SciAps, Inc.

United States of America

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Date
2024 December 1
2024 3
2023 3
2020 1
Before 2020 30
IPC Class
G01J 3/443 - Emission spectrometry 21
G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details 19
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited 18
G01J 3/28 - Investigating the spectrum 13
G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself 12
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Status
Pending 3
Registered / In Force 34

1.

Handheld X-ray fluorescence instrument

      
Application Number 29709109
Grant Number D1053354
Status In Force
Filing Date 2019-10-11
First Publication Date 2024-12-03
Grant Date 2024-12-03
Owner SciAps, Inc. (USA)
Inventor Paulke, Gabor

2.

A METHOD OF AND SYSTEM FOR DETECTING THE CONCENTRATION OF BRINE CONSTITUENTS

      
Application Number US2023072008
Publication Number 2024/059392
Status In Force
Filing Date 2023-08-10
Publication Date 2024-03-21
Owner SCIAPS, INC. (USA)
Inventor
  • Day, David
  • Jennings, Morgan

Abstract

A method of and system for detecting the concentration of a target element in a brine wherein the brine is sampled into a container and an aerosol generator is used to generate an aerosol stream of the sampled brine in the container. The aerosol stream may be directed to a collection system. A handheld LIBS device directs a laser beam to the aerosol stream at a location between the aerosol generator and the collection system to generate a plasma. The plasma is analyzed to detect intensity data for a reference element based on the generated plasma and to detect the intensity data of a target element based on the generated plasma. The concentration of the target element in the brine is calculated based on the reference element intensity data and the target element intensity data.

IPC Classes  ?

  • G01J 3/443 - Emission spectrometry
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/44 - Raman spectrometry; Scattering spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited

3.

METHOD OF AND SYSTEM FOR DETECTING THE CONCENTRATION OF BRINE CONSTITUENTS

      
Application Number 18300602
Status Pending
Filing Date 2023-04-14
First Publication Date 2024-03-14
Owner SciAps, Inc. (USA)
Inventor
  • Day, David
  • Jennings, Morgan

Abstract

A method of and system for detecting the concentration of a target element in a brine wherein the brine is sampled into a container and an aerosol generator is used to generate an aerosol stream of the sampled brine in the container. The aerosol stream may be directed to a collection system. A handheld LIB S device directs a laser beam to the aerosol stream at a location between the aerosol generator and the collection system to generate a plasma. The plasma is analyzed to detect intensity data for a reference element based on the generated plasma and to detect the intensity data of a target element based on the generated plasma. The concentration of the target element in the brine is calculated based on the reference element intensity data and the target element intensity data.

IPC Classes  ?

  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

4.

DUAL BEAM SINGLE SPATIAL MODE LASER FOR HANDHELD LIBS INSTRUMENTS AND SIMILAR APPLICATIONS

      
Application Number US2023060865
Publication Number 2023/147241
Status In Force
Filing Date 2023-01-19
Publication Date 2023-08-03
Owner SCIAPS, INC. (USA)
Inventor
  • Welford, David
  • Day, David, R.
  • Mitrano, Richard, P.

Abstract

A handheld LIBS device and method includes a laser assembly producing two pulsed single spatial mode output beams and a focusing optic which combines the two pulsed single spatial mode output beams at a focal point at a sample. The laser assembly includes a laser assembly housing with an output coupler window for the two pulsed single spatial mode output beams, a gain medium in the laser assembly housing between the output coupler window and an adjustable prism mount in the laser assembly housing holding a prism configured to establish two light paths through the gain medium, a source in the laser assembly housing providing pump energy to the gain medium, and a Q-switch positioned between the prism and the gain medium.

IPC Classes  ?

  • H01S 3/1123 - Q-switching
  • H01S 3/125 - Q-switching using intracavity mechanical devices using rotating prisms
  • H01S 3/115 - Q-switching using intracavity electro-optic devices

5.

HANDHELD LIBS DEVICE WITH ATMOSPHERIC PURGE

      
Application Number 18156464
Status Pending
Filing Date 2023-01-19
First Publication Date 2023-08-03
Owner SciAps, Inc. (USA)
Inventor Day, David

Abstract

A handheld LIES device includes a laser source for generating a laser beam, a spectrometer subsystem for analyzing a plasma generated when the laser beam strikes a sample, and a nose section including an end plate with an aperture for the laser beam and for receiving plasma radiation and an optic spaced from the end plate defining with the end plate a cavity therebetween. An atmospheric purge subsystem includes an air pump with an intake exposed to the atmosphere and a conduit connected to the air pump providing an atmospheric gas mixture to the nose section cavity to purge the cavity of contaminants and keep the optic clean as the atmospheric gas mixture exits the cavity through the end plate aperture.

IPC Classes  ?

  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited

6.

DUAL BEAM SINGLE SPATIAL MODE LASER FOR HANDHELD LIBS INSTRUMENTS AND SIMILAR APPLICATIONS

      
Application Number 18155892
Status Pending
Filing Date 2023-01-18
First Publication Date 2023-07-27
Owner SciAps, Inc. (USA)
Inventor
  • Welford, David
  • Day, David R.
  • Mitrano, Richard P.

Abstract

A handheld LIBS device and method includes a laser assembly producing two pulsed single spatial mode output beams and a focusing optic which combines the two pulsed single spatial mode output beams at a focal point at a sample. The laser assembly includes a laser assembly housing with an output coupler window for the two pulsed single spatial mode output beams, a gain medium in the laser assembly housing between the output coupler window and an adjustable prism mount in the laser assembly housing holding a prism configured to establish two light paths through the gain medium, a source in the laser assembly housing providing pump energy to the gain medium, and a Q-switch positioned between the prism and the gain medium.

IPC Classes  ?

  • H01S 3/1123 - Q-switching
  • H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
  • H01S 3/16 - Solid materials
  • H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
  • H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • H01S 3/06 - Construction or shape of active medium
  • G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/25 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands

7.

Analyzer sample detection method and system

      
Application Number 16828274
Grant Number 11079333
Status In Force
Filing Date 2020-03-24
First Publication Date 2020-07-16
Grant Date 2021-08-03
Owner SciAps, Inc. (USA)
Inventor Day, David R.

Abstract

A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle. A camera receives light from the illumination source reflected off the sample for detecting the presence of the sample.

IPC Classes  ?

  • G01J 3/443 - Emission spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

8.

Portable, hand held aluminum alloy XRF analyzer and method

      
Application Number 15957448
Grant Number 11169100
Status In Force
Filing Date 2018-04-19
First Publication Date 2019-10-03
Grant Date 2021-11-09
Owner SciAps, Inc. (USA)
Inventor Sackett, Donald W.

Abstract

A portable hand held XRF analyzer and method wherein an X-ray source directs X-rays to a sample and a detector detects photons emitted by the sample. A controller subsystem controlling the X-ray source an I/O section and is responsive to the detector and I/O section. The controller subsystem is configured to present to the user, via the I/O section, a choice to invoke an aluminum alloy algorithm test. An aluminum alloy algorithm test is invoked if the operator chooses the aluminum alloy algorithm test. Then, the X-ray source is operated at a predetermined voltage level and predetermined current level and the detector output is analyzed to determine elements and their concentrations present in the sample. Preferably, if the analysis fails to detect one or more common aluminum alloy elements present in the sample and/or fails to specify a particular aluminum alloy, then the X-ray source is automatically operated at a higher voltage and lower current level to repeat the analysis step.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

9.

Analyzer sample detection method and system

      
Application Number 15982373
Grant Number 10697895
Status In Force
Filing Date 2018-05-17
First Publication Date 2018-09-20
Grant Date 2020-06-30
Owner SciAps, Inc. (USA)
Inventor Day, David R.

Abstract

A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle and receives light from the illumination source reflected off the sample also via the detection fiber bundle for detecting the presence of the sample.

IPC Classes  ?

  • G01J 3/443 - Emission spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

10.

Analyzer alignment, sample detection, localization, and focusing method and system

      
Application Number 15016489
Grant Number 09939383
Status In Force
Filing Date 2016-02-05
First Publication Date 2017-08-10
Grant Date 2018-04-10
Owner SCIAPS, INC. (USA)
Inventor Day, David R.

Abstract

An analysis (e.g., LIBS) system includes a source of radiation, an optical emission path for the radiation from the source of radiation to a sample, and an optical detection path for photons emitted by the sample. A detector fiber bundle transmits photons to the spectrometer subsystem. At least one fiber of the fiber bundle is connected to an illumination source (e.g., an LED) for directing light via at least a portion of the detection path in a reverse direction to the sample for aligning, sample presence detection, localizing, and/or focusing based on analysis of the resulting illumination spot on the sample.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/443 - Emission spectrometry

11.

LiBS analyzer sample presence detection system and method

      
Application Number 15484767
Grant Number 09970815
Status In Force
Filing Date 2017-04-11
First Publication Date 2017-08-03
Grant Date 2018-05-15
Owner SCIAPS, INC. (USA)
Inventor
  • Day, David R.
  • Sackett, Donald W.

Abstract

A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/443 - Emission spectrometry
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry

12.

LIBS analyzer sample presence detection system and method

      
Application Number 14632419
Grant Number 09664565
Status In Force
Filing Date 2015-02-26
First Publication Date 2016-09-01
Grant Date 2017-05-30
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Sackett, Donald W.

Abstract

A LIBS analyzer, preferably handheld, includes a laser configured to produce a plasma on a sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce a spectrum. A controller subsystem is configured to control energizing the laser and to analyze the resulting spectrum from each laser pulse to determine if the laser is aimed at a sample. If the analyzed spectrum reveals the laser is not aimed at the sample, the controller subsystem halts the laser puke sequence.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/443 - Emission spectrometry
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

13.

LIBS analyzer sample presence detection system and method

      
Application Number 14800888
Grant Number 09651424
Status In Force
Filing Date 2015-07-16
First Publication Date 2016-09-01
Grant Date 2017-05-16
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Sackett, Donald W.

Abstract

A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/443 - Emission spectrometry
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

14.

LIBS analysis system

      
Application Number 15140707
Grant Number 09719853
Status In Force
Filing Date 2016-04-28
First Publication Date 2016-08-18
Grant Date 2017-08-01
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Derman, Konstantin
  • Egan, John Francis
  • Soucy, Paul Edward

Abstract

A handheld LIBS spectrometer includes an optics stage movably mounted to a housing and including a laser focusing lens and a detection lens. One or more motors advance and retract the optics stage, move the optics stage left and right, and/or move the optics stage up and down. A laser source in the housing is oriented to direct a laser beam to the laser focusing lens. A spectrometer subsystem in the housing is configured to receive electromagnetic radiation from the detection lens and to provide an output. A controller subsystem is responsive to the output of the spectrometer subsystem and is configured to control the laser source and motors. In this way, auto-calibration, auto-clean, and auto-focus, and/or moving spot functionality is possible.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/443 - Emission spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry

15.

LIBS analysis system

      
Application Number 15140816
Grant Number 09714864
Status In Force
Filing Date 2016-04-28
First Publication Date 2016-08-18
Grant Date 2017-07-25
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Derman, Konstantin
  • Egan, John Francis
  • Soucy, Paul Edward

Abstract

A handheld LIBS spectrometer includes an optics stage movably mounted to a housing and including a laser focusing lens and a detection lens. One or more motors advance and retract the optics stage, move the optics stage left and right, and/or move the optics stage up and down. A laser source in the housing is oriented to direct a laser beam to the laser focusing lens. A spectrometer subsystem in the housing is configured to receive electromagnetic radiation from the detection lens and to provide an output. A controller subsystem is responsive to the output of the spectrometer subsystem and is configured to control the laser source and motors. In this way, auto-calibration, auto-clean, and auto-focus, and/or moving spot functionality is possible.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/443 - Emission spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry

16.

