JENTEK Sensors, Inc.

United States of America

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Date
2025 July 3
2025 May 1
2025 (YTD) 5
2024 3
2023 5
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IPC Class
G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents 33
G01N 27/9013 - Arrangements for scanning 13
G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables 10
G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors 9
G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws 8
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Status
Pending 6
Registered / In Force 55

1.

HOLE INSPECTION SCANNER SYSTEM AND METHOD OF USE

      
Application Number US2024055271
Publication Number 2025/151187
Status In Force
Filing Date 2024-11-08
Publication Date 2025-07-17
Owner JENTEK SENSORS INC. (USA)
Inventor
  • Chaplan, Stuart
  • Goldfine, Neil
  • Windoloski, Mark
  • Washabaugh, Andrew
  • Jordao, Rodrigo
  • Mckeeman, John
  • Dunford, Todd
  • Nelms, Jared

Abstract

A system and method are provided for a scanner for controlling a removable element such as a sensor mandrel cartridge. The scanner has a housing. A first motor is secured within the housing for actuating circumferential motion for the mandrel. A second motor within the housing for actuating axial motion for the element. The scanner also includes a geartrain and shafts, the later for maintaining alignment of the geartrain. The housing provides structural support for the shafts and in turn the geartrain. The scanner may have a first encoder to record a circumferential position of the sensor mandrel and a second encoder to record an axial position of the sensor mandrel.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/9093 - Arrangements for supporting the sensorCombinations of eddy-current sensors and auxiliary arrangements for marking or for rejecting
  • G01D 11/24 - Housings
  • G01D 11/30 - Supports specially adapted for an instrumentSupports specially adapted for a set of instruments
  • G01N 21/88 - Investigating the presence of flaws, defects or contamination
  • F16B 19/02 - Bolts or sleeves for positioning of machine parts, e.g. notched taper pins, fitting pins, sleeves, eccentric positioning rings
  • F16B 35/04 - Screw-boltsStay boltsScrew-threaded studsScrewsSet screws with specially-shaped head or shaft in order to fix the bolt on or in an object
  • G01N 29/275 - Arrangements for orientation or scanning by moving both the sensor and the material

2.

In-Process Quality Assessment for Additive Manufacturing

      
Application Number 19081248
Status Pending
Filing Date 2025-03-17
First Publication Date 2025-07-10
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M

Abstract

Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
  • B22F 10/30 - Process control
  • B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
  • B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
  • B22F 12/49 - Scanners
  • B22F 12/90 - Means for process control, e.g. cameras or sensors
  • B33Y 10/00 - Processes of additive manufacturing
  • B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
  • B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

3.

REMOTE CURRENT SENSE

      
Application Number 18850599
Status Pending
Filing Date 2023-03-28
First Publication Date 2025-07-03
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd
  • Washabaugh, Andrew

Abstract

An eddy current sensor with a remote current sense has a drive conductor, current sense conductor, and one or more sense conductors. The drive conductor has first and second loop portions, the current sense conductor has a third loop portion, and the sense conductor has a sense loop portion. The first and third loop portions are proximal to each other to form the remote current sense. The sense loop portion and the second loop portion are proximal to each other to form a sense element. The remote current sense and sense element are suitably distant from one another to have separate environments of sensitivity. The sensor may be used by collecting transimpedance measurements from both the remote current sense and sense element under known conditions, and with the sense element under unknown conditions. These measurements are combined to provide a calibrated measurement result suitable for further analysis.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

4.

HOLE INSPECTION SYSTEM AND METHOD

      
Application Number US2024055269
Publication Number 2025/102007
Status In Force
Filing Date 2024-11-08
Publication Date 2025-05-15
Owner JENTEK SENSORS INC. (USA)
Inventor
  • Goldfine, Neil
  • Dunford, Todd
  • Windoloski, Mark
  • Chaplan, Stuart
  • Washabaugh, Andrew
  • Jordao, Rodrigo
  • Mckeeman, John
  • Simon, Taylor

Abstract

A system and method are provided for inspecting challenging material locations such as holes. The system may comprise an impedance instrument, scanner and sensor cartridge. The instrument provides electronics for measuring an array of sense elements in the sensor cartridge as well as software to control the data collection process and analyze the results. The instrument is connected to a scanner for controlling the mechanical position of the sensor during data collection. An external flex-cable may provide power and data transmission between the instrument and the scanner and sensor cartridge. An internal flex-cable within the scanner permits a compact design. The sensor cartridge can be plugged into the scanner to allow the instrument and scanner to control the position and movement of the sensor and to utilize the sensor for data collection. Methods for inspecting holes and other test objects using the system are also disclosed.

IPC Classes  ?

  • G01N 27/02 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
  • G01M 5/00 - Investigating the elasticity of structures, e.g. deflection of bridges or aircraft wings
  • G01M 11/08 - Testing mechanical properties
  • G01N 27/10 - Investigation or analysis specially adapted for controlling or monitoring operations or for signalling
  • G01N 27/66 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

5.

SYSTEM AND METHOD FOR HOLE INSPECTION

      
Application Number 18801913
Status Pending
Filing Date 2024-08-13
First Publication Date 2025-02-06
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd
  • Goldfine, Neil
  • Chaplan, Stuart

Abstract

A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.

IPC Classes  ?

  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 33/09 - Magneto-resistive devices

6.

SENSOR AND SCANNING SYSTEM AND METHOD FOR RISERS AND OTHER TEST OBJECTS

      
Application Number US2024033312
Publication Number 2024/254616
Status In Force
Filing Date 2024-06-10
Publication Date 2024-12-12
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil
  • Dunford, Todd

Abstract

A system is provided for inspecting risers and other test objects. The system may include two or more sensors and mounting arcs for holding the sensors in an arced shape. To obtain full circumferential coverage some sensors may be offset axially relative to others. In some embodiments two or more sensors have the same axial position but are shifted circumferentially so that different portions of the riser can be inspected by each sensor. The arcs and sensors may be held by a scanner with wheels for moving the scanner along the riser. Some or all of the wheels may have a suspension to provide flexibility in the structure if the surface of the object has variations such as localized changes in surface radius. A flexible version does not require rigid arcs allowing the radii of sensor curvature to change during scanning. An instrument may be provided to perform sensor measurements.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • G01N 29/265 - Arrangements for orientation or scanning by moving the sensor relative to a stationary material
  • E21B 17/01 - Risers
  • E21B 47/10 - Locating fluid leaks, intrusions or movements
  • E21B 47/007 - Measuring stresses in a pipe string or casing
  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01N 29/26 - Arrangements for orientation or scanning
  • E21B 47/001 - Survey of boreholes or wells for underwater installations

7.

