- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 5/28 - Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
Patent holdings for IPC class G01B 5/28
Total number of patents in this class: 428
10-year publication summary
|
29
|
27
|
34
|
24
|
12
|
15
|
11
|
14
|
7
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Mitutoyo Corporation | 1248 |
35 |
| Tokyo Seimitsu Co., Ltd. | 387 |
18 |
| The Boeing Company | 20102 |
15 |
| Bruker Nano, Inc. | 358 |
14 |
| Carl Zeiss Industrielle Messtechnik GmbH | 441 |
6 |
| Carl Mahr Holding GmbH | 107 |
5 |
| JENOPTIK Industrial Metrology Germany GmbH | 14 |
5 |
| Renishaw plc | 773 |
5 |
| NEC Corporation | 36545 |
4 |
| Hitachi, Ltd. | 15862 |
4 |
| Agc, Inc. | 5253 |
4 |
| Columbia Insurance Company | 1493 |
3 |
| Sumitomo Electric Industries, Ltd. | 16050 |
3 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10975 |
3 |
| Boe Technology Group Co., Ltd. | 42839 |
3 |
| Acellent Technologies, Inc. | 35 |
3 |
| Fisher Controls International LLC | 1495 |
3 |
| Frito-Lay North America, Inc. | 1335 |
3 |
| Hysitron, Inc. | 34 |
3 |
| KLA-Tencor Corporation | 2524 |
3 |
| Other owners | 286 |