SK hynix memory solutions inc.

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H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes 53
G06F 11/00 - Error detectionError correctionMonitoring 21
G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens 20
G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation 20
H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits 17
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1.

Reading and writing to NAND flash memories using charge constrained codes

      
Application Number 15092110
Grant Number 10185623
Status In Force
Filing Date 2016-04-06
First Publication Date 2016-07-28
Grant Date 2019-01-22
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Subramanian, Arunkumar
  • Lee, Frederick K. H.
  • Tang, Xiangyu
  • Zeng, Lingqi
  • Bellorado, Jason

Abstract

A charge constrained bit sequence is processed to obtain a lower bound on a number of bit errors associated with the charge constrained bit sequence. The lower bound is compared against an error correction capability threshold associated with an error correction decoder. In the event the lower bound is greater than or equal to the error correction decoder threshold, an error correction decoding failure is predicted.

IPC Classes  ?

  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G11C 16/10 - Programming or data input circuits
  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 29/02 - Detection or location of defective auxiliary circuits, e.g. defective refresh counters
  • G11C 29/52 - Protection of memory contentsDetection of errors in memory contents
  • G11C 29/04 - Detection or location of defective memory elements

2.

Generating soft read values using multiple reads and/or bins

      
Application Number 15007996
Grant Number 09842023
Status In Force
Filing Date 2016-01-27
First Publication Date 2016-05-19
Grant Date 2017-12-12
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Tang, Xiangyu
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Subramanian, Arunkumar
  • Zeng, Lingqi

Abstract

A starting read threshold is received. A first offset and a second offset is determined. A first read is performed at the starting read threshold offset by the first offset to obtain a first hard read value and a second read is performed at the starting read threshold offset by the second offset to obtain a second hard read value. A soft read value is generated based at least in part on the first hard read value and the second hard read value.

IPC Classes  ?

  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 29/52 - Protection of memory contentsDetection of errors in memory contents
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits

3.

Reading and writing to NAND flash memories using charge constrained codes

      
Application Number 13900861
Grant Number 09336885
Status In Force
Filing Date 2013-05-23
First Publication Date 2016-05-10
Grant Date 2016-05-10
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Subramanian, Arunkumar
  • Lee, Frederick K. H.
  • Tang, Xiangyu
  • Zeng, Lingqi
  • Bellorado, Jason

Abstract

A charge constrained bit sequence is processed to obtain a lower bound on a number of bit errors associated with the charge constrained bit sequence. The lower bound is compared against an error correction capability threshold associated with an error correction decoder. In the event the lower bound is greater than or equal to the error correction decoder threshold, an error correction decoding failure is predicted.

IPC Classes  ?

  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory
  • G11C 16/10 - Programming or data input circuits
  • G11C 16/26 - Sensing or reading circuitsData output circuits

4.

Method and system for generating soft-information after a single read in NAND flash using expected and measured values

      
Application Number 13858781
Grant Number 09256522
Status In Force
Filing Date 2013-04-08
First Publication Date 2016-02-09
Grant Date 2016-02-09
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Zeng, Lingqi
  • Bellorado, Jason
  • Lee, Frederick K. H.
  • Subramanian, Arunkumar

Abstract

A system and method for determining soft read data for a group of cells in a nonvolatile flash memory are disclosed. An expected value representative of a plurality of stored values in a group of cells is obtained. A measured value representative of the plurality of stored values in the group of cells is obtained, based on a single read to the group of cells. A soft read data for the group of cells is determined based at least in part on the expected value and the measured value. The expected and measured values may include at least one of a number of 0s, a number of 1s, a ratio of 0s to 1s or a ratio of 1s to 0s. A reliability for a bit i may be obtained using a one-step majority logic decoder, and a threshold reliability may be used when determining the soft read data.

IPC Classes  ?

  • G06F 12/02 - Addressing or allocationRelocation
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G06F 11/00 - Error detectionError correctionMonitoring
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures

5.

Memory efficient triggers of read disturb checks in solid state storage

      
Application Number 14011453
Grant Number 09240245
Status In Force
Filing Date 2013-08-27
First Publication Date 2016-01-19
Grant Date 2016-01-19
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Bellorado, Jason
  • Marrow, Marcus
  • Chu, Derrick Preston

Abstract

An indication is received that a word line has been read. The word line is part of a plurality of word lines (in solid state storage) which is divided into a plurality of groups. It is determined which group is associated with the read. A count of consecutive, at least potentially uninformative reads is updated based at least in part on the group associated with the read and a group associated with a prior read. It is determining if the count is greater than a threshold and in the event it is determined the count is greater than the threshold, a read disturb check is triggered.

IPC Classes  ?

  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention

6.

Multi-level logical block address (LBA) mapping table for solid state

      
Application Number 13910908
Grant Number 09218294
Status In Force
Filing Date 2013-06-05
First Publication Date 2015-12-22
Grant Date 2015-12-22
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Patil, Nishant
  • Chu, Derrick Preston
  • Sridhar, Nandan
  • Relangi, Prasanthi

Abstract

An access instruction which includes a logical block address (LBA) is received. A first-level table is accessed to obtain a first-level table entry associated with the LBA. From the first-level table entry, a location associated with a second-level table on solid state storage media is determined. The second-level table is accessed at the determined location to obtain a second-level table entry associated with the LBA. From the second-level table entry, a physical block address corresponding to the logical block address is determined.

IPC Classes  ?

  • G06F 12/10 - Address translation
  • G06F 3/06 - Digital input from, or digital output to, record carriers

7.

Cross page management to avoid NAND physical page size limitation

      
Application Number 13445139
Grant Number 09159422
Status In Force
Filing Date 2012-04-12
First Publication Date 2015-10-13
Grant Date 2015-10-13
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Thakore, Priyanka
  • Chu, Derrick Preston

Abstract

A method of writing data to non-volatile computer storage is disclosed. A logical page of data is received and stored in an intermediate storage. A first portion of the logical page is read from the intermediate storage and written to a first physical page in the non-volatile computer storage. A second portion of the logical page is read from the intermediate storage and written to a second physical page in the non-volatile computer storage. A method of reading data from non-volatile computer storage is disclosed. A first portion of a logical page is read from a first physical page in the non-volatile computer storage and written in an intermediate storage. A second portion of the logical page is read from a second physical page and written in the intermediate storage. The first portion and the second portion of the logical page are concatenated to form the logical page.

IPC Classes  ?

  • G11C 29/18 - Address generation devicesDevices for accessing memories, e.g. details of addressing circuits
  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 16/10 - Programming or data input circuits

8.

Hardware acceleration of DSP error recovery for flash memory

      
Application Number 13408913
Grant Number 09142323
Status In Force
Filing Date 2012-02-29
First Publication Date 2015-09-22
Grant Date 2015-09-22
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Yeung, Kwok W.

Abstract

A method for correcting a cell voltage driftage in a NAND flash device is disclosed. An indicator indicating a cell voltage driftage in a memory unit of a NAND flash device is monitored by a processor. A cell voltage driftage in the NAND flash device is detected based at least in part on the indicator. One or more NAND commands correcting the cell voltage driftage are generated. The one or more NAND commands include a NAND command associated with changing a configuration setting of the NAND flash device.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G11C 29/42 - Response verification devices using error correcting codes [ECC] or parity check
  • G11C 5/14 - Power supply arrangements

9.

Adaptive scheduling of turbo equalization based on a metric

      
Application Number 13405331
Grant Number 09143166
Status In Force
Filing Date 2012-02-26
First Publication Date 2015-09-22
Grant Date 2015-09-22
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Kou, Yu
  • Zeng, Lingqi

Abstract

Turbo equalization is performing by using a soft output detector to perform decoding. At least a portion of a local iteration of decoding is performed using a soft output decoder. A metric associated with decoding progress is generated and it is determined whether to perform another local iteration of decoding based at least in part on the metric.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/09 - Error detection only, e.g. using cyclic redundancy check [CRC] codes or single parity bit

10.

Fixed-point detector pruning for constrained codes

      
Application Number 13852926
Grant Number 09124299
Status In Force
Filing Date 2013-03-28
First Publication Date 2015-09-01
Grant Date 2015-09-01
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Bellorado, Jason
  • Marrow, Marcus
  • Wu, Zheng

Abstract

A set of branch metrics for a trellis associated with a Viterbi detector is generated. A set of path metrics associated with the trellis is generated based at least in part on the set of branch metrics, including by obtaining a pruned trellis by removing at least some portion of the trellis that is associated with an invalid bit sequence not permitted by a constrained code. A surviving path associated with the pruned trellis is selected based at least in part on the set of path metrics. A sequence of decisions associated with the surviving path is output.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
  • H03M 13/25 - Error detection or forward error correction by signal space coding, i.e. adding redundancy in the signal constellation, e.g. Trellis Coded Modulation [TCM]
  • H03M 13/39 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors

11.

Flash multiple-pass write with accurate first-pass write

      
Application Number 14631448
Grant Number 09142303
Status In Force
Filing Date 2015-02-25
First Publication Date 2015-08-20
Grant Date 2015-09-22
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Wu, Yingquan

Abstract

An instruction to write to a location in the Flash memory is received. It is determining if the Flash memory exposes a level placement setting associated with defining what voltage range corresponds to what level. In the event it is determined that the Flash memory exposes a level placement setting, an accurate coarse write is performed on the location, including by configuring the level placement setting to be a first value, and after the accurate coarse write is performed on the location, a fine write is performed on the location, including by configuring the level placement setting to be a second value, in response to receiving the instruction.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/10 - Programming or data input circuits
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G11C 16/12 - Programming voltage switching circuits
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS

12.