Handheld laser induced breakdown spectroscopy analyzer

      
Application Number 29527112
Grant Number D0763108
Status In Force
Filing Date 2015-05-15
First Publication Date 2016-08-09
Grant Date 2016-08-09
Owner SciAps, Inc. (USA)
Inventor
  • Hagerty, Thomas A.
  • Rose, Joshua
  • Smallwood, Eric
  • Foley, Mark James
  • Wright, Theodore J.

17.

Handheld laser induced breakdown spectroscopy analyzer nose plate

      
Application Number 29527093
Grant Number D0763110
Status In Force
Filing Date 2015-05-15
First Publication Date 2016-08-09
Grant Date 2016-08-09
Owner SciAps, Inc. (USA)
Inventor Derman, Konstantin

18.

Automated focusing, cleaning, and multiple location sampling spectrometer system

      
Application Number 14983933
Grant Number 09568430
Status In Force
Filing Date 2015-12-30
First Publication Date 2016-05-19
Grant Date 2017-02-14
Owner SciAps, Inc. (USA)
Inventor Day, David

Abstract

An analysis system includes a moveable focusing lens, a laser (typically an eye safe laser) having an output directed at the focusing lens, and a spectrometer outputting intensity data from a sample. A controller system is responsive to the spectrometer and is configured to energize the laser, process the output of the spectrometer, and adjust the position of the focusing lens relative to the sample until the spectrometer output indicates a maximum or near maximum intensity resulting from a laser output focused to a spot on the sample.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/443 - Emission spectrometry
  • G01N 21/65 - Raman scattering

19.

Handheld LIBS spectrometer

      
Application Number 14874726
Grant Number 09952100
Status In Force
Filing Date 2015-10-05
First Publication Date 2016-03-24
Grant Date 2018-04-24
Owner SCIAPS, INC. (USA)
Inventor
  • Day, David R.
  • Derman, Konstantin
  • Egan, John Francis
  • Soucy, Paul Edward

Abstract

A handheld LIBS spectrometer system features an optics stage moveable with respect to a housing and including a laser focusing lens. A laser source is mounted in the housing for directing a laser beam to a sample via the laser focusing lens. A detection fiber is mounted in the housing and is fixed relative thereto. A first mirror is fixed relative to the housing and includes an aperture for the laser beam. This mirror is oriented to re-direct plasma radiation for delivery to the detection fiber. A controller subsystem is responsive to the output of a spectrometer subsystem and is configured to control the laser source and the optics stage.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/443 - Emission spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

20.

Combined handheld XRF and OES systems and methods

      
Application Number 14746130
Grant Number 10012603
Status In Force
Filing Date 2015-06-22
First Publication Date 2015-12-31
Grant Date 2018-07-03
Owner SciAps, Inc. (USA)
Inventor Sackett, Donald W.

Abstract

A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals. The low power laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and/or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed voltage, namely, Al, Si, and/or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and/or Ba; and/or rare earth elements.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement

21.

Automated multiple location sampling analysis system

      
Application Number 14795954
Grant Number 09874475
Status In Force
Filing Date 2015-07-10
First Publication Date 2015-11-05
Grant Date 2018-01-23
Owner SciAps, Inc. (USA)
Inventor Day, David

Abstract

An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/443 - Emission spectrometry
  • G01J 3/06 - Scanning arrangements
  • H01L 21/66 - Testing or measuring during manufacture or treatment
  • G01J 3/44 - Raman spectrometry; Scattering spectrometry

22.

