Endress+Hauser Optical Analysis, Inc.

United States of America

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2024 10
2023 5
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IPC Class
G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details 25
G01J 3/44 - Raman spectrometryScattering spectrometry 23
G01N 21/65 - Raman scattering 23
G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry 19
G01J 3/28 - Investigating the spectrum 14
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NICE Class
09 - Scientific and electric apparatus and instruments 8
37 - Construction and mining; installation and repair services 8
42 - Scientific, technological and industrial services, research and design 7
Status
Pending 11
Registered / In Force 84

1.

MULTI-SECTIONED WINDOW FOR SPECTROSCOPIC DEVICE

      
Application Number 18159216
Status Pending
Filing Date 2023-01-25
First Publication Date 2024-07-25
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Croglio, Jr., Nicholas J.
  • Scott, Peter
  • Beyer, Douglas H.

Abstract

The present disclosure includes an optical head for a spectroscopic device configured to produce a beam of light, a reference signal detector, and a signal detector. A mirror reflects the beam of light from the light source toward a multi-sectioned window having a top side and a bottom side. The bottom side includes an AR coating and the top side has a first section including an AR coating and a second section including a beam splitter with transmittance and reflectance. A first beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, and the reference signal detector. A second beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, a medium contained in the spectroscopic device, an additional mirror, the first section of the multi-sectioned window, and the signal detector.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/45 - Interferometric spectrometry
  • G02B 1/11 - Anti-reflection coatings

2.

OPTICAL PROBE FOR PROCESS RAMAN SPECTROSCOPY AND METHOD OF USE

      
Application Number 18430155
Status Pending
Filing Date 2024-02-01
First Publication Date 2024-07-11
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Uerpmann, Carsten
  • Stidham, Michael Gordon

Abstract

One aspect of the present disclosure discloses a probe, including a probe body having a center axis defining a proximal end and a distal end and including an aperture in the distal end; a window affixed in the aperture, wherein the window is substantially optically transparent; and a flange adjoining the proximal end of the probe body, the flange including a sealing surface and a sealing edge, wherein the flange separates an in-process portion of the probe from an ex-process portion of the probe, the in-process portion including at least the probe body, the sealing surface and the sealing edge, where at least the in-process portion of the probe consists essentially of an austenitic stainless steel material. Further aspects include a computer product configured to execute a method employing the probe.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01N 21/85 - Investigating moving fluids or granular solids
  • G01N 33/62 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving urea

3.

ETENDUE-PRESERVING RAMAN SAMPLING OPTICS

      
Application Number 18148519
Status Pending
Filing Date 2022-12-30
First Publication Date 2024-07-04
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor Skriba, Nicholas

Abstract

Sampling optics for spectroscopic analysis include an array of optical elements as opposed to a single objective as used in conventional systems, achieving enhanced collection, inherent signal integration/averaging and improved measurement uniformity. At the same time, the etendue using the array is substantially the same as the etendue using a single-element objective. The array of closely packed optical elements may have spherical or aspherical surfaces and may be transmissive or reflective. An array of lenses and reflective elements may be arranged together in flow cell configurations and/or for signal amplification involving multiple passes through a sample medium. The array elements may be arranged in hexagonal, linear, radial or other packing geometries and may be implemented as a flat or curved panel. The present disclosure is applicable to remote fiber probes and flow cell geometries to measure solids, liquids, gasses and semi-liquid such as slurries.

IPC Classes  ?

4.

WAVEGUIDE AND ELECTROMAGNETIC SPECTROMETER

      
Application Number 18148550
Status Pending
Filing Date 2022-12-30
First Publication Date 2024-07-04
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Slater, Joseph B.
  • Winter, Marc

Abstract

A waveguide for conveying light with an input end and an output end to supply for an electromagnetic spectrometer includes: an input end having a convex envelope of a cross-section of the waveguide at the input end, which envelope defines a circular shape or a shape of a regular polygon with n1 corners, wherein n1 is a natural number bigger than 3; an output end having a cross-section that defines a slit shape; and a plurality of filaments, wherein an arrangement of the plurality of filaments defines the cross-sections at the input and output ends, wherein each filament includes a core and a reflective coating covering a lateral area of the core, wherein the core includes an optically transparent material.

IPC Classes  ?

  • H01P 3/16 - Dielectric waveguides, i.e. without a longitudinal conductor
  • H01P 3/10 - Wire waveguides, i.e. with a single solid longitudinal conductor
  • H01P 5/08 - Coupling devices of the waveguide type for linking lines or devices of different kinds

5.

QUANTIFICATION OF TARGET ANALYTE BASED ON MULTI-LAYER MULTI-VARIANT SPECTRA ANALYSIS FOR SPECTROSCOPIC ANALYZERS

      
Application Number 18532680
Status Pending
Filing Date 2023-12-07
First Publication Date 2024-07-04
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Yeh, Kuan-Ting
  • Chang, Chih-Husan

Abstract

A method of spectroscopic analysis includes: collecting a set of calibration spectra for calibration gas samples by scanning a sample range of wavelengths; calculating a first concentration of a target analyte and first concentrations of background components for each calibration spectrum using a multivariant algorithm; modeling an ideal concentration of the target analyte as a function of the first concentrations using a correlative model; collecting a field spectrum for an unknown field gas sample, wherein the field gas sample includes the target analyte and at least some of the background components; calculating a second concentration of the target analyte and second concentrations the background components for the field spectrum using the multivariant algorithm; correcting the second concentration of the target analyte using the correlative model and second concentrations of the background components; and determining a corrected target analyte concentration in the field gas sample based on the corrected second concentration.

IPC Classes  ?

  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

6.

WAVEGUIDE AND ELECTROMAGNETIC SPECTROMETER

      
Application Number 18148564
Status Pending
Filing Date 2022-12-30
First Publication Date 2024-07-04
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Winter, Marc
  • Slater, Joseph B.

Abstract

A photonic crystal waveguide for conveying light with an input end and an output end to supply for an electromagnetic spectrometer includes: an input end having a convex envelope of a cross-section of the waveguide at the input end, which envelope defines a circular shape or a shape of a regular polygon with n1 corners, wherein n1 is a natural number bigger than 3; an output end having a cross-section that defines a slit shape; and a plurality of photonic crystal fibers, wherein an arrangement of the plurality of photonic crystal fibers defines the cross-sections at the input and output ends.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/18 - Generating the spectrumMonochromators using diffraction elements, e.g. grating
  • G02B 6/02 - Optical fibres with cladding

7.

GAS SENSOR FOR DETERMINING THE CONCENTRATION OF AT LEAST ONE GAS IN A GAS MIXTURE AND METHOD FOR DETERMINING THE CONCENTRATION OF AT LEAST ONE GAS IN A GAS MIXTURE WITH A GAS SENSOR

      
Application Number 18522602
Status Pending
Filing Date 2023-11-29
First Publication Date 2024-05-30
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Meinert, Tobias
  • Scherer, Benjamin
  • Winter, Marc
  • Wittstock, Valentin

Abstract

A gas sensor for determining a concentration of at least one gas in a gas mixture includes: at least one intensity modulatable light source; a measuring section, into which the gas mixture to be investigated can be allowed to flow; and an essentially gas-sealed detection cell, wherein the gas sensor is embodied such that light emitted from the light source is radiated into a measuring section, wherein the intensity of the emitted light is modulated with a modulation frequency, which differs from the resonant frequency of a mode of the acoustic resonance of the detection cell by less than 0.5 times, especially less than 0.25 times, the half-width of the mode. Further, a method for determining the concentration of the at least one gas in the gas mixture uses the gas sensor.

IPC Classes  ?

  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

8.

FLOWCELL AND SYSTEM WITH IMPROVED COLLECTION EFFICIENCY FOR RAMAN SPECTROSCOPY

      
Application Number 18053246
Status Pending
Filing Date 2022-11-07
First Publication Date 2024-05-09
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Skriba, Nicholas
  • Tedesco, James
  • Slater, Joseph

Abstract

Flowcells and Raman analysis systems provide improved signal collection dynamics through increased solid-angle geometries and improved numerical aperture for near-diffraction-limited performance. A combined excitation/collection beam passes through a first optical material, a sample conduit and a second optical material. A concave reflective aspheric surface focuses and re-collimates the combined beam to and from a region of the sample within the conduit. The optical materials may comprise separate windows or may integrally form sidewalls the conduit. The reflective surface may be spaced apart from the second window or may be integrally formed with the second optical material. The focused region in the sample may approximate a point or a line, and at least a portion of the interior wall of the conduit may be reflective, causing the combined beam to pass through the sample region more than once to enhance collection efficiency.

IPC Classes  ?

9.

Intensity calibration of multipass raman systems using standard reference materials

      
Application Number 17937141
Grant Number 12174122
Status In Force
Filing Date 2022-09-30
First Publication Date 2024-04-04
Grant Date 2024-12-24
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Slater, Joseph B.
  • Tedesco, James M.

Abstract

0 within the body when the body is positioned within the sample volume for calibration purposes.

IPC Classes  ?

10.

METHOD FOR OBTAINING A MODEL FOR A SPECTROMETER OR A SPECTROSCOPE

      
Application Number US2023072455
Publication Number 2024/040214
Status In Force
Filing Date 2023-08-18
Publication Date 2024-02-22
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Ludlum, Kevin

Abstract

The present disclosure comprises a method for obtaining a model for a spectrometer or a spectroscope, wherein a model comprises a relationship between a spectrum of a gas mixture or gas and parameters of the gas mixture or gas, in particular the composition and/or concentrations of individual components of the gas mixture, including: - acquiring a reference spectrum of a predetermined gas or gas mixture by means of the spectrometer or spectroscope and parameters of the predetermined gas or gas mixture, in particular the composition and/or concentrations of concentrations of the individual components of the predetermined gas mixture; encrypting the spectrum and/or the parameters by means of a homomorphic encryption method; and analyzing the spectrum and parameters without decoding the spectrum, or parameters.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01J 3/457 - Correlation spectrometry, e.g. of the intensity

11.

