This application describes an image processing system and method for LED Flicker Mitigation (LFM). An example method involves capturing multiple frames of a scene using an image sensor configured with various exposure settings. Based on the pixel values in the frames, the edges of a changing object may be identified in each frame, which could be a moving object or an LED source. It then determines the object's moving path between two frames captured with different exposure settings. The amount of movement of the changing object is calculated based on this moving path. The system then estimates the likelihood of the changing object being either the moving object or the LED source, based on the amount of movement. Finally, an image of the scene is generated using the captured frames by performing High Dynamic Range (HDR) fusion and LFM, taking into account the likelihood of the changing object's identity.
This application describes method and apparatus for LED Flicker mitigation (LFM) using spatially multiplexed image sensors with linear exposure configuration and nonlinear gain configuration. An example spatially multiplexed image sensor includes a plurality of pixels, each pixel being divided into M×N sub-pixels, each of the M×N sub-pixels being configured with an exposure time and an analog gain. Within each of the plurality of pixels: the M×N sub-pixels are configured with different exposure times; a first sub-pixel of the M×N sub-pixels is configured with a first exposure time and a first analog gain, and a second sub-pixel of the M×N sub-pixels is configured with a second exposure time and a second analog gain, wherein the first exposure time is longer than the second exposure time, and the first analog gain is smaller than the second analog gain.
H04N 23/745 - Detection of flicker frequency or suppression of flicker wherein the flicker is caused by illumination, e.g. due to fluorescent tube illumination or pulsed LED illumination
H04N 23/73 - Circuitry for compensating brightness variation in the scene by influencing the exposure time
3.
LIGHT-EMITTING DIODE (LED) FLICKER DETECTION IN HIGH DYNAMIC RANGE (HDR) IMAGES
This application describes method and apparatus for detecting LEDs and moving objects using spatially multiplexed image sensors. The sensor may include various pixel groups, each containing multiple pixels set to different exposure levels. Correspondingly, each frame captured reflects these diverse exposure settings. An example method involves extracting a vector of pixel intensities from a specific cluster of pixels in each frame, resulting in a collection of intensity vectors, one from each frame. These vectors are used to create a pattern that shows how the intensity varies across the series of frames. This intensity-changing pattern may be used to determine whether the cluster of pixels is recording a moving object or the flicker of an LED light source.
H04N 23/745 - Detection of flicker frequency or suppression of flicker wherein the flicker is caused by illumination, e.g. due to fluorescent tube illumination or pulsed LED illumination
G06T 7/246 - Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
This application describes method and apparatus for LED Flickering Management (LFM) using spatially multiplexed image sensors. An example method includes configuring the sensor with diverse exposure settings to capture images of a scene with an LED light source. For each pixel position, multiple intensity values are collected across these images. An estimated linear regression model, incorporating an estimated Quantum Efficiency (QE) factor, is constructed using these values. The pixel intensities are then adjusted based on this estimated QE factor, aligning them with the regression model. This process results in modified images of the scene, effectively managing LED flickering for accurate image capture.
H04N 23/745 - Detection of flicker frequency or suppression of flicker wherein the flicker is caused by illumination, e.g. due to fluorescent tube illumination or pulsed LED illumination
H04N 23/71 - Circuitry for evaluating the brightness variation
H04N 23/72 - Combination of two or more compensation controls
H04N 23/73 - Circuitry for compensating brightness variation in the scene by influencing the exposure time
H04N 23/741 - Circuitry for compensating brightness variation in the scene by increasing the dynamic range of the image compared to the dynamic range of the electronic image sensors
H04N 23/743 - Bracketing, i.e. taking a series of images with varying exposure conditions
5.
Color noise reduction based on guided filter using luminance information
This application describes method and apparatus for color noise reduction to enhance the quality of color images. An example method first takes a color image as its input and converts it into a Luminance-Chrominance color space, resulting in an YUV image. This YUV representation consists of a Y-channel (Luminance information), which encapsulates the luminance information responsible for the image's brightness, and UV-channels, which represent the chrominance information responsible for the color information. Then a guided filter is created using the Y-channel of the YUV image. The guided filter acts as a reference and assists in refining the subsequent noise reduction steps. With the guided filter in place, the method performs color noise reduction in the UV-channels of the YUV image, where the color noise is primarily present, resulting in smoother and cleaner color values.