Handheld LIBS analyzer end plate purging structure

      
Application Number 14608359
Grant Number 09395243
Status In Force
Filing Date 2015-01-29
First Publication Date 2015-05-21
Grant Date 2016-07-19
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Derman, Konstantin
  • Egan, John Francis
  • Soucy, Paul Edward

Abstract

A handheld LIBS analyzer includes a laser source for generating a laser beam and a spectrometer subsystem for analyzing a plasma generated when the laser beam strikes a sample. A nose section includes an end plate with an aperture for the laser beam, a purge cavity behind the aperture fluidly connected to a source of purge gas, and a shield covering the purge cavity. A vent removes purge gas from the purge cavity when the end plate is placed on the sample.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/443 - Emission spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • H01J 37/32 - Gas-filled discharge tubes

23.

WIDE SPECTRAL RANGE SPECTROMETER

      
Application Number US2014024486
Publication Number 2014/159626
Status In Force
Filing Date 2014-03-12
Publication Date 2014-10-02
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

Featured is a spectral analysis method and a wide spectral range spectrometer including a source of electromagnetic radiation and an optical subsystem configured to disperse radiation into a plurality of wavelengths. A pixilated light modulator receives the radiation wavelengths and is configured to direct one or more selective wavelengths to a sample.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01J 3/42 - Absorption spectrometry; Double-beam spectrometry; Flicker spectrometry; Reflection spectrometry
  • G02B 26/00 - Optical devices or arrangements for the control of light using movable or deformable optical elements

24.

Handheld LIBS spectrometer

      
Application Number 14179670
Grant Number 09360367
Status In Force
Filing Date 2014-02-13
First Publication Date 2014-07-24
Grant Date 2016-06-07
Owner SciAps, Inc. (USA)
Inventor
  • Day, David R.
  • Derman, Konstantin
  • Egan, John Francis
  • Soucy, Paul Edward

Abstract

A handheld LIBS spectrometer includes an optics stage movably mounted to a housing and including a laser focusing lens and a detection lens. One or more motors advance and retract the optics stage, move the optics stage left and right, and/or move the optics stage up and down. A laser source in the housing is oriented to direct a laser beam to the laser focusing lens. A spectrometer subsystem in the housing is configured to receive electromagnetic radiation from the detection lens and to provide an output. A controller subsystem is responsive to the output of the spectrometer subsystem and is configured to control the laser source and motors. In this way, auto-calibration, auto-clean, and auto-focus, and/or moving spot functionality is possible.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/443 - Emission spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

25.

Automated plasma cleaning system

      
Application Number 13746102
Grant Number 09435742
Status In Force
Filing Date 2013-01-21
First Publication Date 2014-07-24
Grant Date 2016-09-06
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis (e.g., LIBS) system includes a laser source generating a laser beam for creating a plasma at a location on a sample, and a spectrometer responsive to photons emitted by the sample at said location and having an output. A controller is responsive to a trigger signal and is configured to activate the laser source generating a series of laser pulses in a cleaning cycle, process the spectrometer output, and automatically terminate the cleaning cycle based on the spectrometer output.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • H01J 37/32 - Gas-filled discharge tubes
  • G01J 3/443 - Emission spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

26.

AUTOMATED FOCUSING, CLEANING, AND SAMPLING SPECTROMETER SYSTEM

      
Application Number US2014011863
Publication Number 2014/113574
Status In Force
Filing Date 2014-01-16
Publication Date 2014-07-24
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system includes a moveable focusing lens, a laser (typically an eye safe laser) having an output directed at the focusing lens, and a spectrometer outputting intensity data from a sample. A controller system is responsive to the spectrometer and is configured to energize the laser, process the output of the spectrometer, and adjust the position of the focusing lens relative to the sample until the spectrometer output indicates a maximum or near maximum intensity resulting from a laser output focused to a spot on the sample.

IPC Classes  ?

27.

AUTOMATED MULTIPLE LOCATION SAMPLING ANALYSIS SYSTEM

      
Application Number US2014012060
Publication Number 2014/113680
Status In Force
Filing Date 2014-01-17
Publication Date 2014-07-24
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details

28.

HANDHELD LIBS SPECTROMETER

      
Application Number US2014016188
Publication Number 2014/113824
Status In Force
Filing Date 2014-02-13
Publication Date 2014-07-24
Owner SCIAPS, INC. (USA)
Inventor
  • Day, David, R.
  • Derman, Konstantin
  • Egan, John, Francis
  • Soucy, Paul, Edward

Abstract

A handheld LIBS spectrometer includes an optics stage movably mounted to a housing and including a laser focusing lens and a detection lens. One or more motors advance and retract the optics stage, move the optics stage left and right, and/or move the optics stage up and down. A laser source in the housing is oriented to direct a laser beam to the laser focusing lens. A spectrometer subsystem in the housing is configured to receive electromagnetic radiation from the detection lens and to provide an output. A controller subsystem is responsive to the output of the spectrometer subsystem and is configured to control the laser source and motors. In this way, auto-calibration, auto-clean, and auto-focus, and/or moving spot functionality is possible.

IPC Classes  ?

  • G01N 21/63 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
  • G01J 3/443 - Emission spectrometry

29.

Micro purge of plasma region

      
Application Number 13746095
Grant Number 09036146
Status In Force
Filing Date 2013-01-21
First Publication Date 2014-07-24
Grant Date 2015-05-19
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system includes a laser source generating a laser beam for creating a plasma at a location on a sample. A spectrometer is responsive to photons emitted by the sample at said location and has an output. At least one nozzle is configured to deliver inert gas from a source locally to the location on the sample. A controller is responsive to a trigger signal and is configured to activate the laser source generating a series of laser pulses, open a valve to purge the location locally on the sample, and close the valve after one or more laser pulses.

IPC Classes  ?

  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself
  • G01J 3/443 - Emission spectrometry

30.

Automated multiple location sampling analysis system

      
Application Number 13746108
Grant Number 09243956
Status In Force
Filing Date 2013-01-21
First Publication Date 2014-07-24
Grant Date 2016-01-26
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.

IPC Classes  ?

  • G01J 3/00 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours
  • G01J 3/443 - Emission spectrometry
  • G01J 3/06 - Scanning arrangements
  • H01L 21/66 - Testing or measuring during manufacture or treatment
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/44 - Raman spectrometry; Scattering spectrometry

31.

Automated focusing, cleaning, and multiple location sampling spectrometer system

      
Application Number 13746110
Grant Number 09267842
Status In Force
Filing Date 2013-01-21
First Publication Date 2014-07-24
Grant Date 2016-02-23
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system includes a moveable focusing lens, a laser (typically an eye safe laser) having an output directed at the focusing lens, and a spectrometer outputting intensity data from a sample. A controller system is responsive to the spectrometer and is configured to energize the laser, process the output of the spectrometer, and adjust the position of the focusing lens relative to the sample until the spectrometer output indicates a maximum or near maximum intensity resulting from a laser output focused to a spot on the sample.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/443 - Emission spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01N 21/65 - Raman scattering

32.

MICRO PURGE OF PLASMA REGION

      
Application Number US2014011961
Publication Number 2014/113622
Status In Force
Filing Date 2014-01-17
Publication Date 2014-07-24
Owner SCIAPS, INC. (USA)
Inventor Day, David

Abstract

An analysis system includes a laser source generating a laser beam for creating a plasma at a location on a sample. A spectrometer is responsive to photons emitted by the sample at said location and has an output. At least one nozzle is configured to deliver inert gas from a source locally to the location on the sample. A controller is responsive to a trigger signal and is configured to activate the laser source generating a series of laser pulses, open a valve to purge the location locally on the sample, and close the valve after one or more laser pulses.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01J 3/30 - Measuring the intensity of spectral lines directly on the spectrum itself

33.

