A light source (12) that generates a target beam (12b) includes a seed laser assembly (20) and a waveguide assembly (22). The seed laser assembly (20) emits a seed beam (20a) having a seed vacuum wavelength. The waveguide assembly (22) converts at least a portion of the seed beam (20a) to the target beam (12b) having the target vacuum wavelength with a target optical mode using a non-linear process, wherein the waveguide assembly (22) includes a waveguide (24) that is transparent to light in the vacuum ultraviolet range.
A laser assembly (12) of a system (10) includes a first emitter assembly (30a), a second emitter assembly (30b), and a combiner lens (34). The first emitter assembly (30a) generates a first emitter beam (22a) that is directed along a first emitter axis (32a) at a beam intersection area (31). The second emitter assembly (30b) generates a second emitter beam (22b) that is directed along a second emitter axis (32b) at the beam intersection area (31). The combiner lens (34) receives and spatially combines the first emitter beam (22a) and the second emitter beam (22b) after the emitter beams (22a) (22b) have intersected at and passed through the beam intersection area (31). The laser assembly (12) includes a laser frame (18); an emitter array (20) that generates a plurality of emitter beams (22); a combiner lens assembly (24) that transforms and combines the plurality of emitter beams (22) into the assembly output beam (14); and a system controller (26) that controls the operation of the laser assembly (12). The combiner lens assembly (24) including combiner lenses (34, 36, 38) has a fast axis, front side focal point (24a), and a fast axis and slow axis, rear side focal point (24b). It is positioned so that its fast axis front side focal point (24a) is approximately at the beam intersection area (31). The optical fiber (16) is positioned so that its inlet facet (16A) is approximately at the fast axis and slow axis, rear side focal point (24b).
A laser assembly (10) that generates an output beam (12) includes a laser source (40) that emits a source beam (40a), and a PIC module (33) that receives the source beam (40a) and processes the source beam (40a) to provide the output beam (12). The laser assembly (10) can include a laser frame (14) that encircles the laser source (40) and the PIC module (33). The laser frame (14) provides a controlled environment around these components. The PIC module (33) can include a light modulation assembly that selectively modulates the source beam (40) to generate the output beam (12). The light modulation assembly can modulate at least one of (or both) phase and amplitude of the output beam (12).
H01S 3/105 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity
H01S 5/02257 - Out-coupling of light using windows, e.g. specially adapted for back-reflecting light to a detector inside the housing
H01S 5/062 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
H01S 5/323 - Structure or shape of the active regionMaterials used for the active region comprising PN junctions, e.g. hetero- or double- hetero-structures in AIIIBV compounds, e.g. AlGaAs-laser
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/02255 - Out-coupling of light using beam deflecting elements
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
H01S 5/02251 - Out-coupling of light using optical fibres
H01S 5/02326 - Arrangements for relative positioning of laser diodes and optical components, e.g. grooves in the mount to fix optical fibres or lenses
H01S 5/02208 - MountingsHousings characterised by the shape of the housings
4.
LASER ASSEMBLY WITH ACTIVE POINTING COMPENSATION DURING WAVELENGTH TUNING
An assembly (10) for generating a laser beam (12) includes a beam steering assembly (18); a laser assembly (16) that is tunable over a tunable range; and a controller (20). The laser assembly (16) generates a laser beam (12) that is directed at the beam steering assembly (18). The controller (20) dynamically controls the beam steering assembly (18) to dynamically steer the laser beam (12) as the laser assembly (16) is tuned over at least a portion of the tunable range. As a result thereof, the laser beam (12) is actively steered along a desired beam path (12A) while the wavelength of the laser beam (12) is varied.
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
H01S 3/1055 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity one of the reflectors being constituted by a diffraction grating
H01S 5/02255 - Out-coupling of light using beam deflecting elements
H01S 5/02325 - Mechanically integrated components on mount members or optical micro-benches
A laser assembly (10) includes a substrate (22); a plurality of spaced apart, lasers (20) grown on the substrate (22); and an electrical connector assembly (14). The lasers (20) are individually tested to identify if the tested lasers (20) are a good laser (20a) or a bad laser (20b). The electrical connector assembly (14) is adapted to electrically connect a supply source (16) of electrical power to the identified good lasers (20a), while not electrically connecting the identified bad lasers (20b) to the supply source (16). Thus, the identified bad lasers (20B) are electrically isolated from the supply source (16).
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
6.
OPTICAL SWITCH ASSEMBLY AND VARIABLE OPTICAL POWER ATTENUATOR
An optical assembly (14) that receives an input beam (12a) and selectively provides an adjusted beam (14a) includes an input lens assembly (24), a resonant element assembly (25), and a frequency generator (28). The resonant element assembly (25) can receive a collimated input beam (36). The frequency generator (28) selectively directs a frequency through the resonant element assembly (25) to selectively adjust the characteristics of the adjusted beam (14a) that exits the resonant element assembly (25). The frequency generator (28) includes a transducer (28a) that is coupled to the resonant element assembly (25), and a signal generator (28b) that directs an electric signal to the transducer (28a) to selectively vibrate the resonant element assembly (25).
G02F 1/11 - Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulatingNon-linear optics for the control of the intensity, phase, polarisation or colour based on acousto-optical elements, e.g. using variable diffraction by sound or like mechanical waves
G02F 1/29 - Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulatingNon-linear optics for the control of the position or the direction of light beams, i.e. deflection
A fluid analyzer (214) that analyzes a sample (12) includes an analyzer frame (236); a test cell assembly (242) that receives the sample (12); a laser assembly (238) that generates a laser beam (239A); a signal detector assembly (232); and a self-check assembly (230). The self-check assembly (230) includes (i) a check frame (230A); (ii) a check substance (230E) with known spectral characteristics; and (iii) a check frame mover (230B) that selectively moves the check frame (230A) between a self-check position (231B) and a test position (231A) relative to the analyzer frame (236). In the self-check position (231B), the laser beam (239A) is directed through the check substance (230E) to evaluate the performance of the fluid analyzer (214). In the test position (231A), the laser beam (239A) is directed through the sample (12) in the test cell assembly (242) to evaluate the sample (12).
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
G01N 29/30 - Arrangements for calibrating or comparing, e.g. with standard objects
A laser assembly (10) includes: (i) a first laser subassembly (16) that includes a first laser (26a) that generates a first laser beam (26b); a second laser (26f) that generates a second laser beam (26g); and a first beam combiner (26j) that combines the first laser beam (26b) and the second laser beam (26g) to form a first subassembly beam (16A) that is directed along a first subassembly beam axis (16B); (ii) a second laser subassembly (18) that includes a third laser (28a) that generates a third laser beam (28b); a fourth laser (28f) that generates a fourth laser beam (28g); and a second beam combiner (28j) that combines the third laser beam (28b) and the fourth laser beam (28g) to form a second subassembly beam (18A) that is directed along a second subassembly beam axis (18B) that is substantially parallel to the first subassembly beam axis (16B); and an optical assembly (22) that compresses the subassembly beams (16A) (18A) to provide the output beam (12).