Error recovery for flash memory

      
Application Number 14558486
Grant Number 09292394
Status In Force
Filing Date 2014-12-02
First Publication Date 2015-06-04
Grant Date 2016-03-22
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Wu, Yingquan
  • Marrow, Marcus

Abstract

An indication of a page type which failed error correction decoding is received. A threshold to adjust is selected from a plurality of thresholds based at least in part on the page type. A third adjusted threshold associated with the page type is generated, including by: determining a first number of flipped bits using a first adjusted threshold associated with the page type, determining a second number of flipped bits using a second adjusted threshold associated with the page type, and generating the third adjusted threshold using the first number of flipped bits and the second number of flipped bits.

IPC Classes  ?

  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory
  • G06F 11/20 - Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention

13.

Error data generation and application for disk drive applications

      
Application Number 13427599
Grant Number 09043688
Status In Force
Filing Date 2012-03-22
First Publication Date 2015-05-26
Grant Date 2015-05-26
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Kai Keung
  • Song, Xin-Ning
  • Bellorado, Jason
  • Yeung, Kwok W.

Abstract

Generating error data associated with decoding data is disclosed, including: processing an input sequence of samples associated with data stored on media using a detector and a decoder during a global iteration; and generating one or more error values based at least in part on one or more decision bits output by the detector or the decoder and the input sequence of samples.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received
  • G11B 20/10 - Digital recording or reproducing
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes

14.

Finding optimal read thresholds and related voltages for solid state memory

      
Application Number 14546545
Grant Number 09305658
Status In Force
Filing Date 2014-11-18
First Publication Date 2015-05-21
Grant Date 2016-04-05
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Zeng, Lingqi
  • Bellorado, Jason
  • Lee, Frederick K. H.
  • Subramanian, Arunkumar

Abstract

A read is performed using a first iteration of a read threshold voltage that is set to a default voltage to obtain a first characteristic. A second iteration of the read threshold voltage is generated using the default voltage and an offset. A read is performed using the second iteration of the read threshold voltage to obtain a second characteristic. A third iteration of the read threshold voltage is generated using the first and second characteristics. A read is performed using the third iteration of the read threshold voltage to obtain a third characteristic. It is determined if the third characteristic is one of the two characteristics closest to a stored characteristic. If so, a fourth iteration of the read threshold voltage is generated using the two closest characteristics.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/26 - Sensing or reading circuitsData output circuits

15.

Error recovery using erasures for NAND Flash

      
Application Number 14524942
Grant Number 09021340
Status In Force
Filing Date 2014-10-27
First Publication Date 2015-03-26
Grant Date 2015-04-28
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Tang, Xiangyu

Abstract

Error correction decoding is performed on a codeword where the codeword is unable to be successfully decoded. One or more bits in the codeword are selected to be replaced with an erasure. The selected bits in the codeword is/are replaced with an erasure to obtain a codeword with one or more erasures. Error correction decoding is performed on the codeword with one or more erasures.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G11C 29/52 - Protection of memory contentsDetection of errors in memory contents
  • H03M 13/37 - Decoding methods or techniques, not specific to the particular type of coding provided for in groups
  • H03M 13/45 - Soft decoding, i.e. using symbol reliability information

16.

Storage of read thresholds for NAND flash storage using linear approximation

      
Application Number 14553745
Grant Number 09064595
Status In Force
Filing Date 2014-11-25
First Publication Date 2015-03-26
Grant Date 2015-06-23
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Subramanian, Arunkumar
  • Tang, Xiangyu
  • Bellorado, Jason
  • Zeng, Lingqi
  • Lee, Frederick K. H.

Abstract

A first read threshold associated with a first page in a block and a second read threshold associated with a second page in the block are received, where the first page has a first page number and the second page has a second page number. A slope and a y intercept are determined based at least in part on the first read threshold, the second read threshold, the first page number, and the second page number. The slope and the y intercept are stored with a block identifier associated with the block.

IPC Classes  ?

  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation

17.

Generating read thresholds using gradient descent and without side information

      
Application Number 14550764
Grant Number 09269449
Status In Force
Filing Date 2014-11-21
First Publication Date 2015-03-19
Grant Date 2016-02-23
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Subramanian, Arunkumar
  • Zeng, Lingqi
  • Tang, Xiangyu
  • Aslam, Ameen

Abstract

A first bit position of a cell in solid state storage is read where a sorting bit is obtained using the read of the first bit position. A second bit position of the cell is read for a first time, including by setting a first read threshold associated with the second bit position to a first value and setting a second read threshold associated with the second bit position to a second value. The second bit position of the cell is read for a second time, including by setting the first read threshold to a third value and setting the second read threshold to a fourth value. A new value for the first read threshold and for the second read threshold is generated using the sorting bit, the first read, and the second read.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 16/10 - Programming or data input circuits
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory

18.

Error correction capability improvement in the presence of hard bit errors

      
Application Number 14527618
Grant Number 09712189
Status In Force
Filing Date 2014-10-29
First Publication Date 2015-02-19
Grant Date 2017-07-18
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Kumar, Naveen
  • Wu, Zheng
  • Bellorado, Jason
  • Zeng, Lingqi
  • Marrow, Marcus

Abstract

A soft output detector is programmed with a first set of parameters. Soft information is generated according to the first set of parameters, including likelihood information that spans a maximum likelihood range. Error correction decoding is performed on the soft information generated according to the first set of parameters. In the event decoding is unsuccessful, the soft output detector is programmed with a second set of parameters, soft information according is generated to the second set of parameters (including likelihood information that is scaled down from the maximum likelihood range), and error correction decoding is performed on the soft information generated according to the second set of parameters.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/37 - Decoding methods or techniques, not specific to the particular type of coding provided for in groups
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/45 - Soft decoding, i.e. using symbol reliability information
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors

19.

Generating soft read values which optimize dynamic range

      
Application Number 14531817
Grant Number 10275297
Status In Force
Filing Date 2014-11-03
First Publication Date 2015-02-19
Grant Date 2019-04-30
Owner SK hynix memory solutions Inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

A plurality of bins and a plurality of soft read values are stored in a lookup table where those bins that are either a leftmost bin or a rightmost bin correspond to soft read values having a maximum magnitude. Bin identification information is received for a cell in solid state storage. A soft read value is generated for the cell in solid state storage, including by: accessing the lookup table, mapping the received bin identification information to one of the plurality of bins in the lookup table, and selecting the soft read value in the lookup table that corresponds to the bin which is mapped to.

IPC Classes  ?

  • G06F 11/07 - Responding to the occurrence of a fault, e.g. fault tolerance
  • H03M 13/45 - Soft decoding, i.e. using symbol reliability information
  • G06F 3/06 - Digital input from, or digital output to, record carriers
  • H03M 13/39 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received

20.

Buffer management in a turbo equalization system

      
Application Number 14464582
Grant Number 09276614
Status In Force
Filing Date 2014-08-20
First Publication Date 2015-01-29
Grant Date 2016-03-01
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A plurality of partially-decoded codewords that have been processed at least once by a first and a second error correction decoder is stored. A plurality of metrics associated with how close a corresponding partially-decoded codeword is to being successfully decoded is stored. From the plurality of partially-decoded codewords, a codeword having a metric indicating that that codeword is the closest to being successfully decoded by the first error correction decoder and the second error correction decoder is selected. The selected codeword is output to the first error correction decoder.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

21.

Advance clocking scheme for ECC in storage

      
Application Number 14454057
Grant Number 09419748
Status In Force
Filing Date 2014-08-07
First Publication Date 2015-01-29
Grant Date 2016-08-16
Owner SK Hynix memory solutions Inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Ng, Kin Man
  • Chan, Kin Ming

Abstract

A system for clocking a decoder is disclosed. The system includes: a channel front end configured to receive input data, a first clock configured to provide a first clock signal as input to the channel front end, a decoder configured to receive intermediate data associated with the output of the channel front end, and a second clock configured to provide a second clock signal as input to the decoder. In some embodiments, the second clock signal is not derived from the first clock signal.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/37 - Decoding methods or techniques, not specific to the particular type of coding provided for in groups
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors

22.

Generating soft read values which optimize dynamic range

      
Application Number 13764515
Grant Number 08943386
Status In Force
Filing Date 2013-02-11
First Publication Date 2015-01-27
Grant Date 2015-01-27
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

Bin identification information for a cell is generated. An estimation function is received where the estimation function trends toward a maximum soft read value at a first end and trends toward a minimum soft read value at a second end. A soft read value is determined for the cell based at least in part on the bin identification information and the estimation function.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/07 - Responding to the occurrence of a fault, e.g. fault tolerance

23.

Peel decoding for concatenated codes

      
Application Number 13676876
Grant Number 08943390
Status In Force
Filing Date 2012-11-14
First Publication Date 2015-01-27
Grant Date 2015-01-27
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A codeword that is associated with one uncorrected codeword in a set of first codewords is selected from a set of third codewords. Error correction decoding is performed on the selected codeword using a third, systematic error correction code.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes

24.

Manufacturing testing for LDPC codes

      
Application Number 14334532
Grant Number 09368233
Status In Force
Filing Date 2014-07-17
First Publication Date 2015-01-15
Grant Date 2016-06-14
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi

Abstract

An amount of time and an error rate function are received, where the error rate function defines a relationship between a number of iterations associated with iterative decoding and an error rate. A testing error rate is determined based at least in part on the amount of time. The number of iterations which corresponds to the testing error rate in the error rate function is selected to be a testing number of iterations; the testing error rate and the testing number of iterations are associated with testing storage media using iterative decoding.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring
  • G11C 29/08 - Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G06F 11/22 - Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
  • G11C 29/10 - Test algorithms, e.g. memory scan [MScan] algorithmsTest patterns, e.g. checkerboard patterns
  • H03M 13/01 - Coding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • G06F 11/07 - Responding to the occurrence of a fault, e.g. fault tolerance
  • G11C 29/52 - Protection of memory contentsDetection of errors in memory contents

25.

Generation of constrained pseudo-random binary sequences (PRBS)

      
Application Number 13445277
Grant Number 08935309
Status In Force
Filing Date 2012-04-12
First Publication Date 2015-01-13
Grant Date 2015-01-13
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Kai Keung
  • Song, Xin-Ning

Abstract

A signal is generated by obtaining an unconstrained random bit sequence. The unconstrained random bit sequence is modified to satisfy a constraint and the modified random bit sequence is output.

