A three-dimensional PBF-AM apparatus reflecting one aspect of the present invention includes a stage, a beam emitter, a beam deflector, and a control apparatus. The beam deflector deflects a beam emitted from the beam emitter. The control apparatus controls the beam deflector. The control apparatus determines a next irradiation position, which is a position to be irradiated with the beam, next based on a rank assigned to each of unirradiated positions that have not yet been irradiated with the beam. Further, the control apparatus controls the beam deflector to irradiate the next irradiation position with the beam. The rank is determined based on a molten state around each of the unirradiated positions and is updated every time the beam is emitted.
B22F 10/36 - Process control of energy beam parameters
B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
B22F 12/41 - Radiation means characterised by the type, e.g. laser or electron beam
B22F 12/90 - Means for process control, e.g. cameras or sensors
B28B 1/00 - Producing shaped articles from the material
B28B 17/00 - Details of, or accessories for, apparatus for shaping the materialAuxiliary measures taken in connection with such shaping
B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
B29C 64/268 - Arrangements for irradiation using laser beamsArrangements for irradiation using electron beams [EB]
B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
A three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus includes a build plate, a powder supply device, an irradiation device, a detection unit, and a shielding member. The powder supply device supplies a powder material to the build plate to form a powder layer. The irradiation device irradiates the powder layer with a primary ray. The detection unit detects backscattered electrons generated when the powder material is irradiated with the primary ray. The shielding member openably and closably covers a detection surface of the detection unit.
There is provided an observation instrument capable of reducing drift of a sample. The observation instrument is used for observation of the sample and includes a sample stage and a controller for controlling the sample stage. The sample stage has a sample support base on which the sample is placed, a first drive mechanism for displacing the sample support base relative to a first axis, and a second drive mechanism for displacing the sample support base relative to a second axis different from the first axis. If the first drive mechanism is caused to perform a first operation for displacing the sample support base relative to the first axis, the controller causes the second drive mechanism to perform a second operation for reducing such drift of the sample support base relative to the second axis that is concomitant with the first operation.
There is provided an evaluation method of evaluating the density of a sample. The evaluation method starts with acquiring a backscattered electron spectrum from the sample. Then, an elastically scattered peak of the spectrum is separated into a plurality of minor peaks by waveform separation. Information about the positions and widths of the minor peaks is derived. The chemical elements making up the sample are identified from the positions and widths of the minor peaks.
A composite image includes an overhead image, a flow image, and a report. The overhead image includes a plurality of marks representing a plurality of measurement regions. The flow image includes a plurality of graphics arranged along a main flow direction. Of the plurality of graphics, a multi-graphic includes a plurality of symbols arranged along a sub flow direction. As the report, a provisional report or an actual report is displayed.
A lithography system for drawing patterns on a substrate (2) by irradiating the substrate with a beam of charged particles includes a stage for supporting the substrate, at least one conduction pin (16, 26) for connecting the substrate to a reference potential, and at least one actuator (12, 22) for moving the respective conduction pin. The at least one actuator (12, 22) is configured to move the respective conduction pin (16, 26) between a position where it contacts the substrate and a position where it does not contact the substrate. A resistance measurement circuit can measure the resistance between the first and second conduction pins, and if the resistance value is not less than a threshold value, the actuators are operated so as to lower the resistance value below the threshold value.
H01J 37/302 - Controlling tubes by external information, e.g. programme control
H01J 37/317 - Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. ion implantation
9.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
A beam emitter of a three-dimensional powder bed fusion additive manufacturing apparatus reflecting one aspect of the invention irradiates a powder layer spread on a stage with a beam. A beam deflector deflects the beam emitted from the beam emitter. A controller controls the beam deflector. A point to be irradiated with the beam next in the powder layer is defined as a next irradiation point, and points that have been irradiated with the beam and solidified are defined as solidified points. The controller controls the beam deflector to irradiate at least one solidified point adjacent to the next irradiation point with the beam and then irradiate the next irradiation point with the beam, or to irradiate the next irradiation point with the beam and then irradiate at least one solidified point adjacent to the next irradiation point with the beam before the next irradiation point is solidified.
B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
10.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method of Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
A three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus includes a build plate, a powder supply device, a beam irradiation device, a plurality of detection units, and a control unit. The control unit controls the irradiation device. In addition, when acquiring electrons, the control unit controls the irradiation device in a manner that only a predetermined irradiation range in the powder layer is irradiated with the primary ray.
B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
11.
Magnetic Optical Trap Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
According to the present invention, atoms are trapped by a quadrupole magnetic field formed by ring-shaped magnets and three sets of laser beam pairs. A portion of the laser beam pairs is partially blocked by the ring-shaped magnets, , so that a region which is a non-atom trap space is formed inside an intersecting region where the three groups of laser beam pairs cross. The inside of the intersecting region is irradiated with a laser beam so that atoms within the non-atom catch space are extracted from the intersecting region.
G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
H03L 7/26 - Automatic control of frequency or phaseSynchronisation using energy levels of molecules, atoms, or subatomic particles as a frequency reference
12.
Image Acquisition Method and Scanning Transmission Electron Microscope
Provided is an image acquisition method of acquiring an image of a crystalline specimen in a scanning transmission electron microscope. The scanning transmission electron microscope includes an electron source; an illumination system including a condenser lens, an aperture, and an illumination system deflector; a specimen stage; an imaging apparatus capable of photographing a Ronchigram formed on a diffraction plane; and an imaging system deflector. The method includes aligning a center of the Ronchigram with a center of a detector plane of the imaging apparatus; aligning a direction of incidence of the electron beam with respect to the specimen with a crystal zone axis of the specimen by aligning a shadow of the aperture with the crystal zone axis on the diffraction plane; and causing the imaging system deflector to deflect the electron beam to align the electron beam with the center of the detector plane of the imaging apparatus.
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
G01N 23/20058 - Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
H01J 37/147 - Arrangements for directing or deflecting the discharge along a desired path
H01J 37/22 - Optical or photographic arrangements associated with the tube
H01J 37/28 - Electron or ion microscopesElectron- or ion-diffraction tubes with scanning beams
An angle calculator calculates, for each coordinate in a beam scanning range, an angle representing an orientation of a plane based on an intensity distribution. A normalizer multiplies an angle array produced by the angle calculator by a numerical value corresponding to a shape of interest (for example, a needle shape or a string shape). A particle-of-interest analyzer analyzes whether a candidate particle is a particle of interest, based on a group of normalized angles corresponding to the candidate particle.
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
G06T 5/40 - Image enhancement or restoration using histogram techniques
H01J 37/22 - Optical or photographic arrangements associated with the tube
H01J 37/28 - Electron or ion microscopesElectron- or ion-diffraction tubes with scanning beams
14.
STABLE ISOTOPE-LABELED CYSTEINYLDOPA AND ANALYSIS METHOD
13477 independently of one another represent C or 1388 represents CH, CD, 13CH, or 13922, 2, 1322, 13CHD, or 13211' represents C or 1322' represents CH, CD, 13CH, or 133222, 1322, 13CHD, or 1321122 or 15211 represents O or 18244 represent OH or 1811' represents O or 1822' represents OH or 18OH; and n represents 1 or 2.]
