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Found results for
 patents
1.
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SCANNED PROBE MOUNTING DESIGN
| Application Number |
US2020032488 |
| Publication Number |
2020/232001 |
| Status |
In Force |
| Filing Date |
2020-05-12 |
| Publication Date |
2020-11-19 |
| Owner |
ANGSTROM SCIENCE, INC. (USA)
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| Inventor |
- Erickson, Andrew, Norman
- Hofstatter, Kyle, Alfred
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Abstract
This specification discloses a method and implementations improving the field of holding or mounting Scanning Probe Microscopy probe tips for use and alignment. Specifically, the invention allows probes to be mounted replaceably to a very small SPM actuator and aligned in 5 axes permitting alignment of cantilever (15, 215, 315) to beam (1) and reflected beam (2) to detector. The invention allows for great simplification of SPM design while allowing reduction in sizes and masses of tip mounting apparatus thereby improving performance.
IPC Classes ?
- B82Y 35/00 - Methods or apparatus for measurement or analysis of nanostructures
- B82Y 15/00 - Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
- G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders
- G01Q 60/34 - Tapping mode
- G01Q 60/40 - Conductive probes
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2.
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Scanned probe mounting design
| Application Number |
16411220 |
| Grant Number |
10816571 |
| Status |
In Force |
| Filing Date |
2019-05-14 |
| First Publication Date |
2020-10-27 |
| Grant Date |
2020-10-27 |
| Owner |
Angstrom Science, Inc. (USA)
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| Inventor |
- Erickson, Andrew Norman
- Hofstatter, Kyle Alfred
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Abstract
This specification discloses a method and implementations improving the field of holding or mounting Scanning Probe Microscopy probe tips for use and alignment. Specifically, the invention allows probes to be mounted replaceably to a very small SPM actuator and aligned in 5 axis permitting alignment of cantilever to beam and reflected beam to detector. The invention allows for great simplification of SPM design while allowing reduction in sizes and masses of tip mounting apparatus thereby improving performance.
IPC Classes ?
- G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders
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3.
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SCANNING PROBE MICROSCOPE HEAD DESIGN
| Application Number |
US2015041467 |
| Publication Number |
2016/014623 |
| Status |
In Force |
| Filing Date |
2015-07-22 |
| Publication Date |
2016-01-28 |
| Owner |
ANGSTROM SCIENCE, INC. (USA)
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| Inventor |
- Erickson, Andrew, Norman
- Ippolito, Stephen Bradley
- Hofstatter, Kyle Alfred
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Abstract
A SPM head incorporates a probe (207) and a cantilever (206) on which the probe is mounted. The cantilever has a planar reflecting surface (204) proximate a free end (205) of the cantilever. The cantilever extends from a mechanical mount (203) and a single-mode optical fiber (202) is supported by the mechanical mount to provide a beam axis (212) at an angle (210) away from normal relative to the reflecting surface.
IPC Classes ?
- G01Q 20/02 - Monitoring the movement or position of the probe by optical means
- G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
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