A universal power probe fixture (UPPF) that is configured to be installed into a power signal path between a source device and a load device has one or more UPPF base modules, each UPPF base module including an input terminal block, an output terminal block, and a power transfer circuit including a multiple signal lines electrically connected between the input terminal block and the output terminal block, the signal lines structured to convey high power, and each of the signal lines includes a current probe connection point and at least one voltage probe connection point. The UPPF also has a source device connector adapted to electrically connect the source device to the input terminal block, and a load device connector adapted to electrically connect the load device to the output terminal block. A test system using the UPPF, and an application-specific electric vehicle motor probe adapter are also disclosed.
A universal power probe fixture (UPPF) that is configured to be installed into a power signal path between a source device and a load device has one or more UPPF base modules, each UPPF base module including an input terminal block, an output terminal block, and a power transfer circuit including a multiple signal lines electrically connected between the input terminal block and the output terminal block, the signal lines structured to convey high power, and each of the signal lines includes a current probe connection point and at least one voltage probe connection point. The UPPF also has a source device connector adapted to electrically connect the source device to the input terminal block, and a load device connector adapted to electrically connect the load device to the output terminal block. A test system using the UPPF, and an application-specific electric vehicle motor probe adapter are also disclosed.
A power vector analyzer to analyze power from a device under test (DUT) includes one or more channels to measure a reference voltage signal from a power line connected to the DUT, one or more channels to measure a reference current signal from the power line, a user interface comprising a display and one or more controls, and a quadrature synchronous detector (QSD) for each phase of apparent power being measured, the QSD configured to use a reference voltage signal from the one or more channels and a reference current signal from the one or more channels to determine the apparent power for each phase of power being measured by the DUT and display the apparent power for each phase on the display.
G01R 31/319 - Tester hardware, i.e. output processing circuits
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
4.
SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDER TEST USING MACHINE LEARNING
A test and measurement instrument includes one or more ports to allow the test and measurement instrument to receive a signal from a device under test (DUT), a user interface to allow the user to send inputs to the test and measurement instrument and receive results, and one or more processors configured to acquire the signal from the DUT, make measurements on the signal to create a decimated measurement set, convert the decimated measurement set into a tensor, send the tensor to a machine learning network, and receive a pass/fail value from the machine learning network. A method includes acquiring a signal from a device under test (DUT), making measurements on the signal to create a decimated measurement set, convert the decimated measurement set into a tensor, sending the tensor to a machine learning network, and receiving a pass/fail value from the machine learning network.
Systems and methods implement measuring, in a test and measurement instrument, operational signal timing parameters of electrical signals being communicated over an electrical bus by a device under test. A bus timing characteristics analyzer identifies nominal signal timing parameters for the acquired electrical signals. The nominal signal timing parameters are defined by the bus protocol and defining timing criteria for the electrical signals. The analyzer measures operational signal timing parameters for each of the acquired electrical signals and compares, for each of the electrical signals, the operational signal timing parameters to the nominal signal timing parameters to determine whether the operational signal timing parameters satisfy the timing criteria. The analyzer then displays, on the test and measurement instrument, a visual indication for each of the electrical signals indicating whether the operational signal timing parameters for the electrical signal satisfy the timing criteria.
An oscilloscope includes input channels for receiving at least one voltage signal and at least one current signal from at least one component of a photovoltaic power system under test (SUT), a user interface including a display and one or more controls for receiving one or more test configuration settings from a user, and one or more processors configured to acquire waveforms of the at least one voltage signal and the at least one current signal, and implement a photovoltaic power system compliance test module that automatically determines, in real-time, one or more SUT performance measurements based on the acquired voltage and current waveforms and the one or more test configuration settings, displays, in real-time, the one or more SUT performance measurements to the user on the display. Methods of performing automated hardware-in-the-loop testing of a photovoltaic power system under test using an oscilloscope are also disclosed.
A connector assembly that includes an electrical connector having a connector conductor, a connector housing, a PCB substrate bonded to a base, positioning pads extending away from the PCB substrate, and metallic bumps extending away from the PCB substrate. The connector housing has a housing conductor that is electrically connected to the connector conductor. The PCB substrate is brittle, and the housing conductor contacts an electrical signal path on the PCB substrate at an oblique angle. The positioning pads keep the mounting face of the connector housing away from the PCB substrate at a standoff distance. The metallic bumps are malleable and configured to provide an electrical connection between the PCB substrate and the mounting face of the connector housing.
