The accuracy of an impedance tuner may be improved, and the size may be reduced by using linear actuators instead of rotary motors. The linear actuator may be integrated with position sensors to allow very small size, and implemented with a servo system for best accuracy and speed. Spring loaded arms holding the mismatch probes allow the tuner to operate in any orientation to further fit into small spaces. The small size reduces losses by allowing direct connection to wafer probes for on-wafer measurement systems.
The accuracy of an impedance tuner may be improved, and the size may be reduced by using linear actuators instead of rotary motors. The linear actuator may be integrated with position sensors to allow very small size, and implemented with a servo system for best accuracy and speed. Spring loaded arms holding the mismatch probes allow the tuner to operate in any orientation to further fit into small spaces. The small size reduces losses by allowing direct connection to wafer probes for on-wafer measurement systems.
The accuracy of an impedance tuner may be improved and the size may be reduced by using linear actuators instead of rotary motors. The linear actuator may be integrated with position sensors to allow very small size, and implemented with a servo system for best accuracy and speed. Spring loaded arms holding the mismatch probes allow the tuner to operate in any orientation to further fit into small spaces. The small size reduces losses by allowing direct connection to wafer probes for on-wafer measurement systems.
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01D 5/14 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
A multi-section probe and a tapered probe for impedance tuners to broaden the band width of the probes and hence the band width of the tuners. The multi-section probe and the tapered probe are configured to transform the characteristic impedance of the tuner transmission line step-by-step or continuously to a target impedance value.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
5.
MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPLITUDE TUNING
A load pull system for making measurements on a OUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control (2, 2A, 3, 3A, 9, 9A) of each signal at low frequency before being up-converted (7, 7A) to the millimeter wave measurement frequencies. The measured signals at the OUT plane may be downconverted (9, 9A) for measurement with a low frequency analyzer.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
6.
MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPLITUDE TUNING
A load pull system for making measurements on a OUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control (2, 2A, 3, 3A, 9, 9A) of each signal at low frequency before being up-converted (7, 7A) to the millimeter wave measurement frequencies. The measured signals at the OUT plane may be downconverted (9, 9A) for measurement with a low frequency analyzer.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
7.
Millimeter wave active load pull using low frequency phase and amplitude tuning
A load pull system for making measurements on a DUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control of each signal at low frequency before being upconverted to the millimeter wave measurement frequencies. The measured signals at the DUT plane may be down-converted for measurement with a low frequency analyzer.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/3193 - Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
A probe for a slab line impedance tuner system is operable over a frequency bandwidth. The tuner system includes opposed slab conductor plates and a center conductor disposed between the slab conductor plates. A probe carriage and a drive system move the probe carriage in a longitudinal direction parallel to the center conductor. The probe comprises: a plurality of probe sections mounted adjacent to one another with no gaps between adjacent probe sections. Each probe section has a different characteristic impedance from every other probe section at some position in the range of the longitudinal directional movement of the probe. A number of the probe sections forming the plurality of probe sections is sufficient to provide a desired characteristic impedance transformation for the frequency bandwidth. The characteristic impedance of the tuner system is transformed probe-section by probe-section by the probe to intermediate impedance values to reach a target impedance value.
A multi-section probe and a tapered probe for impedance tuners to broaden the band width of the probes and hence the band width of the tuners. Each section of the multi-section probe has a nominal length equal to one quarter wavelength at a midpoint of the operating band. The tapered probe has a length equivalent to a plurality of one quarter wavelengths of the frequency midpoint. The multi-section probe and the tapered probe are configured to transform the characteristic impedance of the tuner transmission line step-by-step or continuously to a target impedance value.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/04 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants
A multi-section probe and a tapered probe for impedance tuners to broaden the band width of the probes and hence the band width of the tuners. Each section of the multi-section probe has a nominal length equal to one quarter wavelength at a midpoint of the operating band. The tapered probe has a length equivalent to a plurality of one quarter wavelengths of the frequency midpoint. The multi-section probe and the tapered probe are configured to transform the characteristic impedance of the tuner transmission line step-by-step or continuously to a target impedance value.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/04 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants
A multi-section probe and a tapered probe for impedance tuners to broaden the band width of the probes and hence the band width of the tuners. Each section of the multi-section probe has a nominal length equal to one quarter wavelength at a midpoint of the operating band. The tapered probe has a length equivalent to a plurality of one quarter wavelengths of the frequency midpoint. The multi-section probe and the tapered probe are configured to transform the characteristic impedance of the tuner transmission line step-by-step or continuously to a target impedance value.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
12.
