Pascal Co., Ltd.

Japan

Back to Profile

1-8 of 8 for Pascal Co., Ltd. Sort by
Query
Aggregations
Jurisdiction
        World 5
        United States 3
IPC Class
G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective 6
A63F 9/10 - Two-dimensional jig-saw puzzles 4
A63F 9/06 - PatienceOther games for self-amusement 2
G09B 1/34 - Manually- or mechanically-operated educational appliances using elements forming or bearing symbols, signs, pictures, or the like which are arranged or adapted to be arranged in one or more particular ways comprising elements to be used without a special support the elements to be placed loosely in adjacent relationship 2
A63F 9/12 - Three-dimensional jig-saw puzzles 1
See more
Found results for  patents

1.

Figure plate set

      
Application Number 14718095
Grant Number 09443444
Status In Force
Filing Date 2015-05-21
First Publication Date 2015-09-10
Grant Date 2016-09-13
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

The present invention provides a figure plate set (10) for learning that comprises a plate member (4) having a concave portion (5); and groups of figure plates (1, 2, 3) that can form a regular polygon by being combined together, wherein the group of figure plates (1, 2, 3) can be stored on concave portion (5) in a state that the regular polygon is formed and the regular polygon is inscribed in an inner peripheral wall (6) of the concave portion (5). From the above, the user can experientially understand the regular polygon through the work of combining the figure plates. Thus, ability of geometric thinking about regular polygon is increased. In addition, since the plate member (4) has the concave portion (5), the group of figure plates (1, 2, 3) can be positioned. Thus, the figure plates (1, 2, 3) can be combined easily.

IPC Classes  ?

  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective
  • A63F 9/06 - PatienceOther games for self-amusement
  • G09B 1/02 - Manually- or mechanically-operated educational appliances using elements forming or bearing symbols, signs, pictures, or the like which are arranged or adapted to be arranged in one or more particular ways and having a support carrying or adapted to carry the elements

2.

Figure plate set

      
Application Number 14656715
Grant Number 09443440
Status In Force
Filing Date 2015-03-13
First Publication Date 2015-07-09
Grant Date 2016-09-13
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

The present invention provides a figure plate set (10) for learning that comprises a first triangular plate (1) that has an isosceles triangular shape having an apex angle of 108° and base angles of 36°; and a second triangular plate (2) that has an isosceles triangular shape having an apex angle of 36° and base angles of 72°, wherein a length of isosceles sides (7, 8) of the first triangular plate (1) is same as a length of isosceles sides (14, 15) or a bottom side (16) of the second triangular plate (2), and a new triangular shape can be formed by combining the first triangular plate (1) and the second triangular plate (2).

IPC Classes  ?

  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective
  • G09B 1/34 - Manually- or mechanically-operated educational appliances using elements forming or bearing symbols, signs, pictures, or the like which are arranged or adapted to be arranged in one or more particular ways comprising elements to be used without a special support the elements to be placed loosely in adjacent relationship
  • A63F 9/06 - PatienceOther games for self-amusement
  • G09B 19/00 - Teaching not covered by other main groups of this subclass
  • G09B 1/30 - Manually- or mechanically-operated educational appliances using elements forming or bearing symbols, signs, pictures, or the like which are arranged or adapted to be arranged in one or more particular ways and having a support carrying or adapted to carry the elements wherein the elements are adapted to be arranged in co-operation with the support to form symbols
  • A63F 9/10 - Two-dimensional jig-saw puzzles

3.

Figure plate set

      
Application Number 14629492
Grant Number 09443439
Status In Force
Filing Date 2015-02-24
First Publication Date 2015-06-18
Grant Date 2016-09-13
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

The present invention provides a figure plate set for learning that comprises a first triangular plate (1) having an angle of 45°, an angle of 45°, and an angle of 90° and a second triangular plate (2) having an angle of 30°, an angle of 60°, and an angle of 90°. A length of one of two orthogonal sides (7, 8) of the first triangular plate (1) is same as a length of one of two orthogonal sides (14, 16) of the second triangular plate. A new triangular shape can be formed by combining the first triangular plate (1) and the second triangular plate (2).

IPC Classes  ?

  • G09B 1/34 - Manually- or mechanically-operated educational appliances using elements forming or bearing symbols, signs, pictures, or the like which are arranged or adapted to be arranged in one or more particular ways comprising elements to be used without a special support the elements to be placed loosely in adjacent relationship
  • G09B 23/02 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics
  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective
  • A63F 9/12 - Three-dimensional jig-saw puzzles
  • A63F 9/10 - Two-dimensional jig-saw puzzles
  • A63H 33/04 - Building blocks, strips or similar building parts

4.