This application describes method and apparatus for HDR+ using M×N-cell sensors. An example apparatus includes a plurality of pixel groups, each pixel group having M×N pixels configured with color filters of a same color such that the M×N pixels in each pixel group capture a same color. M and N are integers greater than one, and each pixel is represented by a first number of bits. The example apparatus further include one or more processors configured to: capture, through the plurality of pixel groups, a plurality of frames of a scene using a short-exposure setting; merge the plurality of frames into an HDR image; and perform tone mapping on the HDR image to reduce a dynamic range of the super-pixels of the HDR image into a low dynamic range (LDR) image, wherein each pixel in the LDR image is represented with the first number of bits.
G06T 5/92 - Dynamic range modification of images or parts thereof based on global image properties
H04N 25/11 - Arrangement of colour filter arrays [CFA]Filter mosaics
H04N 25/62 - Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
7.
Image sensor with image receiver and automatic image switching
Provided are an image sensor with one or more image receivers for image switching, and an imaging system and method therefor. The image sensor includes an image sensor array to generate first image data for a first image; a receiver to receive, into the image sensor, second image data for a second image; an image selection circuit coupled to the image sensor array and the receiver to receive the first image data and the second image data and select one of the first image data and the second image data according to one or more image selection criteria and at least one of the first image data and the second image data; and a transmitter coupled to the image selection circuit to transmit the selected one of the first image data and the second image data from the image sensor.
H10F 39/00 - Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group , e.g. radiation detectors comprising photodiode arrays
8.
Image sensor with image receiver and automatic image combining
Provided are an image sensor with one or more image receivers for image combining, and an imaging system and method therefor. The image sensor includes an image sensor array to generate first image data for a first image; a receiver to receive, into the image sensor, second image data for a second image; an image combination circuit coupled to the image sensor array and the receiver to receive the first image data and the second image data and combine the first image data and the second image data into combined image data for a single combined image, according to one or more image combination criteria, and at least one of the first image data and the second image data; and a transmitter coupled to the image combination circuit to transmit the combined image data for the combined image from the image sensor.
H04N 23/45 - Cameras or camera modules comprising electronic image sensorsControl thereof for generating image signals from two or more image sensors being of different type or operating in different modes, e.g. with a CMOS sensor for moving images in combination with a charge-coupled device [CCD] for still images
H04N 23/741 - Circuitry for compensating brightness variation in the scene by increasing the dynamic range of the image compared to the dynamic range of the electronic image sensors
9.
Apparatus and method of dark current calibration and correction
This application describes methods and systems for dark shading calibration and correction. An example method may include configuring an image sensor into a plurality of sensor states to capture a plurality of dark images, determining a dark current distribution on each of the plurality of dark images captured by the image sensor to obtain a plurality of dark current distributions respectively corresponding to the plurality of sensor states, storing the plurality of dark current distributions in a memory associated with the image sensor, capturing an image by the image sensor at a first sensor state, determining a first dark current distribution for the first sensor state of the image sensor based on the plurality of dark current distributions stored in the memory, and offsetting dark current noise on the image based on the first dark current distribution for the first sensor state of the image sensor.
This application describes methods and systems for imbalance correction in quad image sensors. An exemplary method includes performing pixel value compensation at both inter-quaternion level and intra-quaternion level within a single pipeline. For example, the method may include obtaining an image captured by a quad image sensor and parameters of quaternions in the quad image sensor; computing a quad-pixel value bin and a standard deviation for each quaternion; performing inter-quad compensation among different quaternions using a cross-mean computed based on the plurality of pixel value bins and the plurality of standard deviations; computing texture weights for the plurality of quaternions based on the quad-pixel value bins; and performing intra-quad compensation among pixels within the quaternion based on the cross-mean and corresponding texture weight.
G06V 10/75 - Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video featuresCoarse-fine approaches, e.g. multi-scale approachesImage or video pattern matchingProximity measures in feature spaces using context analysisSelection of dictionaries
G06V 10/60 - Extraction of image or video features relating to illumination properties, e.g. using a reflectance or lighting model
G06V 10/74 - Image or video pattern matchingProximity measures in feature spaces
H04N 25/46 - Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
11.