IPC Classes  ?

  • G06F 7/58 - Random or pseudo-random number generators

26.

Manufacturing testing for LDPC codes

      
Application Number 14298736
Grant Number 09875157
Status In Force
Filing Date 2014-06-06
First Publication Date 2015-01-01
Grant Date 2018-01-23
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

A storage system includes a channel detector, an LDPC decoder, and an erasure block. The channel detector is configured to receive data corresponding to data read from a storage and output an LLR signal. The LDPC decoder is configured to receive the LLR signal and output a feedback signal to the channel detector. The erasure block is configured to erase at a portion of at least one of the LLR signal and the feedback signal. A method for testing includes generating an error rate function corresponding to an erasure pattern. The function is a function of a number of LDPC iterations. The method includes determining testing parameters at least in part based on the error rate function, wherein the testing parameters comprise a testing number of LDPC iterations, a passing error rate, and the erasure pattern. The method includes testing storage devices using the testing parameters.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • G06F 11/08 - Error detection or correction by redundancy in data representation, e.g. by using checking codes
  • G11C 29/56 - External testing equipment for static stores, e.g. automatic test equipment [ATE]Interfaces therefor
  • H03M 13/01 - Coding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

27.

Generating read thresholds using gradient descent and without side information

      
Application Number 13935714
Grant Number 08923062
Status In Force
Filing Date 2013-07-05
First Publication Date 2014-12-30
Grant Date 2014-12-30
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Subramanian, Arunkumar
  • Zeng, Lingqi
  • Tang, Xiangyu
  • Aslam, Ameen

Abstract

A next read threshold is determined by determining a first number of solid state storage cells having a stored voltage which falls into a first voltage range and determining a second number of solid state storage cells having a stored voltage which falls into a second voltage range. A gradient is determine by taking a difference between the first number of solid state storage cells and the second number of solid state storage cells. The next read threshold is determined based at least in part on the gradient.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory

28.

Storage of read thresholds for NAND flash storage using linear approximation

      
Application Number 13852934
Grant Number 08923066
Status In Force
Filing Date 2013-03-28
First Publication Date 2014-12-30
Grant Date 2014-12-30
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Subramanian, Arunkumar
  • Tang, Xiangyu
  • Bellorado, Jason
  • Zeng, Lingqi
  • Lee, Frederick K. H.

Abstract

A first read threshold associated with a first page in a block and a second read threshold associated with a second page in the block are received, where the first page has a first page number and the second page has a second page number. A slope and a y intercept are determined based at least in part on the first read threshold, the second read threshold, the first page number, and the second page number. The slope and the y intercept are stored with a block identifier associated with the block.

IPC Classes  ?

  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation

29.

Flash multiple-pass write with accurate first-pass write

      
Application Number 14478884
Grant Number 08995199
Status In Force
Filing Date 2014-09-05
First Publication Date 2014-12-25
Grant Date 2015-03-31
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Wu, Yingquan

Abstract

An instruction to write to a location in the Flash memory is received. It is determining if the Flash memory exposes a level placement setting associated with defining what voltage range corresponds to what level. In the event it is determined that the Flash memory exposes a level placement setting, an accurate coarse write is performed on the location, including by configuring the level placement setting to be a first value, and after the accurate coarse write is performed on the location, a fine write is performed on the location, including by configuring the level placement setting to be a second value, in response to receiving the instruction.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/10 - Programming or data input circuits
  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G11C 16/12 - Programming voltage switching circuits
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency

30.

Error recovery by modifying soft information

      
Application Number 13734108
Grant Number 08918705
Status In Force
Filing Date 2013-01-04
First Publication Date 2014-12-23
Grant Date 2014-12-23
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Wu, Yingquan

Abstract

One or more locations in a plurality of data bit sequences that do not satisfy parity and are associated with data bit sequences that are unable to be successfully error correction decoded are determined. Soft information associated with the determined locations is modified and error correction decoding using the modified soft information is performed.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/05 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
  • H03M 13/39 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes
  • H03M 13/45 - Soft decoding, i.e. using symbol reliability information
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits

31.

Probability maximum transition run codes

      
Application Number 13664617
Grant Number 08914705
Status In Force
Filing Date 2012-10-31
First Publication Date 2014-12-16
Grant Date 2014-12-16
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Zeng, Lingqi
  • Kou, Yu

Abstract

A plurality of random bit sequences is generated. Each of the random bit sequences is different and is based at least in part on an input bit sequence. A plurality of metrics corresponding to the plurality of random bit sequences is generated. The plurality of metrics is associated with one or more transition run lengths. One of the random bit sequences is selected based at least in part on the metrics. An output bit sequence is generated that includes the selected random bit sequence and an index associated with demodulating the selected random bit sequence.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • H03M 7/00 - Conversion of a code where information is represented by a given sequence or number of digits to a code where the same information is represented by a different sequence or number of digits
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 7/28 - Programmable structures, i.e. where the code converter contains apparatus which is operator-changeable to modify the conversion process

32.

Manufacturing testing for LDPC codes

      
Application Number 13041218
Grant Number 08914709
Status In Force
Filing Date 2011-03-04
First Publication Date 2014-12-16
Grant Date 2014-12-16
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

A storage system includes a channel detector, an LDPC decoder, and an erasure block. The channel detector is configured to receive data corresponding to data read from a storage and output an LLR signal. The LDPC decoder is configured to receive the LLR signal and output a feedback signal to the channel detector. The erasure block is configured to erase at a portion of at least one of the LLR signal and the feedback signal. A method for testing includes generating an error rate function corresponding to an erasure pattern. The function is a function of a number of LDPC iterations. The method includes determining testing parameters at least in part based on the error rate function, wherein the testing parameters comprise a testing number of LDPC iterations, a passing error rate, and the erasure pattern. The method includes testing storage devices using the testing parameters.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

33.

Interface between multiple controllers

      
Application Number 14305983
Grant Number 09529744
Status In Force
Filing Date 2014-06-16
First Publication Date 2014-12-11
Grant Date 2016-12-27
Owner SK hynix memory solutions Inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Lee, Meng-Kun
  • Huang, Gubo

Abstract

A second controller is communicated with from a first controller via an interface. Storage is also communicated with from the first controller via the interface. The first controller is configured to be a master on the interface and the second controller and the storage are configured to be targets on the interface.

IPC Classes  ?

  • G06F 13/16 - Handling requests for interconnection or transfer for access to memory bus
  • G06F 12/02 - Addressing or allocationRelocation
  • G06F 13/38 - Information transfer, e.g. on bus

34.

Decision directed and non-decision directed low frequency noise cancelation in turbo detection

      
Application Number 13826028
Grant Number 08902530
Status In Force
Filing Date 2013-03-14
First Publication Date 2014-12-02
Grant Date 2014-12-02
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Zheng
  • Bellorado, Jason
  • Kumar, Naveen
  • Marrow, Marcus

Abstract

A set of decisions is determined based at last in part on a set of samples. For a given sample in the set of samples, a low frequency noise estimate is estimated based at least in part on (1) at least some samples from the set of samples and (2) at least some decisions from the set of decisions. A reduced noise sample is generated by removing the low frequency noise estimate from the given sample.

IPC Classes  ?

  • G11B 5/02 - Recording, reproducing or erasing methodsRead, write or erase circuits therefor
  • G11B 20/24 - Signal processing not specific to the method of recording or reproducingCircuits therefor for reducing noise

35.

Error correction capability improvement in the presence of hard bit errors

      
Application Number 13770902
Grant Number 08904263
Status In Force
Filing Date 2013-02-19
First Publication Date 2014-12-02
Grant Date 2014-12-02
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kumar, Naveen
  • Wu, Zheng
  • Bellorado, Jason
  • Zeng, Lingqi
  • Marrow, Marcus

Abstract

A first set of one or more soft detector outputs is generated. It is determined if error correction decoding is successful using the first set of soft detector outputs. In the event it is determined error correction decoding is not successful, a second set of one or more soft detector outputs is generated where a largest likelihood associated with the first set is greater than a largest likelihood associated with the second set.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes

36.

Error recovery using erasures for NAND flash

      
Application Number 13607302
Grant Number 08898546
Status In Force
Filing Date 2012-09-07
First Publication Date 2014-11-25
Grant Date 2014-11-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Tang, Xiangyu

Abstract

Data is processed by selecting one or more bits in a codeword to replace with an erasure. The selected bits in the codeword are replaced with the erasure and error correction decoding is performed on the codeword with the erasure in place for the selected bits.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • H03M 11/00 - Coding in connection with keyboards or like devices, i.e. coding of the position of operated keys
  • G01R 31/30 - Marginal testing, e.g. by varying supply voltage

37.

Margining decoding utilizing soft-inputs

      
Application Number 14266664
Grant Number 09105304
Status In Force
Filing Date 2014-04-30
First Publication Date 2014-11-06
Grant Date 2015-08-11
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Bellorado, Jason
  • Kou, Yu

Abstract

Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.

IPC Classes  ?

  • G11B 27/36 - Monitoring, i.e. supervising the progress of recording or reproducing
  • G11B 20/18 - Error detection or correctionTesting
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits

38.

Memory protection cache

      
Application Number 14263440
Grant Number 09058290
Status In Force
Filing Date 2014-04-28
First Publication Date 2014-10-30
Grant Date 2015-06-16
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Ka Hou
  • Yeung, Kwok W.

Abstract

Accessing data at a memory is described. A request associated with a read or write operation is received, wherein the request includes a logical address associated with the memory. A physical address is generated based at least in part on the logical address. A block of data at the memory that includes data associated with the physical address is determined. Data at the determined block of data and a corresponding set of ECC from the memory are accessed. Whether the accessed data can be decoded based at least in part on the corresponding set of ECC is determined.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G11C 29/04 - Detection or location of defective memory elements

39.

Solid state device coding architecture for chipkill and endurance improvement

      
Application Number 14266702
Grant Number 09170881
Status In Force
Filing Date 2014-04-30
First Publication Date 2014-10-30
Grant Date 2015-10-27
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Agarwal, Rajiv

Abstract

A first decoder performs decoding on each data set in a first plurality of data sets using a first code; each data set in the first plurality is stored on a different chip. It is determined if the first decoding is successful; if not, a second decoder performs a second decoding on each data set in a second plurality of data sets using a second code; each data set in the second plurality includes at least some data, after the first decoding using the first code, from each data set in the first plurality. The first decoder performs a third decoding on each data set in the first plurality using the first code, where each data set in the first plurality includes at least some data, after the second decoding using the second code, from each data set in the second plurality.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/15 - Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes

40.

Inter-track interference (ITI) correlation and cancellation for disk drive applications

      
Application Number 13166717
Grant Number 08862971
Status In Force
Filing Date 2011-06-22
First Publication Date 2014-10-14
Grant Date 2014-10-14
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Kai Keung
  • Song, Xin-Ning
  • Yeung, Kwok W.
  • Rui, Xianfeng

Abstract

Inter-track-interference correlation and cancellation for disk drive application includes receiving an input sequence of samples; and simultaneously processing the input sequence in at least a detector over one or more iterations while processing the input sequence to produce inter-track-interference information during at least a portion of one of the one or more iterations.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
  • H04L 25/03 - Shaping networks in transmitter or receiver, e.g. adaptive shaping networks
  • H04B 1/7085 - Synchronisation aspects using a code tracking loop, e.g. a delay-locked loop

41.

Buffer management in a turbo equalization system

      
Application Number 13489122
Grant Number 08843812
Status In Force
Filing Date 2012-06-05
First Publication Date 2014-09-23
Grant Date 2014-09-23
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A plurality of metrics associated with a plurality of partially decoded codewords is obtained. The plurality of partially decoded codewords has been processed at least once by a first soft output decoder and a second soft output decoder and the plurality of partially decoded codewords is stored in a memory. At least one of the plurality of partially decoded codewords is selected based at least in part on the plurality of metrics; the memory is instructed to vacate the at least one selected codeword.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes

42.

Coding architecture for multi-level NAND flash memory with stuck cells

      
Application Number 14213446
Grant Number 09047213
Status In Force
Filing Date 2014-03-14
First Publication Date 2014-09-18
Grant Date 2015-06-02
Owner SK hynix memory solutions inc. (USA)
Inventor Marrow, Marcus

Abstract

Encoded least significant bit (LSB) values are generated for a cell based at least in part on a readback value for the cell. The encoded LSB values is decoded in order to obtain one or more decoded LSB values. Encoded most significant bit (MSB) values are generated for the cell based at least in part on (1) the readback value for the cell and (2) the decoded LSB values. The encoded MSB values are decoded in order to obtain one or more decoded MSB values, wherein the bit positions of the decoded LSB values do not overlap with the bit positions of the decoded MSB values.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/35 - Unequal or adaptive error protection, e.g. by providing a different level of protection according to significance of source information or by adapting the coding according to the change of transmission channel characteristics
  • H03M 13/25 - Error detection or forward error correction by signal space coding, i.e. adding redundancy in the signal constellation, e.g. Trellis Coded Modulation [TCM]
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/15 - Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes

43.

Advance clocking scheme for ECC in storage

      
Application Number 13404372
Grant Number 08839051
Status In Force
Filing Date 2012-02-24
First Publication Date 2014-09-16
Grant Date 2014-09-16
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Ng, Kin Man
  • Chan, Kin Ming

Abstract

A system for clocking a decoder is disclosed. The system includes: a channel front end configured to receive input data, a first clock configured to provide a first clock signal as input to the channel front end, a decoder configured to receive intermediate data associated with the output of the channel front end, and a second clock configured to provide a second clock signal as input to the decoder. In some embodiments, the second clock signal is not derived from the first clock signal.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring

44.

Write processing for unchanged data with new metadata

      
Application Number 13739370
Grant Number 08832539
Status In Force
Filing Date 2013-01-11
First Publication Date 2014-09-09
Grant Date 2014-09-09
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Patil, Nishant
  • Lee, Meng-Kun
  • Wu, Yingquan

Abstract

Old user data, old metadata, and old error correction parity information are received. New metadata corresponding to the old user data is generated. The old metadata and the new metadata are combined to obtain combined metadata. New error correction parity information is generated using the combined metadata. The old error correction parity information and new error correction parity information are combined to obtain combined error correction parity information. The old user data, new metadata, and combined error correction parity information are stored in solid state storage.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring
  • G06F 7/00 - Methods or arrangements for processing data by operating upon the order or content of the data handled
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens

45.

Method to apply user data for read channel training and adaptation in hard disk drive applications

      
Application Number 13485418
Grant Number 08804264
Status In Force
Filing Date 2012-05-31
First Publication Date 2014-08-12
Grant Date 2014-08-12
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Song, Xin-Ning

Abstract

Calibrating a read channel is disclosed. Previously written user data is read from an auxiliary memory. The previously written user data is processed through a plurality of write channel stages. The output of at least one of the plurality of write channel stages is compared to the output of a corresponding read channel stage to generate an error signal.

IPC Classes  ?

  • G11B 5/09 - Digital recording
  • G11B 27/36 - Monitoring, i.e. supervising the progress of recording or reproducing

46.

Flash multiple-pass write with accurate first-pass write

      
Application Number 14169826
Grant Number 08854893
Status In Force
Filing Date 2014-01-31
First Publication Date 2014-08-07
Grant Date 2014-10-07
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Wu, Yingquan

Abstract

An indication to store a data value in Flash memory is received. An accurate coarse write is performed on the Flash memory, including by: storing a first voltage level in the Flash memory and setting a configuration setting of the Flash memory to a first setting. The first voltage level, when interpreted using the configuration setting at the first setting, corresponds to the data value. A fine write is performed on the Flash memory, including by: storing a second voltage level in the Flash memory and setting the configuration setting of the Flash memory to a second setting. The second voltage level, when interpreted using the configuration setting at the second setting, corresponds to the data value.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices
  • G11C 16/10 - Programming or data input circuits
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 16/12 - Programming voltage switching circuits
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention

47.

Interface between multiple controllers

      
Application Number 13286495
Grant Number 08793419
Status In Force
Filing Date 2011-11-01
First Publication Date 2014-07-29
Grant Date 2014-07-29
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Lee, Meng-Kun
  • Huang, Gubo

Abstract

A second controller is communicated with from a first controller via an interface. Storage is also communicated with from the first controller via the interface. The first controller is configured to be a master on the interface and the second controller and the storage are configured to be targets on the interface.

IPC Classes  ?

  • G06F 13/00 - Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
  • G06F 13/14 - Handling requests for interconnection or transfer
  • G06F 11/00 - Error detectionError correctionMonitoring
  • G06F 11/16 - Error detection or correction of the data by redundancy in hardware

48.

LDPC decoding with on the fly error recovery

      
Application Number 14169003
Grant Number 09048868
Status In Force
Filing Date 2014-01-30
First Publication Date 2014-07-10
Grant Date 2015-06-02
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Zeng, Lingqi
  • Kou, Yu

Abstract

It is decided whether to adjust data associated with a decoder. In the event it is decided to adjust the data associated with the decoder, the data is adjusted to obtain adjusted data and decoding is performed on the adjusted data. In the event it is decided to not adjust the data associated with the decoder, decoding is performed on the data associated with the decoder.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • G11B 20/18 - Error detection or correctionTesting
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/41 - Sequence estimation, i.e using statistical methods for the reconstruction of the original codes using the Viterbi algorithm or Viterbi processors
  • G11B 20/10 - Digital recording or reproducing

49.

MTR and RLL code design and encoder and decoder

      
Application Number 14151656
Grant Number 09071266
Status In Force
Filing Date 2014-01-09
First Publication Date 2014-07-10
Grant Date 2015-06-30
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Zheng
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

An array f(n) is received for n=1, . . . , N where N is a length of a codeword. An array g(n) is received for n=1, . . . , N where N is a length of a codeword. Input data is encoded to satisfy an MTR constraint and a RLL constraint using the array f(n) and the array g(n).

IPC Classes  ?

  • H03M 5/00 - Conversion of the form of the representation of individual digits
  • H03M 7/00 - Conversion of a code where information is represented by a given sequence or number of digits to a code where the same information is represented by a different sequence or number of digits
  • H03M 5/14 - Code representation, e.g. transition, for a given bit cell depending on the information in one or more adjacent bit cells, e.g. delay modulation code, double density code
  • H03M 7/20 - Conversion to or from n-out-of-m codes

50.

Inter-track interference cancelation for shingled magnetic recording

      
Application Number 14158468
Grant Number 09013817
Status In Force
Filing Date 2014-01-17
First Publication Date 2014-07-10
Grant Date 2015-04-21
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

Inter-track interference cancelation is disclosed, including: receiving an input sequence of samples associated with a track on magnetic storage; using a processor to generate inter-track interference (ITI) data associated with a first side track including by performing a correlation between the input sequence of samples and a sequence of data associated with the first side track.

IPC Classes  ?

  • G11B 5/09 - Digital recording
  • G11B 20/10 - Digital recording or reproducing
  • G11B 5/012 - Recording on, or reproducing or erasing from, magnetic disks
  • G11B 5/00 - Recording by magnetisation or demagnetisation of a record carrierReproducing by magnetic meansRecord carriers therefor
  • G11B 20/12 - Formatting, e.g. arrangement of data block or words on the record carriers

51.

Soft input, soft output mappers and demappers for block codes

      
Application Number 14146929
Grant Number 09026881
Status In Force
Filing Date 2014-01-03
First Publication Date 2014-07-03
Grant Date 2015-05-05
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Wu, Zheng
  • Marrow, Marcus

Abstract

A codebook which includes a plurality of messages and a plurality of codewords, a specified codeword bit value, and a specified message bit value are obtained. The LLR for bit ci in a codeword is generated, including by: identifying, from the codebook, those codewords where bit ci has the specified codeword bit value; for a message which corresponds to one of the codewords where bit ci has the specified codeword bit value, identifying those bits which have the specified message bit value; and summing one or more LLR values which correspond to those bits, in the message which corresponds to one of the codewords where bit ci has the specified codeword bit value, which have the specified message bit value.

IPC Classes  ?

  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received
  • G11B 20/18 - Error detection or correctionTesting

52.

Error recovery for flash memory

      
Application Number 14172802
Grant Number 08929138
Status In Force
Filing Date 2014-02-04
First Publication Date 2014-06-19
Grant Date 2015-01-06
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Yingquan
  • Marrow, Marcus

Abstract

An indication of a page type which failed error correction decoding is received. A threshold to adjust is selected from a plurality of thresholds based at least in part on the page type. A third adjusted threshold associated with the page type is generated, including by: determining a first number of flipped bits using a first adjusted threshold associated with the page type, determining a second number of flipped bits using a second adjusted threshold associated with the page type, and generating the third adjusted threshold using the first number of flipped bits and the second number of flipped bits.

IPC Classes  ?

  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens

53.

Margining decoding utilizing soft-inputs

      
Application Number 13040544
Grant Number 08755135
Status In Force
Filing Date 2011-03-04
First Publication Date 2014-06-17
Grant Date 2014-06-17
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Bellorado, Jason
  • Kou, Yu

Abstract

Determining a parameter associated with whether a portion of a storage device is defective is disclosed. Determining comprises: obtaining known data associated with the portion; reading back from the portion to produce a read-back waveform; decoding the read-back waveform, including producing statistical information; and determining a parameter associated with whether the portion is defective based at least in part on the statistical information.

IPC Classes  ?

  • G11B 27/36 - Monitoring, i.e. supervising the progress of recording or reproducing
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

54.

Solid state device coding architecture for chipkill and endurance improvement

      
Application Number 13328988
Grant Number 08756473
Status In Force
Filing Date 2011-12-16
First Publication Date 2014-06-17
Grant Date 2014-06-17
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Agarwal, Rajiv

Abstract

A first decoder performs decoding on each data set in a first plurality of data sets using a first code; each data set in the first plurality is stored on a different NAND Flash chip. It is determined if the first decoding is successful; if not, a second decoder performs a second decoding on each data set in a second plurality of data sets using a second code; each data set in the second plurality includes at least some data, after the first decoding using the first code, from each data set in the first plurality. The first decoder performs a third decoding on each data set in the first plurality using the first code, where each data set in the first plurality includes at least some data, after the second decoding using the second code, from each data set in the second plurality.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

55.

Programmable gray code bit change generator

      
Application Number 13444188
Grant Number 08756485
Status In Force
Filing Date 2012-04-11
First Publication Date 2014-06-17
Grant Date 2014-06-17
Owner SK hynix memory solutions inc. (USA)
Inventor Gee, Ralph Leonard

Abstract

Processing a received signal includes receiving a code word that is different from an expected code word, determining, at least in part using a logic circuit, whether the difference between the received code word and the expected code word is acceptable based at least in part on one or more bit differences, and in the event it is determined that the difference is unacceptable, providing an indication of an error.

IPC Classes  ?

  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

56.

Blind and decision directed multi-level channel estimation

      
Application Number 14086874
Grant Number 09015540
Status In Force
Filing Date 2013-11-21
First Publication Date 2014-06-05
Grant Date 2015-04-21
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Bellorado, Jason
  • Agarwal, Rajiv

Abstract

Data which is read back from a multi-level storage device is received. For each bin in a set of bins, a portion of reads which fall into that particular bin and which are to be maintained is received. The set of bins is adjusted so that the read-back data, after assignment using the adjusted set of bins, matches the received portions of reads which are to be maintained.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 12/02 - Addressing or allocationRelocation
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 29/02 - Detection or location of defective auxiliary circuits, e.g. defective refresh counters
  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures
  • G06F 12/08 - Addressing or allocationRelocation in hierarchically structured memory systems, e.g. virtual memory systems

57.

Measure of health for writing to locations in flash

      
Application Number 14169847
Grant Number 08904097
Status In Force
Filing Date 2014-01-31
First Publication Date 2014-05-29
Grant Date 2014-12-02
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Agarwal, Rajiv
  • Marrow, Marcus

Abstract

For each of a plurality of locations in flash memory, a number of pulses required to change a value stored in that location is obtained. From the plurality of locations, a location to write to is selected using the obtained number of pulses. The selected location is written to.

IPC Classes  ?

  • G06F 12/02 - Addressing or allocationRelocation
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation

58.

Matching signal dynamic range for turbo equalization system

      
Application Number 14073577
Grant Number 08799752
Status In Force
Filing Date 2013-11-06
First Publication Date 2014-05-22
Grant Date 2014-08-05
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A method for reducing a number of bits for representing a value is disclosed. A first value represented with a first number of bits is transformed to a second value represented with a second number of bits, wherein the first number of bits is greater than the second number of bits. The transformed second value is scaled by a scale factor to a third value. Transforming includes selecting a target window with a width of a third number of bits, wherein the third number of bits is smaller than the first number of bits. Transforming further includes saturating the first value to a most significant bit (MSB) within the selected target window and extracting bits within the selected target window from the saturated value.

IPC Classes  ?

  • H03M 13/25 - Error detection or forward error correction by signal space coding, i.e. adding redundancy in the signal constellation, e.g. Trellis Coded Modulation [TCM]
  • H04L 27/01 - Equalisers
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/53 - Codes using Fibonacci numbers series
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received

59.

Defect scan and manufacture test

      
Application Number 14054662
Grant Number 08996954
Status In Force
Filing Date 2013-10-15
First Publication Date 2014-05-22
Grant Date 2015-03-31
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A method for detecting a defect in a portion of a storage device is disclosed. Reference data and data read from the portion are compared to determine a number of error bits and a number of error symbols. An error ratio is computed, wherein the error ratio comprises a ratio of the number of error bits to the number of error symbols. A defect is detected based on whether the error ratio exceeds a threshold. In some embodiments, the reference data and the read data are compared to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data. For each of a plurality of windows of the error vector, a corresponding number of error bits is determined. A defect is detected based on whether any of the numbers of error bits exceeds a threshold.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G11C 29/42 - Response verification devices using error correcting codes [ECC] or parity check
  • G11C 29/32 - Serial accessScan testing
  • G11C 29/44 - Indication or identification of errors, e.g. for repair
  • G06F 11/07 - Responding to the occurrence of a fault, e.g. fault tolerance
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits

60.

Turbo-product codes (TPC) with interleaving

      
Application Number 14061600
Grant Number 09300329
Status In Force
Filing Date 2013-10-23
First Publication Date 2014-05-08
Grant Date 2016-03-29
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kumar, Naveen
  • Wu, Zheng
  • Bellorado, Jason
  • Zeng, Lingqi
  • Marrow, Marcus

Abstract

Decoding associated with a second error correction code and a first error correction code is performed. Ns first and second-corrected segments of data, first sets of parity information, and second sets of parity information are intersegment interleaved to obtain intersegment interleaved data, where the Ns segments of data, the Ns first sets of parity information, and the Ns second sets of parity information have had decoding associated with the first and the second error correction code performed on them (Ns is the number of segments interleaved together). Decoding associated with a third error correction code is performed on the intersegment interleaved data and interleaved parity information to obtain at least third-corrected interleaved data. The third-corrected interleaved data is de-interleaved.

IPC Classes  ?

  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/53 - Codes using Fibonacci numbers series

61.

Memory protection cache

      
Application Number 13273047
Grant Number 08719664
Status In Force
Filing Date 2011-10-13
First Publication Date 2014-05-06
Grant Date 2014-05-06
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Ka Hou
  • Yeung, Kwok W.

Abstract

Accessing data at a memory is described. A request associated with a read or write operation is received, wherein the request includes a logical address associated with the memory. A physical address is generated based at least in part on the logical address. A block of data at the memory that includes data associated with the physical address is determined. Data at the determined block of data and a corresponding set of ECC from the memory are accessed. Whether the accessed data can be decoded based at least in part on the corresponding set of ECC is determined.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation

62.

Coding architecture for multi-level NAND flash memory with stuck cells

      
Application Number 12313512
Grant Number 08719670
Status In Force
Filing Date 2008-11-19
First Publication Date 2014-05-06
Grant Date 2014-05-06
Owner SK hynix memory solutions inc. (USA)
Inventor Marrow, Marcus

Abstract

A system for decoding data is disclosed. The system includes: an input interface configured to receive data associated with encoded data; a first decoder configured to decode a first subset of the encoded data to obtain a first portion of decoded data; a second decoder configured to decode a second subset of the encoded data to obtain a second portion of the decoded data, wherein the second portion includes decoded data not included in the first portion; and an output interface configured to output the decoded data.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/35 - Unequal or adaptive error protection, e.g. by providing a different level of protection according to significance of source information or by adapting the coding according to the change of transmission channel characteristics

63.

Multiple interleavers in a coding system

      
Application Number 14053023
Grant Number 08984364
Status In Force
Filing Date 2013-10-14
First Publication Date 2014-05-01
Grant Date 2015-03-17
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor
  • Zeng, Lingqi
  • Kou, Yu
  • Ng, Kin Man

Abstract

Second interleaved data is de-interleaved using a second interleaving mapping to obtain encoded data. The second interleaved data includes a copy of constrained data in the same sequence and having the same values as the constrained data. Also, the portion of the second interleaved data that includes the copy of the constrained data satisfies a modulation constraint associated with limiting a number of consecutive events to a maximum number of consecutive events. The encoded data is decoded to obtain first interleaved data and the first interleaved data is de-interleaved using a first interleaving mapping to obtain the constrained data, a copy of which is included in the second interleaved data, where the constrained data satisfies the modulation constraint.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • H03M 13/27 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes using interleaving techniques
  • H03M 13/29 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/15 - Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
  • H03M 13/23 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using convolutional codes, e.g. unit memory codes

64.

Generation of interpolated samples for decision based decoding

      
Application Number 13022025
Grant Number 08713413
Status In Force
Filing Date 2011-02-07
First Publication Date 2014-04-29
Grant Date 2014-04-29
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

A plurality of interpolated samples is generated. Using a plurality of soft-decision detectors, error correction decoding is performed on the plurality of interpolated samples in order to obtain a plurality of decisions. From the plurality of decisions, one is selected by determining which of the plurality of soft-decision detectors are able to come to a decision during error correction decoding. It is determined whether a majority of the detectors that are able to come to a decision come to a same decision. If not, a decision associated with a greatest reliability is selected from the decision detectors that are able to come to a decision.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

65.

Low-complexity q-ary LDPC decoder

      
Application Number 12589633
Grant Number 08706792
Status In Force
Filing Date 2009-10-26
First Publication Date 2014-04-22
Grant Date 2014-04-22
Owner SK hynix memory solutions inc. (USA)
Inventor Moon, Jaekyun

Abstract

m lowest values are determined.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

66.

Delay matching across semiconductor devices using input/output pads

      
Application Number 13291629
Grant Number 08687442
Status In Force
Filing Date 2011-11-08
First Publication Date 2014-04-01
Grant Date 2014-04-01
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Thakore, Priyanka
  • Lee, Meng-Kun

Abstract

A data signal is sampled by generating a read enable signal at a first semiconductor device which is intended for a second semiconductor device. A read enable signal with at least some I/O pad delay included is obtained, including by passing the read enable signal intended for the second semiconductor device at least partially through an input/output (I/O) pad on the first semiconductor device. At the first semiconductor device, a data signal from the second semiconductor is sampled using the read enable signal with at least some I/O pad delay included.

IPC Classes  ?

  • G11C 7/00 - Arrangements for writing information into, or reading information out from, a digital store

67.

Virtual addressing with multiple lookup tables and RAID stripes

      
Application Number 13837267
Grant Number 09348758
Status In Force
Filing Date 2013-03-15
First Publication Date 2014-03-27
Grant Date 2016-05-24
Owner SK Hynix memory solutions inc. (USA)
Inventor Pignatelli, David J.

Abstract

A method of relating the user logical block address (LBA) of a page of user data to the physical block address (PBA) where the data is stored in a RAID architecture reduces to size of the tables by constraining the location to which data of a plurality of LBAs may be written. Chunks of data from a plurality of LBAs may be stored in a common page of memory and the common memory pages is described by a virtual block address (VBA) referencing the PBA, and each of the LBAs uses the same VBA to read the data.

IPC Classes  ?

  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures
  • G06F 12/10 - Address translation
  • G06F 12/02 - Addressing or allocationRelocation
  • G06F 3/06 - Digital input from, or digital output to, record carriers

68.

WRITE CACHE SORTING

      
Application Number US2013060375
Publication Number 2014/047159
Status In Force
Filing Date 2013-09-18
Publication Date 2014-03-27
Owner SK HYNIX MEMORY SOLUTIONS INC. (USA)
Inventor Pignatelli, David, J.

Abstract

A method of managing a non-volatile memory system is described where data elements stored in a buffer are characterized by attributes and a write data tag is created for the data elements. A plurality of write data tag queues is maintained so that different data attributes may be applied as sorting criteria when the data elements are formed into pages for storage in the non-volatile memory. The memory system may be organized as a RAID system and a write data tag queue may be associated with a specific RAID group such that the data pages may be written from a buffer to the non-volatile memory in accordance with the results of sorting each write data queue. The data elements stored in the buffer may be received from a user, or be read from the non-volatile memory during the performance of system overhead operations.

IPC Classes  ?

  • G06F 12/08 - Addressing or allocationRelocation in hierarchically structured memory systems, e.g. virtual memory systems
  • G06F 13/00 - Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units

69.

Write cache sorting

      
Application Number 14031589
Grant Number 09507705
Status In Force
Filing Date 2013-09-19
First Publication Date 2014-03-27
Grant Date 2016-11-29
Owner SK hynix memory solutions Inc. (USA)
Inventor Pignatelli, David J.

Abstract

A method of managing a non-volatile memory system is described where data elements stored in a buffer are characterized by attributes and a write data tag is created for the data elements. A plurality of write data tag queues is maintained so that different data attributes may be applied as sorting criteria when the data elements are formed into pages for storage in the non-volatile memory. The memory system may be organized as a RAID system and a write data tag queue may be associated with a specific RAID group such that the data pages may be written from a buffer to the non-volatile memory in accordance with the results of sorting each write data queue. The data elements stored in the buffer may be received from a user, or be read from the non-volatile memory during the performance of system overhead operations.

IPC Classes  ?

  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens
  • G06F 3/06 - Digital input from, or digital output to, record carriers
  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures
  • G06F 12/02 - Addressing or allocationRelocation

70.

Hardware integrity verification

      
Application Number 13828661
Grant Number 10216625
Status In Force
Filing Date 2013-03-14
First Publication Date 2014-03-27
Grant Date 2019-02-26
Owner SK Hynix Memory Solutions Inc. (USA)
Inventor Pignatelli, David J.

Abstract

A flash memory management method and apparatus provides for the separation of the command and data paths so that communication paths may be used more efficiently, taking account of the characteristics of NAND FLASH circuits where the times to read, write and erase data differ substantially. A unique sequence identifier is assigned to a write command and associated data and association of the data and commands are validated prior to writing to the memory by comparing the unique sequence numbers of the data and command prior to executing the command. This comparison is performed after the data and command have traversed the communication paths.

IPC Classes  ?

  • G06F 12/02 - Addressing or allocationRelocation
  • G06F 3/06 - Digital input from, or digital output to, record carriers

71.

HARDWARE INTEGRITY VERIFICATION

      
Application Number US2013060816
Publication Number 2014/047382
Status In Force
Filing Date 2013-09-20
Publication Date 2014-03-27
Owner SK HYNIX MEMORY SOLUTIONS INC. (USA)
Inventor Pignatelli, David, J.

Abstract

A flash memory management method and apparatus provides for the separation of the command and data paths so that communication paths may be used more efficiently. A unique sequence identifier is assigned to a write command and the associated data and association of the data and commands are validated prior to writing to the memory by comparing the unique sequence numbers of the data and command prior to executing the command. This comparison is performed after the data and command have traversed the communication paths.

IPC Classes  ?

  • G06F 11/22 - Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

72.

VIRTUAL ADDRESSING

      
Application Number US2013061293
Publication Number 2014/047609
Status In Force
Filing Date 2013-09-24
Publication Date 2014-03-27
Owner SK HYNIX MEMORY SOLUTIONS INC. (USA)
Inventor Pignatelli, David, J.

Abstract

A method of relating the user logical block address(LBA) of a page of user data to the physical block address (PBA) where the data is stored in a RAIDed architecture reduces to size of the tables by constraining the location to which data of a plurality of LBAs may be written. Chunks of data from a plurality of LBAs may be stored in a common page of memory and the common memory pages is described by a virtual block address (VBA) referencing the PBA, and each of the LBAs uses the same VBA to read the data.

IPC Classes  ?

  • G06F 3/06 - Digital input from, or digital output to, record carriers
  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures

73.

Flash multiple-pass write with accurate first-pass write

      
Application Number 13422774
Grant Number 08681563
Status In Force
Filing Date 2012-03-16
First Publication Date 2014-03-25
Grant Date 2014-03-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Meng-Kun
  • Wu, Yingquan

Abstract

An indication to store a data value in Flash memory is received. An accurate coarse write is performed, including by storing a first voltage level in the Flash memory and setting a configuration setting to a first setting. The first voltage level, when interpreted using the configuration setting at the first setting, corresponds to the data value. A fine write is performed, including by storing a second voltage level in the Flash memory and setting the configuration setting of the Flash memory to a second setting. The second voltage level, when interpreted using the configuration setting at the second setting, corresponds to the data value.

IPC Classes  ?

  • G11C 11/34 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices

74.

Concatenated codes for recovering stored data

      
Application Number 13471747
Grant Number 08671326
Status In Force
Filing Date 2012-05-15
First Publication Date 2014-03-11
Grant Date 2014-03-11
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A method of encoding user data into a first set of codewords using a first code, generating a first set of parity information based at least in part on the first set of codewords and at least a second code, and writing at least parity information associated with the first set of parity information to shingled magnetic recording storage. A method of performing decoding on a first set of read-back signal data read back from shingled magnetic recording storage and associated with a first set of codewords, and if decoding of at least one read-back signal in the first set of read-back signal data fails, performing decoding on at least some of a second set of read-back signal data associated with a set of parity information.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

75.

MTR and RLL code design and encoder and decoder

      
Application Number 13436187
Grant Number 08659450
Status In Force
Filing Date 2012-03-30
First Publication Date 2014-02-25
Grant Date 2014-02-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Zheng
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

An array f(n) is received for n=1, . . . , N where N is a length of a codeword. An array g(n) is received for n=1, . . . , N where N is a length of a codeword. Input data is encoded to satisfy an MTR constraint and a RLL constraint using the array f(n) and the array g(n).

IPC Classes  ?

  • H03M 7/00 - Conversion of a code where information is represented by a given sequence or number of digits to a code where the same information is represented by a different sequence or number of digits

76.

Component reuse for ITI cancellation

      
Application Number 13368226
Grant Number 08659847
Status In Force
Filing Date 2012-02-07
First Publication Date 2014-02-25
Grant Date 2014-02-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Ng, Kin Man
  • Chan, Kin Ming

Abstract

User level data associated with a location adjacent to a desired location on a magnetic disk storage is received. Media level data associated with the adjacent location is generated based at least in part on the user level data associated with the adjacent location; a processor which is configured to generate the media level data associated with the adjacent location is a same processor which is configured to generate media level data based at least in part on user level data during a write process. The media level data associated with the adjacent location is used to remove inter-track interference (ITI) associated with the adjacent location from a signal read back from the desired location.

