
G01R 33/485
|
NMR imaging systems with selection of signal or spectra from particular regions of the volume, e.g. in vivo spectroscopy based on chemical shift information |
|
G01R 33/561
|
Image enhancement or correction, e.g. subtraction or averaging techniques by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences |
|
G01R 33/563
|
Image enhancement or correction, e.g. subtraction or averaging techniques of moving material, e.g. flow-contrast angiography |
|
G01R 33/565
|
Correction of image distortions, e.g. due to magnetic field inhomogeneities |
|
G01R 33/567
|
Image enhancement or correction, e.g. subtraction or averaging techniques gated by physiological signals |
|
G01R 33/3415
|
Constructional details, e.g. resonators comprising surface coils comprising arrays of sub-coils |
|
G01R 33/3815
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets with superconducting coils, e.g. power supply therefor |
|
G01R 33/3873
|
Compensation of inhomogeneities using ferromagnetic bodies |
|
G01R 33/3875
|
Compensation of inhomogeneities using correction coil assemblies, e.g. active shimming |
|
G01R 35/00
|
Testing or calibrating of apparatus covered by the other groups of this subclass |
|
G01R 35/02
|
Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating |
|
G01R 35/04
|
Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current |
|
G01R 35/06
|
Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current by stroboscopic methods |
