A test system rack or cabinet includes a housing containing instruments or equipment and a mass interconnect (MIC) mounted within the housing. The MIC has inputs to couple to the instruments or equipment and outputs to couple to a second MIC separate from the rack. The test system rack has legs positioned underneath the housing to support the housing and the first MIC. The test system rack has actuators configured to adjust a position of the first MIC without adjusting a position of the one or more legs.
Disadvantages associated with present day instrument probes, e.g., active probes used with oscilloscopes, may be overcome by implementing an active probe entirely as a packaged integrated circuit (IC). The probe IC may be implemented in a small, low pin-count package to facilitate the mounting of many probe ICs in a small area. The probe IC may include an interface for configuration as well as customized software to control the probe IC and measurement instrumentation, for example, an oscilloscope, for a variety of applications. The probe IC may be implemented as any one of different types of probes, including active probes and passive probes, voltage probes and current probes, or single ended probes and differential probes.
Methods, computing devices, and software programs for identifying a driving scenario in real-time driving data. A driving scenario is received and translated into an ordered sequence of events that correspond to the driving scenario. A signal computation function is determined for each event in the sequence, which quantifies proximity to the respective event. Driving data is received for a plurality of time steps. Values of each signal computation function are determined, evaluated for the driving data at each of the plurality of time steps. It is determined whether the driving scenario has occurred in the driving data based on the values of the signal computation function. A first portion of the driving data is either modified, discarded, or stored in memory based on the determination whether the driving scenario has occurred.
A control system exhibits improved dynamic performance in a constant voltage (CV) control mode that is also invariant of the source type and operating points. The improvements may be achieved with minimal or potentially no additional parts to the control circuit by replacing a voltage-controlled current source with a voltage-controlled resistance as the control element in the system feedback loop. An input voltage from a device under test (DUT) is measured, a feedback control voltage is determined based at least in part on the input voltage to provide a CV mode control loop for the DUT, and the feedback control voltage added to the input voltage is applied to the DUT to operate the DUT in the CV mode.
G05F 1/56 - Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
5.
Specification to Test using Generative Artificial Intelligence
Apparatuses, systems, and methods for generative Artificial Intelligence (AI) assisted test process development based on an initial input of a specification of a device under test (DUT). The specification of the DUT may be inputted into the Generative AI model. The Generative AI model may summarize the specification, request further input via an interaction with an end user to finalize a description of the DUT, and generate/create test assets, such as code, documentation, tables, diagrams, and so forth. The Generative AI model may collaborate with the end user to refine outputs from the test assets. The refined test assets may be sent to software applications that can use/run/deploy various test assets. Additionally, the generative AI may access local test hardware and enumerate test hardware on other systems via network/serial communications to create a test system that fits the identified hardware.
A matrix switching workflow allows for extending the virtual device configuration associated with a given single (test) site to multiple (test) sites, and expanding use of a single functional test program/sequence from a single site to multiple sites. Virtual device and connection support in a pin map editor enables mapping between switched instrument channels and switched device under test (DUT) pins on multiple sites, eliminating additional editing work. A switched channels section in a front test program design panel may list fully qualified channel connections to pins configured to a matrix switch. Configurations may be exported based on pin names and not based on the switch channel connection so that the configuration may be applied to switched instrument channels based on the specified pins. In order to avoid entering route/route-group names in the pin map, a specific route/route-group naming scheme may be used.
A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array receiver is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the receiver receives a near-field (NF) over-the-air (OTA) signal from the AUT. An alignment procedure is performed to align reception locations for signals received by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the receiver. The correction factors are applied to the received signals, and the corrected signals are combined at each reception location to obtain average signals. A far-field (FF) transmission pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment procedure is performed to align transmission locations for signals transmitted by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the transmitter. The correction factors are applied to the signals, and the corrected signals are combined at each transmission location to obtain average signals. A far-field (FF) reception pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
Systems, methods and devices for performing dynamically controlled battery cell formation. A formation process is performed on a plurality of battery cells. A series connection is established through each of the plurality of battery cells and a cycling device. Each battery cell is coupled to a respective monitoring device to monitor performance during cell formation. The monitoring devices provide indications to a controller when their monitored battery cells experience a status change. Responsive to the indication, instructions are provided for synchronously modifying the series connection through the first battery cell and modifying a voltage amplitude at the cycling device. Modifying the series connection through the first battery cell may include switching a voltage polarity across the first battery cell shorting the series connection around the first battery cell without modifying the series connection through the other battery cells.
Systems, methods and devices for performing dynamically controlled battery cell formation. A formation process is performed on a plurality of battery cells. A series connection is established through each of the plurality of battery cells and a cycling device. Each battery cell is coupled to a respective monitoring device to monitor performance during cell formation. The monitoring devices provide indications to a controller when their monitored battery cells experience a status change. Responsive to the indication, instructions are provided for synchronously modifying the series connection through the first battery cell and modifying a voltage amplitude at the cycling device. Modifying the series connection through the first battery cell may include switching a voltage polarity across the first battery cell shorting the series connection around the first battery cell without modifying the series connection through the other battery cells.
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.
A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.
G01R 31/389 - Measuring internal impedance, internal conductance or related variables
G01R 31/36 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
G01R 31/385 - Arrangements for measuring battery or accumulator variables
15.
SYSTEM AND METHOD OF ADAPTIVELY ASSIGNING SCENARIO-BASED TESTS TO TEST ASSETS
Techniques for assigning scenario-based tests to test assets are described. In an example, a scenario-based test operable to test a key performance indicator (KPI) of a System Under Test (SUT), a component behavior exhibited by a first component of the SUT, and a scenario characteristic are received. Based on the component behavior and the scenario characteristic, a first plurality of behavior models associated with the component behavior are identified. Based on the scenario characteristic a characteristic value is extracted from the scenario-based test. Each behavior model of the first plurality of behavior models is executed using the characteristic value to generate a first plurality of predicted behavior outcomes. Based on the first plurality of predicted behavior outcomes, a first test asset type from a plurality of test asset types is selected and the scenario-based test is transmitted to a test asset of the first test asset type.
Systems, methods and devices for constructing an electrochemical process manifold (EPM) for a battery cell during a formation process. The current through the cell is controllably adjusted to charge or discharge the cell. The temperature and/or pressure may be controllably adjusted along with the current. At each of a plurality of time steps as the current is controllably adjusted, the voltage across the cell is measured and integrated over time to obtain a voltage-hours value for each time step. A data point is stored in memory for each time step that includes the measured voltage, the voltage-hours value, and the current through the cell at the respective time step. The data points for each time step are mapped onto an EPM, and the EPM is stored in a non-transitory computer-readable memory medium.
Systems, methods and devices for constructing an electrochemical process manifold (EPM) for a battery cell during a formation process. The current through the cell is controllably adjusted to charge or discharge the cell. The temperature and/or pressure may be controllably adjusted along with the current. At each of a plurality of time steps as the current is controllably adjusted, the voltage across the cell is measured and integrated over time to obtain a voltage-hours value for each time step. A data point is stored in memory for each time step that includes the measured voltage, the voltage-hours value, and the current through the cell at the respective time step. The data points for each time step are mapped onto an EPM, and the EPM is stored in a non-transitory computer-readable memory medium.
G01R 31/36 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
G01R 31/378 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator
G01R 31/3828 - Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration
G01R 31/3842 - Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements
G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
G01R 31/396 - Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
H01M 50/569 - Constructional details of current conducting connections for detecting conditions inside cells or batteries, e.g. details of voltage sensing terminals
18.
METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN COMPONENTS OF A TEST SYSTEM
In an example, a first testing device is configured to receive testing data from a second testing. The first testing device is configured to send a stimulus to a device under test. The first testing device obtains test data reception methods and test data reception formats that are compatible with the first testing device and translates the methods and formats into content that is readable by the second testing device. The content is received by the second testing device, which accesses test data transmission methods and formats compatible with the second testing device and defines an intersection of the reception and transmission test data formats. The second testing device sends the intersection of methods and formats to the first testing device, which reduces the intersection to a final method and format.
A reflectometer may include two directional couplers configured in parallel by being disposed across from each other on opposite sides of a shared section of a signal line. One of the couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss relative to a serial coupler configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.
G01R 27/06 - Measuring reflection coefficientsMeasuring standing-wave ratio
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
20.
VIRTUALIZED AUTOMATED TEST EQUIPMENT AND METHODS FOR DESIGNING SUCH SYSTEMS
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system is virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
Efficient continuity testing for instruments connected to a mass interconnect. Digital input and output capabilities may be used on each pin of the mass interconnect to test a variety of input/output (I/O) types on a device under test. Each pin of the interconnect may connect to a respective corresponding digital input and digital output in the tester, with the digital input resistively coupled to the digital output. The connectivity of the pin to the digital input and the digital output, and the connectivity between the digital input and the digital output may be implemented with shift registers and a buffer stage, respectively. In some embodiments, the structure may be implemented through parallel I/O blocks, as in a complex programmable logic device (CPLD), field programmable gate array (FPGA), or microcontroller.
