- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation
Patent holdings for IPC class G01N 21/3581
Total number of patents in this class: 822
10-year publication summary
|
66
|
55
|
61
|
94
|
87
|
91
|
69
|
72
|
57
|
19
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hamamatsu Photonics K.K. | 4419 |
27 |
| Murata Manufacturing Co., Ltd. | 24575 |
18 |
| Canon Inc. | 40015 |
17 |
| Panasonic Intellectual Property Management Co., Ltd. | 31515 |
17 |
| Sikora AG | 69 |
13 |
| INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik | 31 |
13 |
| Hitachi High-Tech Corporation | 5331 |
13 |
| Shenzhen Institute of Terahertz Technology and Innovation | 105 |
12 |
| Hitachi High-Technologies Corporation | 2003 |
10 |
| Helmut Fischer GmbH Institut fur Elektronik und Messtechnik | 165 |
10 |
| Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | 6112 |
10 |
| Advantest Corporation | 1809 |
9 |
| CiTEX Holding GmbH | 37 |
9 |
| Canon Kabushiki Kaisha | 7063 |
9 |
| FEMTO Deployments Inc. | 17 |
9 |
| NEC Corporation | 35734 |
8 |
| Texas Instruments Incorporated | 19448 |
8 |
| Pioneer Corporation | 4342 |
8 |
| Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. | 4943 |
8 |
| Institut National de La Recherche Scientifique | 256 |
8 |
| Other owners | 586 |