42 - Scientific, technological and industrial services, research and design
Goods & Services
Analysis of geological samples; Analysis of materials; Chemical analysis; Industrial analysis; Laboratory analysis; Laboratory services (scientific research or analysis); Metallurgical analysis; Product analysis; Providing information, including online, about industrial analysis and research services; Scientific and technical analysis; Technical data analysis services; Technological analysis services; Testing, analysis and evaluation services relating to the application of industry standards; Gas, oil, petroleum, minerals exploration (prospecting); Metallurgical laboratory services; Metallurgical testing; Industrial research; Research, engineering and technical consultancy for industry
There is described herein a method for preparation of an at least partially liquid sample for activation analysis. The method may comprise placing the sample containing at least one target element in a container and solidifying the sample within the container. There is also described herein a method and a system for performing neutron or gamma activation analysis. The method may comprise providing an at least partially liquid sample containing at least one target element. The sample is solidified. The solidified sample is irradiated to activate at least one target element within the sample. The number of gamma rays emitted by the at least one target element may be measured. A value representative of the concentration of the at least one target element in the sample may be determined utilising the measurement of gamma rays emitted by the at least one target element and a calibration determined from a solid sample of known composition.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
A method and system are disclosed to determine a concentration of one or more target elements in a sample, using gamma activation analysis comprising: simultaneously irradiating the sample and a reference material containing at least two reference elements X-rays, detecting deactivation gamma-rays from the irradiated sample and the irradiated reference material; determining the concentration of the or each target element in the sample by correcting the number of detected deactivation gamma-rays from any of the or each target element present in the irradiated sample based on the number of detected deactivation gamma-rays from the at least two reference elements, wherein the at least two reference elements have a variation in activation rate over a pre-defined X-ray end-point energy range which differs from one another.
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
4.
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
A method and system are disclosed to determine a concentration of one or more target elements in a sample, using gamma activation analysis comprising: simultaneously irradiating the sample and a reference material containing at least two reference elements X-rays, detecting deactivation gamma-rays from the irradiated sample and the irradiated reference material; determining the concentration of the or each target element in the sample by correcting the number of detected deactivation gamma-rays from any of the or each target element present in the irradiated sample based on the number of detected deactivation gamma-rays from the at least two reference elements, wherein the at least two reference elements have a variation in activation rate over a pre-defined X-ray end-point energy range which differs from one another.
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
G21G 1/12 - Arrangements for converting chemical elements by electromagnetic radiation, corpuscular radiation, or particle bombardment, e.g. producing radioactive isotopes outside of nuclear reactors or particle accelerators by electromagnetic irradiation, e.g. with gamma or X-rays
5.
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
A method and system are disclosed to determine a concentration of one or more target elements in a sample, using gamma activation analysis comprising: simultaneously irradiating the sample and a reference material containing at least two reference elements X-rays, detecting deactivation gamma-rays from the irradiated sample and the irradiated reference material; determining the concentration of the or each target element in the sample by correcting the number of detected deactivation gamma-rays from any of the or each target element present in the irradiated sample based on the number of detected deactivation gamma-rays from the at least two reference elements, wherein the at least two reference elements have a variation in activation rate over a pre-defined X-ray end-point energy range which differs from one another.
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G21G 1/12 - Arrangements for converting chemical elements by electromagnetic radiation, corpuscular radiation, or particle bombardment, e.g. producing radioactive isotopes outside of nuclear reactors or particle accelerators by electromagnetic irradiation, e.g. with gamma or X-rays
G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
A shielded X-ray radiation apparatus is provided comprising an X-ray source, an X-ray attenuation shield including an elongate cavity to house the X-ray source and incorporating a region to accommodate a sample, a neutron attenuation shield, and a gamma attenuation shield. The neutron attenuation shield is situated adjacent to and substantially surrounds the X-ray attenuation shield and the gamma attenuation shield is adjacent to and substantially surrounds the neutron attenuation shield. In some embodiments a removable sample insertion means is provided to insert samples into the elongate cavity and which is composed of adjacent blocks of material, each respective block having a thickness and a composition which substantially matches the thickness and a composition of one of the X-ray attenuation, neutron attenuation and gamma-ray attenuation shields.
