The present invention refers to a proximity sensor for electron backscatter diffraction (EBSD) systems, particularly, a proximity sensor for collision avoidance between an EBSD sensor of an EBSD system and a stage of a scanning electron microscope (SEM) equipped with the EBSD system, and a corresponding method for proximity monitoring. The proximity sensor comprises emitter(s) to provide a light beam or light curtain which is basically directed parallel to an active area of the EBSD sensor and transmitted across the active area of the EBSD sensor at a distance selected as an alerting distance for the proximity sensor during collision monitoring; and receiver(s) located opposite to the emitter with respect to the active area of the EBSD sensor, configured to detect the light beam or light curtain and to provide a signal corresponding to the intensity of the light beam or light curtain for collision monitoring.
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
The present invention refers to a hybrid integrated silicon drift detector (HiSDD) for X-ray detection, particularly to a HiSDD combining a silicon drift detector (SDD) with a low-noise preamplifier on a SDD sensor chip to improve the electrical and structural properties of the detector assembly. The invention further refers to a corresponding method for the fabrication of a HiSDD. A HiSDD according to the invention hybridly integrates a silicon drift detector, SDD, sensor chip and a preamplifier module; wherein electrically conductive paths are formed on a surface of the SDD sensor chip, having first ends configured for flip chip bonding and second ends configured for wire bonding; wherein the preamplifier module having contacts disposed on a surface of the preamplifier module, and wherein the first ends of the electrically conductive paths are flip chip bonded to the contacts of the preamplifier module.
09 - Scientific and electric apparatus and instruments
Goods & Services
Software for operating probe-based instruments in the fields
of industrial production and scientific research; Hardware
for facilitating a mode of operation sold as an integral
part of probe-based instruments, namely scanning probe
microscopes and atomic force microscopes.
4.
INSPECTION APPARATUS AND METHOD FOR INSPECTING A COMPONENT
An apparatus and method for an inspection apparatus for inspecting a component. The inspection apparatus including a robotic arm. A micro-XRF instrument having an instrument head coupled to the robotic arm. A seat supporting the component within a scanning area during inspection; and a computer in communication with the robotic arm and the micro-XRF instrument.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
The present invention refers to a detector and a method for obtaining Kikuchi images by using electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) technique. In particular, the present invention refers to a detector comprising a detector body, a detector head with a scintillation screen and a photodetector with a active surface for detecting Kikuchi patterns, and means configured to move the detector head with respect to the detector body. The method comprises obtaining a first and a second Kikuchi pattern, and moving the detector head after obtaining the first Kikuchi pattern and prior obtaining the second Kikuchi pattern.
System, method and computer program product for determining mass fractions of one or more elements in a test sample based on a measurement with a wave-length dispersive x-ray fluorescence (WDX) spectrometer measuring gross intensities associated with respective elements with to-be-determined mass fractions (MFi) in the test sample. A mass fraction module determines mass fractions (MFi) by using a calibration equation (CE1) with the respective measured gross intensity and a respective calculated scattering efficiency as inputs. The calibration equation (CE1) associates net intensities of characteristic fluorescence lines of the sample elements with respective mass fractions. The net intensity for a particular peak is obtained by subtracting a respective calculated scattering efficiency times a scaling factor from the calibration equation (CE1) from the measured gross intensity of the particular peak. The elemental composition of the test sample is determined either via an iteration module or via an EDX quantification module.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
The present invention discloses method and device for determining an element concentration of an EDS/WDS spectrum of an unknown sample. The method comprises performing a preliminary quantification of the EDS/WDS spectrum of the unknown sample and identify a plurality of elements in the unknown sample; identify at least one pre-stored standard sample including the plurality of elements; determine, for each element of the plurality of elements, a similarity score for the corresponding element in each identified standard sample; select, for each element of the plurality of elements, the one standard sample among the at least one standard sample by using the determined similarity score and identify the concentration of the corresponding element in the selected standard sample; and perform quantification of the EDS/WDS spectrum of the unknown sample by using, for each element of the plurality of elements, the identified concentration of the respectively selected standard sample.
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
09 - Scientific and electric apparatus and instruments
Goods & Services
Software for operating probe-based instruments in the fields of industrial production and scientific research; Hardware for facilitating a mode of operation sold as an integral part of probe-based instruments, namely Scanning probe microscopes and Atomic force microscopes.
9.
System and method for improved measurement of peak intensities in pulse height spectra obtained by wave-length dispersive x-ray fluorescence spectrometers
Techniques for estimating peak intensities in pulse height spectra obtained by a wave-length dispersive x-ray fluorescence spectrometer are disclosed. A pulse height spectrum is obtained from a sample. A model generator generates a pulse height spectrum model by creating a plurality of diffraction order profiles with predefined profile shapes at photon energy positions corresponding to respective diffraction orders of a monochromator of a spectrometer. For each created diffraction order profile where the corresponding photon energy is higher than the edge energy of the detector material of the detector, a respective escape profile is added. A model adjustment module adjusts pulse-height-to-energy-mapping parameters and contribution area of each diffraction order profile ensemble of the pulse height spectrum model using a fitting algorithm. An intensity module provides the contribution area of the first order profile ensemble as the intensity of the energy to be determined by the wavelength-dispersive X-ray fluorescence spectrometer.
A closure device for the gas-tight closing of the input opening of a sample chamber of an x-ray analysis apparatus includes a slider having a closure plate and a carriage that is configured to be displaced in a lateral movement over the input opening on a linear guide arranged on a baseplate connected fixedly to the sample chamber. The closure plate is connected in an articulated manner to the carriage via deflecting elements that, upon butting against end stops connected rigidly to the baseplate, deflect the lateral movement of the carriage into a movement perpendicular thereto to press the closure plate over the input opening. A drive motor connected to the carriage via a drive means displaces the slider to provide the lateral movement on the linear guide.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor
11.
HYBRID INTEGRATED SILICON DRIFT DETECTOR AND METHOD FOR FABRICATION THEREOF
The present invention refers to a hybrid integrated silicon drift detector (HiSDD) for X-ray detection, particularly to a HiSDD combining a silicon drift detector (SDD) with a low-noise preamplifier on a SDD sensor chip to improve the electrical and structural properties of the detector assembly. The invention further refers to a corresponding method for the fabrication of a HiSDD. A HiSDD according to the invention hybridly integrates a silicon drift detector, SDD, sensor chip (100) and a preamplifier module (200); wherein electrically conductive paths (32) are formed on a surface of the SDD sensor chip (100), having first ends configured for flip chip bonding and second ends configured for wire bonding; wherein the preamplifier module (200) having contacts disposed on a surface of the preamplifier module (200), and wherein the first ends of the electrically conductive paths (32) are flip chip bonded to the contacts of the preamplifier module (200).
The invention is directed to a method for elucidating the three-dimensional structure of compounds by X-ray diffraction (X-ray SCD) characterized in that the compound is co-analyte crystallized with tetraaryladamantanes according to general formula I Wherein R and R′ are identical or different residues selected from the group consisting of O—R1, S—R1, NHR1, NR1R2, F, Cl, Br or I and R1, R2 stand for identical or different, substituted on not substituted aliphatic or aromatic residues having 1 to 25 carbon atoms and the the three-dimensional structure of the compound is obtained by X-ray diffraction (X-ray SCD).