A laser assembly (10) includes an emitter array (34) and a lens array (36). The emitter array (34) includes a first emitter (18A) that generates a first emitter beam (20A) along a first emitter axis (44A), and a second emitter (18B) that generates a second emitter beam (20B) along a second emitter axis (44B). The first emitter axis (44A) and the second emitter axis (44B) are spaced apart a first emitter separation distance (42a). The lens array (36) includes a first lens (22A) that colliminates the first emitter beam (20A), and a second lens (22B) that colliminates the second emitter beam (20B). The first lens (22A) has a first lens axis (48A) and the second lens (22B) has a second lens axis (48B). The first lens axis (48A) and the second lens axis (48B) are spaced apart a first lens separation distance (46a) that is different from the first emitter separation distance (42a).
A gain medium (14) includes a substrate (34) and an active region (38) coupled to the substrate (34). The active region (38) includes a central section (28), a first end section (24), and a first tapered section (26). The central section (28) has a central width (28b) that is substantially constant along the central section (28). The first end section (24) has a first end width (24b) that is substantially constant along the first end section (24). Further, the first end dimension (24b) is smaller than the central dimension (28b). The first tapered section (26) connects the first end section (24) to the central section (28). The first tapered section (26) has a first tapered width (26b) that tapers from the central section (28) to the first end section (24).
H01S 5/10 - Construction or shape of the optical resonator
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
11.
HIGH POWER LASER ASSEMBLY WITH ACCURATE POINTING IN THE FAR FIELD
A laser assembly (10) for generating an output beam (12) includes: (i) a first laser (16) that generates a first laser beam (16A) having a first polarization state; (ii) a second laser (20) that generates a second laser beam (20A); (iii) a polarization beam combiner (24) that combines the first laser beam (16A) and the rotated second laser beam (20A) to form a combination beam (25); and (iv) an optical assembly (32) that expands and collimates the combination beam (25) to provide the output beam (12). The optical assembly (32) include an on-axis telescope plus a projection lens.
A tunable light source (10) that generates a source beam (12) having a tunable source frequency (12a) includes an emitter assembly (14), a first frequency generator (16), and a first filter (18). The emitter assembly (14) emits an emitter beam (14a), and the first frequency generator (16) receives the emitter beam (14a) and generates a plurality of first frequency lines (16b). The first filter (18) filters the first frequency lines (16b) to transmit a first filter beam (18a) that includes only one of the first frequency lines (16b). The light source (10) can include a second frequency generator (20) that converts the first filter beam (18a) into a plurality of second frequency lines (20b), and a second filter (22) that filters the second frequency lines (20b) to provide a second filter beam (22a) having the source frequency (12a).
A laser assembly (10) that generates a first beam (40) includes an emitter (16), a transmission grating assembly (20), and a redirector assembly (22). The emitter (16) emits an emitter beam (16a) from a first facet (16c). The transmission grating assembly (20) is positioned in the path of the emitter beam (16a), and the transmission grating assembly (20) diffracts the emitter beam (16a) into the first beam (40) and a second beam (42) during transmission through the transmission grating assembly (20). The redirector assembly (22) receives the second beam (42) and directs a redirected beam (44) at the transmission grating assembly (20) to form an external cavity.
H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
H01S 5/02325 - Mechanically integrated components on mount members or optical micro-benches
A laser assembly (12) of a system (10) includes a first emitter assembly (30a), a second emitter assembly (30b), and a combiner lens (34). The first emitter assembly (30a) generates a first emitter beam (22a) that is directed along a first emitter axis (32a) at a beam intersection area (31). The second emitter assembly (30b) generates a second emitter beam (22b) that is directed along a second emitter axis (32b) at the beam intersection area (31). The combiner lens (34) receives and spatially combines the first emitter beam (22a) and the second emitter beam (22b) after the emitter beams (22a) (22b) have intersected at and passed through the beam intersection area (31). The laser assembly (12) includes a laser frame (18); an emitter array (20) that generates a plurality of emitter beams (22); a combiner lens assembly (24) that transforms and combines the plurality of emitter beams (22) into the assembly output beam (14); and a system controller (26) that controls the operation of the laser assembly (12). The combiner lens assembly (24) including combiner lenses (34, 36, 38) has a fast axis, front side focal point (24a), and a fast axis and slow axis, rear side focal point (24b). It is positioned so that its fast axis front side focal point (24a) is approximately at the beam intersection area (31). The optical fiber (16) is positioned so that its inlet facet (16A) is approximately at the fast axis and slow axis, rear side focal point (24b).
A laser assembly (10) includes a substrate (22); a plurality of spaced apart, lasers (20) grown on the substrate (22); and an electrical connector assembly (14). The lasers (20) are individually tested to identify if the tested lasers (20) are a good laser (20a) or a bad laser (20b). The electrical connector assembly (14) is adapted to electrically connect a supply source (16) of electrical power to the identified good lasers (20a), while not electrically connecting the identified bad lasers (20b) to the supply source (16). Thus, the identified bad lasers (20B) are electrically isolated from the supply source (16).
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/026 - Monolithically integrated components, e.g. waveguides, monitoring photo-detectors or drivers
16.
TEST CELL ASSEMBLY INCLUDING ATTENUATED TOTAL REFLECTOR
A test cell assembly (924) for receiving a sample (12) that is analyzed with an incident light beam (928a) includes a test cell (925). The test cell (925) includes an attenuated total reflector having a curved first surface (925a) that defines at least a portion of a test internal channel (960) for receiving the sample (12), a second surface (925b) that is spaced apart from the first surface (925a), and an access area (925C) for receiving the incident light beam (928a) that is directed at the first surface (925a). The attenuated total reflector can have an annular shape and can be sized and shaped so that the test internal channel (960) corresponds to and matches the size and shape of an inlet conduit (954) that directs the sample (14) to the test cell (925).
A spectral imaging device (1312) for capturing one or more, two- dimensional, spectral images (1313A) of a sample (1310) including (i) an image sensor (1328), (ii) an illumination source (1314), (iii) a beam path adjuster (1362), and (iv) a control system (1330). The illumination source (1314) that generates an illumination beam (1316) that is directed along an incident sample beam path (1360) at the sample (1310). The beam path adjuster (1362) selectively adjusts the incident sample beam path (1360). The control system (1330) controls (i) the illumination source (1314) to generate the illumination beam during the first capture time, (ii) the image sensor (1328) during the first capture time to capture first information for the first spectral image (1313A), and (iii) the beam path adjuster (1362) to selectively adjust the incident sample beam path (1360) relative to the sample (1310) during the first capture time while the image sensor (1328) is accumulating the information for the first spectral image (1313A).
A laser assembly (10) includes: (i) a first laser subassembly (16) that includes a first laser (26a) that generates a first laser beam (26b); a second laser (26f) that generates a second laser beam (26g); and a first beam combiner (26j ) that combines the first laser beam (26b) and the second laser beam (26g) to form a first subassembly beam (16A) that is directed along a first subassembly beam axis (16B); (ii) a second laser subassembly (18) that includes a third laser (28a) that generates a third laser beam (28b); a fourth laser (28f) that generates a fourth laser beam (28g); and a second beam combiner (28j) that combines the third laser beam (28b) and the fourth laser beam (28g) to form a second subassembly beam (18A) that is directed along a second subassembly beam axis (18B) that is substantially parallel to the first subassembly beam axis (16B); and an optical assembly (22) that compresses the subassembly beams (16A) (18A) to provide the output beam (12).