LASER SYSTEM AND METHOD FOR DRIVING A LASER SYSTEM

      
Application Number 17808310
Status Pending
Filing Date 2022-06-23
First Publication Date 2023-12-28
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor Norwood, Timothy

Abstract

The present disclosure includes a method for driving a laser system, wherein the laser system includes: at least one laser diode arranged for light emission; an electronic circuit configured for driving the laser diode by applying an electric drive current; and a power sensor arrangement including at least one power sensor for measuring an optical power output, wherein the method includes: applying and maintaining the electric drive current to the at least one laser diode at a setpoint; determining measurement values of a current optical power output by the power sensor arrangement; comparing the measurement values of the current optical power output with a target optical power output; and adjusting and maintaining the electric drive current at a new setpoint when an absolute value of a difference between the target optical power output and the current optical power output crosses a threshold.

IPC Classes  ?

  • H01S 5/068 - Stabilisation of laser output parameters
  • H01S 5/026 - Monolithically integrated components, e.g. waveguides, monitoring photo-detectors or drivers

12.

Augmented Raman analysis using absolute Raman

      
Application Number 17806134
Grant Number 11874230
Status In Force
Filing Date 2022-06-09
First Publication Date 2023-12-14
Grant Date 2024-01-16
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Slater, Joseph B.
  • Winter, Marc
  • Link, Oliver

Abstract

A method for determining an amount of a Raman-invisible gas in a multi-component gas stream includes performing a first and second absolute Raman analysis on the gas stream. A decrease in the absolute Raman bands from the first analysis to the second analysis is attributed to an increase of the Raman-invisible gas in the gas stream. The amount of the Raman-invisible gas is calculated from the difference between the first and second sets of Raman bands. The calculation of the Raman-invisible gas is verified via a measurement and a calculation of a secondary property of the gas stream such as the thermal conductivity of the gas stream or the density of the gas stream.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01N 9/24 - Investigating density or specific gravity of materialsAnalysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

13.

Optical probe for process Raman spectroscopy and method of use

      
Application Number 17431850
Grant Number 11940464
Status In Force
Filing Date 2020-02-14
First Publication Date 2023-06-22
Grant Date 2024-03-26
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Uerpmann, Carsten
  • Stidham, Michael Gordon

Abstract

One aspect of the present disclosure discloses a probe, including a probe body having a center axis defining a proximal end and a distal end and including an aperture in the distal end; a window affixed in the aperture, wherein the window is substantially optically transparent; and a flange adjoining the proximal end of the probe body, the flange including a sealing surface and a sealing edge, wherein the flange separates an in-process portion of the probe from an ex-process portion of the probe, the in-process portion including at least the probe body, the sealing surface and the sealing edge, where at least the in-process portion of the probe consists essentially of an austenitic stainless steel material. Further aspects include a computer product configured to execute a method employing the probe.

IPC Classes  ?

14.

Device and method for measuring multiple analyte concentrations in a measuring medium

      
Application Number 17445880
Grant Number 11953437
Status In Force
Filing Date 2021-08-25
First Publication Date 2023-03-02
Grant Date 2024-04-09
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Winter, Marc
  • Liu, Xiang
  • Wilhelm, Thomas

Abstract

The present disclosure relates to a device for measuring a first analyte concentration and a second analyte concentration in a measuring medium, the device including: a sample cell; a first light source unit; a first detector unit; a functional element; a second light source unit; a second detector unit; and a control unit adapted to analyze a detected first light for determining a first value representing the concentration of the first analyte in the measuring medium and adapted to analyze a detected third light for determining a second value representing the concentration of the second analyte in the measuring medium. A method of using the device is also disclosed.

IPC Classes  ?

  • G01N 21/64 - FluorescencePhosphorescence
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

15.

Spatially offset Raman probe with coaxial excitation and collection apertures

      
Application Number 17402798
Grant Number 11913834
Status In Force
Filing Date 2021-08-16
First Publication Date 2023-02-16
Grant Date 2024-02-27
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Tedesco, James M.
  • Gilliam, Sean J.

Abstract

An optical measurement probe for capturing a spectral response through an intervening material emitting unwanted background radiation includes: a first lens configured to receive light and collimate the light into a collimated excitation beam defining a first aperture; an objective element for focusing the collimated excitation beam to a point or region in a sample through the intervening material, wherein the objective element also receives light scattered by the sample and the intervening material and collimates the scattered light into a collimated collection beam defining a second aperture; and a blocking element within the collimated collection beam for removing the light scattered by the intervening material from the collimated collection beam received from the sample, wherein the second aperture defined by the collimated collection beam is at least two times greater than the first aperture defined by the collimated excitation beam.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/12 - Generating the spectrumMonochromators
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G02B 6/04 - Light guidesStructural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres

16.

Friction control and captive sealant for pressed windows

      
Application Number 17078370
Grant Number 11466228
Status In Force
Filing Date 2020-10-23
First Publication Date 2022-10-11
Grant Date 2022-10-11
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Preister, Jeremy David
  • Slater, Joseph B.
  • Stidham, Michael G.

Abstract

An improved method of sealing a window into an aperture in a body uses a lubricant comprising polymer particles suspended in a volatile, low viscosity, low surface tension carrier fluid. The carrier fluid is applied to one or both of the sidewalls of the window and aperture, and the window is pressed into the aperture such that the carrier fluid evaporates, leaving the polymer particles to fill interstitial surface voids, while enabling the sidewall of the window to make intimate mechanical contact with the sidewall of the aperture. While having broader application, the present disclosure finds particular utility in optical characterization techniques based upon the Raman effect and fluorescence probes used in process monitoring and control.

IPC Classes  ?

  • C10M 169/04 - Mixtures of base-materials and additives
  • C10M 105/12 - Lubricating compositions characterised by the base-material being a non-macromolecular organic compound containing oxygen having hydroxy groups bound to acyclic or cycloaliphatic carbon atoms monohydroxy
  • C10M 147/00 - Lubricating compositions characterised by the additive being a macromolecular compound containing halogen
  • E06B 7/16 - Sealing arrangements on wings or parts co-operating with the wings
  • C10N 50/00 - Form in which the lubricant is applied to the material being lubricated

17.

Explosion-proof and flameproof enclosure for Raman systems

      
Application Number 17551362
Grant Number 11852533
Status In Force
Filing Date 2021-12-15
First Publication Date 2022-06-23
Grant Date 2023-12-26
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Sutherland, Scott
  • Jagiella, Manfred
  • Slater, Joseph

Abstract

Raman analysis systems are partitioned to provide for cost-effective flame resistance and explosion resistance, including relatively small enclosures associated with particular subsystems. One or more of an excitation source, spectrograph and/or controller are disposed in separate, flame-resistant or explosion-resistant enclosures. A remote optical measurement probe may also be disposed in a separate flame-resistant or explosion-resistant enclosure. A grating and a detector of the spectrograph may be disposed in separate enclosures, with sealed windows therebetween to deliver a Raman spectral signal from the optical grating to the detector. The sealed window of the detector enclosure may serve the dual purpose of maintaining flame resistance or explosion resistance while maintaining cooling within the enclosure. Wireless interfaces may be used for communications between the enclosures where practical to reduce or eliminate physical electrical feedthroughs.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details

18.

KAISER OPTICAL SYSTEMS

      
Application Number 1664977
Status Registered
Filing Date 2022-05-13
Registration Date 2022-05-13
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Spectroscopes; calibration devices for calibrating scientific instrumentation that is used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; industrial calibration sensors; optical fibers; probes for scientific purposes; scientific instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases. Maintenance of industrial machinery; repair or maintenance of laboratory apparatus and instruments. Engineering; calibration services; rental of laboratory apparatus and instruments; updating of computer software.

19.

KAISER RAMAN TECHNOLOGY

      
Application Number 1664978
Status Registered
Filing Date 2022-05-13
Registration Date 2022-05-13
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Spectroscopes; calibration devices for calibrating scientific instrumentation that is used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; industrial calibration sensors; optical fibers; probes for scientific purposes; scientific instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases. Maintenance of industrial machinery; repair or maintenance of laboratory apparatus and instruments. Engineering; calibration services; rental of laboratory apparatus and instruments; updating of computer software.

20.

KAISER RAMAN TECHNOLOGY

      
Application Number 219112400
Status Pending
Filing Date 2022-05-13
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

(1) Spectroscopes; calibration devices for calibrating spectroscopic instrumentation used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; industrial calibration sensors for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; optical fibers; probes for scientific purposes, namely, for the collection of Raman spectroscopy data in the field of optical sensor technologies, measurement technologies, industrial process control and laboratory measurements; spectroscopic instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases. (1) Maintenance of industrial machinery, namely spectrometers and analyzers using spectroscopy; repair and maintenance of laboratory instruments. (2) Industrial engineering; calibration services, namely, for laboratory equipment and spectrum and spectroscopy analyzers; rental of laboratory instruments and spectrum and spectroscopy analyzers; updating of computer software.

21.

KAISER OPTICAL SYSTEMS

      
Application Number 219112300
Status Pending
Filing Date 2022-05-13
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

(1) Spectroscopes; calibration devices for calibrating spectroscopic instrumentation used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; industrial calibration sensors for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; optical fibers; probes for scientific purposes, namely, for the collection of Raman spectroscopy data in the field of optical sensor technologies, measurement technologies, industrial process control and laboratory measurements; spectroscopic instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases. (1) Maintenance of industrial machinery, namely spectrometers and analyzers using spectroscopy; repair and maintenance of laboratory instruments. (2) Industrial engineering; calibration services, namely, for laboratory equipment and spectrum and spectroscopy analyzers; rental of laboratory instruments and spectrum and spectroscopy analyzers; updating of computer software.