G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
C30B 7/06 - Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by evaporation of the solvent using non-aqueous solvents
A collimator assembly for an x-ray optical system having a Soller slit for collimation of x-ray radiation with respect to a direction of an axis (z) of the Soller slit, wherein the Soller slit has a plurality of lamellae spaced apart from one another and having lamella planes parallel to one another, is characterized in that the Soller slit comprises a plurality of segments which are arranged along the axis and are separated from one another. The arrangement also has a collimator frame for enclosing and guiding the plurality of segments, and at least one of the plurality of segments is displaceable with respect to the collimator frame and relative to other segments. A simple but nonetheless accurate adjustment of the spectral resolution of an x-ray spectrometer to a respective different analytical application is thus enabled in a compact and cost-effective manner.
G21K 1/04 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
14.
Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating
The invention relates to an arrangement having a measuring apparatus for a scanning probe microscope, comprising: a sample receptacle, which is designed to receive a measurement sample for an examination by scanning probe microscopy; a measuring probe, which is received on a probe holder; a relocating device, which has a drive and is designed to relocate the sample receptacle and the probe holder having the measuring probe relative to each another by means of the drive for the examination by scanning probe microscopy; and an active counterweight device having a counterweight and a drive device associated with the counterweight, the active counterweight device being designed to move the counterweight during the measuring operation by means of the drive device, counter to the movement of the probe holder having the measuring probe. The invention furthermore relates to a method for operating the arrangement.
09 - Scientific and electric apparatus and instruments
Goods & Services
Software for operating probe-based instruments in the fields
of manufacturing and scientific research; hardware for
facilitating a mode of operation sold as integral part of
probe-based instruments, namely scanning probe microscopes
and atomic force microscopes.
A method for improving the quality/integrity of an EBSD/TKD map, wherein each data point is assigned to a corresponding grid point of a sample grid and represents crystal information based on a Kikuchi pattern detected for the grid point; comprising determining a defective data point of the EBSD/TKD map and a plurality of non-defective neighboring data points, comparing the position of Kikuchi bands of a Kikuchi pattern detected for a grid point corresponding to the defective data point with the positions of bands in at least one simulated Kikuchi pattern corresponding to crystal information of the neighboring data points and assigning the defective data point the crystal information of one of the plurality of neighboring data point based on the comparison.
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
G01N 23/20091 - Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras
G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
A tool is provided for assembling a specimen carrier assembly in an electron imaging apparatus, the assembly comprising a specimen holder, an object grid containing a sample during measurement, and a C-shaped resilient fixing ring for removably fixing the object grid into a groove of the specimen holder. The tool comprises an elongate hollow handling device with a holding sleeve surrounding a cylindrical pin that is translatory movable within the holding sleeve in both directions between a first position in which the pin protrudes from the holding sleeve at its lower end and a second position in which the pin is retracted into the holding sleeve. The hollow handling device is configured such that the C-shaped fixing ring can be pushed into the specimen holder groove by moving the cylindrical pin into its first position. This allows the object grid to be conveniently and reliably fixed in the carrier assembly.
The present invention refers to a method of processing an energy-dispersive X-ray (EDX)/X-ray fluorescence (XRF) map (1), comprising selecting a data point (dp) among a plurality of data points of the EDX/XRF map (1), wherein each of the data points comprise a local measured value (m) and a local dispersion value (v) of a measured variable; determine a first modified mean value (M[1]) based on the local measured value (m) of the selected data point (dp) and the local measured value of at least one neighboring data point neighboring the selected data point (dp) and determine a first modified dispersion value (V[1]) based on the local dispersion value (v) of the selected data point (dp) and the dispersion value of the at least one neighboring data point, when mTH[1].
e) have an equal distance R0 from the sample position (3). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.
In a method of preparing a single molecule sample of a biological material for use in an imaging experiment, the single molecule sample is deposited on a graphene substrate using a method such as nanopipetting. Excess bulk fluid surrounding the molecule is then removed, for example, by mechanical blotting or controlled evaporation. An enclosing layer of graphene is then deposited and sealed to the graphene substrate so as to encapsulate the molecule. This sealing may include floating the enclosing layer in a water bath and moving it into contact with the graphene substrate. The molecule of interest may be deposited directly on the substrate, or a linker molecule may be first deposited to provide an attachment between the substrate and the molecule of interest.
09 - Scientific and electric apparatus and instruments
Goods & Services
microscopes, namely, measuring, imaging, and scanning probe microscopes; recorded and downloadable software for operating microscopes; atomic force microscopes
09 - Scientific and electric apparatus and instruments
Goods & Services
Software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating a mode of operation sold as integral part of probe-based instruments, namely scanning probe microscopes and atomic force microscopes.
23.
Detector, methods for operating a detector and detector pixel circuit
A pixelated sensor comprises a semiconductor substrate chip with a plurality of sensor pixels and a detector chip with a plurality of detector pixels. Each of the sensor pixels is configured as a photodiode and is electrically connected to an input node of one of the detector pixels. The detector pixels are further configured to convert and output the sensor input to an analog to digital converter. The detector chip further comprises first and second macropixels and a plurality of second macropixels, wherein each first macropixel is formed by subset of detector pixels switchably interconnected via a first conducting grid and wherein each second macropixel is formed by a subset of first macropixels switchably interconnected via a second conducting grid.
H04N 25/42 - Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
H04N 25/75 - Circuitry for providing, modifying or processing image signals from the pixel array
An X-ray laser has a target anode of a crystalline material that emits X-ray radiation in response to excitation and that is located on a thermally conductive substrate. An X-ray source provides an input X-ray beam that illuminates a predetermined volume of the target anode at a predefined angle relative to a surface of the anode so as to induce a Borrmann mode standing wave in the predetermined volume. An electron source outputs an electron beam that is incident on the Borrmann mode region so as to cause electron impact ionization of the crystalline material and thereby induce stimulated emission of a coherent output X-ray beam.
H01S 4/00 - Devices using stimulated emission of electromagnetic radiation in wave ranges other than those covered by groups , or , e.g. phonon masers, X-ray lasers or gamma-ray lasers
The invention relates to a measuring device for a scanning probe microscope that includes a sample receptacle which is configured to receive a measurement sample to be examined, a measuring probe which is arranged on a probe holder and has a probe tip with which the measurement sample can be measured. A displacement device is configured to move the measuring probe and the sample receptacle relative to each other, in order to measure the measurement sample, such that the measuring probe, in order to measure the measurement sample, executes a raster movement relative to said measurement sample in at least one spatial direction. Movement measurement signals indicating a first movement component in a first spatial direction that disrupts the raster movement and a second movement component in a second spatial direction that disrupts the raster movement, which second spatial direction extends transversely to the first spatial direction. Compensating control signal components cause a first countermovement which substantially compensates for the first disruptive movement component in the first spatial direction, and/or cause a second countermovement which substantially compensates for the second disruptive movement component in the second spatial direction.
D=γ*C+(1−γ)*D wherein
Z. The invention further relates to a measurement system, computer program and computer-readable medium for carrying out the method of the invention.
An X-ray laser has a target anode of a crystalline material that emits X-ray radiation in response to excitation and that is located on a thermally conductive substrate. An X-ray source provides an input X-ray beam that illuminates a predetermined volume of the target anode at a predefined angle relative to a surface of the anode so as to induce a Borrmann mode standing wave in the predetermined volume. An electron source outputs an electron beam that is incident on the Borrmann mode region so as to cause electron impact ionization of the crystalline material and thereby induce stimulated emission of a coherent output X-ray beam.