Scanning System and Method for Axial Symmetric Test Objects

      
Application Number 18661553
Status Pending
Filing Date 2024-05-10
First Publication Date 2024-11-14
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd M
  • Goldfine, Neil J.
  • Nelms, Jared
  • Helseth, Matthew

Abstract

Axially symmetric objects may require scanning for reasons such as quality inspection, remaining life prediction, and flaw detection. Scanning systems and methods are provided for test objects that may be substantially symmetric about an axis. The scanning system may have curved supports to provide mechanical support to the test object during scanning. The curved support may reduce bending of the test object during scanning and prevent permanent deformation that may otherwise occur during the scanning process. A sensor system may be mounted (at least in part) to a mounting rail such that a sensor may move axially along the rail during a scanning process. Measurement data may be collected and analyzed to assist in determining the disposition of the test object.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01B 7/02 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width, or thickness
  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • G01N 27/9093 - Arrangements for supporting the sensorCombinations of eddy-current sensors and auxiliary arrangements for marking or for rejecting

8.

Measurement system and method of use

      
Application Number 18535509
Grant Number 12359945
Status In Force
Filing Date 2023-12-11
First Publication Date 2024-08-01
Grant Date 2025-07-15
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M
  • Denenberg, Scott A
  • Dixon, Kevin P
  • Sheiretov, Yanko K
  • Bahranifard, Saber
  • Chaplan, Stuart D
  • Windoloski, Mark

Abstract

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

IPC Classes  ?

  • G01D 11/24 - Housings
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • H03M 1/12 - Analogue/digital converters
  • H05B 47/18 - Controlling the light source by remote control via data-bus transmission

9.

In-process quality assessment for additive manufacturing

      
Application Number 18459641
Grant Number 12253492
Status In Force
Filing Date 2023-09-01
First Publication Date 2023-12-21
Grant Date 2025-03-18
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M

Abstract

Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
  • B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
  • B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
  • B22F 12/49 - Scanners
  • B22F 12/90 - Means for process control, e.g. cameras or sensors
  • B33Y 10/00 - Processes of additive manufacturing
  • B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
  • B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
  • G01N 27/00 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • B22F 10/30 - Process control

10.

REMOTE CURRENT SENSE

      
Application Number US2023065076
Publication Number 2023/192887
Status In Force
Filing Date 2023-03-28
Publication Date 2023-10-05
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Dunford, Todd
  • Washabaugh, Andrew

Abstract

An eddy current sensor with a remote current sense has a drive conductor, current sense conductor, and one or more sense conductors. The drive conductor has first and second loop portions, the current sense conductor has a third loop portion, and the sense conductor has a sense loop portion. The first and third loop portions are proximal to each other to form the remote current sense. The sense loop portion and the second loop portion are proximal to each other to form a sense element. The remote current sense and sense element are suitably distant from one another to have separate environments of sensitivity. The sensor may be used by collecting transimpedance measurements from both the remote current sense and sense element under known conditions, and with the sense element under unknown conditions. These measurements are combined to provide a calibrated measurement result suitable for further analysis.

IPC Classes  ?

  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • G01N 27/9093 - Arrangements for supporting the sensorCombinations of eddy-current sensors and auxiliary arrangements for marking or for rejecting
  • G01N 27/61 - Investigating the presence of flaws
  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01N 27/83 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
  • G01N 27/87 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields using probes

11.

Measurement system and method of use

      
Application Number 18093863
Grant Number 11841245
Status In Force
Filing Date 2023-01-06
First Publication Date 2023-05-25
Grant Date 2023-12-12
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M
  • Denenberg, Scott A
  • Dixon, Kevin P
  • Sheiretov, Yanko K
  • Bahranifard, Saber
  • Chaplan, Stuart D
  • Windoloski, Mark

Abstract

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

IPC Classes  ?

  • G01D 11/24 - Housings
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • H05B 47/18 - Controlling the light source by remote control via data-bus transmission
  • H03M 1/12 - Analogue/digital converters

12.

In-process quality assessment for additive manufacturing

      
Application Number 18092422
Grant Number 11747304
Status In Force
Filing Date 2023-01-02
First Publication Date 2023-05-18
Grant Date 2023-09-05
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M

Abstract

Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
  • B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
  • G01N 27/9013 - Arrangements for scanning
  • B33Y 10/00 - Processes of additive manufacturing
  • B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
  • B22F 12/49 - Scanners
  • B22F 12/90 - Means for process control, e.g. cameras or sensors
  • B22F 10/38 - Process control to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures
  • B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/30 - Process control

13.

Segmented field eddy current sensing for dispersive property measurement and complex structures

      
Application Number 17652993
Grant Number 11802851
Status In Force
Filing Date 2022-03-01
First Publication Date 2023-03-30
Grant Date 2023-10-31
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Dunford, Todd M.
  • Thomas, Zachary M.

Abstract

Disclosed are method and apparatus for measuring material properties. Segmented field sensors have multiple sensing elements at different spatial geometries to capture field components having substantially different depths of penetration. These sensors are excited and measured on these different sensing elements to facilitate characterization of unknown material properties. This is illustrated in some embodiments using eddy current sensors to characterize materials that are frequency dispersive and/or do not produce a measurable phase shifts. Only a single scalar quantity may provide independent information from one or more of the sensing elements. Property estimation techniques, such as those using precomputed databases of sensor responses are used to estimate the unknown material properties.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • B33Y 50/00 - Data acquisition or data processing for additive manufacturing
  • B29C 64/386 - Data acquisition or data processing for additive manufacturing
  • B22F 10/14 - Formation of a green body by jetting of binder onto a bed of metal powder
  • B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
  • B22F 12/90 - Means for process control, e.g. cameras or sensors
  • B22F 10/37 - Process control of powder bed aspects, e.g. density
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/30 - Process control

14.

COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS

      
Application Number 17902963
Status Pending
Filing Date 2022-09-05
First Publication Date 2022-12-29
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Windoloski, Mark
  • Dunford, Todd M

Abstract

Eddy current sensing is governed by the diffusion equation of magnetoquasistatic fields. As such the eddy current sensor's proximity to the object to be inspected (i.e., “liftoff”) significantly affects the sensor's response signal. Methods and apparatus are disclosed for improving performance for an eddy current sensor, though they may also be used for other sensor types. These solutions are beneficial for both single channel eddy current sensors and arrays, and are particularly beneficial for measuring parts with complex surfaces. In some aspects improved performance is achieved by varying the stiffness of the mechanical support for the sensor. Some mechanical supports may exhibit anisotropic stiffness. After performing a scan with an eddy current array, a multi-channel shape filtering module is applied to improve defect detection. The module reduces the variability of defect response measured due to the unpredictability of the defect location transverse to the scan direction.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

15.

Measurement system and method of use

      
Application Number 16572574
Grant Number 11549831
Status In Force
Filing Date 2019-09-16
First Publication Date 2022-11-24
Grant Date 2023-01-10
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M
  • Denenberg, Scott A
  • Dixon, Kevin P
  • Sheiretov, Yanko K
  • Bahranifard, Saber
  • Chaplan, Stuart D
  • Windoloski, Mark

Abstract

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

IPC Classes  ?

  • G01D 11/24 - Housings
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • H03M 1/12 - Analogue/digital converters
  • H05B 47/18 - Controlling the light source by remote control via data-bus transmission

16.

JETI

      
Serial Number 97671188
Status Registered
Filing Date 2022-11-10
Registration Date 2024-05-07
Owner JENTEK Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Electrical eddy current test equipment; Handheld computers

17.

System and method for pit detection and sizing

      
Application Number 17662634
Grant Number 12332201
Status In Force
Filing Date 2022-05-09
First Publication Date 2022-11-10
Grant Date 2025-06-17
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Windoloski, Mark

Abstract

A system and method are disclosed for enhancing pit detection and sizing in a test object. Response signatures are created and stored in a signature library to characterize various sensor responses (liftoff, orientation) and pit properties (e.g., depth, width), possibly with or without additional considerations (e.g., edges, cracks). A sensor is placed on and scanned across a surface of interest on the test object. During scanning the sensor is measured repeatedly at regular intervals. An encoder may be used to record the sensor position for each measurement. The measurement results are then correlated with one or more signatures in the signature library. A threshold is used to determine if the correlation is indicative of the detection of a pit. If so additional processing may be performed to estimate pit properties.

IPC Classes  ?

  • G01H 13/00 - Measuring resonant frequency
  • G01B 11/12 - Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
  • G01B 11/22 - Measuring arrangements characterised by the use of optical techniques for measuring depth
  • G01N 27/02 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
  • G01N 29/12 - Analysing solids by measuring frequency or resonance of acoustic waves

18.

System and method for hole inspection

      
Application Number 17660976
Grant Number 12061169
Status In Force
Filing Date 2022-04-27
First Publication Date 2022-10-27
Grant Date 2024-08-13
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd
  • Goldfine, Neil
  • Chaplan, Stuart

Abstract

A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/904 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
  • G01R 33/09 - Magneto-resistive devices

19.

SYSTEM AND METHOD FOR HOLE INSPECTION AND QUALIFICATION

      
Application Number 17660979
Status Pending
Filing Date 2022-04-27
First Publication Date 2022-10-27
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Chaplan, Stuart
  • Goldfine, Neil
  • Thomas, Zachary M.

Abstract

A system and method are provided for performing a hole inspection performance study. Specimens for the performance study are made from a reconfigurable set of inspection plates. Each plate includes multiple test holes which are located symmetrically. The plates may be of various thicknesses and materials. Each test hole may or may not have a feature such as a crack or machining notch. Such features may be located at various positions of the hole, such as at an edge, within the bore, and at various circumferential positions. A specimen is formed by stacking two or more plates and securing the stack together with an alignment tool. A variety of specimens may be formed by using different combinations of inspection plates and flipping and rotating the member plates. A hole inspection system is disclosed as well as an inspection procedure and data processing algorithm for inspecting each hole.

IPC Classes  ?

20.

In-process quality assessment for additive manufacturing

      
Application Number 17653024
Grant Number 11543388
Status In Force
Filing Date 2022-03-01
First Publication Date 2022-06-09
Grant Date 2023-01-03
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M

Abstract

Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • B22F 3/105 - Sintering only by using electric current, laser radiation or plasma
  • B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
  • B33Y 10/00 - Processes of additive manufacturing
  • B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
  • G01N 27/9013 - Arrangements for scanning
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/30 - Process control

21.

Method and apparatus for measurement of material condition

      
Application Number 17403139
Grant Number 11959880
Status In Force
Filing Date 2021-08-16
First Publication Date 2021-12-02
Grant Date 2024-04-16
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A
  • Sheiretov, Yanko K
  • Goldfine, Neil J
  • Dunford, Todd M
  • Washabaugh, Andrew P
  • Straney, Don
  • Manning, Brian L

Abstract

System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 27/02 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

22.

Complex part inspection with eddy current sensors

      
Application Number 17046047
Grant Number 11435317
Status In Force
Filing Date 2019-04-09
First Publication Date 2021-02-25
Grant Date 2022-09-06
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M

Abstract

Eddy current sensing is governed by the diffusion equation of magnetoquasistatic fields. As such the eddy current sensor's proximity to the object to be inspected (i.e., “liftoff”) significantly affects the sensor's response signal. Methods and apparatus are disclosed for improving performance for an eddy current sensor, though they may also be used for other sensor types. These solutions are beneficial for both single channel eddy current sensors and arrays, and are particularly beneficial for measuring parts with complex surfaces. In some aspects improved performance is achieved by varying the stiffness of the mechanical support for the sensor. Some mechanical supports may exhibit anisotropic stiffness. After performing a scan with an eddy current array, a multi-channel shape filtering module is applied to improve defect detection. The module reduces the variability of defect response measured due to the unpredictability of the defect location transverse to the scan direction.

IPC Classes  ?

  • G01N 27/9013 - Arrangements for scanning
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

23.