A fluid analyzer (214) that analyzes a sample (12) includes (i) an analyzer frame (236); (ii) a module (216) that includes a test cell assembly (242) that receives the sample (12) and a module frame (244) that retains the test cell assembly (242); (iii) a laser assembly (238) that generates a laser beam (239A) that is directed through the test cell assembly (242), the laser assembly (238) being coupled to the analyzer frame (236); (iv) a signal detector assembly (232) that collects a test signal light (239B) transmitted through the test cell assembly (242), the signal detector assembly (232) being coupled to the analyzer frame (236); and (v) a coupler assembly (245) that selectively couples the module frame (244) to the analyzer frame (236).
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
G01N 29/30 - Arrangements for calibrating or comparing, e.g. with standard objects
A fluid analyzer (214) that analyzes a sample (12) includes an analyzer frame (236); a test cell assembly (242) that receives the sample (12); a laser assembly (238) that generates a laser beam (239A) a signal detector assembly (232) and a self-check assembly (230). The self-check assembly (230) includes (i) a check frame (230A); (ii) a check substance (230E) with known spectral characteristics; and (iii) a check frame mover (230B) that selectively moves the check frame (230A) between a self-check position (231 B) and a test position (231 A) relative to the analyzer frame (236). In the self-check position (231 B), the laser beam (239A) is directed through the check substance (230E) to evaluate the performance of the fluid analyzer (214). In the test position (231 A), the laser beam (239A) is directed through the sample (12) in the test cell assembly (242) to evaluate the sample (12).
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 29/30 - Arrangements for calibrating or comparing, e.g. with standard objects
An assembly (10) for generating a laser beam (12) includes a beam steering assembly (18); a laser assembly (16) that is tunable over a tunable range; and a controller (20). The laser assembly (16) generates a laser beam (12) that is directed at the beam steering assembly (18). The controller (20) dynamically controls the beam steering assembly (18) to dynamically steer the laser beam (12) as the laser assembly (16) is tuned over at least a portion of the tunable range. As a result thereof, the laser beam (12) is actively steered along a desired beam path (12A) while the wavelength of the laser beam (12) is varied.
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
H01S 3/1055 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity one of the reflectors being constituted by a diffraction grating
H01S 5/02325 - Mechanically integrated components on mount members or optical micro-benches
22.
HIGH POWER LASER ASSEMBLY WITH ACCURATE POINTING IN THE FAR FIELD
A laser assembly (10) for generating an output beam (12) includes: (i) a first laser (16) that generates a first laser beam (16A) having a first polarization state; (ii) a second laser (20) that generates a second laser beam (20A); (iii) a polarization beam combiner (24) that combines the first laser beam (16A) and the rotated second laser beam (20A) to form a combination beam (25); and (iv) an optical assembly (32) that expands and collimates the combination beam (25) to provide the output beam (12). The optical assembly (32) include an on-axis telescope plus a projection lens.
H01S 5/02 - Structural details or components not essential to laser action
H01S 5/02216 - Butterfly-type, i.e. with electrode pins extending horizontally from the housings
H01S 5/02325 - Mechanically integrated components on mount members or optical micro-benches
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
H01S 3/1055 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity one of the reflectors being constituted by a diffraction grating
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A laser (14) includes an optical amplifier array system (17) that generates a plurality of laser beams (24); and a beam combiner (18) that coherently combines the plurality of laser beams (24) to form a combination beam (26) having a hollow center in a near field. The combination beam (26) with the hollow center allows for the use of a beam director (19) having an on-axis, reflective beam expander (21) without (i) loss in power, (ii) degradation of beam quality, or (iii) excessive heating of the beam expander (21).
A device controller (16) for directing a drive current (12A) to a device (12) includes a current driven power source (40) that is electrically connected to the device (12); and a current adjuster (22) electrically connected to the power source (40) in parallel to the device (12). The current adjuster (22) selectively adjusts the drive current (12A) directed to the device (12). For a laser (12), the current adjuster (22) can adjust the drive current (12A) to modulate a center wavelength of an illumination beam (20) generated by the laser (12).
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
A spectral imaging device (1312) for capturing one or more, two-dimensional, spectral images (1313A) of a sample (1310) including (i) an image sensor (1328), (ii) an illumination source (1314), (iii) a beam path adjuster (1362), and (iv) a control system (1330). The illumination source (1314) that generates an illumination beam (1316) that is directed along an incident sample beam path (1360) at the sample (1310). The beam path adjuster (1362) selectively adjusts the incident sample beam path (1360). The control system (1330) controls (i) the illumination source (1314) to generate the illumination beam during the first capture time, (ii) the image sensor (1328) during the first capture time to capture first information for the first spectral image (1313A), and (iii) the beam path adjuster (1362) to selectively adjust the incident sample beam path (1360) relative to the sample (1310) during the first capture time while the image sensor (1328) is accumulating the information for the first spectral image (1313A).
A connector assembly (16) for electromagnetically connecting a pulse generator (12) to an electronic device (14) includes: a short, first strip transmission line (31 A) and a short, second strip transmission line (31 B) that electromagnetically connect the pulse generator (12) and the electronic device (14). The strip transmission lines (31 A) (31 B) are physically connected. The first strip transmission line (31 A) has a first strip transmission line impedance and the second strip transmission line has a second strip transmission line impedance that is different from the first strip transmission line impedance.
A laser assembly (1710) for generating an assembly output beam (1712) includes a laser subassembly (1716) including a first laser module (1716A) and a second laser module (1716B), a transform assembly (1744), and a beam combiner (1746). The first laser module (1716A) emits a plurality of spaced apart first laser beams (1720A). The second laser module (1716B) emits a plurality of spaced apart second laser beams (1720B). The transform assembly (1744) is positioned in a path of the laser beams (1720A) (1720B). The transform assembly (1744) directs the laser beams (1720A) (1720B) to spatially overlap at a focal plane of the transform assembly (1744). The beam combiner (1746) is positioned at the focal plane that combines the lasers beams (1720A) (1720B) to provide a combination beam. The laser beams (1720A) (1720B) directed by the transform assembly (1744) impinge on the beam combiner (1746) at different angles.
A semiconductor laser tuned with an acousto-optic modulator. The acousto-optic modulator may generate standing waves or traveling waves. When traveling waves are used, a second acousto-optic modulator may be used in a reverse orientation to cancel out a chirp created in the first acousto-optic modulator. The acousto-optic modulator may be used with standing-wave laser resonators or ring lasers.
H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
H01S 5/0625 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/10 - Construction or shape of the optical resonator
30.
LASER ASSEMBLY WITH ACTIVE POINTING COMPENSATION DURING WAVELENGTH TUNING
An assembly (10) for generating a laser beam (12) includes a beam steering assembly (18); a laser assembly (16) that is tunable over a tunable range; and a controller (20). The laser assembly (16) generates a laser beam (12) that is directed at the beam steering assembly (18). The controller (20) dynamically controls the beam steering assembly (18) to dynamically steer the laser beam (12) as the laser assembly (16) is tuned over at least a portion of the tunable range. As a result thereof, the laser beam (12) is actively steered along a desired beam path (12A) while the wavelength of the laser beam (12) is varied.
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
H01S 3/1055 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity one of the reflectors being constituted by a diffraction grating
H01S 5/02208 - MountingsHousings characterised by the shape of the housings
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
31.
