Applejack 199 L.P.

United States of America

 
Total IP 39
Total IP Rank # 36,083
IP Activity Score 1.7/5.0    9
IP Activity Rank # 101,763

Patents

Trademarks

33 0
0 0
6 0
0
 
Last Patent 2021 - Focusing of optical devices
First Patent 1994 - Beam spot position detector havi...

Latest Inventions, Goods, Services

2021 Invention Focusing of optical devices. The present subject matter includes a method of focusing of an optic...
2020 Invention Characterization of specular surfaces. The present subject matter at-least provides a system for...
Invention Hybrid silicon-metal anode using microparticles for lithium-ion batteries. A system and method o...
Invention Dual-sensor arrangment for inspecting slab of material. According to an aspect of one or more em...
Invention Multi-probe gauge for slab characterization. The present subject matter at least provides an appa...
Invention Non-contact measurement of a stress in a film on a substrate. A method for non-contact measuremen...
2019 Invention Inspecting a slab of material. A system for inspecting a slab of material may include an optical...
Invention Multi-probe gauge for slab characterization. The present subject matter at-least provides an appa...
Invention Measurement of surface topography of a work-piece. An apparatus and a method for measuring surfac...
2018 Invention Inspecting a multilayer sample. Inspecting a multilayer sample may include receiving, at a beam s...
Invention Inspecting a slab of material. A system for inspecting a slab of material may include an optical ...
Invention Inspecting a multilayer sample. Inspecting a multilayer sample. In one example embodiment, a meth...
Invention Error reduction in measurement of samples of materials. Operations related to error reduction in ...
Invention Inspecting a slab of material. A system for inspecting a slab of material may include a polarizat...
Invention Dual-sensor arrangment for inspecting slab of material. According to an aspect of one or more emb...
Invention Non-contact measurement of a stress in a film on substrate. A method and apparatus for non-contac...
Invention Characterization of specular surfaces. The present subject matter at-least provides a system for ...
Invention Optical device employing electrically addressed spatial light modulator. A device is described a...
2017 Invention Hybrid silicon-metal anode using microparticles for lithium-ion batteries. A system and method of...
Invention Inspecting a slab of material. According to an aspect of one or more embodiments, a system for in...
2016 Invention System, method and apparatus for forming a thin film lithium ion battery. A system and method of ...
2015 Invention System, method and apparatus for capturing and training a swing movement of a club. A system, met...
Invention Wearable devices. A wearable device may include a flexible printed circuit board and a processin...
Invention Wearable devices. A wearable device may include a flexible printed circuit board and a processing...
Invention Interferometer. An interferometer may include a tunable light source, a beam direction unit, a d...
Invention Stress analysis of semiconductor wafers. According to an aspect of an embodiment, a method may i...
Invention Stress analysis of semiconductor wafers. According to an aspect of an embodiment, a method may in...
Invention Sensor-based gaming system for an avatar to represent a player in a virtual environment. A method...
2014 Invention Method and system for measuring patterned substrates. A system and method of measuring feature de...
2013 Invention Measuring device for detecting a hitting movement of a hitting implement, training device, and me...
Invention Porous, thin film electrodes for lithium-ion batteries. A porous thin film battery is described h...
2011 Invention System, method and apparatus for forming multiple layers in a single process chamber. A method fo...
2010 Invention Junction photovoltage probe face
2008 Invention Solar cell array
Invention Solar cell
2007 Invention Non-contact method and apparatus for measurement of leakage current of p-n junctions in ic produc...