Segmented field eddy current sensing for dispersive property measurement and complex structures

      
Application Number 16445166
Grant Number 11268931
Status In Force
Filing Date 2019-06-18
First Publication Date 2019-12-19
Grant Date 2022-03-08
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Washabaugh, Andrew P
  • Dunford, Todd M
  • Thomas, Zachary M

Abstract

Disclosed are method and apparatus for measuring material properties. Segmented field sensors have multiple sensing elements at different spatial geometries to capture field components having substantially different depths of penetration. These sensors are excited and measured on these different sensing elements to facilitate characterization of unknown material properties. This is illustrated in some embodiments using eddy current sensors to characterize materials that are frequency dispersive and/or do not produce a measurable phase shifts. Only a single scalar quantity may provide independent information from one or more of the sensing elements. Property estimation techniques, such as those using precomputed databases of sensor responses are used to estimate the unknown material properties.

IPC Classes  ?

  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • B33Y 50/00 - Data acquisition or data processing for additive manufacturing
  • B29C 64/386 - Data acquisition or data processing for additive manufacturing
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/30 - Process control

24.

Method and apparatus for measurement of material condition

      
Application Number 16433320
Grant Number 11092571
Status In Force
Filing Date 2019-06-06
First Publication Date 2019-10-24
Grant Date 2021-08-17
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A
  • Sheiretov, Yanko K
  • Goldfine, Neil J
  • Straney, Don

Abstract

System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 27/02 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

25.

COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS

      
Application Number US2019026673
Publication Number 2019/199894
Status In Force
Filing Date 2019-04-09
Publication Date 2019-10-17
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil, J.
  • Dunford, Todd, M.
  • Windoloski, Mark

Abstract

Eddy current sensing is governed by the diffusion equation of magnetoquasistatic fields. As such the eddy current sensor's proximity to the object to be inspected (i.e., "liftoff") significantly affects the sensor's response signal. Methods and apparatus are disclosed for improving performance for an eddy current sensor, though they may also be used for other sensor types. These solutions are beneficial for both single channel eddy current sensors and arrays, and are particularly beneficial for measuring parts with complex surfaces. In some aspects improved performance is achieved by varying the stiffness of the mechanical support for the sensor. Some mechanical supports may exhibit anisotropic stiffness. After performing a scan with an eddy current array, a multi-channel shape filtering module is applied to improve defect detection. The module reduces the variability of defect response measured due to the unpredictability of the defect location transverse to the scan direction.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01N 29/24 - Probes

26.

Measurement system and method of use

      
Application Number 15594004
Grant Number 10416118
Status In Force
Filing Date 2017-05-12
First Publication Date 2019-09-17
Grant Date 2019-09-17
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Dunford, Todd M
  • Denenberg, Scott A
  • Dixon, Kevin P
  • Sheiretov, Yanko K
  • Bahranifard, Saber
  • Chaplan, Stuart D
  • Windoloski, Mark D

Abstract

A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.

IPC Classes  ?

  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
  • A61B 5/0404 - Hand-held devices
  • G01N 27/04 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
  • G01R 27/12 - Measuring resistance by measuring both voltage and current using two-coil or crossed-coil instruments forming quotient using hand generators, e.g. meggers

27.

Portable test instrument

      
Application Number 29666705
Grant Number D0857534
Status In Force
Filing Date 2018-10-15
First Publication Date 2019-08-27
Grant Date 2019-08-27
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd M
  • Goldfine, Neil J
  • Chaplan, Stuart D
  • Sheiretov, Yanko K
  • Denenberg, Scott A

28.

Portable test instrument attachment

      
Application Number 29603805
Grant Number D0842725
Status In Force
Filing Date 2017-05-12
First Publication Date 2019-03-12
Grant Date 2019-03-12
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Dunford, Todd M
  • Goldfine, Neil J

29.

Portable test instrument

      
Application Number 29603661
Grant Number D0830863
Status In Force
Filing Date 2017-05-11
First Publication Date 2018-10-16
Grant Date 2018-10-16
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Dunford, Todd M
  • Goldfine, Neil J
  • Chaplan, Stuart D
  • Sheiretov, Yanko K
  • Denenberg, Scott A

30.

Method and apparatus for inspection of corrosion and other defects through insulation

      
Application Number 15815639
Grant Number 10732096
Status In Force
Filing Date 2017-11-16
First Publication Date 2018-07-26
Grant Date 2020-08-04
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A.
  • Dunford, Todd M.
  • Goldfine, Neil J.
  • Sheiretov, Yanko K.

Abstract

Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.

IPC Classes  ?

  • G01N 17/04 - Corrosion probes
  • G06F 17/00 - Digital computing or data processing equipment or methods, specially adapted for specific functions
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

31.

In-process quality assessment for additive manufacturing

      
Application Number 15796351
Grant Number 11268933
Status In Force
Filing Date 2017-10-27
First Publication Date 2018-05-03
Grant Date 2022-03-08
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil J.
  • Dunford, Todd M.

Abstract

Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • B22F 3/105 - Sintering only by using electric current, laser radiation or plasma
  • B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
  • B33Y 10/00 - Processes of additive manufacturing
  • B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
  • G01N 27/9013 - Arrangements for scanning
  • B22F 10/20 - Direct sintering or melting
  • B22F 10/30 - Process control

32.

Method and apparatus for non-destructive evaluation of materials

      
Application Number 15646622
Grant Number 10444189
Status In Force
Filing Date 2017-07-11
First Publication Date 2017-11-02
Grant Date 2019-10-15
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Washabaugh, Andrew P
  • Lyons, Robert

Abstract

Methods and apparatus for characterizing composite materials for manufacturing quality assurance (QA), periodic inspection during the useful life, or for forensic analysis/material testing. System are provided that relate eddy-current sensor responses to the fiber layup of a composite structure, the presence of impact damage on a composite structure with or without a metal liner, volumetric stress within the composite, fiber tow density, and other NDE inspection requirements. Also provided are systems that determine electromagnetic material properties and material dimensions of composite materials from capacitive sensor inspection measurements. These properties are related to the presence of buried defects in non-conductive composite materials, moisture ingress, aging of the material due to service or environmental/thermal exposure, or changes in manufacturing quality.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 33/09 - Magneto-resistive devices
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01R 33/10 - Plotting field distribution
  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

33.