C07C 323/62 - Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and carboxyl groups bound to the same carbon skeleton having the sulfur atom of at least one of the thio groups bound to a carbon atom of a six-membered aromatic ring of the carbon skeleton
G01N 27/62 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode
15.
Automated Analyzer and Method of Controlling Automated Analyzer
An automated analyzer includes a first turntable that holds a plurality of pre-treatment containers; a first dispensing probe that dispenses a specimen and pre-treatment liquid into one of the pre-treatment containers and generates a pre-treated specimen; a second turntable that holds a plurality of reaction containers; a second dispensing probe that sucks the pre-treated specimen from one of the pre-treatment containers and dispenses the pre-treated specimen into one of the reaction containers; a measurement unit that measures the pre-treated specimen stored in one of the reaction containers; a management unit that determines an order in which the pre-treated specimen stored in one of the pre-treatment containers is dispensed by the second dispensing probe when the pre-treated specimen becomes dispensable into one of the reaction containers; and a control unit that causes the second dispensing probe to dispense the pre-treated specimen in accordance with the order determined by the management unit.
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
There is provided a focused ion beam system having a sample chamber which can be effectively used. The focused ion beam system includes an electron optical column having an optical system for directing an ion beam at a sample; a sample chamber in which the sample is placed and which can be maintained in a vacuum state; a sample holder having a shaft and a sample holding portion which is formed in a front end of the shaft and which is operative to hold the sample; and a sample stage assembly for detachably holding the sample holder. The sample stage assembly has a first drive mechanism for moving the sample holder and a second drive mechanism for moving the sample holder and the first drive mechanism as a unit along an axis of the shaft.
A charged particle beam apparatus includes a measurement unit that scans a sample with a charged particle beam to capture a sample image; an image acquisition unit that acquires a plurality of sample images captured by the measurement unit from a plurality of regions of the sample, and acquires a feature image that is an image of a feature object contained in the sample from each of the plurality of sample images; and an analysis unit that acquires information on the feature object based on the feature image. The image acquisition unit acquires a plurality of feature images by repeating: processing of selecting one mode from among a plurality of modes to acquire the feature image based on a proportion of a region of the feature object occupying a field of view in an acquired sample image; and processing of acquiring the feature image in the selected mode.
H01J 37/28 - Electron or ion microscopesElectron- or ion-diffraction tubes with scanning beams
H01J 37/22 - Optical or photographic arrangements associated with the tube
H01J 37/26 - Electron or ion microscopesElectron- or ion-diffraction tubes
18.
Atom Beam Generation Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
A sample reservoir containing a sample, a nozzle, and a heated element are arranged in a vacuum chamber. An induction coil is located on the outside of the vacuum chamber. The heated element is located around the sample reservoir and the nozzle. Electromagnetic power is wirelessly transferred from the induction coil to the heated element, whereby the heated element is heated. Heating of the heated element causes the sample reservoir and the nozzle to be heated, whereby the sample in the sample reservoir is heated. An atomic beam generated by the heating of the sample is emitted from the nozzle.
A transmission electron microscope includes an illumination system that illuminates a specimen with an electron beam; an imaging system that forms an image using the electron beam that has been transmitted through the specimen; a detector that captures the image formed by the imaging system; and an arithmetic unit that classifies the image captured by the detector. The arithmetic unit: acquires a first image captured by the detector; calculates an average value and a standard deviation of first pixel values of a plurality of first pixels composing the first image; acquires information of an average value and a standard deviation of second pixel values of a plurality of second pixels composing a second image captured in a state in which no electron beam is detected; and classifies the first image based on the average value and the standard deviation of the first pixel values and second pixel values.
G06V 10/75 - Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video featuresCoarse-fine approaches, e.g. multi-scale approachesImage or video pattern matchingProximity measures in feature spaces using context analysisSelection of dictionaries
G06V 10/764 - Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
G06V 10/98 - Detection or correction of errors, e.g. by rescanning the pattern or by human interventionEvaluation of the quality of the acquired patterns
In order to perform shaping control in accordance with a molten state of a shaping surface in three-dimensional additive manufacturing, provided is a three-dimensional additive manufacturing system that performs additive manufacturing by using a shaping beam in a vacuum. The three-dimensional additive manufacturing system is characterized by comprising: a thermal electron detection unit that detects an amount of thermal electrons emitted from the shaping surface by irradiating the shaping surface with the shaping beam; and a control unit that controls the operation of the shaping beam in accordance with the amount of thermal electrons. Also provided are a control method therefor and a control program therefor.
There is provided a jig which permits a sample to be mounted on a sample holder easily. The jig is used to mount the sample on the sample holder that is used for an ion milling apparatus which mills the portion of the sample protruding from a shielding material by irradiating the sample with an ion beam via the shielding material. The jig includes a holder support portion providing support of the sample holder on which the shielding material is mounted; and a guide assembly having rails and a slider assembly capable of moving along the rails and operative to move the sample to the sample holder.
A charged particle beam system includes a sample chamber; a pre-evacuation chamber that is connected to the sample chamber; a first evacuation pump that has a first port connected to the sample chamber, and a second port connected to the pre-evacuation chamber; a second evacuation pump that is connected to the pre-evacuation chamber, an evacuation port, and the sample chamber; and a controller. The controller performs when a sample is introduced into the pre-evacuation chamber, a process of causing the second evacuation pump to evacuate the pre-evacuation chamber; a process of making a determination of whether a vacuum degree inside the pre-evacuation chamber has reached a first vacuum degree, based on power of the second evacuation pump; and a process of causing the first evacuation pump to evacuate the pre-evacuation chamber when the vacuum degree inside the pre-evacuation chamber is determined to have reached the first vacuum degree.
In various embodiments of the invention, a cooled nuclear magnetic resonance (NMR) probe can utilize a sliding band capacitor which can be moved relative to a parent coil inner conductance tapered skirt to adjust the frequency of the parent coil to allow the parent coil to detect the resonance of at least two nuclei without requiring leads between the parent coil and a lock coil. In this manner a cooled NMR probe can be provided without the disadvantages of prior art cooled NMR probes. In an embodiment of the invention, the sliding band capacitor comprises a diamagnetic insulator with a first volume magnetic susceptibility, at least one paramagnetic metal with a second volume magnetic susceptibility and at least one diamagnetic metal with a third volume magnetic susceptibility, where the sum of the first volume magnetic susceptibility, the second volume magnetic susceptibility and the third volume magnetic susceptibility is approximately zero.
A charged particle beam system includes a chamber; a charged particle source unit that has a charged particle source; a supporting member that is provided on a side wall of the chamber and detachably supports the charged particle source unit inside the chamber; and a chamber door that is provided on the side wall of the chamber for access to an interior of the chamber.
In various embodiments of the invention, a cooled-NMR probe can utilize a non-tapered sliding band capacitor which can be moved relative to the inner conducting skirt of a parent coil to adjust the inductance of the parent coil and thereby the frequency of the parent coil to allow the parent coil to detect the resonance of at a nucleus without requiring leads between the parent coil and a lock coil. The cooled-NMR probe can be provided without the disadvantages of prior art cooled-NMR probes. In an embodiment of the invention, the sliding band capacitor comprises a diamagnetic insulator with a first volume magnetic susceptibility, at least one paramagnetic metal with a second volume magnetic susceptibility and at least one diamagnetic metal with a third volume magnetic susceptibility, where the sum of the first volume magnetic susceptibility, the second volume magnetic susceptibility and the third volume magnetic susceptibility is approximately zero.
