- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/06 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
Patent holdings for IPC class G01B 15/06
Total number of patents in this class: 117
10-year publication summary
|
4
|
4
|
8
|
10
|
9
|
7
|
11
|
4
|
13
|
7
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| The Boeing Company | 20186 |
7 |
| NEC Corporation | 37168 |
5 |
| Pulstec Industrial Co., Ltd. | 9 |
5 |
| Huawei Technologies Co., Ltd. | 124115 |
4 |
| Centre National de La Recherche Scientifique | 11059 |
3 |
| Ecole Normale Superieure de Cachan | 68 |
3 |
| Lyten, Inc. | 359 |
3 |
| Saudi Arabian Oil Company | 14305 |
3 |
| ZTE Corporation | 44255 |
2 |
| Cidra Corporate Services, Inc. | 199 |
2 |
| Shanghai Jiao Tong University | 1376 |
2 |
| University of Massachusetts | 2324 |
2 |
| The University of Tokyo | 4378 |
2 |
| Orica International Pte Ltd | 200 |
2 |
| Iida Co., Ltd. | 9 |
2 |
| Hitachi High-Tech Corporation | 5918 |
2 |
| Synspective Inc. | 15 |
2 |
| Siemens AG | 23996 |
1 |
| Mitsubishi Heavy Industries, Ltd. | 9168 |
1 |
| Hitachi, Ltd. | 16163 |
1 |
| Other owners | 63 |