- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/44 - SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
Patent holdings for IPC class G01Q 60/44
Total number of patents in this class: 21
10-year publication summary
3
|
2
|
2
|
2
|
2
|
0
|
2
|
3
|
1
|
0
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
The Regents of the University of California | 20108 |
6 |
Imperial Innovations Limited | 586 |
3 |
SensApex Oy | 14 |
2 |
Ecole Polytechnique Federale de Lausanne (epfl) | 1557 |
1 |
The Florida International University Board of Trustees | 625 |
1 |
Ionscope Ltd | 3 |
1 |
Korea Research Institute of Standards and Science | 682 |
1 |
Ohio State Innovation Foundation | 2178 |
1 |
OpenIOLabs Ltd | 4 |
1 |
Tohoku University | 2824 |
1 |
Westfalische Wilhelms-universitat Munster | 196 |
1 |
Gtheranostics Co., Ltd. | 6 |
1 |
Bio-Xcelerator, Inc. | 17 |
1 |
Other owners | 0 |