Advanced Testing Technologies, Inc.

United States of America

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IPC Class
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer 6
G06F 9/44 - Arrangements for executing specific programs 6
G01R 1/04 - HousingsSupporting membersArrangements of terminals 5
G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences 5
G06F 9/45 - Compilation or interpretation of high level programme languages 3
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NICE Class
09 - Scientific and electric apparatus and instruments 10
42 - Scientific, technological and industrial services, research and design 4
35 - Advertising and business services 3
37 - Construction and mining; installation and repair services 3
41 - Education, entertainment, sporting and cultural services 2

1.

Automated waveform analysis methods using a parallel automated development system

      
Application Number 15784257
Grant Number 10598722
Status In Force
Filing Date 2017-10-16
First Publication Date 2020-03-24
Grant Date 2020-03-24
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Mckenna, Jim
  • Leippe, William Harold
  • Biagiotti, William
  • Engel, Richard

Abstract

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
  • G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences
  • G01R 1/04 - HousingsSupporting membersArrangements of terminals

2.

Automated waveform analysis methods using a parallel automated development system

      
Application Number 15821964
Grant Number 10151791
Status In Force
Filing Date 2017-11-24
First Publication Date 2018-12-11
Grant Date 2018-12-11
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Mckenna, Jim
  • Leippe, William Harold
  • Biagiotti, William
  • Engel, Richard

Abstract

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
  • G01R 1/04 - HousingsSupporting membersArrangements of terminals
  • G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences

3.

Video processor with digital video signal processing capabilities

      
Application Number 15837742
Grant Number 10097818
Status In Force
Filing Date 2017-12-11
First Publication Date 2018-10-09
Grant Date 2018-10-09
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli

Abstract

R (red-difference chroma) data along with clock/sync information which can be used for re-display. Optional support of HDMI, DVI and analog formats, such as composite video, raster video and stroke video, allows a single instrument to generate, acquire and process virtually all known video interfaces, using standard or custom image/formats.

IPC Classes  ?

  • H04N 17/02 - Diagnosis, testing or measuring for television systems or their details for colour television signals
  • H04N 5/46 - Receiver circuitry for receiving on more than one standard at will
  • H04N 9/64 - Circuits for processing colour signals
  • H04N 17/00 - Diagnosis, testing or measuring for television systems or their details
  • H04N 21/2343 - Processing of video elementary streams, e.g. splicing of video streams or manipulating encoded video stream scene graphs involving reformatting operations of video signals for distribution or compliance with end-user requests or end-user device requirements

4.

Multi-standard instrumentation chassis

      
Application Number 15259994
Grant Number 09961787
Status In Force
Filing Date 2016-09-08
First Publication Date 2018-05-01
Grant Date 2018-05-01
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Engel, Richard
  • Levi, Eli
  • Spinner, Robert
  • Leddy, Thomas

Abstract

Chassis for an automated test system including a housing and at least a first and a second backplane in the housing. The first backplane provides electrical connections for at least one functional module of a first type when engaged with the first backplane, while the second backplane provides electrical connections for at least one functional module of a second type different than the first type when engaged with the second backplane. The first and second backplanes include electrical circuitry to enable signals to be provided for the functional modules when engaged therewith. A bottom of the housing includes ducts to enable cooling of both types of functional modules when engaged with the housing.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
  • H05K 5/00 - Casings, cabinets or drawers for electric apparatus
  • H01R 13/73 - Means for mounting coupling parts to apparatus or structures, e.g. to a wall
  • H05K 7/14 - Mounting supporting structure in casing or on frame or rack

5.

PADSOFT

      
Serial Number 87868642
Status Registered
Filing Date 2018-04-09
Registration Date 2019-05-07
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Computer software for managing automated test systems

6.

VID-SOFT

      
Serial Number 87868137
Status Registered
Filing Date 2018-04-09
Registration Date 2019-05-28
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Computer software for generating and capturing video, determining characteristics of captured video, enabling viewing of captured video, enabling development of software for processing, testing and validating video, testing and validating video processing equipment, video formats and video image content

7.

Automated waveform analysis using a parallel automated development system

      
Application Number 15619752
Grant Number 09864003
Status In Force
Filing Date 2017-06-12
First Publication Date 2018-01-09
Grant Date 2018-01-09
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Mckenna, Jim
  • Leippe, William Harold
  • Biagiotti, William
  • Engel, Richard

Abstract

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
  • G01R 1/04 - HousingsSupporting membersArrangements of terminals
  • G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences

8.

Automated waveform analysis using a parallel automated development system

      
Application Number 15422610
Grant Number 09739827
Status In Force
Filing Date 2017-02-02
First Publication Date 2017-08-22
Grant Date 2017-08-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Mckenna, Jim
  • Leippe, William Harold
  • Biagiotti, William
  • Engel, Richard

Abstract

A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
  • G01R 1/04 - HousingsSupporting membersArrangements of terminals
  • G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences

9.

Application for automatically generating graphical flowcharts based on configurable means

      
Application Number 13677635
Grant Number 09519463
Status In Force
Filing Date 2012-11-15
First Publication Date 2016-12-13
Grant Date 2016-12-13
Owner Advanced Testing Technologies Inc. (USA)
Inventor
  • Leippe, William Harold
  • Biagiotti, William

Abstract

Flowchart generation method and tool is provided with an easy-to-use graphical user interface. The graphical user interface of the tool enables a user to select a programming language which the test program was written in, and a test station which the test program was developed for. Upon these selections, a parser will point to the configuration files appropriate for the selected language and test station. The configuration files contain rules and definitions of the chosen programming language and test station, so that the parsing of the test program language can begin. Utilizing the data created from the parsing process, the tool points to other configuration files, referred to as a flowcharting configuration file, that each contain information on how to present the parsed data in a flow chart.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs

10.

Multi-standard instrumentation chassis

      
Application Number 14695106
Grant Number 09488673
Status In Force
Filing Date 2015-04-24
First Publication Date 2016-11-08
Grant Date 2016-11-08
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Engel, Richard
  • Levi, Eli
  • Spinner, Robert
  • Leddy, Thomas

Abstract

Chassis for an automated test system including a housing and at least a first and a second backplane in the housing. The first backplane provides electrical connections for at least one functional module of a first type when engaged with the first backplane, while the second backplane provides electrical connections for at least one functional module of a second type different than the first type when engaged with the second backplane. The first and second backplanes include electrical circuitry to enable signals to be provided for the functional modules when engaged therewith. A bottom of the housing includes ducts to enable cooling of both types of functional modules when engaged with the housing.

IPC Classes  ?

  • G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
  • G01R 1/04 - HousingsSupporting membersArrangements of terminals
  • H01R 43/00 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

11.

Instrumentation chassis within a module

      
Application Number 14936415
Grant Number 09480184
Status In Force
Filing Date 2015-11-09
First Publication Date 2016-10-25
Grant Date 2016-10-25
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Engel, Richard
  • Spinner, Robert
  • Levi, Eli

Abstract

A module that incorporates a chassis for enabling use of at least one smaller functional module in at least one slot of a chassis designed to mate with a larger functional module having a different standard than the smaller functional module. The module has a housing having electrical connections adapted to mate with electrical connections provided by the chassis for the larger functional module and dimensions that fit within at least one slot provided by the chassis for housing the larger functional module. The module includes at least one set of electrical connections adapted to mate with the electrical connections of the smaller functional module(s) and at least one air passage for conveying air from an opening of the chassis that provides air flow to cool the larger functional module to an area in which the smaller functional module(s) is/are situated when mated with the housing.

IPC Classes  ?

  • H05K 7/20 - Modifications to facilitate cooling, ventilating, or heating
  • H05K 5/00 - Casings, cabinets or drawers for electric apparatus

12.

Test system and method for testing electromechanical components

      
Application Number 13888540
Grant Number 09291677
Status In Force
Filing Date 2013-05-07
First Publication Date 2016-03-22
Grant Date 2016-03-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Korpi, Emery
  • Levi, Eli
  • Britch, Peter F

Abstract

Method and system that produce requisite drive signals to fully exercise and test electromechanical elements of a liquid rocket stage including solenoid valve drives, DC motor drives and actuator drive signals. The electrical driver tester includes a signal processor, power driver circuits, and A/D and D/A circuits to monitor and control the drive circuitry. Drive current is monitored and a signal proportional to the current is produced for the purpose of analyzing current profiles as part of the test regimen for the device under test. Actuator speed and positioning are controlled in real time with a tailored lead lag control algorithm implemented with digital signal processor hardware.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring
  • G01R 31/34 - Testing dynamo-electric machines

13.

Common chassis for instrumentation

      
Application Number 14487851
Grant Number 09295169
Status In Force
Filing Date 2014-09-16
First Publication Date 2016-03-22
Grant Date 2016-03-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Engel, Richard

Abstract

Arrangement in an automated test system to connect to a plurality of functional modules of different forms including a common chassis defining a plurality of identical connectors and a backplane associated with the chassis and providing electrical connections for functional modules when engaged with the connectors. A set of adapters is provided including a first adapter having a coupling at an attachment end and a module receiving end configured to mate with one or more functional modules each having a first form, and a second adapter having a coupling at an attachment end and a module receiving end configured to mate with one or more functional modules each having a second form different than the first form. The couplings of the adapters are the same such that the adapters are freely insertable via their attachment ends into engagement with any of the connectors.

IPC Classes  ?

  • H01H 31/02 - Air-break switches for high tension without arc-extinguishing or arc-preventing means Details
  • H05K 5/00 - Casings, cabinets or drawers for electric apparatus

14.

PHASE NOISE SIMULATION MODEL FOR PULSE DOPPLER RADAR TARGET DETECTION

      
Application Number US2015040182
Publication Number 2016/022255
Status In Force
Filing Date 2015-07-13
Publication Date 2016-02-11
Owner ADVANCED TESTING TECHNOLOGIES, INC. (USA)
Inventor
  • Minassian, Shahen
  • Baker, John, L.
  • Levi, Eli

Abstract

Method for generating a model (70) of the effect of phase noise during use of a Doppler radar system (72) includes calculating, using a processing unit (76), an initial signal-to-clutter ratio (SCR) representing a ratio of power received from echoes from a target by the radar system to power resulting from received clutter reflection. The model (70) is displayed on a display (78) associated with the processing unit 76 to enable a radar operator to view it and understand limitations of the radar system (72). A Doppler frequency of interest is calculated based on velocity of a target, target heading, radar frequency, a Doppler filter bandwidth, frequency components and a measure of clutter signal passing through the Doppler filter of interest by summing products of the phase noise for each frequency by the Doppler filter bandwidth. This measure indicates effectiveness of target detection by the Doppler radar system (72) as a function of distance.

IPC Classes  ?

  • G01S 13/00 - Systems using the reflection or reradiation of radio waves, e.g. radar systemsAnalogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified

15.

Phase noise simulation model for pulse doppler radar target detection

      
Application Number 14796797
Grant Number 10025890
Status In Force
Filing Date 2015-07-10
First Publication Date 2016-01-14
Grant Date 2018-07-17
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Minassian, Shahen
  • Baker, John L
  • Levi, Eli

Abstract

Method for generating a model of the effect of phase noise during use of a Doppler radar system including calculating, using a processor, an initial signal-to-clutter ratio (SCR) representing a ratio of power received from echoes from a target by the radar system to power resulting from clutter reflection received by the radar system. The initially calculated SCR is modified as a function of a range ambiguity and range resolution. A Doppler frequency of interest is calculated based on velocity of a target, target heading and radar frequency, along with a Doppler filter bandwidth, frequency components and a measure of clutter signal passing through the Doppler filter of interest by summing products of the phase noise for each frequency by the Doppler filter bandwidth. This measure indicates effectiveness of target detection by the Doppler radar system as a function of distance.

IPC Classes  ?

  • G06F 7/60 - Methods or arrangements for performing computations using a digital non-denominational number representation, i.e. number representation without radixComputing devices using combinations of denominational and non-denominational quantity representations
  • G06F 17/10 - Complex mathematical operations
  • G06F 17/50 - Computer-aided design
  • G01S 7/40 - Means for monitoring or calibrating
  • G01S 13/524 - Discriminating between fixed and moving objects or between objects moving at different speeds using transmissions of interrupted pulse modulated waves based upon the phase or frequency shift resulting from movement of objects, with reference to the transmitted signals, e.g. coherent MTi

16.

Techniques for capturing and generating a DVI signal

      
Application Number 14040788
Grant Number 08817109
Status In Force
Filing Date 2013-09-30
First Publication Date 2014-08-26
Grant Date 2014-08-26
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Biagiotti, William
  • Levi, Eli
  • Britch, Peter F
  • Howell, David

Abstract

Method and modular system for generating and capturing DVI video signals. When generating a video signal, data blocks are arranged in a line parameter memory, each corresponding to a complete video line and containing pointers to specific entries for lines of the video signal in a primary image memory holding a main bit-mapped image, and a video line construct memory holding data enable and blanking patterns. Generation of the video signal is initiated by reading the line parameter memory and extracting pointers from the data blocks for a first line of the video signal being generated. Bits from the primary image and video line construct memories are obtained and combined based on extracted pointers to generate the first line of the video signal. A length of the first line of video signal is monitored to determine when it is complete, and then the process continues for each additional line.

IPC Classes  ?

  • H04N 17/00 - Diagnosis, testing or measuring for television systems or their details

17.

Instrument card for video applications

      
Application Number 14047053
Grant Number 08817110
Status In Force
Filing Date 2013-10-07
First Publication Date 2014-08-26
Grant Date 2014-08-26
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Biagiotti, William
  • Britch, Peter F
  • Howell, David

Abstract

Video processing arrangement including a host computer, a video asset coupled to the computer for generating video signals, and an interface for connecting the video asset to the computer to enable the display of the video signals on a monitor. The video asset includes primary elements such as a primary composite video module that produces different types of a primary video signal and outputs the primary video signal, and a secondary video source module that produces a secondary composite video signal and outputs the secondary composite video signal. The primary composite video module includes a memory component including a user-programmable sequence of bits representative of a video signal and user-programmable signal generators synchronized to the primary video signal output of the primary composite video module. The memory component includes four user specified pulse memories which each hold a series of arbitrary bit line patterns.

IPC Classes  ?

  • H04N 17/00 - Diagnosis, testing or measuring for television systems or their details
  • H04N 17/02 - Diagnosis, testing or measuring for television systems or their details for colour television signals

18.

Method and system for validating video waveforms and other electrical signals

      
Application Number 13238588
Grant Number 08788228
Status In Force
Filing Date 2011-09-21
First Publication Date 2014-07-22
Grant Date 2014-07-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Biagiotti, William
  • Levi, Eli
  • Leippe, William Harold

Abstract

Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source. The method creates a golden template from a known, good instance of the waveform under test and algorithmically applies it to other waveforms under test to determine compliance. In the application to video waveforms, timing parameters, deflection parameters and image content parameters are simultaneously tested resulting in efficient concrete and tangible results. Instead of providing the known, good instance of the waveform under test to a processor that implements the method, descriptive parameters of the known, good instance of the waveform may be provided to the processor that calculates data points of the expected video waveforms and then determines rules for the waveform based on the calculated data points.

IPC Classes  ?

  • G01R 13/00 - Arrangements for displaying electric variables or waveforms

19.

Method, program and arrangement for highlighting failing elements of a visual image

      
Application Number 14027477
Grant Number 08782558
Status In Force
Filing Date 2013-09-16
First Publication Date 2014-07-15
Grant Date 2014-07-15
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Biagiotti, William
  • Levi, Eli

Abstract

Method, system and computer program for visually highlighting identified failing or erroneous pixel elements of a two-dimensional electronic image. Different visual highlighting techniques are stored in memory. A user selects one of the highlighting techniques using a user interface. A processor applies the selected technique(s) to the image and displays the image on a display with visual indications of the failing pixel elements. The techniques include coloring the pixels with a boundary box enclosing all of the erroneous pixels, enclosing separate irregular-shaped groupings of the pixels with a contour-type boundary line, and coloring pixels and enclosing each within a separate box. In the final technique, video lines with some failing pixels, but within allowable tolerances, will have those pixels colored differently and each pixel is enclosed within the same color box. In all cases, it is possible to convert the test image to black and white for display.

IPC Classes  ?

  • G06F 3/048 - Interaction techniques based on graphical user interfaces [GUI]

20.

Method and system for validating video waveforms and other electrical signals

      
Application Number 13934502
Grant Number 08655617
Status In Force
Filing Date 2013-07-03
First Publication Date 2014-02-18
Grant Date 2014-02-18
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Biagiotti, William
  • Levi, Eli
  • Leippe, William Harold

Abstract

Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source. The method creates a golden template from a known, good instance of the waveform under test and algorithmically applies it to other waveforms under test to determine compliance. In the application to video waveforms, timing parameters, deflection parameters and image content parameters are simultaneously tested resulting in efficient concrete and tangible results. Instead of providing the known, good instance of the waveform under test to a processor that implements the method, descriptive parameters of the known, good instance of the waveform may be provided to the processor that calculates data points of the expected video waveforms and then determines rules for the waveform based on the calculated data points.

IPC Classes  ?

  • G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R 13/00 - Arrangements for displaying electric variables or waveforms

21.

Digital functional test system

      
Application Number 12781888
Grant Number 08359504
Status In Force
Filing Date 2010-05-18
First Publication Date 2013-01-22
Grant Date 2013-01-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Pogosky, Marc
  • Engel, Richard
  • Levi, Eli

Abstract

A digital functional test system incorporating both digital stimulus and digital response/compare capability for digital electronic circuitry. The system includes a chassis and a single width VME eXtensions for Instrumentation (VXI) module arranged in or on the chassis. The single width VXI module includes a timing sub-module that generates a stimulus clock signal and a response clock signal, eight pattern sub-modules, and a master oscillator sub-module that provides a clock signal. Each pattern sub-module receives the stimulus and response clock signals, and the clock signal from the master oscillator sub-module, and includes a pattern generating module, a stimulus memory component that stores stimulus data outgoing from the pattern generating module, a response memory component that records response data incoming to the pattern generating module, and a compare reference memory component that provides a reference for a compare function of the recorded response data in the response memory component.

IPC Classes  ?

  • G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer

22.

Instrumentation ATS/TPS mitigation utilizing I/O data stream

      
Application Number 11938991
Grant Number 08359585
Status In Force
Filing Date 2007-11-13
First Publication Date 2013-01-22
Grant Date 2013-01-22
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Spinner, Robert
  • Leippe, William Harold
  • Mckenna, James
  • Fox, Timothy

Abstract

Methods and systems for obsolescence mitigation of electronic systems including hardware and software components, in particular methods and systems for managing obsolete instrument hardware and application software used in legacy Automated Test Systems (ATS) or Automatic Test Equipment (ATE). When one or more components of a test program set (TPS) has been rendered obsolete, migration to one or more replacement instruments without any impact to the TPS or other remaining legacy instruments in the ATE or ATS is obtained by a translator module interposed between the new instrument and the system bus for translating instructions for the obsolete instrument or set of instruments into instructions or procedures for the new instrument whereby the new instrument thus functions in the same manner as the obsolete instrument or set of instruments.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs
  • G06F 9/45 - Compilation or interpretation of high level programme languages

23.

Integrated development environment for the development of electronic signal testing strategies

      
Application Number 13237304
Grant Number 08356282
Status In Force
Filing Date 2011-09-20
First Publication Date 2013-01-15
Grant Date 2013-01-15
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Leippe, William Harold
  • Biagiotti, William
  • Levi, Eli
  • Spinner, Robert

Abstract

Integrated application of specific CASE tools that allow a user to accomplish instrument programming and control when generating, capturing and/or analyzing electronic signals, and in doing so automatically generate automation code to replicate a desired instrument setup, acquisition, analysis and sequence control. The CASE tools include, but are not limited to, GUI instrument programming tools, an electronic signal redisplay tool, a waveform analyzer tool, automated code generation tools, macro generation tools, macro and sequence playback tools, a test creation tool, a test sequencer tool, a decision engine that may be part of the test sequencer tool, and test result data logger. A method for analyzing electronic signals that enables multiple tests to be performed after a single signal acquisition, and enables results from the multiple tests to be analyzed is also disclosed.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs

24.