H01R 43/18 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for manufacturing bases or cases for contact members
8.
USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE FOR SIGNAL CAPTURE AND STORAGE
A test and measurement instrument includes an antenna to receive signals containing symbols from a system under test (SUT), one or more analog-to-digital converters (ADC) to sample the signals received from the SUT, a memory to selectively store samples from the ADC, and one or more processors configured to execute code that causes the one or more processors to: receive samples from the ADC, analyze the samples from the ADC to determine whether one or more of the symbols received from the SUT has exceeded an expected modulation boundary for the one or more symbols; identifying a time at which the one or more symbols exceeded the expected modulation boundary as a trigger time; and store samples from a predetermined window of time surrounding the trigger time in the memory.
A margin tester includes one or more ports to allow the margin tester to connect to a device under test (DUT), a memory, the memory containing a margin tester signature, a transmitter, a receiver to receive signals from the DUT, one or more processors configured to execute code that causes the one or more processors to: receive multiple signals from the receiver through the one or more ports, generate a performance indicator from the multiple signals, send the performance indicator and the margin tester signature to one or more machine learning networks, and receiving a result from the one or more machine learning networks containing a performance measurement prediction for the DUT.
A wideband signal generator has one or more digital-to-analog converters (DAC), each of the one or more DACs having one or more pipes and a sample rate, a multiplexer to receive analog outputs from at least two pipes from the one or more DACs and multiplex the analog outputs and zero into an output stream, a bandpass filter to receive the output stream and filter out frequency components in the output stream that are outside a target frequency band and produce a radio frequency (RF) output signal in the in the target frequency band, and one or more processors configured to execute code that causes the one or more processors to generate digital samples and transfer the digital samples to the one or more DACs, the digital samples generated to produce analog outputs that cause the RF output signal to match the target RF frequency band.
Methods and systems provide access to acquired waveforms from a test and measurement instrument for multiple users. A method includes storing acquired waveforms from the instrument in a cloud-based platform and rendering, on a display of a first remote user device, a timeline illustrating in chronological order each acquired waveform from the instrument in response to the acquired waveform being stored in the cloud-based platform. An acquired waveform on the timeline is selected for viewing and at least one user-selectable feature view configured to display corresponding characteristics of the selected acquired waveform. A file from the cloud-based platform is received including data for the at least one user-selectable feature view and the configurable viewing window including the at least one user-selectable feature view using the file received is rendered on the first remote user device. The configurable viewing window may be shared with at least one other remote user device.
A test and measurement instrument has an input to receive a signal under test having a repeating pattern. one or more analog-to-digital converters (ADC) to sample the signal under test at a sample rate over many repeating patterns to digitize the signal, one or more processors configured to execute code to cause the one or more processors to: recover a clock from the sampled signal under test, use the clock to generate an original pattern waveform, interpolate and resample from the original pattern waveform to generate an evenly time-spaced pattern waveform, apply an equalizer to the evenly time-spaced pattern waveform to produce an equalized pattern waveform, interpolate and resample from the equalized pattern waveform to produce a new waveform having equalized samples at sample times of the sampled signal under test, recover an updated clock from the new waveform, and use the updated clock to produce an updated waveform.
A test and measurement instrument includes one or more ports to allow the test and measurement instrument to receive data from a device under test (DUT), a connection to a machine learning network, a display configured to display a user interface, one or more controls to allow the test and measurement instrument to receive inputs from a user, and one or more processors configured to execute code that causes the one or more processors to: render a menu on the display that displays different types of tensors, receive, from the one or more controls, a user selection that identifies a selected type of tensor, and build the selected type of tensor from the data from the DUT and send the selected type of tensor to the machine learning network. A method of providing a user interface is also disclosed.
G06F 3/0482 - Interaction with lists of selectable items, e.g. menus
G06F 3/0484 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
A heat spreader may include a body having a first surface and a second surface opposite the first surface. Also, the heat spreader may include a wall disposed along a perimeter of the body, the wall extending from the first surface, the wall having a plurality of cut-outs. Furthermore, the heat spreader may include at least one channel extending from a first edge of the body to a second edge of the body parallel to the first edge, where the at least one channel disposed in a first cut-out of a first side of the wall and in a second cut-out of a second side of the wall opposite the first side.
A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.
A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.
A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.
A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.
A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die
A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.
A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.
A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die
A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.
A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.
