A testing device for testing a high or medium-voltage cable comprises a circuit arrangement with a test voltage generator, which comprises a low voltage-side earthing input and a high voltage-side output and is designed to provide a variable test voltage, a test specimen connection for connecting the high voltage-side output to a conductor of the cable, a protective earth connector for connecting to protective earth, a connecting conductor which electrically connects the low-voltage-side earth input to the protective earth connector, so that the connecting conductor represents a current collection point through which a measuring current flows during the test, and a high-frequency signal pick-up at the current collection point, at which a high-frequency pre-location signal is generated based on the measuring current. The testing device comprises evaluation electronics connected to the high-frequency signal pick-up for recording the high-frequency pre-location signal and is designed for defect distance evaluation.
A high-powered, high-voltage test device for generating a test voltage, wherein the test voltage is an alternating voltage having an amplitude of at least 100 kV at a power of greater than 1 kW, wherein the device has at least two voltage amplifier branches, of which a first voltage amplifier branch contributes to generating the positive voltage half-cycles of the test voltage and a second voltage amplifier branch contributes to generating the negative voltage half-cycles of the test voltage. The high-voltage test device furthermore has a measurement circuit for measuring the test voltage to be applied to a measurement object and the test current consequently caused in the measurement object and is characterized in that each voltage amplifier branch is installed in a separate assembly having integrated active air cooling.
G01R 31/10 - Locating faults in cables, transmission lines, or networks by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme
G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G01R 31/12 - Testing dielectric strength or breakdown voltage
A mobile tester is provided for “Very Low Frequency” (VLF) testing of a measurement object, which has means for generating an AC voltage which has an effective amplitude of greater than or equal to 1 kV and a frequency in the range of between 0.01 and 1 Hz, a connection element for connecting the measurement object, and means for measuring and evaluating the test voltage applied to the measurement object and the test current caused thereby. In a first operating mode, the tester autonomously carries out a VLF test using the test voltage generated. The tester also has a communication interface for emitting a synchronization signal or for receiving an externally generated synchronization signal, and the tester is set up, in a second operating mode, to synchronize the generated test voltage with the test voltage generated by at least one further tester of the same type.
G01R 31/08 - Locating faults in cables, transmission lines, or networks
G01R 31/12 - Testing dielectric strength or breakdown voltage
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
4.
Circuit assembly, method for producing a test voltage, and testing device for determining a loss factor, which testing device contains said circuit assembly
A circuit assembly is provided for producing a test voltage for testing a test object, comprising two high voltage sources for producing a positive and negative high voltage of variable amplitude at respective outputs thereof and a high voltage switch assembly, which is arranged between the outputs of the two high voltage sources and the test object and which can be switched suitably in order to successively charge and discharge the test object, wherein furthermore a closed-loop controller is provided, which measures the present test voltage on the test object and acts on the high-voltage switch assembly in order to charge and discharge the test object in a defined manner in dependence on the measured test voltage.
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
G01R 31/12 - Testing dielectric strength or breakdown voltage
H02M 1/088 - Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
H02M 3/335 - Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
The invention relates to a high-powered, high-voltage test device (1) comprising means for generating a test voltage, wherein the test voltage is an alternating voltage having an amplitude of at least 100 kV at a power of greater than 1 kW. Said means for generating the test voltage have at least two voltage amplifier branches (4, 5), of which a first voltage amplifier branch (4) contributes to generating the positive voltage half-cycles of the test voltage and a second voltage amplifier branch (5) contributes to generating the negative voltage half-cycles of the test voltage. The high-voltage test device (1) furthermore has a measurement circuit (17, 23, 24) for measuring the test voltage to be applied to a measurement object and the test current consequently caused in the measurement object and is characterized in that each voltage amplifier branch (4, 5) is installed in a separate assembly (26, 27) having integrated active air cooling.
G01R 31/16 - Construction of testing vesselsElectrodes therefor
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
The present invention relates to a mobile tester (2) for the VLF testing ("Very Low Frequency" testing) of a measurement object (3), in particular a high-voltage or medium-voltage cable, which has means for generating an AC voltage which is used as the test voltage and has an effective amplitude of greater than or equal to 1 kV and a frequency in the range of between 0.01 and 1 Hz, a connection element (9) for connecting the measurement object (3) to which the test voltage is to be applied, and means for measuring and evaluating the test voltage applied to the measurement object and the test current caused thereby. In a first operating mode, the tester (2) is set up to autonomously carry out a VLF test using the test voltage generated thereby. The tester (2) also has a communication interface (17) for emitting a synchronization signal (S) and/or for receiving an externally generated synchronization signal (S), and the tester is set up, in a second operating mode (parallel operating mode), to synchronize the generated test voltage with the test voltage generated by at least one further tester (2) of the same type on the basis of the synchronization signal (S).
H02M 7/493 - Conversion of DC power input into AC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode the static converters being arranged for operation in parallel
G01R 31/12 - Testing dielectric strength or breakdown voltage
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
7.
CIRCUIT ASSEMBLY, METHOD FOR PRODUCING A TEST VOLTAGE, AND TESTING DEVICE FOR DETERMINING A LOSS FACTOR, WHICH TESTING DEVICE CONTAINS SAID CIRCUIT ASSEMBLY
The invention relates to a circuit assembly (1) for producing a test voltage for testing a test object (2), comprising two high-voltage sources (3, 4) for producing a positive and negative high voltage of variable amplitude at respective outputs (5, 6) thereof and a high-voltage switch assembly (7), which is arranged between the outputs (5, 6) of the two high-voltage sources (3, 4) and the test object (2) and which can be switched suitably in order to successively charge and discharge the test object (2), wherein furthermore a closed-loop controller (8) is provided, which measures the present test voltage on the test object (2) and acts on the high-voltage switch assembly (7) in order to charge and discharge the test object (2) in a defined manner in dependence on the measured test voltage. According to the invention, the closed-loop controller (8) does not act on the two high-voltage sources (3, 4), and a separate open-loop controller (14) is provided for the two high-voltage sources (3, 4), wherein the open-loop controller (14) produces a clock signal (T) that is independent of the voltage on the test object (2), such that a synchronized, predefined high voltage (U1, U2) not influenced by the closed-loop controller (8) is provided by the high-voltage sources (3, 4).
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G01R 31/12 - Testing dielectric strength or breakdown voltage
H02M 7/49 - Combination of the output voltage waveforms of a plurality of converters
H02M 7/493 - Conversion of DC power input into AC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode the static converters being arranged for operation in parallel
H02M 7/497 - Conversion of DC power input into AC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode sinusoidal output voltages being obtained by combination of several voltages being out of phase
8.
DEVICE AND METHOD FOR DIAGNOSING TEST OBJECTS USING A MEASURING VOLTAGE
The invention relates to a device (1) for diagnosing test objects (2, 3, 4) using a measuring voltage that acts on the corresponding test object (2, 3, 4), comprising a high-voltage generator (5) for generating the measuring voltage and an electric measuring circuit (7) for carrying out the diagnosis. A device (1) is equipped to simultaneously diagnose at least two test objects (2, 3, 4), said device having a plurality of separate connecting elements (11, 12, 13) that lie on a measuring voltage potential for this purpose. Each test object (2, 3, 4) is associated with one of the connecting elements (11, 12, 13). The measuring circuit (7) has a voltage detecting device (34) for measuring the measuring voltage that is applied to each connecting element (11, 12, 13) in equal measure and a plurality of current detecting devices (23, 24, 25). The current detecting devices (23, 24, 25) lie on a measuring voltage potential, and each said current detecting device is in contact with a connecting element (11, 12, 13) in order to simultaneously measure the current that can be assigned to each test object (2, 3, 4). Furthermore, the device has at least one connecting cable (14) that is at least 10 meters long for connecting the test objects (2, 3, 4) to the connecting elements (11, 12, 13) that are respectively associated therewith. In addition to one or more wire(s) that are attached to the respective test object, the at least one connecting cable (14) has another wire that is not used for contacting a test object (2, 3, 4). Said wire is likewise attached to a connecting element (10) on the device (1); a leakage current that occurs in the connecting cable (14) can be fed via said wire to a leakage current discharge (19) or a leakage current detector that is disposed on the measuring circuit side.
A high-voltage transformer for providing an alternating voltage in the kV range, comprising at least one secondary winding wound on a coil carrying body surrounding a transformer core, and an insulation housing encapsulating the secondary winding is provided to electrically insulate the secondary winding. Said insulation housing is walled by the coil carrying body carrying the secondary winding and by an enveloping body made of plastic and enveloping the secondary winding so that an annular gap is formed, wherein the annular gap between the secondary winding and the enveloping body is filled with an insulating fluid. The annular gap has a gap width of less than or equal to 20 mm viewed in the cross-section, and the enveloping body has a wall thickness of less than or equal to 20 mm, wherein the plastic is polypropylene, and a separate expansion volume is not provided for the insulating fluid.
