- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation
Patent holdings for IPC class G01N 21/3581
Total number of patents in this class: 875
10-year publication summary
|
55
|
61
|
94
|
87
|
91
|
69
|
73
|
59
|
40
|
28
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hamamatsu Photonics K.K. | 4704 |
30 |
| Canon Inc. | 44011 |
19 |
| Murata Manufacturing Co., Ltd. | 25785 |
18 |
| Panasonic Intellectual Property Management Co., Ltd. | 34145 |
17 |
| INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik | 30 |
13 |
| Hitachi High-Tech Corporation | 5903 |
13 |
| Sikora AG | 56 |
12 |
| Shenzhen Institute of Terahertz Technology and Innovation | 105 |
12 |
| Hitachi High-Technologies Corporation | 1987 |
10 |
| Helmut Fischer GmbH Institut fur Elektronik und Messtechnik | 167 |
10 |
| TeraView Limited | 29 |
10 |
| Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | 6119 |
10 |
| Samsung Electronics Co., Ltd. | 158337 |
9 |
| Rohm Co., Ltd. | 6846 |
9 |
| University of Shanghai for Science and Technology | 123 |
9 |
| CiTEX Holding GmbH | 43 |
9 |
| FEMTO Deployments Inc. | 17 |
9 |
| The Boeing Company | 20176 |
8 |
| NEC Corporation | 37135 |
8 |
| Texas Instruments Incorporated | 19636 |
8 |
| Other owners | 632 |