A broadband balun structure has a single-ended port, a balanced port, a first transmission line connected between the single-ended port and one side of the balanced port, and a second transmission line connected to the other side of the balanced port, the first transmission line positioned to allow coupling of a first portion of the first transmission line simultaneously to both a second portion of the first transmission line and a portion of the second transmission line. A broadband balun structure includes a 180° hybrid using coupled-line structures, and a phase-shift network using coupled-line structures, the coupled-line structures positioned to couple at least one line section simultaneously to two other line sections. A test and measurement system and a test and measurement instrument, and at least one balun structure.
A test and measurement system for a frequency-hopping communication system includes a radio frequency antenna structured to receive a signal from a frequency-hopping data transmitting device including at least two frames of data in which the at least two frames of data are sent at two or more unique radio frequencies, and a decoder structured to decode the at least two frames of data without prior knowledge at which radio frequencies the frequency-hopping device were to be sent. Methods are also described.
A test and measurement instrument includes one or more channels to receive a signal under test, each channel comprising an input port, a filter, and a sampler, at least one analog-to-digital converter (ADC), the at least one ADC having two pipes connected to the sampler of one of the one or more channels, the at least one ADC to produce digital samples of the signal at a sample rate, and one or more processors configured to execute code that causes the one more processors to acquire a spectrum of the digital samples for each pipe in the at least one ADC, and use the spectrums of the digital samples for each pipe in the at least one ADC to reconstruct the spectrum of the signal under test. A method of operating a test and measurement instrument, and a method a method of calibrating a test and measurement instrument is included.
A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.
G01R 1/20 - Modifications of basic electric elements for use in electric measuring instrumentsStructural combinations of such elements with such instruments
A communication network has multiple nodes, each node having one or more antennas, one or more input ports to receive communication signals from the antenna, a memory to store data associated with the communication signals, and one or more processors to gather local data about an environment, communicate with other nodes as needed, and use the local data to determine optimized operational settings for the node. A sensor device has one or more antennas to receive communication signals from other nodes in a communication network, one or more input ports to receive the communication signals, one or more output ports to transmit communication signals, a memory to store data associated with the communication signals, and one or more processors to determine a position of the sensor, transmit signals, receive return signals, produce return signal data, and use a machine learning system on the return signal data to identify unblocked ports.
A reconfigurable, automatically self-adjusting test and measurement instrument includes an interface configured to receive one or more static data preconditions for data received in an input signal and one or more dynamic data preconditions for data received in the input signal, the one or more static data preconditions and dynamic data preconditions defining one or more rules for data received during an input signal acquisition period to conform; and one or more processors configured to receive the one or more static and dynamic data preconditions, configure testing parameters of the test and measurement instrument to satisfy the one or more static preconditions, acquire the input signal, and analyze data received in the input signal to determine whether the one or more dynamic data preconditions are met.
A receiver test and measurement system includes a signal generator to provide a stressed signal. The stressed signal needs to be calibrated as per specification for several parameters. Some parameters including a set of two or more equalization parameters can be calibrated by a test and measurement instrument that captures the stressed signal and executes a calibration operation. A multi-variable model is created establishing a relationship between parameters that are set in the signal generator and the measured values of these parameters in a test and measurement equipment like an oscilloscope. The multi-variable model calculates coefficients that allows us to calculate setting values that need to be set in the signal generator for any desired combination of two or more equalization parameters. This allows receiver tests to be done for any combination of desired equalization parameters in a calibrated manner.
A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.
A test and measurement system includes a radio frequency antenna structured to receive a wireless carrier signal generated by an NFC vicinity coupling device and to receive load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards in response to the wireless carrier signal, and a response detector structured to determine if any load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards were received by the antenna. The response detector may use cross-correlation to determine if the load-modulated wireless carrier signals are present.
H04B 5/73 - Near-field transmission systems, e.g. inductive or capacitive transmission systems specially adapted for specific purposes for taking measurements, e.g. using sensing coils
A receiver test and measurement system includes a signal generator to provide a stressed signal. The stressed signal needs to be calibrated as per specification for several parameters. Some parameters including a set of two or more equalization parameters can be calibrated by a test and measurement instrument that captures the stressed signal and executes a calibration operation. A multi-variable model is created establishing a relationship between parameters that are set in the signal generator and the measured values of these parameters in a test and measurement equipment like an oscilloscope. The multi-variable model calculates coefficients that allows us to calculate setting values that need to be set in the signal generator for any desired combination of two or more equalization parameters. This allows receiver tests to be done for any combination of desired equalization parameters in a calibrated manner.
