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2015
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Invention
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Adjustable split-beam optical probing (asop). A practical method for greatly enhancing the streng... |
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2014
|
Invention
|
Probing circuit features in sub-32 nm semiconductor integrated circuit. A method for detecting ul... |
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Invention
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Remotely aligned wafer probe station for semiconductor optical analysis systems.
A test station ... |
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2013
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Invention
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Microscope with detector stop matching.
A microscope includes a detector device having an enclos... |
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Invention
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Auto-flat field for image acquisition.
Image correction may comprise acquiring a pixel value for... |
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Invention
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Multi-magnification high sensitivity optical system for probing electronic devices. An optical pr... |
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Invention
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Optical probe system having accurate positional and orientational adjustments for multiple optica... |
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Invention
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Multi-resolution optical probing system having reliable temperature control and mechanical isolat... |
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Invention
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Optical probing system having reliable temperature control. An optical probe system for probing a... |
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1998
|
Invention
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System and method for optically determining the temperature of a test object. A system and method... |