DESIGN BOARD SET

      
Application Number JP2013084434
Publication Number 2014/103991
Status In Force
Filing Date 2013-12-24
Publication Date 2014-07-03
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

Provided is a design board set (10) for educational use, equipped with a plate member (4) in which a recess (5) is formed, and sets of design boards (1, 2, 3) which can be assembled together to form regular polygonal shapes. When assembled to form regular polygonal shapes, the sets of design boards (1, 2, 3) can be accommodated in internal contact against the inside peripheral wall (6) of the recess (5). In so doing, experiential understanding of regular polygonal shapes is deepened through the process of assembling the design boards into regular polygonal shapes, which is helpful in improving geometric observational abilities in relation to regular polygonal shapes. Moreover, because the plate member (4) is provided with the recess (5), the sets of design boards (1, 2, 3) can be positioned, making the assembly process easy.

IPC Classes  ?

  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective
  • A63F 9/10 - Two-dimensional jig-saw puzzles

5.

FIGURE PLATE SET

      
Application Number JP2013077967
Publication Number 2014/061660
Status In Force
Filing Date 2013-10-15
Publication Date 2014-04-24
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

Provided is a figure plate set (10) for learning, the set including: a first triangle plate (1) that is in a shape of an isosceles triangle having an apex angle of 108° and base angles of 36° each; and a second triangle plate (2) in a shape of an isosceles triangle having an apex angle of 36° and base angles of 72° each. The length of the equilateral sides (7, 8) of the first triangle plate (1), and the length of the equilateral sides (14, 15) or the base side (16) of the second triangle plate (2) are equal to each other, so that the first triangle plate (1) and the second triangle plate (2) can be combined to form a new triangle.

IPC Classes  ?

  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective
  • A63F 9/10 - Two-dimensional jig-saw puzzles

6.

FIGURE PLATE SET

      
Application Number JP2013074041
Publication Number 2014/042084
Status In Force
Filing Date 2013-09-06
Publication Date 2014-03-20
Owner PASCAL CO., LTD. (Japan)
Inventor Moriyasu, Hiroki

Abstract

This figure plate set for learning is provided with: a first triangular plate (1) having angles of 45 degrees, 45 degrees and 90 degrees; and a second triangular plate (2) having angles of 30 degrees, 60 degrees and 90 degrees. The length of one of the two orthogonal sides (7, 8) of the first triangular plate (1), and the length of one of the two orthogonal sides (14, 16) of the second triangular plate coincide, and a new triangle can be formed by combining the first triangular plate (1) and the second triangular plate (2).

IPC Classes  ?

  • G09B 23/04 - Models for scientific, medical, or mathematical purposes, e.g. full-sized device for demonstration purposes for mathematics for geometry, trigonometry, projection, or perspective

7.

ANALYSIS DEVICE AND ANALYSIS METHOD BY SECONDARY IONS EMPLOYING ATOMIC PROBE

      
Application Number JP2012069761
Publication Number 2013/021923
Status In Force
Filing Date 2012-08-02
Publication Date 2013-02-14
Owner PASCAL CO.,LTD. (Japan)
Inventor
  • Nakanishi Shigemitsu
  • Higashitsutsumi Hideaki

Abstract

Provided are an analysis device and an analysis method by secondary ions employing an atomic probe with which it is possible to avoid charge-up without carrying out a preparatory process on a sample. This analysis device comprises: a neutral particle beam source for projecting a neutral particle beam (N) into a sample (41); an ion acceleration means for accelerating secondary ions which are discharged from the sample; and a measuring device which measures either the energy or the mass of the secondary ions which are discharged from the sample wherein the neutral particle beam is projected.

IPC Classes  ?

  • H01J 49/14 - Ion sourcesIon guns using particle bombardment, e.g. ionisation chambers
  • G01N 27/64 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
  • H01J 49/06 - Electron- or ion-optical arrangements
  • H01J 49/40 - Time-of-flight spectrometers

8.

NEUTRAL BEAM FORMATION DEVICE, SURFACE ANALYSIS DEVICE, NEUTRAL BEAM FORMATION METHOD, AND SURFACE ANALYSIS METHOD

      
Application Number JP2012059108
Publication Number 2012/137787
Status In Force
Filing Date 2012-04-03
Publication Date 2012-10-11
Owner PASCAL CO.,LTD. (Japan)
Inventor
  • Nakanishi Shigemitsu
  • Higashitsutsumi Hideaki

Abstract

[Problem] To provide a neutral beam formation device, surface analysis device that uses the same, neutral beam formation method, and surface analysis method capable of measuring the intensity of a neutral beam. [Solution] The present invention is characterized in comprising: a neutralization chamber (3) for introducing a neutral gas and using the neutral gas to neutralize and convert an ion beam to a neutral beam; and a neutral beam intensity monitoring mechanism for monitoring the intensity of the neutral beam. The neutral beam intensity monitoring mechanism measures the charge of charged particles produced when the neutral gas is charged by the charge exchange reaction between the neutral gas and the ion beam.

IPC Classes  ?

  • H05H 3/02 - Molecular or atomic-beam generation, e.g. resonant beam generation
  • G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
  • G01N 23/225 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes
  • H01J 37/04 - Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement