Globalwafers Japan Co., Ltd.

Japan

 
Total IP 65
Total IP Rank # 20,729
IP Activity Score 2.6/5.0    55
IP Activity Rank # 13,204

Patents

Trademarks

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Last Patent 2024 - Heat treatment apparatus and sem...
First Patent 1996 - Manufacturing method of a silico...

Latest Inventions, Goods, Services

2024 Invention Heat treatment apparatus, method of maintaining heat treatment apparatus, and method of regenerat...
Invention Heat treatment apparatus and semiconductor substrate manufacturing method. By accurately detecti...
Invention Method of manufacturing semiconductor wafers and method of manufacturing semiconductor devices. ...
Invention Method of manufacturing semiconductor wafer and semiconductor device. A method of manufacturing ...
Invention Method of manufacturing silicon wafers. To provide a method of manufacturing silicon wafers havi...
2023 Invention Single crystal pulling device and single crystal pulling method. The present invention precisely ...
Invention Silicon single crystal. Provided is a silicon single crystal which is grown by intermittently ins...
Invention Method for evaluating silicon single crystal ingot. Provided is a method for evaluating a silicon...
2022 Invention Method for measuring thickness of high-resistance silicon wafer, and method for measuring flatnes...
Invention Silicon epitaxial substrate production method and silicon epitaxial substrate. Provided are: a si...
Invention Method for producing silicon single crystal, and single crystal pulling apparatus. The purpose of...
Invention Method for producing silicon monocrystal. The purpose of the present invention is to maintain the...
Invention Method for cleaning silicon wafer. The purpose of the present invention is to provide a method fo...
Invention Method for manufacturing silicon wafer and silicon wafer. A clean silicon wafer, having a DZ lay...
Invention Method for producing silicon wafer, and silicon wafer. According to the present invention, there ...
2021 Invention Method for producing three-dimensional structure, method for producing vertical transistor, verti...
Invention Silicon wafer and method for producing silicon wafer. A silicon wafer is provided which is a Czo...
Invention Silicon wafer and method for producing silicon wafer. A Czochralski wafer (1) made of silicon, wh...
Invention Device for cleaning silicon raw material. The present invention effectively reduces the amount of...
Invention Manufacturing method for semiconductor silicon wafer. Provided is a method for manufacturing a s...
Invention Manufacturing method for semiconductor silicon wafer. The substrate is doped with P, has a resis...
Invention Manufacturing method for semiconductor silicon wafer. 3. The method includes steps of mirror-poli...
Invention Semiconductor silicon wafer manufacturing method. Provided is a silicon wafer manufacturing metho...
Invention Method for manufacturing semiconductor silicon wafer. Provided is a method for manufacturing a si...
Invention Method for predicting occurrence of defect in epitaxial silicon wafer and method for manufacturin...
Invention Method for producing silicon monocrystal. Provided is a method for producing a silicon monocrysta...
Invention Method for producing silicon single crystal. The purpose of the present invention is to provide a...
2020 Invention Method and apparatus for pulling single crystal. A method and an apparatus of pulling single crys...
Invention Single crystal pulling method and single crystal pulling device. Provided are a single crystal pu...
Invention Method for producing silicon single crystal. Provided is a method for producing a silicon single ...
Invention Lamination wafers and method of producing bonded wafers using the same. The occurrence of breaki...
Invention Lamination wafer and laminated-wafer manufacturing method using same. The present invention addre...
2019 Invention Method for measuring extremely low oxygen concentration in silicon wafer. 2 film, nitride film or...
Invention Method for measuring ultra-low oxygen concentration in silicon wafer. Provided is a method for me...
Invention Method for heat-treating silicon wafer. Provided is a method for heat-treating a silicon wafer i...
Invention Method for heat-treating silicon wafer. Provided is a method for heat-treating a silicon wafer in...
Invention Method of manufacturing epitaxial silicon wafers. A method for manufacturing an epitaxial silicon...
2018 Invention Evaluation method of metal contamination. 3 or less, slicing silicon wafers from the Si single cr...
Invention Metal contamination evaluation method. The present invention addresses the problem of highly accu...
Invention Evaluation method of silicon wafer. 2 or less and the existence of strain in each of the sections...
Invention Method for evaluating silicon wafer. Provided is a method for evaluating a silicon wafer by which...
Invention Method for producing three-dimensional structure, method for producing vertical transistor, wafer...
2017 Invention Calibration curve determination method, carbon concentration measurement method, and silicon wafe...
Invention Thermal processing method for silicon wafer. d−0.511 (Formula (B)) of an oxygen partial pressure ...
Invention Silicon wafer thermal processing method. A thermal process is performed in a range in which a pro...
Invention Silicon wafer. 3 or over.
Invention Silicon wafer. The present invention configures a silicon wafer comprising: a denuded zone (10), ...
Invention Protective-film forming method for semiconductor substrate. A protective-film forming method for ...