HIGH DYNAMIC RANGE (HDR) FUSION MECHANISM OF MULTI-EXPOSURE IMAGES
This application describes methods and systems for High Dynamic Range (HDR) image fusion on Low Dynamic Range (LDR) images that avoid ghosting effect. An example method may start with detecting a plurality of motion pixels on the plurality of LDR images. For each of the motion pixels, a plurality of pixel values may be obtained. Each pixel value represents a brightness of the pixel in the corresponding LDR image. The method may then construct a fusion tensor comprising a plurality of dimensions respectively corresponding to the plurality of exposure settings. Each motion pixel may be mapped to the fusion tensor based on the plurality of the pixel values of the motion pixel to obtain a fusion weight. The fusion weights of the motion pixels may provide guidance to the HDR fusion on the LDR images.
This application describes apparatuses and systems for rendering the Bokeh effect using stereo vision with edge computing. An example apparatus may include a first sensor and a second sensor. The first sensor is configured to: capture a first view of a scene. The second sensor is configured to: capture a second view of the scene, and send the second view of the scene to the first sensor. The first sensor is further configured to: receive the second view of the scene, compute a depth map of the scene based on the first view of the scene and the second view of the scene; and render Bokeh effect to an image of the scene based on the depth map.
This application describes apparatuses and systems for rendering the Bokeh effect using multi-pixel microlenses. An example apparatus includes a pixel array including a plurality of pixel groups, each pixel group having a square shape comprising at least four pixels, wherein: each pixel group is covered by a microlens; each pixel group is configured with color filters of a same color such that pixels covered by the pixel group capture the same color; and every four adjacent pixel groups form a two-by-two matrix and the four adjacent pixel groups include at least three pixel groups configured with color filters of three different colors.
This application describes systems and methods for detecting depth in deep trench isolation with semiconductor devices using test key transistors. An method comprises: capturing, by an image sensor, an image; generating a plurality of chrominance channels by converting the image into luminance-chrominance space; performing homogeneous region segmentation on the plurality of chrominance channels to generate one or more regions of interest in the plurality of chrominance channels; and projecting the regions of interest onto eigen-illuminant images to determine gray color pixels on the image, wherein the eigen-illuminant images are generated via performing a machine learning algorithm on a training set of images captured by the image sensor.
This application describes systems and methods related to vertical transfer gates. An example system includes a photodiode region disposed in a substrate, wherein: the photodiode region is configured to accumulate charge photogenerated in the photodiode region in response to incoming light, the photodiode region comprises a top surface and a bottom surface, the top surface being smaller than the bottom surface, the photodiode region comprises at least two doping concentrations, and a first doping concentration of the two doping concentrations that is closer to the top surface is higher than a second doping concentration of the two doping concentrations that is closer to the bottom surface; and a vertical transfer gate in the substrate, wherein: the vertical transfer gate is above the top surface of the photodiode region and is centrally symmetric to the top surface of the photodiode region, and the vertical transfer gate is configured to transfer the photogenerated charge from the photodiode region to a transfer gate.
Provided are an image sensor with one or more image receivers for image switching, and an imaging system and method therefor. The image sensor includes an image sensor array to generate first image data for a first image; a receiver to receive, into the image sensor, second image data for a second image; an image selection circuit coupled to the image sensor array and the receiver to receive the first image data and the second image data and select one of the first image data and the second image data according to one or more image selection criteria and at least one of the first image data and the second image data; and a transmitter coupled to the image selection circuit to transmit the selected one of the first image data and the second image data from the image sensor.
This application describes systems and methods for detecting depth in deep trench isolation with semiconductor devices using test key transistors. An example semiconductor device comprises a test key transistor comprising a source, a drain, a channel connected to the source and the drain, and a gate; and a deep trench isolation encroaching into the channel of the test key transistor, wherein: the test key transistor is associated with a specification including a preset gate voltage, a preset source-drain voltage difference, and a predetermined current, and the test key transistor is configured to generate a current within a threshold difference from the predetermined current in the channel in response to receiving the preset gate voltage at the gate and the preset source-drain voltage difference at the source and the drain, and the deep trench isolation encroaches into the channel at a preset depth.
Provided are an image sensor with one or more image receivers for image switching, and an imaging system and method therefor. The image sensor includes an image sensor array to generate first image data for a first image; a receiver to receive, into the image sensor, second image data for a second image; an image selection circuit coupled to the image sensor array and the receiver to receive the first image data and the second image data and select one of the first image data and the second image data according to one or more image selection criteria and at least one of the first image data and the second image data; and a transmitter coupled to the image selection circuit to transmit the selected one of the first image data and the second image data from the image sensor.
A system is provided for generating a ramping signal. The system includes a plurality of storage circuits each including an input and an output. The output of a previous storage circuit is connected to the input of a next storage circuit. The storage circuits are configured to propagate a first enable signal based on a first control signal. The system also includes a plurality of first current generating circuits. Each first current generating circuit is coupled to the output of a corresponding storage circuit to receive the propagated first enable signal. The first current generating circuits are configured to generate a first current signal based on the propagated first enable signal.
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03K 4/12 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth voltage is produced across a capacitor
H03K 4/26 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth current is produced through an inductor
H03K 4/48 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
H04N 5/365 - Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
20.
System and method for visible and infrared high dynamic range sensing
A high dynamic range sensing device is disclosed. The device includes an array of Bayer pattern units. Each of the Bayer pattern units comprises a plurality of pixels and each of the plurality of pixels comprises a plurality of photodiodes. At least one of the plurality of photodiodes in each pixel is configured to detect near infrared (NIR) light and at least one of the plurality of photodiodes in each of the plurality of pixels is configured to detect visible light.
H04N 5/347 - Extracting pixel data from an image sensor by controlling scanning circuits, e.g. by modifying the number of pixels having been sampled or to be sampled by combining or binning pixels in SSIS
H04N 9/07 - Picture signal generators with one pick-up device only
H04N 23/741 - Circuitry for compensating brightness variation in the scene by increasing the dynamic range of the image compared to the dynamic range of the electronic image sensors
H04N 23/11 - Cameras or camera modules comprising electronic image sensorsControl thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
H04N 23/12 - Cameras or camera modules comprising electronic image sensorsControl thereof for generating image signals from different wavelengths with one sensor only
H04N 25/46 - Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
H04N 25/583 - Control of the dynamic range involving two or more exposures acquired simultaneously with different integration times
21.
System and method for visible and infrared high dynamic range sensing
A high dynamic range sensing device is disclosed. The device includes an array of Bayer pattern units. Each of the Bayer pattern units comprises a plurality of pixels and each of the plurality of pixels comprises a plurality of photodiodes. At least one of the plurality of photodiodes in each pixel is configured to detect near infrared (NIR) light and at least one of the plurality of photodiodes in each of the plurality of pixels is configured to detect visible light.
H04N 5/347 - Extracting pixel data from an image sensor by controlling scanning circuits, e.g. by modifying the number of pixels having been sampled or to be sampled by combining or binning pixels in SSIS
A multispectral sensing device is disclosed. The sensing device may comprise an array of pixel units. Each of the pixel units may comprise four pixels in a two by two configuration. Each of the pixels may comprise a plurality of sub-pixels. Each of the pixel units may include at least one pixel that includes at least two sub-pixels configured to detect light of different wavelengths.
A system is provided for generating a ramping signal. The system includes a plurality of storage circuits each including an input and an output. The output of a previous storage circuit is connected to the input of a next storage circuit. The storage circuits are configured to propagate a first enable signal based on a first control signal. The system also includes a plurality of first current generating circuits. Each first current generating circuit is coupled to the output of a corresponding storage circuit to receive the propagated first enable signal. The first current generating circuits are configured to generate a first current signal based on the propagated first enable signal.
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03K 4/12 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth voltage is produced across a capacitor
H03K 4/26 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth current is produced through an inductor
H03K 4/48 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
H04N 5/365 - Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
24.
System and method for high dynamic range image sensing
A high dynamic range sensing device is disclosed. The device may comprise an array of Bayer-pattern units of color filters, each of the color filters corresponding to a pixel of the sensing device, and each of the color filters overlapping with a plurality of photodiodes.
H04N 5/3745 - Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
A multispectral sensing device is disclosed. The sensing device may comprise an array of pixel units. Each of the pixel units may comprise four pixels in a two by two configuration. Each of the pixels may comprise a plurality of sub-pixels. Each of the pixel units may include at least one pixel that includes at least two sub-pixels configured to detect light of different wavelengths.
A high dynamic range sensing device is disclosed. The device includes an array of Bayer pattern units. Each of the Bayer pattern units comprises a plurality of pixels and each of the plurality of pixels comprises a plurality of photodiodes. At least one of the plurality of photodiodes in each pixel is configured to detect near infrared (NIR) light and at least one of the plurality of photodiodes in each of the plurality of pixels is configured to detect visible light.
H04N 5/347 - Extracting pixel data from an image sensor by controlling scanning circuits, e.g. by modifying the number of pixels having been sampled or to be sampled by combining or binning pixels in SSIS
H04N 9/07 - Picture signal generators with one pick-up device only
27.
System and method for high dynamic range image sensing
A high dynamic range sensing device is disclosed. The device may comprise an array of Bayer-pattern units of color filters, each of the color filters corresponding to a pixel of the sensing device, and each of the color filters overlapping with a plurality of photodiodes.
H04N 5/3745 - Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
A system and method is provided for image sensing. The image sensing system includes a comparator for comparing an input signal representing a sensed light signal from at least one pixel of the image sensing system and a reference signal. The comparator includes at least one digital transistor.
H03M 1/18 - Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H04N 5/3745 - Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
A system is provided for generating a ramping signal. The system includes a plurality of storage circuits each including an input and an output. The output of a previous storage circuit is connected to the input of a next storage circuit. The storage circuits are configured to propagate a first enable signal based on a first control signal. The system also includes a plurality of first current generating circuits. Each first current generating circuit is coupled to the output of a corresponding storage circuit to receive the propagated first enable signal. The first current generating circuits are configured to generate a first current signal based on the propagated first enable signal.
H03K 4/02 - Generating pulses having essentially a finite slope or stepped portions having stepped portions, e.g. staircase waveform
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03K 4/12 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth voltage is produced across a capacitor
H03K 4/26 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth current is produced through an inductor
H03K 4/48 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
H04N 5/365 - Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
A system is provided for generating a ramping signal. The system includes a plurality of storage circuits each including an input and an output. The output of a previous storage circuit is connected to the input of a next storage circuit. The storage circuits are configured to propagate a first enable signal based on a first control signal. The system also includes a plurality of first current generating circuits. Each first current generating circuit is coupled to the output of a corresponding storage circuit to receive the propagated first enable signal. The first current generating circuits are configured to generate a first current signal based on the propagated first enable signal.
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03K 4/12 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth voltage is produced across a capacitor
H03K 4/26 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth current is produced through an inductor
H03K 4/48 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
H04N 5/365 - Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
31.
System, method, and apparatus for generating a ramp signal with a changing slope
A device for generating a ramp signal with a changing slope is disclosed. The device may comprise a processor configured to generate a variable signal. The device may also comprise a phase-locked loop (PLL) circuit configured to receive the variable signal and a reference clock signal, generate a changing ramp clock signal based on the variable signal and the reference clock signal, and output the generated changing ramp clock signal as an input of an analog-to-digital-converter (ADC) circuit.
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03L 7/197 - Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division
H03M 3/00 - Conversion of analogue values to or from differential modulation
H03K 6/04 - Modifying slopes of pulses, e.g. S-correction
An image sensor including at least one pixel for collecting charge in its photodiode is provided. The image sensor comprises: a substrate having a first surface on a front side and a second surface on a back side, a photodetector formed in the silicon substrate and having a light-receiving surface on the second surface, and a first layer with positive charges disposed on the second surface, the first layer being configured to form an electron accumulation region at the light-receiving surface of the photodetector for suppressing a dark current at a back side interface of the image sensor. A method for fabricating an image sensor including a first layer with positive charges is also provided.
Multimedia data capture and processing device having image sensor integrated and embedded during manufacture with preset information for broadcasting to people
The present application relates to a multimedia data capture and processing (C&P) device. In an example, the multimedia data C&P device comprises a multimedia sensor configured to capture a first multimedia data; and a device processor configured to obtain a preset information, and generate a second multimedia data according to the first multimedia data and the preset information, at least a part of the second multimedia data presenting the preset information. The present application also relates to a user terminal and multimedia data processing server.
G06F 17/30 - Information retrieval; Database structures therefor
G06Q 20/40 - Authorisation, e.g. identification of payer or payee, verification of customer or shop credentialsReview and approval of payers, e.g. check of credit lines or negative lists
G06Q 30/02 - MarketingPrice estimation or determinationFundraising
G06Q 30/06 - Buying, selling or leasing transactions
34.
Image sensor pixel structure with optimized uniformity
An image sensor includes at least a first row and a second row of photodiodes, each photodiode being coupled with an associated transistor, each associated transistor including a gate, the first and second row of photodiodes forming a series of 2×2 Bayer-pattern units. In each Bayer-pattern unit, a first photodiode and a second photodiode in the first row are designated respectively as a first green pixel and a blue pixel, and a third photodiode and a fourth photodiode in the second row are designated respectively as a red pixel and a second green pixel, wherein a position of the gate of the transistor associated with the first photodiode relative to the first photodiode and a position of the gate of the transistor associated with the fourth photodiode relative to the fourth photodiode are the same.
The present invention provides a compact row decoder with multiple voltage support. The row decoder may include a global driver and a plurality of row-level drivers. The global driver may include one or more voltage level shifters that are operable to provide multiple voltages required to drive each of the plurality of row-level drivers. The plurality of row-level drivers each may include only one voltage level shifter. In an example, the row-level driver includes an address decoder implemented in a digital domain providing an address selection signal, a voltage level shifter to convert the address selection signal to an analog domain, and a row driver receiving driving signals from the global driver. The row driver has no voltage level shifter contained therein. Thus, the row-level drivers and the row decoder may be very compact. The present invention further provides a CMOS image sensor including the row decoder and a method of operating the CMOS image sensor.
H04N 3/14 - Scanning details of television systemsCombination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
The invention provides a voltage regulator with multiple output ranges. The voltage regulator includes a voltage divider that has at least a first resistor and a second resistor. The resistance ratio of the first resistor to the second resistor is 1:(X−1). The input of the regulator is connected to the first resistor, and the output is connected to the second resistor. A voltage source may provide a reference voltage Vref to a connecting point between the first resistor and the second resistor. At least one working circuit is connected to the output to provide the output voltage as Vout=Vin−X(Vin−Vref), wherein Vin is the input voltage. As another option, the at least one working circuit may be deactivated and the output may be coupled to ground.
H02M 3/06 - Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider
G05F 1/618 - Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series and in parallel with the load as final control devices
H02M 3/07 - Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode
A system is provided for generating a ramping signal. The system includes a plurality of storage circuits each including an input and an output. The output of a previous storage circuit is connected to the input of a next storage circuit. The storage circuits are configured to propagate a first enable signal based on a first control signal. The system also includes a plurality of first current generating circuits. Each first current generating circuit is coupled to the output of a corresponding storage circuit to receive the propagated first enable signal. The first current generating circuits are configured to generate a first current signal based on the propagated first enable signal.
H03K 4/02 - Generating pulses having essentially a finite slope or stepped portions having stepped portions, e.g. staircase waveform
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03K 4/08 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
H03K 4/12 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth voltage is produced across a capacitor
H03K 4/26 - Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements vacuum tubes only in which a sawtooth current is produced through an inductor
38.
Column comparator system and method for comparing a ramping signal and an input signal
A system and method is provided for image sensing. The image sensing system includes a comparator for comparing an input signal representing a sensed light signal from at least one pixel of the image sensing system and a reference signal. The comparator includes at least one digital transistor.
H04N 5/3745 - Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
The present invention relates to an integrated circuit having a flexible reference. In an example, the integrated circuit includes a reference generator, and the reference generator can generate a flexible reference signal in response to a control signal. The flexible reference signal can be changed freely by adjusting the control signal. By providing the flexible reference, the present invention can enhance the capability of verification and characterization for an integrated circuit design and reduce the physical layout area of the integrated circuit design. The present invention also relates to a method of operating the integrated circuit with a flexible reference signal.
H04N 5/3745 - Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
H02M 3/156 - Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
H04L 5/00 - Arrangements affording multiple use of the transmission path
H04N 5/378 - Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
H03M 1/78 - Simultaneous conversion using ladder network
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