H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
H01S 4/00 - Devices using stimulated emission of electromagnetic radiation in wave ranges other than those covered by groups , or , e.g. phonon masers, X-ray lasers or gamma-ray lasers
H01S 3/0959 - Processes or apparatus for excitation, e.g. pumping using pumping by high energy particles by an electron beam
A method comprises the steps of: (a) Obtaining a measured X-ray spectrum for the coated sample, for determining characteristics for the sample and for a coating material; (b) Determining a simulated X-ray spectrum for the sample based on an initial sample composition; (c) Determining an adapted sample composition that improves a match between the characteristics of the sample and an adapted simulated X ray spectrum; (d) Determining an adapted coating thickness for the coating material based on the adapted sample composition and characteristics of the coating; and (e) Repeating the steps (b) to (d) using the adapted sample composition and the adapted coating thickness of the coating material instead of the initial values, wherein the coating thickness is used for determining an absorption of X-rays.
G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
A detector for Kikuchi diffraction comprising a detector body and a detector head mountable to each other. The detector body comprises a body part which is enclosing a photodetector configured for detecting incident radiation and further comprises a vacuum window arranged upstream the photodetector with respect to a propagation direction of the incident radiation, a first body mounting portion configured to be mounted to a SEM chamber port and a second body mounting portion. The detector head comprises a scintillation screen and a head mounting portion configured to be mounted to the second body mounting portion.
A measuring arrangement (20) for x-ray radiation, comprising - a sample position (3), which can be illuminated by x-ray radiation (2) and - an x-ray detector (13) for detecting x-ray radiation emitted from the sample position (3), comprising at least one detector module (21-24), wherein the detector module (21-24) has a plurality of sensor elements (14; 14a-14e) arranged successively in a measuring direction (MR), each sensor element having a centroid (18), wherein the sensor elements (14; 14a-14e) are arranged in a common sensor plane (16) of the detector module (21-24), is characterized in that at least a majority of the sensor elements (14; 14a-14e) of the detector module (21-24), preferably all the sensor elements (14; 14a-14e) of the detector module (21-24), are designed as uniformly spaced sensor elements (14; 14a-14e), wherein the centroids (18) of the sensor elements (14; 14a-14e) have an equal distance R0 from the sample position (3). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.
A beamstop arrangement for an x-ray-optical system is adjustable in an xy plane perpendicular to a z-direction for optimizing a ratio of useful radiation reaching a surface to interfering radiation of an x-ray beam in the z-direction. The beamstop arrangement comprises a plurality of beamstops of differing size and/or geometry arranged on an exchanging mount, which is installed on a carriage displaceable in the xy plane by means of a drive unit having at least one positioning motor. The multiple beamstops can be located in a vacuum, while the drive motors and all electronic components can be positioned outside the vacuum, so that no heat development takes place in the measurement region. Corruption of the measurement result due to a changed measurement background is thus avoided.
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
32.
Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscope
A measuring device for a scanning probe microscope including a sample receptacle configured to receive a sample; a measuring probe which is arranged on a probe holder and has a probe tip; a displacement device which moves the measuring probe and the sample receptacle relative to each other; a control device which is connected to the displacement device and controls the relative movement between the measuring probe and the sample receptacle; and a sensor device which is configured to detect, movement measurement signals during an absolute measurement for a movement of the measuring probe and/or a movement of the sample receptacle. The movement measurement signals are relayed to the control device. The control device is configured to control the relative movement. The invention also provides a scanning probe microscope, as well as a method for examining a sample.
The invention relates to an arrangement having a measuring apparatus (20) for a scanning probe microscope, comprising: a sample receptacle (26), which is designed to receive a measurement sample (27) for an examination by scanning probe microscopy; a measuring probe (23), which is received on a probe holder (21); a relocating device, which has a drive (24; 25) and is designed to relocate the sample receptacle (26) and the probe holder (21) having the measuring probe (23) relative to each other by means of the drive (24; 25) for the examination by scanning probe microscopy; and an active counterweight device (30) having a counterweight (32) and a drive device (31) associated with the counterweight (32), the active counterweight device (30) being designed to move the counterweight (32) during measuring operation by means of the drive device (31), counter to the movement of the probe holder (21) having the measuring probe (23). The invention furthermore relates to a method for operating the arrangement.
The present invention refers to a method for improving the quality/integrity of an EBSD/TKD map (30) that is comprising a plurality of data points (31, 32), wherein each data point (31, 32) is assigned to a corresponding grid point of a sample grid and represents crystal information based on a Kikuchi pattern (20) detected for the grid point. The method of the invention comprises the steps of: determining a defective data point (31) of the EBSD/TKD map (30) and a plurality of non-defective neighboring data points (32, 33) of the defective data point (31), comparing the position of Kikuchi bands (21) of a Kikuchi pattern (20) detected for a grid point corresponding to the defective data point (31) with the positions of bands in at least one simulated Kikuchi pattern corresponding to crystal information of the neighboring data points (32, 33), and assigning the defective data point (31) the crystal information of one of the plurality of neighboring data point (32, 33) based on the comparison. The invention further relates to a method for determining a sample structure and a measurement system.
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/20091 - Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
35.
MEASUREMENT ARRANGEMENT FOR X-RAY RADIATION FOR GAP-FREE 1D MEASUREMENT
The present invention relates to an x-ray detector (21) having a plurality of detector modules (1, 1a-1g), each comprising dead zones (6) without x-ray sensitivity and active zones (3, 3a-3c) having x-ray sensitivity, which is spatially resolved in a measurement direction (MR), wherein the detector modules (1, 1a-1g) are designed to be successive and overlapping along the measurement direction (MR), such that, in overlapping regions (23a-23e), the dead zone (6) of a detector module (1, 1a-1g) is bridged by an active zone (3, 3a-3c) of another detector module (1, 1a-1g). The overlapping detector modules (1, 1a-1g) are arranged adjacent to one another in the transverse direction (QR) in the overlapping regions (23a-23e), wherein the transverse direction (QR) extends crosswise to the local measurement direction (MR) and crosswise to a local connection direction (VR) to a sample position (91). A gapless, one-dimensional piece of measurement information, particularly x-ray diffraction information, can be easily obtained by the x-ray detector (21) from a measurement sample (96) at the sample position (91).
In a method of preparing a single molecule sample of a biological material for use in an imaging experiment, the single molecule sample is deposited on a graphene substrate using a method such as nanopipetting. Excess bulk fluid surrounding the molecule is then removed, for example, by mechanical blotting or controlled evaporation. An enclosing layer of graphene is then deposited and sealed to the graphene substrate so as to encapsulate the molecule. This sealing may include floating the enclosing layer in a water bath and moving it into contact with the graphene substrate. The molecule of interest may be deposited directly on the substrate, or a linker molecule may be first deposited to provide an attachment between the substrate and the molecule of interest.
An electron diffraction imaging system for imaging the three-dimensional structure of a single target molecule of a sample uses an electron source that emits a beam of electrons toward the sample, and a two-dimensional detector that detects electrons diffracted by the sample and generates an output indicative of their spatial distribution. A sample support is transparent to electrons in a region in which the sample is located, and is rotatable and translatable in at least two perpendicular directions. The electron beam has an operating energy between 5 keV and 30 keV, and beam optics block highly divergent electrons to limit the beam diameter to no more than three times the size of the sample molecule and provide a lateral coherence length of at least 15 nm. An adjustment system adjusts the sample support position in response to the detector output to center the target molecule in the beam.