IPC Classes  ?

77.

Soft input, soft ouput mappers and demappers for block codes

      
Application Number 13284597
Grant Number 08650459
Status In Force
Filing Date 2011-10-28
First Publication Date 2014-02-11
Grant Date 2014-02-11
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Wu, Zheng
  • Marrow, Marcus

Abstract

A log-likelihood ratio (LLR) for a bit bi in a message is determined by generating a first term, including by summing LLRs corresponding to bits in a first codeword having a specified value. The first codeword has a corresponding first message and bit bi of the first message corresponds to a 0. A second term is generated, including by summing LLRs corresponding to bits in a second codeword having the specified value. The second codeword has a corresponding second message and bit bi of the second message corresponds to a 1. The LLR for bit bi in the message is generated based at least in part on the first term and the second term.

IPC Classes  ?

  • H03M 13/03 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words

78.

Data independent error computation and usage with decision directed error computation

      
Application Number 13963824
Grant Number 08924833
Status In Force
Filing Date 2013-08-09
First Publication Date 2014-02-06
Grant Date 2014-12-30
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Zheng
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

An analog front end is adjusted by determining a signal quality based at least in part on digital sample(s). If the signal quality satisfies one or more criteria, a data independent gain gradient and a data independent offset gradient are selected to adjust the analog front end, where the two gradients are generated without taking into consideration an instantaneous value of an expected signal. If the signal quality does not satisfy the criteria, a decision directed gain gradient and a decision directed offset gradient are selected to adjust the analog front end, where the two gradients are generated based at least in part on decision(s).

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G06F 11/00 - Error detectionError correctionMonitoring
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received
  • H03M 13/37 - Decoding methods or techniques, not specific to the particular type of coding provided for in groups
  • H03M 13/11 - Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
  • H03M 13/15 - Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes

79.

Data recovery using existing reconfigurable read channel hardware

      
Application Number 13453729
Grant Number 08631311
Status In Force
Filing Date 2012-04-23
First Publication Date 2014-01-14
Grant Date 2014-01-14
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Chan, Kai Keung
  • Kou, Yu
  • Song, Xin-Ning
  • Hui, Wing

Abstract

A method for recovering data is disclosed. A sensed analog signal is converted into digital samples using an analog-to-digital converter (ADC). The digital samples are processed into processed digital samples using a first filter. The processed digital samples are decoded into decoded data. Whether the decoded data is acceptable is then determined. The processed digital samples are fed back to the first filter using a reprocessing circuit such that the processed digital samples are reprocessed into reprocessed digital samples in the event that the decoded data is unacceptable. A set of reprocessing coefficients is provided for the first filter to reprocess the processed digital samples.

IPC Classes  ?

  • G06F 11/00 - Error detectionError correctionMonitoring

80.

Power saving techniques that use a lower bound on bit errors

      
Application Number 13902410
Grant Number 09128710
Status In Force
Filing Date 2013-05-24
First Publication Date 2014-01-09
Grant Date 2015-09-08
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Subramanian, Arunkumar
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Tang, Xiangyu
  • Zeng, Lingqi

Abstract

A read back bit sequence and charge constraint information are obtained. A lower bound on a number of bit errors associated with the read back bit sequence is determined based at least in part on the read back bit sequence and the charge constraint information. The lower bound and an error correction capability threshold associated with an error correction decoder are compared. In the event the lower bound is greater than or equal to the error correction capability threshold, an error correction decoding failure is predicted and in response to the prediction a component is configured to save power.

IPC Classes  ?

  • G06F 1/32 - Means for saving power
  • G11C 7/00 - Arrangements for writing information into, or reading information out from, a digital store

81.

Error recovery for flash memory

      
Application Number 13933986
Grant Number 08681550
Status In Force
Filing Date 2013-07-02
First Publication Date 2014-01-09
Grant Date 2014-03-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Yingquan
  • Marrow, Marcus

Abstract

A set of data associated with a page in flash storage is received. Error correction decoding is performed on the set of data; if event error correction decoding fails, it is determined whether the page is a most significant bit (MSB) page or a least significant bit (LSB) page. If it is determined the page is a MSB page, one or more MSB read thresholds are adjusted and the is re-read page using the adjusted MSB read threshold(s). If it is determined the page is a LSB page, one or more LSB read thresholds are adjusted and the page is re-read using the adjusted LSB read threshold(s).

IPC Classes  ?

  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory

82.

Matching signal dynamic range for turbo equalization system

      
Application Number 13099162
Grant Number 08607132
Status In Force
Filing Date 2011-05-02
First Publication Date 2013-12-10
Grant Date 2013-12-10
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A method for reducing a number of bits for representing a value is disclosed. A first value represented with a first number of bits is transformed to a second value represented with a second number of bits, wherein the first number of bits is greater than the second number of bits. The transformed second value is scaled by a scale factor to a third value. Transforming includes selecting a target window with a width of a third number of bits, wherein the third number of bits is smaller than the first number of bits. Transforming further includes saturating the first value to a most significant bit (MSB) within the selected target window and extracting bits within the selected target window from the saturated value.

IPC Classes  ?

  • H03M 13/25 - Error detection or forward error correction by signal space coding, i.e. adding redundancy in the signal constellation, e.g. Trellis Coded Modulation [TCM]
  • H03M 13/53 - Codes using Fibonacci numbers series

83.

Measure of health for writing to locations in flash

      
Application Number 13869863
Grant Number 08683118
Status In Force
Filing Date 2013-04-24
First Publication Date 2013-11-28
Grant Date 2014-03-25
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Agarwal, Rajiv
  • Marrow, Marcus

Abstract

A number of pulses to modify information stored in a given location in a plurality of locations is obtained for each of the plurality of locations in flash memory. A location having the largest number of pulses is selecting from the plurality of locations. The selected location is written to.

IPC Classes  ?

  • G06F 12/00 - Accessing, addressing or allocating within memory systems or architectures

84.

FLASH MEMORY CONTROLLER

      
Application Number US2013040708
Publication Number 2013/176912
Status In Force
Filing Date 2013-05-13
Publication Date 2013-11-28
Owner SK HYNIX MEMORY SOLUTIONS INC. (USA)
Inventor Pignatellli, David, G.

Abstract

An apparatus and method of managing the operation of a plurality of FLASH chips provides for a physical layer (PHY) interface to a FLASH memory circuit having a plurality of FLASH chips having a common interface bus. The apparatus has a PHY for controlling the voltages on the interface pins in accordance with a microprogrammable state machine. A data transfer in progress over the bus may be interrupted to perform another command to another chip on the shared bus and the data transfer may be resumed after completion of the another command.

IPC Classes  ?

  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory
  • G06F 13/14 - Handling requests for interconnection or transfer

85.

Defect scan and manufacture test

      
Application Number 13076259
Grant Number 08589760
Status In Force
Filing Date 2011-03-30
First Publication Date 2013-11-19
Grant Date 2013-11-19
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kou, Yu
  • Zeng, Lingqi

Abstract

A method for detecting a defect in a portion of a storage device is disclosed. Reference data and data read from the portion are compared to determine a number of error bits and a number of error symbols. An error ratio is computed, wherein the error ratio comprises a ratio of the number of error bits to the number of error symbols. A defect is detected based on whether the error ratio exceeds a threshold. In some embodiments, the reference data and the read data are compared to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data. For each of a plurality of windows of the error vector, a corresponding number of error bits is determined. A defect is detected based on whether any of the numbers of error bits exceeds a threshold.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation

86.

Multiple interleavers in a coding system

      
Application Number 12454558
Grant Number 08583979
Status In Force
Filing Date 2009-05-19
First Publication Date 2013-11-12
Grant Date 2013-11-12
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Zeng, Lingqi
  • Kou, Yu
  • Ng, Kin Man

Abstract

A technique for processing data. The technique includes modulation encoding input data. A first interleaving process is used to obtain first interleaved data. The first interleaved data is systematically encoded. The systematically encoded data is interleaved using a second interleaving process to obtain second interleaved data. The second interleaving process is an inverse of the first interleaving process, at least for a common portion.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

87.

Blind and decision directed multi-level channel estimation

      
Application Number 13864161
Grant Number 08621293
Status In Force
Filing Date 2013-04-16
First Publication Date 2013-11-07
Grant Date 2013-12-31
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Marrow, Marcus
  • Bellorado, Jason
  • Agarwal, Rajiv

Abstract

A value read back from storage and a set of bins are received. Each bin in the set of bins has a bin range. A bin corresponding to the read-back value is selected from the set of bins. The bin range of the selected bin is adjusted, based at least in part on the read-back value, so that the read-back value is more centered within the selected bin after adjustment.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

88.

Adjusting receiver parameters without known data

      
Application Number 13160360
Grant Number 08560900
Status In Force
Filing Date 2011-06-14
First Publication Date 2013-10-15
Grant Date 2013-10-15
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Bellorado, Jason
  • Marrow, Marcus
  • Kou, Yu

Abstract

Adjusting receiving parameters without known data is disclosed, including: receiving an indication of whether data associated with a sector is error correcting code (ECC) uncorrectable; in the event that the indication is that the data is uncorrectable, determining a plurality of statistical information outputs using a detector; and using at least a subset of the plurality of statistical information outputs to adjust a set of one or more receiver parameters.

IPC Classes  ?

  • G11C 29/00 - Checking stores for correct operationTesting stores during standby or offline operation
  • G06F 11/00 - Error detectionError correctionMonitoring
  • G06F 9/455 - EmulationInterpretationSoftware simulation, e.g. virtualisation or emulation of application or operating system execution engines
  • G01R 31/30 - Marginal testing, e.g. by varying supply voltage

89.