Integrated sensor cartridge system and method of use

      
Application Number 15169361
Grant Number 10677756
Status In Force
Filing Date 2016-05-31
First Publication Date 2016-12-01
Grant Date 2020-06-09
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil J
  • Sheiretov, Yanko K
  • Denenberg, Scott A
  • Walrath, Karen
  • Dunford, Todd M
  • Dixon, Kevin P
  • Martin, Christopher T

Abstract

A sensor system has an integrated sensor cartridge, and instrument, and an instrument side connector. The integrated sensor cartridge has a mechanical support, a flexible sensor array, and a rigid connector. The mechanical support is shaped to facilitate sensor measurements on a test object. The rigid connector has a mechanical connection and an electrical connection for simultaneous electrical and mechanical mating of the sensor cartridge to the instrument side connector. The flexible array has a connecting portion, a lead portion, and a sensing portion. The sensing portion is attached to the mechanical support, and the connecting portion interfaces with the rigid connector. The connecting portion may form the electrical connection of the rigid connector or may simply mate internally with the electrical connection. The instrument side connector is connected to the instrument which measures the response of the flexible sensor array. Test objects may include bolt holes, fillets, disk slots, and other types of parts or components.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables

34.

JET

      
Serial Number 87241626
Status Registered
Filing Date 2016-11-18
Registration Date 2017-06-20
Owner JENTEK Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Electrical eddy current test equipment

35.

Method and apparatus for measurement of material condition

      
Application Number 15030094
Grant Number 10324062
Status In Force
Filing Date 2014-10-22
First Publication Date 2016-09-22
Grant Date 2019-06-18
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A
  • Sheiretov, Yanko K
  • Goldfine, Neil J
  • Straney, Don
  • Kristal, Leon B

Abstract

System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01N 27/02 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
  • G01R 27/02 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

36.

Method and apparatus for inspection of corrosion and other defects through insulation

      
Application Number 15003483
Grant Number 09823179
Status In Force
Filing Date 2016-01-21
First Publication Date 2016-08-18
Grant Date 2017-11-21
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A.
  • Dunford, Todd M.
  • Goldfine, Neil J.
  • Sheiretov, Yanko K.

Abstract

Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.

IPC Classes  ?

  • G01N 17/04 - Corrosion probes
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 33/04 - Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle
  • G06F 17/00 - Digital computing or data processing equipment or methods, specially adapted for specific functions

37.

Method and apparatus for non-destructive evaluation of materials

      
Application Number 14566422
Grant Number 09772309
Status In Force
Filing Date 2014-12-10
First Publication Date 2015-07-30
Grant Date 2017-09-26
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Lyons, Robert
  • Thomas, Zachary
  • Martin, Christopher

Abstract

Methods and apparatus for characterizing composite materials for manufacturing quality assurance (QA), periodic inspection during the useful life, or for forensic analysis/material testing. System are provided that relate eddy-current sensor responses to the fiber layup of a composite structure, the presence of impact damage on a composite structure with or without a metal liner, volumetric stress within the composite, fiber tow density, and other NDE inspection requirements. Also provided are systems that determine electromagnetic material properties and material dimensions of composite materials from capacitive sensor inspection measurements. These properties are related to the presence of buried defects in non-conductive composite materials, moisture ingress, aging of the material due to service or environmental/thermal exposure, or changes in manufacturing quality.

IPC Classes  ?

  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01R 33/10 - Plotting field distribution
  • G01R 33/09 - Magneto-resistive devices

38.

Durability enhanced and redundant embedded sensors

      
Application Number 14456567
Grant Number 09279784
Status In Force
Filing Date 2014-08-11
First Publication Date 2015-05-28
Grant Date 2016-03-08
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Grundy, David C.
  • Schlicker, Darrell E.
  • Washabaugh, Andrew P.

Abstract

A substantially planar eddy-current sensor having durability enhancing pillars in an active region is provided. The pillars are distributed and sized so as to have limited effect on the sensor's performance. When the sensor is mounted on a component such that the sensor experiences forces on a top and bottom surface, the pillars bear the load reducing the load bore by the active elements (e.g., drive winding, sense elements). A sensor with redundant drive windings and/or redundant sense elements is disclosed. The redundant elements may be connected to separate electronics. Another aspect relates to providing a reference transformer for calibration of a sensor. The secondary windings of the reference transformer are connected in series with the sense elements of the sensor to be calibrated. Transimpedance measurements are made when the drive winding of the reference transformer is excited. The measurements are used to correct transimpedance measurements made when the drive winding of the sensor is excited. A system having an impedance analyzer and a plurality of multiplexing units is disclosed for monitoring a plurality of sensor. Each multiplexing units directs an excitation signal to the drive winding of a respective sensor and returns, serially, the sense element responses back to the impedance analyzer. The system coordinates the excitation of each sensor and return of the sensor response to share a serial network. The multiplexing units may have a reference transformer for calibration of their respective sensors. Optical communication may be used.

IPC Classes  ?

  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01D 18/00 - Testing or calibrating apparatus or arrangements provided for in groups
  • G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids

39.

METHOD AND APPARATUS FOR MEASUREMENT OF MATERIAL CONDITION

      
Application Number US2014061825
Publication Number 2015/061487
Status In Force
Filing Date 2014-10-22
Publication Date 2015-04-30
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Denenberg, Scott, A.
  • Sheiretov, Yanko, K.
  • Goldfine, Neil, J.
  • Dunford, Todd, M.
  • Washabaugh, Andrew P.
  • Straney, Don
  • Manning, Brian

Abstract

System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.

IPC Classes  ?

  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01R 27/02 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

40.

Method and apparatus for detection and characterization of mechanical damage

      
Application Number 14067784
Grant Number 08960012
Status In Force
Filing Date 2013-10-30
First Publication Date 2014-07-03
Grant Date 2015-02-24
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Dunford, Todd M.
  • Goldfine, Neil J.
  • Haque, Shayan

Abstract

Yield stress is an important indicator of the strength of a component such as a pipe section. A method and apparatus for measuring yield stress of components made from magnetic materials is provided. The magnetic permeability of the material is recorded at multiple stress levels below yield establishing a permeability-stress relationship. The yield stress is then estimated as a function of the recorded permeability-stress relationship. The permeability stress relationship may be non-linear for a range of stress levels, achieving a peak permeability response for a stress below yield. The yield stress may be estimated as a multiple of the stress at which the peak permeability response is recorded.