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
G01N 23/20008 - Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
38.
Electron diffraction imaging system for determining molecular structure and conformation
An electron diffraction imaging system for imaging the three-dimensional structure of a single target molecule of a sample uses an electron source that emits a beam of electrons toward the sample, and a two-dimensional detector that detects electrons diffracted by the sample and generates an output indicative of their spatial distribution. A sample support is transparent to electrons in a region in which the sample is located, and is rotatable and translatable in at least two perpendicular directions. The electron beam has an operating energy between 5 keV and 30 keV, and beam optics block highly divergent electrons to limit the beam diameter to no more than three times the size of the sample molecule and provide a lateral coherence length of at least 15 nm. An adjustment system adjusts the sample support position in response to the detector output to center the target molecule in the beam.
The present invention refers to an apparatus (100) and a method for detecting characteristics of a probe. In an embodiment, the apparatus (100) comprises a vacuum chamber (104) and a beam generator (102) adapted to generate a beam of charged particles within the vacuum chamber (104). When the beam of charged particles falls onto the probe, interaction particles and/or interaction radiation are generated. The apparatus (100) further comprises an electromechanical unit (114) within the vacuum chamber (104) and a detector (110) comprising a plurality of detection units and being arranged on the electromechanical unit (114) allowing for the detector (110) to move from a first position (302) with respect to the beam generator (102) to a second position (304) with respect to the beam generator (102) and vice versa, upon a corresponding actuation of the electromechanical unit (114) performable from outside of the vacuum chamber (104).
The present invention relates to a pixelated sensor (100)comprising a semiconductor substrate chip (10) with a plurality of sensor pixels (11) and a detector chip (20) with a plurality of detector pixels (21).Therein, each of the plurality of sensor pixels (11) is configured as a photodiode and is electrically connected to an input node (22) of one of the detector pixels (21). Each of the detector pixels (21) is configured to receive a sensor input from the connected sensor pixel (11), to convert the sensor input into a detector output and to output the detector output to an analog to digital converter (40). According to the invention, the detector chip (20) further comprises a plurality of macropixels (30), wherein each macropixel (30) isformed by a subset of detector pixels (21) that are interconnected by at least one conducting grid (50), whereineach detector pixel (21) of the subset isconfigured to be switchable connected to the at least one conducting grid (50).Theinvention further relates to adetector pixel circuit (70) for a detector chip (20) of a pixelated detector (100)of the invention and to methods for operating a pixelateddetector (100) according to the invention.
G01T 1/29 - Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
H04N 5/343 - Extracting pixel data from an image sensor by controlling scanning circuits, e.g. by modifying the number of pixels having been sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. between still and video mode or between interlaced and non-interlaced mode
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
41.
Set-up and method for spatially resolved measurement with a wavelength-dispersive X-ray spectrometer
X-ray spectrometer comprising an X-ray source emitting X-ray radiation onto a sample, a collimator arrangement for collimating X-ray radiation that has passed through a diaphragm arrangement, the collimator arrangement comprising a modified Soller slit with mutually parallel lamellae forming a plurality of slit-shaped passages, at least a portion of the slit-shaped passages having partition walls aligned substantially perpendicularly to the slit-shaped passages, the partition walls being non-transmissive to X-ray radiation and restricting the transverse divergence of the X-ray radiation passing through the collimator arrangement in a direction transversely with respect to the diffraction plane of the X-ray radiation coming from the sample. Significantly faster spatially resolved measurements can thus be carried out.
G01N 23/20091 - Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
42.
Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope
The invention relates to a measuring device for a scanning probe microscope including a measuring probe a first probe holding device on which the measuring probe is arranged, a detection device including a measurement light source which is adapted to provide light beams directed toward the measuring probe, a sensor device which is adapted, during the operation to receive measurement light beams reflected from the measuring probe. A first measuring arrangement in which the first probe holding device with the measuring probe is arranged in a first position spaced from the detection device, and a second measuring arrangement is formed in which a lengthening device is changeably arranged between the detection device and the measuring probe which lengthens the respective optical beam path for the light beams and the measurement light beams in such a manner that the first probe holding device or a second probe holding device which is different from the first probe holding device is arranged with the measuring probe at a second position spacing from the detection device which is greater than the first position spacing.
An X-ray source uses excitation of a liquid metal beam of ions or ionized droplets to produce an X-ray output with higher brightness than conventional sources. The beam may be accelerated from a liquid metal source using an extraction electrode. The source may have an emitter tip, and the acceleration of the liquid metal may include field emission from a Taylor cone. An electrostatic or electromagnetic focusing electrode may be used to reduce a cross-sectional diameter of the beam. The liquid metal beam has a relatively high velocity as it does not suffer from flow turbulence, thus allowing for a more energetic excitation and a correspondingly higher brightness. A beam dump may also be used to collect the liquid metal beam after excitation, and may be concave with no direct sight lines to either an electron beam cathode or to X-ray windows of an enclosure for the source.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
H05G 2/00 - Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
44.
Optical emission spectrometer with cascaded charge storage devices
An optical emission spectrometer has an excitation device for a sample to be examined, a dispersive element for spectrally decomposing light emitted by an excited sample, a multiplicity of photodiodes, which are arranged such that different spectral components of the emitted, decomposed light are detectable with different photodiodes, and a multiplicity of electronic readout systems for the photodiodes. A respective electronic readout system has a charge storage assembly comprising a plurality of individual charge storage devices, wherein the charge storage devices are interconnectable in cascading fashion, with the result that charges flowing in from an associated photodiode successively fill the charge storage devices. The respective electronic readout system can be used to read the charges of the individual charge storage devices of the charge storage assembly and/or the charges of subsets of the charge storage devices of the charge storage assembly.
The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode to emit a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens. The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to a method for adjusting the focal depth of as spectrometer.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G21K 1/04 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
46.
Analytical X-ray tube with high thermal performance
An analytical X-ray tube with an anode target material that emits characteristic X-rays in response to excitation by an electron beam may include any of several advantageous features. The target material is deposited on a diamond substrate layer, and a metal carbide intermediate layer may be provided between the target material and substrate that provides enhanced bonding therebetween. An interface layer may also be used that provides an acoustic impedance matching between the target material and the substrate. For a low thermal conductivity target material, a heat dissipation layer of a higher thermal conductivity material may also be included between the target material and substrate to enhance thermal transfer. The target material may have a thickness that corresponds to a maximum penetration depth of the electrons of the electron beam, and the structure may be such that a predetermined temperature range is maintained at the substrate interface.
For an x-ray apparatus comprising a goniometer with a detector circle rotatable about a goniometer axis, an actuator coupled to the detector circle for the motor-driven rotation thereof, a source arrangement with an x-ray source, a detector arrangement fastened to the detector circle and including an x-ray detector, and a sample position for a sample to be examined towards which the source arrangement and the detector arrangement are oriented, a compensation apparatus is provided that compensates for a torque about the goniometer axis produced by the weight of the detector arrangement on the detector circle. The compensation apparatus comprises a compensation motor coupled to the detector circle and a control device that actuates the compensation motor depending on a current position of the detector arrangement to apply a torque at least substantially equal and opposite to the torque produced by the detector arrangement.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
The invention relates to a photon detector (10), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis (23) and has a detector head (11) at a first end of the measurement finger, wherein the detector head (11) comprises a plurality of at least two detector modules (22), each comprising a sensor chip (12) sensitive to photon radiation (14), in particular x-radiation, said sensor chip having an exposed end face (13) and a face facing away from the end face (13), wherein the detector modules (22) are arranged around the detector axis (23) in a plane (24) extending orthogonally to the detector axis (23).
i) and the incidence direction for each of the plurality of pixels. The invention further refers to a system, a computer-related product and a sample (8) for performing such method and to the use of a pixel detector (2) for determining a position of a divergent radiation source (1).
G01B 15/00 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
G01T 1/29 - Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
50.
Measurement chamber for a compact goniometer in an x-ray spectrometer
A measurement chamber of an x-ray spectrometer for analyzing x-ray fluorescence radiation from a measuring sample has an entrance opening for the entry of x-ray fluorescence radiation into the measurement chamber, a first goniometer arm for holding and adjusting an analyzer crystal, and a second goniometer arm for holding and adjusting an x-ray detector. The measurement chamber and entrance opening are sealed in a vacuum-tight manner by way of a window. The chamber contains a bearing block for receiving and holding both goniometer arms in a concentric and rotatable manner, the arms each being mechanically adjustable by means of a piezo-motor, which is securely connected to the bearing block or a drive plate of the respective goniometer arm. The measurement chamber contains all mechanical components of the goniometer and allows for a more compact, lighter and more stable x-ray spectrometer with a rotatable goniometer and little heat influx into the system.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
51.
Device for sorting materials, in particular scrap particles, by means of X-ray fluorescence
A device for identifying materials on a conveyor belt by means of X-ray fluorescence comprises an X-ray source, from which X-ray radiation is guided onto material parts, a detector head containing an X-ray detector with a multiplicity of detector elements arranged in a planar fashion for receiving X-ray radiation and converting it into electrical charge signals, and an electronic unit for reading out and processing the charge signals, which comprises for each individual detector element a signal channel having a discriminator unit with a plurality of energy thresholds and a counting unit apparatus for converting the signals into digital counting events, wherein the electronic units are interconnected such that simultaneous occurrence of signals on more than one detector element can be identified and treated separately.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 1/167 - Measuring radioactive content of objects, e.g. contamination
B07C 5/342 - Sorting according to other particular properties according to optical properties, e.g. colour
B07C 5/34 - Sorting according to other particular properties
B07C 5/346 - Sorting according to other particular properties according to radioactive properties
09 - Scientific and electric apparatus and instruments
Goods & Services
X-ray apparatus not for medical purposes; X-ray fluorescence analysers, other than for medical purposes; X-ray spectroscopy apparatus, namely, total reflection X-ray fluorescence spectrometer other than for medical use; X-ray spectrometers; Computer software for controlling X-ray spectrometry; Accessories for sample preparations for X-ray spectrometry, namely, analytical sample laboratory trays, drying equipment for analyical laboratory samples; Accessories for storage of samples for X-ray spectrometry, namely, laboratory storage containers
53.
X-ray optics assembly with switching system for three beam paths, and associated X-ray diffractometer
An X-ray optics assembly for an X-ray diffractometer is provided, comprising a multilayer mirror, in particular a Goebel mirror, and a switching system with which beam paths for an X-ray beam are selectable. The X-ray optics assembly includes a monochromator, in particular a channel-cut crystal, and three beam paths for the X-ray beam are selectable using the switching system. A first beam path in a first position of the switching system leads past the multilayer mirror and leads past the monochromator, a second beam path in a second position of the switching system contains the multilayer mirror and leads past the monochromator, and a third beam path in a third position of the switching system contains the multilayer mirror and contains the monochromator. The invention provides an X-ray optics assembly and an X-ray diffractometer which may be used even more universally for various measurement geometries in a simple manner.
G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
54.
Method and arrangement for identifying crystalline phases, a corresponding computer program, and a corresponding computer-readable storage medium
Methods and arrangements identify crystalline phases in a polycrystalline sample by determining a normalized vector p(i) for the chemical composition of the expected crystal structure, at each measurement point of the sample, recording a spectrum by means of energy-dispersive X-ray spectroscopy and determining the chemical composition, and recording an electron diffraction image and determining of the diffraction bands. The methods and arrangements also determine a normalized vector v for the chemical composition, compare the normalized vector v with each of the normalized vectors p(i) of the expected crystal structures and outputting an evaluation factor s(i) for the similarity of the vectors in each case, compare the diffraction bands with those of the expected crystal structures and outputting an evaluation factor n(i), and determining an overall quality from the two evaluation factors and identifying the crystal structure with the highest overall quality as belonging to the measurement point.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
09 - Scientific and electric apparatus and instruments
Goods & Services
X-ray apparatus not for medical purposes; X-ray analysers, other than for medical purposes; X-ray spectroscopy apparatus [other than for medical use]; X-ray spectrometers; Computer software for X-ray spectrometry; Accessories for sample preparations for X-ray spectrometry; Accessories for storage of samples for X-ray spectrometry.
57.
Optical base body for a spectrometer, method for producing an optical base body for a spectrometer and spectrometer comprising such optical base body
A optical base body for a spectrometer for mounting other components of a spectrometer, wherein the optical base body is produced as a sandwich construction from at least three flat elements layered on top of each other and interconnected, in particular bonded, wherein each of the flat elements has a low coefficient of thermal expansion which is substantially isotropic, at least in one isotropic plane and wherein the flat elements are layered on top of each other and interconnected such that their isotropic planes run substantially parallel to one another.
The invention relates to a method (90) for scanning a sample (99) by means of x-ray optics (100) for irradiating the sample (99) with x-rays (107a), comprising the following steps: (a) displacing a measuring point (106), defined by an optical initial point (108) of the x-ray optics (100), in the sample (99) in a first scanning direction (92) by means of swiveling the x-ray optics (100) about a first swivel axis (336); (b) detecting radiation (107b) emanating from the sample (99) at at least two measuring points (106) along the first scanning direction (92); (c) combining measured values correlating with the detected radiation (107b) to form an overall scan. Moreover, the invention relates to an apparatus (96) for scanning a sample (99), comprising: x-ray optics (100) for irradiating a sample (99) with x-rays (107a); a goniometer mechanism (300) connected to the x-ray optics (100), wherein the goniometer mechanism (300) is configured to carry out a swiveling of the x-ray optics (100) about a first swivel axis (336); at least one actuator (117) which is embodied to actuate the goniometer mechanism (300); and a control device (97) which is embodied to carry out the method as claimed in one of the preceding claims.
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
b) in any direction (x, y, z) is at least a factor of 1.5 smaller than the extension of the target (4). An x-ray apparatus is thereby provided with simplified alignment of the x-ray optics with respect to a microfocus x-ray source.
H01J 35/30 - Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
H01J 35/14 - Arrangements for concentrating, focusing, or directing the cathode ray
H05G 1/58 - Switching arrangements for changing-over from one mode of operation to another, e.g. from radioscopy to radiography, from radioscopy to irradiation
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
61.
Device for spatially orienting an X-ray optical unit and apparatus having such a device
The invention relates to a device (98) for the spatial alignment of X-ray optics (100) with an entry point (104) and an exit point (108). The device (98) comprises a parallel displacement mechanism (200) for gauging the entry point (104) of the X-ray optics (100) to a first predetermined point (100) by parallel displacement of the X-ray optics (100). Further, the device (98) comprises a goniometer mechanism (300) for gauging the exit point (108) of the X-ray optics (100) to a second predetermined point (106) by at least approximate pivoting of the X-ray optics (100) around the entry point (104). Further, the invention relates to an apparatus (96) which comprises the device (98) and X-ray optics (100).