A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.
H04B 5/73 - Near-field transmission systems, e.g. inductive or capacitive transmission systems specially adapted for specific purposes for taking measurements, e.g. using sensing coils
38.
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIPLE SIGNALS IN A MEMORY CHIP
A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.
A test and measurement instrument includes one or more ports to allow the instrument to connect to a DUT, a memory, a user interface including a display to display waveform signals received from the DUT and controls to allow a user to select settings for the instrument, and one or more processors configured to execute code that causes the one or more processors to: receive a signal from the DUT having multiple signal levels and multiple jitter thresholds; and adjust each measurement of the signal from the DUT using a jitter compensation value for each jitter threshold to produce a final measurement. A method includes receiving a waveform signal having multiple signal levels and multiple jitter thresholds from a device under test (DUT), and adjusting measurements of each level of the signal using a jitter compensation value for each level to produce final measurements.
A method of characterizing a communication channel includes receiving a first signal from a set of transmitters reflected along a reflected channel from each element of a reconfigurable intelligent surface (RIS) set at a nominal angle, receiving a second signal reflected in the reflected channel from each element of the RIS set at an adjusted angle, using the first and second signals to determine a transfer function for a combined channel comprised of a reflected channel and a direct channel, and using the transfer function as an input to a machine learning network to determine optimized settings for the elements of the RIS. A communications system includes a set of transmitters, a reconfigurable intelligent surface (RIS), one or more receivers positioned to receive signals reflected by the RIS from the set of transmitters, and a machine learning system configured to produce optimized angles for elements of the RIS.
H04B 7/04 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
A test and measurement system includes a test and measurement instrument, including a port to receive a signal from a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: adjust a set of operating parameters for the DUT to a first set of reference parameters; acquire, using the test and measurement instrument, a waveform from the DUT; repeatedly execute the code to cause the one or more processors to adjust the set of operating parameters and acquire a waveform, for each of a predetermined number of sets of reference parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted optimal operating parameters; adjust the set of operating parameters for the DUT to the predicted optimal operating parameters; and determine whether the DUT passes a predetermined performance measurement when adjusted to the set of predicted optimal operating parameters.
H04B 10/073 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an out-of-service signal
H04B 10/077 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an in-service signal using a supervisory or additional signal
A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the low resolution ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.
A method of training a machine learning system to determine operating parameters for optical transceivers includes connecting the transceiver to a test and measurement device, tuning the transceiver with a set of parameters, capturing a waveform from the transceiver, sending the waveform and the set of parameters to a machine learning system, and repeating the tuning, capturing, and sending until a sufficient number of samples are gathered.
H04B 10/079 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
H04B 10/07 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems
H04B 10/077 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using an in-service signal using a supervisory or additional signal
A machine learning management system includes a repository having one or more partitions, the one or more partitions being separate from others of the partitions, a communications interface, and one or more processors configured to execute code to: receive a selected model and associated training data for the selected model through the communications interface from a customer; store the selected model and the associated training data in a partition dedicated to the customer; and manage the one or more partitions to ensure that the customer can only access the customer's partition. A method includes receiving a selected model and associated training data for the selected model from a customer, storing the selected model and the associated training data in a partition dedicated to the customer in a repository, and managing the one or more partitions to ensure that the customer can only access the partition dedicated to the customer.
A test and measurement instrument includes a port to connect to a device under test (DUT) to receive waveform data, a connection to a machine learning network, and one or more processors configured to: receive one or more inputs about a three-dimensional (3D) tensor image; scale the waveform data to fit within the 3D tensor image; build the 3D tensor image; send the 3D tensor image to the machine learning network; and receive a predictive result from the machine learning network. A method includes receiving waveform data from one or more device under test (DUT), receiving one or more inputs about a three-dimensional (3D) tensor image, scaling the waveform data to fit within the 3D tensor image, building the 3D tensor image, sending the 3D tensor image to a pre-trained machine learning network, and receiving a predictive result from the machine learning network.
An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuity receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.
H04B 10/80 - Optical aspects relating to the use of optical transmission for specific applications, not provided for in groups , e.g. optical power feeding or optical transmission through water
H04Q 11/00 - Selecting arrangements for multiplex systems
50.
INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF TX, CHANNEL, AND RX MODELS FROM MULTIPLE VENDORS
A test system includes a repository of component models containing characteristic parameters for each component model, one or more processors to receive a list of selected component models through a user interface to be tested as a combination, access the characteristic parameters for each selected component model, build a tensor image using the characteristic parameters, send the tensor image to one or more trained neural networks to predict interoperability of the combination, and receive a prediction about the combination. A method includes receiving a list of selected component models through a user interface to be tested as a combination, accessing characteristic parameters for the selected component models, building a tensor image for each combination of the selected component models, sending the tensor image to one or more trained neural networks to predict interoperability of the combination, and receiving a prediction about the combination.
09 - Scientific and electric apparatus and instruments
Goods & Services
Hardware and software, as a component feature of an oscilloscope for signal acquisition that optimizes the oscilloscope's noise floor based on the input signal frequency content.
52.
SPLIT-PATH MULTIPLEXING ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuitry receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.
G01R 1/20 - Modifications of basic electric elements for use in electric measuring instrumentsStructural combinations of such elements with such instruments
A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.
A testing system for performing Electrochemical Impedance Spectroscopy on a Unit Under Test (UUT) includes a function generator configured to apply a plurality of frequency components combined in a single burst or broadband stimulus to the UUT, and an oscilloscope having one or more processors configured to measure an amplitude ratio and phase difference between a voltage and a current of the UUT at a plurality of frequencies after the single burst or broadband stimulus of frequency components has been applied, generate a Nyquist plot of impendence values in both real and imaginary axes from the measured phase difference, and present the Nyquist plot at an output of the oscilloscope. Methods of operation are also described.
A waveform generator includes a carrier band generator to produce a carrier signal, one or more selectable frequency multipliers to receive the carrier signal and to output a selected carrier signal having a frequency of a multiple of the carrier signal, at least two main digital-to-analog converters (DACs), each main DAC to receive a digital in-phase (I) or quadrature (Q) signals, and to convert the digital I and Q signals to analog I and Q signals in accordance with a control signal, at least two offset DACs, each offset DAC to receive the digital I or Q signals to convert the digital I and Q signals to analog I and Q signals in accordance with the control signal, a mixer to mix the analog I and Q signals with the selected carrier signal to produce an output signal, and a variable filter configured to produce a filtered output signal.
A manufacturing system has a machine learning (ML) system having one or more neural networks and a configuration file associated with a trained neural network (NN), a structured data store having interfaces to the ML system a test automation application, a training store, a reference parameter store, a communications store, a trained model store, and one or more processors to control the data store to receive and store training data, allow the ML system to access the training data to train the one or more NNs, receive and store reference parameters and to access the reference parameters, receive and store prediction requests for optimal tuning parameters and associated data within the communication store, to provide requests to the ML system, allow the ML system to store trained NNs in the trained models store, and to recall a selected trained NN and provide the prediction to the test automation application.
G05B 13/02 - Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
58.
AD HOC MACHINE LEARNING TRAINING THROUGH CONSTRAINTS, PREDICTIVE TRAFFIC LOADING, AND PRIVATE END-TO-END ENCRYPTION
A machine learning network has a plurality of test and measurement devices, one or more of the test and measurement devices has one or more communication interfaces configured to allow the device to receive and process physical layer signals, a memory, and one or more processors configured to execute code to cause the one or more processors to receive physical layer data, perform one or more operations on the physical layer data according to a machine learning model to produce changed physical layer data, and transmit the changed physical layer data to at least one other node in the machine learning neural network. The machine learning network may include a learner node.
A test and measurement instrument includes an input configured to receive an input signal from a device under test (DUT), an output display, and one or more processors configured to execute code that causes the one or more processors to measure a noise component of the input signal, compensate the measured noise component based on the measurement population and a relative amount of noise generated by the test and measurement instrument and a total noise measurement, and produce the compensated measured noise component as a noise measurement on the output display. Methods are also described.
A machine learning network has a plurality of test and measurement devices, one or more of the test and measurement devices has one or more communication interfaces configured to allow the device to receive and process physical layer signals, a memory, and one or more processors configured to execute code to cause the one or more processors to receive physical layer data, perform one or more operations on the physical layer data according to a machine learning model to produce changed physical layer data, and transmit the changed physical layer data to at least one other node in the machine learning neural network. The machine learning network may include a learner node.
A customizable safety enclosure for a device under test (DUT) includes a plurality of non-conductive panels to enclose the DUT, and a plurality of non-conductive removeable corner joints each configured to secure a corner of the enclosure. A method of supplying a customized safety enclosure for a DUT to a customer includes receiving information from the customer about the DUT size and testing environment, fabricating one or more variable components of the enclosure, producing custom assembly instructions for the enclosure, packaging a plurality of components of the enclosure including the variable components and one or more fixed components, and sending the package of components and the custom assembly instructions to the customer.
A cable assembly has a connector to receive a signal, a cable connected to the connector, the cable having a length and one or more conductors along at least part of the length to conduct the signal, a magnetic material external to the one or more conductors, and an elastomer material external to the one or more conductors. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, one or more discrete magnetic components spaced along the length of the cable, and one or more elastomer components next to at least one of the one or more magnetic components. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, an elastomer material at least partially enclosing the cable, and a magnetic material at least partially enclosing the cable.
A customizable safety enclosure for a device under test (DUT) includes a plurality of non-conductive panels to enclose the DUT, and a plurality of non-conductive removeable corner joints each configured to secure a corner of the enclosure. A method of supplying a customized safety enclosure for a DUT to a customer includes receiving information from the customer about the DUT size and testing environment, fabricating one or more variable components of the enclosure, producing custom assembly instructions for the enclosure, packaging a plurality of components of the enclosure including the variable components and one or more fixed components, and sending the package of components and the custom assembly instructions to the customer.
A shunt resistor has a substrate having electrically conductive structures to carry current in a current path, a resistive portion in electrical contact with the electrically conductive structures, and one or more canceling inductance leads electrically connected to the electrically conductive structures and the resistive portion, the one or more canceling inductance configured to cancel inductive effects in a voltage measurement across the resistive portion. A modular tip interconnect has a connector at a first end of the interconnect configured to connect to a probe tip of a test and measurement instrument, and the above shunt resistor located at a second end of the interconnect configured to connect to a device under test (DUT).
H01C 7/00 - Non-adjustable resistors formed as one or more layers or coatingsNon-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
A test and measurement instrument includes an acquisition memory and a processor structured to store a stream of sampled incoming data samples in the acquisition memory. As the memory fills, the instrument automatically decimates either the data samples already stored in the acquisition memory, the incoming data samples, or both. The instrument may also store two copies of the incoming data samples, one at an increased decimation rate. The two copies are tied together with a timestamp or using other methods. The more highly decimated copy may be used to produce a video output of the stored data samples, saving the instrument from generating the video output from the larger sized sample.
A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.
An apparatus includes a fixed substrate having at least two contact structures, a movable substrate having at least two electrically conductive paths, a housing containing the fixed substrate and the movable substrate, a plurality of connectors in the housing, each connector connecting to one of the at least two contact structures to connect to ground and a spring contact, the plurality of connectors arranged to connect to at least one of the conductive paths depending upon a position of the movable substrate, and a motorized stage in the housing to move the movable substrate to align one of the at least two conductive paths to form a connection between two of the connectors. The apparatus may be part of a test and measurement instrument, and a method of operating the apparatus is also included.
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
68.
CURRENT MONITOR COMBINING A SHUNT RESISTOR WITH A ROGOWSKI COIL
A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski core. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt resistor. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.
G01R 15/18 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
G01R 15/14 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.
A communication system includes one or more transmitters, each transmitter to: transmit communication signals using a defined signaling protocol with multiple antenna elements to a target receiver, the communication signals containing known specific transmit sequences spread across a frequency spectrum of the communication signals to be detectable only by receivers having the known specific transmit sequences, and receive feedback from the target receiver indicating any errors in reception of the communication signals based upon the known specific transmit sequences, and a machine learning system to use configuration of the multiple antenna elements when the communication signal was sent and the feedback to predict preconfigured settings for transmitters. A test and measurement system located at a base station, a signal generator to generate one or more signals having a predetermined modulation format, a receiver to receive the one or more signals, and a machine learning system to develop a calibration matrix.
A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.
A current measurement device includes a shunt having sense leads, the shunt configured to be located in a current path for a current to be measured, and a Rogowski coil at least partially wrapped around the shunt, the current measuring device configured to combine signals from the shunt and the Rogowski coil. A current measurement device includes a shunt having sense leads configured to be located in a current path for a current to be measured, a Rogowski coil in series with the sense leads and at least partially wrapped around the shunt, a compensating pole connected to the Rogowski coil, and an isolation barrier connected to the compensating pole.