A scanning transmission electron microscope includes an electron source that generates an electron beam, an optical system that has a condenser lens, an aperture, and an objective lens and forms an electron probe by condensing the electron beam generated by the electron source, and a control unit that controls the electron source and the optical system. The control unit performs processing of: inserting the aperture into a path of the electron beam; setting the acceleration voltage to a first voltage value and obtaining a first STEM image, in a state in which the aperture is inserted; setting the acceleration voltage to a second voltage value that is different from the first voltage value and obtaining a second STEM image, in a state in which the aperture is inserted; and moving the aperture based on position deviation between the first STEM image and the second STEM image.
There is provided a charged particle beam system into which a sample can be easily introduced. The charged particle beam system includes a sample holder for holding the sample; a body portion equipped both with an optical system for irradiating the sample with a charged particle beam and with a holder support portion having an insertion port into/from which the sample holder can be inserted and removed; and a housing containing the body portion. The housing is provided both with a recessed portion and with an opening portion permitting the sample holder to gain access to the insertion port, the recessed portion having a bottom where the opening portion is formed. The housing also has a lighting device for illuminating the bottom of the recessed portion.
An automatic analyzer includes a diluted specimen cell turntable, a plurality of reaction lines, and a diluted specimen dispensing unit. The diluted specimen cell turntable has a plurality of diluted specimen cells that contains a diluted specimen. The plurality of reaction lines is supplied with the diluted specimen, in which the diluted specimen is reacted with a reagent. The diluted specimen dispensing unit supplies the diluted specimen contained in the diluted specimen cell of the diluted specimen cell turntable to the plurality of reaction lines. The diluted specimen dispensing unit supplies the diluted specimen from one diluted specimen line provided in the diluted specimen cell turntable to the plurality of reaction lines.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
There is provided a focused ion beam (FIB) system capable of exhausting gas remaining in a nozzle. The FIB system is operative to mill a sample by irradiating it with an ion beam and includes the nozzle for blowing the gas from a blowoff port against the sample (to deposit a film, and a tank for supplying the gas into the nozzle. The nozzle is provided with exhaust holes for exhausting the gas in the nozzle.
A plurality of measurement intervals are set on a retention time axis based on a plurality of compound peak observation periods. A start time and a completion time of each measurement interval are corrected so as to prevent occurrence of a blank period (remainder time) between two measurement intervals which are timewise adjacent to each other, to thereby determine an actual start time and an actual completion time of each measurement interval after correction. Specifically, the actual start time of an ith cycle measurement interval is made to coincide with the actual completion time of an (i−1)th cycle measurement interval.
A pressure control equipment changes a pressure in a tank from an initial pressure (atmospheric pressure) to a first pressure (negative pressure), so as to cause a liquid coolant from an external container to be injected into the tank. After a certain amount of the liquid coolant is injected into the tank, the pressure control equipment causes the pressure in the tank to change from the first pressure to a second pressure (atmospheric pressure). Then, after a settling period, spontaneous bumping is caused in the liquid coolant in the tank. Due to the spontaneous bumping, the pressure in the tank is rapidly, temporarily increased, and bubbles in the liquid coolant in the tank liquefy. With this process, cavities are deactivated.
There is provided a liquid feeder using a liquid container having a reduced number of ports than conventional. The liquid feeder can reduce the operational burden on the user. The liquid feeder includes the liquid container and a container holding portion that holds the liquid container. The liquid container has a container body, a sealing member, and a cap. The container holding portion has a cap receiving portion and a needle. The sealing member is made of a resilient material and has slitted portions. The cap is made of a hard material and has a cover portion that is disposed opposite to the sealing member. The cover portion is so configured as to be split along groove portions when the needle pushes against the cover portion. The slitted portions of the sealing member are spread apart when the needle pushes against the sealing member.
A first drive mechanism of a dispensing probe device moves a first support arm in a vertical direction and rotates the first support arm in a horizontal direction. The second drive mechanism moves a second support arm in the vertical direction and rotates the second support arm in the horizontal direction. A distance from a rotation center of the first support arm to a second dispensing probe in the horizontal direction is longer than a distance from a rotation center of the second support arm to the second dispensing probe in the horizontal direction. A fan shape having an arc formed by a trajectory of one end of the second support arm that is far from the rotation center of the second support arm is included in a fan shape having an arc formed by a trajectory of the second dispensing probe.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
35.
Evaluation Apparatus, System, and Evaluation Method
An evaluation apparatus includes an acquiring unit configured to acquire information on a change amount of an absorbance per unit time. The change amount is obtained by a measurement method including causing a peroxidase to act on hydrogen peroxide, which is produced by solubilizing a low-density lipoprotein (LDL) in a specimen with a surfactant that acts on the LDL, and subjecting the resultant to an oxidation reaction with a cholesterol oxidase, to introduce the hydrogen peroxide to a color reaction, followed by measurement of a change of the absorbance with time. The evaluation apparatus also includes an evaluating unit configured to evaluate an amount of an oxidized LDL in the specimen based on the change amount.
C12Q 1/60 - Measuring or testing processes involving enzymes, nucleic acids or microorganismsCompositions thereforProcesses of preparing such compositions involving cholesterol
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glasswareDroppers
C12Q 1/26 - Measuring or testing processes involving enzymes, nucleic acids or microorganismsCompositions thereforProcesses of preparing such compositions involving oxidoreductase
C12Q 1/28 - Measuring or testing processes involving enzymes, nucleic acids or microorganismsCompositions thereforProcesses of preparing such compositions involving oxidoreductase involving peroxidase
36.
Magneto-Optical Trap Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
In this magneto-optical trap device, five laser beams are irradiated in a trap space in which atoms are trapped. Of the five laser beams, three laser beams (laser beams a1, a2, a3) pass through the inside of the same plane (Z plane) and are irradiated in the trap space. The two laser beams that intersect that plane (laser beams a4, a5) are irradiated in the trap space. The laser beam a1 is used together as a slowing laser beam b for Zeeman slower.
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
G06N 10/40 - Physical realisations or architectures of quantum processors or components for manipulating qubits, e.g. qubit coupling or qubit control
G21K 1/00 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
H03L 7/26 - Automatic control of frequency or phaseSynchronisation using energy levels of molecules, atoms, or subatomic particles as a frequency reference
37.
Charged Particle Gun and Charged Particle Beam System
There is provided a charged particle gun capable of increasing the number of charged particles contained in each pulse. The charged particle gun operates to emit a charged particle beam and includes: an emitter, an extraction electrode for extracting the charged particle beam from the emitter, a capacitor having one end connected to the extraction electrode, an offset power supply for supplying a first voltage to the one end of the capacitor via a resistor, a pulsed power supply providing an output of a second voltage, and a switch circuit that switches between whether the second voltage or a reference potential is supplied to the other end of the capacitor, based on a reference pulsed signal.
A derivatization reagent comprising a compound represented by Formula (1):
A derivatization reagent comprising a compound represented by Formula (1):
RR′CO (1),
A derivatization reagent comprising a compound represented by Formula (1):
RR′CO (1),
In Formula (1), R and R′ are each independently a hydrogen atom, a substituted or unsubstituted alkyl group having 1 to 11 carbon atoms, or a substituted or unsubstituted aryl group having 1 to 11 carbon atoms.
