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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 60/22 - Probes, their manufacture or their related instrumentation, e.g. holders

Patent holdings for IPC class G01Q 60/22

Total number of patents in this class: 153

10-year publication summary

8
16
11
5
10
15
3
4
4
0
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Hitachi, Ltd.
16071
11
Bruker Nano, Inc.
381
9
Centre National de La Recherche Scientifique
11016
7
Samsung Electronics Co., Ltd.
157557
4
Baylor University
381
4
Universidade Federal de Minas Gerais - Ufmg
193
4
Xi'an Jiaotong University
735
4
Hitachi High-Tech Corporation
5819
4
The Regents of the University of California
20720
3
attocube Systems AG
23
3
Danmarks Tekniske Universitet
1026
3
Technische Universiteit Eindhoven
387
3
LIG Nanowise Limited
9
3
Hitachi High-Tech Science Corporation
48
2
Commissariat à l'énergie atomique et aux energies alternatives
11127
2
Industry-Academic Cooperation Foundation, Yonsei University
2447
2
Lehigh University
172
2
Neaspec GmbH
4
2
Regents of the University of Minnesota
2785
2
The University of Bristol
264
2
Other owners 77

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