FLUID ANALYZER WITH SELF-CHECK, LEAK DETECTION, AND ADJUSTABLE GAIN
A fluid analyzer (214) that analyzes a sample (12) includes an analyzer frame (236); a test cell assembly (242) that receives the sample (12); a laser assembly (238) that generates a laser beam (239A); a signal detector assembly (232); and a self-check assembly (230). The self-check assembly (230) includes (i) a check frame (230A); (ii) a check substance (230E) with known spectral characteristics; and (ill) a check frame mover (230B) that selectively moves the check frame (230A) between a self-check position (231 B) and a test position (231 A) relative to the analyzer frame (236). In the self-check position (231 B), the laser beam (239A) is directed through the check substance (230E) to evaluate the performance of the fluid analyzer (214). In the test position (231 A), the laser beam (239A) is directed through the sample (12) in the test cell assembly (242) to evaluate the sample (12).
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
32.
FLUID ANALYZER WITH REMOVABLE TEST CELL FOR DETECTION AND QUANTITATION OF COMPOUNDS IN LIQUIDS
A fluid analyzer (214) that analyzes a sample (12) includes (i) an analyzer frame (236); (ii) a module (216) that includes a test cell assembly (242) that receives the sample (12) and a module frame (244) that retains the test cell assembly (242); (iii) a laser assembly (238) that generates a laser beam (239A) that is directed through the test cell assembly (242), the laser assembly (238) being coupled to the analyzer frame (236); (iv) a signal detector assembly (232) that collects a test signal light (239B) transmitted through the test cell assembly (242), the signal detector assembly (232) being coupled to the analyzer frame (236); and (v) a coupler assembly (245) that selectively couples the module frame (244) to the analyzer frame (236).
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
A laser (14) includes an optical amplifier array system (17) that generates a plurality of laser beams (24); and a beam combiner (18) that coherently combines the plurality of laser beams (24) to form a combination beam (26) having a hollow center in a near field. The combination beam (26) with the hollow center allows for the use of a beam director (19) having an on-axis, reflective beam expander (21) without (i) loss in power, (ii) degradation of beam quality, or (iii) excessive heating of the beam expander (21).
A method of spectral beam-combining an array of fiber optics is disclosed. Each fiber may be coupled to a high-power, wavelength-stabilized, fiber-coupled, diode-laser module and has a fiber-by-fiber pre-selected wavelength. The wavelengths may be chosen such that the array can be spectrally combined on, for example a transmission grating and re-focused into an output fiber. This approach is scalable to, for example, 10 kW power and have a beam quality sufficient for metal cutting applications.
A flow cell assembly (16) for a fluid analyzer (14) that analyzes a sample (12) includes (i) a base (350) that includes a base window (350B); (ii) a cap (352) having a cap window (352B) that is spaced apart from the base window (350B); and (iii) a gasket (360) that is secured to and positioned between the base (350) and the cap (352), the gasket (360) having a gasket body (360A) that includes a gasket opening (360B). The gasket body (360A), the base (350) and the cap (352) cooperate to define a flow cell chamber (362). Moreover, an inlet passageway (366) extends into the flow cell chamber (362) to direct the sample (12) into the flow cell chamber (362); and an outlet passageway (368) extends into the flow cell chamber (362) to allow the sample (12) to exit the flow cell chamber (362).
G01N 21/3577 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
36.
Low-noise spectroscopic imaging system using substantially coherent illumination
A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
A semiconductor laser tuned with an acousto-optic modulator. The acousto-optic modulator may generate standing waves or traveling waves. When traveling waves are used, a second acousto-optic modulator may be used in a reverse orientation to cancel out a chirp created in the first acousto-optic modulator. The acousto-optic modulator may be used with standing-wave laser resonators or ring lasers.
H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
H01S 5/0625 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/10 - Construction or shape of the optical resonator
The present invention is directed to an ultra-compact dual quantum cascade laser assembly that nearly doubles the strength of a traditional laser in a in a single hermetically sealed micropackage. The device may comprise two quantum cascade lasers that meet at a combiner to create a single laser with a higher strength than traditional lasers. The current invention provides a path to an ultra-compact coherent beam combing arrangement that uses both dichroic beam combining and polarization beam combining techniques.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A laser assembly (1210) for generating an assembly output beam (1212) includes a laser subassembly (1216) that emits a plurality of spaced apart first laser beams (1220A), a plurality of spaced apart second laser beams (1220B), a transform lens assembly (1244), a wavelength selective beam combiner (1246), and a path length adjuster (1299). The transform lens assembly (1244) collimates and directs the laser beams (1220A) (1220B) to spatially overlap at a focal plane of the transform lens assembly (1244). The path length adjuster (1299) is positioned in a path of the first laser beams (1220A), the path length adjuster (1299) being adjustable to adjust of a path length the first laser beams (1220A) relative to the second laser beams (1220B).
A laser assembly (10) for generating a pulsed output beam (16) includes a quantum cascade device (12); and a laser driver (14A) that controls the voltage to the quantum cascade device (12) in a pulsed drive profile (950) to generate the pulsed output beam (16). The pulsed drive profile (950) includes a plurality of spaced on-time segments (952) in which the laser driver (14A) directs voltage to the quantum cascade device (12), and at least one off-time segment (954) in which the laser driver (14A) pulls down the voltage from the quantum cascade device (12). The off-time segment (954) occurs between two on-time segments (952).
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A method for identifying one or more analytes (12A)(12B)(12C) includes (i) directing a solvent (18) into a test cell (22); (ii) directing a first laser probe beam (26) at the solvent (18) in the test cell (22); (iii) acquiring a solvent intensity spectrum of the solvent (18); (iv) directing a sample (12) that includes one or more analytes (12A)(12B)(12C) and the solvent (18) into the flow cell (22); (v) directing a second laser probe beam (26) at the sample (12) in the test cell (22); (vi) acquiring a sample intensity spectrum of the sample (12); (vii) calculating a solvent referenced transmittance spectrum that details a solvent reference transmittance as a function of wavelength using the solvent intensity spectrum and the sample intensity spectrum; and (viii) identifying one or more analytes (12A)(12B)(12C) in the sample (12) using the solvent referenced transmittance spectrum.
G01N 21/3577 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
09 - Scientific and electric apparatus and instruments
10 - Medical apparatus and instruments
Goods & Services
Laser based products for use in a variety of applications, namely, lasers, not for medical purposes, being instruments used in molecular detection and imaging of gases, detection of drugs, chemicals, explosives, and volatile organic compounds; Lasers for material modification; Lasers for scientific research; Lasers for ellipsometry, metrology, surface analysis; Lasers for signaling, identification, and emergency rescue; Lasers for remote sensing and standoff detection; Flow cytometers and flow-based analyzers providing cell and particle analysis, detection, and counting for scientific, laboratory, and general research uses; Spectral analyzer and imaging apparatus and instruments for use in the study of proteins and peptides in drug development; Laser diodes; Laser equipment for non-medical purposes; Laser pointers; Laser pointing device for use with firearms; Lasers for industrial use; Lasers, not for medical purposes; Liquid analyzers; Liquid chromatography apparatus for laboratory use; Microscopes and parts thereof that operate in the infrared range; Scientific apparatus and instruments, namely, fluid handling devices used for disposable bioprocessing applications and parts and fittings therefor; Scientific apparatus, namely, spectrometers and parts and fittings therefor; Scientific instrumentation for detection, identification, quantification of chemicals in water; Scientific instrumentation for measuring chemical compositions of liquids, gases and solids, and chemical concentrations of liquids, gases and solids not for medical use; Scientific instruments, namely, electronic analyzers for testing and analyzing chemical and biological substances for the presence, absence, or quantity of target chemicals, biologics, pharmaceutical ingredients, pharmaceutical by-products, pharmaceutical precursors, and disease bio-markers, not for medical use; Scientific instruments, namely, electronic analyzers for testing consumer products for the presence of contaminants; Optics for microscopes that operate in the infrared range being structural parts of infrared microscopes, namely, refractive elements, diffractive elements, phase retarders, fractional waveplates, phase randomizers, polarizers, polarization rotators, beam splitters, beam combiners, detectors, detector arrays, imaging sensors, imaging optics, micro lenses, micro-lens arrays; Thermal imaging systems, not for medical use; Infrared imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks Laser-based products for use in a variety of commercial and government applications, namely, lasers for medical use being instruments used in medical diagnostics for molecular detection and imaging; Flow cytometers and flow-based analyzers providing cell and particle analysis, detection, and counting for medical, clinical, medical diagnostic, and therapeutic uses; Lasers for medical purposes; Medical imaging apparatus
44.
Light source assembly with multiple, disparate light sources
A light source assembly for use by a user includes a housing assembly and a moving beam light source. The moving beam light source is positioned substantially within the housing assembly. The moving beam light source generates a source output beam that is directed away from the housing assembly at an angle relative to a rotation axis as a moving output beam while being rotated about the rotation axis. The moving beam light source is a non-visible light source that generates the source output beam having a center wavelength that is outside a visible light spectrum.
F21V 14/02 - Controlling the distribution of the light emitted by adjustment of elements by movement of light sources
F21V 14/00 - Controlling the distribution of the light emitted by adjustment of elements
F21W 111/10 - Use or application of lighting devices or systems for signalling, marking or indicating, not provided for in groups for personal use, e.g. hand-held
45.
Low-noise spectroscopic imaging system using substantially coherent illumination
A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.
A chromatography analyzer system (10) for analyzing a sample (12) includes a MIR analyzer (34) for spectrally analyzing a sample fraction (12A) while the sample fraction (12A) is flowing in the MIR analyzer (34). The MIR analyzer (34) includes (i) a MIR flow cell (35C) that receives the flowing sample fraction (12A), (ii) a MIR laser source (35A) that directs a MIR beam (35B) in a MIR wavelength range at the sample fraction (12A) in the MIR flow cell (35C), and (iii) a MIR detector (35D) that receives light from the sample fraction (12A) in the MIR flow cell (35C) and generates MIR data of the sample fraction (12A) for a portion of the MIR wavelength range.
The present invention is directed to an ultra-compact dual quantum cascade laser assembly that nearly doubles the strength of a traditional laser in a in a single hermetically sealed micropackage. The device may comprise two quantum cascade lasers that meet at a combiner to create a single laser with a higher strength than traditional lasers. The current invention provides a path to an ultra-compact coherent beam combing arrangement that uses both dichroic beam combining and polarization beam combining techniques.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A laser assembly (10) for generating an assembly output beam (12) includes a laser subassembly (16) that emits a plurality of spaced apart laser beams (20), a beam adjuster (42), a transform lens (44A), a beam combiner (46), and an output coupler (48). The beam adjuster (42) adjusts the spacing between the plurality of laser beams (20). The transform lens (44A) focuses the laser beams (20) at a focal plane (54) and the beam combiner (46) is positioned at the focal plane (54). The beam combiner (46) combines the lasers beams (20) to provide a combination beam (58). Further, the output coupler (48) redirects at least a portion of the combination beam (58) back to the beam combiner (46) as a redirected beam (60), and transmits a portion of the combination beam (58) as the assembly output beam (12).
A semiconductor laser tuned with an acousto-optic modulator. The acousto-optic modulator may generate standing waves or traveling waves. When traveling waves are used, a second acousto-optic modulator may be used in a reverse orientation to cancel out a chirp created in the first acousto-optic modulator. The acousto-optic modulator may be used with standing-wave laser resonators or ring lasers.
H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
H01S 5/0625 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/10 - Construction or shape of the optical resonator
50.
Laser power adjustment during tuning to compensate for detector response and varying background absorption
An assembly (14) for analyzing a sample (15) includes a detector assembly (18); a tunable laser assembly (10); and (iii) a laser controller (10F). The detector assembly (18) has a linear response range (232) with an upper bound (232A) and a lower bound (232B). The tunable laser assembly (10) is tunable over a tunable range, and includes a gain medium (10B) that generates an illumination beam (12) that is directed at the detector assembly (18). The laser controller (10F) dynamically adjusts a laser drive to the gain medium (10B) so that the illumination beam (12) has a substantially constant optical power at the detector assembly (18) while the tunable laser assembly (10) is tuned over at least a portion of the tunable range.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
09 - Scientific and electric apparatus and instruments
Goods & Services
Flow cytometers and flow-based analyzers providing cell and particle analysis, detection, or counting for scientific, laboratory, and general research uses; Imaging apparatus and instruments for use in the study of proteins and peptides in drug development; Liquid analyzers; Liquid chromatography apparatus for laboratory use; Scientific apparatus and instruments, namely, fluid handling device used for disposable bioprocessing applications and parts and fittings therefor; Scientific instrumentation for measuring concentrations of chemicals in water; Scientific instrumentation for measuring chemical compositions of liquids, and chemical concentrations of liquids; Scientific instruments, namely, electronic analyzers for testing and analyzing chemical and biological substances for the presence, absence, or quantity of target chemicals, biologics, pharmaceutical ingredients, pharmaceutical by-products, and pharmaceutical precursors.; Scientific instruments, namely, electronic analyzers for testing consumer products for the presence of contaminants
A flow cell assembly (16) for a fluid analyzer (14) that analyzes a sample (12) includes (i) a base (350) that includes a base window (350B); (ii) a cap (352) having a cap window (352B) that is spaced apart from the base window (350B); and (iii) a gasket (360) that is secured to and positioned between the base (350) and the cap (352), the gasket (360) having a gasket body (360A) that includes a gasket opening (360B). The gasket body (360A), the base (350) and the cap (352) cooperate to define a flow cell chamber (362). Moreover, an inlet passageway (366) extends into the flow cell chamber (362) to direct the sample (12) into the flow cell chamber (362); and an outlet passageway (368) extends into the flow cell chamber (362) to allow the sample (12) to exit the flow cell chamber (362).
G01N 21/3577 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
53.
Infrared imaging microscope using tunable laser radiation
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follows a beam path (16B) from the sample (10) to the image sensor (28). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), and controls the image sensor (28) to capture the data. Further, during the data acquisition time (346), an effective optical path segment (45) of the beam path (16B) is modulated.
A semiconductor laser tuned with an acousto-optic modulator. The acousto-optic modulator may generate standing waves or traveling waves. When traveling waves are used, a second acousto-optic modulator may be used in a reverse orientation to cancel out a chirp created in the first acousto-optic modulator. The acousto-optic modulator may be used with standing-wave laser resonators or ring lasers.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
56.
MODULATING SPECTROSCOPIC IMAGING SYSTEM USING SUBSTANTIALLY COHERENT ILLUMINATION
A spectral imaging device (12) for generating an image (13A) of a sample (10) includes (i) an image sensor (30); (ii) a tunable light source (14) that generates an illumination beam (16) that is directed at the sample (10); (iii) an optical assembly (22) that collects light from the sample (10) and forms an image of the sample (1 0) on the image sensor (30); and (iv) a control system (32) that controls the tunable light source (14) and the image sensor (30). During a time segment, the control system (32) (i) controls the tunable light source (14) so that the illumination beam (16) has a center wavenumber that is modulated through a first target wavenumber with a first modulation rate; and (ii) controls the image sensor (30) to capture at least one first image at a first frame rate. Further, the first modulation rate is equal to or greater than the first frame rate.
A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.
An imaging and capture micro-dissection microscope (12) for spectrally analyzing a sample (10) and isolating a region of interest (210) in the sample (10) includes (i) a stage (26A) that retains the sample (10); (ii) an analysis laser assembly (14) that generates a coherent interrogation beam (16A) that is directed at the sample (10), the interrogation beam (16A) having a center wavelength that is in the infrared region; (iii) an image sensor (24A) that receives light from the sample (10), the image sensor (24A) capturing image information that is used to identify the region of interest (210) in the sample (10); (iv) a separation assembly (18) that separates the region of interest (210) from the sample (10) while the sample (10) is retained by the stage (26A); and (v) a capturing assembly (20) that captures the region of interest (210).
A spectral imaging device (12) for generating an image (13A) of a sample (10) includes (i) an image sensor (30); (ii) a tunable light source (14) that generates an illumination beam (16) that is directed at the sample (10); (iii) an optical assembly (22) that collects light from the sample (10) and forms an image of the sample (10) on the image sensor (30); and (iv) a control system (32) that controls the tunable light source (14) and the image sensor (30). During a time segment, the control system (32) (i) controls the tunable light source (14) so that the illumination beam (16) has a center wavenumber that is modulated through a first target wavenumber with a first modulation rate; and (ii) controls the image sensor (30) to capture at least one first image at a first frame rate. Further, the first modulation rate is equal to or greater than the first frame rate.
A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.
G02B 9/60 - Optical objectives characterised both by the number of the components and their arrangements according to their sign, i.e. + or – having five components only
A light source assembly includes a housing assembly and at least two sets of disparate light sources that are coupled to the housing assembly. The sets of disparate light sources include a first plurality of disparate light sources; and a second plurality of disparate light sources. Each plurality of disparate light sources includes a first light source that generates a first light beam having a first center wavelength and a second light source that generates a second light beam having a second center wavelength that is different than the first center wavelength. The first plurality of disparate light sources generates a first output beam that is directed along a first central beam axis. The second plurality of disparate light sources generates a second output beam that is directed along a second central beam axis that is spaced apart from the first central beam axis by at least approximately sixty degrees.
F21V 31/00 - Gas-tight or water-tight arrangements
F21V 23/00 - Arrangement of electric circuit elements in or on lighting devices
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A laser source (340) that generates an output beam (354) that is directed along a beam axis (354A) that is coaxial with a first axis and orthogonal to a second axis comprises a first frame (356), a laser (358), and a first mounting assembly (360). The laser (358) generates the output beam (354) that is directed along the beam axis (354A). The first mounting assembly (360) couples the laser (358) to the first frame (356). The first mounting assembly (360) allows the laser (358) to expand and contract relative to the first frame (356) along the first axis and along the second axis, while maintaining alignment of the output beam (354) so the beam axis (354A) is substantially coaxial with the first axis. The first mounting assembly (360) can include a first fastener assembly (366) that couples the laser (358) to the first frame (356), and a first alignment assembly (368) that maintains alignment of the laser (358) along a first alignment axis (370) that is substantially parallel to the first axis.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
F41H 13/00 - Means of attack or defence not otherwise provided for
Spectrally analyzing an unknown sample (10A) for the existence of a characteristic includes (i) analyzing a first known sample (10C) having the characteristic and a second known sample (10D) not having the characteristic to identify less than fifty diagnostic spectral features, each diagnostic spectral feature being present at a different diagnostic wavelength in a mid-infrared spectral region; (ii) directing a plurality of interrogation beams (16) at the unknown sample (10A), each of the interrogation beams (16) having a different interrogation wavelength, and each interrogation wavelength corresponding to a different one of the diagnostic wavelengths; (iii) acquiring a plurality of separate output images (245) of the unknown sample (10A), wherein each of the output images (245) is acquired while the unknown sample is illuminated by a different one of the interrogation beams (16); and (iv) analyzing less than fifty output images (245) with a control system (28) to determine whether the characteristic is present in the unknown sample (10A).
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
An imaging microscope for spectrally analyzing a sample includes (i) a laser source that generates an interrogation beam; (ii) an attenuated total reflection assembly that includes an ATR crystal and a sample holder that holds the sample in intimate contact with the ATR crystal; (iii) an objective lens assembly that collects a reflected beam and focuses the reflected beam; and (iv) a two dimensional image sensor that receives the focused, reflected beam and captures two dimensional image information that is used to generate an image of the sample, the image sensor being operable in the mid-infrared range.
A laser assembly for generating an output beam includes a first module assembly, a second module assembly, and a module fastener assembly. The second module assembly is selectively movable relative to the first module assembly to selectively adjust a cavity length, and a pivot axis of a grating in the laser. Further, an arm assembly that retains the grating can be adjusted to adjust the cavity length, and to adjust the plane of the grating face. Moreover, the grating is movable relative to the arm assembly to align the grating.
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/082 - Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
H01S 3/139 - Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/10 - Construction or shape of the optical resonator
66.
Low-noise spectroscopic imaging system using substantially coherent illumination
A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/343 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser
H01S 5/30 - Structure or shape of the active regionMaterials used for the active region
H01S 5/10 - Construction or shape of the optical resonator
A laser assembly for generating an output beam includes a first module assembly, a second module assembly, and a module fastener assembly. The second module assembly is selectively movable relative to the first module assembly to selectively adjust a cavity length, and a pivot axis of a grating in the laser. Further, an arm assembly that retains the grating can be adjusted to adjust the cavity length, and to adjust the plane of the grating face. Moreover, the grating is movable relative to the arm assembly to align the grating.
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/082 - Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
H01S 3/139 - Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity
A spectral imaging device (12) includes an image sensor (28), an illumination source (14), a refractive, optical element (24A), a mover assembly (24C) (29), and a control system (30). The image sensor (28) acquires data to construct a two-dimensional spectral image (13A) during a data acquisition time (346). The illumination source (14) generates an illumination beam (16) that illuminates the sample (10) to create a modified beam (16I) that follow a beam path (16B) from the sample (10) to the image sensor (28). The refractive, optical element (24A) is spaced apart a separation distance (42) from the sample (10) along the beam path (16B). During the data acquisition time (346), the control system (30) controls the illumination source (14) to generate the illumination beam (16), controls the mover assembly (29) (24C) to modulate the separation distance (42), and controls the image sensor (28) to capture the data.
G02B 21/16 - Microscopes adapted for ultraviolet illumination
G02B 21/36 - Microscopes arranged for photographic purposes or projection purposes
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
72.
System and method for rapid thermal data acquisition
An assembly (12) for rapid thermal data acquisition of a sample (10) includes a laser source (14), a light sensing device (26), and a control system (28). The laser source (14) emits a laser beam (16) that is directed at the sample (10), the laser beam (16) including a plurality of pulses (233). The light sensing device (26) senses mid-infrared light from the sample (10), the light sensing device (26) including a pixel array (348). The control system (28) controls the light sensing device (26) to capture a plurality of sequential readouts (402) from the pixel array (348) with a substantially steady periodic readout acquisition rate 405. The control system (28) can generate a spectral cube (13) using information from the readouts (402).
