|
2025
|
Invention
|
Microscopy imaging method and system.
A method to compensate for drift while controlling a charg... |
|
2024
|
Invention
|
Fiducial guided cross-sectioning and lamella preparation with tomographic data collection. Linear... |
|
2023
|
Invention
|
Method for cross-section sample preparation. A method for attaching a prepared sample to a carrie... |
|
2022
|
Invention
|
Microscopy imaging method for 3d tomography with predictive drift tracking for multiple charged p... |
|
|
Invention
|
Method for cross-section sample preparation. A carrier grid with integrated gas delivery system f... |
|
2021
|
Invention
|
Method and system for cross-sectioning a sample with a preset thickness or to a target site. Line... |
|
2020
|
Invention
|
Method and system for iteratively cross-sectioning a sample to correlatively targeted sites. Line... |
|
2018
|
Invention
|
Method for cross-section sample preparation. A novel method for cross-section sample preparation ... |
|
2017
|
Invention
|
Microscopy imaging method and system. Notches or chevrons with known angles relative to each othe... |
|
2012
|
Invention
|
Microscopy imaging method and system. Generally, the present disclosure provides a method and sys... |
|
|
Invention
|
Microscopy imaging method and system. ABSTRACT: Generally, the present disclosure provides a meth... |
|
2011
|
Invention
|
Apparatus and method for surface modification using charged particle beams. An apparatus and meth... |
|
2007
|
Invention
|
Method and system for counting secondary particles. An apparatus for visualizing an ion beam edit... |
|
|
Invention
|
Redeposition technique for membrane attachment.
A method for securing a micro-object to a substr... |
|
|
Invention
|
Redeposition technique for membrane attachment. A method for securing a micro-object to a substra... |
|
2006
|
Invention
|
Methods for performing circuit edit operations with low landing energy electron beams. Methods fo... |
|
2004
|
G/S
|
Computer hardware and software used for operating charged particle beam instruments |
|
1998
|
G/S
|
ANALYSIS FOR OTHERS OF SEMICONDUCTOR SPECIMENS USING FOCUSED BEAMS OF CHARGED PARTICLES; GENERAL ... |
|
|
G/S
|
Focused ion beam services, materials science and semiconductor analysis services. |
