Quantamap B.V.

Netherlands

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Date
New (last 4 weeks) 1
2026 October (MTD) 1
2026 (YTD) 2
IPC Class
G01Q 60/50 - MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes 1
G01Q 60/54 - Probes, their manufacture or their related instrumentation, e.g. holders 1
G01Q 70/10 - Shape or taper 1
G01Q 70/14 - Particular materials 1
G01R 33/00 - Arrangements or instruments for measuring magnetic variables 1
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NICE Class
09 - Scientific and electric apparatus and instruments 1
42 - Scientific, technological and industrial services, research and design 1
Status
Pending 1
Registered / In Force 1

1.

QuantaMap

      
Application Number 019436347
Status Pending
Filing Date 2026-10-15
Owner QuantaMap B.V. (Netherlands)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measuring, detecting, monitoring and controlling equipment; Microscopes; Measuring instruments. Development of measuring and testing methods; Research in the field of quantum precision measuring; Design of measurement systems; Technical measuring and testing; Measurement services; Materials testing and analysing.

2.

SUPERCONDUCTING SENSOR DEVICE AND CANTILEVER STRUCTURE FOR A SCANNING PROBE COMPRISING SUCH SUPERCONDUCTING SENSOR DEVICE

      
Application Number EP2025078647
Publication Number 2026/077890
Status In Force
Filing Date 2025-10-06
Publication Date 2026-04-16
Owner QUANTAMAP B.V. (Netherlands)
Inventor Lahabi, Kaveh

Abstract

A cantilever structure for a scanning sensor probe is described wherein the cantilever structure includes an elongated support substrate; a 3D point-shaped structure at a distal end of the elongated support substrate, the 3D point-shaped structure including at least one facet and an apex forming a tip of the cantilever structure, the surface of the facet having an angular orientation with the surface of the elongate support substrate; and, a superconducting sensor device comprising one or more Josephson junctions formed on the surface of the facet.

IPC Classes  ?

  • G01R 33/035 - Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
  • G01Q 60/50 - MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01R 33/12 - Measuring magnetic properties of articles or specimens of solids or fluids
  • G01Q 70/10 - Shape or taper
  • G01Q 70/14 - Particular materials
  • G01Q 60/54 - Probes, their manufacture or their related instrumentation, e.g. holders