G01J 5/20 - Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
G01J 3/18 - Generating the spectrumMonochromators using diffraction elements, e.g. grating
A body monitor (12) for monitoring a condition of a living being (10) includes (i) a monitor housing (28) that is positioned adjacent to the living being (10); (ii) a first laser source (240) that directs a first output beam (240A) at the living being (10) to generate first photoacoustic waves; (iii) a second laser source (242) that directs a second output beam (242A) at the living being (10) to generate second photoacoustic waves; and (iv) a photoacoustic detector (16) secured to the monitor housing (28). The photoacoustic detector (16) detects the first photoacoustic waves and the second photoacoustic waves to monitor the condition of the living being (10). The output beams (240A) (240B) have a different center wavelength and can be in the mid-infrared range.
A61B 5/145 - Measuring characteristics of blood in vivo, e.g. gas concentration or pH-value
G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.
G02B 9/60 - Optical objectives characterised both by the number of the components and their arrangements according to their sign, i.e. + or – having five components only
Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (1 6) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (16) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.
G01N 21/3563 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solidsPreparation of samples therefor
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
A spectral imaging device (12) includes an image sensor (28), a tunable light source (14), an optical assembly (17), and a control system (30). The optical assembly (17) includes a first refractive element (24A) and a second refractive element (24B) that are spaced apart from one another by a first separation distance. The refractive elements (24A) (24B) have an element optical thickness and a Fourier space component of the optical frequency dependent transmittance function. Further, the element optical thickness of each refractive element (24A) (24B) and the first separation distance are set such that the Fourier space components of the optical frequency dependent transmittance function of each refractive element (24A) (24B) fall outside a Fourier space measurement passband.
A light source assembly includes a housing assembly, a plurality of disparate light sources that are coupled to the housing assembly, a power source, a control system and a selector assembly. Each of the light sources generates an output beam that is directed away from the housing assembly, wherein each of the output beams has a center wavelength that is in a different wavelength range than each of the other output beams. The power source provides electrical power to each of the light sources. The control system selectively controls the electrical power that is provided by the power source to the light sources. The selector assembly is electrically connected to the control system, and is selectively controllable to selectively direct current to each of the light sources to generate the desired output beams.
F21L 4/02 - Electric lighting devices with self-contained electric batteries or cells characterised by provision of two or more light sources
F21V 23/00 - Arrangement of electric circuit elements in or on lighting devices
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
An improved quantum cascade laser, the improvement comprising a longitudinally non-uniform dielectric waveguide. The waveguide includes a longitudinally straight section and a longitudinally tapered section. The length of the tapered section is between 5% and 50% of the total cavity length. The tapered section tapers at a taper angle from the facet width to the ridge width. The taper angle is smaller than the delineation angle of the waveguide.
H01S 5/20 - Structure or shape of the semiconductor body to guide the optical wave
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/24 - Structure or shape of the semiconductor body to guide the optical wave having a grooved structure, e.g. V-grooved
H01S 5/30 - Structure or shape of the active regionMaterials used for the active region
81.
Control system for directing power to a laser assembly
An assembly (10) for providing an assembly output beam comprises a laser assembly (12), a power source (14), and a system controller (16). The power source (14) is electrically coupled to the laser assembly (12). The system controller (16) directs power from the power source (14) to the laser assembly (12). Additionally, the system controller (16) includes a capacitor assembly (22) that is electrically connected to the laser assembly (12), and a current source (20) that directs power from the power source (14) to the capacitor assembly (22) and the laser assembly (12). The power source (14) and the capacitor assembly (22) cooperate to provide power to the laser assembly (12). Further, the capacitor assembly (22) provides pulses of power and the current source (20) directs the pulses of power to the laser assembly (12). Moreover, the current source (20) charges the capacitor assembly (22) in between the pulses of power.
H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
H01S 3/13 - Stabilisation of laser output parameters, e.g. frequency or amplitude
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
F41G 1/35 - Night sights, e.g. luminescent combined with light source, e.g. spot light for illuminating the target
A laser source (10) for emitting an output beam (12) along an output axis (12A) includes (i) a first laser module (16) that generates a first beam (16A); (ii) a second laser module (18) that generates a second beam (18A); (iii) a beam selector assembly (32); (iv) a first director assembly (24) that directs the first beam (16A) at the beam selector assembly (32); (v) a second director assembly (26) that directs the second beam (18A) at the beam selector assembly (32); and (vii) a control system (34) that directs power to the modules (16), (18). The beam selector assembly (32) moves between a first position in which the first beam (16A) is directed along the output axis (12A), and a second position in which the second beam (18A) is directed along the output axis (12A).
H01S 3/13 - Stabilisation of laser output parameters, e.g. frequency or amplitude
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
H01S 5/062 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
A mid-infrared objective lens assembly (10) includes a plurality of spaced apart, refractive lens elements (20) that operate in the mid-infrared spectral range, the plurality of lens elements (20) including an aplanatic first lens element (26) that is closest to an object (14) to be observed. The first lens element (26) has a forward surface (36) that faces the object (14) and a rearward surface (38) that faces away from the object (14). The forward surface (36) can have a radius of curvature that is negative.
A highly portable, high-powered infrared laser source is produced by intermittent operation of a quantum cascade laser power regulated to a predetermined operating range that permits passive cooling. The regulation process may boost battery voltage allowing the use of a more compact, low-voltage batteries.
A laser source (340) comprises a first frame (356), a laser (358), and a first mounting assembly (360). The laser (358) generates an output beam (354) that is directed along a beam axis (354A). The first mounting assembly (360) allows the laser (358) to expand and contract relative to the first frame (356) along a first axis and along a second axis that is orthogonal to the beam axis, while maintaining alignment of the output beam (354) so the beam axis (354A) is substantially coaxial with the first axis. The first mounting assembly (360) can include a first fastener assembly (366) that couples the laser (358) to the first frame (356), and a first alignment assembly (368) that maintains alignment of the laser (358) along a first alignment axis (370) that is substantially parallel to the first axis.
G01S 7/495 - Counter-measures or counter-counter-measures
F41H 11/02 - Anti-aircraft or anti-guided missile defence installations or systems
G01S 7/481 - Constructional features, e.g. arrangements of optical elements
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
H01S 5/02 - Structural details or components not essential to laser action
A laser assembly (10) that generates a beam (12) includes (i) a gain medium (22) that generates the beam (12) when electrical power is directed to the gain medium (22); (ii) a grating (32) positioned in a path of the beam (12); (iii) a grating arm (34) that retains the grating (32); and (iv) a mover assembly (36) that moves the grating arm (34) about a pivot axis (38). The mover assembly (36) includes a coarse mover (344) that makes large scale movements to the grating arm (34), and a fine mover (352) that makes fine movements to the grating arm (34). With this design, the mover assembly (36) can quickly and accurately move the grating (32) over a relatively large range.
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
87.
