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2021
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Invention
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Semi-automatic prober. A wafer probe station system for reliability testing of a semiconductor wa... |
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2018
|
Invention
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Signal distribution apparatus. A signal distribution apparatus for distributing a stress signal t... |
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2017
|
Invention
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Universal probing assembly with five degrees of freedom. A universal multi-pin, adjustable probin... |
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Invention
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System and method for limiting voltage. A voltage limiting circuit for limiting the voltage devel... |
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2016
|
Invention
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Pulsed current source with internal impedance matching. Pulsed current circuitry for electromigra... |
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2015
|
Invention
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Pulsed current source with internal impedance matching.
Pulsed current circuitry for electromigr... |
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2014
|
Invention
|
Wafer temperature measurement tool. A wafer temperature measurement tool for measuring the surfac... |
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2010
|
Invention
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Integrated unit for electrical/reliability testing with improved thermal control. In accordance w... |
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2009
|
Invention
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High temperature ceramic die package and dut board socket. A strip-shaped package is provided tha... |
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2008
|
Invention
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Electromigration tester for high capacity and high current. An electronic device under test (DUT)... |
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Invention
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Modified current source (mcs) with seamless range switching. A current source is provided with tw... |
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Invention
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High temperature ceramic socket configured to test packaged semiconductor devices. A test socket ... |
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Invention
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Smart parallel controller for semiconductor experiments. An instrument coordinates execution of a... |
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Invention
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Voltage source measurement unit with minimized common mode errors. A particular configuration of ... |
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2007
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Invention
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Voltage source measurement unit with minimized common mode errors. DUT is not affected by common-... |
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Invention
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Automatic multiplexing system for automated wafer testing. A parametric test system is for testin... |
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|
Invention
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Smart parallel controller for semiconductor experiments.
An instrument is configured to coordina... |
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2006
|
Invention
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High temperature open ended zero insertion force (zif) test socket. A socket for use in testing p... |
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Invention
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Semi-automatic multiplexing system for automated semiconductor wafer testing. A semi-automatic mu... |
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Invention
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Vertical probe card and air cooled probe head system. A probe card is vertically mounted generall... |
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2005
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Invention
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Electrical connector for semiconductor device test fixture and test assembly. An interconnect ass... |
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Invention
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Dual channel source measurement unit for semiconductor device testing. A dual channel source meas... |
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2004
|
Invention
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Pulsed current generator circuit with charge booster. A pulsed current generator circuit for prov... |
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|
Invention
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Automatic range finder for electric current testing. In an electrical circuit for testing electri... |
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2003
|
Invention
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Electrostatic discharge (esd) tool for electronic device under test (dut) boards. An anti-electro... |
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Invention
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Test socket for packaged semiconductor devices. A test socket assembly for use in testing integra... |
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2002
|
Invention
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Zif socket and actuator for dip. A socket for use in testing packaged integrated circuits having ... |
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Invention
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High-temperature minimal (zero) insertion force socket. A minimal insertion force socket for use ... |
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2001
|
Invention
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Method for measurement of electromigration in semiconductor integrated circuits. Electromigration... |
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1999
|
Invention
|
Programmable connector. A programmable connector for use with a burn-in tester for manufactured i... |
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Invention
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Circuit and method for pulsed reliability testing. A test circuit for applying bipolar current pu... |