IPC Classes  ?

  • G01L 1/00 - Measuring force or stress, in general
  • G01B 7/24 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties
  • G01R 33/02 - Measuring direction or magnitude of magnetic fields or magnetic flux
  • G01M 5/00 - Investigating the elasticity of structures, e.g. deflection of bridges or aircraft wings

41.

Method and apparatus for load and additional property measurement

      
Application Number 13853853
Grant Number 09207131
Status In Force
Filing Date 2013-03-29
First Publication Date 2013-10-17
Grant Date 2015-12-08
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Schlicker, Darrell E.
  • Goldfine, Neil J.

Abstract

A system and method for measuring load and an additional property using a sensor gasket embedded between two components. The sensor gasket may include a sensor layer and a conductive layer. A gap between the sensor layer and conductive layer may be filled with a load sensitive material. The thickness of the load sensitive material varies with the load applied to the two components between which the sensor gasket sits. The sensor operates in a first mode to obtain a sensor measurement that depends on the distance between the sensor layer and conductive layer. The sensor measurement then used to estimate the applied load. The sensor operates in a second mode to estimate a property of one or both of the components. The property of interest may be cracking, material loss due to corrosion, temperature, or another property of the component.

IPC Classes  ?

  • B25B 23/14 - Arrangement of torque limiters or torque indicators in wrenches or screwdrivers
  • G01L 5/24 - Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for determining value of torque or twisting moment for tightening a nut or other member which is similarly stressed
  • G01L 1/12 - Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
  • G01L 1/26 - Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload

42.

Method and apparatus for inspection of corrosion and other defects through insulation

      
Application Number 13660914
Grant Number 09255875
Status In Force
Filing Date 2012-10-25
First Publication Date 2013-05-16
Grant Date 2016-02-09
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Denenberg, Scott A.
  • Dunford, Todd A.
  • Goldfine, Neil J.
  • Sheiretov, Yanko K.

Abstract

Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.

IPC Classes  ?

  • G01N 17/04 - Corrosion probes
  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G06F 17/00 - Digital computing or data processing equipment or methods, specially adapted for specific functions
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

43.

Method for stress assessment that removes temperature effects and hysteresis on the material property measurements

      
Application Number 13549875
Grant Number 08415947
Status In Force
Filing Date 2012-07-16
First Publication Date 2013-01-17
Grant Date 2013-04-09
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Sheiretov, Yanko K.
  • Goldfine, Neil J.
  • Dunford, Todd M.
  • Denenberg, Scott A.
  • Grundy, David C.
  • Schlicker, Darrell E.
  • Washabaugh, Andrew P.
  • Walrath, Karen E.

Abstract

An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.

IPC Classes  ?

  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01B 7/24 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties

44.

Performance curve generation for non-destructive testing sensors

      
Application Number 13451128
Grant Number 10001457
Status In Force
Filing Date 2012-04-19
First Publication Date 2012-10-25
Grant Date 2018-06-19
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Goldfine, Neil J.
  • Sheiretov, Yanko K.
  • Spencer, Floyd W.
  • Jablonski, David A.
  • Grundy, David C.
  • Schlicker, Darrell E.

Abstract

Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.

IPC Classes  ?

  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01M 5/00 - Investigating the elasticity of structures, e.g. deflection of bridges or aircraft wings
  • G01N 29/30 - Arrangements for calibrating or comparing, e.g. with standard objects

45.

Method and apparatus for non-destructive evaluation of materials

      
Application Number 13297933
Grant Number 08928316
Status In Force
Filing Date 2011-11-16
First Publication Date 2012-05-24
Grant Date 2015-01-06
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Lyons, Robert
  • Thomas, Zachary
  • Jablonski, David A.
  • Martin, Christopher

Abstract

Methods and apparatus for characterizing composite materials for manufacturing quality assurance (QA), periodic inspection during the useful life, or for forensic analysis/material testing. System are provided that relate eddy-current sensor responses to the fiber layup of a composite structure, the presence of impact damage on a composite structure with or without a metal liner, volumetric stress within the composite, fiber tow density, and other NDE inspection requirements. Also provided are systems that determine electromagnetic material properties and material dimensions of composite materials from capacitive sensor inspection measurements. These properties are related to the presence of buried defects in non-conductive composite materials, moisture ingress, aging of the material due to service or environmental/thermal exposure, or changes in manufacturing quality.

IPC Classes  ?

  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01R 33/10 - Plotting field distribution
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables

46.

Durability enhanced and redundant embedded sensors

      
Application Number 13024154
Grant Number 08803515
Status In Force
Filing Date 2011-02-09
First Publication Date 2011-09-01
Grant Date 2014-08-12
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Grundy, David C.
  • Schlicker, Darrell E.
  • Washabaugh, Andrew P.

Abstract

A substantially planar eddy-current sensor having durability enhancing pillars in an active region is provided. The pillars are distributed and sized so as to have limited effect on the sensor's performance. When the sensor is mounted on a component such that the sensor experiences forces on a top and bottom surface, the pillars bear the load reducing the load bore by the active elements (e.g., drive winding, sense elements). A sensor with redundant drive windings and/or redundant sense elements is disclosed. The redundant elements may be connected to separate electronics. Another aspect relates to providing a reference transformer for calibration of a sensor. The secondary windings of the reference transformer are connected in series with the sense elements of the sensor to be calibrated. Transimpedance measurements are made when the drive winding of the reference transformer is excited. The measurements are used to correct transimpedance measurements made when the drive winding of the sensor is excited. A system having an impedance analyzer and a plurality of multiplexing units is disclosed for monitoring a plurality of sensor. Each multiplexing units directs an excitation signal to the drive winding of a respective sensor and returns, serially, the sense element responses back to the impedance analyzer. The system coordinates the excitation of each sensor and return of the sensor response to share a serial network. The multiplexing units may have a reference transformer for calibration of their respective sensors. Optical communication may be used.

IPC Classes  ?

  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01R 33/14 - Measuring or plotting hysteresis curves

47.