Dual source system and method

      
Application Number 13507654
Grant Number 09285272
Status In Force
Filing Date 2012-07-17
First Publication Date 2014-01-23
Grant Date 2016-03-15
Owner SciAps, Inc. (USA)
Inventor Sackett, Don

Abstract

A dual source system and method includes a high power laser used to determine elemental concentrations in a sample and a lower power device used to determine compounds present in the sample. A detector subsystem receives photons from the sample after laser energy from the high power laser strikes the sample and provides a first signal. The detector subsystem then receives photons from the sample after energy from the lower power device strikes the sample and provides a second signal. The high power laser is pulsed and the first signal is processed to determine elemental concentrations present in the sample. The lower power device is energized and the second signal is processed to determine compounds present in the signal. Based on the elemental concentrations and the compounds present, the compounds present in the sample are quantified.

IPC Classes  ?

  • G01J 3/42 - Absorption spectrometry; Double-beam spectrometry; Flicker spectrometry; Reflection spectrometry
  • G01J 3/44 - Raman spectrometry; Scattering spectrometry
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/18 - Generating the spectrum; Monochromators using diffraction elements, e.g. grating
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/443 - Emission spectrometry
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
  • G01N 21/65 - Raman scattering

34.

Dual source analyzer with single detector

      
Application Number 13591907
Grant Number 09970876
Status In Force
Filing Date 2012-08-22
First Publication Date 2014-01-23
Grant Date 2018-05-15
Owner SciAps, Inc. (USA)
Inventor Sackett, Donald W.

Abstract

A dual source system and method includes a high power laser used to determine elements in a sample and a lower power device used to determine compounds present in the sample. An optical subsystem directs photons from a sample to a detector subsystem after laser energy from the laser strikes the sample along an optical path. After energy from the device strikes the sample protons are directed to the detector subsystem along the same optical path. The detector subsystem receives photons after laser energy from the laser strikes the sample and provides a first signal, and receives photons after energy from the device strikes the sample and provides a second signal. A controller subsystem pulses the high power laser and processes the first signal to determine elements present in the sample, energizes the lower power device and processes the second signal to determine compounds present in the sample.

IPC Classes  ?

  • G01J 3/42 - Absorption spectrometry; Double-beam spectrometry; Flicker spectrometry; Reflection spectrometry
  • G01N 21/65 - Raman scattering
  • G01J 3/44 - Raman spectrometry; Scattering spectrometry
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/18 - Generating the spectrum; Monochromators using diffraction elements, e.g. grating
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/443 - Emission spectrometry
  • G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
  • G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

35.

SCIAPS

      
Serial Number 76713643
Status Registered
Filing Date 2013-03-07
Registration Date 2014-07-01
Owner Sciaps, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Scientific apparatus, namely, spectrometers and parts and fittings therefor

36.

Optical beam spectrometer with movable lens

      
Application Number 13286181
Grant Number 08373856
Status In Force
Filing Date 2011-10-31
First Publication Date 2012-02-23
Grant Date 2013-02-12
Owner SCIAPS, INC. (USA)
Inventor
  • Carron, Keith T.
  • Watson, Mark
  • Buller, Shane

Abstract

A spectroscopic system is described that provides at least one of focus of an excitation beam onto a sample, automatic focus of an optical system of the spectroscopic system for collecting a spectroscopic signal, and/or averaging of excitation intensity over a surface area of the sample.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometry; Scattering spectrometry

37.

Optical beam spectrometer with movable lens

      
Application Number 12268419
Grant Number 08125637
Status In Force
Filing Date 2008-11-10
First Publication Date 2009-05-28
Grant Date 2012-02-28
Owner SCIAPS, INC. (USA)
Inventor
  • Carron, Keith T.
  • Watson, Mark
  • Buller, Shane

Abstract

A spectroscopic system is described that provides at least one of focus of an excitation beam onto a sample, automatic focus of an optical system of the spectroscopic system for collecting a spectroscopic signal, and/or averaging of excitation intensity over a surface area of the sample.

IPC Classes  ?