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2025
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G/S
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Scientific apparatus and instruments, namely, particle source modules, systems and instruments; s... |
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G/S
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Scientific apparatus and instruments; nautical apparatus and
instruments; surveying apparatus an... |
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2024
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Invention
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Ion source. The present description relates to an ion source device (100) with charge separation,... |
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2023
|
Invention
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Electron beam device for surface treatment.
The present description concerns an electron beam de... |
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2017
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Invention
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Plasma source. 1) of the enclosure (202). The distance (l) between the end of the antenna (204) a... |
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2010
|
Invention
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Mass analysis device with wide angular acceptance including a reflectron. A mass analysis device ... |
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Invention
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Mass analysis device with wide angular acceptance including a reflectron. The invention relates t... |
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Invention
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Magnetic achromatic mass spectrometer with double focusing. An achromatic magnetic mass spectrome... |
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Invention
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Magnetic achromatic mass spectrometer with double focusing. The invention relates to an achromati... |
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Invention
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Tomographic atom probe with flight-time mass spectrometer including an electrostatic device. The ... |
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2009
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Invention
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Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses. 0. |
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Invention
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Tomography atomic probe comprising a high voltage electric pulse electro-optical generator. The i... |
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Invention
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Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe.... |
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2008
|
Invention
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Atom probe with a high acceptance. The present invention relates to the field of tomographic atom... |
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Invention
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High resolution wide angle tomographic probe. The present invention concerns the enhancing of the... |
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Invention
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Wide angle high resolution tomographic probe. The invention pertains to improvements in the mass ... |
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2007
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G/S
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[ Particle accelerators; magnets; electromagnetic coils; ] testing apparatus not for medical purp... |
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2003
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Invention
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Device for measuring the emission of x-rays produced by an object exposed to an electron beam. Th... |
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Invention
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Device for measuring the emission of x rays produced by an object exposed to an electron beam. Th... |
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1999
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Invention
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Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer. ... |
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1991
|
Invention
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High transmission mass spectrometer with improved optical coupling. The disclosed mass spectromet... |
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1990
|
Invention
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Composite electromagnetic lens with variable focal distance. The lens is formed by the associatio... |
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1988
|
Invention
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Time-of-flight analysis method with continuous scanning and analyzer to implement this method. A ... |
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Invention
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Method for sample analysis by sputtering with a particle beam, and device to implement said metho... |
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1987
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Invention
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Method and device to discharge samples of insulating material during ion analysis. To compensate ... |
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1986
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Invention
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Electron beam integrated circuit tester. An electric beam integrated circuit tester including a s... |
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1984
|
Invention
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Process and device for the ionic analysis of an insulating sample. The device comprises for this ... |
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1983
|
Invention
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Electronic optical apparatus comprising pyrolytic graphite elements. The electronic optical appar... |
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1977
|
Invention
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Mass spectrometer for ultra-rapid scanning. The invention relates to a mass spectrometer for rapi... |