RE-CONFIGURABLE ELECTRICAL CONNECTORS

      
Application Number US2012027064
Publication Number 2012/118877
Status In Force
Filing Date 2012-02-29
Publication Date 2012-09-07
Owner ADVANCED TESTING TECHNOLOGIES, INC. (USA)
Inventor Leddy, Thomas

Abstract

Re-configurable electrical connector (10) including a pair of endcaps (12), a pair of elongate rails (14), each removably attached at one end to one of the endcaps (12), and connector modules (16) arranged between the endcaps (12) and including one or more male or female connecting members (18) adapted to electrically connect at a first end (32) to one electrical component or part thereof and at a second, opposite end (34) to another electrical component or part thereof (24). The connecting members (18) include a bend (18C) between the first and second ends such that a plane (P1 ) in which the first end (32) of the connecting member (18) is situated is not parallel to a plane (P2) in which the second end (34) of the connecting member (18) is situated. (FIG. 2)

IPC Classes  ?

  • H01R 13/514 - BasesCases formed as a modular block or assembly, i.e. composed of co-operating parts provided with contact members or holding contact members between them

25.

Re-configurable electrical connectors

      
Application Number 13037457
Grant Number 08469723
Status In Force
Filing Date 2011-03-01
First Publication Date 2012-09-06
Grant Date 2013-06-25
Owner Advanced Testing Technologies, Inc. (USA)
Inventor Leddy, Thomas

Abstract

Re-configurable electrical connector including a pair of endcaps, a pair of elongate rails, each removably attached at one end to one of the endcaps, and connector modules arranged between the endcaps and including one or more male or female connecting members adapted to electrically connect at a first end to one electrical component or part thereof and at a second, opposite end to another electrical component or part thereof. Each connector module includes connecting members adapted to electrically connect at a first end to a first electrical component or part thereof and at a second, opposite end to a second electrical component or part thereof, and a bend between the first and second ends such that a plane in which the first end of the connecting member is situated is not parallel to a plane in which the second end of the connecting member is situated.

IPC Classes  ?

  • H01R 12/00 - Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocksCoupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structuresTerminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
  • H05K 1/00 - Printed circuits

26.

Phase noise measurement system and method

      
Application Number 13236869
Grant Number 08248297
Status In Force
Filing Date 2011-09-20
First Publication Date 2012-08-21
Grant Date 2012-08-21
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Baker, John
  • Levi, Eli

Abstract

System that measures absolute or additive phase noise includes a power divider for dividing an input RF signal, a local oscillator, two mixers, each arranged in a path of a respective signal component from the power divider and receiving input from the power divider and local oscillator, two digital radio frequency memories, each associated with a respective mixer and receiving an input signal therefrom, and a digital signal processor that receives signals from the digital radio frequency memories and outputs a digital data stream indicative of measured phase noise. For absolute phase noise measurement, phase noise of the input RF signal is provided. For additive phase noise measurement, a unit under test is arranged in one of the paths between the power divider and the mixer. The system may be interposed between a radar transmitter of a radar environment simulator and a radar receiver coupled to a radar target display.

IPC Classes  ?

  • G01S 13/00 - Systems using the reflection or reradiation of radio waves, e.g. radar systemsAnalogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
  • G01S 7/40 - Means for monitoring or calibrating

27.

Electro-mechanical system simulator arrangement and method

      
Application Number 12099874
Grant Number 08249845
Status In Force
Filing Date 2008-04-09
First Publication Date 2012-08-21
Grant Date 2012-08-21
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Britch, Peter F.
  • Korpi, Emery

Abstract

Arrangement and method for simulating electro-mechanical systems includes a simulator for simulating an operating environment of a plurality of different electro-mechanical systems, a first interface unit for enabling the simulator to interface with a host computer and input/output devices, and a second interface unit for enabling the simulator to be reprogrammed and re-configured to enable simulation of the operating environment of the different electro-mechanical systems. The simulator may include a user-programmable field programmable gate array and a digital signal processing unit coupled to the field programmable gate array.

IPC Classes  ?

28.

Test program set obsolescence mitigation through software and automatic test equipment processes

      
Application Number 13303960
Grant Number 08484618
Status In Force
Filing Date 2011-11-23
First Publication Date 2012-03-22
Grant Date 2013-07-09
Owner Advanced Testing Technologies, Inc. (USA)
Inventor Spinner, Robert

Abstract

Electronic test system including hardware and software components and method of use which provide obsolescence mitigation. A test program set (TPS) including a test program test is created to enable units to be tested. When a new component is introduced, the change is detected and a new TPS is created with at least part of the test program test. If the new TPS complies with defined, governing rules for the system, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs
  • G06F 9/45 - Compilation or interpretation of high level programme languages

29.

LOW PHASE NOISE RF SIGNAL GENERATING SYSTEM AND METHOD FOR CALIBRATING PHASE NOISE MEASUREMENT SYSTEMS USING SAME

      
Application Number US2011021231
Publication Number 2011/088278
Status In Force
Filing Date 2011-01-14
Publication Date 2011-07-21
Owner ADVANCED TESTING TECHNOLOGIES, INC. (USA)
Inventor
  • Minassian, Shahen
  • Levi, Eli

Abstract

Very low phase noise radio frequency (RF) source having multiple discrete frequency outputs used, for example, to calibrate phase noise measurement systems, and that includes a main oscillator (12), a multiplier chain (14) receiving an output signal therefrom and includes a multiplier that multiplies the signal frequency by an integer multiplication factor, and a frequency mixer (16). The multiplier chain (14) provides an output signal to an LO input of the frequency mixer (16). A first, multi-pole switch (18) is coupled to a plurality of additional oscillators (20n) and an IF input of the frequency mixer (16) and generates an output signal derived from a signal from at least one additional oscillator (20n), and a control unit (38) selects additional oscillators (20n) and a frequency thereof to enable variation of a range and number of output frequencies at an RF output of the frequency mixer (16).

IPC Classes  ?

  • G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences

30.

MITIGATOR

      
Serial Number 77837788
Status Registered
Filing Date 2009-09-29
Registration Date 2012-01-03
Owner Advanced Testing Technologies Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Computer software and hardware for computer systems performance continuity; computer software and hardware that enables continued use of computer systems after replacement of one or more obsolete software and/or hardware components thereof

31.

TPS OBSOLESCENCE MITIGATION

      
Serial Number 77837782
Status Registered
Filing Date 2009-09-29
Registration Date 2010-07-20
Owner Advanced Testing Technologies Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Computer software and hardware for computer systems performance continuity; computer software and hardware that enables continued use of computer systems after replacement of one or more obsolete software and/or hardware components thereof

32.

TEST PROGRAM OBSOLESCENCE MITIGATION

      
Serial Number 77837790
Status Registered
Filing Date 2009-09-29
Registration Date 2010-07-20
Owner Advanced Testing Technologies Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Computer software and hardware for computer systems performance continuity; computer software and hardware that enables continued use of computer systems after replacement of one or more obsolete software and/or hardware components thereof

33.

VIDEO SELECTION DISPLAY UNIT FOR MULTIPLE DEVICES

      
Application Number US2009001214
Publication Number 2009/110977
Status In Force
Filing Date 2009-02-26
Publication Date 2009-09-11
Owner ADVANCED TESTING TECHNOLOGIES, INC. (USA)
Inventor
  • Spinner, Robert
  • Engel, Richard
  • Leippe, William, Harold

Abstract

Video selection display unit (18) that is capable of routing real-time output signals having a video component from different video signal sources, e.g., different instruments (10a,..., 10n) or home entertainment devices, to a single output for display on a monitor or other type of video display (14). The video selection display unit (18) may be part of an automatic test system or home entertainment system. Control of the video selection display unit (18) can be effected locally via a user interface, such as one or more pushbuttons, and/or remotely over a network which may be the same network used for communication with the instruments or devices or using an infrared remote control unit.

IPC Classes  ?

34.

Video selection display unit for multiple devices

      
Application Number 12043183
Grant Number 08300153
Status In Force
Filing Date 2008-03-06
First Publication Date 2009-09-10
Grant Date 2012-10-30
Owner Advanced Testing Technologies, Inc. (USA)
Inventor
  • Engel, Richard
  • Spinner, Robert
  • Leippe, William Harold

Abstract

Video selection display unit that is capable of routing real-time output signals having a video component from different video signal sources, e.g., different instruments or home entertainment devices, to a single output for display on a monitor or other type of video display. The video selection display unit may be part of an automatic test system or home entertainment system. Control of the video selection display unit can be effected locally via a user interface, such as one or more pushbuttons, and/or remotely over a network which may be the same network used for communication with the instruments or devices or using an infrared remote control unit.

IPC Classes  ?

  • H04N 5/44 - Receiver circuitry
  • G06F 11/00 - Error detectionError correctionMonitoring
  • G01R 19/00 - Arrangements for measuring currents or voltages or for indicating presence or sign thereof
  • G01R 21/00 - Arrangements for measuring electric power or power factor
  • G01R 23/00 - Arrangements for measuring frequenciesArrangements for analysing frequency spectra
  • G01R 11/32 - Watt-hour meters

35.

Method and system for simulating test instruments and instrument functions

      
Application Number 11514717
Grant Number 08131529
Status In Force
Filing Date 2006-09-01
First Publication Date 2007-03-01
Grant Date 2012-03-06
Owner Advanced Testing Technologies Inc. (USA)
Inventor
  • Spinner, Robert
  • Levi, Eli
  • Leippe, William Harold
  • Korpi, Emery
  • Lai, Michael
  • Kuveikis, James
  • Chalmers, Richard E.
  • Engel, Richard
  • Britch, Peter F.
  • Biagiotti, William
  • Howell, David

Abstract

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs
  • G06F 13/10 - Program control for peripheral devices
  • G06F 13/12 - Program control for peripheral devices using hardware independent of the central processor, e.g. channel or peripheral processor

36.

Test program set obsolescence mitigation through software and automatic test equipment system processes

      
Application Number 11330702
Grant Number 07624379
Status In Force
Filing Date 2006-01-12
First Publication Date 2006-07-13
Grant Date 2009-11-24
Owner Advanced Testing Technologies, Inc. (USA)
Inventor Spinner, Robert

Abstract

Electronic test system including hardware and software components and method of use of same which provide obsolescence mitigation. A set of governing rules for the system is defined and a test program test (TPS) is created to enable units to be tested. When a new component is introduced into the system, the change is detected and a new TPS is created. If the new TPS complies with the rules, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of the removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.

IPC Classes  ?

  • G06F 9/44 - Arrangements for executing specific programs
  • G06F 9/45 - Compilation or interpretation of high level programme languages

37.

SINGLE SOURCE SOLUTION

      
Serial Number 76638783
Status Registered
Filing Date 2005-05-17
Registration Date 2006-05-02
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ? 42 - Scientific, technological and industrial services, research and design

Goods & Services

testing avionics systems including testing avionics systems in order to ensure proper use, operation or maintenance, testing a single avionics system or multiple avionics systems over a plurality of stages or levels, across different platforms and/or for varying degrees of fault isolation, and testing multiple and different avionics systems over a single stage or level, across a single platform and/or for a single degree of fault isolation

38.

BRAT

      
Serial Number 76532878
Status Registered
Filing Date 2003-07-15
Registration Date 2004-05-04
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

integrated turnkey hardware and software systems comprised of a computer, monitor, printer, multimeter, counter-timer, digitizing oscilloscope, function and arbitrary/sweep generators, multiplexer, switches, synthesizers and programmable power supplies, for testing electronic systems, subsystems, modules and printed circuit boards

39.

MCBRAT

      
Serial Number 78191911
Status Registered
Filing Date 2002-12-06
Registration Date 2003-11-04
Owner Advanced Testing Technologies Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Munitions capable integrated turnkey hardware and software systems comprised of a computer, monitor, multimeter, counter-timer, waveform generator, function generator, multiplexer, communications interface, switches, programmable loads, digitizer, programmable filters, solid-state switches, solid-state high current drivers, relay drivers, amplifiers, and environmental controls for testing air-launched weapons

40.

BRATNET

      
Serial Number 76212299
Status Registered
Filing Date 2001-02-20
Registration Date 2004-01-27
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ?
  • 35 - Advertising and business services
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Database management of data about integrated turnkey hardware and software systems via a global communication network; database management of data obtained from testing of airplanes and avionic equipment by integrated turnkey hardware and software systems via a global communication network;inventory management in the field of airplane components, anionic equipment and integrated turnkey hardware and software systems via a global communication network; providing data processing services in the area of integrated turnkey hardware and software systems and data relating to airplanes and avionic equipment; Providing data processing services in the area of mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes Retrieving, processing and disseminating information from integrated turnkey hardware and software systems about mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes via a global communication network; providing information, informational documents and administrative information and reports in regard to functioning status and maintenance of airplanes and non-computerized avionic equipment via a global communication network for use in repair and maintenance of airplanes and non-computerized avionic equipment; providing information, informational documents and administrative information and reports in regard to mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes via a global communication network; analysis and gathering of data in the area of mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes obtained by integrated turnkey hardware and software systems via a global communication network; providing a library of technical support documents for integrated turnkey hardware and software systems and mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes accessible via a global communication network; testing and analysis of mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes by integrated hardware and software systems via a global communication network; providing information in the field of integrated turnkey hardware and software systems, mechanical systems and other non-computerized systems for purposes of maintenance, repair and proper operation of airplanes over computer networks and global communication networks Diagnosing integrated turnkey hardware and software systems via a global communication network; retrieving, processing and disseminating information from integrated turnkey hardware and software systems about computerized airplane and avionic equipment tested by the integrated turnkey hardware and software systems via a global communication network; providing information, informational documents and administrative information and reports in regard to integrated turnkey hardware and software systems via a global communication network; providing information, informational documents and administrative information and reports in regard to computerized airplane and avionic equipment and systems tested by integrated turnkey hardware and software systems via a global communication network; analysis and gathering of data in the area of integrated hardware and software systems used to test airplanes and avionic equipment and of systems configuration and support data obtained by integrated turnkey hardware and software systems used to test airplanes and avionic equipment via a global communication network; providing information of updated guidelines on how to use integrated turnkey hardware and software systems via a global communication network; scheduling and verifying installation of updates for integrated turnkey hardware and software systems via a global communication network; installation maintenance and up-dating of computer software for use in integrated turnkey hardware and software systems via a global communication network; technical support services for integrated hardware and software systems via a global computer network, namely, troubleshooting of computer hardware and software problems and providing back-up computer programs and facilities;technical support services, namely monitoring of network systems, namely, software for integrated turnkey hardware and software systems via a global communication network providing a library of technical support documents for integrated turnkey hardware and software systems and computerized airplane and avionic equipment and systems tested by integrated turnkey hardware and software systems accessible via a global communication network; testing and analysis of integrated turnkey hardware and software systems via a global communication network; testing and analysis of computerized airplane and avionic equipment and systems by integrated turnkey hardware and software systems via a global communication network; providing information in the field of integrated turnkey hardware and software systems, computerized airplane and avionic equipment and systems over computer networks and global communication networks

41.