G01R 15/18 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
G01R 15/14 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
74.
RUNTIME DATA COLLECTION AND MONITORING IN MACHINE LEARNING SYSTEMS
A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.
G05B 19/418 - Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
75.
FLEXIBLE ARBITRARY WAVEFORM GENERATOR AND INTERNAL SIGNAL MONITOR
A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R 13/00 - Arrangements for displaying electric variables or waveforms
76.
HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROCESSING UNIT IN A TEST AND MEASUREMENT INSTRUMENT
A test and measurement instrument has an acquisition system to receive and digitize a batch of waveforms into a batch of digitized waveforms, a memory configured as a raster plane having rows and columns, a graphics processing unit (GPU) capable of processing multiple threads to rasterize the batch of digitized waveforms to the raster plane to form a batch histogram and to group multiple threads into groups of a first type of group, assign each thread group of the first type of group to one column in the raster plane, execute a common instruction per thread group of the first type to populate the raster plane, and transfer the batch histogram upon completion, and a central processing unit (CPU) to receive the batch histogram from the GPU, and display a map of the batch histogram on a display.
A test and measurement instrument includes an input configured to accept an input signal from a Device Under Test, an acquisition memory handler structured to store the input signal as a series of digital samples in an acquisition memory, and a rasterizer structured to generate a histogram of the values of the digital samples prior to or simultaneously with the values being stored in the acquisition memory. Methods of generating a raster display from a series of digital samples from an input display are also described.
A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Downloadable computer software, namely, computer software for automating, configuring, calibrating, and testing non-medical scientific instruments and electronic test, signaling, and measurement instruments; Downloadable computer software, namely, computer software for measuring, analyzing, storing, processing, and managing data received from electronic and optical test, signaling, and measurement instruments and equipment; Downloadable computer software, namely, computer software for measuring, analyzing, storing, processing, and managing data received from non-medical scientific instruments; Downloadable computer software, namely, computer software for high-speed serial data testing, analysis, report generation, protocol compliance, data management, and validation; Downloadable computer software, namely, computer software for use in software asset management for tracking, monitoring, managing, and viewing software licenses Software as a service (SAAS) featuring computer software for collecting, measuring, analyzing, storing, processing, and managing data from electronic test, signaling, and measurement instruments and equipment; Software as a service (SAAS) featuring computer software for uploading, transferring, downloading, and sharing data in the fields of test and measurement of electronic test and measurement apparatus and equipment; Software as a service (SAAS) featuring computer software for test and measurement automation in the fields of test and measurement of electronic test and measurement apparatus and equipment; Software as a service (SAAS) featuring computer software for automating, configuring, calibrating, and testing non-medical scientific instruments and electronic test, signaling, and measurement instruments; Software as a service (SAAS) featuring computer software for high-speed serial data testing and analysis, report generation, protocol compliance, data management, and validation; Providing temporary use of non-downloadable cloud-based asset management for tracking, monitoring, managing, and viewing software licenses
80.
Test and measurement system for analyzing devices under test
A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.
A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a shunt configured to be placed in series with the current-carrying conductor, and a Rogowski coil including at least one conductor segment. The shunt and the Rogowski coil are coupled to produce an output signal representing the current in the current-carrying conductor.
G01R 15/18 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
G01R 15/14 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
82.
SEPARATING NOISE TO INCREASE MACHINE LEARNING PREDICTION ACCURACY IN A TEST AND MEASUREMENT SYSTEM
A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms and generate a noise representation of the noise removed, create one or more images using the waveform pattern and the one or more filtered waveforms, add the noise representation to the one or more images to produce at least one combined image, input the at least one combined image to one or more deep learning networks, and receive one or more predicted values for the DUT.
G01R 13/02 - Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
A test and measurement instrument has one or more ports configured to receive a signal one or more devices under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform, perform linear response extraction on the pattern waveform, present one or more data representations including a data representation of the extracted linear response to a machine learning system, and receive a prediction for a measurement from the machine learning system. A method of performing a measurement on a waveform includes acquiring the waveform at a test and measurement device, deriving a pattern waveform from the waveform, performing linear response extraction on the pattern waveform, presenting one or more data representations including a data representation of the extracted linear response to a machine learning system, and receiving a prediction of the measurement from the machine learning system.
