Systems and methods for use in introducing samples to an analytical instrument. In particular, systems and methods to process moisture sensitive/reactive gases and then analyze by an analytical device/instrument using also a liquid calibrant sample. Suitable analytical devices include, for example, an inductively coupled plasma-mass spectrometer or inductively coupled plasma-optical emission spectrometer.
G01N 27/68 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
An ion guide includes a plurality of curved electrodes arranged along a curved central axis. The plurality of electrodes define a curved ion guide region, with the curved ion guide region beginning at an ion entrance and ending at an ion exit. The ion guide includes an ion deflecting device configured to apply a radial DC electric field across the ion guide region and along the curved central axis. The ion guide region has a radius of curvature that varies along the curved central axis, and the radius of curvature is at a maximum at the ion entrance and decreases along the curved central axis toward the ion exit.
An ion guide includes a plurality of lenses arranged in series along a curved central axis. Each lens includes a body and a central opening, and the central openings of the plurality of disks define a curved ion guide region. The ion guide includes an ion deflector configured to apply a radial DC electric field across the ion guide region and along the curved central axis. The ion deflector includes at least one DC voltage source that is configured to apply a positive DC voltage to at least some of the plurality of lenses and a negative DC voltage to at least some of the plurality of lenses.
Systems and methods for use in introducing samples to an analytical device for single particle compositional analysis. Suitable analytical devices include, for example, an inductively coupled plasma-optical emission spectrometer. Prior to introduction to the analytical device, the sample gas is exchanged with argon gas, for example, using a gas exchange device. The analytical device may be calibrated with a liquid sample which is aerosolized prior to entry into the analytical device.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/16 - Ion sourcesIon guns using surface ionisation, e.g. field-, thermionic- or photo-emission
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
5.
DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING THE SAME
An ion detector assembly comprising: a first particle shield comprising an ion entry opening for receiving an ion beam propagating along a first propagation axis; a deflector configured to generate an electric field in a deflection region that deflects the ion beam out of alignment with the first propagation axis along a deflection path; a second particle shield comprising an ion exit opening; and a detection element configured to convert and multiply the ion beam to electrons after deflection via the deflector, wherein: the first particle shield extends at an angle relative to the second particle shield, the first particle shield and the second particle shield define a corner region, and the deflector comprises: a first rear surface extending proximate to the first particle shield; a second rear surface extending proximate to the second particle shield, a vertex where the first rear surface meets the second rear surface, the vertex being disposed proximate to the corner region; and a curved deflection surface opposite the vertex and extending between the first rear surface and the second rear surface.
A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.
A mass spectrometry apparatus includes an ion detector and a control circuit coupled to the ion detector. The ion detector includes a pulse counting stage and an analog stage configured to generate a pulse counting signal and an analog signal, respectively, responsive to incident ions. The a control circuit is configured to output the pulse counting signal in a pulse counting output mode and to output the analog signal in an analog output mode. The control circuit is configured to switch from the pulse counting output mode to the analog output mode responsive to the pulse counting signal exceeding a first threshold. The first threshold may be within a range of about 10 million counts per second to about 200 million counts per second, or may be set responsive to receiving a user input. Related devices and operating methods are also discussed.
An ICP torch includes an injector tube defining an injector flow passage to receive a flow of a sample fluid, an intermediate tube disposed about the injector tube, a plasma tube disposed about the intermediate tube, and an induction coil disposed about the plasma tube. An auxiliary gas passage is defined between the injector tube and the intermediate tube to receive a flow of an auxiliary gas. A plasma gas passage is defined between the intermediate tube and the plasma tube to receive a flow of a plasma gas. The induction coil can produce a plasma proximate a torch distal end. The induction coil extends axially from a coil proximal end to a coil distal end proximate the torch distal end. The plasma tube includes an outlet opening proximate the torch distal end. The outlet opening is at least partially coincident with or axially inset from the coil distal end.
