Goods & Services

Sample transfer system consisting of various hardware components, for the automated transfer of samples of all kinds under inert gas or vacuum between different devices, such as glove boxes, microscopes or ion milling systems

Goods & Services

Sample transfer system consisting of various hardware components, for the automated transfer of samples of all kinds under inert gas or vacuum between different devices, such as glove boxes, microscopes or ion milling systems.

Abstract

A method for the contactless measurement of an object with a measuring camera includes producing an uninterrupted relative motion between the measuring camera and a surface of the object. A plurality of images of the surface of the object are recorded during the relative motion, each image showing a different segment of the surface. A blur of the images that is produced by the relative motion is computationally extracted by applying a deconvolution algorithm, use being made of different convolution kernels that differ from one another in at least one zero. In this case, e.g., exactly one image of each segment of the surface can be recorded. During the recording of the exactly one image at least one recording parameter is changed such that the convolution kernel during the recording changes in at least one zero.

IPC Classes  ?

• G06T 5/73 - DeblurringSharpening
• G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Abstract

A method for operating an optical sensor, which has a movement controller that can be actuated by a user to control a movement of the sensor relative to a measurement object, includes identifying that the sensor is in a favorable state of movement relative to the measurement object, and generating and outputting a signal when the sensor is in the favorable state of movement to assist the user in keeping the sensor in the favorable state of movement, and/or inhibiting or blocking by machine a movement of the sensor which would cause the sensor to leave the favorable state of movement. To achieve a favorable orientation of the sensor, generating and outputting a third signal signals to the user to actuate the movement controller such that the sensor achieves the favorable orientation, and/or controlling by machine a movement of the sensor which causes the sensor to achieve the favorable orientation.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Goods & Services

Software in the field of metrology and quality assurance

Goods & Services

Software in the field of metrology and quality assurance

Goods & Services

Software in the field of metrology and quality assurance.

Goods & Services

Software in the field of metrology and quality assurance.

Abstract

A method for generating a resultant test plan includes generating a data record by measuring a measurement object. The method includes assigning at least part of the measurement object to an object class based on the data record. The method includes determining a test plan assigned to the object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment is known in advance, between (a) object properties determinable based on data and the object class or (b) the object class and the object-class-specific test plan. The method includes creating an adapted assignment by adapting the assignment based on: (a) object properties of the measurement object currently measured or (b) the resultant test plan assigned to the measurement object. The determining the resultant test plan is performed based on the adapted assignment.

IPC Classes  ?

• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Goods & Services

Optical apparatus and instruments; measuring, detecting, monitoring and controlling apparatus, instruments and systems, in particular testing and quality control devices; software for metrology and quality control. Printed matter; stationery; educational supplies [except apparatus]; paper and cardboard. Advertising; marketing; promotional activities [sales promotion] for third parties; promotional marketing services using audio and visual media; advertising and marketing services provided by means of social media, blogging, video blogging; banner advertising; production of advertising materials; organization of events for commercial and advertising purposes; organization of trade fairs; provision of business information of any kind; retail and wholesale services relating to optical apparatus and instruments and measuring apparatus and instruments; all the aforesaid services in the field of metrology and quality control; administration of internet communities in the area of quality control. Provision of information for training and education in the areas of metrology and quality control; online reference library services; audio, video and multimedia productions; production of podcasts; drafting of texts for blogs, other than advertising texts; provision of non-downloadable blogs; organization of conferences; organization and conduction of seminars, webinars and tutorials; organization of competitions and awards in the area of quality control [education and entertainment]. Scientific and technological services and research and design relating thereto; industrial analysis and research services; testing, authentication and quality control services; all the aforesaid services in the field of metrology and quality control; providing quality control information via a website; consultancy relating to quality control.

Abstract

A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Goods & Services

Measuring instruments, consisting of hard- and software. Measuring services.

Abstract

A method for selecting a measurement sequence for a coordinate measuring machine includes obtaining multiple surface regions of an object to be measured by at least one measurement sensor in respect of at least one predetermined property. The measurement sensor is arranged by the coordinate measuring machine at at least one specific position and/or with at least one specific orientation for the purposes of measuring a respective surface region. The method includes changing a measurement sequence, in which the surface regions should be measured, multiple times using at least one algorithm. The algorithm respectively ascertains a changed measurement sequence and an assessment variable for the changed measurement sequence within the scope of each change. The method includes selecting one of the measurement sequences based on the ascertained assessment variables. A relative relationship of at least two surface regions is specified as a condition to be observed by each measurement sequence

IPC Classes  ?

• G05B 13/04 - Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
• G01B 5/012 - Contact-making feeler heads therefor
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G06F 17/18 - Complex mathematical operations for evaluating statistical data
• G06F 30/20 - Design optimisation, verification or simulation

Abstract

A stripe projection system for three-dimensionally capturing the surface of a measurement object includes a projector configured to project a stripe pattern onto the measurement object and a digital camera for capturing the stripe pattern. The projector includes a binary amplitude mask having transparent and opaque regions. The amplitude mask has first stripe regions which extend in a first direction and in which the proportion of the opaque and of the transparent area proportions varies depending on a position in a second direction. In this case, it is provided that the first stripe regions each form a transition region between continuous opaque or transparent stripes extending in the first direction and alternate with these stripes in the second direction.

IPC Classes  ?

• G03B 21/54 - Accessories
• G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object

Abstract

A measurement device includes a measurement head configured to capture dimensional measurement data of a measurement object. A guide structure is configured to move and guide at least one of the measurement head and the measurement object in a measurement volume of the measurement device. A measurement unit is configured to capture positional data of the guide structure based on which a pose of the measurement head can be calculated. Multiple temperature sensor units are configured to capture temperature data about the measurement volume. Each temperature sensor unit includes a carrier element, a temperature sensor connected to the carrier element, and a heating element connected to the carrier element. A control system is configured to process the dimensional measurement data and the positional data and, based on the temperature data, correct at least one of the dimensional measurement data and the positional data.

IPC Classes  ?

• G01B 5/012 - Contact-making feeler heads therefor
• G01K 1/02 - Means for indicating or recording specially adapted for thermometers
• G01K 15/00 - Testing or calibrating of thermometers

Abstract

The invention relates to an X-ray measurement arrangement (1) for examining test objects (20) by means of X-ray radiation, comprising a rotatable receiving device (2), an X-ray examination device (3) having at least one X-ray source (4) and at least one X-ray detector (5), wherein the at least one X-ray source (4) and the at least one X-ray detector (5) are arranged on the rotatable receiving device (2), and at least one positioning device (7), which is configured to arrange at least one predetermined region of interest (20-1) of a test object (20) in a detection area (8) of the X-ray examination device (3) on an axis of rotation (9) of the rotatable receiving device (2), between the at least one X-ray source (4) and the at least one X-ray detector (5) and to hold it there during the examination. The invention also relates to a method for examining test objects (20) by means of X-ray radiation.

IPC Classes  ?

• G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material

Abstract

A method for measuring components produced by a production device includes selecting components to be measured from multiple components. The selection is made according to at least one selection parameter. The at least one selection parameter includes a sampling frequency. The method includes determining at least one production parameter. The at least one production parameter includes a production condition. The method includes adapting the sampling frequency based on the production parameter or a change in the production parameter. Adapting includes reducing the sampling frequency in response to one or more production parameters not changing by more than a predetermined amount.

IPC Classes  ?

• G05B 19/418 - Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]

Abstract

The present invention relates to a computer-implemented method (200) for locating an edge position of an edge (166) in an image region (162) of an image (160) with an extended depth of field, comprising the following steps: determining (206) an image gradient for each image point in the image region (162), wherein the determined image gradients form an image gradient map; determining (210) at least one edge parameter of a modelled, curved edge profile based on the image gradient map; determining (212) an edge profile (172) of the edge (166) on the basis of a projection of the image points of the image region (162) along the edge profile, using the at least one edge parameter; and determining (214) the edge position on the basis of the edge profile (172). The present invention also relates to a method (220) for edge location in an image with an extended depth of field, to a measuring device (10) and to a computer program product.

IPC Classes  ?

• G06T 7/10 - SegmentationEdge detection
• G06T 7/571 - Depth or shape recovery from multiple images from focus

Abstract

A photogrammetric camera for the two-dimensional measurement of objects has a lens, an image sensor and a pupil filter configured as a micromirror, each of which is transferable into a first and second tilted position. An illumination system produces light. A micromirror in the first tilt position reflects light produced by the illumination system such that the light cannot reach the object while light reflected at the object is guided to the image sensor. Conversely, a micromirror in the second tilt position reflects light such that the light can reach the object while light reflected at the object is supplied to the image sensor. To implement a recording of an image with coaxial dark or coaxial reflected light illumination, the micromirror device is controlled such that the light produced by the illumination system is incident on the surface at different angles within an angular range of at least arcsin(NA).

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G02B 26/08 - Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
• G02B 13/22 - Telecentric objectives or lens systems
• H04N 23/56 - Cameras or camera modules comprising electronic image sensorsControl thereof provided with illuminating means
• H04N 23/12 - Cameras or camera modules comprising electronic image sensorsControl thereof for generating image signals from different wavelengths with one sensor only

Abstract

A surface inspection system for capturing surface defects of a surface to be checked, includes a camera system, an illumination system including one or more light sources, and an evaluation system. The evaluation system evaluates a brightness and/or color distribution of the surface to be checked in at least one image captured by the camera system and captures surface defects of the surface to be checked as local deviations in the brightness and/or color. The evaluation system is configured to assess a local deviation in the brightness and/or color as a surface defect when the local deviation appears brighter in at least one first subregion and darker in at least one second subregion than a surface region surrounding the local deviation, and/or different colors are dominant in different subregions.

IPC Classes  ?

• G06T 7/00 - Image analysis
• H04N 23/56 - Cameras or camera modules comprising electronic image sensorsControl thereof provided with illuminating means
• H04N 23/695 - Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects
• H04N 23/90 - Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums

Abstract

The invention relates to a measuring apparatus (1) for optically measuring objects (2), having a camera (3) and a laser projection unit (4) which has a laser light source (5), wherein the laser projection unit (4) is designed to project laser light (L) onto an object (2) to be measured and the camera (3) is designed to record an image of the object (2) with the projected laser light (L), wherein the measuring apparatus (1) is designed to supply the at least one laser light source (5) with a driving power which varies during each exposure time of the camera (3), in particular a varying injection current and/or driving voltage, in order to increase the bandwidth of the projected laser wavelengths.

IPC Classes  ?

• G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object

Abstract

A method for additively manufacturing a workpiece includes obtaining a dataset that defines the workpiece in a layer stack. The method includes producing the layers in sequential production steps using a layer forming tool. At a defined point in time, the stack has an uppermost layer and zero or more layers underneath. The method includes thermally exciting the layer stack with a first pulsed thermal excitation. The first pulsed thermal excitation includes a spatially structured heating pattern that heats the uppermost workpiece layer in parallel at mutually spatially distant excitation points. The method includes recording images of the uppermost workpiece layer after the first pulsed thermal excitation and inspecting the layer stack using the images in order to obtain an inspection result. The inspection result is based on a time-based individual deformation profile or a time-based individual temperature profile determined from the images.

IPC Classes  ?

• B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B29C 64/268 - Arrangements for irradiation using laser beamsArrangements for irradiation using electron beams [EB]
• B29C 64/295 - Heating elements

Abstract

A method for additive manufacture of a workpiece includes obtaining a dataset defining the workpiece in multiple workpiece layers. The method includes producing a respective layer and capturing an image of the layer. The method includes feeding the image to a statistical learning model to determine a defect vector of defect probabilities each indicating whether a respective layer defect is present. The method includes, in response to no layer defects being present, selectively solidifying the layer. The method includes, in response to at least one defect being present, reworking or reproducing the layer and repeating the recording and the feeding to determine the defect vector again. The method includes repeating the producing, the recording, the feeding, and the selectively solidifying such that further layers are produced one on top of the other. The respective material layers each are inspected using the previously trained statistical learning model.

IPC Classes  ?

• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
• B22F 12/90 - Means for process control, e.g. cameras or sensors
• B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]

Abstract

A method for additive manufacturing includes obtaining a dataset that defines the workpiece in multiple workpiece layers arranged one on top of the other. A layer stack of multiple workpiece layers is produced based on the dataset. The layer stack has a respective topmost workpiece layer at a defined instant of time. The layer stack is thermally excited at the defined instant of time and a sequence of images of the respective topmost workpiece layer is recorded. The layer stack is inspected using the sequence of images. The inspection involves evaluation of an individual temporal deformation profile of the respective topmost workpiece layer in response to the thermal excitation. The individual temporal deformation profile has multiple characteristic features including an individual deformation increase, an individual deformation maximum, and an individual deformation decrease. The inspection result is determined by evaluating at least one of the characteristic features.

IPC Classes  ?

• B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B22F 12/90 - Means for process control, e.g. cameras or sensors
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes

Goods & Services

measuring instruments, consisting of hard- and software. measuring services.

Abstract

A method for measuring the surface topography of an object including the following steps: a) providing source radiation and dividing the source radiation into illumination radiation and reference radiation, b) illuminating the surface of the object with illumination radiation in a planar illumination field, the surface of the object being illuminated simultaneously with more than one spatial radiation mode and the radiation modes of the illumination being spatially and temporally coherent, but with a fixed phase difference from one another, and c) overlaying the reference radiation on illumination radiation back-scattered at the surface of the object, and detecting an interference signal of the overlaid radiation with a detector. Steps a) to c) are carried out for at least two different, fixed wavelengths. The surface topography of the object is determined by means of digital holography.

IPC Classes  ?

• G01B 9/021 - Interferometers using holographic techniques
• G01B 9/02 - Interferometers
• G01B 11/30 - Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Abstract

A method for additively manufacturing a workpiece having lateral workpiece dimensions includes obtaining a first data set defining the workpiece in layers arranged on top of the other. The method includes providing a manufacturing platform having lateral platform dimensions that are greater than the lateral workpiece dimensions. The method includes providing a structuring tool movable relative to the manufacturing platform. The method includes selecting an individual manufacturing region on the manufacturing platform. The method includes obtaining a second data set that represents individual layer deformations that are dependent on the selected manufacturing region. The method includes producing a defined material layer of the workpiece in the manufacturing region by controlling the structuring tool using the first and second data sets. The method includes repeating the producing in order to produce further defined material layers one on top of the other using the first data set and the second data set.

IPC Classes  ?

• B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B29C 64/245 - Platforms or substrates
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor

Abstract

A position of a movable part of a coordinate measuring machine (CMM) is determined repeatedly. A position value of the part is measured at a reference location. First and second acceleration values are measured at a first and second measuring location. The second measuring location is closer to a measuring sensor than the first measuring location and the first measuring location is closer to the reference location than the second measuring location. A target and/or actual state value is supplied to a model of the CMM. Estimators are modelled. The model is supplied with a position deviation based on the estimator of the position deviation and deviation based on the estimator of the deviation and the deviation of the measured first and second values. The position of the part is determined from the measured position value in relation to the reference location based on the estimator of the position deviation.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01P 15/18 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration in two or more dimensions

Abstract

A device for additive manufacturing of a workpiece includes a production platform supporting a defined material layer of particulate material, a structuring tool, an inspection sensor, a control unit, and a position encoder. The inspection sensor has a line scan camera and a line light source and is movable along a movement direction relative to the production platform. The position encoder generates a position signal representing a respective instantaneous position of the inspection sensor relative to the production platform. The control unit generates a spatially resolved image of the defined layer using the line light source, the line scan camera, and the position signal. The control unit controls the structuring tool in order to produce a defined workpiece layer by selectively solidifying particulate material of the defined material layer based on the image of the defined material layer and/or an image of a previously produced workpiece layer.

IPC Classes  ?

• B22F 12/90 - Means for process control, e.g. cameras or sensors
• B22F 12/30 - Platforms or substrates
• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B22F 12/50 - Means for feeding of material, e.g. heads
• B22F 12/45 - Two or more
• B22F 10/366 - Scanning parameters, e.g. hatch distance or scanning strategy
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor

Abstract

The invention relates to a computer tomography assembly (1) comprising an X-ray source (2), an X-ray detector (3), a first positioning device (4) with at least two translational axes (4-1, 4-2) and at least one rotational axis (4-3, 4-4), a second positioning device (5) with at least two translational axes (5-1, 5-2) and at least one rotational axis (5-3, 5-4), at least one pose detection device (6), and a controller (7), wherein the X-ray source (2) is arranged on the first positioning device (4), the X-ray detector (3) is arranged on the second positioning device (5), and the at least one pose detection device (6) is designed to detect and/or determine source poses (12) of the X-ray source (2) and detector poses (13) of the X-ray detector (3). The controller (7) is designed to arrange the X-ray source (2) along a source trajectory (30) by actuating the first positioning device (4), arrange the X-ray detector (3) along a detector trajectory (31) by actuating the second positioning device (5), and take into consideration the source poses (12) and detector poses (13) determined for each detected X-ray image (20) when reconstructing an object volume (40) from the detected X-ray images (20).

IPC Classes  ?

• A61B 6/03 - Computed tomography [CT]
• A61B 6/00 - Apparatus or devices for radiation diagnosisApparatus or devices for radiation diagnosis combined with radiation therapy equipment
• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Goods & Services

Optical apparatus and instruments; measuring, detecting, monitoring and controlling apparatus, instruments and systems, in particular testing and quality control devices; software for metrology and quality control. Printed matter, and stationery and educational supplies; paper and cardboard; all the aforesaid goods in the area of metrology and quality control. Advertising, marketing and promotional activities; promotional marketing services using audio and visual media; advertising and marketing services provided by means of social media, blogging, video blogging; banner advertising; production of advertising materials; organization of events for commercial and advertising purposes; organization of trade fairs; provision of business information of any means; retail and wholesale services relating to optical apparatus and instruments and measuring apparatus and instruments; all the aforesaid services in the field of metrology and quality control. Provision of training and education; online reference library services; audio, video and multimedia productions; production of podcasts, blogs and video blogs; organization of conferences; organization and conduction of seminars, webinars and tutorials; organization of competitions and awards; all the aforesaid services in the area of metrology and quality control. Industrial analysis and research services; testing, authentication and quality control services; IT services, namely creating an online community for registered users; Science and technology services; Technological research; Scientific services and design relating thereto; Technological services and design relating thereto; Scientific research; Provision of information in the field of quality control; provision of quality control information via a website; provision of information in the field of quality control via newsletters via e-mail; All the aforesaid services in the field of metrology and quality control.

Abstract

The invention relates to a method for operating a CT scanner (1), wherein, according to an inspection task, radiograms (11) of an inspection object (10) are captured for different radiographic directions using an X-ray source (2) and an X-ray detector (3), wherein a three-dimensional object volume (20) is reconstructed from the captured radiograms (11), wherein at least one quality parameter (21) which characterises the reconstructed three-dimensional object volume (20) is determined, and wherein, on the basis of the determined at least one quality parameter (21), an intensity of the X-ray source (2) is adjusted by changing at least one operating parameter (8) of the X-ray source (2) so that the at least one quality parameter (21) is in a predetermined parameter range (22) when the inspection task is carried out again. The invention further relates to a CT scanner (1).

IPC Classes  ?

• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Abstract

A method includes capturing images of a surface of a workpiece using an optical sensor. Each image respectively images a region of the surface. Each image is assigned a defined 6-DOF pose of the optical sensor relative to the workpiece and a defined focal plane position of the optical sensor. The captured images form an image stack. The method includes determining a sharpness value for each picture element of each image of the image stack to generate a sharpness map for each image. The sharpness maps of the images form a sharpness map stack. The method includes transforming the sharpness maps of the sharpness map stack into a defined reference system based on the respective assigned 6-DOF pose and focal plane position of the optical sensor in order to generate a sharpness cloud. The method includes generating a surface profile of the workpiece based on the sharpness cloud.

IPC Classes  ?

• G06T 7/00 - Image analysis

Abstract

A method for operating a joint and a joint for connecting a first joint element to a further joint element are provided. The joint includes the two joint elements, a head element, a socket element, and at least two drive devices. The head element is connected to or formed by the first joint element and the socket element is connected to or formed by the further joint element. The head element and the socket element are mounted movably on one another, and the drive devices are connected via at least one flexible connecting element to the head element or the first joint element, or to the socket element or the further joint element. The at least one connecting element is guided at least section-wise along the head element.

IPC Classes  ?

• B25J 17/02 - Wrist joints
• B25J 9/06 - Programme-controlled manipulators characterised by multi-articulated arms
• B25J 9/10 - Programme-controlled manipulators characterised by positioning means for manipulator elements

Abstract

The invention relates to a method for operating a computer tomography apparatus (1) in measuring a region of interest (11) of an object (10), wherein a source trajectory (20) of an x-ray source (2) with a focal point (2-1) is defined in a coordinate system (30) of the object (10) arranged on a turntable (4), wherein for this purpose a source point (13) on the source trajectory (20) is chosen in the coordinate system (30) for predetermined irradiation angles (25) such that a) all object points (12) in the region of interest (10) are imaged with as large a magnification as possible on a detector surface of an x-ray detector (3), b) the focal point (2-1) can be positioned at the source point (13) with a parameter range of an object motion device (5) and/or a source detector motion device of the computer tomography apparatus (1), and c) a predetermined minimum distance (50) between the x-ray source (2) and the object (10) or an object holder (17) is maintained. The defined source trajectory (20) is traversed by controlling the object motion device (5) and/or the source detector motion device, while irradiation images of the region of interest (11) are captured at the associated irradiation angles (25). The invention further relates to a computer tomography apparatus (1).

IPC Classes  ?

• G01N 23/046 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Abstract

A method for generating a depth map of a region of a surface of a workpiece includes receiving a stack of images. The images image the region of the surface of the workpiece with defined focal plane positions that are different in a depth direction and a focal plane position is assigned to each. Image points of the images are respectively assigned to a corresponding object point on the surface. The method includes determining a focus value of each image point of each image. The method includes fitting a function along the depth direction to the focus values of those image points that are assigned to the same object point. The method includes determining a depth value of each object point on the surface in the depth direction based on an extremum of the fitted function. The method includes generating the depth map based on the determined depth values.

IPC Classes  ?

• G06T 7/55 - Depth or shape recovery from multiple images

Abstract

The invention relates to an inspection system (1) for inspecting at least one test object (10-x), comprising: at least one reflection X-ray tube (2-x) which is designed to emit X-ray radiation (4), at least one X-ray detector (6) which is designed to capture a radiography image (7), wherein the at least one reflection X-ray tube (2-x) and the at least one X-ray detector (6) are designed and configured such that only a high resolution section (4-x) of the X-ray radiation (4), which is emitted by the at least one reflection X-ray tube (2-x), is used for radiographing at least one section (18-x) of the at least one test object. The invention also relates to a method for inspecting at least one test object (10-x).

IPC Classes  ?

• G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material

Abstract

A method and an apparatus for isolating a vibration of a positioning device are provided. The apparatus includes a base plate for the positioning device, at least one active bearing element for bearing the base plate on/at a foundation and at least one evaluation and control device. The apparatus includes at least one means for determining a foundation movement-dependent quantity, wherein the active bearing element is controllable by the at least one control and evaluation device on the basis of the foundation movement-dependent quantity.

IPC Classes  ?

• F16M 11/00 - Stands or trestles as supports for apparatus or articles placed thereon
• F16M 11/22 - Undercarriages with or without wheels with approximately constant height, e.g. with constant length of column or of legs
• B25J 19/00 - Accessories fitted to manipulators, e.g. for monitoring, for viewingSafety devices combined with or specially adapted for use in connection with manipulators
• F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
• F16F 15/00 - Suppression of vibrations in systemsMeans or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion

Abstract

The invention relates to a method and system for measuring components (B) which are produced by a production device (1), comprising: a) selecting (S1) components (B) to be measured from a plurality of components (B), wherein the selection is made according to at least one selection parameter (p), b) generating (S2a) component-specific measurement data (MD) by measuring the selected components (B) using a coordinate measurement device (2) and evaluating (S2b) the measurement data (MD) and/or c) determining (S3) at least one production parameter (m), d) adapting (S4) the at least one selection parameter (p) according to a result (r) of the evaluation and/or according to the production parameter (m) or a change to the production parameter (m), and to a program.

IPC Classes  ?

• G05B 19/418 - Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]

Abstract

The invention relates to a method for inspecting workpieces on the basis of a determination of coordinates of the workpieces by means of at least one coordinate-measuring device (10), wherein - inspection features (51) which can be determined from the coordinates of the workpieces are defined or information about a definition of the inspection features (51) is received, - on the basis of the inspection features (51), a usage scope (63) of usage of the at least one coordinate-measuring device (10) is determined, - in the determining of the usage scope (63), a value in which a number of the determined inspection features (51) or of the inspection features (51) to be determined is involved is determined, and wherein a) coordinates of the workpieces are determined by means of at least one coordinate-measuring device (10) and the inspection features (51) are determined from the determined coordinates, wherein, in the determination of each of the inspection features (51), the coordinates determined for a plurality of measurement points and/or for at least one measurement region of the workpiece are used, and/or b) for at least one of the inspection features (51), a measurement specification specifying the workpiece measurement points to be measured by a coordinate-measuring device (10) is produced.

IPC Classes  ?

• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes

Goods & Services

X-ray apparatus for industrial purposes; X-ray apparatus, not for medical purposes; non-destructive testing equipment by radiography used in industrial applications; industrial x-ray systems for non-medical use, consisting of x-ray tube, x-ray generator and controller, in particular for non-destructive testing, for evaluating and diagnosing apparatuses, for castings and for mechanical, electromechanical and electronic apparatus and components, for maintenance purposes and for use in aeronautical engineering or space technology; industrial x-ray systems for non- medical use, consisting of x-ray tube, x-ray generator, detector, radiation exposure chamber, manipulator and control software, in particular for non-destructive testing, for evaluating and diagnosing apparatuses, for castings and for mechanical, electromechanical and electronic apparatuses and components, for maintenance purposes and for use in aeronautical engineering and space technology; 2D radioscopy apparatus; 2D X-ray apparatus for non-destructive testing; 2D x-ray apparatus for the inspection of castings; 2D x-ray apparatus for the automatic inspection of wheels; software in the field of testing and inspection; X-ray tomography software; industrial automation software exclusively and in direct connection with x-ray apparatus. X-ray imaging, other than for medical purposes; non-destructive testing of aircraft structures, engines and components.

Abstract

In a method for the additive manufacture of a workpiece (14), a data set (42) is obtained which defines the workpiece (14) in a plurality of workpiece layers (16, 20) arranged one atop the other. A plurality of workpiece layers (16, 20) arranged one atop the other is produced, and the plurality of workpiece layers (16, 20) form a layer stack (18) which, at a defined point in time, has an uppermost workpiece layer (20) and a number of workpiece layers (16) lying therebelow. The layer stack (18) is thermally excited (46) at the defined point in time, and a plurality of images of the uppermost workpiece layer (20) are captured. The layer stack (18) is inspected using the plurality of images in order to obtain an inspection result which is representative of the workpiece. An individual deformation time curve of the uppermost workpiece layer (20) is determined in response to the thermal excitation (46). The individual deformation time curve has a plurality of characteristic features which contain an individual deformation increase, an individual deformation maximum, and an individual deformation decrease. The inspection result is determined using at least one of the aforementioned characteristic features from the plurality of characteristic features.

IPC Classes  ?

• B29C 64/386 - Data acquisition or data processing for additive manufacturing
• B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
• B22F 10/80 - Data acquisition or data processing
• B22F 12/90 - Means for process control, e.g. cameras or sensors
• B33Y 50/00 - Data acquisition or data processing for additive manufacturing
• G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

Goods & Services

Optical apparatus and instruments, namely, optical measuring apparatus, multi-sensor measuring machines, optical scanners for 3D measurement, camera systems for 3D measurement consisting of cameras, sensors, testing controller, LED lighting controls that optimize optical measurement of objects by governing the direction and intensity of the illumination of the objects, and downloadable dimensional metrology software for the operation of quality assurance machines, the creation of test plans, the acquisition and evaluation of measurement data, the creation of reports, the storage of data, and the networking of machines; automated measuring apparatus for production environments for the automated loading of measuring machines with objects to be measured and the acquisition of measurement data; 3D laser scanners; mobile 3d scanners; mobile measuring stations for dimensional measurement of manufactured parts and prototypes, featuring a robot that, in collaboration with a human user, moves the measuring station's sensor to face the part or prototype from different directions; portable coordinate measuring machine for 3D coordinate measurements and deformation analysis; electron scanning microscopes, x-ray microscopes, light microscopes, digital microscopes, laser scanning microscopes, coordinate measuring machines, and optical sensors for capturing the surface of forms; measuring, detecting, monitoring and controlling apparatus, instruments and systems, namely, testing and quality control devices in the nature of light microscopes, digital microscopes, electron scanning microscopes, x-ray microscopes, optical coordinate measuring machines, and 3D scanners; downloadable and recorded software for inspection and analysis of 2D and 3D surfaces in the fields of metrology and quality control Printed matter, namely, printed notebooks, desk pads, give-aways, wall calendars, posters, and product brochures about metrology and quality control and stationery; printing paper and cardboard Advertising and promotional services; marketing services; promotional marketing services using audio and visual media; advertising and marketing services provided by means of social media, blogging, video blogging; banner advertising; production of advertising materials; organization of events for commercial and advertising purposes; organization of trade fairs; provision of business information; retail and wholesale store services relating to optical apparatus and instruments and measuring apparatus and instruments; all the aforesaid services in the field of metrology and quality control Education services, namely, providing classes and instruction in the fields of metrology and quality control; Training services in the fields of metrology and quality control; online reference library services; providing online newsletters in the field of quality control via e-mail; audio, video and multimedia productions; production of podcasts, blogs and video blogs; organization of conferences in the area of quality control; organization and conduction of seminars, webinars and tutorials in the area of quality control; organization of competitions and awards in the area of quality control Scientific and technological services and research and design relating thereto; industrial analysis and research services; testing, authentication and quality control services; creating an online community for registered users; providing information; all the aforesaid services in the field of metrology and quality control

Goods & Services

Coordinate measuring machines and their parts.

Abstract

In a method for additive manufacturing of a workpiece, a data set defines the workpiece in multiple layers. A first energy beam is moved relative to a manufacturing platform along first trajectories to produce, in temporally successive steps, a stack of workpiece layers. Individual properties of the stack are determined using a measurement arrangement having an exciter that excites the stack with a second energy beam, and having a detector that detects properties of the stack resulting from an excitation along a defined detection path in a spatially resolved manner. At least one of the second energy beam and the detection path is moved relative to the manufacturing platform along further trajectories using a further scanning unit. The first scanning unit and the further scanning unit establish completely separate beam paths for the first energy beam and the at least one of the second energy beam and the detection path.

IPC Classes  ?

• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
• B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
• B23K 26/082 - Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
• B23K 26/34 - Laser welding for purposes other than joining
• B28B 1/00 - Producing shaped articles from the material
• B28B 17/00 - Details of, or accessories for, apparatus for shaping the materialAuxiliary measures taken in connection with such shaping
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes

Goods & Services

Parts and accessories of coordinate measuring machines, namely, mounting and holding devices for clamping workpieces for dimensional measurement purposes

Abstract

The invention relates to a method for the additive production of a workpiece (14), wherein a material layer (18) having a defined surface is formed from a particulate material (20). At least one image of the material layer (18) is recorded by a camera (40) in order to determine individual properties (110) of the material layer (18). According to the individual properties of the material layer (18), the particulate material (20) is selectively solidified using a structuring tool (28). The at least one image of the material layer (18) is inspected using a previously trained statistical learning model (112). At least one defect vector (100) is determined which represents a plurality of individual defect probabilities (102a, 102b). Each individual defect probability of the plurality of individual defect probabilities (102a, 102b) is an individual indicator for whether a defined layer defect of a plurality of possible layer defects is present in the material layer (18).

IPC Classes  ?

• B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B22F 10/30 - Process control
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• G05B 23/02 - Electric testing or monitoring
• G06N 20/00 - Machine learning
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
• B33Y 10/00 - Processes of additive manufacturing
• B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting

Abstract

In a method and a device for the additive manufacture of a workpiece (14a, 14b, 14c) with lateral workpiece dimensions (36), a data set (50) is used which defines the workpiece (14) in a plurality of workpiece layers (18) arranged one on top of the other. A production region (40) on which the workpiece (14) is to be produced in layers is selected on a manufacturing platform (12) with lateral platform dimensions (38) which are greater than the lateral workpiece dimensions (36). A plurality of defined material layers (16) are produced using the first data set (50). Advantageously, a second data set (54) is used which represents a deformation of each material layer (16) based on the production region (40). The individual material layers (16) are produced using the first data set (50) and the second data set (54).

IPC Classes  ?

• B29C 64/245 - Platforms or substrates
• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes

Abstract

A method evaluates a sample of measurement data from measuring multiple workpieces by at least one coordinate measuring machine. A system of statistical distributions describes a frequency of measurement data values. The distributions are distinguishable based on skewness and kurtosis. The method includes defining a set of statistical distributions that are able to describe a frequency of measurement data values in the entire value interval from the system of statistical distributions for a value interval of the measurement data, which is a specified value interval or a value interval of the measurement data actually arising in the sample. The method includes ascertaining the skewness and the kurtosis from the sample of measurement data corresponding to a first statistical distribution. The method includes checking, using the ascertained moment values, whether the defined set contains a statistical distribution that has the ascertained skewness and kurtosis, and producing a corresponding test result.

IPC Classes  ?

• G05B 19/41 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by interpolation, e.g. the computation of intermediate points between programmed end points to define the path to be followed and the rate of travel along that path
• G05B 19/418 - Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques

Abstract

A method of producing a workpiece includes obtaining CAD data representing the workpiece in multiple workpiece layers. The CAD data includes multiple workpiece layer definitions corresponding respectively to the workpiece layers. The method includes selecting a first workpiece layer definition, preparing a powder bed of powder material on a build platform, and producing, based on the selected workpiece layer definition, a workpiece layer on the build platform by controlling a layer tool to selectively melt or sinter the powder material on the build platform. The method includes assessing the produced workpiece layer, including measuring the produced workpiece layer using a measuring head, analyzing the measurements of the produced workpiece layer, and, in response to the analysis indicating that the produced workpiece layer is defective, reprocessing the produced workpiece layer by controlling the layer tool to selectively melt or sinter the powder material on the build platform.

IPC Classes  ?

• B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes

Abstract

The invention relates to a device for the additive manufacturing of a workpiece (14), which contains a production platform, which is designed to hold a defined material layer (18) made of a particulate material (20). The device also contains a structuring tool (30) for selectively solidifying the defined material layer (18) on the production platform (12) in order to produce a defined workpiece layer (16). The device also contains an inspection sensor (42) for inspecting the defined material (18) and/or the defined workpiece layer (16). The inspection sensor (42) can be moved in a movement direction (29) and contains a line scan camera and a line light source, which each extend perpendicularly to the movement direction (29). Furthermore, the inspection sensor is coupled to a position encoder (48). An evaluation and control unit (34) captures a location-resolved image of the defined material layer (18) and/or workpiece layer (16) with the aid of the line scan camera and the position encoder and controls the structuring tool (30) according to the location-resolved image.

IPC Classes  ?

• B22F 3/105 - Sintering only by using electric current, laser radiation or plasma
• B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes

Abstract

The invention relates to a method for measuring the surface topography of an object (18), which method comprises the following steps: a) providing source radiation and dividing the source radiation into illumination radiation (12) and reference radiation (22), b) illuminating the surface of the object (18) with illumination radiation (12) in a planar illumination field, the surface of the object (18) being illuminated simultaneously with more than one spatial radiation mode and the radiation modes of the illumination being spatially and temporally coherent, but with a fixed phase difference from one another, and c) overlaying the reference radiation (22) on illumination radiation back-scattered at the surface of the object (18), and detecting an interference signal of the overlaid radiation (16, 22) by means of at least one detector (17). Steps a) to c) are carried out for at least two different, fixed wavelengths. The surface topography of the object (18) is determined by means of digital holography.

IPC Classes  ?

• G01B 9/02 - Interferometers

Abstract

A method for determining an altered measurement strategy for measurement of a measurement object using a coordinate measuring machine includes measuring the measurement object according to an initial measurement strategy. The method includes determining a measurement quality of the measurement. The method includes, in response to the measurement quality being greater than a predetermined target minimum measurement quality, altering the initial measurement strategy to produce the altered measurement strategy. The altering is performed such that at least one of time required to measure the measurement object in accordance with the altered measurement strategy is reduced, computational outlay required to measure the measurement object in accordance with the altered measurement strategy is reduced, and data storage capacity required to measure the measurement object in accordance with the altered measurement strategy is reduced.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines

Abstract

A coordinate measuring machine has a measurement head having a point measurement device which measures first coordinates of only a single point on the surface of a workpiece at a given time. An area measurement device records images of a reference surface. A displacement device displaces the measurement head and/or the workpiece such that they assume different relative positions with respect to one another. An evaluation device calculates a shift between images that the area measurement device has recorded of the reference surface at different times at different relative positions, with a stitching algorithm. Based on this, second coordinates of the measurement head, which are defined relative to the reference surface, are determined. By linking the first coordinates with the second coordinates, third coordinates are determined, which define the points on the surface of the workpiece measured by the point measurement device relative to the reference surface.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
• G06T 7/33 - Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods
• G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods

Abstract

A method for determining a measurement strategy for measuring a measurement object includes determining a test element of the measurement object. There is an automated test for the test element as to whether there is an applicable measurement rule in a measurement rule set of measurement rules defined in advance. An applicable measurement rule is added to a new measurement strategy or the test element-specific measurement rule of an existing measurement strategy is altered based on an applicable measurement rule. The measurement rules of the measurement rule set are determined by virtue of a measurement rule and at least one test criterion in respect of the applicability thereof being set for a test element by a user or in (partly) automated fashion. The measurement rule defines at least one parameter for measuring the test element.

IPC Classes  ?

• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Abstract

A method for determining measurement points of an adapted measurement path for measuring a measurement object includes determining measurement points of an ideal measurement path. The method includes determining target measurement points of at least one guide path, which differs from the ideal measurement path. The method includes capturing actual measurement points along the at least one guide path using a coordinate measuring device. The method includes determining deviations between the target measurement points and the actual measurement points of the at least one guide path. The method includes determining the measurement points of the adapted measurement path by changing the measurement points of the ideal measurement path based on the deviations.

IPC Classes  ?

• G01B 5/012 - Contact-making feeler heads therefor
• G01B 7/012 - Contact-making feeler heads therefor

Abstract

A positioning apparatus with a pose measurement function includes a first and second kinematic links, a first measuring link attached to the second kinematic link, a joint connecting the first and second kinematic links, and a sensor capturing a measurement device. Either the measurement device or the sensor is arranged at the first measuring link and is movable jointly with the second kinematic link. The other one is arranged at the first kinematic link and is movable jointly with the first kinematic link. An attachment location of the first measuring link lies closer to an end of the second kinematic link that is remote from the joint than to the joint. The positioning apparatus is configured to ascertain, based on data captured by the sensor, a first relative pose value corresponding to the degree of freedom of the joint and a further relative pose value for another degree of freedom.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• B25J 15/00 - Gripping heads

Abstract

A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.

IPC Classes  ?

• G01B 5/016 - Constructional details of contacts
• G01B 5/20 - Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
• G01B 7/00 - Measuring arrangements characterised by the use of electric or magnetic techniques
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Abstract

A tactile and/or optical distance sensor includes a housing, which has at least one elongate portion, a measurement arm, which is arranged in the housing, at least partially extends through the elongate portion and has a tactile and/or an optical probe element at one end, a transducer, which is configured to capture a position of the tactile probe element or a signal of the optical probe element and to generate associated probe element measurement signals, and an advance unit, with which the housing is linearly dis-placeable along an advance direction. A strain sensor is located in the region of the measurement arm extending through the elongate portion or at an adjacent region directly adjoining said region. In addition, a system for measuring the roughness of a surface of a workpiece and a method for calibrating a distance sensor or a system are provided.

IPC Classes  ?

• G01B 11/30 - Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
• B25J 19/02 - Sensing devices
• B25J 9/16 - Programme controls
• G01L 1/24 - Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Abstract

A calibration standard for geometry measurement calibration of a measurement system operating by tactile and/or optical means is provided which includes a flat surface having a structure that is capturable by a measurement system operating by optical and/or tactile means. The structure has a changeable periodicity that is capturable by a sensor in a first direction and/or in a second direction and for a change in the periodicity to code position information and/or direction information. In addition, a method for calibrating a coordinate measuring machine operating by tactile and/or optical means and to a coordinate measuring machine for such a method or having such a calibration standard is provided.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Abstract

A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.

IPC Classes  ?

• G01B 21/20 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Abstract

An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.

IPC Classes  ?

• H04N 5/232 - Devices for controlling television cameras, e.g. remote control
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Abstract

A coordinate measuring machine and a method for operating a coordinate measuring machine, and a rotary table module for a coordinate measuring machine with a rotary table for receiving a workpiece and a rotary table block are provided. The rotary table is supported on a rotary table side rotatably about a rotary table axis. The rotary table block has, opposite the rotary table side of the rotary table block, a bottom side with which the rotary table module can be supported on a measurement table of the coordinate measuring machine. The rotary table block has a further supporting side with which the rotary table block is supportable on the measurement table of the coordinate measuring machine and which differs from the bottom side in its alignment. The rotary table module includes a pose capturing device for the determination of whether the rotary table block is supported on the bottom side.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques

Abstract

A method creates a measurement plan of a dimensional measuring apparatus or controls a measurement of the dimensional measuring apparatus. The method includes receiving setting parameters defining a measurement or control command of multiple measurement or control commands of the dimensional measuring apparatus. The method includes evaluating the setting parameters based on at least one of a statistical evaluation and an evaluation using machine-assisted learning. The method includes determining a presetting that assigns at least one setting parameter of the evaluated setting parameters to the measurement or control command. The method includes outputting a setting parameter proposal based on the determined presetting in response to receiving an input command for selecting the measurement or control command.

IPC Classes  ?

• G01B 21/20 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
• G01Q 30/04 - Display or data processing devices

Abstract

An optical device for determining a distance of a measurement object includes a LIDAR unit and a light sensor. The LIDAR unit has an illumination device to illuminate the measurement object and a measurement channel to detect a measurement beam reflected from the measurement object and to generate a LIDAR measurement signal. The light sensor has an optical source with a mode-locked laser to generate first and second frequency comb signals and splits the first frequency comb signal into a first measurement signal and a first reference signal and to illuminate the measurement object with the first measurement signal. The light sensor splits the second frequency comb signal into a second measurement signal and a second reference signal. An evaluation unit determines first distance information, evaluates signals detected by a measurement detector and a reference detector, generates a frequency spectrum, and determines second distance information of the measurement object.

IPC Classes  ?

• G01S 17/08 - Systems determining position data of a target for measuring distance only
• G01S 7/4911 - Transmitters
• G01S 7/486 - Receivers
• G01S 7/484 - Transmitters

Abstract

A method for software-based planning of a dimensional measurement of a measurement object includes receiving an input command for selecting at least one measurement element of the measurement object that is to be measured during the measurement. The method includes determining a selection of measurable test features of the at least one selected measurement element. Each of the test features includes a dimensionally measurable measurand of the at least one selected measurement element. The method includes determining a reduced subset of the selection of measurable test features depending on a view currently chosen on a display. The method includes visualizing the test features contained in the reduced subset by generating a graphical representation of each of the test features contained in the reduced subset on the display.

IPC Classes  ?

• G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

Abstract

A system for optical measurement of an object includes a radiation generating device, a capturing device, and an evaluation device. The radiation generating device is configured to emit electromagnetic radiation onto the object. The capturing device includes an image sensor. The capturing device is configured to capture a measurement image as a result of an exposure of the image sensor with radiation returned from the object. The capturing device is configured to vary a focus setting (D) during the exposure. The evaluation device is configured to determine coordinates of at least one location on the object based on the captured measurement image.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G06T 7/70 - Determining position or orientation of objects or cameras
• H04N 23/67 - Focus control based on electronic image sensor signals
• H04N 23/80 - Camera processing pipelinesComponents thereof

Abstract

A position of an object is determined by optically capturing at least one capture structure arranged at the object or at a reference object captured from the object and thereby obtaining capture information, the at least one capture structure having a point-symmetrical profile of an optical property that varies along a surface of the capture structure, transforming a location-dependent mathematical function corresponding to the point-symmetrical profile of the optical property into a frequency domain, forming a second frequency-dependent mathematical function from a first frequency-dependent mathematical function, wherein the second mathematical function is formed from a relationship of in each case a real part and an imaginary part of complex function values of the first frequency-dependent mathematical function, and forming at least one function value of the second frequency-dependent mathematical function and determining the same as location information about a location of a point of symmetry of the location-dependent mathematical function.

IPC Classes  ?

• G06T 7/00 - Image analysis
• G01N 21/88 - Investigating the presence of flaws, defects or contamination
• G06T 7/11 - Region-based segmentation

Abstract

A position of a movable object is determined with a capture structure having a profile of an optical property that varies along a surface of the capture structure such that the profile corresponds to a progression of numerical values with local maxima and local minima on an ordered scale of the numerical values, and which is interpretable as a first mathematical function of the location. The optical property varies such that a second mathematical function of the location has an absolute maximum corresponding to a maximum value of the optical property. The optical property has assigned corresponding numerical values such that the progression thereof has the local maxima and the local minima and corresponds to the first mathematical function of the location. The position of the movable object is determined by a frequency analysis of the progression of the numerical values of the second mathematical function of the location.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 9/02002 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
• G01B 11/27 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes for testing the alignment of axes

Abstract

A method and an apparatus for planning an obstacle-free measurement trajectory of a coordinate measuring machine, and a computer program are provided. An original measurement trajectory is determined, all compact obstacles along the original measurement trajectory are determined, an obstacle entrance pose on the original measurement trajectory and an obstacle exit pose on the original measurement trajectory are determined for each compact obstacle, and at least one obstacle-free alternative measurement trajectory is determined for each compact obstacle.

IPC Classes  ?

• G05D 3/20 - Control of position or direction using feedback using a digital comparing device
• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes

Abstract

A multi-color system for optically inspecting a surface of a specimen includes a multi-wavelength led array to illuminate the specimen with a multi-color light pattern including simultaneously emitted spatial intensity color image patterns, each of which has first areas in which light is emitted with a first light intensity and second areas in which the light is emitted with a second light intensity, the first light intensity being higher than the second light intensity, and corresponding first and second areas in each of the simultaneously emitted spatial intensity color image patterns being phase-shifted relative to each other. A multi-color sensor captures each of the simultaneously emitted spatial intensity color image patterns reflected from the surface of the specimen in a single wavelength-multiplexed sensor image, and a data processing apparatus in communication with the multi-color sensor determines properties of the surface based on an evaluation of the single wavelength-multiplexed sensor image.

IPC Classes  ?

• G01N 21/88 - Investigating the presence of flaws, defects or contamination
• G01N 21/25 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
• G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
• H04N 23/12 - Cameras or camera modules comprising electronic image sensorsControl thereof for generating image signals from different wavelengths with one sensor only

Goods & Services

Digital microscopes for optical/visual inspection in the field of industrial quality control.

Abstract

A method is described for measuring workpieces, each having structural features that form test features for measurement. The method determines an unstable one and a stable one of the test features, based on expected violation or satisfaction, respectively, of a statistical control rule. The method measures workpieces such that the unstable test feature is measured more frequently than the stable test feature. The method ascertains whether the unstable test feature remains unstable and whether the stable test feature remains stable. The method measures additional workpieces if the unstable test feature remained unstable and the stable test feature remaining stable. The determining is repeated if the unstable test feature is no longer unstable, the stable test feature is no longer stable, or any other measurement feature changes, such as if a new batch of workpieces is to be measured, environmental conditions change, or measurement has proceeded longer than a predefined threshold.

IPC Classes  ?

• G01B 5/016 - Constructional details of contacts
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Abstract

A method for generating a test plan for testing a measurement object includes obtaining a data record representing the measurement object. The method includes setting a reference structure based on the data. The method includes assigning at least one reference structure-specific test feature to the reference structure. A test is carried out based on data for the data record representing the measurement object as to whether structures that are similar to or the same as the reference structure are present. The reference structure-specific test feature is assigned to each similar or same structure as the structure-specific test feature. The method includes generating the test plan to include the structure-specific test features.

IPC Classes  ?

• G06F 30/20 - Design optimisation, verification or simulation
• G06F 30/10 - Geometric CAD

Abstract

A method for generating a resultant test plan for testing a measurement object includes generating at least one data record by measuring the measurement object. The method includes assigning at least part of the measurement object to at least one object class based on the at least one data record. The method includes determining a test plan assigned to the at least one object class as an object-class-specific test plan. The method includes determining the resultant test plan based on the object-class-specific test plan. The assignment of the at least part of the measurement object to the at least one object class is independent of dimensions.

IPC Classes  ?

• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Abstract

A method includes receiving a command designating a desired measurement path, including desired start and end positions. The method includes searching a data memory to find a first measurement path corresponding to the command. The first measurement path includes first start and end positions. The method includes, in response to the search being successful (the first measurement path corresponds to the command), reading the first measurement path and controlling a measuring head of a coordinate measuring machine to move along the first measurement path to capture a measurement point on the measurement object. The method includes, in response to the search being unsuccessful, calculating a second measurement path, storing the second measurement path in the data memory, and moving the measuring head along the second measurement path to capture the measurement point. The method includes determining dimensional properties of the measurement object based on the measurement point.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines

Goods & Services

X-ray apparatus for industrial purposes; X-ray apparatus, not for medical purposes; non-destructive testing equipment by radioscopy used in industrial applications, namely, industrial computed tomography systems comprising x-ray tube, x-ray generator and controller, x-ray lead shielded cabinet, recorded inspection and control software and digital detector for detecting non-conformities of all types in workpieces and castings, and a handling and manipulation system consisting of a gearbox, a turntable, a motor, a mechanical structure, and a transmission screw, not for medical use; industrial x-ray systems for non-medical use, consisting of x-ray tube, x-ray generator and controller, in particular for non-destructive testing, for castings; industrial x-ray systems for non-medical use, consisting of x-ray tube, x-ray generator, digital detector for detecting non-conformities of all types in workpieces and castings, radiation exposure chamber, manipulator and recorded operating and control software, in particular for non-destructive testing, for evaluating and diagnosing apparatuses, for castings and for mechanical, electromechanical and electronic apparatuses and components, for maintenance purposes and for use in aeronautical engineering and space technology; 2D radioscopy systems other than for medical purposes comprising x-ray tube, x-ray generator and controller, x-ray lead shielded cabinet, recorded inspection and control software and digital detector for detecting non-conformities of all types in workpieces and castings, and a handling and manipulation system consisting of a gearbox, a turntable, a motor, a mechanical structure, and a transmission screw; 2D X-ray systems other than for medical purposes for non-destructive testing comprising x-ray tube, x-ray generator and controller, x-ray lead shielded cabinet, recorded inspection and control software and digital detector for detecting non-conformities of all types in workpieces and castings, and a handling and manipulation system consisting of a gearbox, a turntable, a motor, a mechanical structure, and a transmission screw; 2D x-ray systems for the inspection of castings comprising x-ray tube, x-ray generator and controller, x-ray lead shielded cabinet, recorded inspection and control software and digital detector for detecting non-conformities of all types in workpieces and castings, and a handling and manipulation system consisting of a gearbox, a turntable, a motor, a mechanical structure, and a transmission screw; 2D x-ray systems for the automatic inspection of wheels comprising x-ray tube, x-ray generator and controller, x-ray lead shielded cabinet, recorded inspection and control software and digital detector for detecting non-conformities of all types in workpieces and castings, and a handling and manipulation system consisting of a gearbox, a turntable, a motor, a mechanical structure, and a transmission screw; recorded software for use in operating and controlling x-ray systems, acquisition and processing of X-ray images used in the field of testing and inspection; downloadable and recorded X-ray tomography software for use in reconstruction of 3D volumes and performing of specific internal non-conformity analysis of workpieces and castings; recorded industrial automation software exclusively and in direct connection with x-ray apparatus for use in operating and controlling x-ray systems used in the field of testing and inspection X-ray imaging, other than for medical purposes, namely, industrial x-ray inspection services

Goods & Services

Coordinate measuring machines and their parts

Abstract

A computer device includes memory that stores a test plan for a coordinate measuring machine to perform an object measurement. The test plan includes at least one test feature for a plurality of reference elements of the object. The computer device includes at least one processor configured to execute instructions stored in the memory. The instructions include, for each of the reference elements, obtaining at least one accuracy variable. The accuracy variable specifies an accuracy of the measurement result of a respective reference element. The instructions include ascertaining an error effect of each reference element on the quantification of the test feature based on the respective accuracy variable. The instructions include ascertaining for each of the error effects whether it meets an error criterion and, if so, classifying a reference element assigned to this error effect as a critical reference element.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Abstract

A signal generator includes a processing unit. The signal generator is configured to generate at least one periodic output signal. The output signal comprises a triangular-waveform signal. A frequency and an amplitude of the output signal are adjustable. The signal generator is configured to receive an input parameter. The input parameter comprises at least one piece of information about a setpoint amplitude and a setpoint frequency of the output signal. The processing unit is configured to determine a signal direction of the output signal. The processing unit is configured to determine a step size. The processing unit is configured to apply the step size to an actual amplitude based on the signal direction for a number of clock cycles. The number of clock cycles is dependent on the setpoint frequency of the output signal.

IPC Classes  ?

• H03K 4/00 - Generating pulses having essentially a finite slope or stepped portions
• H03K 4/06 - Generating pulses having essentially a finite slope or stepped portions having triangular shape
• H03K 4/92 - Generating pulses having essentially a finite slope or stepped portions having a waveform comprising a portion of a sinusoid
• H03L 7/18 - Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
• H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape

Abstract

Sensor signals from a sensor of a coordinate measuring machine or microscope describe a workpiece arranged within a space. The sensor and the space are movable relative to one another. A method of visualizing the sensor signals includes obtaining data relating to a three-dimensional scene that is stationary relative to the space. The method includes generating a two-dimensional view image of the scene. The view image has opposing edges predefined with respect to at least one of the two directions. A central region of the view image is located between the edges. The method includes, repeatedly, obtaining a two-dimensional sensor representation of the workpiece and combining the sensor representation with the view image to form a two-dimensional output image. The method includes, in response to movement between the sensor and the space, generating a new view image if the central region would extend beyond either of the edges.

IPC Classes  ?

• G06T 7/00 - Image analysis
• H04N 13/172 - Processing image signals image signals comprising non-image signal components, e.g. headers or format information
• H04N 13/221 - Image signal generators using stereoscopic image cameras using a single 2D image sensor using the relative movement between cameras and objects
• G06T 7/60 - Analysis of geometric attributes
• H04N 13/00 - Stereoscopic video systemsMulti-view video systemsDetails thereof

Abstract

A method includes generating image signals from which a two-dimensional image is generated. The method includes generating object image signals by capturing an examination object arranged in a space. The method includes generating overview image signals by capturing an overview of the space. The method includes receiving image information included in the generated object image signals and the generated overview image signals. The method includes combining a two-dimensional object image, generated from the object image signals, with a two-dimensional perspectively distorted overview image of the space, generated from the overview image signals, to form a two-dimensional output image. The method includes scaling the received image information with respect to an image size for forming the output image in a manner such that at least one dimension of the examination object captured both in the object image and in the overview image has a same size in the output image.

IPC Classes  ?

• G06T 3/40 - Scaling of whole images or parts thereof, e.g. expanding or contracting
• G06T 7/11 - Region-based segmentation
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G06T 7/00 - Image analysis

Abstract

A method and an arrangement for producing a workpiece using additive manufacturing techniques involve pre-process, in-process and post-process measurement in order to determine individual characteristics of one or more workpiece layers. In particular, dimensional and/or geometrical characteristics of a workpiece layer are measured before the next workpiece layer is produced. Advantageously, production parameters are controlled in response to individual material characteristics determined prior to the production process. Also advantageously, measurement results are fed back into a production process in order to increase accuracy, reliability, repeatability and precision of the production process.

IPC Classes  ?

• B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
• B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
• B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
• B29C 64/188 - Processes of additive manufacturing involving additional operations performed on the added layers, e.g. smoothing, grinding or thickness control
• B29C 64/227 - Driving means
• B29C 64/245 - Platforms or substrates
• B29C 64/268 - Arrangements for irradiation using laser beamsArrangements for irradiation using electron beams [EB]
• B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B29K 25/00 - Use of polymers of vinyl-aromatic compounds as moulding material
• B29K 71/00 - Use of polyethers as moulding material
• B29K 75/00 - Use of polyureas or polyurethanes as moulding material
• B29K 77/00 - Use of polyamides, e.g. polyesteramides, as moulding material
• B29K 103/06 - Metal powders, metal carbides or the like
• B33Y 10/00 - Processes of additive manufacturing
• B33Y 40/20 - Post-treatment, e.g. curing, coating or polishing
• B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
• B33Y 70/00 - Materials specially adapted for additive manufacturing

Abstract

An apparatus for adjusting a beam path for tracking an object includes an illumination unit to generate an illumination light beam, an optical unit with a beam expander optical unit and a beam deflection unit, the beam expander optical unit being configured to divergently expand the illumination light beam and the beam deflection unit being configured to deflect the illumination light beam spatially about two different axes of rotation, a detector unit to capture a light beam reflected by the object in response to an illumination by the illumination light beam and to generate a measurement signal, an evaluation and control unit to evaluate the measurement signal and configured to determine a manipulated variable for setting an effective focal length of the beam expander optical unit and/or for setting a spatial alignment of the beam deflection unit based on the information item in respect of the illumination of the object.

IPC Classes  ?

• G01B 9/02 - Interferometers
• G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Abstract

A method for creating a measurement protocol in a computer, such as the measurement computer of a coordinate-measuring machine or a computer remote therefrom, includes: providing data necessary for creating a measurement protocol generated on the basis of a measurement sequence by the coordinate-measuring machine; providing specification data specifying predefined conditions under which a measurement sequence should be performed and/or specifying predefined conditions under which examination features should be evaluated; checking the data necessary for creating a measurement protocol as to whether the predefined conditions under which the entire measurement sequence should be performed were met and/or as to whether the predefined conditions under which individual examination features to be examined should be evaluated were met; and, creating a measurement protocol in the form of an electronic document, in which compliance and/or non-compliance with the conditions in accordance with the specification data is documented in the measurement protocol.

IPC Classes  ?

• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
• G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques
• G01B 11/03 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness by measuring coordinates of points
• G05B 19/40 - Open loop systems, e.g. using stepping motor
• G05B 23/02 - Electric testing or monitoring
• G05B 19/401 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes
• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines

Abstract

A method is described for determining a relative position of an axis of rotation of a rotary table of a coordinate measuring machine. The rotary table has or forms a reference element that is arranged eccentrically in relation to the axis of rotation. The method includes a measuring step including performing a rotary movement of the rotary table, and producing measuring points that encode a position of the reference element by a sensor of the coordinate measuring machine during the rotary movement. The method includes a determining step including determining the relative position of the axis of rotation of the rotary table based on the measuring points.

IPC Classes  ?

• G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
• G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques
• G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

Abstract

The invention is directed to a method for correcting scattered radiation in a computed tomography apparatus, wherein x-ray radiation emanating from an x-ray radiation source is divided into a plurality of partial beams by a grid structure such that irradiated regions and non-irradiated regions alternate, wherein a grid position of the grid structure is changed parallel to a detector surface. In a changed grid position, previously non-irradiated regions are irradiated and previously irradiated regions are not irradiated, wherein at least one radiograph of the test object is captured for each of the grid positions, wherein the radiographs captured at different grid positions are used to generate a bright field radiograph from the respectively irradiated regions and a dark field radiograph from the respectively non-irradiated regions and wherein a corrected radiograph is generated on the basis of the bright field radiograph and the dark field radiograph.

IPC Classes  ?

• A61B 6/00 - Apparatus or devices for radiation diagnosisApparatus or devices for radiation diagnosis combined with radiation therapy equipment
• A61B 6/03 - Computed tomography [CT]

Abstract

A holder is configured to hold multiple reference standards for calibrating a measurement system. The holder includes a first receptacle that is configured to receive a first reference standard. The holder includes a second receptacle that is configured to receive a second reference standard. The holder includes a calibration jig that is configured to facilitate a bijective determination of a position and orientation of the holder in space.

IPC Classes  ?

• G01D 11/30 - Supports specially adapted for an instrumentSupports specially adapted for a set of instruments
• G01B 21/30 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Abstract

A target for a radiation source of invasive electromagnetic radiation has at least one target element, which is configured to generate invasive electromagnetic radiation when irradiated with particles and is coupled to a substrate arrangement for dissipating heat out of the target element, wherein: the target element has a peripheral surface which forms a first part of the outer surface of the target element; the outer surface of the target element is also formed by a side surface of the target element; an extension of the side surface defines a thickness (D) of the target element; a peripheral line of the side surface forms a borderline of the peripheral surface; the target has an end face, as part whereof the side surface of the target element is exposed for irradiation with particles; and the substrate arrangement is in contact with the peripheral surface.

IPC Classes  ?

• H01J 35/08 - AnodesAnticathodes
• H01J 35/24 - Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof

Abstract

A device for a 3D measurement of object coordinates of a measurement object or parts of the measurement object in a coordinate measuring machine is provided. The device includes at least one illumination device configured to generate at least one illumination light beam and to illuminate the measurement object, at least one lens, wherein the lens has a longitudinal chromatic aberration, at least one color sensor arranged in an image plane of the lens, wherein the color sensor is configured to capture a measurement light beam generated by the measurement object in response to the illumination light beam and to determine at least one spectrally dependent image space content; at least one evaluation unit configured to determine at least one item of depth information from the spectrally dependent image space content.

IPC Classes  ?

• G01J 3/46 - Measurement of colourColour measuring devices, e.g. colorimeters
• G01N 21/25 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
• G02B 27/42 - Diffraction optics
• G01J 3/28 - Investigating the spectrum

Abstract

An articulating probe for a measurement device includes a base platform, a rotor platform that is movable relative to the base platform, and a sensor element coupled to the rotor platform. The rotor platform is coupled to the base platform via a spherical parallel kinematic system.

IPC Classes  ?

• G01B 5/016 - Constructional details of contacts
• G01B 7/008 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 7/016 - Constructional details of contacts

Goods & Services

Microscopes for optical/visual inspection in the field of industrial quality control

Goods & Services

Metrology software and hardware for analysis of the surface quality of intermediate manufacturing steps and final part quality, namely, measuring apparatus.

Abstract

A coordinate measuring machine for determining dimensional and/or geometric properties of a measurement object has a measurement element, which defines a reference point and is movable along multiple movement axes relative to a measurement object receptacle. The movement axes include multiple linear axes and at least one axis of rotation. In order to control the measurement element relative to a measurement object, desired positions of the reference point and parameters defining limit values for permissible velocities and/or accelerations are provided. Multiple individual temporal sequences of respective individual axial positions for the plurality of movement axes are determined as a function of the desired positions of the reference point and the parameters. The individual temporal sequences each have individual time intervals between successive individual axial positions. The individual temporal sequences are synchronized onto a common timing cycle, which uses the longest individual time interval in each case for each target position.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Abstract

A method and a device for generating a control signal for a controllable device are provided. The controllable device has an optical position detection system. At least two images of at least one spatial region are generated with at least one optical detection device of the optical position detection system. Markers are identified in the images and the control signal is generated when a relative position between at least two markers changes. In addition, a marker array and a controllable system are provided.

IPC Classes  ?

• G05B 19/402 - Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for positioning, e.g. centring a tool relative to a hole in the workpiece, additional detection means to correct position
• A61B 90/00 - Instruments, implements or accessories specially adapted for surgery or diagnosis and not covered by any of the groups , e.g. for luxation treatment or for protecting wound edges
• G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods
• G06T 1/00 - General purpose image data processing
• G06T 7/246 - Analysis of motion using feature-based methods, e.g. the tracking of corners or segments

Abstract

The invention relates to a method and a device for additive manufacturing of a workpiece (14) using a data set (34), which defines the workpiece (14), in a plurality of layers (16) arranged one atop the other. A structuring tool (24) moves a first energy beam (26) in a spatially resolved manner relative to a manufacturing platform (12). A measuring arrangement (36) determines individual properties of the layer stack (20). The measurement arrangement (36) includes an exciter (38), which excites the stack (20) by means of a second energy beam (42), and a detector (40), which detects properties of the stack (20) in a spatially resolved manner as a result of the excitation. The controller (30) controls the second energy beam (42) and/or the detection path (44) for the measurement along a plurality of measurement trajectories (46), which can differ from the trajectories (28) of the first energy beam (26). The first scanning unit (50) and the additional scanning unit (54) establish beam paths, which are completely separate from each other, for the first energy beam (26) and the second energy beam (42) and/or for the first energy beam (26) and the detection path (44).

IPC Classes  ?

• B23K 26/342 - Build-up welding
• B23K 31/12 - Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by any single one of main groups relating to investigating the properties, e.g. the weldability, of materials
• B23K 15/00 - Electron-beam welding or cutting

Abstract

An apparatus, a method, and a computer program for determining a chamfer property of a workpiece chamfer are provided. The method includes generating measurement points along at least a first measuring path, the first measuring path running over a first chamfer edge, determining at least one unadapted compensating element for the measurement points of the first measuring path, and determining a spatial position of the first chamfer edge depending on a deviation between the measurement points of the first measuring path and the at least one unadapted compensating element.

IPC Classes  ?

• G01B 21/22 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapersMeasuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for testing the alignment of axes
• G01B 21/02 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
• G06F 30/10 - Geometric CAD

Abstract

A stylus is arranged on a coordinate measuring machine. A method for aligning a component in relation to the coordinate measuring machine includes positioning the stylus and the component in relation to one another according to a defined arrangement. The method includes acquiring at least one coordinate of the component. The method includes changing at least one of a position and an orientation of the component in relation to the coordinate measuring machine while maintaining the defined arrangement.

IPC Classes  ?

• G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
• G01B 5/012 - Contact-making feeler heads therefor
• G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques

Goods & Services

Handheld laser scanners.

Abstract

A method for evaluating measurement data from a measurement of a plurality of workpieces includes obtaining a set of measurement data. Each workpiece has an associated set of measurement data. The set of measurement data corresponds to measurement points of the workpieces. The set of measurement data has, for each measurement point of the workpieces, at least one measured coordinate and/or, for each measured coordinate, a divergence from a comparison coordinate. The method includes determining a measure of the correlation of the measured coordinates and/or of the divergences is determined for a plurality of the sets of measurement data, in each case in relation to a pair of measurement points that consists of two measurement points of the workpieces.

IPC Classes  ?

• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
• G01B 21/20 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile