2023
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Invention
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Automated optimization of afm light source positioning. An atomic force microscope is provided ha... |
2021
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Invention
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Atomic force microscope. An atomic force microscope (“AFM”) based interferometer, uses a light so... |
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Invention
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Atomic force microscope based interferometer. An atomic force microscope ("AFM") based interferom... |
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Invention
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Metrological scanning probe microscope. This invention relates to a metrological scanning probe m... |
2017
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Invention
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Am/fm measurements using multiple frequency atomic force microscopy. Apparatus and techniques pre... |
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Invention
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Scanning probe microscope.
A scanning probe microscope has a probe configured to move across the... |
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Invention
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Quantitative measurements using multiple frequency atomic force microscopy. The imaging mode pres... |
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Invention
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Thermal measurements using multiple frequency atomic force microscopy. Apparatus and techniques f... |
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Invention
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Modular atomic force microscope with environmental controls. A modular Atomic Force Microscope th... |
2016
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Invention
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Am/fm measurements using multiple frequency of atomic force microscopy. Apparatus and techniques ... |
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Invention
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Optical beam positioning unit for atomic force microscope. An optical light beam positioning syst... |
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Invention
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Automated atomic force microscope and the operation thereof. Improvements for rapidly calibrating... |
2014
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Invention
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Optical beam positioning unit for atomic force microscope. This invention relates to an optical l... |
2013
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Invention
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Integrated micro actuator and lvdt for high precision position measurements. A single housing wit... |
2011
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Invention
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Material property measurements using multiple frequency atomic fore microscopy. Apparatus and tec... |
2010
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Invention
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Fully digitally controller for cantilever-based instruments. A controller for cantilever-based in... |
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Invention
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Nanoindenter. A new type of indenter is described. This device combines certain sensing and struc... |
2009
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Invention
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Modular atomic force microscope. A modular AFM/SPM which provides faster measurements, in part th... |
2008
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Invention
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Method for microfabricating a probe with integrated handle, cantilever, tip and circuit. A simple... |
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Invention
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Digital q control for enhanced measurement capability in cantilever-based instruments. A digital ... |
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Invention
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Material property measurements using multiple frequency atomic force microscopy. Apparatus and te... |
2007
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Invention
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Apparatus and method for scanning capacitance microscopy and spectroscopy. An apparatus and techn... |
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Invention
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Precision position sensor using a nonmagnetic coil form. A position sensor has a moving coil part... |
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Invention
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Active damping of high speed scanning probe microscope components. A technique for actively dampi... |
2006
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Invention
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Variable density scanning. Systems and techniques for varying a scan rate in a measurement instru... |
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Invention
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Multiple frequency atomic force microscopy. An apparatus and technique for extracting information... |
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Invention
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Apparatus for determining cantilever parameters. Apparatus for determining physical properties of... |
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Invention
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Linear force detecting element formed without ferromagnetic materials which produces a resolution... |
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Invention
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Position sensing assembly with sychronizing capability. A linear variable transformer, or LVDT, f... |
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Invention
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Linear variable differential transformers for high precision position measurements. A linear vari... |
2005
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Invention
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Diffractive optical position detector in an atomic force microscope having a moveable cantilever.... |
2004
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Invention
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Digital control of quality factor in resonant systems including cantilever based instruments. A d... |
2003
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Invention
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Fully digital controller for cantilever-based instruments. A controller for cantilever-based inst... |
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Invention
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Linear variable differential transformer with digital electronics. Techniques for coupling with d... |