A61B 6/08 - Auxiliary means for directing the radiation beam to a particular spot, e.g. using light beams
G02B 7/02 - Mountings, adjusting means, or light-tight connections, for optical elements for lenses
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
The invention relates to a method for identifying crystalline phases in a polycrystalline sample, comprising the method steps: a) for each crystal structure that is suspected in the sample, determining a normalized vector p(i) for the chemical composition of the crystal structure, wherein the basis of the vector represents elements and/or compounds and thus the coordinates of the vector comprise details about the concentration of the elements and/or compounds inside the crystal structure; b) at each measurement point of the sample, (i) recording of a spectrum by means of energy-dispersive X-ray spectroscopy (EDX spectrum) and determining of the chemical composition and (ii) recording of an electron diffraction image and determining of the diffraction bands; c) determining of a normalized vector v for the chemical composition at the measurement point, the coordinates whereof comprise details about the concentration of the elements and/or compounds at the measurement point; d) comparison of the normalized vector v for the chemical composition at the measurement point with each of the normalized vectors p(i) of the suspected crystal structures by issuing an evaluation factor s(i) for correlating each vector; e) comparison of the diffraction bands determined at the measurement point with the diffraction bands of the suspected crystal structures by issuing an evaluation factor n(i) for correlating the diffraction bands; and f) determining an overall quality from the two evaluation factors s(i) and n(i) and attributing the crystal structure with the highest overall quality to the measurement point.
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
G01N 23/225 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes
63.
Method for identifying a crystallographic candidate phase of a crystal
According to the invention a method is provided for identifying a crystallographic candidate phase of a crystal in an EBSD diffraction pattern, which includes the following steps: Sorting and indexing of the bands of the diffraction pattern in order of decreasing intensity. Providing of indices of the diffraction bands of candidate phases, which are to be expected as a result of the EBSD pattern acquisition, in a database, wherein all the indices provided can, in each case, be assigned to a candidate phase. Identification of the expected bands with the bands measured in the diffraction pattern for each candidate phase. Comparison of the intensities of bands of the measured diffraction pattern with intensities which were predicted for the diffraction bands of the candidate phases, which are to be expected as a result of the EBSD pattern acquisition, the indices of said candidate phases being stored in the database. In addition, a corresponding computer program and a computer-readable storage medium are provided, on which a computer program according to the invention is stored.
The invention relates to a photon detector (10), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis (23) and has a detector head (11) at a first end of the measurement finger, wherein the detector head (11) comprises a plurality of at least two detector modules (22), each comprising a sensor chip (12) sensitive to photon radiation (14), in particular x-radiation, said sensor chip having an exposed end face (13) and a face facing away from the end face (13), wherein the detector modules (22) are arranged around the detector axis (23) in a plane (24) extending orthogonally to the detector axis (23).
G01N 23/00 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or
G01T 1/24 - Measuring radiation intensity with semiconductor detectors
G01N 23/225 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes
H01J 37/244 - Detectors; Associated components or circuits therefor
65.
LENS MAIN PART FOR SPECTROMETER, METHOD FOR PRODUCING A LENS MAIN PART FOR A SPECTROMETER AND SPECTROMETER COMPRISING A LENS MAIN PART OF THIS TYPE
The invention relates to a lens main part (10) for a spectrometer for mounting other components (18, 24, 28) of a spectrometer, the lens main part being produced as a sandwich construction from at least three flat elements (12, 14, 16) arranged one on top of the other and interconnected, in particular bonded, each of said flat elements (12, 14, 16) having a low coefficient of thermal expansion which is substantially isotropic, at least on one isotropic plane. The flat elements (12, 14, 16) are arranged on top of one another and interconnected such that their isotropic planes run substantially parallel to one another.
The invention relates to an energy dispersive detection method for X-radiation, comprising the following steps: irradiating a sample (20) with a primary electron beam (11) while exciting an emission of X-radiation (13) and back-scattered electrons (12); providing a means (34) for reducing the back-scattered electrons (12), said means comprising at least two windows (33) with different transmission properties for back-scattered electrons (12); positioning one of the at least two windows between an X-ray detection element (31) and a sample (20); and detecting the X-radiation (13) by means of the X-ray detection element (31). According to the invention, the one of the at least two windows (33) is selected such that in a predetermined energy range in at least one characteristic X-ray peak the transmittance Tx for X-rays is at a maximum and the transmittance TBSE for back-scattered electrons is not more than 0.1.
H01J 37/252 - Tubes for spot-analysing by electron or ion beams; Microanalysers
H01J 37/244 - Detectors; Associated components or circuits therefor
G01N 23/225 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes
67.
X-ray analyzing system for x-ray scattering analysis
b) has at least three hybrid slit elements (7), each hybrid slit element (7) having a single crystal substrate (8) bonded to a base (9) with a taper angle α≠0. The single crystal substrates (8) of the hybrid slit elements (7) limit the aperture and the hybrid slit elements (7) are staggered with an offset along the transmission axis (3). The X-ray analyzing system has improved resolution and signal to noise ratio.
G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
G21K 1/04 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
68.
DEVICE FOR SPATIALLY ORIENTING AN X-RAY OPTICAL UNIT AND APPARATUS HAVING SUCH A DEVICE
The invention relates to a device (98) for spatially orienting an x-ray optical unit (100) having an input point (104) and an output point (108). The device (98) comprises a parallel-displacement mechanism (200) for moving the input point (104) of the x-ray optical unit (100) to a first predetermined point by means of parallel displacement of the x-ray optical unit (100). In addition, the device (98) comprises a goniometer mechanism (300) for moving the output point (108) of the x-ray optical unit (100) to a second predetermined point (108) by means of at least approximate pivoting of the x-ray optical unit (100) about the input point (104). The invention further relates to an apparatus (96), which comprises the device (98) and an x-ray optical unit (100).
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
69.
XRF measurement apparatus for detecting contaminations on the bevel of a wafer
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
The invention relates to a photon detector (10), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis (23) and has a detector head (11) at a first end of the measurement finger, wherein the detector head (11) comprises a plurality of at least two detector modules (22), each comprising a sensor chip (12) sensitive to photon radiation (14), in particular x-radiation, said sensor chip having an exposed end face (13) and a face facing away from the end face (13), wherein the detector modules (22) are arranged around the detector axis (23) in a plane (24) extending orthogonally to the detector axis (23).
09 - Scientific and electric apparatus and instruments
Goods & Services
Microscopes, namely, Scanning Probe Microscopes and Atomic Force Microscopes for analyzing and manipulating surfaces at the nanometer scale by means of an atomically fine tip that scans over the surface of a sample
72.
Device and method for combustion analysis by means of induction furnaces and protective element for induction furnaces for the combustion analysis
With a device for combustion analysis, comprising an induction furnace with a furnace chamber, in which carrier gas can flow during operation via at least one gas inlet to a gas outlet, and in which a sample to be analyzed can be arranged and burned in a sample container, a hollow protective element is provided and, with normal operation of the device, is arranged in the furnace chamber directly above the sample in such a way that the end of the protective element facing towards the sample, together with the sample container, forms a constriction for the carrier gas flow, wherein the protective element is desgned to convey gases produced during the combustion of the sample through the protective element and to the gas outlet.