A single drive positioning system includes a drive shaft, a motor, a first worm screw, and a second worm screw. The motor has a motor output connected to the drive shaft and operable to selectively rotate the drive shaft. The first worm screw is mounted on the drive shaft for rotation therewith. The second worm screw is mounted on the drive shaft for rotation therewith.
G12B 5/00 - Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereofCompensating for the effects of tilting or acceleration, e.g. for optical apparatus
G01N 21/62 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
10.
THERMAL MANAGEMENT FOR INSTRUMENTS INCLUDING A PLASMA SOURCE
Thermal management arrangements for analysis systems including a plasma source such as inductively-coupled-plasma are disclosed. An analysis system may include a plasma source configured to a plasma source configured to receive and ionize a sample to create an ionized sample, and an instrument such as a mass spectrometer or optical emission spectrometer configured to receive and analyze the ionized sample. A heat shield may be positioned between the plasma source and the instrument, and the heat shield may be constructed and arranged to direct heated gas and/or plasma from the plasma source away from the instrument. In some instances, the heated gas and/or plasma may be extracted from a chamber containing the plasma source.
Certain embodiments of ion interfaces are described that can provide higher sensitivities improved ion transmission and multiple operating modes. In some configurations, the ion interface may comprise a first element and a second element each of which can receive a non-zero voltage. In one configuration, the first element can be a hyperskimmer cone and the second element can be a cylindrical lens. Systems and methods using the interface are also described.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/06 - Electron- or ion-optical arrangements
H01J 49/26 - Mass spectrometers or separator tubes
Certain embodiments of ion interfaces are described that can provide higher sensitivities improved ion transmission and multiple operating modes. In some configurations, the ion interface may comprise a first element and a second element each of which can receive a non-zero voltage. In one configuration, the first element can be a hyperskimmer cone and the second element can be a cylindrical lens. Systems and methods using the interface are also described.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/06 - Electron- or ion-optical arrangements
H01J 49/26 - Mass spectrometers or separator tubes
13.
VARIABLE DISCRIMINATOR THRESHOLD FOR ION DETECTION
An example system includes an ion detector and a signal processing apparatus in communication with the ion detector. The ion detector is arranged to detect ions during operation of the system and to generate a signal pulse in response to the detection of an ion. The signal pulse has a peak amplitude related to at least one operational parameter of the system. The signal processing apparatus is configured to analyze signal pulses from the ion detector and determine information about the detected ions during operation of the system based on the signal pulses. The signal processing apparatus includes a discriminator circuit. The signal processing apparatus is programmed to vary a threshold of the discriminator circuit based on the at least one operational parameter of the system during operation of the system.
G01D 5/48 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using wave or particle radiation means
G01T 1/15 - Instruments in which pulses generated by a radiation detector are integrated, e.g. by a diode pump circuit
Aspects of the disclosure relate to techniques for analyzing unknown sample compositions using a prediction model based on optical emission spectra. One method comprises: receiving first emission spectra corresponding to a training sample comprising a plurality of pure elements of known concentrations; determining, based on the first spectra, a plurality of spectral regions corresponding to the plurality of pure elements of known concentrations; determining, for each spectral region corresponding to each pure element of a known concentration, features associated with a signature peak of the region; training a prediction model to predict unknown concentrations of a plurality of constituents of an unknown sample based on an emission spectra of the unknown sample; receiving second emission spectra corresponding to the unknown sample comprising a plurality of constituents of unknown concentrations; and generating, based on the application of the trained prediction model, a concentration for each of the constituents of the sample.
Aspects relate to reconstructing phase images from brightfield images at multiple focal planes using machine learning techniques. A machine learning model may be trained using a training data set comprised of matched sets of images, each matched set of images comprising a plurality of brightfield images at different focal planes and, optionally, a corresponding ground truth phase image. An initial training data set may include images selected based on image views of a specimen that are substantially free of undesired visual artifacts such as dust. The brightfield images of the training data set can then be modified based on simulating at least one visual artifact, generating an enhanced training data set for use in training the model. Output of the machine learning model may be compared to the ground truth phase images to tram the model. The trained model may be used to generate phase images from input data sets.
