Kobe Material Testing Laboratory Group

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        Patent 5
        Trademark 1
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        World 5
        United States 1
Date
2024 1
Before 2020 5
IPC Class
B23H 1/00 - Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric 2
A61B 8/12 - Diagnosis using ultrasonic, sonic or infrasonic waves in body cavities or body tracts, e.g. by using catheters 1
B24B 21/02 - Machines or devices using grinding or polishing beltsAccessories therefor for grinding rotationally symmetrical surfaces 1
G01N 1/04 - Devices for withdrawing samples in the solid state, e.g. by cutting 1
G06T 7/00 - Image analysis 1
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NICE Class
09 - Scientific and electric apparatus and instruments 1
42 - Scientific, technological and industrial services, research and design 1

1.

IMAGE CLASSIFICATION SYSTEM AND PROGRAM

      
Application Number JP2024005638
Publication Number 2024/172165
Status In Force
Filing Date 2024-02-18
Publication Date 2024-08-22
Owner
  • JAPAN ORGANIZATION OF OCCUPATIONAL HEALTH AND SAFETY (Japan)
  • KOBE MATERIAL TESTING LABORATORY CO., LTD. (Japan)
Inventor Yamagiwa Kenta

Abstract

Provided is an image classification system with which a region of interest, etc. of an image can be easily confirmed visually, and the validity of an estimation can be determined. This image classification system comprises: a data receiving unit that receives subject image data; a data generation unit that generates a plurality of pieces of sectional image data, each piece of sectional image data being a portion of the image data included in the subject image data and being smaller in size than the subject image data; a data estimation unit that uses a neural network, which has been trained in advance with teacher image data, to estimate into which classification element among a plurality of classification elements, which have been preset in association with features of a surface, a piece of sectional image data should be classified, for each of the plurality of pieces of the sectional image data; and a display unit that generates display information related to the sectional image data or the classification element, and that displays the generated display information by superimposing same on a subject display image which is a display image of the subject image data.

IPC Classes  ?

  • G06T 7/00 - Image analysis
  • G06V 10/82 - Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks

2.

KMTL

      
Application Number 1129421
Status Registered
Filing Date 2012-03-27
Registration Date 2012-03-27
Owner KOBE MATERIAL TESTING LABORATORY CO., LTD. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Physics apparatus and instruments; chemistry apparatus and instruments; measuring apparatus and instruments; detectors; apparatus and instruments for electricity distribution; electricity distribution consoles; rotary converter; phase modifiers; apparatus and instruments for photography; apparatus and instruments for cinematographic; optical apparatus and instruments. Testing or research of metal material; testing or research using the metal material testing machine; testing or research of pharmaceutical products; testing or research of cosmetic; testing or research of food; research in the field of construction; research of urban planning; research in the field of environmental protection; testing or research on electricity; testing or research on engineering works; testing or research on agriculture; testing or research on stock raising; testing or research on the marine products industry; mechanical research; calibration.

3.

Material piece scooping device

      
Application Number 11922584
Grant Number 07952045
Status In Force
Filing Date 2006-03-14
First Publication Date 2010-01-21
Grant Date 2011-05-31
Owner KOBE MATERIAL TESTING LABORATORY CO., LTD (Japan)
Inventor
  • Tsurui, Takafumi
  • Fujiwara, Masaharu
  • Nagasawa, Hiroyuki
  • Kanaya, Akihiro
  • Kusumoto, Junichi

Abstract

A material piece scooping device, which extracts a material piece from a surface of an object to be scooped by cutting electric discharges between an electric discharge electrode and the object to be scooped, includes a rotation drive section 40, an arm portion 30 driven by the rotation drive section to rotate around a rotational axis X, an electrode holder 20 supported by the arm portion, and an electric discharge electrode 10 detachably mounted on the electrode holder. A sliding section for sliding the arm portion in a direction perpendicular to the rotational axis and an arm length adjusting section for adjusting a length of the arm portion from the rotational axis thereof are provided, so as to adjust a trajectory of the electric discharge electrode as the arm portion rotates. The material piece can be scooped from the object along a line of the trajectory gnawing into the object.

IPC Classes  ?

  • B23H 1/00 - Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric

4.