G01R 19/25 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
G06N 3/0442 - Recurrent networks, e.g. Hopfield networks characterised by memory or gating, e.g. long short-term memory [LSTM] or gated recurrent units [GRU]
A system includes an input for accepting a dataset including at least two sets of data in a dataset domain and one or more processors configured to derive at least two principal components from the dataset using principal component analysis, the at least two principal components being orthogonal to one another, map the dataset to a principal component domain derived from the at least two principal components, generate additional data in the principal component domain, and remap the additional data in the principal component domain back to the dataset domain as a newly generated dataset. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
G01N 22/00 - Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
G01R 15/26 - Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using modulation of waves other than light, e.g. radio or acoustic waves
86.
OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER
A system includes an input for accepting an input signal from a Device Under Test (DUT), a measurement unit for generating first measurement data and second measurement data from the input signal, and one or more processors configured to derive at least one principal component from the first and second measurement data using principal component analysis, and remap the first measurement data and the second measurement data to a principal component domain derived from the at least one principal component. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
A test and measurement instrument includes one or more ports to connect to one or more devices under test (DUT) having tuning screws, and to a robot, one or more processors to configured to: send commands to the robot to position the tuning screws on the one or more DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the one or more DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, send commands to the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the one or more DUTs, and validate operation of the one or more DUTs.
A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.
A test and measurement instrument has one or more input ports to connect the instrument to a device under test (DUT), one or more processors configured to execute code to cause the one or more processors to: receive an equalized waveform and an un-equalized waveform through the input port from the DUT, without any knowledge of a digital pattern that corresponds to the waveforms and without extracting the digital pattern from the waveforms, align the un-equalized waveform and the equalized waveform in time to produce an aligned un-equalized waveform and an aligned equalized waveform, and use the aligned equalized waveform and the aligned un-equalized waveform to determine equalizer tap values.
A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
A method of dynamically determining an oscilloscope noise characteristic includes retrieving a power spectral density (PSD) model of noise from a storage based upon a current configuration of the oscilloscope, generating a representation of any filtering being applied to a waveform generated by a device under test, using the PSD and the representation to produce a modified power spectral density, and using the modified power spectral density to determine a dynamic oscilloscope noise characteristic. A test and measurement instrument has one or more inputs to acquire waveforms from a device under test (DUT), one or more processors to retrieve a power spectral density (PSD) model of noise from a database, generate a representation of any filtering being applied to a waveform generated by the DUT, use the PSD and the representation to produce a modified PSD, and use the modified PSD to determine a dynamic instrument noise characteristic.
A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.
A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.
A test and measurement instrument includes a first channel input for accepting a first input signal, a second channel input for accepting a second input signal, a spectrogram processor for producing a first spectrogram from the first input signal and for producing a second spectrogram from the second input signal, and a display for simultaneously showing the first spectrogram and the second spectrogram. Methods are also described.
A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.
A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument. The system further includes a remote device structured to receive through a communication network at least a portion of the stored data derived from the input signal from the instrument, and further structured to receive a transaction identifier that identifies the present operating state of the instrument when the portion of the stored data was acquired by the instrument. Methods are also described.
A test and measurement system has one or more inputs connectable to a device under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: gather a set of training waveforms by acquiring one or more waveforms from one or more DUTs or from simulated waveforms, remove noise from the set of training waveforms to produce a set of noiseless training waveforms, and use the set of noiseless training waveforms as a training set to train a neural network to predict a measurement value for a DUT, producing a trained neural network. A method of training a neural network having receiving one or more waveforms from one or more DUTs, or generating one or more waveforms from a waveform simulator, removing noise from a set of training waveforms gathered from the one or more waveforms to produce a set of noiseless training waveforms, and use the set of noiseless training waveforms as a training set to train a neural network to predict a measurement value for a DUT, producing a trained neural network.
A structure has a flexible thermally conductive material having an adhesive surface and a non-adhesive surface, and a thermally conductive adhesive adhered to the adhesive surface of the flexible thermally conductive material leaving the non-adhesive surface exposed to an atmosphere in which the structure resides. A structure has a substrate having one or more conductive paths, and a flexible, thermally conductive material attached to at least a portion of the substrate to draw heat away from the conductive paths. An apparatus has a substrate having one or more conductive paths, a probe tip at one end of the substrate configured to electronically connect with a device under test, and a flexible, thermally conductive material attached to at least a portion of the substrate to draw heat away from the probe tip and conductive paths.
