- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/18 - SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
Patent holdings for IPC class G01Q 60/18
Total number of patents in this class: 90
10-year publication summary
|
7
|
8
|
8
|
2
|
1
|
2
|
6
|
1
|
2
|
0
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi, Ltd. | 15226 |
16 |
| Bruker Nano, Inc. | 335 |
8 |
| Centre National de La Recherche Scientifique | 10102 |
2 |
| Koninklijke Philips Electronics N.V. | 10844 |
2 |
| Pioneer Corporation | 4628 |
2 |
| Kyoto University | 2778 |
2 |
| Lehigh University | 162 |
2 |
| Pioneer Micro Technology Corporation | 59 |
2 |
| Thorlabs, Inc. | 416 |
2 |
| Centre National de La Recherche Scientifique (cnrs) | 3146 |
2 |
| The Regents of the University of California | 19517 |
1 |
| Hitachi High-Technologies Corporation | 2018 |
1 |
| Ricoh Company, Ltd. | 13216 |
1 |
| Olympus Corporation | 13275 |
1 |
| California Institute of Technology | 3936 |
1 |
| Shimadzu Corporation | 6019 |
1 |
| The Trustees of the University of Pennsylvania | 4260 |
1 |
| The Board of Trustees of the University of Illinois | 2666 |
1 |
| Korea Advanced Institute of Science and Technology | 4188 |
1 |
| Japan Science and Technology Agency | 1418 |
1 |
| Other owners | 40 |