BRAT

      
Application Number 000599126
Status Registered
Filing Date 1997-07-25
Registration Date 1999-03-17
Owner ADVANCED TESTING TECHNOLOGIES, INC. (USA)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Integrated turnkey automatic test systems consisting of hardware and software elements comprising one or more of the following: computer, monitor, printer, software drivers, software algorithms, graphical interfaces, digitizing oscilloscope, multiplexer, multimeter, waveform generator, counter/timer, digital word generator, spectrum analyzer, radio frequency synthesizer, microwave synthesizer and radio frequency interface unit.

42.

ATTI

      
Serial Number 75297500
Status Registered
Filing Date 1997-05-23
Registration Date 1999-12-28
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 35 - Advertising and business services
  • 37 - Construction and mining; installation and repair services
  • 41 - Education, entertainment, sporting and cultural services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

electrical and scientific apparatus, namely, automatic test equipment for testing analog, digital and RF (radio frequency) signals in avionic systems equipment and for use in connection with avionic mechanical fixtures and components; test programs sets in the nature of computer hardware which interface avionic subsystems, subassemblies and components to automatic test equipment to automatically test such avionic subsystems, subassemblies and components and software software to operate automatic test equipment to isolate faults and failures in avionic subsystems, subassemblies and components; interface test adaptors and fixtures, namely, electrical devices used with automatic test equipment which interface avionic subsystems, subassemblies and components to such automatic test equipment; electrical and fiber optic cable assemblies; wave guide assemblies of hollow tubing within which electromagnetic waves are propagated on a solid dielectric or dielectric-filled conductor; electrical harnesses and printed circuit card assemblies; computer software for use in the operation of automatic test equipment for testing avionic equipment, for data processing, graphics and video generation and processing in connection with automatic test equipment for testing avionic equipment, and for isolating faults and failures of avionic subsystems, subassemblies and components and user manuals sold as a unit therewith Business management services and consultation related thereto featuring integrated logistics management, acquisition management for competitive programs, computerized database management, document management, management of maintenance manuals, management and evaluation of tests of mechanical and electrical equipment, primarily in the avionics field; data administration and management for others, namely, data processing services maintenance of computer hardware, namely, maintenance of automatic test equipment in the avionics field Educational services, namely, providing computer-based training, video tape training, seminars and workshops in the fields of word processing, operation and maintenance of information systems, operation and maintenance of electronic equipment in the avionics field, operation and maintenance of automatic testing equipment in the avionics field, operation and maintenance of test program sets in the nature of computer hardware which interface with avionic subsystems, subassemblies, components and automatic test equipment used therewith design and testing of new products for others and consultation related thereto; design and maintenance of computer software for others and consultation related thereto; engineering services and consultation related thereto

43.

ATTI

      
Serial Number 75297501
Status Registered
Filing Date 1997-05-23
Registration Date 1999-12-28
Owner Advanced Testing Technologies, Inc. ()
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 35 - Advertising and business services
  • 37 - Construction and mining; installation and repair services
  • 41 - Education, entertainment, sporting and cultural services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

electrical and scientific apparatus, namely, automatic test equipment for testing analog, digital and RF (radio frequency) signals in avionic systems equipment and for use in connection with avionic mechanical fixtures and components; test programs sets in the nature of computer hardware which interface avionic subsystems, subassemblies and components to automatic test equipment to automatically test such avionic subsystems, subassemblies and components and software to operate automatic test equipment to isolate faults and failures in avionic subsystems, subassemblies and components; interface test adaptors and fixtures, namely, electrical devices used with automatic test equipment which interface avionic subsystems, subassemblies and components to such automatic test equipment; electrical and fiber optic cable assemblies; wave guide assemblies of hollow tubing within which electromagnetic waves are propagated on a solid dielectric or dielectric-filled conductor; electrical harnesses and printed circuit card assemblies; computer software for use in the operation of automatic test equipment for testing avionic equipment, for data processing, graphics and video generation and processing in connection with automatic test equipment for testing avionic equipment, and for isolating faults and failures in avionic subsystems, subassemblies and components and user manuals sold as a unit therewith Business management services and consultation related thereto featuring integrated logistics management, acquisition management for competitive programs, computerized database management, document management, management of maintenance manuals, management and evaluation of tests of mechanical and electrical equipment, primarily in the avionics field; data administration and management for others, namely, data processing services maintenance of computer hardware, namely, maintenance of automatic test equipment in the avionics field Educational services, namely, providing computer-based training, video tape training, seminars and workshops in the fields of word processing, operation and maintenance of information systems, operation and maintenance of electronic equipment in the avionics field, operation and maintenance of automatic testing equipment in the avionics field, operation and maintenance of test program sets in the nature of computer hardware which interface with avionic subsystems, subassemblies, components and automatic test equipment used therewith design and testing of new products for others and consultation related thereto; design and maintenance of computer software for others and consultation related thereto; engineering services and consultation related thereto