22.

KAISER OPTICAL SYSTEMS

      
Serial Number 97346927
Status Registered
Filing Date 2022-04-05
Registration Date 2023-07-04
Owner Endress+Hauser Optical Analysis, Inc. ()
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Spectroscopes; Calibration devices for calibrating scientific instrumentation that is used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; Industrial calibration sensors; Optical fibers; Probes for scientific purposes; Scientific instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases Maintenance of industrial machinery; Repair or maintenance of laboratory apparatus and instruments Engineering; Calibration services; Rental of laboratory apparatus and instruments; Updating of computer software

23.

KAISER RAMAN

      
Serial Number 97346932
Status Registered
Filing Date 2022-04-05
Registration Date 2024-09-17
Owner Endress+Hauser Optical Analysis, Inc. ()
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Spectroscopes; Calibration devices for calibrating scientific instrumentation that is used for measuring chemical components and conducting chemical analysis of solids, liquids, and gases; Industrial calibration sensors; Optical fibers; Probes for scientific purposes; Scientific instrumentation for measuring chemical components and conducting chemical analysis of solids, liquids, and gases Maintenance of industrial machinery; Repair or maintenance of laboratory apparatus and instruments Engineering; Calibration services; Rental of laboratory apparatus and instruments; Updating of computer software

24.

System and method for improving calibration transfer between multiple raman analyzer installations

      
Application Number 16932601
Grant Number 11287384
Status In Force
Filing Date 2020-07-17
First Publication Date 2022-01-20
Grant Date 2022-03-29
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Norwood, Timothy
  • Slater, Joseph B.
  • Tedesco, James M.

Abstract

A method for harmonizing the responses of a plurality of Raman analyzers includes steps of calibrating an intensity axis response of a spectrometer to a reference light source and measuring a laser wavelength of a laser using the spectrometer. The method also includes steps of measuring a fluorescence spectrum induced by the laser at the laser wavelength of a plurality of standard reference material samples using the spectrometer, measuring a temperature of each standard reference material sample while measuring the fluorescence spectrum, and correcting the fluorescence spectrum of each standard reference material sample based on the respective temperature. The method further includes steps of deploying each standard reference material sample in one of a plurality of field calibrator devices and calibrating the intensity axis of one of the Raman analyzers using one of the field calibrator devices and the corrected fluorescence spectrum of the respective standard reference material sample.

IPC Classes  ?

25.

Real-time Raman spectroscopic monitoring of wine properties and constituents during wine production

      
Application Number 17405536
Grant Number 11598726
Status In Force
Filing Date 2021-08-18
First Publication Date 2021-12-02
Grant Date 2023-03-07
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor Gilliam, Sean J.

Abstract

A method of characterizing and monitoring a pressing process includes acquiring online Raman spectra of a juice pressing process within a vessel at different times during the pressing process to generate a training data set; acquiring physical samples from pressing process near in time to the acquired Raman spectra; performing offline measurements of the target analyte properties and/or compositions using an assay measurement technique; generating a correlative model of the target analyte such that spectral changes in the training data set correlate with the offline measurements of the target analyte properties and/or compositions; acquiring online Raman spectra of a subsequent run of the pressing process within the vessel at different times during the run to generate a process data set; and applying the correlative model to the process data set to qualitatively and/or quantitatively predict a value of a property and/or composition of the target analyte.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/65 - Raman scattering
  • G05B 13/02 - Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
  • G01N 33/14 - Beverages

26.

System and computer-implemented method for extrapolating calibration spectra

      
Application Number 16842849
Grant Number 11754539
Status In Force
Filing Date 2020-04-08
First Publication Date 2021-10-14
Grant Date 2023-09-12
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Ludlum, Kevin
  • Winter, Marc
  • Scherer, Benjamin
  • Liu, Xiang

Abstract

The present disclosure relates to a computer-implemented method for forecasting calibration spectra including a step of providing a machine learning model trained using historical calibration data corresponding to different gas species at different pressures. The computer-implemented method also includes steps of performing a calibration scan of one gas species at one pressure using an analyzer and generating calibration curves for the analyzer corresponding to one or multiple gas species at multiple pressures using the machine learning model and the calibration scan. Thereafter, a spectrum is obtained using the analyzer, and a concentration measurement is generated using the spectrum and at least one of the calibration curves.

IPC Classes  ?

  • G06N 3/08 - Learning methods
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • G06N 20/00 - Machine learning
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

27.

Real-time monitoring of wine fermentation properties using Raman spectroscopy

      
Application Number 17174949
Grant Number 11231324
Status In Force
Filing Date 2021-02-12
First Publication Date 2021-08-19
Grant Date 2022-01-25
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Gilliam, Sean J.

Abstract

A method of characterizing and monitoring a fermentation process includes acquiring online Raman spectra of a fermentation process within a fermenter vessel at different times during the fermentation process to generate a training data set; acquiring physical samples from fermentation process near in time to the acquired Raman spectra; performing offline measurements of the target analyte properties and/or compositions using an assay measurement technique; generating a correlative model of the target analyte such that spectral changes in the training data set correlate with the offline measurements of the target analyte properties and/or compositions; acquiring online Raman spectra of a subsequent run of the fermentation process within the fermenter vessel at different times during the run to generate a process data set; and applying the correlative model to the process data set to qualitatively and/or quantitatively predict a value of a property and/or composition of the target analyte.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/65 - Raman scattering
  • G01N 21/84 - Systems specially adapted for particular applications

28.

System and method for limiting the effective coherence length of a solid-state laser in holographic recording

      
Application Number 16263298
Grant Number 11035992
Status In Force
Filing Date 2019-01-31
First Publication Date 2021-06-15
Grant Date 2021-06-15
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Britton, Timothy J.
  • Tedesco, James M.

Abstract

The effective coherence length of a single-frequency, solid-state laser is limited to reduce spurious, secondary holograms in conjunction with a holographic recording. The wavelength of the laser is varied or ‘scanned’ with high precision over a very small wavelength range. In an embodiment, the temperature of the laser's resonant cavity optical bench is altered, causing the dimension of the cavity to change and the emission wavelength to move in a controlled manner. The changing wavelength is monitored at high resolution, and a feedback control loop updates the temperature set-point to keep the monitored laser wavelength moving at a desired rate of change through a desired range. As the wavelength of the laser is scanned, the phase of the holographic interference pattern is locked at a position of maximum coherence/contrast within the holographic film aperture.

IPC Classes  ?

29.

Spectrometer with wide-scan tunable diode laser

      
Application Number 16511429
Grant Number 11079324
Status In Force
Filing Date 2019-07-15
First Publication Date 2021-01-21
Grant Date 2021-08-03
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Feitisch, Alfred
  • Yeh, Gary
  • Chang, Chih-Hsuan

Abstract

A method for implementation by a laser spectrometer is provided. The method includes first scanning, by a control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by a laser light source and passing through a sample gas. The first wavelength range encompasses a first spectral feature corresponding to a first constituent. The method also includes at least one second scanning, by the control unit using a second set of laser spectrometer operating parameters, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas. The second wavelength range has a second spectral feature corresponding to at least one second constituent. The control unit also determines a first concentration of the first constituent and a second concentration of the at least one second constituent.

IPC Classes  ?

  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation

30.

Augmented Raman analysis of a gas mixture

      
Application Number 16984748
Grant Number 11592398
Status In Force
Filing Date 2020-08-04
First Publication Date 2020-11-19
Grant Date 2023-02-28
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Slater, Joseph B.
  • Tedesco, James M.
  • Esmonde-White, Francis

Abstract

The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/65 - Raman scattering
  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light

31.

Standard reference material interface for Raman probe

      
Application Number 16864786
Grant Number 11346715
Status In Force
Filing Date 2020-05-01
First Publication Date 2020-11-05
Grant Date 2022-05-31
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Norwood, Timothy
  • Slater, Joseph B.

Abstract

A standard reference material interface for a Raman probe includes a locator including a housing having a first end and a second end, the first end including an attachment portion configured to mate with an attachment portion of the Raman probe. The locator defines a central axis that intersects the first end and the second end. The standard reference material interface also includes a hermetically sealed standard reference material enclosure positioned at the second end of the housing and enclosing a standard reference material. An optical port is positioned within the housing between the Raman probe and the standard reference material relative to the central axis. The optical port includes a window.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01J 3/44 - Raman spectrometryScattering spectrometry

32.

Friction control and captive sealant for pressed windows

      
Application Number 16178851
Grant Number 10816373
Status In Force
Filing Date 2018-11-02
First Publication Date 2020-10-27
Grant Date 2020-10-27
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Preister, Jeremy David
  • Slater, Joseph B.
  • Stidham, Michael G.

Abstract

An improved method of sealing a window into an aperture in a body uses a lubricant comprising polytetrafluoroethylene (PTFE) particles suspended in a volatile, low viscosity, low surface tension carrier fluid. The carrier fluid is applied to one or both of the sidewalls of the window and aperture, and the window is pressed into the aperture such that the carrier fluid evaporates, leaving the PTFE particles to fill interstitial surface voids, while enabling the sidewall of the window to make intimate mechanical contact with the sidewall of the aperture. While having broader application, the present disclosure finds particular utility in optical characterization techniques based upon the Raman effect and fluorescence probes used in process monitoring and control.

IPC Classes  ?

  • F16J 15/14 - Sealings between relatively-stationary surfaces by means of granular or plastic material, or fluid
  • G01N 21/64 - FluorescencePhosphorescence
  • G01D 11/26 - WindowsCover glassesSealings therefor
  • G01N 21/85 - Investigating moving fluids or granular solids

33.

