eMemory Technology Inc.

Taiwan, Province of China


 
Total IP 381
Total IP Rank # 3,379
IP Activity Score 3.1/5.0    185
IP Activity Rank # 3,717
Stock Symbol 3529 (tpex)
ISIN TW0003529004
Market Cap. 234.40001B  (TWD)
Industry Semiconductor Memory
Sector Technology
Dominant Nice Class Scientific, technological and in...

Patents

Trademarks

370 8
0 0
0 0
3
 
Last Patent 2025 - Sensing apparatus for non-volati...
First Patent 1998 - Fabricating method of an ultra-f...
Last Trademark 2016 - NEOPUF
First Trademark 2002 - NEOBIT

Industry (Nice Classification)

Latest Inventions, Goods, Services

2024 Invention Nonvolatile memory cell and manufacturing method thereof. A nonvolatile memory cell includes an ...
Invention One-time-programmable memory device. A one-time-programmable (OTP) memory device includes an act...
Invention Voltage level shifter. A voltage level shifter is provided. The voltage level shifter includes a...
Invention Control gate voltage generating circuit for non-volatile memory. A control gate voltage generati...
Invention Power control apparatus for non-volatile memory. A power control apparatus for a non-volatile me...
Invention Antifuse-type one time programming memory and associated bias voltage control method. An antifus...
Invention Non-volatile memory with auxiliary select gate line driver. A non-volatile memory with an auxili...
Invention Level shifter. A level shifter which includes an inverter, first/second/third/fourth N-type tran...
Invention Antifuse-type memory with fin field-effect transistor. An antifuse-type memory includes a first ...
Invention Layout structure of memory cell array for non-volatile memory. A layout structure of a memory ce...
Invention One-time-programmable memory device. A one-time-programmable (OTP) memory device includes a memo...
Invention Level shifting circuit. A level shifting circuit includes a first-type level shifter, a second-t...
Invention One time programming memory including forksheet transistors and using physically unclonable funct...
Invention Sensing apparatus for non-volatile memory. A sensing apparatus for a non-volatile memory include...
Invention Sense amplifier applied to non-volatile memory. A sense amplifier for a non-volatile memory is p...
Invention Non-volatile memory and associated control method. A control method for a non-volatile memory is...
Invention Storage transistor of charge-trapping non-volatile memory. A storage transistor of a charge-trap...
Invention Non-volatile memory cell of array structure and associated controlling method. A non-volatile me...
Invention Antifuse-type one time programming memory with forksheet transistors. An antifuse-type one time ...
Invention One time programming memory cell and memory array for physically unclonable function technology a...
2023 Invention Antifuse-type non-volatile memory cell. An antifuse-type non-volatile memory cell includes a sel...
Invention Non-volatile memory and reference current generator thereof. A non-volatile memory receives a su...
Invention Latch type sense amplifier for non-volatile memory. A latch type sense amplifier includes three ...
Invention Memory cell and array structure of non-volatile memory and associated control method. A memory c...
Invention Memory device and operation method thereof. A memory device includes a memory cell array and a s...
Invention Anti-fuse memory device. An anti-fuse memory device includes an anti-fuse module, a reference cu...
Invention Antifuse-type non-volatile memory and control method thereof. An antifuse-type non-volatile memo...
Invention Fault-injection protection circuit for protecting against laser fault injection. A fault-injecti...
Invention Level shifter with voltage stress durability and method for driving the same. A level shifter in...
Invention Regulator and operation method thereof. A regulator includes a pre-regulator circuit, a pump cir...
Invention Programming method of non-volatile memory cell. A programming method of a non-volatile memory cel...
Invention One time programming memory cell with fin field-effect transistor using physically unclonable fun...
Invention One time programming memory cell with gate-all-around transistor for physically unclonable functi...
Invention Short channel effect based random bit generator. A random bit generator includes a voltage source...
Invention Selection circuit. A selection circuit includes a main selection circuit and an auxiliary select...
Invention Electrostatic discharge circuit. An ESD circuit includes a first P-type transistor, a second P-t...
Invention Erasable programmable non-volatile memory cell. A non-volatile memory cell includes a p-type wel...
Invention Voltage level shifter and operation method thereof. A voltage level shifter includes an input tra...
Invention Antifuse-type one time programming memory cell with gate-all-around transistor. An antifuse-type...
Invention Manufacturing method for nonvolatile charge-trapping memory apparatus. A manufacturing method fo...
Invention Resistive memory cell and associated cell array structure. A resistive memory cell includes a P-...
Invention Memory cell of charge-trapping non-volatile memory. A memory cell of a charge-trapping non-volat...
2022 Invention Memory cell of charge-trapping non-volatile memory. A memory cell of a charge-trapping non-volati...
Invention Non-volatile memory and voltage detecting circuit thereof. A voltage detecting circuit for a non-...
Invention Sensing device for non-volatile memory. A sensing device for a non-volatile memory includes a ref...
Invention Non-volatile memory cell and non-volatile memory cell array. A non-volatile memory cell includes ...
Invention Erasable programmable single-ploy non-volatile memory cell and associated array structure. An era...
Invention Driving circuit for non-volatile memory. A driving circuit includes a cross coupled circuit, a fi...
Invention Program control circuit for antifuse-type one time programming memory cell array. A program contr...
2016 G/S Semiconductor chips and semiconductor devices, all for use in computing devices, communication pr...
2012 G/S Design and testing of integrated circuits for others; testing and analysis of integrated circuits...