BROADBAND DIRECTIONAL COUPLERS FOR TEM AND QUASI-TEM MODE GUIDES AND LINES
A directional coupler operable at microwave and RF frequencies. Embodiments of directional coupler includes a main transmission line supporting transverse electromagnetic (TEM) or quasi-TEM wave mode propagation. A coupled transmission line supports TEM or quasi-TEM wave mode propagation. The coupled transmission line is adjacent to and oriented at an angle with respect to the main transmission line. A coupling hole is formed through conductive shielding between the main and coupled lines, the coupling hole formed at an intersection region between the main and coupled lines. The angle is nominally 60 degrees for optimal directivity and isolation.
H01P 5/18 - Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
13.
BROADBAND DIRECTIONAL COUPLERS FOR TEM AND QUASI-TEM MODE GUIDES AND LINES
A directional coupler operable at microwave and RF frequencies. Embodiments of directional coupler includes a main transmission line supporting transverse electromagnetic (TEM) or quasi-TEM wave mode propagation. A coupled transmission line supports TEM or quasi-TEM wave mode propagation. The coupled transmission line is adjacent to and oriented at an angle with respect to the main transmission line. A coupling hole is formed through conductive shielding between the main and coupled lines, the coupling hole formed at an intersection region between the main and coupled lines. The angle is nominally 60 degrees for optimal directivity and isolation.
H01P 5/18 - Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
14.
Broadband directional couplers for TEM and quasi-TEM mode guides and lines
A directional coupler operable at microwave and RF frequencies. Embodiments of directional coupler includes a main transmission line supporting transverse electromagnetic (TEM) or quasi-TEM wave mode propagation. A coupled transmission line supports TEM or quasi-TEM wave mode propagation. The coupled transmission line is adjacent to and oriented at an angle with respect to the main transmission line. A coupling hole is formed through conductive shielding between the main and coupled lines, the coupling hole formed at an intersection region between the main and coupled lines. The angle is nominally 60 degrees for optimal directivity and isolation.
H01P 5/18 - Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
H01P 5/02 - Coupling devices of the waveguide type with invariable factor of coupling
H01P 5/08 - Coupling devices of the waveguide type for linking lines or devices of different kinds
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
15.
MEASUREMENT SYSTEM CONFIGURED FOR MEASUREMENT AT NON-CALIBRATED FREQUENCIES
A tuner system for conducting measurements on a Device Under Test (DUT) includes at least one passive tuner, and calibration data for the at least one passive tuner including a set of s-parameters at a set of calibration frequencies. A measurement on the DUT is done at a measurement frequency at which the at least one passive tuner is not calibrated. The tuner s-parameters at the measurement frequency are determined by interpolation between or extrapolation from the s-parameters at calibration frequencies.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
16.
Measurement system configured for measurements at non-calibrated frequencies
A tuner system for conducting measurements on a Device Under Test (DUT) includes at least one passive tuner, and calibration data for the at least one passive tuner including a set of s-parameters at a set of calibration frequencies. A measurement on the DUT is done at a measurement frequency at which the at least one passive tuner is not calibrated. The tuner s-parameters at the measurement frequency are determined by interpolation between or extrapolation from the s-parameters at calibration frequencies.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
17.
MEASUREMENT SYSTEM CONFIGURED FOR MEASUREMENT AT NON-CALIBRATED FREQUENCIES
A tuner system for conducting measurements on a Device Under Test (DUT) includes at least one passive tuner, and calibration data for the at least one passive tuner including a set of s-parameters at a set of calibration frequencies. A measurement on the DUT is done at a measurement frequency at which the at least one passive tuner is not calibrated. The tuner s-parameters at the measurement frequency are determined by interpolation between or extrapolation from the s-parameters at calibration frequencies.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
18.
MEASUREMENT SYSTEM AND CALIBRATION METHOD WITH WIDEBAND MODULATION
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
19.
Measurement system and calibration method with wideband modulation
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
G01R 31/319 - Tester hardware, i.e. output processing circuits
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
20.
MEASUREMENT SYSTEM AND CALIBRATION METHOD WITH WIDEBAND MODULATION
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase. A multi-section probe for an impedance tuner system may include a plurality of probe sections and a holder structure for mechanically supporting the plurality of probe sections.