A focused ion beam (FIB) system capable of preventing a film from being deposited thickly on the surface of a sample The FIB system operates to mill the sample by irradiating it with an ion beam. The FIB system includes an FIB column through which the ion beam is directed at the sample; a nozzle having a blowoff port for blowing a gas against the sample to deposit the film; a sample stage providing mechanical support of the sample; a shield member for impeding the flow of the gas; and a shield support member. The shield member is movable to a shield position located between the blowoff port and the sample. The shield member is also movable to a retractive position not located therebetween. The shield member support mechanism supports the shield member so that it can move between the shield position and the retractive position of the shield member.
C23C 14/22 - Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
C23C 14/54 - Controlling or regulating the coating process
H01J 37/305 - Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
40.
Atom Beam Generation Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
An atom beam generation device includes an atomic oven including a reservoir in which a sample is contained, a deceleration unit, and coil units. The deceleration unit includes a bore through which an atomic beam and a slowing laser beam pass, and decelerates an atomic beam emitted from the atomic oven by means of slowing laser beam and a magnetic field. The coil units supply Joule heat to the atomic oven, and generate a magnetic field in the deceleration unit.
H05H 3/02 - Molecular or atomic-beam generation, e.g. resonant beam generation
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
41.
Build Data Generating Device, Three-Dimensional Powder Bed Fusion Additive Manufacturing System, and Cumulative Energy Density Distribution Display Method
Provided is a build data generating device that generates build data for controlling a three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus that manufactures an article by melting a cross-sectional shape of each layer by irradiation of a beam. The build data generating device includes: a display control unit that generates data indicating a distribution of an irradiation energy density accumulated in a target layer by beam scanning for the target layer based on the build data and outputs the data to a display device.
B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
B29C 64/153 - Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
A superconducting coil device includes a superconducting coil and adhesive layer. The superconducting coil includes a superconducting wire wound into a coil shape. An electrical conductivity is imparted to the adhesive layer. The adhesive layer constitutes at least a part of a current bypass for the superconducting coil. The adhesive layer includes a binder. The adhesive layer includes a resistance-decrease suppression structure that imparts the electrical conductivity to the adhesive layer while suppressing a decrease in contact resistance with the superconducting wire.
H01F 6/02 - QuenchingProtection arrangements during quenching
H01F 6/06 - Coils, e.g. winding, insulating, terminating or casing arrangements therefor
43.
Build Data Generating Device, Three-Dimensional Power Bed Fusion Additive Manufacturing System, and Three-Dimensional Power Bed Fusion Additive Manufacturing Method
Even when shape elements having opposing appropriate manufacturing conditions are mixed in one cross-sectional shape, the entire cross-sectional shape is manufactured under an appropriate manufacturing condition. A build data generating device generating build data for controlling a three-dimensional powder bed fusion additive manufacturing apparatus that manufactures an article by melting a cross-sectional shape of each layer by irradiation of a beam includes: a region segmentation unit that performs processing for segmenting the cross-sectional shape cut out from three-dimensional shape data of the article into a fine region and a coarse region; and a condition application unit that applies different manufacturing conditions to the fine region and the coarse region segmented by the region segmentation unit to generate the build data.
B22F 10/85 - Data acquisition or data processing for controlling or regulating additive manufacturing processes
B22F 10/28 - Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
B22F 10/36 - Process control of energy beam parameters
B22F 12/90 - Means for process control, e.g. cameras or sensors
B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
44.
Build Data Generating Device, Three-Dimensional Powder Bed Fusion Additive Manufacturing System, and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
Provided is a technique capable of reducing variation in density of scanning lines when generating the scanning lines for manufacturing an article by three-dimensional powder bed fusion additive manufacturing. A build data generating device generates build data for controlling the three-dimensional powder bed fusion additive manufacturing apparatus that melts the cross-sectional shape of each layer by irradiation of a beam to manufacture the article. The build data generating device includes a build data generating unit that generates a plurality of scanning lines in a region of the cross-sectional shape cut out from three-dimensional shape data of the article by a predetermined beam scanning method, and generates correction scanning lines in a portion where the arrangement of the scanning lines becomes sparse and/or a portion where the arrangement of the scanning lines becomes dense.
An information processing apparatus includes: an irradiation point output unit configured to output an irradiation point of a manufacturing beam read from a manufacturing file to a display unit; a position specifying unit configured to specify a position of the irradiation point designated by an input unit; and a melting condition output unit 65 configured to search the manufacturing file for a melting condition of the irradiation point at the specified position and output the searched melting condition to the display unit.
A sample coil for NMR detection includes a first coil unit and a second coil unit placed with a sample therebetween. In the first coil unit, a first coil and a second coil are formed on a first plane of a first substrate. In the second coil unit, a third coil and a fourth coil are formed on a second plane of a second substrate. Each of the coils is a superconducting coil. When viewed from an x direction orthogonal to the first plane and the second plane, the first coil and the second coil do not intersect the sample, and, similarly, the third coil and the fourth coil do not intersect the sample.
G01N 24/08 - Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
G01R 33/34 - Constructional details, e.g. resonators
An electron microscope includes an electron optical system that irradiates a sample with an electron beam to form an image with electrons transmitted through the sample, a camera that includes an image sensor having sensor pixels and captures frame images that are based on output values output from each of the sensor pixels by incidence of the electrons on the image sensor, and a correction coefficient calculation unit that calculates correction coefficients for correcting sensitivities of the sensor pixels. The correction coefficient calculation unit determines, from the frame images captured under a condition under which the electrons incident on the image sensor follow a Poisson process, a mode value of the output values for each of the sensor pixels, and calculates the correction coefficients based on the mode value determined for each of the sensor pixels.
A spectrum processing device includes a data acquiring unit configured to acquire, for each of pixels expressing positions on a specimen, spectrum imaging data in which a pixel spectrum based on a signal from the specimen is stored; an extraction unit configured to compare, for each of the pixels, the pixel spectrum and a representative spectrum selected from the spectrum imaging data, and extract a plurality of the pixel spectra from the spectrum imaging data, based on a comparison result; and a spectrum generating unit configured to generate a phase spectrum, based on the plurality of the extracted pixel spectra.
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods
49.
Charged Particle Beam Apparatus and Camera Image Displaying Method
During an ascending process of a specimen unit, a camera image including a height guide is displayed. A display magnification controller increases a display magnification of the camera image in response to a representative height of the specimen unit having reached a magnification changing height. A protrusion amount computing unit computes a protrusion amount of a specimen from a specimen holder based on a height of the specimen holder at the time of accepting registration operation.
A multivariable analyzer executes multivariable analysis on a data set formed from a plurality of spectrograms acquired from a plurality of samples, and identifies a primary component of the data set, as a result of the multivariable analysis. Each spectrogram has a first coordinate system. A distribution generator generates a loading distribution corresponding to the primary component, as a result of the multivariable analysis. A plot generator generates a loading plot having a second coordinate system, based on the loading distribution. The second coordinate system is identical to the first coordinate system.
