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2023
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Invention
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Pin-type probes for contacting electronic circuits. Pin probes (200) are provided that allow elec... |
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Invention
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Multi-beam probes with decoupled structural and current carrying beams. Probe structures having m... |
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Invention
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Compliant pin probes with multiple spring segments and compression spring deflection stabilizatio... |
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Invention
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Shielded probes for semiconductor testing. Shielded probes are provided having connection nodes t... |
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Invention
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Probe with multiple springs and movable stops capable of movement or inhibition of movement based... |
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Invention
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Compliant pin probes with flat extension springs and pre-biasing stop structures. Embodiments are... |
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Invention
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Probe arrays and improved methods for making and using longitudinal deformation of probe preforms... |
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Invention
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Method for making improved buckling beam probe arrays including forming probes with lateral posit... |
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Invention
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Multi-beam vertical probes with independent compliant arms formed of materials having different y... |
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Invention
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Two-dimensional probe arrays comprising vertical probes having spacers make constant contact betw... |
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Invention
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Probes with modulating mechanical properties by using nano-fibers, corresponding probe arrays and... |
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Invention
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Probe array incorporating probes that have selected mechanical properties manipulated during form... |
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Invention
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Probes having improved mechanical and/or electrical properties for making contact between electro... |
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Invention
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Improved methods for making probe arrays utilizing lateral plastic deformation of probe preforms.... |
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Invention
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Improved methods for making probe arrays utilizing deformed templates. Probe array formation embo... |
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Invention
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Probes with planar unbiased spring elements for electronic component contact. Probes for contacti... |
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Invention
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Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in plane... |
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Invention
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Compliant probes with enhanced pointing stability and including at least one extension spring or ... |
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Invention
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Compliant pin probes with extension springs or spring segments and ratcheting elements. Embodimen... |
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Invention
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Compliant probes including dual independently operable probe contact elements including at least ... |
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Invention
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Methods of separating good probe structures from defective probe structures in an electrochemical... |
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2022
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Invention
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Probes with planar unbiased spring elements for electronic component contact, methods for making ... |
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Invention
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Compliant probes with enhanced pointing stability and including at least one flat extension sprin... |
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Invention
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Compliant pin probes with extension springs, methods for making, and methods for using. Embodimen... |
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Invention
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Compliant pin probes with flat extension springs, methods for making, and methods for using. Embo... |
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2021
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Invention
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Probes with planar unbiased spring elements for electronic component contact and methods for maki... |
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Invention
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Shielded probes for semiconductor testing, methods for using, and methods for making.
Dual shiel... |
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Invention
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Multi-beam vertical probes with independent arms formed of a high conductivity metal for enhancin... |
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Invention
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Methods of reinforcing plated metal structures and independently modulating mechanical properties... |
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Invention
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Methods for making probe arrays utilizing deformed templates.
Probe array formation embodiments ... |
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Invention
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Methods for making probe arrays utilizing lateral plastic deformation of probe preforms.
Improve... |
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Invention
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Vertical probe arrays and improved methods for making using temporary or permanent alignment stru... |
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Invention
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Buckling beam probe arrays and methods for making such arrays including forming probes with later... |
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2020
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Invention
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Probes with multiple springs, methods for making, and methods for using. Embodiments are directed... |
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2004
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G/S
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Manufacture of products, namely micro electro-mechanical or MEMS devices, systems and components,... |
