|
2007
|
Invention
|
Method and apparatus for measurement of the thickness of thin layers by means of measurement prob... |
|
2006
|
Invention
|
Measuring probe, especially for a device for the measurement of the thickness of thin layers. The... |
|
|
Invention
|
Measurement stand for holding a measuring instrument. A measurement stand for holding a measuring... |
|
|
Invention
|
Calibration standard. The invention relates to a calibration standard, especially for the calibra... |
|
|
Invention
|
Method for optimising measuring times of a measuring device. The invention relates to a method fo... |
|
2005
|
Invention
|
Method for outputting measured values and display device. Method for emitting measuring values on... |
|
|
Invention
|
Method for emitting measuring values and display device. The invention relates to a method for em... |
|
|
Invention
|
Calibrating device for adapting a measuring device for measuring the thickness of thin layers on ... |
|
2003
|
Invention
|
Apparatus for measurement of the thickness of thin layers. An apparatus for measurement of the th... |
|
|
Invention
|
Measurement probe, in particular for an apparatus for measurement of the thickness of thin layers... |
|
|
Invention
|
Hand-held device for non-destructive thickness measurement. An apparatus for non-destructive meas... |
|
1999
|
Invention
|
Determination of the measuring spot during x-ray fluorescence analysis. A specimen part for deter... |
|
1998
|
Invention
|
Method and device for the determination of measurement uncertainties in x-ray fluorescence layer ... |
|
|
Invention
|
Method and apparatus for measuring the thicknesses of thin layers by means of x-ray fluorescence.... |
