- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/025 - Double-exposure technique
Patent holdings for IPC class G01B 9/025
Total number of patents in this class: 3
10-year publication summary
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0
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1
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0
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0
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0
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0
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0
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0
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0
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0
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ONERA (Office National d'Etudes et de Recherches Aerospatiales) | 81 |
1 |
| Sentek Instrument LLC | 13 |
1 |
| Technical University of Denmark A/S | 1 |
1 |
| Other owners | 0 |