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G21F 1/08 - MetalsAlloysCermets, i.e. sintered mixtures of ceramics and metals
A system and method is provided to determine the moisture content in a sample material undergoing elemental activation analysis (EAA), the sample material containing at least one sample element which during EAA forms an activation product. The method comprises the steps of (i) positioning a reference material in vicinity of the sample material, the reference material containing a reference element having a thermal neutron capture cross-section of at least 1 barn, the reference material selected such that its product isotope of a thermal neutron capture reaction is a radioisotope that emits gamma-rays, (ii) irradiating the sample material and the reference material with a source of fast neutrons to produce thermal neutrons in the sample material and (iii) detecting gamma-rays emitted from the reference material and generating signals representative of the detected gamma-rays, (iv) calculating a factor, R, proportional to the thermal neutron flux based on the generated signals and (v) identifying, from a relationship relating moisture content to R, the moisture content in the sample material.
G01N 23/222 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis using neutron activation analysis [NAA]
A system and method is provided to determine the moisture content in a sample material undergoing elemental activation analysis (EAA), the sample material containing at least one sample element which during EAA forms an activation product. The method comprises the steps of (i) positioning a reference material in vicinity of the sample material, the reference material containing a reference element having a thermal neutron capture cross-section of at least 1 barn, the reference material selected such that its product isotope of a thermal neutron capture reaction is a radioisotope that emits gamma-rays, (ii) irradiating the sample material and the reference material with a source of fast neutrons to produce thermal neutrons in the sample material and (iii) detecting gamma-rays emitted from the reference material and generating signals representative of the detected gamma-rays, (iv) calculating a factor, R, proportional to the thermal neutron flux based on the generated signals and (v) identifying, from a relationship relating moisture content to R, the moisture content in the sample material.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G01N 23/222 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis using neutron activation analysis [NAA]
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G01N 23/222 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis using neutron activation analysis [NAA]
10.
Accelerator system for mineral component analysis, system and method for mineral component analysis
The present application discloses an accelerator system for mineral component analysis and system and method for mineral component analysis. The accelerator system includes an electron gun for generating an electron beam; an accelerating tube for accelerating an electron beam emitted by the electron gun to a predetermined energy; a composite target for generating a radioactive ray on the composite target after receiving bombardment of the electron beam; and a shielding mechanism for shielding the radioactive ray.
The present application discloses an accelerator system for mineral component analysis and system and method for mineral component analysis. The accelerator system includes an electron gun for generating an electron beam; an accelerating tube for accelerating an electron beam emitted by the electron gun to a predetermined energy; a composite target for generating a radioactive ray on the composite target after receiving bombardment of the electron beam; and a shielding mechanism for shielding the radioactive ray.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
A shielded X-ray radiation apparatus is provided comprising an X-ray source, an X-ray attenuation shield including an elongate cavity to house the X-ray source and incorporating a region to accommodate a sample, a neutron attenuation shield, and a gamma attenuation shield. The neutron attenuation shield is situated adjacent to and substantially surrounds the X-ray attenuation shield and the gamma attenuation shield is adjacent to and substantially surrounds the neutron attenuation shield. In some embodiments a removable sample insertion means is provided to insert samples into the elongate cavity and which is composed of adjacent blocks of material, each respective block having a thickness and a composition which substantially matches the thickness and a composition of one of the X-ray attenuation, neutron attenuation and gamma-ray attenuation shields.
