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2024
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G/S
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Software for operating probe-based instruments in the fields
of industrial production and scient... |
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2023
|
Invention
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Proximity sensor for electron backscatter diffraction systems.
The present invention refers to a... |
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Invention
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Inspection apparatus and method for inspecting a component.
An apparatus and method for an inspe... |
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G/S
|
Software for operating probe-based instruments in the fields of industrial production and scienti... |
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|
Invention
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Detector and method for obtaining kikuchi images.
The present invention refers to a detector and... |
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Invention
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Method for determining an element concentration of an eds/wds spectrum of an unknown sample and a... |
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2022
|
Invention
|
Hybrid integrated silicon drift detector and method for fabrication thereof.
The present inventi... |
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|
Invention
|
Hybrid integrated silicon drift detector and method for fabrication thereof. The present inventio... |
|
|
G/S
|
Software for operating probe-based instruments in the fields
of manufacturing and scientific res... |
|
|
G/S
|
microscopes, namely, measuring, imaging, and scanning probe microscopes; recorded and downloadabl... |
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G/S
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Software for operating probe-based instruments in the fields of manufacturing and scientific rese... |
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2021
|
Invention
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Method of processing an edx/xrf map and a corresponding image processing device. The present inve... |
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2020
|
Invention
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Method for improving transmission kikuchi diffraction pattern. D=γ*C+(1−γ)*D wherein
Z. The inve... |
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Invention
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Compensating control signal for raster scan of a scanning probe microscope. The invention relates... |
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|
Invention
|
Method for determining a material composition. A method comprises the steps of: (a) Obtaining a m... |
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|
Invention
|
Kikuchi diffraction detector. A detector for Kikuchi diffraction comprising a detector body and a... |
|
|
Invention
|
Arrangement having a measuring apparatus for a scanning probe microscope, scanning probe microsco... |
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|
Invention
|
Measuring device for a scanning probe microscope and method for scanning probe microscopy of a me... |
|
|
Invention
|
Method for improving an ebsd/tkd map. A method for improving the quality/integrity of an EBSD/TKD... |
|
|
Invention
|
Method for improving an ebsd/tkd map. The present invention refers to a method for improving the ... |
|
2019
|
Invention
|
Moveable detector. The present invention refers to an apparatus (100) and a method for detecting ... |
|
|
Invention
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Detector, methods for operating a detector and detector pixel circuit. A pixelated sensor compris... |
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|
Invention
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Detector, methods for operating a detector and detector pixel circuit. The present invention rela... |
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2018
|
Invention
|
Measuring device for a scanning probe microscope, scanning probe microscope and method for operat... |
|
|
Invention
|
X-ray fluorescence spectrometer. The present invention relates to an X-ray fluorescence, XRF, spe... |
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2017
|
Invention
|
Multi-module photon detector and use thereof. The invention relates to a photon detector (10), in... |
|
|
G/S
|
X-ray apparatus not for medical purposes; X-ray fluorescence analysers, other than for medical pu... |
|
|
Invention
|
Method and system for determining the position of a radiation source. i) and the incidence direct... |
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|
G/S
|
X-ray apparatus not for medical purposes; X-ray analysers, other than for medical purposes; X-ray... |
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2016
|
G/S
|
X-ray spectrometers; Accessories for X-ray spectrometry; Software. |
|
2015
|
Invention
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Method for scanning a sample by means of x-ray optics and an apparatus for scanning a sample. (c)... |
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|
Invention
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Method for scanning a sample by means of x-ray optics and an apparatus for scanning a sample. The... |
|
|
Invention
|
Method and arrangement for identifying crystalline phases, a corresponding computer program, and ... |
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|
Invention
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Method for identifying a crystallographic candidate phase of a crystal. According to the inventio... |
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2014
|
Invention
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Method for detecting x-rays and device. The invention relates to an energy dispersive detection m... |
|
|
Invention
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Device for spatially orienting an x-ray optical unit and apparatus having such a device. The inve... |
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|
G/S
|
Microscopes, namely, Scanning Probe Microscopes and Atomic Force Microscopes for analyzing and ma... |
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2013
|
Invention
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Apparatus and a method for investigating a sample by means of several investigation methods. A sa... |
|
2010
|
Invention
|
Low-interference sensor head for a radiation detector, as well as a radiation detector which cont... |
|
|
Invention
|
Method and arrangement for generating representations of anisotropic properties and a correspondi... |
|
|
Invention
|
Detector, device, and method for the simultaneous, energy-dispersive recording of backscattered e... |
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2009
|
Invention
|
Method and apparatus for determining the cell activation of a target cell by an activator. The in... |
|
|
Invention
|
Sensor head for an x-ray detector and x-ray detector containing said sensor head. The invention r... |
|
|
Invention
|
Low stray field magnetic traps and x-ray detectors comprising them. The invention relates to a lo... |
|
|
Invention
|
Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microsc... |
|
2008
|
Invention
|
Method and apparatus for the combined analysis of a sample with objects to be analyzed. The inven... |
|
|
Invention
|
Measuring probe device for a probe microscope, measuring cell and scanning probe microscope. The ... |
|
|
Invention
|
Method and apparatus for characterizing a sample with two or more optical traps. The present inve... |
|
|
Invention
|
Method for examining a test sample using a scanning probe microscope, measurement system and a me... |
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2007
|
Invention
|
Apparatus and method for examining a specimen by means of probe microscopy. The invention relates... |
|
2006
|
Invention
|
Method for examining a measurement object, and apparatus. The invention relates to a method for e... |
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|
G/S
|
X-ray spectrometers not for medical use, being laboratory equipment; computer software for use in... |
|
|
G/S
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X-ray spectrometers; software for X-ray spectrometers
(stored and downloaded). |
|
2005
|
G/S
|
Spectroscopes, microscopes, especially atomic force
microscopes; analysis apparatus, material te... |
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2004
|
G/S
|
Material testing instruments; measuring apparatus and
instruments; microscopes; apparatus and in... |
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2002
|
G/S
|
Material testing instruments, measuring apparatus, measuring
instruments, microscopes, apparatus... |
|
1997
|
G/S
|
x-ray detector |
|
|
G/S
|
X-ray detectors. |