A method of orchestrating measurements in a measurement system includes configuring a first service with a first configuration for acquiring measurement data by an orchestrator. The method also includes receiving a moniker generated by the first service in response to being configured that represents the first configuration. The moniker includes a location of the first service and an identifier of the first configuration. The method also includes transferring the moniker to a second service configured to establish communication with the first service based on the location, consume the measurement data acquired by the first service using the first configuration and transmitted in response to receiving the identifier from the second service, and generate a result in response to receiving the measurement data from the first service. The method further includes receiving the result from the second service.
H04L 41/5054 - Automatic deployment of services triggered by the service manager, e.g. service implementation by automatic configuration of network components
H04L 41/0806 - Configuration setting for initial configuration or provisioning, e.g. plug-and-play
H04L 61/4511 - Network directoriesName-to-address mapping using standardised directoriesNetwork directoriesName-to-address mapping using standardised directory access protocols using domain name system [DNS]
23.
Dynamic range extension of radio frequency signals using phasing of two or more IQ channels
Dynamic range of radio frequency transmitters and receivers may be improved via a multiple-channel phasor configuration in which channels are phased in a manner that distributes the local oscillator phases over π/2 radians. A multiple-channel phasing receiver may include a power splitter to split an input signal into multiple signals, and may further include multiple single-channel receivers providing intermediate signals. Each single-channel receiver may have an input that receives a respective signal of the multiple signals, and may further have an output to provide a respective intermediate signal as a function of the respective input signal, a total gain applied to the respective input signal, a signal frequency of the local oscillator signal, and a respective phase of the local oscillator signal. The multiple-channel receiver may include a digital signal processor that combines the plurality of intermediate signals into a single output signal. A multiple-channel transmitter/transceiver may be similarly implemented.
Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.
National Instruments Ireland Resources Limited (Ireland)
Inventor
Vanden Bossche, Marc
Abstract
In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.
A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.
Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.
G01R 19/03 - Measuring effective values, i.e. root-mean-square values using thermoconverters
G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
H01S 5/183 - Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
28.
Reduction of emulated channel count for phased-array systems through angle-of-arrival processing
Systems and methods for emulating a channel for wireless communications between a transmit (TX) system-under-test (SUT) and a receive (RX) SUT. The TX and RX SUTs include integrated antenna arrays for transmitting and receiving wireless signals. For a plurality of paths of the emulated channel, and for each antenna element of the TX SUT, a respective phase shift and gain modification is applied to a wireless signals transmitted by the respective antenna element. The phase shifts and gain modifications emulate path length differences between different antenna elements. The signals for each antenna element are summed, and a path-specific modification is applied to each aggregate signal for each path. For each RX antenna element, phase shift and gain modifications are applied to emulate path-length differences for the RX antenna elements, the resultant signals are summed for each path, and the emulated wireless signals are output to the RX antenna elements.
Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.
A reflectometer may include two directional couplers in a parallel configuration, sharing the same section of a signal line or through-line. For example, two directional couplers may be disposed across from each other on opposite sides of the shared through-line. One of the directional couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other directional coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss with respect to reflectometers having a serial configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.
G01R 27/06 - Measuring reflection coefficientsMeasuring standing-wave ratio
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.
A user equipment device (UE) determines a beam coherence interval metric, which is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a receive beam of the UE and a transmit beam of a base station transmitting to the UE. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE also determines a hysteresis value based on the beam coherence interval metric and uses the hysteresis value to decide to switch from an active receive beam to a different receive beam that has a signal quality higher than the active receive beam by at least the hysteresis value. Alternatively, the base station determines and sends the UE the hysteresis value.
H04B 7/06 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Downloadable computer software for utilizing quantifying and analyzing scientific information across multiple platforms; Recorded computer software and hardware for providing a framework to connect quantification and analysis systems from different platform environments sold as a unit Computer hardware and software design; Design and development of software and hardware for providing a framework to connect quantification and analysis systems from different platform environments
36.
MEASUREMENT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST
NATIONAL INSTRUMENTS IRELAND RESOURCES LIMITED (Ireland)
Inventor
Vanden Bossche, Marc
Abstract
The present invention relates to a measurement system (100) for determining voltage and current or incident and reflected wave at at least one port of a device under test (OUT). The OUT is excited by at least one modulated signal. The measurement system comprises : - at least one signal probing hardware circuit (30) configured to provide probed signals resulting from probing at a port of the OUT while allowing a signal to flow towards the OUT or while arranged to provide a termination to the OUT, one or more of voltage and current or incident and reflected wave, - a multi-channel receiver structure (62) comprising a plurality of receivers (64), configured to receive two probed signals coming from at least one of the signal probing hardware circuits, each of the plurality of receivers comprising a respective digitizer (66) for digitizing a corresponding one of the two probed signals, the respective digitizer having its own sample clock (67) derived from a master clock, - a synchronization block (80) external to the plurality of receivers and comprising a reference clock derived from the master clock, the synchronization block configured to enable the two probed signals to be phase coherently digitized across the plurality of receivers by synchronizing the respective sample clocks of the plurality of receivers while the reference clock is being shared with the plurality of receivers, - a signal processing circuit (90) configured to process the phase coherently digitized probed signals.
G01R 31/3193 - Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
37.
Measurement system for characterizing a device under test
National Instruments Ireland Resources Limited (Ireland)
Inventor
Vanden Bossche, Marc
Abstract
In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.
An open-loop test system (300, 400) for testing vertical-cavity surface-emitting lasers (306) is provided. A high-speed pulse generator (402, 302) may be used to produce nanoseconds pulses provided to the VCSEL device (306). A high-speed oscilloscope (410) may be used to measure the resultant nanoseconds pulses across the VCSEL device (306). The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data (308) derived from the system (300, 400). A pre-test compensation procedure may be used to obtain the compensation data (308), which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator (302) to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also to obtain various parameters later used to derive the accurate VCSEL device voltage and the accurate VCSEL device current.
G01R 27/00 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
39.
Direct network access by a memory mapped peripheral device for scheduled data transfer on the network
A network interface peripheral device (NIP) may include a network interface for communicating with a network, and an interconnect interface for communicating with a processor subsystem. First buffers in the NIP may hold data received from and/or distributed to peer peripherals by the NIP, and second buffers may hold payload data of scheduled data streams transmitted to and/or received from the network by the NIP. Payload data from the data in the first buffers may be stored in the second buffers and transmitted to the network according to transmit events generated based on a received schedule. Data may be received from the network according to receive events generated based on the received schedule, and distributed from the second buffers to the first buffers. A centralized system configuration entity may generate the schedule, manage configuration of the NIP, and coordinate the internal configuration of the NIP with a network configuration flow.
Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
H01Q 21/24 - Combinations of antenna units polarised in different directions for transmitting or receiving circularly and elliptically polarised waves or waves linearly polarised in any direction
H01Q 13/24 - Non-resonant leaky-waveguide or transmission-line antennas Equivalent structures causing radiation along the transmission path of a guided wave constituted by a dielectric or ferromagnetic rod or pipe
H04B 3/56 - Circuits for coupling, blocking, or by-passing of signals
H01Q 13/28 - Non-resonant leaky-waveguide or transmission-line antennas Equivalent structures causing radiation along the transmission path of a guided wave comprising elements constituting electric discontinuities and spaced in direction of wave propagation, e.g. dielectric elements or conductive elements forming artificial dielectric
H01Q 1/24 - SupportsMounting means by structural association with other equipment or articles with receiving set
41.
Virtualized automated test equipment and methods for designing such systems
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
A multiphase current-sharing configuration may include at least two power supplies providing respective output-currents in the current-sharing configuration. One or more of the power supplies may itself be a multiphase power supply. A first power supply of the current-sharing configuration may detect a phase difference between an external control signal provided to the first power supply to control the output voltage of the first power supply, and an internal control signal provided by a VCO of the first power supply. The phase difference may be provided to an integrator to cause the internal control signal to track the external control signal when the external control signal is available, and maintain a present operating frequency of the internal control signal in case the external control signal is lost, in which case the internal control signal may be used to uninterruptedly control the output voltage of the first power supply.
H02M 3/28 - Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC
H02M 3/335 - Conversion of DC power input into DC power output with intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate AC using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
43.
METHOD AND SYSTEM FOR OVER-THE-AIR TESTING OF MILLIMETER WAVE ANTENNA ARRAYS
A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
A connector gap between a module connector mating surface and the backplane connector of a chassis may be eliminated through a mechanism that forcefully pushes (or pulls) the module towards the backplane and/or forcefully pushes (or pulls) the backplane toward the module. A spring-loaded or resilient element may be used to fasten the module in a way that effectively fills any designed-in and tolerance-induced gap in the connector interface, allowing the connector to fully seat. In addition, a gasket or other compressible member may be included at the connector mating interface. The gap in the connector interface may be reduced by introducing adjustable card cage members that are capable of being set during the assembly or manufacturing process using special alignment fixtures. The gap in the connector interface may also be reduced by introducing a higher tolerance capable manufacturing process, such as machining, to the card cage sub-assembly.
Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.
System and method for machine condition monitoring using phase adjusted vector averaging. An analog signal from a sensor measuring a machine parameter may be acquired, thereby generating a first digital signal that includes multiple analysis blocks of data. For each analysis block, a complex valued frequency spectrum (CVFS) may be computed via a Discrete Fourier transform (DFT), at least one reference frequency may be specified, and a complex valued phase compensation vector that preserves magnitude while adjusting phase constructed to achieve coherence between reference frequency components (RFCs) and the selected analysis block. The CVFS may be phase compensated by multiplying the complex valued phase compensation vector with the complex-valued frequency spectrum. The complex valued frequency spectra of the analysis blocks may be vector averaged, thereby improving signal to noise ratio at specified frequencies. RFCs in the averaged spectrum may be identified, thereby generating average RFCs analyzable to determine machine condition.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.
A non-transitory computer-readable memory medium may store a first table comprising rows, wherein each row comprises a first data set identification (ID) field which stores a measurement data set identifier value identifying a measurement data set, and one or more fields for storing measurement data metadata associated with the identified data set. The medium may also store a second table comprising rows, wherein each row comprises a second data set identification (ID) field which stores a measurement data set identifier value present in the first data set ID field. The second table may also store a datapoints field for storing individual data set datapoints and a data set index field corresponding to an ordering of the individual data set datapoints. At least a portion of each of the fields of both the first and second tables may be stored in a columnar format in contiguous memory.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.
G06F 30/20 - Design optimisation, verification or simulation
G01S 17/10 - Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
G01S 17/34 - Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal
A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.
Systems and methods for communication between heterogenous processors via a virtual network interface implemented via programmable hardware and one or more buses. The programmable hardware may be configured with a multi-function bus such that the programmable hardware appears as both a network device and a programmable device to a host system. Additionally, the programmable hardware may be configured with a second bus to appear as a network device to an embedded system. Each system may implement network drivers to allow access to direct memory access engines configured on the programmable hardware. The configured programmable hardware and the network drivers may enable a virtual network connection between the systems to allow for information transfer via one or more network communication protocols.
G06F 13/28 - Handling requests for interconnection or transfer for access to input/output bus using burst mode transfer, e.g. direct memory access, cycle steal
41 - Education, entertainment, sporting and cultural services
Goods & Services
Arranging and conducting trade shows in the field of science and technology Educational services, namely, conducting seminars and conferences in the field of science and technology
Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
A method for determining coarse carrier phase and frequency offsets of an initial block of received M-QAM symbols includes creating a grid of discrete candidate phase offset values and for each candidate value: applying the candidate value to each symbol, applying a respective hard decision to each applied symbol, and computing a figure of merit based thereon. The candidate value having the best figure of merit is selected as an initial phase offset estimate. An initial frequency offset estimate is computed using the symbols updated with the initial phase offset estimate, their respective hard decisions, and an approximation of the complex exponential function. To track carrier phase and frequency offsets associated with a series of symbol blocks, for each symbol of a current block, set a binary trust weight based on comparison of a computed parameter with a threshold and use the binary trust weights to compute a phase offset error and a frequency offset error for the current block.
A low-reflectivity solid-state switch circuit includes an input port configured to transmit an electronic signal and first and second output ports configured to receive the electronic signal. The switch circuit further includes a first switching element connected between the input port and the first output port, a second switching element connected between the input port and the second output port, a third switching element connected to a first conductive path between the first switching element and the first output port, and a fourth switching element connected to a second conductive path between the second switching element and the second output port. The third and fourth switching elements are utilizable to shunt current reflections from their connected conducted paths when the respective conductive path is configured in an off configuration.
A user equipment device (UE) reduces receive beam selection time. An antenna array forms receive beams to receive synchronization signal blocks (SSBs) transmitted by a base station (BS). Each SSB comprises OFDM symbols. Each SSB includes a BS-assigned index. The receive beams are switched in time such that, for each SSB, two or more of the receive beams are used to receive corresponding two or more mutually exclusive sets each having at least one but less than all of the OFDM symbols of the SSB. A processor is programmed to, for each receive beam/SSB index pair, measure a signal quality based on the at least one but less than all of the OFDM symbols of the indexed SSB received by the receive beam of the pair. The processor uses the measured signal qualities to select one of the receive beams to use to receive subsequent communications from the BS.
H04B 7/08 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the receiving station
41 - Education, entertainment, sporting and cultural services
42 - Scientific, technological and industrial services, research and design
Goods & Services
Educational services, namely, conducting informal programs in the fields of engineering and technology, using on-line activities and interactive exhibits, and printable materials distributed therewith; Entertainment services, namely, providing podcasts in the field of engineering and technology Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
63.
Cellular system utilizing beam coherence interval metric
A UE determines a beam coherence interval metric that is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a UE receive beam and a base station transmit beam. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE reports the metric to the base station. The base station may update beam management resource and reporting configurations to the UE based on the metric. The UE may also use the metric to determine a hysteresis value useable by the UE to decide to switch from an active receive beam to a different receive beam having a higher signal quality by at least the hysteresis value.
H04B 7/06 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
Circuits and methods for electronically adjusting an effective inductance of one or more primary inductors in a circuit. The circuit may include a plurality of sub-circuits connected in parallel between an input and an output of the circuit. Each sub-circuit may include a primary inductor and an auxiliary inductor inductively coupled to the primary inductor. The circuit may further include first circuitry coupled to the primary inductor, wherein the first circuitry configured to introduce an oscillating first voltage across the primary inductor; and second circuitry coupled to the auxiliary inductor, wherein the second circuitry is configured to introduce an oscillating second voltage across the auxiliary inductor. The amplitudes of the second voltages may be selected to reduce a difference between effective inductances of the primary inductors.
Circuits and methods for operating a programmable load circuit that includes a plurality of sub-circuits connected in parallel between an input and an output. Each sub-circuit may include an inductor, a load, and a switch coupled to the inductor. Each switch may be configurable in a first state and a second state, wherein the inductor is either connected to the output through the load or connected to the output through a connection that bypasses the load. The switches of the plurality of first sub-circuits may be programmable to periodically switch between the first state and the second state according to a duty cycle, and the switches may be out of phase with each other by a predetermined amount. The duty cycle may be programmable to tune the load of the programmable load circuit.
H02M 3/158 - Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators including plural semiconductor devices as final control devices for a single load
Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.
Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.
Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a cross-correlation measurement, and the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
An apparatus to transmit and receive wireless communications is disclosed in which the transmit circuitry includes a square root raised cosine filter to pulse shape modulate signals and the receive circuitry includes a higher order Nyquist receive filter coupled to receive the input signals and remove the pulse shaping modulation. The cascaded combination of the transmit and receive filters has a frequency response equivalent to a higher order generalized raised cosine filter response.
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
A novel modular probe may include an interchangeable (connectable/disconnectable) probe-tip adaptor having a tip connector for coupling to a device under test, and further having a probe-tip terminal for coupling to a first assembly connector of a cable assembly, which further has a second assembly connector for coupling to a first build-out terminal of a build-out adaptor, which also has a second build-out terminal for coupling to an assembly connector of an interchangeable instrument connector cable assembly, which also has an instrument-end connector for coupling to a measurement instrument. The built-out adaptor may include a compensation adjustment circuit for compensating the probe for varying system capacitances. The probe may include one or more corrective circuits in the interchangeable probe-tip adaptor and/or in the build-out adaptor for at least partially terminating each end of the cable assembly with a characteristic impedance of the cable in the cable assembly to attenuate reflections.
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, the design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
74.
Wireless communication system that performs measurement based selection of phase tracking reference signal (PTRS) ports
A UE transmits to a BS an indication of a number of PTRS ports. The number of PTRS ports is a suggestion to the BS for allocating the indicated number of PTRS ports to the UE for transmission of PTRS from the BS to the UE to enable the UE to perform phase tracking. The method also includes allocating, by the BS, PTRS ports to the UE based on the indication of the number of PTRS ports. The indication may be included in a UCI message, MAC CE, or RRC message transmitted by the UE to the BS. The BS may map the allocated PTRS ports to DMRS ports corresponding to spatial streams transmitted by the BS. The UE may estimate CPE of each spatial stream, measure correlations of the estimated CPE among the spatial streams, and use the correlations to determine the suggested number of PTRS.
H04B 7/06 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
(1) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and downloadable electronic instruction manuals sold therewith.
(2) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith (1) Technical services, namely, design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
09 - Scientific and electric apparatus and instruments
42 - Scientific, technological and industrial services, research and design
Goods & Services
(1) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and downloadable electronic instruction manuals sold therewith.
(2) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith (1) Technical services, namely, design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis.
(2) Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
42 - Scientific, technological and industrial services, research and design
Goods & Services
Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
42 - Scientific, technological and industrial services, research and design
Goods & Services
Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
09 - Scientific and electric apparatus and instruments
Goods & Services
Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith
09 - Scientific and electric apparatus and instruments
Goods & Services
Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith
09 - Scientific and electric apparatus and instruments
Goods & Services
Computer hardware, recorded and downloadable software and software-hardware interfaces for use in the manufacture, development, control, and distribution of software-defined radios, radio systems and related applications
Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
42 - Scientific, technological and industrial services, research and design
Goods & Services
Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
09 - Scientific and electric apparatus and instruments
Goods & Services
Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith
88.
OVER-THE-AIR TESTING OF MILLIMETER WAVE INTEGRATED CIRCUITS WITH INTEGRATED ANTENNAS
Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.
G01R 21/12 - Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants
89.
OVER-THE-AIR TEST FIXTURE USING ANTENNA ARRAY, METHOD FOR PERFORMING OVER THE AIR PRODUCTION TESTING
Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections for input/output signals, power, and control and may also provide positioning. RF characteristics (e.g., including transmission, reception, and/or beamforming) of the DUT may be tested over-the-air using an array of antennas or probes.
Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.
H04B 17/27 - MonitoringTesting of receivers for locating or positioning the transmitter
H04B 17/17 - Detection of non-compliance or faulty performance, e.g. response deviations
H04B 17/336 - Signal-to-interference ratio [SIR] or carrier-to-interference ratio [CIR]
H01Q 3/26 - Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the relative phase or relative amplitude of energisation between two or more active radiating elementsArrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the distribution of energy across a radiating aperture
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01R 31/319 - Tester hardware, i.e. output processing circuits
H04B 17/12 - MonitoringTesting of transmitters for calibration of transmit antennas, e.g. of amplitude or phase
Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections for input/output signals, power, and control and may also provide positioning. RF characteristics (e.g., including transmission, reception, and/or beamforming) of the DUT may be tested over-the-air using an array of antennas or probes.
H04B 17/17 - Detection of non-compliance or faulty performance, e.g. response deviations
H04B 17/336 - Signal-to-interference ratio [SIR] or carrier-to-interference ratio [CIR]
H01Q 3/26 - Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the relative phase or relative amplitude of energisation between two or more active radiating elementsArrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the distribution of energy across a radiating aperture
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
H04B 17/27 - MonitoringTesting of receivers for locating or positioning the transmitter
G01R 31/319 - Tester hardware, i.e. output processing circuits
H04B 17/12 - MonitoringTesting of transmitters for calibration of transmit antennas, e.g. of amplitude or phase
Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.
A wireless cellular base station (BS) transmitter transmits a downlink calibration pilot symbol. A receiver receives from a user equipment (UE) an uplink calibration pilot symbol and an effective downlink channel estimate transmitted by the UE. The effective downlink channel estimate is computed by the UE using the downlink calibration pilot symbol received from the BS. Processing devices compute an effective uplink channel estimate using the uplink calibration pilot symbol received from the UE and compute channel reciprocity calibration coefficients using the effective downlink channel estimate received from the UE and the effective uplink channel estimate computed by the BS. The BS includes multiple antennas, and the BS computes the channel reciprocity calibration coefficients for each antenna. Alternatively, the uplink channel estimate received by the BS is an inverted version of the effective downlink channel estimate, which the processing devices use for channel reciprocity compensation.
H04B 7/06 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
09 - Scientific and electric apparatus and instruments
16 - Paper, cardboard and goods made from these materials
37 - Construction and mining; installation and repair services
41 - Education, entertainment, sporting and cultural services
42 - Scientific, technological and industrial services, research and design
Goods & Services
(1) Information processing installations and apparatus, namely computers, personal computers, computer terminals; computer peripherals, namely, interface boards, data acquisition and control apparatus, namely, meters for measuring voltage, meters for measuring electric current, sensors for determining temperature, pressure meters and sound level meters; computer parts; computer memory boards, computer memory expansion modules, semiconductor memory devices being computer memories; computer software, namely engineering and scientific software for use in industrial automation and scientific and engineering data acquisition, control and analysis operations, namely, for acquisition, processing and analyzing of industrial automation data, for controlling and emulating scientific and engineering instruments, namely, computer application software used for performing instrumentation functions, namely, performance tracking, performance improvement and performance trend reporting; magnetic and electronic data carriers, namely, blank magnetic disks, hard drives for computers; computer hardware; computer networks, namely, computer hardware for network access servers.
