The present application discloses various embodiments of a high-resolution spectrograph. In one embodiment, the high-resolution spectrograph includes a light source, a housing, at least one adjustment device secured to the housing, and an optical detector secured to the adjustment device. At least one dispersive optical element is positioned in optical communication with the light source and the optical detector, wherein the dispersive optical element is configured to diffract at least a portion of an incident optical signal from the light source as a diffracted optical signal propagating toward the optical detector, wherein the optical detector is configured to measure at least one property at least one wavelength component of the diffracted optical signal. The adjustment device is configured to change the position of the optical detector relative to the dispersive optical element to optimize the image width of the wavelength component of the diffracted optical signal.
The present application discloses various embodiments of a high-resolution spectrograph. In one embodiment, the high-resolution spectrograph includes a light source, a housing, at least one adjustment device secured to the housing, and an optical detector secured to the adjustment device. At least one dispersive optical element is positioned in optical communication with the light source and the optical detector, wherein the dispersive optical element is configured to diffract at least a portion of an incident optical signal from the light source as a diffracted optical signal propagating toward the optical detector, wherein the optical detector is configured to measure at least one property at least one wavelength component of the diffracted optical signal. The adjustment device is configured to change the position of the optical detector relative to the dispersive optical element to optimize the image width of the wavelength component of the diffracted optical signal.
fcece fnoisenoise fcece fnoisenoise noise ), and adjusting the frequency characteristic of at least one of the oscillator signal and the stretcher output signal based on the correction signal.
A method of carrier envelope phase stabilization is disclosed which includes temporally stretching a oscillator output signal to produce at least one stretcher output signal, splitting the stretcher output signal to produce a forward bypass signal, amplifying the stretcher output signal to produce at least one amplifier output signal, compressing the amplifier output signal to produce at least one compressor output signal, compressing the forward bypass signal to form at least one fast loop signal, measuring the carrier envelope offset frequency (fce) and the carrier envelope noise (fnoise) of the fast loop signal, generating at least one correction signal based on at least one of the carrier envelope offset frequency (fce) the carrier envelope noise (fnoise), and adjusting the frequency characteristic of at least one of the oscillator signal and the stretcher output signal based on the correction signal.
H01S 3/13 - Stabilisation of laser output parameters, e.g. frequency or amplitude
H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
5.
VIBRATION ISOLATION APPARATUS WITH THERMALLY CONDUCTIVE PNEUMATIC CHAMBER, AND METHOD OF MANUFACTURE
The present application discloses embodiments of a vibration isolation assembly configured to reduce the communication of excitation vibration between a supporting surface and a payload, at excitation frequencies significantly higher than the resonant frequency of the isolator. In one embodiment, the vibration isolation assembly includes a housing assembly having a housing body with a pneumatic chamber formed therein, wherein the housing assembly is supported by the supporting surface. The pneumatic chamber is configured to accept at least one fluid therein. A mass engaging member configured to support at least a portion of the payload is supported by the pneumatic chamber, and at least one thermally conductive member in thermal communication with the housing body is positioned within the pneumatic chamber. The thermally conductive member is configured to transfer thermal energy from the fluid in the pneumatic chamber to the housing body and into the ambient environment.
F16F 15/023 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system using fluid means
F16F 15/03 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system using electromagnetic means
F16F 15/18 - Suppression of vibrations in rotating systems by making use of members moving with the system using electric means
6.
Vibration Isolation Apparatus with Thermally Conductive Pneumatic Chamber, and Method of Manufacture
The present application discloses embodiments of a vibration isolation assembly configured to reduce the communication of excitation vibration between a supporting surface and a payload, at excitation frequencies significantly higher than the resonant frequency of the isolator. In one embodiment, the vibration isolation assembly includes a housing assembly having a housing body with a pneumatic chamber formed therein, wherein the housing assembly is supported by the supporting surface. The pneumatic chamber is configured to accept at least one fluid therein. A mass engaging member configured to support at least a portion of the payload is supported by the pneumatic chamber, and at least one thermally conductive member in thermal communication with the housing body is positioned within the pneumatic chamber. The thermally conductive member is configured to transfer thermal energy from the fluid in the pneumatic chamber to the housing body and into the ambient environment.
F16F 15/023 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system using fluid means
7.
LASER AMPLIFIER UTILIZING MULTIPLE END PUMP SPOTS AND METHOD OF MANUFACTURE
The present application discloses various embodiments of a laser amplifier system utilizing multiple end pump spots to pump an optical crystal during the amplification process which includes a telecentric telescope configured to magnify each individual pump beamlet and output the magnified pump beamlets such that the pump beamlets remain parallel and substantially non-divergent incident on an optical crystal positioned within a resonator-like thereby permitting the construction of a compact laser amplifier system.
A system for outputting partially spatially coherent light to an imaging system is disclosed herein, which includes a spatially coherent light source configured to output a spatially coherent signal, at least one optical device having an optical device body with a first device surface formed thereon and configured to reflect a portion of the spatially coherent signal to form at least one coherent reflected signal. The optical device body also includes a second device surface having one or more surface irregularities configured to diffuse a portion of the spatially coherent light source output signal transmitted through the optical device body, to produce at least one spatially incoherent signal. The combination of the coherent reflected signal and the spatially incoherent signal form the partially spatially coherent light signal.
A system for outputting partially spatially coherent light to an imaging system is disclosed herein, which includes a spatially coherent light source configured to output a spatially coherent signal, at least one optical device having an optical device body with a first device surface formed thereon and configured to reflect a portion of the spatially coherent signal to form at least one coherent reflected signal. The optical device body also includes a second device surface having one or more surface irregularities configured to diffuse a portion of the spatially coherent light source output signal transmitted through the optical device body, to produce at least one spatially incoherent signal. The combination of the coherent reflected signal and the spatially incoherent signal form the partially spatially coherent light signal.
G02B 17/06 - Catoptric systems, e.g. image erecting and reversing system using mirrors only
G02B 1/02 - Optical elements characterised by the material of which they are madeOptical coatings for optical elements made of crystals, e.g. rock-salt, semiconductors
G02B 1/10 - Optical coatings produced by application to, or surface treatment of, optical elements
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
The present application discloses embodiments of a mount for optical components configured to secure thin optical components while minimizing wavefront distortion effects. The optical mount may include at least one mount body with at least one optical component receiving recess formed therein, the at least one optical component receiving recess configured to receive at least one optical component therein, the optical component having at least one edge. The mount may include one or more elastomeric retention members configured to exert at least one compliant retention force to the edge of the optical component, thereby securely retaining the optical component within the optical component receiving recess.
G02B 7/02 - Mountings, adjusting means, or light-tight connections, for optical elements for lenses
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
13.
Laser system having a multi-stage amplifier and methods of use
A laser system having a multi-pass amplifier system which includes at least one seed source configured to output at least one seed signal having a seed signal wavelength, at least one pump source configured to output at least one pump signal, at least one multi-pass amplifier system in communication with the seed source and having at least one gain media, a first mirror, and at least a second mirror therein, the gain media device positioned between the first mirror and second mirror and configured to output at least one amplifier output signal having an output wavelength range, the first mirror and second mirror may be configured to reflect the amplifier output signal within the output wavelength range, and at least one optical system may be in communication with the amplifier system and configured to receive the amplifier output signal and output an output signal within the output wavelength range.
H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/06 - Construction or shape of active medium
H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
H01S 3/094 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
14.
METHOD AND APPARATUS FOR IMMERSION GRATING LITHOGRAPHY
The present application is directed to an improved immersion grating assembly that provides additional wavelength dispersion and higher optical efficiency at ultraviolet wavelengths relative to prior art devices. More specifically, the immersion grating disclosed herein may be used to narrow the spectrum of light emitted by excimer laser systems. Narrower spectral linewidth of excimer laser systems may enable the creation of smaller feature sizes in semiconductor structures manufactured using UV photolithography processes.
The present application discloses a modular broadband light source and includes at least one lamp housing defining at least one lamp body receiver having at least one outlet port formed on the lamp housing, at least one lamp body insert positionable within the body insert receiver and configured to detachably couple to the lamp housing, at least one thermal managing assembly coupled to the lamp body insert and defining a lamp receiving area, at least one Xenon arc lamp positionable in the lamp receiving area and in communication with the outlet port on the lamp housing, at least one processor device coupled to at least one of the at least one lamp housing, the at least one lamp body insert and the at least one Xenon arc lamp.
A high responsivity, high bandwidth photodiode is disclosed which includes at least one substrate, at least one n+ type layer may be formed on the at substrate and configured to receive at least a portion of an incident optical signal from the substrate, at least one supplemental layer formed on the n+ type layer and configured to receive at least a portion of the incident optical signal from the n+ type layer, at least absorbing layer formed on the supplemental layer and configured to receive at least a portion of the incident optical signal from the supplemental layer, at least one angled facet formed on the substrate and configured to direct at least a portion of the incident optical signal to at least one of the n+ type layer, the supplemental layer, and the absorbing layer at angle of incidence from 15° to 89° from a normal angle of incidence.
Systems and methods for shifting a position of one or more optical elements are disclosed. In an embodiment, a system may include a housing having a chamber formed therein, at least one non-linear crystal disposed in the chamber, the non-linear crystal configured to receive at least one incident signal and to convert a wavelength of at least a portion of the incident signal, and at least one shape memory alloy element disposed such that thermal or electrical energy applied to the shape memory alloy causes movement of the non-linear crystal.
C22C 38/44 - Ferrous alloys, e.g. steel alloys containing chromium with nickel with molybdenum or tungsten
C22F 1/00 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
F03G 7/06 - Mechanical-power-producing mechanisms, not otherwise provided for or using energy sources not otherwise provided for using expansion or contraction of bodies due to heating, cooling, moistening, drying, or the like
G02F 1/355 - Non-linear optics characterised by the materials used
C22C 38/42 - Ferrous alloys, e.g. steel alloys containing chromium with nickel with copper
19.
OPTICAL COMPONENTS HAVING HYBRID NANO-TEXTURED ANTI-REFLECTIVE COATINGS AND METHODS OF MANUFACTURE
The present application is directed to various embodiments of optical components having hybrid nano-textured anti-reflective coatings applied thereto which includes at least one substrate having at least one substrate body defining at least one surface, at least one layer may be applied to a surface of the substrate body, and at least one nano-textured surface formed on least one layer applied to the surface of the substrate body.
09 - Scientific and electric apparatus and instruments
Goods & Services
Optical engine, namely, compact, configurable fixed wavelength spectrometer module, consisting of a series of optical filters and photodiodes, used to measure the distribution of radiation in particular wavelengths, for use in the field of photonics.
09 - Scientific and electric apparatus and instruments
Goods & Services
optical engine, namely, compact, configurable fixed wavelength spectrometer module, consisting of a series of optical filters and photodiodes, used to measure the distribution of radiation in particular wavelengths, for use in the field of photonics
09 - Scientific and electric apparatus and instruments
Goods & Services
Lasers; and laser instruments and apparatus, namely, diode
gas laser, and solid state lasers, and related power
supplies, power meters, frequency doublers, plasma tubes,
mode lockers, etalons, scanning auto correlators, spatial
filters, beam expanding telescopes and optical components;
and optical components and elements, namely, lenses, prisms,
mirrored and reflective surfaces.
09 - Scientific and electric apparatus and instruments
Goods & Services
measuring, testing and laboratory equipment in the fields of optics and photonics, namely, polarizers, optical integrating spheres, mounting platforms, positioning bases; measuring, testing and laboratory equipment in the fields of optics and photonics, namely, beam routing systems, consisting of, adapter plates, beam tubes; measuring, testing and laboratory equipment in the fields of optics and photonics, namely, damped rods, optical tables, optical workstations, comprising optical tables, system controllers; measuring, testing and laboratory equipment in the fields of optics and photonics, namely, optical breadboards, vibration isolated workstations, comprising optical tables; vibration damped workstations, comprising optical tables, vibration dampers, system controllers; measuring, testing and laboratory equipment in the fields of optics and photonics, namely, electric piezo actuators and controllers, motion controllers, and system controllers, for use in semiconductor manufacturing and laser material processing
24.
LASER OSCILLATOR SYSTEM HAVING OPTICAL ELEMENT FOR INJECTION SEEDING AND METHOD OF MANUFACTURE
The present application is directed to various architectures of a laser oscillator which include an optical element, reflective, refractive, or diffractive injection device for injection seeding and/or locking a laser oscillator.
A novel optical component mount is disclosed, which includes at least one first mount body with at least one adjustment member traversing through at least one adjustment member passage formed in the first mount body. At least one second mount body is configured with at least one component aperture formed therein and at least one insert receiver formed therein. The insert receiver is configured to receive at least one thermal compensating positioning insert positioned in the insert receiver. The coefficient of thermal expansion of the thermal compensating positioning insert is configured to be equal to the coefficient of thermal expansion of the adjustment member. At least one engaging body is positioned in the thermal compensating insert and engages the adjustment member. The engaging body is configured having a coefficient of thermal expansion less than the coefficient of thermal expansion of the thermal compensating positioning insert and the coefficient of thermal expansion of the adjustment member. At least one biasing system movably couples the second mount body to the first mount body. During use, the combinations of the coefficients of thermal expansion of the components described above, result in minimal changes in position of the optical component mount during changes in ambient temperature.
G02B 15/14 - Optical objectives with means for varying the magnification by axial movement of one or more lenses or groups of lenses relative to the image plane for continuously varying the equivalent focal length of the objective
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
26.
Component shifting apparatus with shape memory alloy actuators
Systems and methods for shifting a position of one or more optical elements are disclosed. In an embodiment, a system may include a housing having a chamber formed therein, at least one non-linear crystal disposed in the chamber, the non-linear crystal configured to receive at least one incident signal and to convert a wavelength of at least a portion of the incident signal, and at least one shape memory alloy element disposed such that thermal or electrical energy applied to the shape memory alloy causes movement of the non-linear crystal.
C22C 38/42 - Ferrous alloys, e.g. steel alloys containing chromium with nickel with copper
C22C 38/44 - Ferrous alloys, e.g. steel alloys containing chromium with nickel with molybdenum or tungsten
C22F 1/00 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
F03G 7/06 - Mechanical-power-producing mechanisms, not otherwise provided for or using energy sources not otherwise provided for using expansion or contraction of bodies due to heating, cooling, moistening, drying, or the like
G02F 1/355 - Non-linear optics characterised by the materials used
27.
Diode pumped high peak power laser system for multi-photon applications
The present application discloses various embodiments of a high peak power laser system which includes a diode pump source configured to directly pump at least one optical crystal positioned within the laser cavity, the diode pump source emitting at least one pump beam comprised of two or more vertically stacked optical signals having a wavelength from about 400 nm to about 1100 nm., the optical crystal configured to output at least one optical output having a wavelength of about 750 nm to about 1100 nm and having an output power of about 25 kW or more.
H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
G02F 1/39 - Non-linear optics for parametric generation or amplification of light, infrared, or ultraviolet waves
H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
H01S 3/081 - Construction or shape of optical resonators or components thereof comprising three or more reflectors
H01S 3/11 - Mode lockingQ-switchingOther giant-pulse techniques, e.g. cavity dumping
H01S 5/40 - Arrangement of two or more semiconductor lasers, not provided for in groups
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/105 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity
A multi-axis positioning system that may be used in conjunction with an inspection system includes multiple position sensors corresponding to multiple axes in conjunction with multiple motors also corresponding to multiple axes to provide high accuracy, high load and extended travel for controllable movement of an object in up to 6 degrees of freedom. Some embodiments of the multi-axis positioning system may include an x-y stage assembly, a bottom plate assembly coupled to the x-y stage assembly, a top plate assembly coupled to the bottom plate assembly, and a chuck secured to the top plate assembly with multiple position sensors configured to measure displacement between the x-y stage assembly and top plate assembly.
G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/68 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for positioning, orientation or alignment
G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes
G01N 21/88 - Investigating the presence of flaws, defects or contamination
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
29.
LENS SYSTEM FOR USE WITH HIGH LASER POWER DENSITY SCANNING SYSTEM
A lens system for use with a high laser power density scanning system is disclosed and includes a first lens group having one or more refractive optical elements therein. The first lens group is in communication with at least one high average power laser scanning system and is configured to transmit at least one high average laser power density signal there through. At least a second lens group having one or more refractive optical elements therein is in communication with the laser scanning system via the first lens group. The second lens group is configured to transmit the high average laser power density signal there through. At least one diffractive optical element may be in communication with at least one of the first lens group and the second lens group and is configured to transmit the at least one high average laser power density signal there through.
A high responsivity, high bandwidth photodiode is disclosed which includes at least one substrate, at least one n+ type layer may be formed on the at substrate and configured to receive at least a portion of an incident optical signal from the substrate, at least one supplemental layer formed on the n+ type layer and configured to receive at least a portion of the incident optical signal from the n+ type layer, at least absorbing layer formed on the supplemental layer and configured to receive at least a portion of the incident optical signal from the supplemental layer, at least one angled facet formed on the substrate and configured to direct at least a portion of the incident optical signal to at least one of the n+ type layer, the supplemental layer, and the absorbing layer at angle of incidence from 15 ° to 89 ° from a normal angle of incidence.
H01L 31/10 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
H01L 31/0304 - Inorganic materials including, apart from doping materials or other impurities, only AIIIBV compounds
H01L 31/18 - Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
The present application discloses a mount for an optical component having a least one support assembly having at least one support body, at least, one adjustment assembly having at least one adjustment body and in communication with the support assembly, the adjustment assembly having at least one first adjustment device configured to rotate the support assembly about at least one first axis, at least one second adjustment device configured to rotate the support assembly about at least one second axis substantially orthogonal to the first axis, and at least one third adjustment device configured to rotate the support assembly about at least one third axis, the third axis being orthogonal to the first axis and the second axis, wherein the at least one first axis, the at least one second axis and the at least one third axis are configured to substantially overlap at least one selected point.
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
G02B 26/08 - Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
The present application discloses a modular broadband light source and includes at least one lamp housing defining at least one lamp body receiver having at least one outlet port formed on the lamp housing, at least one lamp body insert positionable within the body insert receiver and configured to detachably couple to the lamp housing, at least one thermal managing assembly coupled to the lamp body insert and defining a lamp receiving area, at least one Xenon arc lamp positionable in the lamp receiving area and in communication with the outlet port on the lamp housing, at least one processor device coupled to at least one of the at least one lamp housing, the at least one lamp body insert and the at least one Xenon arc lamp.
An apparatus for facilitating a measurement of characteristics of a photovoltaic cell. The apparatus includes an input port for coupling to a photovoltaic cell and an output port for coupling to a measurement equipment. The apparatus is configured to couple a first resistor across positive and negative inputs of the input port and a second resistor between the negative input and ground when the input port is not selected or inactive, and decouple the first and second resistors from the input port when the input port is selected and active. The apparatus couples the positive input of the input port to the output port when the input port is selected but inactive or selected and active. The resistors protect the photovoltaic cell from adverse consequences due to incident ambient light. Examples of multiple port versions of the apparatus are also disclosed.
H02S 50/10 - Testing of PV devices, e.g. of PV modules or single PV cells
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
35.
LASER SYSTEM HAVING A MULTI-PASS AMPLIFIER AND METHODS OF USE
A laser system having a multi-pass amplifier system which includes at least one seed source configured to output at least one seed signal having a seed signal wavelength, at least one pump source configured to output at least one pump signal, at least one multi-pass amplifier system in communication with the seed source and having at least one gain media, a first mirror, and at least a second mirror therein, the gain media device positioned between the first mirror and second mirror and configured to output at least one amplifier output signal having an output wavelength range, the first mirror and second mirror may be configured to reflect the amplifier output signal within the output wavelength range, and at least one optical system may be in communication with the amplifier system and configured to receive the amplifier output signal and output an output signal within the output wavelength range.
H01S 3/082 - Construction or shape of optical resonators or components thereof comprising three or more reflectors defining a plurality of resonators, e.g. for mode selection or suppression
H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
H01S 3/094 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
09 - Scientific and electric apparatus and instruments
10 - Medical apparatus and instruments
Goods & Services
(1) Lasers for productivity use and laser applications in the microelectronics and material processing markets and non-medical lasers for research purposes
(2) Lasers for medical use.
37.
High-power ytterbium doped calcium fluoride mode-locked laser and methods of use
A high-power ytterbium-doped calcium fluoride laser system is disclosed herein which includes at least one pump source, at least one laser cavity formed by at least one high reflector and at least one output coupler, and at least one ytterbium-doped calcium fluoride optical crystal positioned within the laser cavity in communication with the pump source, the ytterbium-doped calcium fluoride optical crystal configured to output at least one output signal of at least 20 W, having a pulse width of 200 fs or less, and a repetition rate of at least 40 MHz.
H01S 3/042 - Arrangements for thermal management for solid state lasers
H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
H01S 3/11 - Mode lockingQ-switchingOther giant-pulse techniques, e.g. cavity dumping
A high-power ytterbium-doped calcium fluoride laser system is disclosed herein which includes at least one pump source, at least one laser cavity formed by at least one high reflector and at least one output coupler, and at least one ytterbium-doped calcium fluoride optical crystal positioned within the laser cavity in communication with the pump source, the ytterbium-doped calcium fluoride optical crystal configured to output at least one output signal of at least 20 W, having a pulse width of 200 fs or less, and a repetition rate of at least 40 MHz.
A laser system having a multi-pass amplifier system which includes at least one seed source configured to output at least one seed signal having a seed signal wavelength, at least one pump source configured to output at least one pump signal, at least one multi-pass amplifier system in communication with the seed source and having at least one gain media, a first mirror, and at least a second mirror therein, the gain media device positioned between the first mirror and second mirror and configured to output at least one amplifier output signal having an output wavelength range, the first mirror and second mirror may be configured to reflect the amplifier output signal within the output wavelength range, and at least one optical system may be in communication with the amplifier system and configured to receive the amplifier output signal and output an output signal within the output wavelength range.
H01S 3/30 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range using scattering effects, e.g. stimulated Brillouin or Raman effects
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/06 - Construction or shape of active medium
H01S 3/0941 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a semiconductor laser, e.g. of a laser diode
H01S 3/094 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
System and method for detecting the presence and type of capacitive load that may be coupled to a power driver. The system includes a detection circuit to determine the presence and type of load based on a measured characteristic of the load in response to a drive voltage. The characteristic may be the load capacitance as measured by the current flow between the driver and load. The circuit may include a differential amplifier to generate a current-related voltage, comparators to generate pulses when the voltage exceeds respective thresholds, registers to output logic levels in response to the comparators, and a microcontroller to make the determination based on the logic levels. Alternatively, the circuit includes a differential amplifier to generate a current-related voltage, a rectifier to rectify the voltage, a peak and hold circuit to hold the peak voltage, an ADC to digitize the peak voltage, and a microcontroller to make its determination based on the digitized voltage.
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
H01L 41/04 - SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR - Details thereof - Details of piezo-electric or electrostrictive elements
A novel multi-junction detector device and method of use is disclosed, which includes a housing, at least one mount system body positioned within the housing, at least one beam dump region formed in the mount system body, with a first detector having a first wavelength responsivity range positioned on the mount system body and at least a second detector having a second wavelength responsivity range positioned on the mount system body in optical communication with the first detector.
The present application discloses a double-clad crystal fiber which includes a Yb-doped CALGO core region, a pump cladding region configured to have the core region positioned therein, and a second cladding region configured to have the core region and pump cladding region positioned therein.
A novel multi-junction detector device and method of use is disclosed, which includes a housing, at least one mount system body positioned within the housing, at least one beam dump region formed in the mount system body, with a first detector having a first wavelength responsivity range positioned on the mount system body and at least a second detector having a second wavelength responsivity range positioned on the mount system body in optical communication with the first detector.
H01L 27/14 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy
H01L 31/02 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof - Details
An optical mount system that may be adjusted by a variety of devices and methods. In some cases, a post collar assembly may be configured to engage a collar coupling surface of a post holder body such that the post collar engages the collar coupling surface in indexed and predetermined angular positions. In some cases, a base of a post holder body may be configured to accept a secondary base element in the form of a mounting adapter which may be releasably secured the base to provide additional stiffness for the mounting of the base to a reference surface.
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
G02B 6/42 - Coupling light guides with opto-electronic elements
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
The present application is directed to a method for selectively enhancing the wetting characteristics of a substrate and includes providing at least one substrate having a first wetting characteristic, outputting at least one patterning beam having a wavelength of 200nm to 1200nm from a laser system, forming at least one feature having a second wetting characteristic on the substrate wherein the first wetting characteristic and second wetting characteristic are different, selectively applying at least one substrate coating to the substrate and the feature, and selectively ablating at least a portion of the substrate coating to expose the feature formed on the substrate.
H01L 21/027 - Making masks on semiconductor bodies for further photolithographic processing, not provided for in group or
H01L 21/302 - Treatment of semiconductor bodies using processes or apparatus not provided for in groups to change the physical characteristics of their surfaces, or to change their shape, e.g. etching, polishing, cutting
H01L 21/268 - Bombardment with wave or particle radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
H01L 21/306 - Chemical or electrical treatment, e.g. electrolytic etching
47.
Optical component mount device and post system and method of use
The present application discloses an optical post system for use with an optical mount device and includes at least one post body having at least one engaging surface formed thereon, at least one fastener recess configured to receive at least one fastener configured to couple the optical post system to at least one work surface therein formed in the post body, at least one fastener adjustment relief having at least one angled fastener plate positioned therein formed in the post body wherein the fastener adjustment relief is in communication with the fastener via the fastener recess.
The present application discloses an optical post system for use with an optical mount device and includes at least one post body having at least one engaging surface formed thereon, at least one fastener recess configured to receive at least one fastener configured to couple the optical post system to at least one work surface therein formed in the post body, at least one fastener adjustment relief having at least one angled fastener plate positioned therein formed in the post body wherein the fastener adjustment relief is in communication with the fastener via the fastener recess.
Systems for measuring optical properties of a specimen are disclosed. The systems are configured to sample signals related to the measurement of the properties of a specimen, and perform software-based coherent detection of the signals to generate resulting measurements are based on the signals acquired at substantially the same time instance. This facilitates the displaying or generating of the desired measurements in real time. In one configuration, the system is configured to direct a modulated light signal at a selected wavelength incident upon a specimen. In another configuration, the system is configured to direct a combined light signal, derived from a plurality of light signals at different wavelengths and modulated with different frequencies, incident upon a specimen. In yet another configuration, the system is configured to direct a plurality of light signals modulated with different frequencies incident upon different regions of a specimen.
Systems and methods for shifting a position of one or more optical elements are disclosed. In an embodiment, a system may include a housing having a chamber formed therein, at least one non-linear crystal disposed in the chamber, the non-linear crystal configured to receive at least one incident signal and to convert a wavelength of at least a portion of the incident signal, and at least one shape memory alloy element disposed such that thermal or electrical energy applied to the shape memory alloy causes movement of the non-linear crystal.
F03G 7/06 - Mechanical-power-producing mechanisms, not otherwise provided for or using energy sources not otherwise provided for using expansion or contraction of bodies due to heating, cooling, moistening, drying, or the like
G02F 1/355 - Non-linear optics characterised by the materials used
51.
Optical rail system and method using quick-disconnect optical component mounts
An optical rail system that includes an electronic component mount configured to be mounted on rails between two previously-mounted electronic component mounts without the need of removing one of the two previous-mounted mounts. The electronic component mount includes grooves configured to securely register with respective portions of the rails. The mount further comprises locking devices for securely locking the portions of the rails to the housing within the grooves. The mount additionally includes a dock for securely hosting one or more optical components. Also disclosed is a rail mount for facilitating the mounting the optical rail system to an optical table or other structure. The rail mount includes grooves for securely registering with respective portions of the rails, locking devices for more securely locking the rails within the grooves, and an attachment structure for attaching the rail mount to a post, the post being configured for mounting to an optical table or other structure.
A multi-axis positioning system that may be used in conjunction with an inspection system includes multiple position sensors corresponding to multiple axes in conjunction with multiple motors also corresponding to multiple axes to provide high accuracy, high load and extended travel for controllable movement of an object in up to 6 degrees of freedom. Some embodiments of the multi-axis positioning system may include an x-y stage assembly, a bottom plate assembly coupled to the x-y stage assembly, a top plate assembly coupled to the bottom plate assembly, and a chuck secured to the top plate assembly with multiple position sensors configured to measure displacement between the x-y stage assembly and top plate assembly.
H01L 21/66 - Testing or measuring during manufacture or treatment
G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes
H01L 21/68 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for positioning, orientation or alignment
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
G01N 21/88 - Investigating the presence of flaws, defects or contamination
G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
53.
HOMOGENEOUS LASER LIGHT SOURCE FOR AREA PROCESSING APPLICATIONS
The present application is directed to a homogeneous laser light source and includes at least one modeless seed source configured to output at least one modeless seed signal, at least one amplifier in communication with and configured to receive the modeless seed signal from the seed source and output at least one modeless amplifier signal, and at least one nonlinear optical generator configured to receive the amplifier signal and generate at least one modeless harmonic output signal in response to the modeless amplifier signal, wherein the wavelength of the harmonic output signal is different than a wavelength of the modeless amplifier signal.
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
H01S 3/094 - Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
H01S 3/11 - Mode lockingQ-switchingOther giant-pulse techniques, e.g. cavity dumping
54.
HIGH POWER LASER DIODE TEST SYSTEM AND METHOD OF MANUFACTURE
A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device test module compartment, a device test module having at least one carrier device receiver formed therein detachably coupled to the housing body, and at least one carrier device configured to support at least one laser diode device coupled thereto detachably positioned within the carrier device port formed on the device test module.
A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device test module compartment, a device test module having at least one carrier device receiver formed therein detachably coupled to the housing body, and at least one carrier device configured to support at least one laser diode device coupled thereto detachably positioned within the carrier device port formed on the device test module.
An optical component mount system which includes an optical mount having at least one mount body. At least one optical component receiver may be formed on the mount body. The optical component receiver may be configured to receive at least one optical component therein. In addition, at least one coupling extension extends from the optical mount body. The coupling extension includes at least one coupling receiver formed therein. The coupling receiver is configured to receive at least a portion of at least one optical rail body therein. In one embodiment, the coupling receiver and optical component receiver are co-aligned along a common longitudinal axis of the optical mount.
09 - Scientific and electric apparatus and instruments
Goods & Services
Sources to generate light, namely lasers and light-emitting diodes; active and passive optical components to transport and modify the optical characteristics of light, namely fiber optics, polarizers, isolators, modulators, scanners, integrated optical devices, lenses, mirrors, filters and reticles; mechanical components to hold and manipulate the optical components, namely optical mounts and mechanical and electro-mechanical positioning stages, actuators and control electronics therefor; photosensitive devices to detect, sense, and record light patterns and signals, namely photodetectors and image converters; high-speed, low-noise, and signal acquisition electronic circuits, lock-in amplifiers, pulse compression circuits, feedback and control circuits, power supplies, and temperature controllers to drive the aforementioned instruments and components and for processing signals and images; all for use in systems and subsystems for communication, measurement, sensing, testing and laboratory experimentation.
58.
Tunable vibration dampers and methods of manufacture and tuning
Embodiments are directed to tunable damper embodiments and methods of using the same for damping resonant and non-resonant vibrations present within an object that the tunable damper is secured to. In some cases, the tunable damper may be tuned before, during or after being secured to an object.
F16F 7/10 - Vibration-dampersShock-absorbers using inertia effect
F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
F16F 7/116 - Vibration-dampersShock-absorbers using inertia effect the inertia member being resiliently mounted on metal springs
Embodiments are directed to tunable damper embodiments and methods of using the same for damping resonant and non-resonant vibrations present within an object that the tunable damper is secured to. In some cases, the tunable damper may be tuned before, during or after being secured to an object.
F16F 7/10 - Vibration-dampersShock-absorbers using inertia effect
F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
F16F 7/116 - Vibration-dampersShock-absorbers using inertia effect the inertia member being resiliently mounted on metal springs
The present application discloses various embodiments of a high peak power laser system which includes a diode pump source configured to directly pump at least one optical crystal positioned within the laser cavity, the diode pump source emitting at least one pump beam comprised of two or more vertically stacked optical signals having a wavelength from about 400 nm to about 1100 nm., the optical crystal configured to output at least one optical output having a wavelength of about 750 nm to about 1100nm and having an output power of about 25 kW or more.
H01S 5/04 - Processes or apparatus for excitation, e.g. pumping
H01L 33/10 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof characterised by the semiconductor bodies with a light reflecting structure, e.g. semiconductor Bragg reflector
61.
APPARATUS AND METHOD FOR MEASURING ONE OR MORE CHARACTERISTICS OF ONE OR MORE PHOTOVOLTAIC CELLS
An apparatus for facilitating a measurement of characteristics of a photovoltaic cell. The apparatus includes an input port for coupling to a photovoltaic cell and an output port for coupling to a measurement equipment. The apparatus is configured to couple a first resistor across positive and negative inputs of the input port and a second resistor between the negative input and ground when the input port is not selected or inactive, and decouple the first and second resistors from the input port when the input port is selected and active. The apparatus couples the positive input of the input port to the output port when the input port is selected but inactive or selected and active. The resistors protect the photovoltaic cell from adverse consequences due to incident ambient light. Examples of multiple port versions of the apparatus are also disclosed.
H02S 50/10 - Testing of PV devices, e.g. of PV modules or single PV cells
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
62.
OPTICAL ANALYSIS SYSTEM WITH OPTICAL CONDUIT LIGHT DELIVERY
Optical analysis system and methods that may include a demultiplexing assembly with a photodetector array and a plurality of optical channels configured to prevent crosstalk therebetween. Some optical analysis system embodiments may include a multiplexer operatively coupled to a demultiplexing assembly may be used to split a single optical signal into multiple optical signals, or any other suitable purpose.
A piezoelectric actuator that may include a monolithic frame having an integral bias band that provides a resilient restoring force between a first contact surface and a second contact surface of the actuator that may be used to rotate an adjustment shaft. In some cases, a preload mechanism may also be included with the frame. Such piezoelectric actuators may be used for adjustable optical mounting devices such as optical mounting devices.
H01L 41/22 - Processes or apparatus specially adapted for the assembly, manufacture or treatment of piezo-electric or electrostrictive devices or of parts thereof
H02N 2/00 - Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
B23H 1/00 - Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric
B23K 26/38 - Removing material by boring or cutting
B24C 1/04 - Methods for use of abrasive blasting for producing particular effectsUse of auxiliary equipment in connection with such methods for treating only selected parts of a surface, e.g. for carving stone or glass
H02N 2/10 - Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing rotary motion, e.g. rotary motors
B23H 9/00 - Machining specially adapted for treating particular metal objects or for obtaining special effects or results on metal objects
The present application discloses a LED-based solar simulator light source having at least one LED array formed by multiple LED groups of LED assemblies, at least one field flattening device, at least one diffractive element, and at least one optical element configured to condition the broad spectrum light source output signal and direct the light source output signal to a work surface.
An adjustable compact mount that may include an integrated configuration that is suitable for use in confined spaces. Some adjustable compact mount embodiments may include a threaded drive screw that is completely disposed within an outer perimeter of the base during use. End caps of high density material may be used to facilitate the compactness of certain embodiments while enabling efficient use of piezoelectric type drive motors for the adjustable compact mounts. Certain coatings may be used on components of some embodiments in order to increase durability.
H01L 41/053 - Mounts, supports, enclosures or casings
H01L 41/09 - Piezo-electric or electrostrictive elements with electrical input and mechanical output
H02N 2/00 - Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
F16M 11/18 - Heads with mechanism for moving the apparatus relatively to the stand
F16M 13/02 - Other supports for positioning apparatus or articlesMeans for steadying hand-held apparatus or articles for supporting on, or attaching to, an object, e.g. tree, gate, window-frame, cycle
An adjustable compact mount that may include an integrated configuration that is suitable for use in confined spaces. Some adjustable compact mount embodiments may include a threaded drive screw that is completely disposed within an outer perimeter of the base during use. End caps of high density material may be used to facilitate the compactness of certain embodiments while enabling efficient use of piezoelectric type drive motors for the adjustable compact mounts. Certain coatings may be used on components of some embodiments in order to increase durability.
A novel broadly tunable optical parametric oscillator is described for use in numerous applications including multi-photon microscopy. The optical parametric oscillator includes at least one sub-picosecond laser pump source configured to output a pump signal having a wavelength of about 650 nm or less and at least one type II optical parametric oscillator in optical communication with the pump source and configured to generate a single widely tunable pulsed optical signal. In one application, an optical system is in optical communication with the optical parametric oscillator and configured to direct at least a portion of the optical signal to a specimen, and at least one analyzing device is configured to receive a signal from the specimen in response to the optical signal.
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
H01S 3/108 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using non-linear optical devices, e.g. exhibiting Brillouin or Raman scattering
G01N 21/359 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
G02F 1/39 - Non-linear optics for parametric generation or amplification of light, infrared, or ultraviolet waves
H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
H01S 3/11 - Mode lockingQ-switchingOther giant-pulse techniques, e.g. cavity dumping
69.
System and method for mounting and aligning optical components using single-rail mounting
The disclosure relates to an apparatus for mounting optical components in a manner that self-aligns the optical axes of the optical components. The apparatus uses an optical component mount that includes a housing consisting of a single rail mount configured to mechanically couple to a portion of a rail for supporting the optical component mount on a rail. The housing also has an optical component dock configured to support an optical component in a manner that defines an optical axis. The rail mount and the optical component dock are configured to make the optical axis substantially parallel with a longitudinal axis of the rail. Using such optical component mounts secured to the rail would result in the self-alignment of the optical axes of optical components on the optical component mounts. Various embodiments of such apparatus are also provided in the disclosure.
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
F16M 13/02 - Other supports for positioning apparatus or articlesMeans for steadying hand-held apparatus or articles for supporting on, or attaching to, an object, e.g. tree, gate, window-frame, cycle
G02B 13/16 - Optical objectives specially designed for the purposes specified below for use in conjunction with image converters or intensifiers
The present application discloses a double-clad crystal fiber which includes a Yb-doped CALGO core region, a pump cladding region configured to have the core region positioned therein, and a second cladding region configured to have the core region and pump cladding region positioned therein.
Systems for measuring optical properties of a specimen are disclosed. The systems are configured to sample signals related to the measurement of the properties of a specimen, and perform software-based coherent detection of the signals to generate resulting measurements are based on the signals acquired at substantially the same time instance. This facilitates the displaying or generating of the desired measurements in real time. In one configuration, the system is configured to direct a modulated light signal at a selected wavelength incident upon a specimen. In another configuration, the system is configured to direct a combined light signal, derived from a plurality of light signals at different wavelengths and modulated with different frequencies, incident upon a specimen. In yet another configuration, the system is configured to direct a plurality of light signals modulated with different frequencies incident upon different regions of a specimen.
A multi-axis positioning system that may be used in conjunction with an inspection system includes multiple position sensors corresponding to multiple axes in conjunction with multiple motors also corresponding to multiple axes to provide high accuracy, high load and extended travel for controllable movement of an object in up to 6 degrees of freedom. Some embodiments of the multi-axis positioning system may include and x-y stage assembly, a bottom plate assembly coupled to the x-y stage assembly, a top plate assembly coupled to the bottom plate assembly, and a chuck secured to the top plate assembly with multiple position sensors configured to measure displacement between the x-y stage assembly and top plate assembly.
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping
An optical mount system that may be adjusted by a variety of devices and methods. In some cases, a post collar assembly may be configured to engage a collar coupling surface of a post holder body such that the post collar engages the collar coupling surface in indexed and predetermined angular positions. In some cases, a base of a post holder body may be configured to accept a secondary base element in the form of a mounting adapter which may be releasably secured the base to provide additional stiffness for the mounting of the base to a reference surface.
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
G02B 6/42 - Coupling light guides with opto-electronic elements
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
An optical rail system that includes an electronic component mount configured to be mounted on rails between two previously-mounted electronic component mounts without the need of removing one of the two previous-mounted mounts. The electronic component mount includes grooves configured to securely register with respective portions of the rails. The mount further comprises locking devices for securely locking the portions of the rails to the housing within the grooves.
A low interference optical mount assembly that permits the mounting of one or more optics in a stable clamped configuration while minimizing the amount of surface area of the optic obscured by an optic mount of the assembly. Clamp embodiments for such an assembly may include a resilient leaf spring or a rigid clamp plate. In some cases, the mount assembly may be configured in a wheel arrangement that allows the selection of multiple optics by rotating a support frame that supports a plurality of optic mounts.
System and method for detecting the presence and type of capacitive load that may be coupled to a power driver. The system includes a detection circuit to determine the presence and type of load based on a measured characteristic of the load in response to a drive voltage. The characteristic may be the load capacitance as measured by the current flow between the driver and load. The circuit may include a differential amplifier to generate a current-related voltage, comparators to generate pulses when the voltage exceeds respective thresholds, registers to output logic levels in response to the comparators, and a microcontroller to make the determination based on the logic levels. Alternatively, the circuit includes a differential amplifier to generate a current-related voltage, a rectifier to rectify the voltage, a peak and hold circuit to hold the peak voltage, an ADC to digitize the peak voltage, and a microcontroller to make its determination based on the digitized voltage.
G01R 27/26 - Measuring inductance or capacitanceMeasuring quality factor, e.g. by using the resonance methodMeasuring loss factorMeasuring dielectric constants
H01L 41/04 - SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR - Details thereof - Details of piezo-electric or electrostrictive elements
A piezoelectric actuator that may include a monolithic frame having an integral bias band that provides a resilient restoring force between a first contact surface and a second contact surface of the actuator that may be used to rotate an adjustment shaft. In some cases, a preload mechanism may also be included with the frame. Such piezoelectric actuators may be used for adjustable optical mounting devices such as optical mounting devices.
A piezoelectric actuator that may include a monolithic frame having an integral bias band that provides a resilient restoring force between a first contact surface and a second contact surface of the actuator that may be used to rotate an adjustment shaft. In some cases, a preload mechanism may also be included with the frame. Such piezoelectric actuators may be used for adjustable optical mounting devices such as optical mounting devices.
H02N 2/00 - Electric machines in general using piezoelectric effect, electrostriction or magnetostriction
G02B 7/00 - Mountings, adjusting means, or light-tight connections, for optical elements
B23K 26/38 - Removing material by boring or cutting
B24C 1/04 - Methods for use of abrasive blasting for producing particular effectsUse of auxiliary equipment in connection with such methods for treating only selected parts of a surface, e.g. for carving stone or glass
H02N 2/10 - Electric machines in general using piezoelectric effect, electrostriction or magnetostriction producing rotary motion, e.g. rotary motors
B23H 1/00 - Electrical discharge machining, i.e. removing metal with a series of rapidly recurring electrical discharges between an electrode and a workpiece in the presence of a fluid dielectric
Demultiplexing systems and methods are discussed which may be small and accurate without moving parts. In some cases, demultiplexing embodiments may include optical filter cavities that include filter baffles and support baffles which may be configured to minimize stray light signal detection and crosstalk. Some of the demultiplexing assembly embodiments may also be configured to efficiently detect U.V. light signals and at least partially compensate for variations in detector responsivity as a function of light signal wavelength.
G02B 6/293 - Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
G02B 6/12 - Light guidesStructural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
G01J 3/51 - Measurement of colourColour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
G01J 1/06 - Restricting the angle of incident light
H04Q 11/00 - Selecting arrangements for multiplex systems
The present application is directed to a flexure-type strain relief device and includes a device body having a first surface and at least one support member formed on the device body, at least one fastener receiver may be formed in and traversing through the device body, at least one flex channel formed in and traversing through the device body and configured to be selectively movable in relation to at least one of the first surface of the device body and the support member of the device body, and at least one conduit receiving port formed in the flex channel wherein at least one transverse dimension of the receiving port configured to be selectively adjustable by controllably moving the flex channel thereby applying at least one clamping force to at least one conduit positioned within the receiving port.
Demultiplexing systems and methods are discussed which may be small and accurate without moving parts. In some cases, demultiplexing embodiments may include optical filter cavities that include filter baffles and support baffles which may be configured to minimize stray light signal detection and crosstalk. Some of the demultiplexing assembly embodiments may also be configured to efficiently detect U.V. light signals and at least partially compensate for variations in detector responsivity as a function of light signal wavelength.
G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
G01J 3/36 - Investigating two or more bands of a spectrum by separate detectors
H04J 14/02 - Wavelength-division multiplex systems
G02B 6/293 - Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
The present application discloses a LED-based solar simulator light source having at least one LED array formed by multiple LED groups of LED assemblies, at least one field flattening device, at least one diffractive element, and at least one optical element configured to condition the broad spectrum light source output signal and direct the light source output signal to a work surface.
Embodiments are directed to systems and methods for correcting lateral and angular displacement of laser beams within a laser cavity. For some embodiments, such systems and methods are used to correct angular displacement of laser beams within a laser cavity that result from varying the lasing wavelength in a tunable laser system.
H01S 3/081 - Construction or shape of optical resonators or components thereof comprising three or more reflectors
H01S 3/13 - Stabilisation of laser output parameters, e.g. frequency or amplitude
H01S 3/106 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
H01S 3/091 - Processes or apparatus for excitation, e.g. pumping using optical pumping
H01S 3/08 - Construction or shape of optical resonators or components thereof
H01S 3/11 - Mode lockingQ-switchingOther giant-pulse techniques, e.g. cavity dumping
Embodiments are directed to tunable damper embodiments and methods of using the same for damping resonant and non-resonant vibrations present within an object that the tunable damper is secured to. In some cases, the tunable damper may be tuned before, during or after being secured to an object.
F16F 7/10 - Vibration-dampersShock-absorbers using inertia effect
F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
F16F 7/116 - Vibration-dampersShock-absorbers using inertia effect the inertia member being resiliently mounted on metal springs
A platform that includes a vibration sensor located within an inner core of a table. The table may have a first plate that supports a vibration-sensitive payload. The first plate may be separated from a second plate by the inner core. The sensor can be located within the core directly below the device. The sensor can be connected to an electrical connector attached to an external surface of the table. A monitor can be readily plugged into the electrical connector to obtain vibration data from the sensor. The platform may also include a damper located within the inner core to reduce vibration of the table. The damper may be an active device that is connected to control circuits located within, or outside, the inner core.
F16M 11/00 - Stands or trestles as supports for apparatus or articles placed thereon
F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
F16F 7/10 - Vibration-dampersShock-absorbers using inertia effect
A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.
G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
H02S 50/10 - Testing of PV devices, e.g. of PV modules or single PV cells
An optical mount system that may be adjusted by a variety of devices and methods. In some cases, a post collar assembly may be configured to engage a collar coupling surface of a post holder body such that the post collar engages the collar coupling surface in indexed and predetermined angular positions. In some cases, a base of a post holder body may be configured to accept a secondary base element in the form of a mounting adapter which may be releasably secured the base to provide additional stiffness for the mounting of the base to a reference surface.
The present application is directed to a method and apparatus for processing a transparent or semitransparent material with a laser beam resulting in deterministic separation of a single sheet of the material into two or more pieces.
B23K 26/38 - Removing material by boring or cutting
B23K 26/40 - Removing material taking account of the properties of the material involved
B23K 26/06 - Shaping the laser beam, e.g. by masks or multi-focusing
B23K 26/08 - Devices involving relative movement between laser beam and workpiece
B23K 26/359 - Working by laser beam, e.g. welding, cutting or boring for surface treatment by providing a line or line pattern, e.g. a dotted break initiation line
A supercontinuum source using diamond as the supercontinuum material is disclosed that works at higher average powers than previous sources. The thermal properties of diamond allow continuum to be generated directly from an oscillator at high repetition rates. The diamond does not need to be translated even at multi-Watt power levels. This diamond continuum source can be based on a single filament and thus possesses excellent stability and phase coherence.
H01S 3/10 - Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
G02B 6/00 - Light guidesStructural details of arrangements comprising light guides and other optical elements, e.g. couplings
97.
CAPACITIVE LOADS PRESENCE AND TYPE DETECTING SYSTEM
System and method for detecting the presence and type of capacitive load that may be coupled to a power driver are disclosed. The system includes a detection circuit to determine the presence and type of load based on a measured characteristic of the load in response to a drive voltage. The characteristic maybe the load capacitance as measured by the current flow between the driver and load. The circuit may include a differential amplifier to generate a current related voltage, comparators to generate pulses when the voltage exceeds respective thresholds, registers to output logic levels in response to the comparators, and a microcontroller to make the determination based on the logic levels.
A vibration damper assembly that may be attached and moved about a payload or optical mount surface of an optical structure such as an optical table. The vibration damper assembly may include a sensor and an actuator that may be disposed within a housing. In some embodiments, the vibration damper assembly or components thereof may be incorporated into an optical structure in the form of an optical component to be disposed or mounted on an optical mount surface of an optical structure such as an optical table. Embodiments of the vibration damper system may include a controller in communication with the damper assembly Embodiments of the controller may use adaptive tuning, auto-ranging selection of gain factors and other features in order to optimize damping performance.
F16M 13/00 - Other supports for positioning apparatus or articlesMeans for steadying hand-held apparatus or articles
G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
F16F 15/10 - Suppression of vibrations in rotating systems by making use of members moving with the system
B60N 2/54 - Seat suspension devices using mechanical springs
F16F 15/02 - Suppression of vibrations of non-rotating, e.g. reciprocating, systemsSuppression of vibrations of rotating systems by use of members not moving with the rotating system
G01M 11/00 - Testing of optical apparatusTesting structures by optical methods not otherwise provided for
99.
SYSTEM AND METHOD OF PROVIDING WIDEBAND WAVELENGTH OPTICAL DETECTION USING SANDWICH DETECTOR
The disclosure relates to an optical detector that is capable of wideband wavelength detection of incident radiation with relatively good noise performance and without the need of a switch to select different types of optical detecting elements. The optical detector includes a sandwich detector with distinct photo or optical detecting elements configured to generate photocurrents in response to incident radiation of distinct wavelength ranges, respectively. The optical detector further includes transimpedance amplifiers configured to generate voltages based on the photocurrents, respectively. Additionally, the optical detector includes a summing device configured to generate an output voltage by summing the voltages from the amplifiers. The optical detector effectively operates as a single detector but with a detection range based on the combined wavelength bands of the distinct detecting elements of the sandwich detector. The distinct wavelength bands may overlap, and in the overlap region, the optical detector exhibits greater responsivity.