G21F 3/00 - Shielding characterised by its physical form, e.g. granules, or shape of the material
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G21F 1/00 - Shielding characterised by the composition of the material
G21F 5/00 - Transportable or portable shielded containers
A shielded X-ray radiation apparatus is provided comprising an X-ray source, an X-ray attenuation shield including an elongate cavity to house the X-ray source and incorporating a region to accommodate a sample, a neutron attenuation shield, and a gamma attenuation shield. The neutron attenuation shield is situated adjacent to and substantially surrounds the X-ray attenuation shield and the gamma attenuation shield is adjacent to and substantially surrounds the neutron attenuation shield. In some embodiments a removable sample insertion means is provided to insert samples into the elongate cavity and which is composed of adjacent blocks of material, each respective block having a thickness and a composition which substantially matches the thickness and a composition of one of the X-ray attenuation, neutron attenuation and gamma-ray attenuation shields.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Apparatus for analysis, other than for medical use, namely, apparatus for measuring the grade of target elements in minerals, slurries, and solutions for geological, mining and mineral processing operations and mineral assaying; apparatus for use in laboratory analysis, namely, apparatus for use in exploration, mining, mineral processing assays, and industrial sites to analyze the grade of target elements in a sample; chemical analysis apparatus for non-medical purposes, namely, apparatus for measuring the grade of target elements in minerals, slurries, and solutions for exploration, mining, mineral processing, and industrial operations; spectroscopes for use in exploration, mining, mineral processing and industrial samples; x-ray apparatus for use in the analysis of exploration, mining, mineral processing and industrial samples, not for medical purposes; x-ray fluorescence analyzers other than for medical use; x-ray apparatus for industrial purposes; x-ray apparatus not for medical purposes; x-ray spectroscopes other than for medical use Geological research, namely, analysis of geological samples; analysis of exploration, mining, mineral processing, and industrial samples for mining operations; laboratory analysis of geological, mining, and mineral processing operations, mineral assaying, and process samples, including slurries and solutions, for mining operations; laboratory services, namely, scientific research or analysis of geological, mining, and mineral processing operations, mineral assaying, and process samples, including slurries and solutions, for mining operations; material testing, namely, metallurgical analysis; product testing; providing information, including online, about industrial analysis and research services; scientific and technical analysis, namely, analysis of geological, mining, and mineral processing operations, mineral assaying, and process samples, including slurries and solutions, for mining operations; technical data analysis services, namely, grade analysis of exploration, mining, mineral processing, and industrial samples for mining operations; scientific and technological services, namely, technological analysis services in the field of grade analysis of exploration, mining, mineral processing, and industrial samples for mining operations; testing, analysis and evaluation of the exploration, mining, mineral processing and industrial samples of others to assure compliance with industry standards; metallurgical scientific laboratory services; material testing, namely, metallurgical testing; gas, oil, petroleum and minerals exploration; provision of mineral processing and industrial laboratory research services; technical research, engineering and technical consultancy for industry in the technology field of grade analysis of exploration, mining, mineral processing, and industrial samples
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Apparatus for analysis (other than for medical use);
apparatus for use in laboratory analysis; chemical analysis
apparatus for non-medical purposes; measuring apparatus for
spectroscopic analysis (other than medical); apparatus and
installations for the production of x-rays, not for medical
purposes; x-ray analysers (other than for medical use);
x-ray apparatus for industrial purposes; x-ray apparatus not
for medical purposes; x-ray spectroscopy apparatus (other
than for medical use). Analysis of geological samples; analysis of materials;
chemical analysis; industrial analysis; laboratory analysis;
laboratory services (scientific research or analysis);
metallurgical analysis; product analysis; providing
information, including online, about industrial analysis and
research services; scientific and technical analysis;
technical data analysis services; technological analysis
services; testing, analysis and evaluation services relating
to the application of industry standards; metallurgical
laboratory services; metallurgical testing; gas, oil,
petroleum, minerals exploration (prospecting); provision of
research services; research, engineering and technical
consultancy for industry.
A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.
G01N 23/221 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by activation analysis
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
A61B 6/00 - Apparatus or devices for radiation diagnosisApparatus or devices for radiation diagnosis combined with radiation therapy equipment
A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 1/24 - Measuring radiation intensity with semiconductor detectors
G01T 1/34 - Measuring cross-section, e.g. absorption cross-section of particles
G21G 1/12 - Arrangements for converting chemical elements by electromagnetic radiation, corpuscular radiation, or particle bombardment, e.g. producing radioactive isotopes outside of nuclear reactors or particle accelerators by electromagnetic irradiation, e.g. with gamma or X-rays