Infrared imaging microscope using tunable laser radiation
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
A laser source assembly for providing an assembly output beam includes a first MIR laser source, a second MIR laser source, and a beam combiner. The first MIR laser source emits a first MIR beam that is in the MIR range and the second MIR laser source emits a second MIR beam that is in the MIR range. Further, the beam combiner spatially combines the first MIR beam and the second MIR beam to provide the assembly output beam. With this design, a plurality MIR laser sources can be packaged in a portable, common module, each of the MIR laser sources generates a narrow linewidth, accurately settable MIR beam, and the MIR beams are combined to create a multiple watt assembly output beam having the desired power.
H01S 3/23 - Arrangement of two or more lasers not provided for in groups , e.g. tandem arrangement of separate active media
H01S 5/062 - Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
89.
Multi-wavelength high output laser source assembly with precision output beam
A laser source assembly (210) for generating an assembly output beam (212) includes a first laser source (218A), a second laser source (218B), and a dispersive beam combiner (222). The first laser source (218A) emits a first beam (220A) having a first center wavelength, and the second laser source (218B) emits a second beam (220B) having a second center wavelength that is different than the first center wavelength. The dispersive beam combiner (222) includes a common area 224 that combines the first beam (220A) and the second beam (220B) to provide the assembly output beam (212). The first beam (220A) impinges on the common area (224) at a first beam angle (226A), and the second beam (220B) impinges on the common area (224) at a second beam angle (226B) that is different than the first beam angle (226A). Further, the beams (220A) (220B) that exit from the dispersive beam combiner (222) are substantially coaxial, are fully overlapping, and are co-propagating.
An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.
An optical fiber switch (16) for alternatively redirecting an input beam (14) comprises a redirector (18) and a redirector mover (20). The redirector (18) is positioned in the path of the input beam (14) along a directed axis (344A). The redirector (18) redirects the input beam (14) so that a redirected beam (46) alternatively launches from the redirector (18) (i) along a first redirected axis (354) that is spaced apart from the directed axis (344A) when the redirector (18) is positioned at a first position (348), and (ii) along a second redirected axis (356) that is spaced apart from the directed axis (344A) when the redirector (18) is positioned at a second position (350) that is different from the first position (348). The redirector mover (20) moves the redirector (18) about a movement axis (366) between the first position (348) and the second position (350). The redirector mover (20) includes a stator component (320A) and a rotor component (320B) that moves relative to the stator component (320A). The input beam (14) is directed along the directed axis (344A) substantially between the stator component (32A) and the redirector (18) prior to the input beam (14) being redirected by the redirector (18).
A laser source assembly (10) comprises a laser system (228), a mounting base (226), and a temperature control system (229). The mounting base (226) supports the laser system (228). The mounting base (226) includes a side wall (232) having a side top (232T) and a side bottom (232B), and a base floor (234) that extends away from the side wall (232) between the side top (232T) and the side bottom (232B). The temperature control system (229) controls the temperature of the laser system (228) and/or the mounting base (226). The temperature control system (229) includes a heat transferor (246) positioned substantially adjacent to an outer surface (2320) of the side wall (232). Heat generated by the laser system (228) is transferred away from the base floor (234) and through the side wall (232) to the heat transferor (246).
H01S 5/34 - Structure or shape of the active regionMaterials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
B82Y 20/00 - Nanooptics, e.g. quantum optics or photonic crystals
An optical switch (16) for alternatively redirecting a source beam (14) includes a director assembly (18) that is selectively moveable between (i) a first switch position (350), (ii) a second switch position (352), and (iii) a dual switch position (354). In the first switch position (350), the source beam (14) passes to a first port (36). In the second switch position (352), the source beam (14) is directed to a second port (38). In the dual switch position (354), the director assembly (18) splits the source beam (14) into a first beam part (314A) that is directed to the first port (36), and a second beam part (314B) that is directed to the second port (38).
A highly portable, high-powered infrared laser source is produced by intermittent operation of a quantum cascade laser power regulated to a predetermined operating range that permits passive cooling. The regulation process may boost battery voltage allowing the use of a more compact, low-voltage batteries.
A system and method for standoff detection of explosives, CWAs and TICs using optical techniques. Preliminary analysis indicates detection of TNT at a distance of 0.5 km with a signal-to-noise ratio exceeding 10,000. The optical/thermal techniques apparently permit unambiguous detection of the target molecules even the presence of commonly encountered interferents. The technique, named Remote Optothermal Sensor (ROSE), has the potential for standoff detection at distances greater than one (1) kilometer.
A laser source assembly for providing an assembly output beam includes a first emitter, a second emitter, and a third emitter. The first emitter emits a first beam along a first beam axis that is substantially parallel to and spaced apart from an assembly axis. The second emitter emits a second beam along a second beam axis that is substantially parallel to and spaced apart from the assembly axis. The third emitter emits a third beam along a third beam axis that is substantially parallel to and spaced apart from the assembly axis. The first beam axis, the second beam axis and the third beam axis are positioned spaced apart about and substantially equidistant from the assembly axis.
An external cavity laser assembly (10) that generates a light beam (12) includes a gain medium (14) and a diffraction grating (24). The gain medium (14) has a growth direction (14C), a fast axis (14A), a first facet (34A), and a second facet (34B) that is spaced apart from the first facet (34A). The gain medium (14) emits from both facets (34A) (34B). Further, a beam polarization (30) of the light beam (32) emitting from the second facet (34B) is perpendicular to the growth direction (14C) and the fast axis (14A). The grating (24) includes a plurality of grating ridges (24A) that are oriented parallel to the beam polarization (30). Moreover, each of the grating ridges (24A) can have a substantially rectangular shaped cross-sectional profile.
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
An optical fiber switch (16) for alternatively redirecting an input beam (14) comprises a redirector (18) and a redirector mover (20). The redirector (18) redirects the input beam (14) so that a redirected beam (46) alternatively launches from the redirector (18) (i) along a first redirected axis (354) that is spaced apart from a directed axis (344A) when the redirector (18) is positioned at a first position (348), and (ii) along a second redirected axis (356) that is spaced apart from the directed axis (344A) when the redirector (18) is positioned at a second position (350) that is different from the first position (348). The redirector mover (20) moves the redirector (18) about a movement axis (366) between the first position (348) and the second position (350).
1-yAs. The first active region barrier has a thickness of less than fourteen angstroms, and the second active region barrier has a thickness of less than eleven angstroms. The lower active region wavefunction overlaps with each of the injector level wavefunctions. Also, the laser transition is vertical at a bias close to roll-over. The injector level 3′ is above a lower laser level 3, the injector level 2′ is below the lower laser level 3, and the active region level 2 is confined to the active region. The lower laser level 3 is separated from the active region level 2 by the energy of the LO phonon. The remaining active region states and the remaining injector states are either above the lower laser level 3 or significantly below the active region level 2.
A laser source assembly (210) for generating an assembly output beam (212) includes a first laser source (218A), a second laser source (218B), and a dispersive beam combiner (222). The first laser source (218A) emits a first beam (220A) having a first center wavelength, and the second laser source (218B) emits a second beam (220B) having a second center wavelength that is different than the first center wavelength. The dispersive beam combiner (222) includes a common area 224 that combines the first beam (220A) and the second beam (220B) to provide the assembly output beam (212). The first beam (220A) impinges on the common area (224) at a first beam angle (226A), and the second beam (220B) impinges on the common area (224) at a second beam angle (226B) that is different than the first beam angle (226A). Further, the beams (220A) (220B) that exit from the dispersive beam combiner (222) are substantially coaxial, are fully overlapping, and are co- propagating.
