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2018
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Invention
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A probe for testing an electrical property of a test sample. A probe for direct nano- and micro-s... |
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Invention
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Probe for testing an electrical property of a test sample. b) extending from the probe body. |
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Invention
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Position correction method and a system for position correction in relation to four probe resista... |
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Invention
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A position correction method and a system for position correction in relation to four probe resis... |
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2014
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Invention
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Small scale measurements on anisotropic sheet conductances. In a method of determining a pair of ... |
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2013
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Invention
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Deep-etched multipoint probe. A multipoint probe for establishing an electrical connection betwee... |
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Invention
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Rack for supporting a multi-point electrical probe holder |
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Invention
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Cover, connector, and handle assembly attachable to a rack for a rack-supported multi-point elect... |
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Invention
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Rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder |
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2012
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G/S
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Electric and electronic apparatus and instruments; namely,
microscopes, microprobes for testing ... |
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G/S
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Electric and electronic apparatus and instruments, namely, microscopes and microprobes for testin... |
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2011
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Invention
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Single-position hall effect measurements. A method for determining an electrical property of a te... |
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Invention
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Single-position hall effect measurements. A method for determining a distance (Y) between a first... |
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Invention
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Method for providing alignment of a probe. A method for aligning a probe relative to a supporting... |
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2010
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Invention
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Eliminating inline positional errors for four-point resistance measurement. Calculating resistanc... |
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Invention
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Automated multi-point probe manipulation. A multi-point probe particularly suitable for automated... |
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2009
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Invention
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Multi-point probe for testing electrical properties and a method of producing a multi-point probe... |
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Invention
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A multi-point probe for testing electrical properties and a method of producing a multi-point pro... |
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2008
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Invention
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Connector for a microchip probe |
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Invention
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Method of determining an electrical property of a test sample. A method of obtaining an electrica... |
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Invention
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A method of determining an electrical property of a test sample. A method of obtaining an electri... |
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Invention
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Device including a contact detector. The present invention relates to a probe for determining an ... |
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2007
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G/S
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Electric and electronic apparatus and instruments; namely, microscopes, microprobes for testing s... |
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G/S
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Electric and electronic apparatus and instruments;
microscopes, microprobes for testing semicond... |
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Invention
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Method for sheet resistance and leakage current density measurements on shallow semiconductor imp... |
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2006
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Invention
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Probe for testing electrical properties of a test sample. A probe for testing electrical properti... |
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Invention
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A probe for testing electrical properties of a test sample. The present invention relates to a pr... |
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Invention
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Eliminating inline positional errors for four-point resistance measurement. The present invention... |
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Invention
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Electrical feedback detection system for multi-point probes. An electrical feedback detection sys... |
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2005
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Invention
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A method for providing alignment of a probe. A method for providing alignment of a probe relative... |
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2003
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G/S
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Scientific and technological research and design services, namely, analysis and research, design ... |
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G/S
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Electric and electronic apparatus and instruments; microscopes, microprobes for testing semicondu... |
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2002
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Invention
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Nano-drive for high resolution positioning and for positioning of a multi-point probe. The multi-... |
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2000
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Invention
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Nano-drive for high resolution positioning and for positioning of a multi-point probe. A multi-po... |
