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2023
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Invention
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Socketed probes.
A modular/configurable space transformer system may comprise socketed probes, a... |
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G/S
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Probes for testing semiconductors; Probes for testing integrated circuits; Downloadable computer ... |
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Invention
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Reducing position repeatability error in linear motion systems. A linear movement system may comp... |
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2022
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Invention
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Redistribution plate. A single-layer redistribution plate functioning as a space translator betwe... |
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2017
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Invention
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Probe card assembly having die-level and pin-level compliance, and associated systems and methods... |
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Invention
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Test stack having wafer translator and stiffening interface, and associated systems and methods. ... |
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Invention
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Space transformers for probe cards, and associated systems and methods. Systems and methods for t... |
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Invention
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Designed asperity contactors, including nanospikes, for semiconductor test, and associated system... |
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Invention
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Stacked stud bump contacts for wafer test contactors, and associated methods. Systems and methods... |
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Invention
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Wafer testing system and associated methods of use and manufacture. A wafer testing system and as... |
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Invention
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Wafer prober integrated with full-wafer contactor.
Methods and apparatus for testing unsingulate... |
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2016
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Invention
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Probe card for testing semiconductor wafers. A probe card is disclosed. The probe card includes a... |
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Invention
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Designed asperity contactors, including nanospikes, for semiconductor test using a package, and a... |
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Invention
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Shaping of contact structures for semiconductor test, and associated systems and methods.
System... |
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Invention
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Systems and methods for generating and preserving vacuum between semiconductor wafer and wafer tr... |
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Invention
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Shaping of contact structures for semiconductor test, and associated systems and methods. Systems... |
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Invention
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Lost motion gasket for semiconductor test, and associated systems and methods.
Systems and metho... |
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Invention
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Interdigitized polysymmetric fanouts, and associated systems and methods.
Systems and methods fo... |
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Invention
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Lost motion gasket for semiconductor test, and associated systems and methods. Systems and method... |
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Invention
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Interdigitized polysymmetric fanouts, and associated systems and methods. Systems and methods for... |
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Invention
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Semiconductor tests using interposers, and associated systems and methods.
Semiconductor tests t... |
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2015
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Invention
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Wafer prober integrated with full-wafer contacter. Methods and apparatus for testing unsingulated... |
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2014
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G/S
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Probe device for testing semiconductors; Probe device for testing integrated circuits; Software f... |
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Invention
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Probe card for testing semiconductor wafers.
A probe card is disclosed. The probe card includes ... |
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Invention
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Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associ... |
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Invention
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Method and apparatus for multi-planar edge-extended wafer translator.
An apparatus, suitable for... |
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2013
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Invention
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Apparatus for thinning, testing and singulating a semiconductor wafer. A wafer translator is prov... |
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Invention
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Designed asperity contactors, including nanospikes for semiconductor test, and associated systems... |
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Invention
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Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed. A wafer... |
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Invention
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Maintaining a wafer/wafer translator pair in an attached state free of a gasket diposed. A wafer ... |
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2012
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Invention
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Full-water test and burn-in mechanism. Assemblies include a substrate, such as a printed circuit ... |
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Invention
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Probing assembly for testing integrated circuits. A probing assembly is disclosed. The probing as... |
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2011
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Invention
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Methods and apparatus for thinning, testing and singulating a semiconductor wafer. A wafer transl... |
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Invention
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Wafer testing systems and associated methods of use and manufacture. A wafer testing system and a... |
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Invention
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Wafer prober integrated with full-wafer contactor. Methods and apparatus for testing unsingulated... |
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Invention
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Method and apparatus for multi-planar edge-extended wafer translator. An apparatus, suitable for ... |
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2009
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Invention
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Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer i... |
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Invention
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Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed therebet... |
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Invention
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Methods and apparatus for collecting process characterization data after first failure in a group... |
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Invention
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Methods and apparatus for translated wafer stand-in tester. A translated wafer stand-in tester, b... |
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2008
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Invention
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Method and apparatus for single-sided extension of electrical conductors beyond the edges of a su... |
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Invention
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Full-wafer test and burn-in mechanism. Assemblies include a substrate, such as a printed circuit ... |