Methods and systems that can use a gas comprising a nitrogen center that is introduced upstream of a plasma sustained in a torch are described. In some configurations, the gas comprising the nitrogen center can be introduced as a gas upstream of the plasma and through a sample introduction device. Mass spectrometers and optical emission systems that can use the gas comprising the nitrogen center are also described.
G01N 1/00 - SamplingPreparing specimens for investigation
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
17.
MASS SPECTROMETER COMPONENTS INCLUDING PROGRAMMABLE ELEMENTS AND DEVICES AND SYSTEMS USING THEM
Certain configurations of mass spectrometer components are described herein that comprise one or more mass spectrometer programmable elements. In some instances, the mass spectrometer programmable element can be configured as an electrode that can function independently of any underlying substrate or component. Ion guides, lenses, ion switches, mass analyzers and other components of a mass spectrometer are described which comprise one or more mass spectrometer programmable elements.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
Auto sampler rack mounts and fluid vials that can be used with them are described. In some configurations, the rack mount can be configured to spin each fluid vial rotationally to assist in mixing or stirring of fluid in the vial and/or to maintain fluid homogeneity. If desired, the fluid vial may include one or more internal features to assist in the mixing or stirring.
Certain configurations of a sampler cone and its use with a metal gasket to seal the sampler cone to a mass spectrometer interface are described. The sampler cone, interface or both may comprise one or more surface features. Coupling of the sampler cone to the interface can compress or crush the metal gasket to provide a seal between the sampler cone and the interface. For example, a crushing force provided by surface features of the sampler cone and interface can crush the gasket and provide a substantially fluid tight seal between the sampler cone and the interface.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
Certain configurations are provided of a particle filter that can be used with a vacuum pump. In some examples, the particle filter is configured to remove particles in a fluid stream prior to the fluid stream being provided to an inlet of the vacuum pump. In some instances, the particle filter may remove the particles without using any filtration media. The particle filter may be designed to permit emptying or removal of filtered particles without breaking a vacuum.
Systems and methods for use in introducing samples to an analytical instrument. The systems and methods are adaptable to process either a liquid sample or a gaseous sample, including samples containing particle contaminants, for subsequent analysis using an analytical instrument, such as e.g., a mass spectrometer and/or an inductively coupled plasma mass spectrometer.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
22.
SYSTEM FOR INTRODUCING PARTICLE-CONTAINING SAMPLES TO AN ANALYTICAL INSTRUMENT AND METHODS OF USE
Systems and methods for use in introducing samples to an analytical instrument. The systems and methods are adaptable to process either a liquid sample or a gaseous sample, including samples containing particle contaminants, for subsequent analysis using an analytical instrument, such as e.g., a mass spectrometer and/or an inductively coupled plasma mass spectrometer.
G01N 1/00 - SamplingPreparing specimens for investigation
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
23.
IONIZATION SOURCES AND SYSTEMS AND METHODS USING THEM
Certain configurations of ionization sources are described. In some examples, an ionization source comprises an ionization block, an electron source, an electron collector, an ion repeller and at least one electrode configured to provide an electric field when a voltage is provided to the at least one electrode. Systems and methods using the ionization source are also described.
Certain configurations of plasma discharge chambers and plasma ionization sources comprising a plasma discharge chamber are described. In some examples, the discharge chamber comprises a conductive area and is configured to sustain a plasma discharge within the discharge chamber. In other examples, the discharge chamber comprises at least one inlet configured to receive a plasma gas and at least one outlet configured to provide ionized analyte from the discharge chamber. Systems and methods using the discharge chambers are also described.
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H05H 1/42 - Plasma torches using an arc with provisions for introducing materials into the plasma, e.g. powder or liquid
An ionizer includes a probe having multiple coaxially aligned conduits. The conduits may carry liquids, and nebulìzing and heating gases at various flow rates and temperatures, for generation of ions from a liquid source. An outermost conduit defines an entrainment region that transports and entrains ions in a gas for a defined distance along the length of the conduits. In embodiments, various voltages may be applied to the multiple conduits to aid in ionization and to guide ions. Depending on the voltages applied to the multiple conduits and electrodes, the ionizer can act as an electrospray, APCI, or APR source. Further, the ionizer may include a source of photons or a source of corona ionization. Formed ions may be provided to a downstream mass analyzer.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
26.
MASS ANALYZER INCLUDING AN ION SOURCE AND A REACTION CELL AND SYSTEMS AND METHODS USING THEM
Certain configurations of a mass analyzer comprising two chambers for ionizing species to form ions and/or introduce a reaction gas to assist in ionization are described. In some instances, a first chamber may receive electrons to permit electron bombardment of a first gas. A second chamber can receive a second gas and the ions from the first chamber to permit the ions and second gas to interact. The first gas or the second gas or both may include analyte.
Certain embodiments described herein are directed to methods and systems of detecting two or more analytes present in a single system such as a nanoparticle or nanostructure. In some examples, the methods and systems can estimate data gaps and fit intensity curves to obtained detection values so the amount of the two or more analytes present in the single system can be quantified.
A device for providing analyte to an analyzer is described. In some examples, the device comprises a substrate comprising a plurality of wells formed therein at predetermined locations. Each of the wells can be capable of containing an analyte without mixing with analytes in other of the wells. Each of the wells can also have a well exit to allow analyte to exit therefrom. A channel can be in flow communication with at least one of the well exits, and can guide analyte ions exiting therefrom to the mass analyzer. The wells may be filled prior to use in association with the mass analyzer. The substrate may be used as part of a fraction collector if desired.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
An ion source comprising a chamber and an electron collector is described. In one configuration, the chamber comprises a sample inlet and an ion outlet. The chamber may also include an electron inlet configured to receive electrons from an electron source. The electron collector can be arranged in opposition to the electron inlet. The chamber can be configured to direct an electron beam from the electron source along a path with the chamber transverse to a path between the gas inlet and the ion outlet. The chamber may comprise an ion guide that includes a guide axis offset from an axis of the ion outlet.
Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.
H01J 49/14 - Ion sourcesIon guns using particle bombardment, e.g. ionisation chambers
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two- dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.
Certain configurations of a torch are described which can be used to sustain a plasma using lower powers and lower cooling gas flow rates. In some examples, the torch may comprise an inner tube of variable diameter along a longitudinal length with a selected gap between outer surfaces of a terminal end or third section of the inner tube and inner surfaces of the outer tube. The terminal end length and/or gap distance can be selected to sustain a concentric plasma using the torch and one or more induction devices. Methods and systems using the torch are also described.
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
Certain configurations are described herein of an instrument comprising a passive cooling device which includes, in part, a loop thermosyphon configured to thermally couple to a component of the instrument to be cooled. In some instances, the cooling device can cool a transistor, transistor pair, an interface or other components of the instalment.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
THE GOVERNING COUNCIL OF THE UNIVERSITY OF TORONTO (Canada)
PERKINELMER HEALTH SCIENCES CANADA, INC. (Canada)
Inventor
Mostaghimi-Tehrani, Javad
Pershin, Valerian
Yugeswaran, Subramaniam
Alavi, Sina
Badiei, Hamid
Chan, Brian
Abstract
Certain configurations of systems and methods which can recycle argon used in an inductively coupled plasma mass spectrometer are described. In some configurations, the system may comprise two or more separate stages each of which can remove impurities from a fluid stream comprising the argon. In some instances, substantially pure argon is recovered using the systems and methods, and the substantially pure argon can be reused in the inductively coupled plasma mass spectrometer.
B01D 53/02 - Separation of gases or vapoursRecovering vapours of volatile solvents from gasesChemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases or aerosols by adsorption, e.g. preparative gas chromatography
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
35.
INORGANIC AND ORGANIC MASS SPECTROMETRY SYSTEMS AND METHODS OF USING THEM
Certain configurations of systems and methods that can detect inorganic ions and organic ions in a sample are described. In some configurations, the system may comprise one, two, three or more mass spectrometer cores. In some instances, the mass spectrometercores can utilize common components such as gas controllers, processors, power supplies and vacuum pumps. In certain configurations,the systems can be designed to detect both inorganic and organic analytes comprising a mass from about three atomic mass units, four atomic mass units or five atomic mass units up to a mass of about two thousand atomic mass units.
Certain configurations of systems and methods that can detect inorganic ions and organic ions in a sample are described. In some configurations, the system may comprise one, two, three or more mass spectrometer cores. In some instances, the mass spectrometer cores can utilize common components such as gas controllers, processors, power supplies and vacuum pumps. In certain configurations, the systems can be designed to detect both inorganic and organic analytes comprising a mass from about three atomic mass units, four atomic mass units or five atomic mass units up to a mass of about two thousand atomic mass units.
Certain configurations of a stable capacitor are described which comprise electrodes produced from materials comprising a selected coefficient of thermal expansion to enhance stability. The electrodes can be spaced from each other through one of more dielectric layers or portions thereof. In some instances, the electrodes comprise integral materials and do not include any thin films. The capacitors can be used, for example, in feedback circuits, radio frequency generators and other devices used with mass filters and/or mass spectrometry devices.
Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.
A mass analyzer includes a desolvation chamber into which an upstream gas is injected to provide a counter-flow to said downstream flow in the chamber. The counter-flow may slow the downstream flow of solvated ionized particles in the chamber, while allowing lighter desolvated ions to travel toward an outlet aperture of the desolvation chamber.
G01N 27/623 - Ion mobility spectrometry combined with mass spectrometry
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/16 - Ion sourcesIon guns using surface ionisation, e.g. field-, thermionic- or photo-emission
An ion source and method for providing ionized particles to a molecular/atomic analyser, such as a mass spectrometer, are disclosed. The ion source includes a vessel defining a channel; a gas inlet extending from the gas source into the channel, for introducing a gas flow into the channel; a sample inlet extending into the channel for introducing sample within the channel; and an ionizer to ionize the sample in the channel. The vessel is sufficiently sealed to allow the channel to be pressurized, at a pressure in excess of 100 Torr. At least one gas source maintains the pressure of the channel at a pressure in excess of 100 Torr and the pressure exterior to the channel at a pressure in excess of.1 Torr and provides a gas flow that sweeps across the ionizer to guide and entrain ions from the ionizer to the outlet.
An ion guide includes multiple stages. An electric filed within each stage guides ions along a guide axis. Within each stage, amplitude and frequency, and resolving potential of the electric field may be independently varied. The geometry of the rods maintains a similarly shaped field from stage to stage, allowing efficient guidance of the ions along the axis. In particular, each rod segment of the ith of stage has a cross sectional radius ri, and a central axis located a distance Ri+ri from the guide axis. The ratio ri/RIis substantially constant along the guide axis, thereby preserving the shape of the field.
A mass spectrometer interface, having improved sensitivity and reduced chemical background, is disclosed. The mass spectrometer interface provides improved desolvation, chemical selectivity and ion transport. A flow of partially solvated ions is transported along a tortuous path into a region of disturbance of flow, where ions and neutral molecules collide and mix. Thermal energy is applied to the region of disturbance to promote liberation of at least some of the ionized particles from any attached impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in the flow. Molecular reactions and low pressure ionization methods can also be performed for selective removal or enhancement of particular ions.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
A mass spectrometer interface, having improved sensitivity and reduced chemical background, is disclosed. The mass spectrometer interface provides improved desolvation, chemical selectivity and ion transport. A flow of partially solvated ions is transported along a tortuous path into a region of disturbance of flow, where ions and neutral molecules collide and mix. Thermal energy is applied to the region of disturbance to promote liberation of at least some of the ionized particles from any attached impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in the flow. Molecular reactions and low pressure ionization methods can also be performed for selective removal or enhancement of particular ions.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
H01J 49/26 - Mass spectrometers or separator tubes
patents
