- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/06 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
Patent holdings for IPC class G01B 15/06
Total number of patents in this class: 96
10-year publication summary
5
|
4
|
4
|
8
|
10
|
9
|
7
|
10
|
4
|
0
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
The Boeing Company | 19915 |
7 |
NEC Corporation | 34467 |
5 |
Pulstec Industrial Co., Ltd. | 9 |
5 |
Centre National de La Recherche Scientifique | 10124 |
3 |
Ecole Normale Superieure de Cachan | 70 |
3 |
Texas Instruments Incorporated | 19447 |
2 |
Cidra Corporate Services, Inc. | 206 |
2 |
Lyten, Inc. | 288 |
2 |
Saudi Arabian Oil Company | 12481 |
2 |
University of Massachusetts | 2197 |
2 |
The University of Tokyo | 4066 |
2 |
Orica International Pte Ltd | 175 |
2 |
Iida Co., Ltd. | 9 |
2 |
Hitachi High-Tech Corporation | 5065 |
2 |
Synspective Inc. | 11 |
2 |
Siemens AG | 24568 |
1 |
Hitachi, Ltd. | 15239 |
1 |
Hitachi High-Technologies Corporation | 2018 |
1 |
Infineon Technologies AG | 8135 |
1 |
Nikon Corporation | 7119 |
1 |
Other owners | 48 |