G16B 40/10 - Signal processing, e.g. from mass spectrometry [MS] or from PCR
G16H 50/20 - ICT specially adapted for medical diagnosis, medical simulation or medical data miningICT specially adapted for detecting, monitoring or modelling epidemics or pandemics for computer-aided diagnosis, e.g. based on medical expert systems
A retention index is calculated based on a detection time (more specifically, retention time) of a compound. A molecular weight range and a number-of-carbon-atoms range are specified based on the retention index. A search range is determined by the molecular weight range. A molecular peak searcher searches for a molecular peak in the search range which is set on a mass spectrum of the compound. A composition estimator estimates a composition of the compound based on an accurate mass specified from the molecular peak. In this process, the number-of-carbon-atoms range is taken into consideration.
An analysis device includes an electron beam source that irradiates a sample with a charged particle beam, and a detection unit having a plurality of detection regions that detects electrons emitted from the sample irradiated with the charged particle beam. The analysis device includes an arithmetic processing unit 100 that performs predetermined arithmetic processing on strength distribution of a plurality of detection signals respectively detected by the plurality of detection regions.
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
A superconducting magnet device includes a magnet device body including a superconducting magnet, a magnet support, a refrigerator, a refrigerator support, and a coupling member. The magnet support supports the magnet device body such that the magnet device body is disposed above an installation surface. The refrigerator support supports the refrigerator from below such that the refrigerator is disposed above the installation surface. The coupling member couples the refrigerator support and the magnet support at a position above the installation surface.
F25D 19/00 - Arrangement or mounting of refrigeration units with respect to devices
G01R 33/3815 - Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets with superconducting coils, e.g. power supply therefor
54.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method for Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
A three-dimensional PBF-AM apparatus includes a build plate, a powder supply device, a beam irradiation device, a plurality of detection units, and a control unit. The control unit has a plurality of arithmetic expressions. Then, the control unit selects, according to a build step, a predetermined arithmetic expression from the plurality of arithmetic expressions, uses the selected arithmetic expression to perform arithmetic processing on a plurality of backscattered electron signals, and calculates an arithmetic signal.
B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
B33Y 50/02 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
55.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method for Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
A three-dimensional PBF-AM apparatus includes a build plate; a powder supply device; a beam irradiation device; a detection unit; and a control unit that controls the powder supply device and the beam irradiation device. The control unit acquires a post-melting-of-preceding-layer backscattered electron signal that is a backscattered electron signal detected by the detection unit after the powder material was melted by the electron beam in the step of building the layer preceding the current layer. Then, based on the post-melting-of-preceding-layer backscattered electron signal, the control unit sets conditions for controlling the beam irradiation device in the melting step in the step of building the current layer.
A sample holder used for a sample processing apparatus that applies a charged particle beam to a sample to process the sample. The sample holder includes a holder base thermally connected to a cooling source, a rotating body rotatably supported on the holder base to hold the sample, and a drive unit that rotates the rotating body. The rotating body has a sliding surface that comes into slidable surface contact with the holder base.
A pyrolysis product library formed from a plurality of groups of predicted mass spectra corresponding to a plurality of resin candidates is created using a prediction model. An information processing unit generates a plurality of measured mass spectra corresponding to a plurality of compounds generated due to pyrolysis of a resin sample. Next, the information processing unit searches through the pyrolysis product library based on the plurality of measured mass spectra, to thereby judge one or a plurality of contained resins contained in the resin sample.
H01J 49/00 - Particle spectrometers or separator tubes
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
58.
Electron Microscope, Aberration Correction Method, And Imaging Method
An electron microscope includes an electron optical system, and a control unit that controls the electron optical system. The control unit performs processing for determining a standard deviation of a brightness distribution of an electron microscope image; processing for determining an optimum value of a parameter of the electron optical system such that the standard deviation becomes the maximum, by Gaussian process regression; and processing for capturing the electron microscope image with setting a value of the parameter to the optimum value. The control unit repeats the processing for determining the standard deviation, the processing for determining the optimum value, and the processing for capturing the electron microscope image to determine a value of the parameter.
A specimen holder includes a holder main body, a specimen mount to which a specimen is to be fixed, and a pressing member which slidably presses the specimen mount against the holder main body. A through-hole is provided in the specimen mount, and the specimen mount is tilted with respect to the holder main body by tilting a rod-like member which is inserted into the through-hole.
Based on quantification ion peaks and identification ion peaks derived from a plurality of compounds, a plurality of first errors (or retention time errors) and a plurality of second errors (or peak ratio errors) are calculated. In a coordinate system with a first error axis and a second error axis, a plurality of elements representing error sets composed of the first errors and the second errors are plotted, and a chart is thereby created.
There is provided a shield plate fabrication apparatus capable of fabricating a shield plate easily. The shield plate is included in a sample milling apparatus which mills a sample by shielding a part of the sample with the shield plate and irradiating the sample with a charged particle beam. The fabrication apparatus includes: a base plate holding shaft for rotatably holding a base plate and winding tape around the base plate; and a tension mechanism for applying tension to the tape while it is being wound around the base plate.
B65H 35/00 - Delivering articles from cutting or line-perforating machinesArticle or web delivery apparatus incorporating cutting or line-perforating devices, e.g. adhesive tape dispensers
B65H 59/06 - Adjusting or controlling tension in filamentary material, e.g. for preventing snarlingApplications of tension indicators by regulating delivery of material from supply package by devices acting on material leaving the package
H01J 37/09 - DiaphragmsShields associated with electron- or ion-optical arrangementsCompensation of disturbing fields
62.
Collision Judgment Apparatus, Recording Medium Recording Program, and Collision Judgment Method
Based on a three-dimensional model of a dynamic object having a position which changes, point group information which represents, with a group of points, a three-dimensional shape of the dynamic object is generated. Based on a three-dimensional model of a static object having a position which does not change, point group information representing, with a group of points, a three-dimensional shape of the static object is generated. Based on the point group information of the static object, voxel group information which represents, with a group of voxels, the three-dimensional shape of the static object, and which is formed into a database is generated. Presence or absence of overlap between the dynamic object and the static object is judged by collating voxel group information representing the static object which is present on a movement path of the dynamic object, and point group information representing the dynamic object.
H01J 37/26 - Electron or ion microscopesElectron- or ion-diffraction tubes
63.
Slow Atomic Beam Generator, Physical Package, Physical Package For Optical Lattice Clock, Physical Package For Atomic Clock, Physical Package For Atomic Interferometer, Physical Package For Quantum Information Processing Device, And Physical Package System
A high-temperature tank includes an optical window which transmits a laser and is provided at one end, and a right-angle conical mirror which is provided at the other end, has an opening at the apex, and which reflects laser light incident from the optical window towards the one end in an area other than opening. A magnetic field generator generates a magnetic field in the region of intersection of the laser reflected by the right-angle conical mirror. A magnetic field gradient attenuation module locally attenuates the gradient of the magnetic field generated by the magnetic field generator.
H03L 7/26 - Automatic control of frequency or phaseSynchronisation using energy levels of molecules, atoms, or subatomic particles as a frequency reference
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
An angle adjustment mechanism has a block, a projecting piece, and a connection mechanism. The projecting piece is fixed to a stator. The connection mechanism has elongated holes provided in the block and a shaft member provided in the projecting piece. The shaft member is inserted in the elongated holes. During a tilt angle adjustment process, the shaft member is caused to move in a sliding motion in the elongated holes. During a cooling process, the shaft member is also caused to move in a sliding motion in the elongated holes.