MICRO TEST PIECE POLISHING APPARATUS

      
Application Number JP2007066421
Publication Number 2008/111243
Status In Force
Filing Date 2007-08-24
Publication Date 2008-09-18
Owner KOBE MATERIAL TESTING LABORATORY CO., LTD. (Japan)
Inventor Tsurui, Takafumi

Abstract

This invention provides a micro test piece polishing apparatus, which is less likely to cause bending or damage to a micro test piece, can realize a high working efficiency, and can manufacture micro test pieces having a uniform quality. A micro test piece polishing apparatus (1) is used for polishing the surface of a micro test piece (3) having a circular cross-section with a string-shaped member (13). The micro test piece polishing apparatus (1) comprises string-shaped member delivery/collection means (10), abrasive material adhering means (20), holding/rotating means (30), and pressing/scanning means (40). An abrasive material is adhered, by the abrasive material adhering means (20), onto the string-shaped member delivered by the string-shaped member delivery/collection means (10). Thereafter, the string-shaped member (13), to which the abrasive material has been adhered, is pressed and scanned onto the micro test piece (3), which is held and rotated by the holding/rotating means (30) by the pressing/scanning means (40), to polish the micro test piece (3).

IPC Classes  ?

  • B24B 21/02 - Machines or devices using grinding or polishing beltsAccessories therefor for grinding rotationally symmetrical surfaces

5.

ULTRASONIC PROBE FOR INTRAVASCULAR DIAGNOSIS AND METHOD FOR MANUFACTURING THE SAME

      
Application Number JP2007067482
Publication Number 2008/108015
Status In Force
Filing Date 2007-09-07
Publication Date 2008-09-12
Owner Kobe Material Testing Laboratory Co., ltd. (Japan)
Inventor
  • Tsurui, Takafumi
  • Saiki, Tsunetada
  • Tanaka, Katsuhiko

Abstract

An ultrasonic probe, of which the outside diameter is reduced so that the distal end of a catheter probe can be inserted into a very thin blood vessel such as a blood vessel in the brain, and which is provided with a plurality of transducer elements so that a high quality high resolution ultrasonic image can be provided. Its manufacturing method is also provided. From one viewpoint, the ultrasonic probe has a columnar damper portion and N (N is 2 or above) grooves provided in the side face of the damper portion and filled with a conductive resin material. A first electrode, a piezoelectric ceramics array of a 1-3 composite structure and a second electrode are formed in layers on the upper surface of the damper portion, and the first electrode is divided substantially equally into N fan-shaped sectors.

IPC Classes  ?

  • A61B 8/12 - Diagnosis using ultrasonic, sonic or infrasonic waves in body cavities or body tracts, e.g. by using catheters

6.

MATERIAL PIECE SCOOPING DEVICE

      
Application Number JP2006305015
Publication Number 2007/105308
Status In Force
Filing Date 2006-03-14
Publication Date 2007-09-20
Owner
  • MINATOGAWA KINZOKU TEST PIECE MANUFACTURING CO., LTD. (Japan)
  • KYUSHU ELECTRIC POWER CO., INC. (Japan)
  • KOBE MATERIAL TESTING LABORATORY CO., LTD. (Japan)
Inventor
  • Tsurui, Takafumi
  • Fujiwara, Masaharu
  • Nagasawa, Hiroyuki
  • Kanaya, Akihiro
  • Kusumoto, Junichi

Abstract

A material piece scooping device for scooping material pieces from the surface of a body, from which the material pieces are scooped, by electric discharge between the body and an electrode for electrical discharge machining. The scooping device has rotating/driving means (40), an arm part (30) rotated about the rotation axis (X) by the rotating/driving means, an electrode holder (20) held by the arm part, and an electrode (10) for electrical discharge machining, detachably installed on the electrode holder. The scooping device further has a slide means capable of sliding the arm part in the direction perpendicular to the rotation axis, and also has an arm length adjusting means for adjusting the length of the arm part from the rotation axis so that the device can, while adjusting the locus of the electrode for electrical discharge machining which locus is formed by the rotating motion of the arm part, scoop the material pieces along a line on which the locus of the electrode for electrical discharge machining intersects with the body.

IPC Classes  ?

  • G01N 1/04 - Devices for withdrawing samples in the solid state, e.g. by cutting
  • B23H 1/00 - Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric