- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/02 - Multiple-type SPM, i.e. involving two or more SPM techniques
Patent holdings for IPC class G01Q 60/02
Total number of patents in this class: 16
10-year publication summary
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0
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1
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0
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0
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3
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0
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1
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0
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1
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0
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Massachusetts Institute of Technology | 10102 |
1 |
| Tsinghua University | 5951 |
1 |
| Empire Technology Development LLC | 1620 |
1 |
| Shimadzu Corporation | 6191 |
1 |
| CAMECA Instruments, Inc. | 18 |
1 |
| Chinese Academy of Inspection and Quarantine | 20 |
1 |
| IMEC VZW | 1654 |
1 |
| JPK Instruments AG | 20 |
1 |
| Technische Universitat Graz | 125 |
1 |
| Technische Universitat Wien | 385 |
1 |
| The University of North Carolina at Chapel Hill | 2052 |
1 |
| Paris Sciences et Lettres - Quartier Latin | 213 |
1 |
| Sorbonne Universite | 1303 |
1 |
| Centre National de La Recherche Scientifique (cnrs) | 3103 |
1 |
| Cest Kompetenzzentrum für Elektrochemische Oberflächentechnologie GmbH | 2 |
1 |
| Universite de Paris | 195 |
1 |
| Other owners | 0 |