There is provided an electron microscope capable of reducing variations of aberrations due to thermal variations. The electron microscope includes an electron optical system having a built-in aberration corrector equipped with multipole elements each for producing a multipolar field. Each multipole element includes a plurality of magnetic polepieces. Each polepiece includes a magnetic core, a first coil wound around the core, and a second coil wound around the core. The first coil and the second coil produce a first multipolar field and a second multipolar field, respectively, when energized. The first and second multipolar fields are identical in terms of symmetry.
An analyzing method using an analyzer including a wavelength-dispersive X-ray spectrometer that has an analyzing element to analyze an X-ray emitted from a specimen and detects an X-ray of energy corresponding to a position of the analyzing element. The analyzing method includes acquiring a plurality of map data by repeatedly performing a mapping analysis while changing the position of the analyzing element, the mapping analysis being an analysis to detect an X-ray of specific energy with the position of the analyzing element fixed to acquire map data while scanning the specimen with an electron beam; and generating, based on the plurality of map data, a spectrum map in which a position on the specimen and an X-ray spectrum are associated with each other.
G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
H01J 37/147 - Arrangements for directing or deflecting the discharge along a desired path
67.
ADDITIVE MANUFACTURING DEVELOPMENT METHOD AND THREE-DIMENSIONAL ADDITIVE MANUFACTURING SYSTEM
An additive manufacturing development method includes predicting a defect that occurs in a product based on a combination of a plurality of design data and a plurality of manufacturing conditions, collecting defect detection data for defect detection by monitoring the product during manufacturing in accordance with the combination of the plurality of design data and the plurality of manufacturing conditions, and generating a process map in which the plurality of manufacturing conditions are plotted using the predicted defect and the collected defect detection data. The method further includes collecting defect repair data for defect repair by monitoring the product during manufacturing and repairing a defect detected from the product, and storing the defect and the defect repair data in association with each other using the defect repair data and a repair result.
A method of adjusting a charged particle optical system in a charged particle beam apparatus provided with the charged particle optical system including an aberration corrector in which multipole elements disposed in three or more stages and transfer optical systems are alternately disposed. The method includes adjusting aberration using at least two of the multipole elements without using at least one of the multipole elements, and adjusting parameters of the charged particle optical system other than aberration using at least one of the transfer optical systems that is not disposed between the at least two of the multipole elements used.
A stable isotope-labeled indole carboxylic acid compound represented by Formula (I) is provided. In Formula (I), X1 to X8 are each independently C or 13C; Y is N or 15N; M is H, Na, K, Li, CH3, or C2H5; R1 is H or D; R2 is H, CH3, 13CH3, C2H5, or 13C2H5; R3 is H, CH3, 13CH3, C2H5, or 13C2H5; R4 is H or D; and R5 is H or D.
A stable isotope-labeled indole carboxylic acid compound represented by Formula (I) is provided. In Formula (I), X1 to X8 are each independently C or 13C; Y is N or 15N; M is H, Na, K, Li, CH3, or C2H5; R1 is H or D; R2 is H, CH3, 13CH3, C2H5, or 13C2H5; R3 is H, CH3, 13CH3, C2H5, or 13C2H5; R4 is H or D; and R5 is H or D.
G01N 33/574 - ImmunoassayBiospecific binding assayMaterials therefor for cancer
C07D 209/42 - Carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals
G01N 33/96 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving blood or serum control standard
70.
Atom Beam Generation Device, Physical Package, Optical Lattice Clock Physical Package, Atomic Clock Physical Package, Atomic Interferometer Physical Package, Quantum Information Processing Device Physical Package, and Physical Package System
An atomic oven includes a cartridge and a main body. The cartridge includes a holder that accommodates an atom source; and a capillary nozzle. The main body includes: a housing in which the cartridge is installed; a button heater; an access opening for removing the cartridge from the main body and placing the cartridge into the main body, the access opening being provided on the atmosphere side, which is outside the main body; and a passage from the access opening to the housing. The cartridge is inserted into the main body through the access opening and is installed in the housing. The atom source is heated by the button heater, whereby atomic gas generated from the atom source is emitted as an atom beam to the vacuum side, which is outside the main body.
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
71.
Slow Atomic Beam Generator, Physical Package, Physical Package for Optical Lattice Clock, Physical Package for Atomic Clock, Physical Package for Atomic Interferometer, Physical Package for Quantum Information Processing Device, and Physical Package System
By heating a high-temperature bath with a heater, atomic gas is generated in the high-temperature bath from an atomic source. A magneto-optical trap is realized by a laser beam reflected by a right-angled conical mirror and a magnetic field formed by a magnetic field generator, and the atomic gas is confined by using the magneto-optical trap and cooled. The cooled atoms are output from an opening to the outside of a slow atom beam generator by a laser beam, which is a push laser beam. A slow atomic beam is thereby formed.
An estrogen derivatization method uses a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1):
An estrogen derivatization method uses a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1):
where in Formula (1), X is a quaternary cation. A mass spectrometry method includes derivatizing estrogen by the above estrogen derivatization method. A derivatization reagent derivatizing estrogen includes a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1), where in Formula (1), X is a quaternary cation.
A second polymer is prepared through derivatization of a first polymer. Kendrick Mass Defect (KMD) analysis is applied on a mass spectrum of the second polymer, to thereby produce a plot. Meanwhile, a plurality of mass candidates for a non-primary-chain segment are calculated based on a mass spectrum of the first polymer. The KMD analysis is applied on the plurality of mass candidates, to thereby produce reference images. A mass of the non-primary-chain segment is identified through matching of two KMD analysis results.
A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.
There is provided a sample milling apparatus capable of mitigating heat damage to a sample. The apparatus mills the sample by irradiating it with an ion beam and includes: an ion source for emitting the ion beam; and a shield plate placed on the sample and covering a part of the sample. The shield plate includes: a shield surface on which the ion beam impinges; and a bottom surface connected to the shield surface and forming a bottom edge. The bottom surface is smaller in area than the shield surface.
An electron microscope includes an irradiation optical system that irradiates a specimen with an electron beam, a specimen stage that supports the specimen, an image forming optical system that forms an image of electrons transmitted through the specimen, an imaging apparatus that captures an image formed by the image forming optical system, and a control unit that controls inclination of the specimen with respect to an incident direction of the electron beam. The irradiation optical system includes an aperture that cuts off a part of the electron beam to be irradiated to the specimen. The control unit acquires an image including Kikuchi bands that appear in a shadow region of the aperture, detects the Kikuchi bands in the shadow region of the aperture in the image, and controls inclination of the specimen with respect to the incident direction of the electron beam, based on the detected Kikuchi bands.
In various embodiments of the invention, a solid sample magic angle spinning nuclear magnetic resonance (NMR) probe can utilize an appropriate inductance parent coil with a fixed capacitor and introducing an idler coil with a variable capacitor which can inductively couple to the parent coil by adjusting the variable capacitance of the idler coil. By coupling the idler coil to the parent coil in this manner a double resonance circuit can be provided without the disadvantages of prior art coils. In an alternative embodiment of the invention, a solid sample magic angle spinning nuclear magnetic resonance probe can utilize an appropriate inductance parent coil with a fixed capacitor, introducing an idler coil with a variable capacitor in a first region and two variable inductor coupling coils and two coupling coils in a second region, where the two variable inductors are connected to the parent coil to reduce the number of coils in the sample region of the NMR probe, where variable inductors can inductively couple to the parent coil by adjusting one or both the capacitance of the variable capacitor of the idler coil and/or adjusting the variable inductors to observe a tuned condition between the parent coil and the idler coil.