G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods using combustion
The invention relates to a spectrometer comprising a hollow main optical body having at least one light channel, a light source, a diffraction grating having a grating central point, a light inlet opening, and a detector unit, which are arranged in such a way that the focal curve of the spectrometer satisfies the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, which spectrometer is able to operate in a large temperature interval even without thermostatic control, according to the invention the light inlet opening is arranged on a compensation body, the compensation body is arranged in the light channel and fastened to the main optical body between the light source and the diffraction grating, and the compensation body is dimensioned in such a way that the compensation body changes the distance between the light inlet opening and the grating central point when the main optical body thermally expands.
The invention relates to a device (10) for combustion analysis with an induction furnace having a furnace chamber (11), in which during operation carrier gas can flow via at least one gas inlet to a gas outlet (33), and in which a sample to be analyzed can be arranged and burned in a sample container (24). The device is provided with a hollow protective element (32), which, when the device is in the proper operational state, is arranged in the furnace chamber (11) directly above the sample such that the end of the protective element (32) facing the sample, together with the sample container, forms a constriction for the carrier gas flow, wherein the protective element is designed to conduct the gases generated during the combustion of the sample through the protective element to the gas outlet (33).
G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods using combustion
75.
METHOD AND ARRANGEMENT FOR CHARACTERIZING FAT BLOOM AND QUALITY OF CHOCOLATE CONTAINING SURFACES BY X-RAY DIFFRACTION
A method and an arrangement for characterizing an object comprising a fatty acid is provided, the method comprising: directing an X-ray beam (105) to a surface (113) of the object (115) at a grazing incidence angle (αi); diffracting the X-ray beam at the object; detecting an intensity pattern of the diffracted X-ray beam emanating from the surface; comparing the intensity pattern with reference data; and characterizing the object based on the comparison. The object may in particular comprises cacao butter or chocolate.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
An X-ray optical configuration for irradiation of a sample (1) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source (2) and a beam-conditioning X-ray optics, is characterized in that the X-ray source (2) comprises a brilliant point source (4) and the X-ray optics comprises an X-ray optical element (3) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
77.
Low-interference sensor head for a radiation detector, as well as a radiation detector which contains this low-interference sensor head
The invention relates to a low interference sensor head for a radiation detector and a radiation detector containing said low interference sensor head. Preferably, the radiation detector according to the invention is an X-ray detector. The invention further relates to the use of the low interference sensor head or the radiation detector, in particular of the X-ray detector for radiation analysis, in particular for (energy dispersive) X-ray analysis in microscopy using optics for charged particles.
A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
79.
APPARATUS AND METHOD FOR SUPPORTING A LIQUID SAMPLE FOR MEASURING SCATTERING OF ELECTROMAGNETIC RADIATION
It is provided an apparatus for supporting a liquid sample for measuring an intensity of electromagnetic radiation scattered by the liquid sample, the apparatus comprising : a first support member (103, 203, 603) having a first surface (104, 204, 604); a second support member (105, 205, 605) having a second surface (106, 206, 606), the first surface and the second surface being adapted such that the liquid sample (101) is supportable between the first surface and the second surface by a surface tension force, wherein the apparatus is configured such as to allow the electromagnetic radiation to impinge along a first direction (117, 217, 317, 417, 517, 617) through the first support member onto the liquid sample and to leave the liquid sample through the second member along a second direction (119, 219, 319, 419, 519, 619) different from the first direction to be detected by a detector. Further, a system for measuring an intensity of electromagnetic radiation scattered by a liquid sample and corresponding methods are provided.
G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
H01J 37/20 - Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
80.
Method for determining the quantitative composition of a powder sample
A method for automatic determination of the quantitative composition of a powder sample, comprises the following steps: (a) predetermining a list of phases; (b) calculating a theoretical diffraction diagram or theoretical energy-dispersive spectrum; (c) fitting the theoretical diffraction diagram or theoretical energy-dispersive spectrum. In step (a), a list is predetermined which is composed of phases that are actually contained in the powder sample and also phases that are possibly not contained in the powder sample, a threshold value for the phase content is predetermined for each phase, and the following further steps are carried out: (d) elimination of all phases, having phase contents which are below the threshold value, from the list in step (a); (e) repeating steps (b), (c) and (d) with the new list until all phase contents are above their predetermined threshold values; and (f) outputting the composition of the powder sample. This method permits automatic exclusion of amorphous or crystalline phases with phase contents below a user-definable threshold value in profile adjustment methods based on Rietveld or Pawley methods.
The invention relates to a spectrometer (10), comprising a hollow main optical body (12) having at least one light channel (14), a light source (18), a diffraction grating (20) having a center grating point, a light inlet opening (24), and a detector unit (22), which are arranged in such a way that the focal curve of the spectrometer fills the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, said spectrometer being able to operate in a large temperature interval even without temperature stabilization, the light inlet opening (24) is arranged on a compensation body (28), the compensation body (28) is arranged in the light channel (14) and fastened to the main optical body (12) between the light source (18) and the diffraction grating (20), and the compensation body (28) is dimensioned in such a way that the compensation body changes the distance between the light inlet opening (24) and the center grating point when the main optical body (12) thermally expands.
G01N 21/67 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
An apparatus for analyzing a granulate for producing a pharmaceutical product, the apparatus comprising a data receiving unit adapted for receiving X-ray diffraction data indicative of a scattering of X-rays irradiated onto the granulate, a processor unit adapted for processing the X-ray diffraction data to derive information indicative of at least one of a compressibility and a dissolution characteristic of the granulate, and a control unit adapted for controlling a process of producing a pharmaceutical product based on the derived information.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
G01N 23/201 - Measuring small-angle scattering, e.g. small angle X-ray scattering [SAXS]
83.
Sensor head for an x-ray detector and x-ray detector containing said sensor head
The invention relates to a reduced sensor head (30) for an X-ray detector (74), comprising a printed circuit board (10) having an end face (12) and lateral faces (14), a sensor chip (32) which is arranged on the end face (12) of the printed circuit board (10) and which is sensitive to X-ray radiation (72), a plurality of signal and control connections (40), a plurality of bonding islands (16) which are arranged on the printed circuit board (10) so as to make contact and which are electrically conductively connected to the signal and control connections (40) by means of at least one respective bonding wire (46), wherein the bonding islands (16) are arranged on the lateral faces (14) of the printed circuit board (10). The inventive arrangement of the bonding islands (16) on the lateral faces (14) of the printed circuit board (10), together with lateral bonding of the bonding wires (46), allows the components of the sensor head (30) to be arranged in a space-saving manner, the overall result of which is a reduction in the sensor head (30).
An X-ray optical configuration (1), comprising a position for an X-ray source (2), a position for a sample (3), a first focusing element (4) for directing X-ray radiation from the position of the X-ray source (2) via an intermediate focus (5) onto the position of the sample (3), and an X-ray detector (6) that can be moved on a circular arc (7) of radius R around the position of the sample (3), is characterized in that the configuration also comprises a second focusing element (8) for directing part of the X-ray radiation emanating from the intermediate focus (5) onto the position of the sample (3), and an aperture system (9) for selecting between illumination of the position of the sample (3) exclusively and directly from the intermediate focus (5) (=first optical path (10′)), or exclusively via the second focusing element (8) (=second optical path (10″)). The configuration facilitates changing between reflection geometry and transmission geometry, in particular, wherein modification and adjustment devices are minimized or unnecessary.
