Abstract

An optical measuring device having a polarization state generator to prepare a measuring light having a defined polarization state propagating along an analysis beam path, a receiving equipment arranged downstream of the polarization state generator to receive at least a first measuring cell and a second measuring cell, a polarization state analyzer arranged downstream of the receiving equipment, a detector for detecting an intensity of the measuring light, a stationary transmitting/receiving system to communicate with at least one of the first measuring cell and the second measuring cell and an evaluation and control unit for evaluating measuring signals from the detector and/or the polarization state analyzer and/or the polarization state generator taking into account information communicated between the stationary transmitting/receiving system and at least one of the two measuring cells.

IPC Classes  ?

• G01N 21/88 - Investigating the presence of flaws, defects or contamination
• G01N 21/90 - Investigating the presence of flaws, defects or contamination in a container or its contents
• G01K 1/022 - Means for indicating or recording specially adapted for thermometers for recording

Abstract

2.

IPC Classes  ?

• G01N 21/21 - Polarisation-affecting properties
• G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
• G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
• G01J 4/00 - Measuring polarisation of light

Goods & Services

Measuring apparatus and instruments; Scientific apparatus and instruments; Apparatus and instruments for industrial process monitoring and control; Parts and fittings for the above goods; Software and hardware; All the aforesaid goods relating to spectrometers, spectrum analysers and integrated optics; In particular Raman spectrometers and Raman microscopes. Installation, construction and repair of scientific and measuring apparatus and instruments; Installation of scientific measuring apparatus and instruments; Information and consultancy relating to all the aforesaid; All the aforesaid services relating to spectrometers, spectrum analysers and integrated optics; In particular Raman spectrometers and Raman microscopes. Scientific and technological services and research and design relating thereto; Industrial analysis and research services; Design and development of computer hardware and software; All the aforesaid services relating to spectrometers, spectrum analysers and integrated optics; In particular Raman spectrometers and Raman microscopes.

Goods & Services

Measuring apparatus and instruments; Scientific apparatus and instruments; Sensors; Laboratory apparatus and instruments; Laboratory equipment; Measuring, regulating and testing apparatus; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control; Parts and fittings for the above goods; Software and hardware. Installation, construction and repair of scientific and measuring apparatus and instruments; Installation of scientific measuring apparatus and instruments; Information and consultancy relating to all the aforesaid. Scientific and technological services and research and design relating thereto; Industrial analysis and research services; Design and development of computer hardware and software.

Goods & Services

Measuring apparatus and instruments; Scientific apparatus and instruments; Sensors; Laboratory apparatus and instruments; Laboratory equipment; Measuring, regulating and testing apparatus; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control; Parts and fittings for the above goods; Software and hardware. Apparatus and instruments for use in analysis and diagnosis in the medical and/or veterinary sector, in particular infrared spectrometers, UV/Vis spectrometers, Raman spectrometers and Raman microscopes; Medical and surgical apparatus and instrument; parts and fittings for any of the aforesaid goods. Installation, construction and repair of scientific and measuring apparatus and instruments; Installation of scientific measuring apparatus and instruments; Information and consultancy relating to all the aforesaid. Scientific and technological services and research and design relating thereto; Industrial analysis and research services; Design and development of computer hardware and software.

Abstract

Measuring apparatus-calibration device for calibrating a measuring apparatus-temperature sensor of a, in particular optical, measuring apparatus, wherein the measuring apparatus-calibration device comprises a, preferably measuring apparatus-external, calibration-temperature sensor, which is traceably calibratable itself, for determining a calibration temperature in the region of a measuring surface of the measuring apparatus and a determination unit which is adapted for determining an information which is indicative for a discrepancy between a measuring apparatus-temperature which is captured by the measuring apparatus-temperature sensor in the region of the measuring surface and the calibration temperature, on whose basis the measuring apparatus-temperature sensor is calibratable.

IPC Classes  ?

• G01K 15/00 - Testing or calibrating of thermometers
• G01N 21/41 - Refractivity; Phase-affecting properties, e.g. optical path length
• G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
• G01N 21/43 - Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
• G01N 21/552 - Attenuated total reflection
• G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light

Abstract

Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of the sample, wherein the calibration device comprises an itself traceably calibratable determination unit, which is preferably at least partially external of the refractometer, which is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on whose basis the refractometer is calibratable.

IPC Classes  ?

• G01N 21/41 - Refractivity; Phase-affecting properties, e.g. optical path length
• G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

Abstract

Disclosed is an optical measuring system (100) for determining polarisation rotation characteristics of a sample (P), which system has: a polarisation state generator (PSG) that is configured to prepare a measurement light (ML), which propagates along an analysis beam path, with a defined polarisation state; a sample receptacle (PT) which is arranged downstream of the PSG in the analysis beam path and which is designed to receive the sample; a polarisation state analyser (PSA) which is arranged downstream of the sample receptacle in the analysis beam path; a detector (Det) arranged downstream of the PSA in the analysis beam path for detecting the measurement light, wherein the PSA and the detector are configured to detect a polarisation rotation (αP(λeff)) of the measurement light caused by the sample; and has an evaluation and control unit (μP) for evaluating measurement signals from the detector and/or the PSA and/or the PSG, wherein: a wavelength spectrum of the measurement light comprises at least a first wavelength (λ1) and a second wavelength (λ2); the detector is configured to detect measurement light with the first wavelength separately from measurement light with the second wavelength; and wherein the evaluation and control unit is configured to calculate a polarisation rotation (αP(λ0)) of the measurement light caused by the sample at a standardised wavelength (λ0) in accordance with: (a) a first polarisation rotation (αP(λ1)) at the first wavelength (λ1); (b) a second polarisation rotation (αP(λ2)) at the second wavelength (λ2); (c) a first transmission (T(λ1)) at the first wavelength (λ1); and (d) a second transmission (T(λ2)) at the second wavelength (λ2).

IPC Classes  ?

• G01N 21/21 - Polarisation-affecting properties
• G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

Abstract

The present invention is directed to temperature modulated refractive index measurement. In accordance with the invention a method for determination of the complex temperature coefficient of the refractive index of a sample is provided, wherein the determination of the complex temperature coefficient of the refractive index of the sample is based on a refractive index measurement. Furthermore, the refractive index of the sample is measured over a period of time, wherein the temperature of the sample is modulated over said period of time and the complex temperature coefficient of the refractive index is calculated on the basis of the refractive index measurement over the period of time and the temperature modulation over the period of time. Additionally, a measurement system, in particular comprising a temperature control system and a processing system to carry out the above method, is disclosed.

IPC Classes  ?

• G01N 21/41 - Refractivity; Phase-affecting properties, e.g. optical path length
• G01N 21/43 - Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
• G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated

Abstract

The present invention is directed to temperature modulated refractive index measurement. In accordance with the invention a method for determination of the complex temperature coefficient of the refractive index of a sample 2 is provided, wherein the determination of the complex temperature coefficient of the refractive index of the sample 2 is based on a refractive index measurement. Furthermore, the refractive index of the sample 2 is measured over a period of time, wherein the temperature of the sample is modulated over said period of time and the complex temperature coefficient of the refractive index is calculated on the basis of the refractive index measurement over the period of time and the temperature modulation over the period of time. Additionally, a measurement system 1, in particular comprising a temperature control system 6 and a processing system 8 adapted to carry out the above method, is disclosed.

IPC Classes  ?

• G01N 21/41 - Refractivity; Phase-affecting properties, e.g. optical path length