LDPC selective decoding scheduling using a cost function

      
Application Number 13781361
Grant Number 08650453
Status In Force
Filing Date 2013-02-28
First Publication Date 2013-09-19
Grant Date 2014-02-11
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Ng, Kin Man
  • Zeng, Lingqi
  • Kou, Yu
  • Yeung, Kwok W.

Abstract

A cost function is obtained. For each of a plurality of groups of nodes, the cost function is evaluated by obtaining, for a given group of nodes, one or more reliability values associated with the given group of nodes; the one or more reliability values include sign and magnitude. For a given group of nodes, a reliability value with a smallest magnitude is selected where the evaluated cost function for the given group of nodes is set to the smallest magnitude. One of the plurality of groups of nodes is selected based at least in part on the evaluated cost functions. Error correction decoding related processing is performed on the selected group of nodes.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

90.

Detecting radial head position using spiral wedge information in self-servo-write

      
Application Number 13102981
Grant Number 08537489
Status In Force
Filing Date 2011-05-06
First Publication Date 2013-09-17
Grant Date 2013-09-17
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tran, Hiep The
  • Bellorado, Jason

Abstract

Writing servo wedge code to a disk is disclosed. A first selected burst demodulation window is determined. A final radial head position is computed based at least in part on the first selected burst demodulation window. Servo wedge code is written to a disk based at least in part on the final radial head position.

IPC Classes  ?

  • G11B 5/596 - Disposition or mounting of heads relative to record carriers with provision for moving the head for the purpose of maintaining alignment of the head relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following for track following on disks

91.

Data independent error computation and usage with decision directed error computation

      
Application Number 13012640
Grant Number 08533576
Status In Force
Filing Date 2011-01-24
First Publication Date 2013-09-10
Grant Date 2013-09-10
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Zheng
  • Bellorado, Jason
  • Marrow, Marcus

Abstract

A signal error is determined by obtaining a known property of an expected signal. A signal is received and a signal error is determined based at least in part on the received signal and the known property of the expected signal.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes
  • G06F 11/00 - Error detectionError correctionMonitoring

92.

Generating soft read values using multiple reads and/or bins

      
Application Number 13747329
Grant Number 09269448
Status In Force
Filing Date 2013-01-22
First Publication Date 2013-09-05
Grant Date 2016-02-23
Owner SK Hynix memory solutions inc. (USA)
Inventor
  • Tang, Xiangyu
  • Lee, Frederick K. H.
  • Bellorado, Jason
  • Subramanian, Arunkumar
  • Zeng, Lingqi

Abstract

A starting read threshold is received. A first offset and a second offset is determined. A first read is performed at the starting read threshold offset by the first offset to obtain a first hard read value and a second read is performed at the starting read threshold offset by the second offset to obtain a second hard read value. A soft read value is generated based at least in part on the first hard read value and the second hard read value.

IPC Classes  ?

  • G11C 16/26 - Sensing or reading circuitsData output circuits
  • G11C 16/28 - Sensing or reading circuitsData output circuits using differential sensing or reference cells, e.g. dummy cells
  • G11C 16/34 - Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
  • G06F 11/10 - Adding special bits or symbols to the coded information, e.g. parity check, casting out nines or elevens

93.

Wide frequency range signal generator using a multiphase frequency divider

      
Application Number 13273968
Grant Number 08513987
Status In Force
Filing Date 2011-10-14
First Publication Date 2013-08-20
Grant Date 2013-08-20
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Kim, Heung S.
  • Evans, Kenneth J.

Abstract

In a high frequency mode a multiphase voltage-controlled oscillator (VCO) generates a first plurality of signals where each has the desired frequency and a different phase. A phase interpolator generates the signal at the desired frequency and the desired phase using a first plurality of signals. In a low frequency mode the VCO generates a second plurality of signals where each has a frequency which is a multiple of the desired frequency and a different phase. A multiphase frequency divider generates a third plurality of signals by dividing the frequency of the second plurality to the desired frequency while maintaining a phase relationship with the second plurality of signals. The phase interpolator generates the signal at the desired frequency and the desired phase using the third plurality.

IPC Classes  ?

  • H03K 21/00 - Details of pulse counters or frequency dividers

94.

Disk-locked loop in self-servo-write using spiral sync-mark detection

      
Application Number 13080104
Grant Number 08514511
Status In Force
Filing Date 2011-04-05
First Publication Date 2013-08-20
Grant Date 2013-08-20
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Tran, Hiep The
  • Bellorado, Jason

Abstract

Writing servo wedge code to a disk is disclosed. A wedge-to-wedge time interval is determined. At least until it is determined that a lock criterion is met: For each wedge-to-wedge time interval, a wedge frequency error is computed based on an adjustable clock. The clock is adjusted based on one or more of the wedge frequency errors. It is determined whether a lock criterion is met based on one or more of the wedge frequency errors. After the lock criterion is met, servo wedge code is written to the disk.

IPC Classes  ?

  • G11B 5/596 - Disposition or mounting of heads relative to record carriers with provision for moving the head for the purpose of maintaining alignment of the head relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following for track following on disks
  • G11B 5/09 - Digital recording

95.

E/P durability by using a sub-range of a full programming range

      
Application Number 13758485
Grant Number 08599621
Status In Force
Filing Date 2013-02-04
First Publication Date 2013-08-15
Grant Date 2013-12-03
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Lee, Meng-Kun

Abstract

An instruction to perform an erase on a group of one or more memory cells is sent. An indication that the erasure of the group of memory cells is unsuccessful is received. In response to receiving the indication that the erasure of the group of memory cells is unsuccessful, the value of a voltage threshold, associated with the group of memory cells, is changed to a new voltage threshold and the new voltage threshold and identification information associated with the group of memory cells is stored.

IPC Classes  ?

  • G11C 16/04 - Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
  • G11C 11/56 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency

96.

Error recovery for flash memory

      
Application Number 13188250
Grant Number 08503238
Status In Force
Filing Date 2011-07-21
First Publication Date 2013-08-06
Grant Date 2013-08-06
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Wu, Yingquan
  • Marrow, Marcus

Abstract

A system for error recovery for flash memory comprises a receiver and an interface. The receiver is configured to receive a portion of data. The receiver is further configured to identify a logical type of the portion of data. The receiver is further configured to adjust a threshold for error recovery of the portion of data based at least in part on the logical type. The receiver is further configured to read the portion of data using the adjusted threshold. The interface is coupled to the receiver.

IPC Classes  ?

  • G11C 16/06 - Auxiliary circuits, e.g. for writing into memory

97.

Systematic encoding for non-full row rank, quasi-cyclic LDPC parity check matrices

      
Application Number 13039040
Grant Number 08504894
Status In Force
Filing Date 2011-03-02
First Publication Date 2013-08-06
Grant Date 2013-08-06
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Zeng, Lingqi
  • Kou, Yu
  • Ng, Kin Man
  • Yeung, Kwok W.

Abstract

Encoding is performed by putting a low-density parity-check (LDPC) generator matrix into partial quasi-cyclic form comprising an identity matrix, a parity generator matrix, a zero matrix and a remainder matrix. The parity generator matrix is quasi-cyclic and the remainder matrix is not quasi-cyclic. An encoder is used to generate LDPC encoded data using the parity generator matrix and without using the remainder matrix.

IPC Classes  ?

  • H03M 13/00 - Coding, decoding or code conversion, for error detection or error correctionCoding theory basic assumptionsCoding boundsError probability evaluation methodsChannel modelsSimulation or testing of codes

98.

GENERATING SOFT READ VALUES USING MULTIPLE READS AND/OR BINS

      
Application Number US2013022741
Publication Number 2013/112580
Status In Force
Filing Date 2013-01-23
Publication Date 2013-08-01
Owner SK HYNIX MEMORY SOLUTIONS INC. (USA)
Inventor
  • Tang, Xiangyu
  • Lee, Frederick, K.H.
  • Bellorado, Jason
  • Subramanian, Arunkumar
  • Zeng, Lingqi

Abstract

A starting read threshold is received. A first offset and a second offset is determined. A first read is performed at the starting read threshold offset by the first offset to obtain a first hard read value and a second read is performed at the starting read threshold offset by the second offset to obtain a second hard read value. A soft read value is generated based at least in part on the first hard read value and the second hard read value.

IPC Classes  ?

  • G11C 7/12 - Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines

99.

FINDING OPTIMAL READ THRESHOLDS AND RELATED VOLTAGES FOR SOLID STATE MEMORY

      
Application Number US2012067622
Publication Number 2013/106139
Status In Force
Filing Date 2012-12-03
Publication Date 2013-07-18
Owner SK HYNIX MEMORY SOLUTIONS, INC. (USA)
Inventor
  • Tang, Xiangyu
  • Zeng, Lingqi
  • Bellorado, Jason
  • Lee, Frederick, K.H.
  • Subramanian, Arunkumar

Abstract

An expected value associated with stored values in solid state storage, as well as a set of three or more points are obtained where the three or more points include a voltage and a value associated with stored values. Two points having ratios closest to the expected value are selected from the set. A voltage is determined based at least in part on the selected two points and the expected value.

IPC Classes  ?

  • G06G 7/48 - Analogue computers for specific processes, systems, or devices, e.g. simulators

100.

Soft output Viterbi detector with error event output

      
Application Number 13733004
Grant Number 08671335
Status In Force
Filing Date 2013-01-02
First Publication Date 2013-07-18
Grant Date 2014-03-11
Owner SK hynix memory solutions inc. (USA)
Inventor
  • Yeung, Kwok W.
  • Shih, Shih-Ming

Abstract

A first sequence of states associated with a surviving path and a second sequence of states associated with a non-surviving path are determined. A possible error event is determined based at least in part on the first sequence of states and the second sequence of states. The first sequence of states is replaced with the second sequence of states by applying the possible error event to the first sequence of states.

IPC Classes  ?

  • H04B 15/00 - Suppression or limitation of noise or interference
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