(2) Printed matter, namely books, manuals and brochures with regard to automation. (1) System analysis and other computer and automation services, namely repair and installation of computers.
(2) System analysis and other computer and automation services, namely computer training.
(3) Programming for electronic data processing, namely, computer programming, computer software and hardware development, and computer software and hardware engineering; control of computer projects, namely computer software project management services; automation consultancy and consultancy with regard to the choice of computer hardware and software.
95.
One-shot wideband delay measurement with sub-sample accuracy for parallel receivers and/or generators, and alignment procedure
Systems and methods are described for using a single wideband pilot signal to reduce a timing misalignment between receivers in a multiple-input multiple-output (MIMO) radio system. The multiple generators of the MIMO radio system may be aligned using a second wideband pilot signal subsequent to performing the receiver alignment. The calibration kit of the MIMO radio system may be aligned using a third wideband pilot signal prior to performing the receiver alignment. Alignment may be achieved to subsample precision by determining time delays from the rate of change of the phase shift of the wideband pilot signals.
Systems and methods for calibration and operation of a source-measure unit (SMU). The system may include a functional unit and output terminals coupled to the functional unit. An excitation signal may be applied to a capacitor by the SMU. The capacitor may be included in a calibration circuit. The method may include obtaining one or more of a current calibration coefficient (CCC) or a voltage calibration coefficient (VCC). The CCC may correspond to a current-range setting and the VCC may correspond to a voltage-range setting. The CCC may be obtained from a value of a first current and a value of a second current developed in the capacitor responsive to the excitation signal. The VCC may be obtained from a value of a first voltage and a value of a second voltage developed across the capacitor responsive to the excitation signal.
A novel coupling system may include a head-end circuit for coupling a probe via a cable to an instrument, delivering power to the probe over the cable while the cable carries signal(s) from the probe to the instrument. The head-end circuit may include a first terminal for coupling to the probe via a cable, and may further include a second terminal for coupling to the instrument. The head-end circuit may apply direct-current (DC) power to the cable, and may remove a DC voltage offset resulting from the applied DC power before a signal from the probe reaches the instrument. The head-end circuit may include a common node coupled to the first terminal, a current source coupling the common node to a supply voltage, and a voltage source coupling the common node to a second terminal that couples to the instrument.
To perform system level physical connectivity monitoring measurements, a test signal may be generated in an instrument and transmitted down a signal path extending from the instrument to a device. In a static state (high or low), the test signal generator may produce a specified AC impedance at the point where the signal path connects to the instrument for a designated back termination. A response signal resulting from the test signal may be acquired and used to obtain an impedance value and/or reflection coefficient value representative of the signal path and an additional signal path extending from the source of the test signal to the signal path. The measured response may be compared to an expected response to determine a condition of any component(s) in the signal path and/or in the additional signal path. The expected response may be represented by masks (low and high) created during automated test development.
A base station radio transceiver transceives beams with a UE. In a first beam set of wide beam reference signals (RS), each wide beam RS direction is unique, and in a second beam set of narrow beam RS, each narrow beam RS direction is unique and the width of the narrow beam RS is narrower than the width of the wide beam RS. A linkage uniquely links each narrow beam RS to a wide beam RS. The direction of each narrow beam RS is spatially nested within the width of the wide beam RS to which it is uniquely linked. A processor uses the first and second beam sets in a beam management process in which one of the narrow beam RS is selected for the UE and the wide beam RS uniquely linked to the selected narrow beam RS is selected for the UE according to the linkage.
H04B 7/08 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the receiving station
Wireless communication system that performs beam reporting based on a combination of reference signal receive power and channel state information metrics
A base station receives a report of channel state information (CSI) computation capability from a UE, configures the UE with X and Y values based on the reported computation capability, performs a beam sweep by transmitting direction-unique beams, and receives a beam measurement report from the UE comprising a reference signal receive power (RSRP) of Y strongest beams of the transmitted beams and at least a portion of the CSI of X strongest beams of the Y beams. Based on the beam measurement report, one of the X beams is selected to configure the UE for subsequent data and control channel transmissions. X and Y are positive integers, Y is greater than or equal to X, and Y is at least 1.
H04B 7/08 - Diversity systemsMulti-antenna systems, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the receiving station