Light source module

      
Application Number 16281841
Grant Number 11169357
Status In Force
Filing Date 2019-02-21
First Publication Date 2020-08-27
Grant Date 2021-11-09
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Croglio, Jr., Nicholas J.
  • Scott, Peter
  • Beyer, Doug
  • Ludlum, Kevin
  • Helbley, Keith
  • Peter, David

Abstract

A light source module may include a base with a support feature protruding from a surface of the base and securing a light source to direct radiation away from the surface. A lens cells may be attached proximate to the surface, optionally by being secured within a sleeve that is attached at one end to the surface. A multi-conductor part may include electrical conductors and a base temperature sensor that contacts the base. The base temperature sensor may be electrically connected to at least one of the plurality of conductive elements and further connected to an optical ignition safety protection system configured to interrupt current to the light source if the base temperature sensor indicates that a temperature of the light source is outside of a safe range.

IPC Classes  ?

  • G02B 7/02 - Mountings, adjusting means, or light-tight connections, for optical elements for lenses
  • F21V 33/00 - Structural combinations of lighting devices with other articles, not otherwise provided for

34.

System for measuring composition of a mixed phase fluid

      
Application Number 16178728
Grant Number 10670528
Status In Force
Filing Date 2018-11-02
First Publication Date 2020-05-07
Grant Date 2020-06-02
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Slater, Joseph B.

Abstract

A Raman spectroscopic measurement system for measuring the material composition of a mixed phase fluid having a gas phase dispersed in a liquid phase or vice versa is disclosed, which includes an insert to be inserted into a process. The insert includes a measurement chamber partially defined by a phase separating membrane that enables the gas phase to diffuse into and out of the measurement chamber and facilitates coalescing of the liquid phase which into a collector. A first probe of the measurement system is configured to transmit excitation light into the measurement chamber and to receive a Raman signal emanating from the gas phase therein, and a second probe is configured to transmit excitation light into the drain and to receive a Raman signal emanating from the liquid phase therein. The measurement system further includes a spectrometer to determine the material composition of the fluid from the Raman signals.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 21/84 - Systems specially adapted for particular applications

35.

Raman signal position correction using relative integration parameters

      
Application Number 16165057
Grant Number 10627289
Status In Force
Filing Date 2018-10-19
First Publication Date 2020-04-21
Grant Date 2020-04-21
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Wiegand, Patrick

Abstract

An improved method for integrating curve peaks as compared to techniques such as the trapezoidal rule wherein integration parameters are at fixed x-axis positions. Integration parameters are instead specified relative to a peak center, which allows the peak to shift over time due to hardware changes, temperature fluctuation, pressure changes, etc., while maintaining integration parameters at optimal locations for that peak. As such, the present disclosure finds particular utility in spectroscopy wherein, in the case of Raman spectroscopy, for example, specific wavenumber shift locations may drift over time, leading to inaccurate results based upon absolute integration parameters.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/18 - Generating the spectrumMonochromators using diffraction elements, e.g. grating
  • G01N 21/65 - Raman scattering

36.

Spectrometer with active beam steering

      
Application Number 16415171
Grant Number 10620045
Status In Force
Filing Date 2019-05-17
First Publication Date 2019-09-12
Grant Date 2020-04-14
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Helbley, Keith
  • Beyer, Douglas
  • Winter, Marc

Abstract

A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry

37.

Augmented Raman analysis of a gas mixture

      
Application Number 15830094
Grant Number 10768115
Status In Force
Filing Date 2017-12-04
First Publication Date 2019-06-06
Grant Date 2020-09-08
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Slater, Joseph B.
  • Tedesco, James M.
  • Esmonde-White, Francis

Abstract

The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 21/65 - Raman scattering
  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light

38.

Optical reflectors for spectrometer gas cells

      
Application Number 14494482
Grant Number 10488258
Status In Force
Filing Date 2014-09-23
First Publication Date 2019-05-30
Grant Date 2019-11-26
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Keller, Lutz
  • Feitisch, Alfred
  • Scott, Peter
  • Schrempel, Mathias
  • St. John, Nathan

Abstract

A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that includes attachment materials that are chemically inert to at least one reactive gas compound. The mechanical attachment can hold an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, ceramic, or the like. Related methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details

39.

Spectrometer with operator assistance for measurement optimization

      
Application Number 15986918
Grant Number 10209130
Status In Force
Filing Date 2018-05-23
First Publication Date 2018-11-29
Grant Date 2019-02-19
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Schipper, Darren
  • Slater, Joseph B.
  • Tedesco, James M.

Abstract

The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.

IPC Classes  ?

  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01J 3/28 - Investigating the spectrum

40.

Endoscopic immersion probe end optics for laser spectroscopy

      
Application Number 15592506
Grant Number 10481385
Status In Force
Filing Date 2017-05-11
First Publication Date 2018-11-15
Grant Date 2019-11-19
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Tedesco, James M.

Abstract

In one aspect of the present disclosure, improved end optics are disclosed that maximize the numerical aperture focused at a sample point while minimizing unwanted artifacts such as vignetting. The configurations also maintain centering of the excitation/collection beam on the objective if the probe tilts or bends. The disclosed configurations are particularly suited to probes wherein the excitation and/or collection paths between the probe and the laser/analyzer are coupled through multimode fibers, such as in Raman and other forms of laser spectroscopy. The disclosure includes the insertion of one or more additional lenses between the probe head and the focusing objective at the probe tip.

IPC Classes  ?

  • G02B 23/24 - Instruments for viewing the inside of hollow bodies, e.g. fibrescopes
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/64 - FluorescencePhosphorescence
  • G01N 21/65 - Raman scattering
  • G01N 21/85 - Investigating moving fluids or granular solids
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • A61B 1/00 - Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopesIlluminating arrangements therefor

41.

Radiation shield for near-infrared detectors

      
Application Number 15479681
Grant Number 10753805
Status In Force
Filing Date 2017-04-05
First Publication Date 2018-10-11
Grant Date 2020-08-25
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Slater, Joseph B.
  • Tedesco, James M.
  • Feitisch, Alfred

Abstract

A radiation shield for near-infrared detectors of the type used in Raman spectroscopic systems comprises a chamber enclosing the detector and a cooling device in thermal contact with the chamber and the detector to reduce the level of unwanted radiation to which the detector would otherwise be exposed. The chamber may include a window in optical alignment with the detector, and the window may include one or more coatings to pass wavelengths in a range of interest or block radiation at wavelengths outside of this range. The shield may be enclosed in an evacuated dewar having a window which may also include one or more coatings to favor the wavelength range.

IPC Classes  ?

  • G01J 5/06 - Arrangements for eliminating effects of disturbing radiationArrangements for compensating changes in sensitivity
  • G01N 21/65 - Raman scattering
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 5/04 - Casings

42.

Cost-effective Raman probe assembly for single-use bioreactor vessels

      
Application Number 15398096
Grant Number 10261020
Status In Force
Filing Date 2017-01-04
First Publication Date 2018-07-05
Grant Date 2019-04-16
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Tedesco, James M.
  • Slater, Joseph B.

Abstract

Systems and methods are used to couple an optical sampling probe to a port in a single-use bioreactor bag for in-process monitoring. A combination of re-useable and disposable components maintain precision while reducing costs. A disposable barb with an integral window, received by the port of the reaction vessel, is coupled to a re-useable optic component with a focusing lens. A separate focus alignment tool is used to set the lens position to a precise focal point before placement of the optic component into the barb. The fixture includes a window to simulate the window in a barb component, a target with a known spectral signature, and a probe head coupled to a spectral analyzer. The axial position of the lens is adjusted with respect to the spacer component to maximize the spectral signature from a sample target, whereupon the spacer component is bonded to the lens mount.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01N 21/03 - Cuvette constructions
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/34 - Measuring or testing with condition measuring or sensing means, e.g. colony counters
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01N 21/85 - Investigating moving fluids or granular solids

43.

Optical absorbance measurements with self-calibration and extended dynamic range

      
Application Number 15832690
Grant Number 10746655
Status In Force
Filing Date 2017-12-05
First Publication Date 2018-06-07
Grant Date 2020-08-18
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Feitisch, Alfred
  • Zhou, Xin

Abstract

Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.

IPC Classes  ?

  • G01J 3/433 - Modulation spectrometryDerivative spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/03 - Cuvette constructions
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/05 - Flow-through cuvettes

44.

Spectrometer with active beam steering

      
Application Number 15730548
Grant Number 10309828
Status In Force
Filing Date 2017-10-11
First Publication Date 2018-05-10
Grant Date 2019-06-04
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Helbley, Keith Benjamin
  • Beyer, Douglas

Abstract

A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

45.

Determination and correction of frequency registration deviations for quantitative spectroscopy

      
Application Number 15640119
Grant Number 10180353
Status In Force
Filing Date 2017-06-30
First Publication Date 2018-05-03
Grant Date 2019-01-15
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Yeh, Gary
  • Chaimowitz, Adam S.
  • Jenko, William
  • Feitisch, Alfred

Abstract

A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.

IPC Classes  ?

  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

46.

Particle size determination using Raman spectroscopy

      
Application Number 15784703
Grant Number 10139329
Status In Force
Filing Date 2017-10-16
First Publication Date 2018-04-19
Grant Date 2018-11-27
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Owen, Harry

Abstract

The present disclosure is directed to a method of particle size determination for particles suspended within a light-transmissive medium. The method includes directing a monochromatic light source into the medium and collecting from the medium a Raman-scattered light spectrum. The method includes analyzing the Raman spectrum to determine an amount of Tyndall scattering of the Raman spectrum caused by particles within the medium, and thus determine the size and the number of particles mediating the Tyndall scattering.

IPC Classes  ?

  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/14 - Optical investigation techniques, e.g. flow cytometry
  • G01N 21/65 - Raman scattering
  • G01N 21/85 - Investigating moving fluids or granular solids

47.

Semiconductor laser mounting with intact diffusion barrier layer

      
Application Number 15652177
Grant Number 10224693
Status In Force
Filing Date 2017-07-17
First Publication Date 2017-11-02
Grant Date 2019-03-05
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Neubauer, Gabi
  • Schrempel, Mathias

Abstract

A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.

IPC Classes  ?

48.

Spectrometer with variable beam power and shape

      
Application Number 15376541
Grant Number 10072980
Status In Force
Filing Date 2016-12-12
First Publication Date 2017-08-31
Grant Date 2018-09-11
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Chang, Chih-Husan
  • Huang, Hsu-Hung

Abstract

At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01J 3/46 - Measurement of colourColour measuring devices, e.g. colorimeters
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry

49.

Methods for collection, dark correction, and reporting of spectra from array detector spectrometer

      
Application Number 15588005
Grant Number 10260942
Status In Force
Filing Date 2017-05-05
First Publication Date 2017-08-24
Grant Date 2019-04-16
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Wiegand, Patrick
  • Tedesco, James M.
  • Slater, Joseph B.
  • Esmonde-White, Francis

Abstract

Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/28 - Investigating the spectrum

50.

Real-time characterization of pharmaceutical tablet coatings using Raman spectroscopy

      
Application Number 14986260
Grant Number 10365229
Status In Force
Filing Date 2015-12-31
First Publication Date 2017-07-06
Grant Date 2019-07-30
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Gilliam, Sean J.

Abstract

Pharmaceutical tablet properties, including surface roughness, gloss and temperature, are determined in real-time using Raman spectroscopy. A plurality of coated pharmaceutical tablets are provided having a distribution of known values of a surface property to be modeled. The Raman spectrum of each coated tablet is acquired to generate a distribution of Raman spectra. A correlative model is then developed based upon the distribution of the acquired Raman spectra relative to the distribution of the known values of the measured property. The Raman spectrum of a pharmaceutical tablet is then acquired during and/or after a coating process, and the value of the surface property of the tablet is determined using the correlative model. The steps associated with model development are carried out off-line, whereas the step or steps associated with acquiring the Raman spectra of the pharmaceutical tablet during (preferable) or after online coating process(es) are carried out on-line using a remote, fiber-coupled probe.

IPC Classes  ?

  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
  • G01N 21/57 - Measuring gloss
  • G01N 21/65 - Raman scattering
  • G01N 21/88 - Investigating the presence of flaws, defects or contamination
  • G01N 33/15 - Medicinal preparations
  • G01N 21/84 - Systems specially adapted for particular applications
  • A61J 3/00 - Devices or methods specially adapted for bringing pharmaceutical products into particular physical or administering forms
  • A61K 9/28 - DrageesCoated pills or tablets

51.

Monolithic element and system for collimating or focusing laser light from or to an optical fiber

      
Application Number 15410206
Grant Number 09958615
Status In Force
Filing Date 2017-01-19
First Publication Date 2017-05-11
Grant Date 2018-05-01
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Tedesco, James M.

Abstract

A monolithic optical element and system is used for collimating or focusing laser light from or to optical fibers. The optical fiber terminates in a tip that directly abuts against the first surface of the optical element. The optical element may provide a collimation or focusing function depending upon whether the abutting fiber delivers light for collimation or receives focused light from a collimated beam. The optical element may be a standard or modified barrel or drum lens, with the first and second surfaces being convex curved surfaces having the same or different radii of curvature. The end of the optical element to which the fiber abuts may have a diameter to match the inner diameter of a ferrule for positioning the fiber. A pair of the elements may be used for collimation and focusing in a Raman probehead or other optical detection system.

IPC Classes  ?

  • G02B 6/32 - Optical coupling means having lens focusing means
  • G02B 6/42 - Coupling light guides with opto-electronic elements
  • G02B 6/36 - Mechanical coupling means
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/44 - Raman spectrometryScattering spectrometry

52.

Spectrometer optical head assembly

      
Application Number 14842642
Grant Number 10073028
Status In Force
Filing Date 2015-09-01
First Publication Date 2017-03-02
Grant Date 2018-09-11
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Cohen, Joshua
  • St. John, Nathan
  • Feitisch, Alfred

Abstract

An optical head assembly for use in a spectrometer is provided that is configured to characterize one or more constituents within a sample gas. The assembly includes a thermoelectric cooler (TEC) having a cold side on one end and a hot side on an opposite end, a cold plate in thermal communication with the cold side of the TEC, a hot block in thermal communication with the hot side of the TEC, a light source in thermal communication with the cold plate such that a change in temperature of the TEC causes one or more properties of the light source (e.g., wavelength, etc.) to change, and an optical element in thermal communication with the cold plate positioned to collimate light emitted by the light source through the sample gas (such that properties of the optical element vary based on a change in temperature of the TEC).

IPC Classes  ?

  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G02B 7/02 - Mountings, adjusting means, or light-tight connections, for optical elements for lenses
  • H01S 3/131 - Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
  • H01S 5/00 - Semiconductor lasers
  • H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
  • H01S 5/068 - Stabilisation of laser output parameters
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry

53.

Reconstruction of frequency registration for quantitative spectroscopy

      
Application Number 15227876
Grant Number 11953427
Status In Force
Filing Date 2016-08-03
First Publication Date 2017-03-02
Grant Date 2024-04-09
Owner Endress+Hauser Optical Analysis, Inc. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Ludlum, Kevin
  • Schrempel, Mathias

Abstract

Frequency registration deviations occurring during a scan of a frequency or wavelength range by a spectroscopic analysis system can be corrected using passive and/or active approaches. A passive approach can include determining and applying mathematical conversions to a recorded field spectrum. An active approach can include modifying one or more operating parameters of the spectroscopic analysis system to reduce frequency registration deviation.

IPC Classes  ?

  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01J 3/457 - Correlation spectrometry, e.g. of the intensity
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/21 - Polarisation-affecting properties
  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light

54.

Determination and correction of frequency registration deviations for quantitative spectroscopy

      
Application Number 14817119
Grant Number 09696204
Status In Force
Filing Date 2015-08-03
First Publication Date 2017-02-09
Grant Date 2017-07-04
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Yeh, Gary
  • Chaimowitz, Adam S.
  • Jenko, William
  • Feitisch, Alfred

Abstract

A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.

IPC Classes  ?

  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours
  • G01J 3/28 - Investigating the spectrum

55.

Methods for collection, dark correction, and reporting of spectra from array detector spectrometers

      
Application Number 14950598
Grant Number 10048128
Status In Force
Filing Date 2015-11-24
First Publication Date 2016-12-08
Grant Date 2018-08-14
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Wiegand, Patrick
  • Tedesco, James M.
  • Slater, Joseph B.
  • Esmonde-White, Francis
  • Schipper, Darren

Abstract

Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/65 - Raman scattering

56.

Spectrometer with random beam profiles

      
Application Number 14703616
Grant Number 10024788
Status In Force
Filing Date 2015-05-04
First Publication Date 2016-11-10
Grant Date 2018-07-17
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Dorn, Peter
  • Tedesco, James
  • Liu, Xiang

Abstract

A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/03 - Cuvette constructions
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details

57.

Intrinsically safe spectroscopic analyzer

      
Application Number 15065783
Grant Number 11079316
Status In Force
Filing Date 2016-03-09
First Publication Date 2016-09-15
Grant Date 2021-08-03
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Helbley, Keith Benjamin
  • Dessecker, Juergen
  • Mueller, Harald
  • Fink, Nikolai
  • Boyle, William
  • Dorn, Peter
  • Silva, Paulo

Abstract

A laser spectrometer can be operated for analysis of one or more analytes present in a combustible gas mixture. The spectrometer can include one or more features that enable intrinsically safe operation. In other words, electrical, electronic, thermal, and/or optical energy sources can be limited within an hazardous are of the spectrometer where it is possible for an explosive gas mixture to exist. Methods, systems, articles and the like are described.

IPC Classes  ?

  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01J 1/42 - Photometry, e.g. photographic exposure meter using electric radiation detectors
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • H02H 9/00 - Emergency protective circuit arrangements for limiting excess current or voltage without disconnection

58.

Reduced volume spectroscopic sample cell

      
Application Number 14807859
Grant Number 10156513
Status In Force
Filing Date 2015-07-23
First Publication Date 2016-06-02
Grant Date 2018-12-18
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Scott, Peter
  • Feitisch, Alfred
  • Dorn, Peter
  • Chaimowitz, Adam S.
  • Huang, Hsu-Hung
  • Schrempel, Mathias
  • Keller, Lutz

Abstract

A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.

IPC Classes  ?

  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 21/03 - Cuvette constructions
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01N 21/05 - Flow-through cuvettes

59.

Target analyte detection and quantification in sample gases with complex background compositions

      
Application Number 14538699
Grant Number 10643008
Status In Force
Filing Date 2014-11-11
First Publication Date 2016-05-12
Grant Date 2020-05-05
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Feitisch, Alfred
  • Helbley, Keith Benjamin
  • Tedesco, James

Abstract

Background composition concentration data representative of an actual background composition of a sample gas can be used to model absorption spectroscopy measurement data obtained for a gas sample and to correct an analysis of the absorption spectroscopy data (e.g. for structural interference and collisional broadening) based on the modeling.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G06F 30/20 - Design optimisation, verification or simulation
  • G01N 21/65 - Raman scattering
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G06F 17/10 - Complex mathematical operations
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 1/04 - Optical or mechanical part
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details

60.

Spectrometer with active beam steering

      
Application Number 14466819
Grant Number 09816860
Status In Force
Filing Date 2014-08-22
First Publication Date 2016-02-25
Grant Date 2017-11-14
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Helbley, Keith Benjamin
  • Beyer, Douglas

Abstract

A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

61.

Spectrometer with variable beam power and shape

      
Application Number 14466839
Grant Number 09518866
Status In Force
Filing Date 2014-08-22
First Publication Date 2016-02-25
Grant Date 2016-12-13
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Chang, Chih-Husan
  • Huang, Hsu-Hung

Abstract

At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01J 3/46 - Measurement of colourColour measuring devices, e.g. colorimeters
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry

62.

Monolithic element and system for collimating or focusing laser light from or to an optical fiber

      
Application Number 14455235
Grant Number 09671564
Status In Force
Filing Date 2014-08-08
First Publication Date 2016-02-11
Grant Date 2017-06-06
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Tedesco, James M.

Abstract

A monolithic optical element and system is used for collimating or focusing laser light from or to optical fibers. The optical fiber terminates in a tip that directly abuts against the first surface of the optical element. The optical element may provide a collimation or focusing function depending upon whether the abutting fiber delivers light for collimation or receives focused light from a collimated beam. The optical element may be a standard or modified barrel or drum lens, with the first and second surfaces being convex curved surfaces having the same or different radii of curvature. The end of the optical element to which the fiber abuts may have a diameter to match the inner diameter of a ferrule for positioning the fiber. A pair of the elements may be used for collimation and focusing in a Raman probehead or other optical detection system.

IPC Classes  ?

  • G02B 6/32 - Optical coupling means having lens focusing means
  • G01N 21/65 - Raman scattering
  • G02B 3/00 - Simple or compound lenses
  • G02B 3/02 - Simple or compound lenses with non-spherical faces
  • G02B 6/38 - Mechanical coupling means having fibre to fibre mating means
  • G02B 6/36 - Mechanical coupling means
  • G01J 3/44 - Raman spectrometryScattering spectrometry

63.

Semiconductor laser mounting with intact diffusion barrier layer

      
Application Number 14873080
Grant Number 09711937
Status In Force
Filing Date 2015-10-01
First Publication Date 2016-01-28
Grant Date 2017-07-18
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Neubauer, Gabi
  • Schrempel, Mathias

Abstract

A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.

IPC Classes  ?

64.

Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers

      
Application Number 14634364
Grant Number 09618391
Status In Force
Filing Date 2015-02-27
First Publication Date 2016-01-14
Grant Date 2017-04-11
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Huang, Hsu-Hung
  • Ji, Wenhai
  • Cline, Richard L.

Abstract

Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/05 - Flow-through cuvettes
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/03 - Cuvette constructions

65.

Reduced volume spectroscopic sample cell

      
Application Number 14073711
Grant Number 09109951
Status In Force
Filing Date 2013-11-06
First Publication Date 2015-05-07
Grant Date 2015-08-18
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Scott, Peter
  • Feitisch, Alfred
  • Dorn, Peter
  • Chaimowitz, Adam S.
  • Huang, Hsu-Hung
  • Schrempel, Mathias
  • Keller, Lutz

Abstract

A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation

66.

Dynamic reconstruction of a calibration state of an absorption spectrometer

      
Application Number 14263942
Grant Number 09360415
Status In Force
Filing Date 2014-04-28
First Publication Date 2014-09-11
Grant Date 2016-06-07
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Lewison, John
  • Ji, Wenhai
  • Feitisch, Alfred

Abstract

A reference harmonic absorption curve of a laser absorption spectrometer can have a reference curve shape derived from a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/03 - Cuvette constructions
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 21/3518 - Devices using gas filter correlation techniquesDevices using gas pressure modulation techniques

67.

Optical reflectors for spectrometer gas cells

      
Application Number 13712923
Grant Number 08842282
Status In Force
Filing Date 2012-12-12
First Publication Date 2014-06-12
Grant Date 2014-09-23
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Keller, Lutz
  • Feitisch, Alfred
  • Scott, Peter
  • Schrempel, Mathias
  • St. John, Nathan

Abstract

A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that includes attachment materials that are chemically inert to at least one reactive gas compound. The mechanical attachment can hold an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, ceramic, or the like. Related methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01J 3/28 - Investigating the spectrum
  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/03 - Cuvette constructions
  • G01N 21/09 - Cuvette constructions adapted to resist hostile environments or corrosive or abrasive materials

68.

Ellipsoidal raman signal amplifier

      
Application Number 13564461
Grant Number 08824042
Status In Force
Filing Date 2012-08-01
First Publication Date 2014-02-06
Grant Date 2014-09-02
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Tedesco, James M.
  • Slater, Joseph B.

Abstract

Raman signal amplification apparatus comprises an ellipsoidal reflector providing a first real focus f1, and second real or virtual focus f2, both foci being situated within a sample volume. When an input laser excitation beam having an initial numerical aperture (NA) is focused onto one of the foci, the beam is reflected by the reflector and refocused onto alternating foci, such that the NA of the reflected optical path progressively increases for higher efficiency collection of Raman emissions from the multiple foci. The ellipsoidal reflector may be a half section providing a single real focus f1, with a flat reflector producing a mirror image of the ellipsoidal reflector, such that f2 is a virtual focus occupying the same point as f1. Alternatively, the ellipsoidal reflector may have a first half section with a first real focus f1 and a second half section with a second real focus f2.

IPC Classes  ?

  • H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
  • G02B 5/10 - Mirrors with curved faces

69.

Optical spectrometer dynamic range balancing methods and apparatus

      
Application Number 13903052
Grant Number 08937715
Status In Force
Filing Date 2013-05-28
First Publication Date 2013-12-05
Grant Date 2015-01-20
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Fairchild, Ronald C.
  • Tedesco, James M.
  • Slater, Joseph B.

Abstract

Methods and apparatus facilitate dynamic range balancing for multi-component peaks of widely varying magnitude in an optical spectrometer. In a specific embodiment, filters attenuate the C—H stretch region to produce a better fit of a multi-component hydrocarbon Raman spectrum to the dynamic range of a CCD detector. The filter may be translated into and out of the collimated collection beam to achieve a varying degree of attenuation. In certain applications, the filter is insertable into a collimated collection beam within a fiber-optic probe head to collect Raman spectra. The invention may include optical elements to create the collimated collection beam if not already present or not suitable for insertion of the filter. A second filter, an “opaque” or neutral density filter, may be insertable into the collimated collection beam to attenuate a broad spectral response within and outside the spectral range.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01N 21/65 - Raman scattering
  • G01J 3/12 - Generating the spectrumMonochromators
  • G01N 21/47 - Scattering, i.e. diffuse reflection

70.

Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers

      
Application Number 13428591
Grant Number 08976358
Status In Force
Filing Date 2012-03-23
First Publication Date 2013-09-26
Grant Date 2015-03-10
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Huang, Hsu-Hung
  • Ji, Wenhai
  • Cline, Richard

Abstract

Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

71.

Semiconductor laser mounting with intact diffusion barrier layer

      
Application Number 13212085
Grant Number 09166364
Status In Force
Filing Date 2011-08-17
First Publication Date 2013-02-21
Grant Date 2015-10-20
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Neubauer, Gabi
  • Schrempel, Mathias

Abstract

A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.

IPC Classes  ?

72.

Large-collection-area raman probe with reduced background fluorescence

      
Application Number 13117485
Grant Number 08675190
Status In Force
Filing Date 2011-05-27
First Publication Date 2012-11-29
Grant Date 2014-03-18
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Owen, Harry
  • Davis, Kevin L.

Abstract

A compact Raman analysis system combines a near-infrared (NIR) laser source, a 2D array collecting anti-Stokes Raman spectra, and a probe configured to measure complex solid samples, including pharmaceutical tablets and other large-area targets with reduced background fluorescence at relatively low cost. The system collects spectra from an area of 1-mm or greater, preferably 3-12 mm or more, facilitating the collection of statistically useful data from inhomogeneous and laser-sensitive samples, among other applications. Potential pharmaceutical applications include tablet dosage level measurements, as well as online and at-line quality-control (QC) monitoring opportunities. Other applications include tablet identification as a forensic tool to identify counterfeit pharmaceutical products; granulation and blend uniformity for improved formulation via better process understanding.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry

73.

Semiconductor laser mounting for improved frequency stability

      
Application Number 13212075
Grant Number 09368934
Status In Force
Filing Date 2011-08-17
First Publication Date 2012-09-20
Grant Date 2016-06-14
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Neubauer, Gabi
  • Feitisch, Alfred
  • Schrempel, Mathias

Abstract

A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness of a metallic barrier layer to be applied to the first contact surface. A metallic barrier layer having the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the metallic barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.

IPC Classes  ?

  • H01S 5/022 - MountingsHousings
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01S 5/042 - Electrical excitation
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited

74.

Reactive gas detection in complex backgrounds

      
Application Number 13428626
Grant Number 08500849
Status In Force
Filing Date 2012-03-23
First Publication Date 2012-07-19
Grant Date 2013-08-06
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Zhou, Xin
  • Liu, Xiang
  • Feitisch, Alfred
  • Sanger, Gregory M.

Abstract

A differential absorption spectrum for a reactive gas in a gas mixture can be generated for sample absorption data by subtracting background absorption data set from the sample absorption data. The background absorption data can be characteristic of absorption characteristics of the background composition in a laser light scan range that includes a target wavelength. The differential absorption spectrum can be converted to a measured concentration of the reactive gas using calibration data. A determination can be made whether the background composition has substantially changed relative to the background absorption data, and new background absorption data can be used if the background composition has substantially changed. Related systems, apparatus, methods, and/or articles are also described.

IPC Classes  ?