HYPERLATTICE

      
Serial Number 85407963
Status Registered
Filing Date 2011-08-26
Registration Date 2014-09-16
Owner Jentek Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Electronic database, recorded on computer-readable media, in the field of non-destructive testing for use in estimating unknown quantities

48.

Component adaptive life management

      
Application Number 12795538
Grant Number 08494810
Status In Force
Filing Date 2010-06-07
First Publication Date 2011-03-10
Grant Date 2013-07-23
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Sheiretov, Yanko K.
  • Washabaugh, Andrew P.
  • Zilberstein, Vladimir A.
  • Grundy, David C.
  • Lyons, Robert J.
  • Jablonski, David A.
  • Spencer, Floyd W.

Abstract

A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired. A hyperlattice database is used with a rapid searching method to estimate at least one material condition and one usage parameter, such as stress level for the component. The hyperlattice is also used to rapidly predict future condition, associated uncertainty and risk of failure.

IPC Classes  ?

  • G06F 19/00 - Digital computing or data processing equipment or methods, specially adapted for specific applications (specially adapted for specific functions G06F 17/00;data processing systems or methods specially adapted for administrative, commercial, financial, managerial, supervisory or forecasting purposes G06Q;healthcare informatics G16H)

49.

Material condition assessment with eddy current sensors

      
Application Number 12484761
Grant Number 07812601
Status In Force
Filing Date 2009-06-15
First Publication Date 2010-02-04
Grant Date 2010-10-12
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Sheiretov, Yanko K.
  • Schlicker, Darrell E.
  • Lyons, Robert J.
  • Windoloski, Mark D.
  • Craven, Christopher A.
  • Tsukernik, Vladimir B.
  • Grundy, David C.

Abstract

Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.

IPC Classes  ?

  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents

50.

Test circuit with sense elements having associated and unassociated primary windings

      
Application Number 12157719
Grant Number 08222897
Status In Force
Filing Date 2008-06-12
First Publication Date 2009-01-01
Grant Date 2012-07-17
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Sheiretov, Yanko K.
  • Goldfine, Neil J.
  • Dunford, Todd M.
  • Denenberg, Scott A.
  • Grundy, David C.
  • Schlicker, Darrell E.
  • Washabaugh, Andrew P.
  • Walrath, Karen E.

Abstract

An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the meanders are oriented 90° apart while in a quadridirectional implementation the meanders are orientated at −45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence. After the correction, the permeability measurement is then used to assess the local stresses and strains in the material of interest.

IPC Classes  ?

  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01N 27/72 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
  • G01N 27/90 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
  • G01B 7/24 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties

51.

TORQUE AND LOAD MONITORING USING MAGNETIC SENSOR ARRAYS

      
Application Number US2008007326
Publication Number 2008/156628
Status In Force
Filing Date 2008-06-12
Publication Date 2008-12-24
Owner JENTEK SENSORS, INC. (USA)
Inventor
  • Sheiretov, Yanko, K.
  • Goldfine, Neil, J.
  • Dunford, Todd, M.
  • Denenberg, Scott, A.
  • Grundy, David, C.
  • Schlicker, Darrell, E.
  • Washabaugh, Andrew, P.
  • Walrath, Karen, E.

Abstract

An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the angle is 90° while in a quadridirectional implementation the relative angles are -45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence. After the corrections, the permeability measurement is then used to assess the local stresses and strains in the material of interest.

IPC Classes  ?

  • G01L 3/10 - Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft involving electric or magnetic means for indicating

52.

GRIDSTATION

      
Serial Number 77617667
Status Registered
Filing Date 2008-11-19
Registration Date 2009-10-13
Owner Jentek Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Electronic systems comprising data acquisition and analysis computer programs and software, electromagnetic and dielectrometer sensors and probes, and computer hardware and measurement systems, namely, impedance instrumentation, eddy current testing equipment, dynamic stress and/or temperature measurement equipment, calibration equipment, and materials testing equipment; all of the foregoing used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degeneration

53.

Engine blade dovetail inspection

      
Application Number 11715288
Grant Number 07451639
Status In Force
Filing Date 2007-03-07
First Publication Date 2007-11-29
Grant Date 2008-11-18
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J
  • Windoloski, Mark D
  • Tsukernik, Vladimir B
  • Schlicker, Darrell E
  • Dunford, Todd M
  • Washabaugh, Andrew P.

Abstract

A set of curved components, such as the dovetail region of engine blades, are inspected by mounting each component into a circular carousel in a vertical orientation and rotating the carousel to move each component toward and away from an inspection site. The inspection site clamps a flexible eddy current sensor array to the curved material surface, scans the array over the surface, records the sensor position. A rigid element having a surface geometry similar to the surface shape of the component can be attached to the component to facilitate scanning of the sensor array over a component edge. The response of each sense element in the array may be converted into an effective material property and sense element proximity to the component material surface to verify the quality of the inspection scan and the presence of a defect such as a crack.

IPC Classes  ?

54.

Remaining life prediction for individual components from sparse data

      
Application Number 11653067
Grant Number 08768657
Status In Force
Filing Date 2007-01-12
First Publication Date 2007-10-11
Grant Date 2014-07-01
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Zilberstein, Vladimir A.
  • Weiss, Volker
  • Sheiretov, Yanko K.

Abstract

Predicting the remaining life of individual aircraft, fleets of aircraft, aircraft components and subpopulations of these components. This is accomplished through the use of precomputed databases of response that are generated from a model for the nonlinear system behavior prior to the time that decisions need to be made concerning the disposition of the system. The database is calibrated with a few data points, to account for unmodeled system variables, and then used with an input variable to predict future system behavior. These methods also permit identification of the root causes for observed system behavior. The use of the response databases also permits rapid estimations of uncertainty estimates for the system behavior, such as remaining life estimates, particularly, when subsets of an input variable distribution are passed through the database and scaled appropriately to construct the output distribution. A specific example is the prediction of remaining life for an aircraft component where the model calculates damage evolution, input variables are a crack size and the number of cycles, and the predicted parameters are the actual stress on the component and the remaining life.

IPC Classes  ?