A system and method for measuring noise parameters of a linear device-under-test is provided. The system includes a noise source, an impedance generator, a receiver for measuring noise power of the device-under-test, and a processor and memory. The impedance generator has a plurality of impedance generator settings to generate a plurality of driving-port impedances over a plurality of frequencies. The processor is configured for identifying a plurality of stable driving-port impedances, calculating an aggregate driving-port impedance for each of the stable driving-port impedances, identifying a minimal set of impedance generator settings for a user-selected frequency range, and calculating the noise parameters of the device-under-test based on the noise power measured by the receiver. The minimal set of impedance generator settings provide at least one aggregate driving-port impedance located within each of four linearly independent regions of a Smith Chart over the user-selected frequency range.
Embodiments of a broadband capacitor in a coaxial line are described. A capacitor may be realized in the center conductor of the coaxial line, and this aspect has two different embodiments. One embodiment forms the capacitor between the flat faces of an interrupted inner conductor structure. A second embodiment forms the capacitor between overlapping fingers of the female inner conductor and the male inner conductor, where the fingers can be realized in different ways. In another embodiment, a capacitor is realized in the outer conductor of the coaxial line, between fingers of a female portion of the outer conductor and a male portion of the outer conductor, where the fingers can be realized in different ways.
A solid state impedance tuner or impedance tuner system including a housing structure and at least two solid state tuner modules electrically combined and disposed in one package within the housing structure. Each tuner module includes at least one solid state control element.
Another embodiment is directed to an impedance tuner module card configured in a standardized system architecture. The card includes a chassis board, and at least one solid state tuner module integrated on the card and supported on or by the chassis board, each module including at least one solid state control element.
Methods for calibrating a solid state impedance tuner that includes at least two solid state tuner modules combined in one package are disclosed.
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/02 - Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G01R 1/00 - Details of instruments or arrangements of the types covered by groups or
H03H 1/00 - Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network
Embodiments of a broadband capacitor in a coaxial line are described. A capacitor may be realized in the center conductor of the coaxial line, and this aspect has two different embodiments. One embodiment forms the capacitor between the flat faces of an interrupted inner conductor structure. A second embodiment forms the capacitor between overlapping fingers of the female inner conductor and the male inner conductor, where the fingers can be realized in different ways. In another embodiment, a capacitor is realized in the outer conductor of the coaxial line, between fingers of a female portion of the outer conductor and a male portion of the outer conductor, where the fingers can be realized in different ways.
Systems and methods of measuring and determining noise parameters. An exemplary method measures noise data and determines element values of a device noise model for a device under test (DUT), using a test system including an impedance tuner coupled to an input of the DUT for presenting a controllable variable impedance to the DUT and a noise receiver coupled to an output of the DUT. Noise data is measured as a function of at least one measurement parameter. The measured data includes raw noise data read from the noise receiver, and is used to determine element values of the device noise model. The system may include a database of device models
Systems and methods of measuring and determining noise parameters. An exemplary method measures noise data and determines element values of a device noise model for a device under test (DUT), using a test system including an impedance tuner coupled to an input of the DUT for presenting a controllable variable impedance to the DUT and a noise receiver coupled to an output of the DUT. Noise data is measured as a function of at least one measurement parameter. The measured data includes raw noise data read from the noise receiver, and is used to determine element values of the device noise model. The system may include a database of device models
Systems and methods of measuring and determining noise parameters. An exemplary method measures noise data and determines element values of a device noise model for a device under test (DUT), using a test system including an impedance tuner coupled to an input of the DUT for presenting a controllable variable impedance to the DUT and a noise receiver coupled to an output of the DUT. Noise data is measured as a function of at least one measurement parameter. The measured data includes raw noise data read from the noise receiver, and is used to determine element values of the device noise model. The system may include a database of device models.
An impedance tuner having an RF transmission line, with a single lead screw extending along the RF transmission line. A plurality of movable carriages are engaged with the lead screw, wherein each of the plurality of movable carriages is configured for independent movement relative to other carriages. A motorized drive system drives the plurality of movable carriages independently along the lead screw.
G01R 1/20 - Modifications of basic electric elements for use in electric measuring instrumentsStructural combinations of such elements with such instruments
An impedance tuner having an RF transmission line, with a single lead screw extending along the RF transmission line. A plurality of movable carriages are engaged with the lead screw, wherein each of the plurality of movable carriages is configured for independent movement relative to other carriages. A motorized drive system drives the plurality of movable carriages independently along the lead screw.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
An impedance tuner includes a controller, an RF transmission line, and a movable capacitive object configured for movement commanded by the controller relative to the transmission line to alter impedance. A position sensor is configured to provide feedback position data to the controller indicative of the actual position of the capacitive object after it is moved. The controller is configured to utilize the feedback position data in a closed loop to position the capacitive object at a desired position within a tolerance.
An impedance tuner includes a controller, an RF transmission line, and a movable capacitive object configured for movement commanded by the controller relative to the transmission line to alter impedance. A position sensor is configured to provide feedback position data to the controller indicative of the actual position of the capacitive object after it is moved. The controller is configured to utilize the feedback position data in a closed loop to position the capacitive object at a desired position within a tolerance.
G01R 1/20 - Modifications of basic electric elements for use in electric measuring instrumentsStructural combinations of such elements with such instruments
H02P 8/00 - Arrangements for controlling dynamo-electric motors rotating step by step
An impedance tuner includes a controller, an RF transmission line, and a movable capacitive object configured for movement commanded by the controller relative to the transmission line to alter impedance. A position sensor is configured to provide feedback position data to the controller indicative of the actual position of the capacitive object after it is moved. The controller is configured to utilize the feedback position data in a closed loop to position the capacitive object at a desired position within a tolerance.
An impedance tuner having an RF transmission line, with a single lead screw extending along the RF transmission line. A plurality of movable carriages are engaged with the lead screw, wherein each of the plurality of movable carriages is configured for independent movement relative to other carriages. A motorized drive system drives the plurality of movable carriages independently along the lead screw.
H03J 1/06 - Driving or adjusting arrangementsDetails of adjusting, driving, indicating, or mechanical control arrangements for resonant circuits in general combined with other driving or adjusting arrangements, e.g. of gain control
H03H 7/40 - Automatic matching of load impedance to source impedance
35.
SELF-CHARACTERIZING, SELF CALIBRATING AND SELF-MEASURING IMPEDANCE TUNERS
An impedance tuner system, usable in a measurement system including at least one measurement system device, the tuner system comprising the impedance tuner having a signal transmission line, and an impedance-varying system coupled to the transmission line, and responsive to command signals to selectively vary the impedance presented by the impedance tuner. An impedance tuner controller is configured to generate the command signals, and wherein measurement device drivers and at least one of characterization, calibration and measurement algorithms are embedded into the tuner controller, the tuner controller configured to allow a user to control execution of said at least one of the characterization, calibration and measurement algorithms using the tuner controller.
An impedance tuner system, usable in a measurement system including at least one measurement system device, the tuner system comprising the impedance tuner having a signal transmission line, and an impedance-varying system coupled to the transmission line, and responsive to command signals to selectively vary the impedance presented by the impedance tuner. An impedance tuner controller is configured to generate the command signals, and wherein measurement device drivers and at least one of characterization, calibration and measurement algorithms are embedded into the tuner controller, the tuner controller configured to allow a user to control execution of said at least one of the characterization, calibration and measurement algorithms using the tuner controller.
An impedance tuner system, usable in a measurement system including at least one measurement system device, the tuner system comprising the impedance tuner having a signal transmission line, and an impedance-varying system coupled to the transmission line, and responsive to command signals to selectively vary the impedance presented by the impedance tuner. An impedance tuner controller is configured to generate the command signals, and wherein measurement device drivers and at least one of characterization, calibration and measurement algorithms are embedded into the tuner controller, the tuner controller configured to allow a user to control execution of said at least one of the characterization, calibration and measurement algorithms using the tuner controller.
Methods are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.
A measurement system and method for conducting measurements on a device-under-test (DUT). The system includes, in one embodiment, a passive impedance controlling tuner, and a signal transmission line, the tuner including a signal transmission line segment as at least part of the signal transmission line. A signal coupling device is coupled in a non-contacting relationship to the signal transmission line between a signal port of the DUT and the tuner for sampling signals propagating between the passive impedance controlling tuner and the DUT to allow measurement of an actual impedance presented to the DUT with the DUT in place in the measurement system during measurement of DUT characteristics. Measurement system equipment receives response signals from the signal coupler. The measurement system is configured to conduct measurement of DUT characteristics without pre-characterizing the impedance controlling tuner.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
G01R 27/04 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
A mechanical impedance tuner has at least two probe carriages mounted for movement along an axis parallel to the center conductor. The at least two probe carriages including a first probe carriage and a second probe carriage. Each probe carriage has at least N probes where N is an integer equal to or greater than one, and at least one of the N probes is mechanically different or of different nominal geometry from the probes on at least one of the other carriages so that each such probe has an non-identical frequency response.
A mechanical impedance tuner has at least two probe carriages mounted for movement along an axis parallel to the center conductor. The at least two probe carriages including a first probe carriage and a second probe carriage. Each probe carriage has at least N probes where N is an integer equal to or greater than one, and at least one of the N probes is mechanically different or of different nominal geometry from the probes on at least one of the other carriages so that each such probe has an non-identical frequency response.
A mechanical impedance tuner has at least two probe carriages mounted for movement along an axis parallel to the center conductor. The at least two probe carriages including a first probe carriage and a second probe carriage. Each probe carriage has at least N probes where N is an integer equal to or greater than one, and at least one of the N probes is mechanically different or of different nominal geometry from the probes on at least one of the other carriages so that each such probe has an non-identical frequency response.
A male coaxial connector structure for mating with a corresponding female connector structure to provide electrical connections at microwave frequencies. The male coaxial connector structure includes a coaxial outer conductor structure having a central longitudinal axis and a central open region, with a face region at a leading end of the outer conductor structure, defining a continuous uninterrupted coaxial outer conductor surface. An outer compression finger structure is disposed outside of and adjacent the coaxial outer conductor surface and having a plurality of longitudinally oriented slots forming individual finger regions. The face region is configured to contact a corresponding face surface of the female connector structure with the male and female connectors mated together. The finger regions of the outer compression finger structure are configured to compress to fit into the outer conductor receptacle of the female connector.
H01R 24/40 - Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
H01R 24/70 - Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure with pins, blades or analogous contacts and secured to apparatus or structure, e.g. to a wall with additional earth or shield contacts
H01R 43/26 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for engaging or disengaging the two parts of a coupling device
A male coaxial connector structure for mating with a corresponding female connector structure to provide electrical connections at microwave frequencies. The male coaxial connector structure includes a coaxial outer conductor structure having a central longitudinal axis and a central open region, with a face region at a leading end of the outer conductor structure, defining a continuous uninterrupted coaxial outer conductor surface. An outer compression finger structure is disposed outside of and adjacent the coaxial outer conductor surface and having a plurality of longitudinally oriented slots forming individual finger regions. The face region is configured to contact a corresponding face surface of the female connector structure with the male and female connectors mated together. The finger regions of the outer compression finger structure are configured to compress to fit into the outer conductor receptacle of the female connector.
H01R 24/70 - Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure with pins, blades or analogous contacts and secured to apparatus or structure, e.g. to a wall with additional earth or shield contacts
H01R 24/40 - Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
A solid state impedance tuner (30) or impedance tuner system including a housing structure (36) and at least two solid state tuner modules (10) electrically combined and disposed in one package within the housing structure. Each tuner module includes at least one solid state control element. Another embodiment is directed to an impedance tuner module card configured in a standardized system architecture. The card includes a chassis board, and at least one solid state tuner module integrated on the card and supported on or by the chassis board, each module including at least one solid state control element. Methods for calibrating a solid state impedance tuner that includes at least two solid state tuner modules combined in one package are disclosed.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
A solid state impedance tuner (30) or impedance tuner system including a housing structure (36) and at least two solid state tuner modules (10) electrically combined and disposed in one package within the housing structure. Each tuner module includes at least one solid state control element. Another embodiment is directed to an impedance tuner module card configured in a standardized system architecture. The card includes a chassis board, and at least one solid state tuner module integrated on the card and supported on or by the chassis board, each module including at least one solid state control element. Methods for calibrating a solid state impedance tuner that includes at least two solid state tuner modules combined in one package are disclosed.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
A solid state impedance tuner or impedance tuner system includes a control element array with a plurality of solid state control elements configured to be turned on simultaneously to achieve a desired impedance state. The control element array comprises N solid state control elements arranged along an RF transmission line. A controller selectively turns on or off each control element by application of a control signal to vary an impedance presented by the control element array, Another aspect is an impedance tuner module card configured in a standardized system architecture, with a chassis board, and at least one solid state tuner module integrated on the card A chassis electrical connector connected to the tuner module is configured for connection to a corresponding backplane connector. Methods for calibrating a solid state impedance tuner that includes at least two solid state tuner modules combined in one package are disclosed.
H03H 7/40 - Automatic matching of load impedance to source impedance
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
G01R 1/00 - Details of instruments or arrangements of the types covered by groups or
A male coaxial connector structure for mating with a corresponding female connector structure to provide electrical connections at microwave frequencies. The male coaxial connector structure includes a coaxial outer conductor structure having a central longitudinal axis and a central open region, with a face region at a leading end of the outer conductor structure, defining a continuous uninterrupted coaxial outer conductor surface. An outer compression finger structure is disposed outside of and adjacent the coaxial outer conductor surface and having a plurality of longitudinally oriented slots forming individual finger regions. The face region is configured to contact a corresponding face surface of the female connector structure with the male and female connectors mated together. The finger regions of the outer compression finger structure are configured to compress to fit into the outer conductor receptacle of the female connector.
Exemplary embodiments of a torque ring or nut system for use on or with RF and microwave male/female paired coaxial connectors, to apply a pre-set torque value to the mated coaxial connector pair. The torque system includes an inner ring structure and an outer ring structure configured for rotation relative to each other. Rotation of the outer ring structure applies a torque to the inner ring structure.
H01R 43/26 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for engaging or disengaging the two parts of a coupling device
H01R 24/40 - Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
Exemplary embodiments of a torque ring or nut system for use on or with RF and microwave male/female paired coaxial connectors, to apply a pre-set torque value to the mated coaxial connector pair. The torque system includes an inner ring structure and an outer ring structure configured for rotation relative to each other. Rotation of the outer ring structure applies a torque to the inner ring structure.
B25B 23/155 - Arrangement of torque limiters or torque indicators in wrenches or screwdrivers wherein the work-contacting means is released from torque-transmitting engagement with the work, when a selected torque is exceeded
51.
Web-enabled controller for impedance tuner systems
A system and method for controlling an impedance tuner system. In one embodiment, a web-enabled electronic controller controls an impedance tuner system including a signal transmission line and an electronically-controllable impedance-varying system coupled to the signal transmission line for affecting the impedance presented by the signal transmission line. The controller has a communication port, and an electronic processor configured to process external command signals and generate electronic control signals to configure the impedance-varying system in response to the command signals. An electronic memory stores sets of data and one or more web pages. The controller has a communication server and is configured to receive or send signals through a communication channel from or to a client computer system. The communication server is configured to be responsive to a request message from a client computer system to send a response comprising a web page to the client computer system. The controller processes commands received from the client computer system into the electronic control signals.
An exemplary embodiment of a method for controlling an impedance tuner system includes providing a web-enabled controller having a communication server, storing web pages on the controller, sending a client request to the communication server from a client computer through a communication channel, in response to the client request, sending the web page to the client computer from the impedance tuner system through the communication channel, entering user commands through the web page and transmitting signals representing the user commands to the tuner controller, and processing the user commands by the tuner controller to provide tuner drive signals to set the tuner to a state determined by the user commands.
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
H04L 12/24 - Arrangements for maintenance or administration
A system and method for controlling an impedance tuner system. In one embodiment, a web-enabled electronic controller controls an impedance tuner system including a signal transmission line and an electronically-controllable impedance-varying system coupled to the signal transmission line for affecting the impedance presented by the signal transmission line. The controller has a communication port, and an electronic processor configured to process external command signals and generate electronic control signals to configure the impedance-varying system in response to the command signals. An electronic memory stores sets of data and one or more web pages. The controller has a communication server and is configured to receive or send signals through a communication channel from or to a client computer system. The communication server is configured to be responsive to a request message from a client computer system to send a response comprising a web page to the client computer system. The controller processes commands received from the client computer system into the electronic control signals. An exemplary embodiment of a method for controlling an impedance tuner system includes providing a web-enabled controller having a communication server, storing web pages on the controller, sending a client request to the communication server from a client computer through a communication channel, in response to the client request, sending the web page to the client computer from the impedance tuner system through the communication channel, entering user commands through the web page and transmitting signals representing the user commands to the tuner controller, and processing the user commands by the tuner controller to provide tuner drive signals to set the tuner to a state determined by the user commands.
H04B 1/18 - Input circuits, e.g. for coupling to an antenna or a transmission line
H04L 29/06 - Communication control; Communication processing characterised by a protocol
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
53.
WEB-ENABLED CONTROLLER FOR IMPEDANCE TUNER SYSTEMS
A system and method for controlling an impedance tuner system. In one embodiment, a web-enabled electronic controller controls an impedance tuner system including a signal transmission line and an electronically-controllable impedance-varying system coupled to the signal transmission line for affecting the impedance presented by the signal transmission line. The controller has a communication port, and an electronic processor configured to process external command signals and generate electronic control signals to configure the impedance-varying system in response to the command signals. An electronic memory stores sets of data and one or more web pages. The controller has a communication server and is configured to receive or send signals through a communication channel from or to a client computer system. The communication server is configured to be responsive to a request message from a client computer system to send a response comprising a web page to the client computer system. The controller processes commands received from the client computer system into the electronic control signals. An exemplary embodiment of a method for controlling an impedance tuner system includes providing a web-enabled controller having a communication server, storing web pages on the controller, sending a client request to the communication server from a client computer through a communication channel, in response to the client request, sending the web page to the client computer from the impedance tuner system through the communication channel, entering user commands through the web page and transmitting signals representing the user commands to the tuner controller, and processing the user commands by the tuner controller to provide tuner drive signals to set the tuner to a state determined by the user commands.
H04L 41/0253 - Exchanging or transporting network management information using the InternetEmbedding network management web servers in network elementsWeb-services-based protocols using browsers or web-pages for accessing management information
H04L 67/02 - Protocols based on web technology, e.g. hypertext transfer protocol [HTTP]
H04L 67/025 - Protocols based on web technology, e.g. hypertext transfer protocol [HTTP] for remote control or remote monitoring of applications
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
H04B 1/18 - Input circuits, e.g. for coupling to an antenna or a transmission line
H04L 61/5014 - Internet protocol [IP] addresses using dynamic host configuration protocol [DHCP] or bootstrap protocol [BOOTP]
An impedance tuner may include a shunt stub located at a fixed location along the transmission media, and a phase shifter to control the reflection phase. Another embodiment includes an adjustable length shunt stub connected on the transmission media, a variable phase shifter connected between the DUT port and the adjustable length shunt stub, a probe arranged for movement in a direction transverse to the direction of signal propagation. Another embodiment includes a reflection magnitude control system mounted in a fixed position relative to a direction of signal propagation along the transmission media, and a phase shifter to control a reflection phase.
G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass
G01R 27/28 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
56.
SYSTEMS AND METHODS FOR IMPEDANCE TUNER INITIALIZATION
An exemplary embodiment of a multiple carriage tuner employs a carriage initialization technique, in which at least two of the carriages (60, 70) are initialized at fixed positions. This has the advantage of faster initialization, since multiple carriages can be moving simultaneously, if desired. In another embodiment, a method is described for initializing a mechanical impedance tuner with at least two probe carriages and a center conductor, each of the at least two probe carriages moveable independently along an axis parallel to the center conductor by commanding respective carriage drive motors to move in opposite directions along the axis, recording as a first carriage zero or home position of the first motor a first fixed initialization location indicated by a first sensor signal generated by proximity of the first carriage to the first fixed initialization location (52A) so that future positioning of the first carriage is determined from this first zero or home position, and recording as a second carriage zero or home position of the second motor a second fixed initialization location indicated by a second sensor signal generated by proximity of the second carriage to the second fixed initialization location (54A) so that future positioning of the second carriage is determined from this second zero or home position.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
57.
Systems and methods for impedance tuner initialization
An exemplary embodiment of a multiple carriage tuner employs a carriage initialization technique, in which at least two of the carriages are initialized at fixed positions. This has the advantage of faster initialization, since multiple carriages can be moving simultaneously, if desired. In another embodiment, a method is described for initializing a mechanical impedance tuner with at least two probe carriages and a center conductor, each of the at least two probe carriages moveable independently along an axis parallel to the center conductor by commanding respective carriage drive motors to move in opposite directions along the axis, recording as a first carriage zero or home position of the first motor a first fixed initialization location indicated by a first sensor signal generated by proximity of the first carriage to the first fixed initialization location so that future positioning of the first carriage is determined from this first zero or home position, and recording as a second carriage zero or home position of the second motor a second fixed initialization location indicated by a second sensor signal generated by proximity of the second carriage to the second fixed initialization location so that future positioning of the second carriage is determined from this second zero or home position.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
58.
SYSTEMS AND METHODS FOR IMPEDANCE TUNER INITIALIZATION
An exemplary embodiment of a multiple carriage tuner employs a carriage initialization technique, in which at least two of the carriages (60, 70) are initialized at fixed positions. This has the advantage of faster initialization, since multiple carriages can be moving simultaneously, if desired. In another embodiment, a method is described for initializing a mechanical impedance tuner with at least two probe carriages and a center conductor, each of the at least two probe carriages moveable independently along an axis parallel to the center conductor by commanding respective carriage drive motors to move in opposite directions along the axis, recording as a first carriage zero or home position of the first motor a first fixed initialization location indicated by a first sensor signal generated by proximity of the first carriage to the first fixed initialization location (52A) so that future positioning of the first carriage is determined from this first zero or home position, and recording as a second carriage zero or home position of the second motor a second fixed initialization location indicated by a second sensor signal generated by proximity of the second carriage to the second fixed initialization location (54A) so that future positioning of the second carriage is determined from this second zero or home position.
H01P 5/04 - Coupling devices of the waveguide type with variable factor of coupling
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase. A multi-section probe for an impedance tuner system may include a plurality of probe sections and a holder structure for mechanically supporting the plurality of probe sections.
Methods and systems are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.
G01R 29/26 - Measuring noise figureMeasuring signal-to-noise ratio
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
Methods are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.
G06F 19/00 - Digital computing or data processing equipment or methods, specially adapted for specific applications (specially adapted for specific functions G06F 17/00;data processing systems or methods specially adapted for administrative, commercial, financial, managerial, supervisory or forecasting purposes G06Q;healthcare informatics G16H)
G01R 29/26 - Measuring noise figureMeasuring signal-to-noise ratio
Methods and systems are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.
G01R 29/26 - Measuring noise figureMeasuring signal-to-noise ratio
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase. A multi-section probe for an impedance tuner system may include a plurality of probe sections and a holder structure for mechanically supporting the plurality of probe sections.
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase. A multi-section probe for an impedance tuner system may include a plurality of probe sections and a holder structure for mechanically supporting the plurality of probe sections.
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase.
An impedance tuner may include a transmission media for propagating RF signals, a reflection magnitude control device mounted in a fixed position relative to a direction of signal propagation along said transmission media, and a phase shifter to control a reflection phase. A multi-section probe for an impedance tuner system may include a plurality of probe sections and a holder structure for mechanically supporting the plurality of probe sections.
An exemplary embodiment of a measurement system for conducting measurements on a device-under-test (DUT) includes a signal transmission line, an impedance controlling tuner including a signal transmission line segment as part of the signal transmission line, and a low-loss, electrically small signal coupling probe coupled to the signal transmission line in a non-contacting relationship for sampling signals propagating along the signal transmission line.
A measurement system for conducting measurements on a device-under-test (DUT), wherein impedance is controlled or varied over a set of measurement conditions and a parameter or set of parameters measured for each measurement condition, the system comprises a passive impedance controlling tuner, a signal coupling device connected between a signal port of the DUT and the tuner for sampling signals propagating between the passive impedance controlling tuner and the DUT, measurement equipment for receiving response signals from the signal coupler and wherein the measurement system is free of active impedance controlling devices which employ signal injection to synthesize an impedance.
G01R 23/14 - Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by heterodyningArrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage by beat-frequency comparison
G01R 23/00 - Arrangements for measuring frequenciesArrangements for analysing frequency spectra
A method of using a measurement system including an impedance-controlling tuner, comprises a sequence of the following steps pre-characterizing the tuner over a desired tuning range at a number of pre-characterized calibrated impedance tuning points, connecting a signal coupling device in a non-contacting relationship relative to a transmission line of the measurement system to allow measurement of an impedance presented to a device-under-test (DUT) with the DUT in place, for a DUT measurement, setting the impedance tuning at one of said pre-characterized calibrated impedance tuning points or by interpolating between pre-calibrated impedance tuning points to achieve a particular target impedance presented to the DUT, and measuring an actual impedance presented to the DUT after the tuning setting is determined and set.
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
patents