A load unit jets a load gas from a cone-shaped slit to a first position located in a pathway. As a result, a first gas stream for loading a sample tube is generated. An eject unit jets an eject gas from a cone-shaped slit to a second position in the pathway. As a result, a second gas stream for ejecting a sample tube is generated.
Provided is a focused ion beam apparatus that machines a cross section of a specimen by scanning the specimen with an ion beam. The focused ion beam apparatus includes an optical system that scans the specimen with the ion beam, a receiving unit that receives setting of a machining region of the specimen and setting of a plurality of machining conditions for the machining region, and a control unit that controls the optical system. The control unit causes the optical system to scan the machining region with the ion beam, based on the machining conditions that have been set for the machining region.
A three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus includes: a build plate that holds a powder layer made of a metal powder; a beam irradiating device that irradiates the build plate or the powder layer with an electron beam; and a heat shield unit shields radiant heat emitted from a part heated by irradiation with the electron beam. The heat shield unit is configured of a plurality of heat shield members. Each of the plurality of heat shield members has a side wall surrounding a side of a beam passage region through which the electron beam passes, and the side walls are arranged to overlap each other on a side of the beam passage region.
A first searcher executes a primary search with respect to a primary library based on a sample mass spectrum. The primary library includes a plurality of standard mass spectra. When a judging unit judges that a search range is to be enlarged, a second searcher executes a secondary search with respect to a secondary library based on the sample mass spectrum. The secondary library includes a plurality of predicted mass spectra produced from a plurality of molecular structures.
A superconducting coil device according to one embodiment of the present invention includes: A superconducting coil device including: a bobbin having a tubular body; superconducting wires, a part of which constitutes a wound portion where the superconducting wires are wound on the bobbin; a bobbin-side guide portion holding the superconducting wires extending from the bobbin, the bobbin-side guide portion being provided to extend in a bobbin axial direction, which is an axial direction of the body of the bobbin; a first guide portion holding the superconducting wires extending from the bobbin-side guide portion, the first guide portion being arranged on an outer side of the bobbin-side guide portion in a direction intersecting the bobbin axial direction and provided to extend in the direction intersecting the bobbin axial direction; and a second guide portion capable of holding the superconducting wires extending from the first guide portion, the second guide portion being provided to extend in a direction intersecting the direction of extension of the first guide portion, in which the superconducting wires are constituted of a plurality of wires connected in series, and a connection portion between the wires is fixed to at least either one of the first guide portion and the second guide portion.
A holder includes a first sub holder configured to hold a primary specimen, and a second sub holder configured to hold a support member. The primary specimen is processed in a first state where the holder is disposed within a first specimen processing apparatus. Subsequently, in a second state where the holder is disposed within a second specimen processing apparatus, a secondary specimen is prepared from the primary specimen, the secondary specimen is moved onto the support member, and a thin film specimen is prepared from the secondary specimen.
A powder bed fusion additive manufacturing (PBF-AM) apparatus includes an electron gun chamber, a build chamber, a first vacuum pump, a second vacuum pump, and a beam path. In addition, the three-dimensional PBF-AM apparatus includes a differential evacuation aperture, a focusing lens, and an axis adjustment mechanism. The differential evacuation aperture divides an internal space of the beam path into two, and has a restriction hole through which an electron beam can pass. The focusing lens is configured to focus the electron beam by a restriction hole of the differential evacuation aperture. The axis adjustment mechanism is configured to adjust a trajectory of the electron beam or positions of the focusing lens and the differential evacuation aperture so that an optical axis of the electron beam passes through both the center of the restriction hole and the center of the focusing lens.
B22F 12/41 - Radiation means characterised by the type, e.g. laser or electron beam
B33Y 30/00 - Apparatus for additive manufacturingDetails thereof or accessories therefor
B22F 12/90 - Means for process control, e.g. cameras or sensors
85.
COLD ATOM GENERATION DEVICE, COLD ATOM GENERATION METHOD, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOM INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, in a first area that captures atoms in a first state by means of first light and a magnetic field, atoms are optically pumped into a second state and thereby captured by magnetic force. The atoms in the second state captured in the first area are moved from the first area to a second area by means of gravity or the radiation pressure of second light. In the second area, the second light is radiated at the atoms in the second state, and the atoms in the second state are thereby cooled. The atoms are optically pumped into a third state that is insensitive to magnetic fields and thereby released from a magnetic trap and supplied to a downstream device by means of a moving optical lattice or an optical dipole guide.
H01S 1/06 - Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range gaseous
G04F 5/14 - Apparatus for producing preselected time intervals for use as timing standards using atomic clocks
H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
86.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus, Three-Dimensional Powder Bed Fusion Additive Manufacturing Method, and Method For Setting Moving Speed of Regulating Member in Three-Dimensional Powder Bed Fusion Additive Manufacturing
Provided is a three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus including a base plate, a regulating member configured to level powder supplied onto the base plate by moving over the base plate at a height position keeping a predetermined interval from a surface of the base plate to form a powder layer, and a controller configured to control movement of the regulating member, in which an input unit for inputting manufacturing data is included, and the controller causes the regulating member to move at a moving speed based on the manufacturing data input from the input unit.
An electron spectrometer is provided which can collect spectra in a reduced measurement time. The electron spectrometer includes an electron analyzer for providing energy dispersion of electrons emitted from a sample (S), a detector having a plurality of detection elements juxtaposed and arranged in the direction of energy dispersion of the dispersed electrons, and a processor. The processor operates (i) to sweep a measurement energy in first incremental energy steps (ΔE1) within the analyzer, to detect the dispersed electrons with the detection elements, and to obtain a plurality of resulting first spectra; (ii) to interpolate points of measurement in each of the first spectra; and (iii) to generate a spectral chart in second incremental energy steps (ΔE2) smaller than the first incremental energy steps (ΔE1) on the basis of the first spectra for which the points of measurement have been interpolated.
Provided is a sample container which is for use with an X-ray fluorescence analyzer and which permits measurement of light elements in a liquid. The sample container includes a sealable first receptacle, a pressure adjusting valve for adjusting the pressure in the first receptacle, a second receptacle receiving a liquid sample (S) and having both a first opening and a second opening located inside and outside, respectively, of the first receptacle, and an analytical film closing off the second opening and transmitting X-rays.
G01N 23/2204 - Specimen supports thereforSample conveying means therefor
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
89.
MAGNETIC OPTICAL TRAP DEVICE, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE WATCH, PHYSICAL PACKAGE FOR ATOMIC WATCH, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTOM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, atoms are caught by means of a quadruple magnetic field formed by magnets (106), (108) and three groups of laser beam pairs. A portion of the laser beam pairs LZ is masked by the magnets (106), (108), so that a region (114) which is a non-atom catch space is formed inside a crossing region (112) where the three groups of laser beam pairs cross. The inside of the crossing region (112) is irradiated with a laser beam (118) so that atoms inside the non-atom catch space move to the outside of the crossing region (112).