  • G06F 7/60 - Methods or arrangements for performing computations using a digital non-denominational number representation, i.e. number representation without radixComputing devices using combinations of denominational and non-denominational quantity representations
  • G06F 17/10 - Complex mathematical operations
  • G06F 19/00 - Digital computing or data processing equipment or methods, specially adapted for specific applications (specially adapted for specific functions G06F 17/00;data processing systems or methods specially adapted for administrative, commercial, financial, managerial, supervisory or forecasting purposes G06Q;healthcare informatics G16H)
  • G21C 17/00 - MonitoringTesting
  • G06F 15/18 - in which a program is changed according to experience gained by the computer itself during a complete run; Learning machines (adaptive control systems G05B 13/00;artificial intelligence G06N)
  • G06E 1/00 - Devices for processing exclusively digital data
  • G06E 3/00 - Devices not provided for in group , e.g. for processing analogue or hybrid data
  • G06G 7/00 - Devices in which the computing operation is performed by varying electric or magnetic quantities
  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G06N 7/00 - Computing arrangements based on specific mathematical models
  • G01B 7/34 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

55.

Fastener and fitting based sensing methods

      
Application Number 11473297
Grant Number 07528598
Status In Force
Filing Date 2006-06-22
First Publication Date 2007-01-11
Grant Date 2009-05-05
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Grundy, David C.
  • Washabaugh, Andrew P.
  • Sheiretov, Yanko K.
  • Schlicker, Darrell E.

Abstract

Damage and usage conditions in the vicinity of fasteners in joined structures are nondestructively evaluated using the fasteners themselves. Sensors or sensor conductors are embedded in the fasteners or integrated within the fastener construct, either in the clearance gap between the fastener and the structure material or as an insert inside the shaft or pin of the fastener. The response of the material to an interrogating magnetic or electric field is then measured with drive and sense electrodes both incorporated into the fastener or with either drive or sense electrodes external to the fastener on the material surface. In another configuration, an electric current is applied to one or more fasteners and the electric potential is measured at locations typically between the driven electrodes applying the current. The potential is measured circumferentially around the fastener at locations on the material surface or across pairs of fasteners throughout or along the joint. The voltage or potential measurement electrodes may be collinear with the drive electrodes. State sensitive material layers can be added either to the fastener or the test material layers in order to enhance observability of the test material condition, such as the presence of a crack, mechanical stress, delamination, or disbond.

IPC Classes  ?

  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants

56.

Segmented field dielectric sensor array for material characterization

      
Application Number 11371315
Grant Number 07280940
Status In Force
Filing Date 2006-03-07
First Publication Date 2006-11-02
Grant Date 2007-10-09
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Schlicker, Darrell E.
  • Sheiretov, Yanko K
  • Washabaugh, Andrew P.
  • Grundy, David C.
  • Zilberstein, Vladimir A.

Abstract

The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.

IPC Classes  ?

  • G06F 15/00 - Digital computers in generalData processing equipment in general

57.

Local feature characterization using quasistatic electromagnetic sensors

      
Application Number 11249047
Grant Number 07289913
Status In Force
Filing Date 2005-10-11
First Publication Date 2006-05-11
Grant Date 2007-10-30
Owner JENTEK Sensors, Inc. (USA)
Inventor
  • Schlicker, Darrell E.
  • Goldfine, Neil J.
  • Washabaugh, Andrew P.
  • Sheiretov, Yanko K.
  • Windoloski, Mark D.

Abstract

Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.

IPC Classes  ?

  • G01B 7/34 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
  • G06F 17/40 - Data acquisition and logging
  • G06F 19/00 - Digital computing or data processing equipment or methods, specially adapted for specific applications (specially adapted for specific functions G06F 17/00;data processing systems or methods specially adapted for administrative, commercial, financial, managerial, supervisory or forecasting purposes G06Q;healthcare informatics G16H)

58.

Internal material condition monitoring for control

      
Application Number 11079912
Grant Number 08981018
Status In Force
Filing Date 2005-03-14
First Publication Date 2006-01-12
Grant Date 2015-03-17
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Goldfine, Neil J.
  • Zilberstein, Vladimir A.
  • Shay, Ian C.
  • Craven, Christopher A.
  • Grundy, David C.
  • Weiss, Volker
  • Washabaugh, Andrew P.

Abstract

The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses. The sensor responses can also be used to determine properties of the test material, such as electrical conductivity or magnetic permeability, prior to conversion to the material state. The states are used to support control decisions that control the process or operation causing the material condition to change.

IPC Classes  ?

  • G01N 27/00 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01B 7/00 - Measuring arrangements characterised by the use of electric or magnetic techniques
  • G05D 23/22 - Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element being a thermocouple
  • G05D 23/24 - Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. thermistor
  • G05D 23/26 - Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a permeability varying with temperature

59.

Absolute property measurements using electromagnetic sensors

      
Application Number 10963482
Grant Number 07696748
Status In Force
Filing Date 2004-10-12
First Publication Date 2005-06-16
Grant Date 2010-04-13
Owner Jentek Sensors, Inc. (USA)
Inventor
  • Schlicker, Darrell E.
  • Goldfine, Neil J.
  • Grundy, David C.
  • Lyons, Robert J.
  • Zilberstein, Vladimir A.
  • Washabaugh, Andrew P.
  • Tsukernik, Vladimir
  • Windoloski, Mark D.
  • Shay, Ian C.

Abstract

Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.

IPC Classes  ?

  • G01N 27/82 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01B 7/24 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties

60.

JENTEK

      
Serial Number 75495564
Status Registered
Filing Date 1998-06-03
Registration Date 2000-12-26
Owner JENTEK Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

measurement and analysis systems comprising electromagnetic inductive and capacitive and dielectrometer sensors, probes and sensor arrays, computer hardware, impedance analyzers, and data acquisition and analysis software, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metal, composites and ceramics, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of adhesives and metallic, graphite composite, ceramic, glass, paper, epoxy, and plastic parts, field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as cure states, stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, moisture content, porosity, contamination and residual protective capacity for filter materials

61.

MWM

      
Serial Number 75495566
Status Registered
Filing Date 1998-06-03
Registration Date 2000-12-26
Owner JENTEK Sensors, Inc. ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

magnetometer sensors, probes and sensor arrays, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metals and graphite composites, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of metallic and graphite composite parts field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, porosity, and contamination