  • B01D 59/26 - Separation by extracting by sorption, i.e. absorption, adsorption, persorption

75.

Dynamic reconstruction of a calibration state of an absorption spectrometer

      
Application Number 13235105
Grant Number 08711357
Status In Force
Filing Date 2011-09-16
First Publication Date 2012-04-26
Grant Date 2014-04-29
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Lewison, John
  • Ji, Wenhai
  • Feitisch, Alfred

Abstract

A reference harmonic absorption curve of a laser absorption spectrometer, which can include a tunable or scannable laser light source and a detector, can have a reference curve shape and can include a first, second, or higher order harmonic signal of a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. The reference harmonic absorption curve can have been determined for the laser absorption spectrometer in a known or calibrated state. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

76.

Energy meter for mixed streams of combustible compounds

      
Application Number 13301707
Grant Number 08355124
Status In Force
Filing Date 2011-11-21
First Publication Date 2012-03-15
Grant Date 2013-01-15
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Liu, Xiang
  • Zhou, Xin
  • Langham, Dale
  • Cook, Charles F.

Abstract

An energy content meter can spectroscopically quantify oxidation products after oxidation of a combustible mixture. The measured oxidation product concentrations or mole fractions can be converted to an energy content of the un-oxidized combustible mixture using a conversion factor that relates oxygen consumption during oxidation of the combustible mixture to the energy content of the combustible mixture.

IPC Classes  ?

  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours

77.

Spectrometer with validation cell

      
Application Number 13026921
Grant Number 08358417
Status In Force
Filing Date 2011-02-14
First Publication Date 2011-12-08
Grant Date 2013-01-22
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Keller, Lutz
  • Liu, Xiang
  • Schrempel, Mathias
  • Helbley, Keith Benjamin

Abstract

A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

78.

Validation and correction of spectrometer performance using a validation cell

      
Application Number 13027000
Grant Number 08953165
Status In Force
Filing Date 2011-02-14
First Publication Date 2011-12-08
Grant Date 2015-02-10
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Feitisch, Alfred
  • Keller, Lutz
  • Liu, Xiang
  • Schrempel, Mathias
  • Helbley, Keith Benjamin

Abstract

Light intensity data quantifying intensity of light generated by a light source and received at a detector during a validation mode of an absorption spectrometer can be compared with a stored data set representing at least one previous measurement in a validation mode of an analytical system. The validation mode can include causing the light to pass at least once through each of a zero gas and a reference gas contained within a validation cell and including a known amount of a target analyte. The zero gas can have at least one of known and negligible first light absorbance characteristics within a range of wavelengths produced by the light source. A validation failure can be determined to have occurred if the first light intensity data and the stored data set are out of agreement by more than a predefined threshold amount. Related systems, methods, and articles of manufacture are also described.

IPC Classes  ?

  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01J 3/28 - Investigating the spectrum
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/03 - Cuvette constructions
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/3518 - Devices using gas filter correlation techniquesDevices using gas pressure modulation techniques
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

79.

Reactive gas detection in complex backgrounds

      
Application Number 12911666
Grant Number 08152900
Status In Force
Filing Date 2010-10-25
First Publication Date 2011-04-21
Grant Date 2012-04-10
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Zhou, Xin
  • Liu, Xiang
  • Feitisch, Alfred
  • Sanger, Gregory M.

Abstract

A differential absorption spectrum for a reactive gas in a gas mixture can be generated for sample absorption data by subtracting background absorption data set from the sample absorption data. The background absorption data can be characteristic of absorption characteristics of the background composition in a laser light scan range that includes a target wavelength. The differential absorption spectrum can be converted to a measured concentration of the reactive gas using calibration data. A determination can be made whether the background composition has substantially changed relative to the background absorption data, and new background absorption data can be used if the background composition has substantially changed. Related systems, apparatus, methods, and/or articles are also described.

IPC Classes  ?

  • B01D 59/26 - Separation by extracting by sorption, i.e. absorption, adsorption, persorption

80.

Optical absorbance measurements with self-calibration and extended dynamic range

      
Application Number 12814315
Grant Number 09846117
Status In Force
Filing Date 2010-06-11
First Publication Date 2011-02-10
Grant Date 2017-12-19
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Zhou, Xin
  • Liu, Xiang
  • Feitisch, Alfred

Abstract

Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.

IPC Classes  ?

  • G01J 3/433 - Modulation spectrometryDerivative spectrometry
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
  • G01N 21/03 - Cuvette constructions
  • G01N 21/05 - Flow-through cuvettes
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

81.

Wavelength dependent reflective sample substrates for Raman and fluorescence spectroscopy

      
Application Number 12855279
Grant Number 08305572
Status In Force
Filing Date 2010-08-12
First Publication Date 2010-12-02
Grant Date 2012-11-06
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Fairchild, Ronald C.

Abstract

A material which is generally transparent in the visible region of the spectrum but reflective at laser wavelengths reduces undesirable, substrate-induced Raman and fluorescence scattering. A substrate provides a surface for supporting the sample, with the material being disposed between the surface of the substrate and the sample. The material is substantially transparent in the visible region of the spectrum but reflective at the laser wavelength, thereby minimizing unwanted Raman or fluorescence scattering that would be produced by the substrate if the material were not present. The substrate will typically be a glass microscope slide or multi-cell well plate. The optical filter material is preferably a multilayer dielectric filter acting as a “hot mirror” that reflects near-infrared energy. An advantage of visible transmission is that it allows back illumination from behind/underneath the slide or well plate, thereby being visible to a microscope's eyepiece or video camera. Methods and article are also disclosed.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry

82.

Reactive gas detection in complex backgrounds

      
Application Number 12763124
Grant Number 07819946
Status In Force
Filing Date 2010-04-19
First Publication Date 2010-08-12
Grant Date 2010-10-26
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Zhou, Xin
  • Liu, Xiang
  • Feitisch, Alfred
  • Sanger, Gregory M.

Abstract

A differential absorption spectrum for a reactive gas in a gas mixture can be generated for sample absorption data by subtracting background absorption data set from the sample absorption data. The background absorption data can be characteristic of absorption characteristics of the background composition in a laser light scan range that includes a target wavelength. The differential absorption spectrum can be converted to a measured concentration of the reactive gas using calibration data. A determination can be made whether the background composition has substantially changed relative to the background absorption data, and new background absorption data can be used if the background composition has substantially changed. Related systems, apparatus, methods, and/or articles are also described.

IPC Classes  ?

  • B01D 59/26 - Separation by extracting by sorption, i.e. absorption, adsorption, persorption

83.

Scrubber for reactive gases

      
Application Number 12202098
Grant Number 07829046
Status In Force
Filing Date 2008-08-29
First Publication Date 2009-03-05
Grant Date 2010-11-09
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Baum, Marc M.
  • Moss, John
  • Zhou, Xin
  • Kwan, Alex
  • Feitisch, Alfred
  • Liu, Xiang

Abstract

3), can include reactive particles, potentially as small as nano-scale, that can optionally be suspended on macro-scale carrier particles. Reactive gases can be converted to non-volatile compounds by being passed through a bed of such scrubber media. Such scrubber media can be used to remove reactive gases from gas mixtures. Potential applications include differential absorption spectroscopy, air pollutant emission controls, and the like. Methods of preparing scrubber media are also described.

IPC Classes  ?

  • B01D 47/00 - Separating dispersed particles from gases, air or vapours by liquid as separating agent
  • B01J 38/12 - Treating with free oxygen-containing gas

84.

Wavelength dependent reflective sample substrates for raman and fluorescence spectroscopy

      
Application Number 11747477
Grant Number 07800752
Status In Force
Filing Date 2007-05-11
First Publication Date 2008-11-13
Grant Date 2010-09-21
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Fairchild, Ronald C.

Abstract

A material which is generally transparent in the visible region of the spectrum but reflective at laser wavelengths reduces undesirable, substrate-induced Raman and fluorescence scattering. A substrate provides a surface for supporting the sample, with the material being disposed between the surface of the substrate and the sample. The material is substantially transparent in the visible region of the spectrum but reflective at the laser wavelength, thereby minimizing unwanted Raman or fluorescence scattering that would be produced by the substrate if the material were not present. The substrate will typically be a glass microscope slide or multi-cell well plate. The optical filter material is preferably a multilayer dielectric filter acting as a “hot mirror” that reflects near-infrared energy. An advantage of visible transmission is that it allows back illumination from behind/underneath the slide or well plate, thereby being visible to a microscope's eyepiece or video camera. Methods and article are also disclosed.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry

85.

Reactive gas detection in complex backgrounds

      
Application Number 12101890
Grant Number 07704301
Status In Force
Filing Date 2008-04-11
First Publication Date 2008-10-16
Grant Date 2010-04-27
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Zhou, Xin
  • Liu, Xiang
  • Feitisch, Alfred
  • Sanger, Gregory M.

Abstract

A differential absorption spectrum for a reactive gas in a gas mixture can be generated for sample absorption data by subtracting background absorption data set from the sample absorption data. The background absorption data can be characteristic of absorption characteristics of the background composition in a laser light scan range that includes a target wavelength. The differential absorption spectrum can be converted to a measured concentration of the reactive gas using calibration data. A determination can be made whether the background composition has substantially changed relative to the background absorption data, and new background absorption data can be used if the background composition has substantially changed. Related systems, apparatus, methods, and/or articles are also described.

IPC Classes  ?

  • B01D 59/26 - Separation by extracting by sorption, i.e. absorption, adsorption, persorption

86.

Pressure-invariant trace gas detection

      
Application Number 11724665
Grant Number 07508521
Status In Force
Filing Date 2007-03-14
First Publication Date 2008-09-18
Grant Date 2009-03-24
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Zhou, Xin
  • Feitisch, Alfred
  • Sanger, Greg

Abstract

A system includes a light source, a detector, at least one pressure sensor, and a control unit. The light source emits light at a wavelength substantially corresponding to an absorption line of a target gas. The detector is positioned to detect the intensity of light emitted from the light source that has passed through the target gas. The pressure sensor detects the pressure of the target gas. The control circuit is coupled to the detector and the light source to adjust the modulation amplitude of the light source based on the pressure detected by the at least one pressure sensor. Related systems, apparatus, methods, and/or articles are also described.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 7/00 - Analysing materials by measuring the pressure or volume of a gas or vapour
  • G01N 9/00 - Investigating density or specific gravity of materialsAnalysing materials by determining density or specific gravity
  • G01N 19/00 - Investigating materials by mechanical methods
  • G01N 25/00 - Investigating or analysing materials by the use of thermal means
  • G01N 27/00 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means

87.

Raman probe configured for low-concentration measurements

      
Application Number 11873718
Grant Number 07692786
Status In Force
Filing Date 2007-10-17
First Publication Date 2008-07-31
Grant Date 2010-04-06
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Tedesco, James M.
  • Slater, Joseph B.

Abstract

Raman measurement apparatus optimized for gaseous and other low-concentration samples includes a focusing objective that uses only first-surface mirrors instead of lenses, thereby dramatically reducing background noise. In the preferred embodiment, the focusing and collimation functions performed by the objective section are performed by an off-axis parabolic mirror. A spherical first-surface mirror opposing the parabolic mirror re-images the counter-propagating beam back through the same focus for re-collimation by the parabolic mirror. A probe-head section operative to generate the counter-propagating beam has substrates and surfaces arranged such that the excitation beam does not pass through any substrates after it is filtered by the bandpass coating, thereby further decreasing background signals. Additionally, when the objective section includes the opposing spherical mirror, the excitation beam is collected substantially in its entirety and neutralized out of the collection path by the probe-head section.

IPC Classes  ?

88.

Background compensation by multiple-peak measurements for absorption spectroscopy-based gas sensing

      
Application Number 11929525
Grant Number 07586094
Status In Force
Filing Date 2007-10-30
First Publication Date 2008-07-31
Grant Date 2009-09-08
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Liu, Xiang
  • Zhou, Xin
  • Feitisch, Alfred
  • Sanger, Gregory M.

Abstract

Concentrations of a target analyte in a gas mixture containing one or more background analytes having potentially interfering spectral absorption features can be calculated by compensating for background analyte absorption at a target wavelength used to quantify the target analyte. Absorption can be measured at a reference wavelength chosen to quantify the concentration of the background analyte. Using a background gas adjustment factor or function, the absorption measured at the reference wavelength can be used to calculate absorption due to the background analyte at the target wavelength and thereby compensate for this background absorption to more accurately calculate the target analyte concentration in real or near real time. Additional background analytes can optionally be compensated for by using one or more additional reference wavelengths.

IPC Classes  ?

89.

SPECTRASENSORS

      
Application Number 138771300
Status Registered
Filing Date 2008-03-17
Registration Date 2011-02-18
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

(1) Diode laser gas sensors for detecting trace amounts of a first gas within a second gas for use in environmental monitoring. (2) Environmental monitoring sensors for detecting trace substances within a gaseous background; environmental monitoring sensors for detecting moisture in natural gas; environmental monitoring sensors for detecting carbon dioxide in natural gas; environmental monitoring sensors for detecting moisture in air; software for characterizing sensor data; software for operation by a sensor for detecting trace gases, software for remotely controlling a sensor for detecting trace gases; supervisory control and data acquisition software for data acquisition, control and monitoring of custody transfer metering; system control and data acquisition software and hardware; software for automated and on-demand polling of field monitoring devices; software for monitoring industrial processes; software for monitoring petrochemical equipment; software for controlling a plurality of remote sensors monitoring levels of trace gases within a background gas. (1) Installation services for gas sensors; services relating to repair and maintenance of gas sensors; software maintenance and repair.

90.

SPECTRASENSORS

      
Application Number 006737654
Status Registered
Filing Date 2008-03-10
Registration Date 2008-12-04
Owner Endress+Hauser Optical Analysis, Inc. (USA)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services

Goods & Services

Environmental monitoring sensors; gas sensors; diode laser gas sensors for detecting trace amounts of a first gas within a second gas for use in environmental monitoring; environmental monitoring sensors for detecting trace substances within a gaseous background; environmental monitoring sensors for detecting moisture in natural gas; environmental monitoring sensors for detecting carbon dioxide in natural gas; environmental monitoring sensors for detecting moisture in air; parts and fittings for all the aforesaid goods; software for environmental monitoring applications; software for characterizing sensor data; software for operation by a sensor for detecting trace gases, software for remotely controlling a sensor for detecting trace gases; supervisory control and data acquisition software for data acquisition, control and monitoring of custody transfer metering; SCADA software and hardware; software for automated and on-demand polling of field monitoring devices; software for monitoring industrial processes; software for monitoring petrochemical equipment; software for controlling a plurality of remote sensors monitoring levels of trace gases within a background gas. Installation services for gas sensors and environmental monitoring sensors; services relating to repair and maintenance of gas sensors and environmental monitoring sensors.

91.

Measuring trace components of complex gases using gas chromatography/absorption spectrometry

      
Application Number 11726001
Grant Number 07511802
Status In Force
Filing Date 2007-03-19
First Publication Date 2007-11-29
Grant Date 2009-03-31
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Smith, Stevie Horton

Abstract

Low concentrations of complex gas mixture components may be detected and quantified using a gas-chromatograph to separate a gas mixture prior to analysis of one or more eluting components using an absorption spectrometer. Substantial reductions in analytical system complexity and improvements in reliability are achieved compared with other commonly used methods for analyzing such complex mixtures.

IPC Classes  ?

  • G01J 3/26 - Generating the spectrumMonochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filter
  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

92.

Measuring water vapor in hydrocarbons

      
Application Number 11715599
Grant Number 07679059
Status In Force
Filing Date 2007-03-07
First Publication Date 2007-10-25
Grant Date 2010-03-16
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Zhou, Xin

Abstract

Low concentrations of water vapor within a background of one or more olefin gases may be detected and quantified using a differential absorption spectrometer. A dehydrated sample of the gas is used as a background sample whose absorption spectrum allows elimination of absorption features not due to water vapor in the gas. Absorption spectra may recorded using tunable diode lasers as the light source. These lasers may have a wavelength bandwidth that is narrower than the water vapor absorption feature used for the differential absorption spectral analysis.

IPC Classes  ?

  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry

93.

High-dispersion grisms

      
Application Number 11118978
Grant Number 07230761
Status In Force
Filing Date 2005-04-29
First Publication Date 2005-11-03
Grant Date 2007-06-12
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Arns, James A.

Abstract

A grism based upon a grating with a given line frequency is configured such that a design wavelength will undergo either a specific total bend angle, a zero-degree total bend without lateral displacement, or a zero-degree total bend with a lateral displacement. Each configuration exhibits the same dispersion characteristics. Other design wavelengths, bend angles and displacements are possible through appropriate adjustment of grating frequency, prism geometry, and/or material(s). A specific design is disclosed using light with a +/−delta wavelength around a design wavelength of 795 nm. The invention may be used to disperse light at different wavelengths, including wavelengths associated with optical communications bands.

IPC Classes  ?

94.

High-integrity seal for optical elements, dichromated gelatin holographic optical elements in particular

      
Application Number 10352309
Grant Number 07755818
Status In Force
Filing Date 2003-01-27
First Publication Date 2003-08-14
Grant Date 2010-07-13
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor
  • Slater, Joseph B.
  • Britton, Timothy J.
  • Ferree, Eric M.

Abstract

A method and apparatus for encapsulating optical elements, particularly dichromated gelatin (DGC) holographic optical elements (HOEs), exhibits a very high degree of environmental integrity. In broad terms, the optical element is disposed between opposing plates, and a metal seal soldered to the edge(s) of the plates to seal the optical element therewithin. In the preferred embodiment, the metalization includes chrome and nickel, or alloys thereof, followed by gold or platinum. The metallization is preferably applied using a low-temperature process such as vacuum deposition or sputtering. The metal seal may be in the form of a foil or wire. One or both of the plates are compatible with wavelengths of interest, and the technique may be used in transmissive and reflective configurations.

IPC Classes  ?

  • G03H 1/02 - Holographic processes or apparatus using light, infrared, or ultraviolet waves for obtaining holograms or for obtaining an image from themDetails peculiar thereto Details

95.

Laser indication light configuration

      
Application Number 10101798
Grant Number 07859660
Status In Force
Filing Date 2002-03-19
First Publication Date 2002-10-03
Grant Date 2010-12-28
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Slater, Joseph B.

Abstract

Indicator light apparatus and methods associated with a laser beam having a primary wavelength enable an operator to see the indicator while wearing protective eyewear tuned to the primary wavelength. The apparatus includes a source of indicator light other than the primary wavelength, a first optical element for co-injecting the indicator light into the laser beam to form a co-propagating beam, and an optical or physical configuration enabling an operator to view light from the co-propagating beam. The first optical element may be some form of beam splitter or combiner, and the configuration enabling an operator to view light from the co-propagating beam uses a diffuser upon which the co-propagating beam impinges. The indicator light is preferably derived from an inexpensive source, such as a diode laser operating in the 670-690 nm range. The invention is useful in many different environments, including stimulate emission systems, wherein one or more optical elements are used to direct the laser beam onto a sample to stimulate an optical emission therefrom. The stimulated emission may be representative of a Raman or fluorescence spectrum, for example.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/00 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours
  • G02C 7/10 - Filters, e.g. for facilitating adaptation of the eyes to the darkSunglasses