A device for diagnosing measurement objects using a measurement voltage comprises a housing (2), in which at least one electric measurement circuit (3) is arranged for carrying out the diagnosis. To this end, the device is designed for the simultaneous diagnosis of a plurality of measurement objects using the same measurement voltage and comprises at least two separate connecting elements (5a, 5b, 5c) for connecting one measurement object each to the measurement voltage. The measurement circuit (2) in turn comprises at least two current detection units (20a, 20b, 20c) and a voltage detection unit (26), by means of which the current flowing through each measurement object and the measurement voltages present at all measurement objects can be measured at the same time.
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
11.
Portable high-voltage test instrument with housing
A portable high-voltage test instrument comprises an electronic unit having means for producing a test voltage located in the kV range, a control area cooperating with the electronic unit, at least one terminal for the component or cable to be tested and for an external voltage supply, a housing for permanently accommodating the electronic unit and a cooling system, disposed inside the housing, for cooling the electronic unit, the cooling system comprising an air-cooled assembly having an air inlet and an air outlet. This housing is provided with a lid part that can be moved between an open and a closed position, such that all terminals, the control area and the air inlet and air outlet are covered in closed position thereof, whereas all terminals, the control area and the air inlet and air outlet are unobstructed in open position thereof.
In a high-voltage transformer (1) for providing an alternating voltage in the kV range, comprising at least one secondary winding (12), which is wound on a coil carrying body (11) surrounding a transformer core (2), an insulation housing (5, 6) encapsulating the secondary winding (12) is provided to electrically insulate the secondary winding (12). Said insulation housing is walled by the coil carrying body (11) carrying the secondary winding (12) and by an enveloping body (14) made of plastic and enveloping the secondary winding (12) so that an annular gap (13) is formed, wherein the annular gap (13) between the secondary winding (12) and the enveloping body (14) is filled with an insulating fluid. The annular gap (13) filled with insulating fluid has a gap width of less than or equal to 20 mm viewed in the cross-section, and the enveloping body (14) has a wall thickness of less than or equal to 20 mm, wherein the plastic is polypropylene, and a separate expansion volume is not provided for the insulating fluid.
A mobile high-voltage test set (1) comprises electronics (24) having means for producing a test voltage in the kilovolt range, a control area (3) which interacts with the electronics (24), at least one connection (4, 5) for the component or cable to be tested and for an external voltage supply, a housing (2) for permanent accommodation of the electronics (24), and a cooling system, which is arranged within the housing (2), in order to cool the electronics (24), which cooling system comprises air cooling with an air inlet (13) and an air outlet (14). In this case, the housing (2) has a cover part (7) which can be moved between an open position and a closed position and which, when in its closed position, covers all the connections (4, 5), the control area (3) and the air inlet (13) and air outlet (14), while, in its open position, all the connections (4, 5), control area (3) and the air inlet (13) and air outlet (14) are uncovered.
The invention relates to an arrangement comprising at least one electronic component and a cooling body associated therewith. A support physically interposed between the electronic component and the cooling body and the support has at least one layer with at least one material of an electric strength of at least 10 kV/mm and a thermal conductivity of at least 5 W/mK. At least one recess and/or at least one protruding element is arranged in and/or on the layer of the support, and is configured in such a manner that it extends, along the surface of the layer of the support, through preferably all electrically possible pathways between the electronic component and the cooling body as compared to the condition of the layer of the support without the recess and/or without the protruding element.
The invention relates to an arrangement comprising at least one electronic component (1) and a cooling body (3) associated therewith and a support physically interposed between the electronic component (1) and the cooling body (3) and having at least one layer (2) with at least one material of an electric strength of at least 10 kV/mm and a thermal conductivity of at least 5 W/mK. At least one recess (5) and/or at least one protruding element is arranged in and/or on the layer (2) of the support and is configured in such a manner that it extends, along the surface of the layer (2) of the support, preferably all electrically possible pathways between the electronic component (1) and the cooling body as compared to the condition of the layer (2) of the support without the recess (5) and/or without the protruding element.
Disclosed is a device for measuring the loss factor and/or measuring the phase angle between a voltage and a current and/or recording a voltage decay and/or current decay and/or recording partial discharge processes and/or measuring the propagation time on test objects that are to be tested. Said device comprises a housing in which at least one measuring circuit is arranged for measuring and/or recording purposes. A terminal adapter (12) is provided on the housing (9) to connect the test object that is to be tested directly to the housing (9).
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