- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/18 - SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
Patent holdings for IPC class G01Q 60/18
Total number of patents in this class: 89
10-year publication summary
|
7
|
8
|
8
|
2
|
1
|
2
|
6
|
1
|
2
|
4
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi, Ltd. | 15495 |
16 |
| Bruker Nano, Inc. | 339 |
8 |
| Centre National de La Recherche Scientifique | 10432 |
2 |
| Koninklijke Philips Electronics N.V. | 9618 |
2 |
| Pioneer Corporation | 4345 |
2 |
| Kyoto University | 2800 |
2 |
| Lehigh University | 166 |
2 |
| Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V. | 1775 |
2 |
| Pioneer Micro Technology Corporation | 58 |
2 |
| Thorlabs, Inc. | 419 |
2 |
| Centre National de La Recherche Scientifique (cnrs) | 3107 |
2 |
| Molecular Vista, Inc. | 15 |
2 |
| The Regents of the University of California | 19929 |
1 |
| Hitachi High-Technologies Corporation | 2004 |
1 |
| Olympus Corporation | 13175 |
1 |
| California Institute of Technology | 3972 |
1 |
| Shimadzu Corporation | 6172 |
1 |
| The Trustees of the University of Pennsylvania | 4323 |
1 |
| Korea Advanced Institute of Science and Technology | 4382 |
1 |
| Japan Science and Technology Agency | 1321 |
1 |
| Other owners | 37 |