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
85.
METHOD AND ARRANGEMENT FOR GENERATING REPRESENTATIONS OF ANISOTROPIC PROPERTIES AND A CORRESPONDING COMPUTER PROGRAM AND A CORRESPONDING COMPUTER-READABLE STORAGE MEDIUM
The invention relates to a method and an arrangement for generating and representing anisotropic properties and a corresponding computer program and a corresponding computer-readable storage medium that can be used particularly in materials science for representing textures or in diffractometry, for example for rapidly generating stereographic or gnomonic projections of anisotropic properties (pole figures, orientation density distributions, EBSD patterns [EBSD = Electron Backscatter Diffraction] or the like). The invention proposes carrying out the following steps for generating representations of anisotropic properties: - determining a radial distribution of at least one anisotropic property, - generating a spherical or polyhedral model, the respective surfaces of which at least partially comprise a reproduction of the radial distribution, - generating the representations of anisotropic properties by projecting at least one part of the radial distribution reproduced on the spherical or polyhedral surface into a plane using a computer graphics program.
The invention relates to a low-interference sensor head (30) for a radiation detector, and to a radiation detector which contains the low-interference sensor head. The radiation detector according to the invention is preferably an X-ray detector. The invention also relates to the use of the low-interference sensor head or of the radiation detector, in particular of the X-ray detector, for radiation analysis, in particular (energy-dispersive) X-ray analysis in microscopy, using optics for charged particles.
The invention relates to a method for the combined analysis of a sample with objects to be analyzed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analyzed in the sample are obtained by analyzing the one or more objects to be analyzed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analyzed by analyzing the one or more objects to be analyzed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.
The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell.
The invention relates to a detector (10) and a device for the simultaneous, energy-dispersive recording of backscattered electrons (5) and X-rays (7) after a sample (3) is excited with primary electrons (4). The detector (10) comprises an energy-dispersive X-ray detector element (12) and a means (11) for reducing the amount of the backscattered electrons compared to the amount of the X-rays, arranged in front of the X-ray detector element (12). The means (11) is designed in such a way that the amount of the backscattered electrons (5) compared to the amount of the X-rays (7) is reduced in such a way that the characteristic peaks of the X-rays (7) can be proven compared to the measuring signal of the backscattered electron amount (5), and simultaneously a backscatter electron amount can be proven after the theoretical X-ray bremsstrahlung background is deducted from the measured spectrum.
The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.
The invention relates to an apparatus and a method for examining a specimen by means of probe microscopy, in particular scanning probe microscopy. The apparatus comprises a probe microscope device which has a specimen holder for holding a specimen to be examined, a measurement probe and a displacement unit which is configured to displace the specimen holder and the measurement probe relative to one another for an examination of the specimen by means of probe microscopy, and comprises a condenser illumination and also an optical system which is arranged downstream of the condenser illumination and is configured to project condenser light, which is emitted by the condenser illumination in a condenser light path, into the region of the specimen holder for optical microscopy of the specimen to be examined, while at least partially maintaining condenser light parameters with which the condenser light is emitted by the condenser illumination.
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle. During the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position. During the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.
An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength and energy, and a detector (5) for measuring the selected X-ray beams, a diffractometry channel (6) that selects, by means of a monochromator (7), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector (8) for measuring the selected X-ray beams, is characterized in that a single slit device (9) is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit (10) which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2θ of a predetermined crystal structure of the polycrystalline sample at the wavelength of the source selected by the monochromator. In this fashion, reliable element analysis and inexpensive X-ray diffraction can be performed with the same device, wherein the at least three collimator arrangements that have been necessary up to now for the diffractometry channel, are omitted and the monochromator does not require any complex diffraction mechanism in the diffractometry channel.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
94.
X-ray reflectometry system with multiple sample holder and individual sample lifting mechanism
An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position. When the sample lift mechanism (7) is activated, the piston (8) moves upwards against a bottom surface of the selected sample (4) or sample container (9) containing said selected sample (4), lifts the selected sample (4) or sample container (9) until it touches a stop (10) that keeps the sample (4) in the sample measuring position. When the sample lift mechanism (7) is deactivated, the piston (8) moves downwards and the sample (4) rests in its resting position. The device prevents signal cross talk to neighboring samples or to the sample holder, while also assuring an alignment which can be parallel to the incident beam.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
An X-ray optical element (1, 1′, 1″) with a Soller slit comprising several lamellas for collimating an X-ray beam with respect to the direction of the axis (5, 15) of the Soller slit, and a further collimator for delimiting an X-ray (10), wherein the further collimator is rigidly connected to the Soller slit (2, 14) during operation, is characterized in that the X-ray beam (10) delimited by the further collimator intersects the axis (5, 15) of the Soller slit within the Soller slit, and the direction of the X-ray beam (10) subtends an angle α≧10° with respect to the axis (5, 15) of the Soller slit. An X-ray optical element (1, 1′, 1″) with a Soller slit (2, 14) and a further collimator is thereby realized, which permits automatic change between the Soller slit (2, 14) and the further collimator.
G21K 1/06 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction, or reflection, e.g. monochromators
96.
Door configuration with a pivoting door and sliding door function which can be actuated by a single actuating element
A door configuration, which improves the operating and locking mechanism and facilitates construction and handling, comprising a door having a sliding door disposed on a casement such that it can be slidably displaced and the casement can he pivoted about an axis relative to a main frame. A lock is provided for locking and unlocking the casement with respect to the main frame, and an operating element is disposed on the sliding door, which can be moved with the sliding door and can be switched between a first position and a second position, wherein, in the first position, the operating element does not obstruct movement of the sliding door on the casement, and, in the second position, the operating element engages with the latch or a carrier, such that, when the casement is closed, the latch is operated when the sliding door is moved.
b) can be pivoted about the axis S relative to the main frame (9). The amount of space that is required in front of the access to the working chamber is thereby reduced.
The invention relates to a method and a device for determining the cell activation of a target cell by an activator, said method having the following steps: provision of a probe measuring device with a probe sample arrangement having a measuring probe and a sample holder; loading of the probe sample arrangement with a target cell and with an activator assigned to the target cell, the measuring probe being loaded with the activator, and the sample holder being loaded with the target cell, or vice versa; relative mutual displacement of the measuring probe and the sample holder until contact is made between the target cell and the activator by means of a displacement apparatus of the probe measuring device; recording of measurement values, indicating binding between the target cell and the activator, for the measuring probe with the probe measuring device during the relative displacement of the measuring probe and the sample holder; and determination of a dimension for the cell activation of the target cell from the measurement values recorded.
The invention relates to a sensor head (30) for an X-ray detector (74), which sensor head is reduced in size and comprises a printed circuit board (10) having a front face (12) and lateral faces (14), a sensor chip (32) which is arranged on the front face (12) of the printed circuit board (19) and which is sensitive to X-rays, a plurality of signal and control connections (40), a plurality of bonding islands (16) which are aranged so as to contact the printed circuit board (10) and which are interconnected via at least one bonding wire (46) each to the signal and control connections (40) in an electrically conductive manner, the bonding islands (16) being arranged on the lateral faces (14) of the printed circuit board (10). The arrangement of the bonding islands (16) on the lateral faces (14) of the printed circuit board (10) and the lateral bonding of the bonding wires (46) together result in a space-saving arrangement of the components of the sensor head (30) which in sum leads to a reduction in size of the sensor head (30).
An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