A charged particle beam device acquires an image by scanning a specimen with a probe formed from a charged particle beam and detects a signal emitted from the specimen. The charged particle beam device includes an optical system that forms the probe; a control unit that repeatedly performs correction processing and image acquisition processing for acquiring a frame image; and an image processing unit that generates an image of the specimen based on a plurality of the frame images. In the correction processing, the control unit acquires a reference image, and corrects the shifting of the irradiation position of the probe. The image processing unit acquires position shift information, corrects a position shift between the frame images based on the position shift information, and generates an image of the specimen based on the plurality of corrected frame images.
An electron microscope includes an electronic optical system that irradiates a specimen with an electron beam and forms an image; a camera that includes an image sensor and outputs a frame image; and a computation unit that generates an image based on the frame image. The computation unit sets a threshold; and binarizes the frame image using the threshold, and generates the image based on the binarized frame image. In setting the threshold, the computation unit repeatedly sets a tentative threshold, acquires a plurality of the frame images obtained on a condition that electrons entering the image sensor follow Poisson process, binarizes each of the plurality of acquired frame images using the tentative threshold, generates an integrated image by integrating the plurality of binarized frame images, and obtains a normalized constant based on a mean and variance of pixel values of pixels of the integrated image.
A pre-processor applies a pre-process to an original mass image produced through mass spectrometry of a sample, to produce a model input image. An image quality converter has an image quality conversion model produced through machine learning based on a group of images produced by a scanning electron microscope, and produces a model output image through image quality conversion of the model input image. A post-processor applies a post-process to the model output image, to produce a mass image after image quality conversion.
G06V 10/60 - Extraction of image or video features relating to illumination properties, e.g. using a reflectance or lighting model
H01J 49/26 - Mass spectrometers or separator tubes
93.
ATOM BEAM GENERATION DEVICE, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOMIC INTERFEREROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
A sample vessel (104) containing a sample (118), a nozzle (106), and a heated body (108) are arranged in a vacuum vessel (102). An induction coil (114) is located on the outside of the vacuum vessel (102). The heated body (108) is located around the sample vessel (104) and the nozzle (106). Electric power is wirelessly supplied from the induction coil (114) to the heated body (108), whereby the heated body (108) is heated. Heating of the heated body (108) causes the sample vessel (104) and the nozzle (106) to be heated, whereby the sample (118) in the sample vessel (104) is heated. An atomic gas generated by the heating of the sample (118) is emitted from the nozzle (106).
An electron microscope includes an irradiation optical system that focuses electron beams and scans a specimen with the focused electron beams; a deflector that deflects the electron beams transmitted through the specimen; a detector that detects the electron beams transmitted through the specimen; and a control unit that controls the irradiation optical system and the deflector The control unit causes the irradiation optical system to scan the specimen with the electron beams so that the electron beams have a plurality of irradiation positions on the specimen. The control unit causes the deflector to repeatedly deflect the electron beams transmitted through each of the irradiation positions, so that a plurality of electron beams which have the same irradiation position and different incident angle ranges with respect to the specimen are caused to sequentially enter the detector.
G01N 23/18 - Investigating the presence of defects or foreign matter
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
95.
Charged Particle Beam System and Control Method Therefor
Provided is a charged particle beam system capable of scanning a sample in a short time. The charged particle beam system is operative to scan the sample with a charged particle beam and to obtain a scanned image, and includes a magnetic deflector for producing a magnetic field to deflect the beam, an electrostatic deflector for producing an electric field to deflect the beam, and a controller for controlling both magnetic deflector and electrostatic deflector. The controller causes the magnetic deflector to deflect the beam in a first direction and to draw a first scan line, causes the magnetic deflector to deflect the beam in a second direction perpendicular to the first direction, causes the electrostatic deflector to deflect the beam in a third direction opposite to the first direction, and causes the magnetic deflector to deflect the beam in the first direction and to draw a second scan line.
A cleaning liquid (112-0) is stored in a cleaning tank (75) before cleaning of a cuvette (92). The cleaning liquid (112-0) in the cleaning tank (75) is retained while the cuvette (92) is being cleaned by a cleaning nozzle (72). At the start of nozzle cleaning after the cleaning of the cuvette (92), a suction nozzle (80) in the cleaning nozzle (72) is inserted into the cleaning liquid (112-0) in the cleaning tank (75). Then, the suction nozzle (80) is further cleaned through discharging and suctioning the cleaning liquid.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
97.
Charged Particle Beam Source and Charged Particle Beam System
Provided is a charged particle beam source having an emitter that can be replaced easily. The charged particle beam source includes an electron gun chamber; a first unit including both a supportive insulative member mechanically supporting a cable and a first set of terminals electrically connected to the cable; and a second unit including both the emitter that releases charged particles and a second set of terminals electrically connected to the emitter. The chamber has a side wall provided with a through-hole in which the first unit is secured. The second unit can be detachably mounted to the first unit. Within the chamber, the emitter is placed on an optical axis, so that the first and second sets of terminals are brought into contact with each other.
A charged particle beam apparatus that forms a probe with a charged particle beam and scans a specimen with the probe to acquire a scanning image. The charged particle beam apparatus includes an optical system for scanning the specimen with the probe; a detector that detects a signal generated from the specimen through the scanning of the specimen with the probe; and a control unit that controls the optical system. The control unit performs correction processing of acquiring a reference image obtained by the scanning of the specimen with the probe, comparing the reference image to a criterion image to determine a drift amount, and correcting a displacement of an irradiation position with the probe on the specimen based on the drift amount; and processing of setting a frequency with which the correction processing is to be performed based on the drift amount.
H01J 37/22 - Optical or photographic arrangements associated with the tube
H01J 37/26 - Electron or ion microscopesElectron- or ion-diffraction tubes
H01J 37/147 - Arrangements for directing or deflecting the discharge along a desired path
99.
DERIVATIZING COMPOSITION FOR MASS SPECTROMETRY, DERIVATIZATION KIT FOR MASS SPECTROMETRY, MASS SPECTROMETRIC METHOD FOR BIOLOGICAL COMPONENT, AND METHOD FOR PREPARING SAMPLE FOR USE IN MASS SPECTROMETRY
11's each independently represent an alkyl group having 1 to 4 carbon atoms and X represents an N-alkyl-N-morpholinium group or a halogen atom (provided that, when X represents an N-alkyl-N-morpholinium group, X further has a counter ion).
G01N 27/62 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode
C07D 251/46 - One nitrogen atom with oxygen or sulfur atoms attached to the two other ring carbon atoms
100.
Charged particle beam apparatus and control method for charged particle beam apparatus
A charged particle beam apparatus for scanning a specimen with a charged particle beam and acquiring a scan image. The charged particle beam apparatus including: an optical system that includes a pulse mechanism for illuminating the specimen with pulses of the charged particle beam, and a deflector that deflects the charged particle beam and scans the specimen with the deflected charged particle beam; and a control unit that controls the optical system. The control unit controls the optical system so as to satisfy T=n×t (n is a natural number). T represents a dwell time of the charged particle beam in each pixel of the scan image, and t represents a cycle of pulses of the charged particle beam.
