Oxford Instruments plc

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Type PI
        Brevet 12
        Marque 7
Juridiction
        États-Unis 11
        International 4
        Europe 4
Classe IPC
G01Q 60/32 - Mode vibrant 4
B82Y 35/00 - Procédés ou appareils pour la mesure ou l’analyse des nanostructures 2
G01B 5/28 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer la rugosité ou l'irrégularité des surfaces 2
G01B 7/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques électriques ou magnétiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés 2
G01Q 10/00 - Dispositions pour le balayage ou le positionnement, c.-à-d. dispositions pour commander de manière active le mouvement ou la position de la sonde 2
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 4
10 - Appareils et instruments médicaux 3
35 - Publicité; Affaires commerciales 3
37 - Services de construction; extraction minière; installation et réparation 3
41 - Éducation, divertissements, activités sportives et culturelles 3
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1.

OXFORD INSTRUMENTS

      
Numéro d'application 017977734
Statut Enregistrée
Date de dépôt 2018-10-30
Date d'enregistrement 2019-03-15
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Computer software for use in relation to flexible plasma processing apparatus, flexible ion beam processing systems, high precision magnets, cryogenic systems and associated electronic instrumentation for nuclear magnetic resonance, magnetic resonance imaging and associated applications, other than for medical purposes; computer software for use in relation to electron detector apparatus, electron microscope control apparatus, x-ray pulse processor instruments, microanalysis apparatus, crystallographic analysis apparatus, laboratory cryostats, dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, metrology apparatus, scanning probe microscopy apparatus, all being scientific apparatus; computer software for use in relation to electronic scientific apparatus, x-ray fluorescence (XRF), low field nuclear magnetic resonance (NMR) spectrometers, filter near infra-red (NIR) instruments, detector magnets, insertion devices, monochromators, optics, cooling options, scientific cameras, spectrograph and detector systems for spectroscopy, confocal microscope systems, apparatus and instruments for cryogenic and superconducting magnet research; computer software for use in relation to apparatus and instruments for generating milliKelvin temperatures, apparatus and instruments for adiabatic demagnetisation refrigeration, dilution refrigerators, cryogen free superconducting magnets, cryogen free scientific apparatus, instruments and systems, apparatus and instruments for atomic force microscopy, probes; computer software for electron backscatter diffraction analysis; computer software for quantum transport measurement; computer software for use in relation to nuclear magnetic resonance, microscopy and spectroscopy; imaging software; computer software for image analysis; computer software for spectroscopy analysis; computer software for data management, visualization, analysis, segmentation and interpretation of 3D and 4D microscopy datasets; computer software for comparison of information on a database; databases.

2.

Integrated micro actuator and LVDT for high precision position measurements

      
Numéro d'application 15377458
Numéro de brevet 10337890
Statut Délivré - en vigueur
Date de dépôt 2016-12-13
Date de la première publication 2017-03-30
Date d'octroi 2019-07-02
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s)
  • Proksch, Roger Carlos
  • Bocek, Dan
  • Cleveland, Jason
  • Longmire, Matthew
  • Klonowski, Matthew

Abrégé

A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.

Classes IPC  ?

  • G01B 7/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques électriques ou magnétiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés
  • G01D 5/22 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensibleMoyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminéTransducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques influençant la valeur d'un courant ou d'une tension en faisant varier l'inductance, p. ex. une armature mobile influençant deux bobines par une action différentielle
  • G01Q 10/04 - Balayage ou positionnement fin
  • H01F 21/04 - Inductances ou transformateurs variables du type pour signaux continûment variables, p. ex. variomètres par déplacement relatif de spires ou de parties d'enroulements

3.

Material property measurements using multiple frequency atomic force microscopy

      
Numéro d'application 15064405
Numéro de brevet 10215773
Statut Délivré - en vigueur
Date de dépôt 2016-03-08
Date de la première publication 2016-09-08
Date d'octroi 2019-02-26
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Inventeur(s)
  • Proksch, Roger
  • Callahan, Roger

Abrégé

Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information using contact resonance with multiple excitation signals are also described.

Classes IPC  ?

  • G01Q 20/00 - Contrôle du mouvement ou de la position de la sonde
  • G01Q 60/24 - Microscopie à forces atomiques AFM [Atomic Force Microscopy] ou appareils à cet effet, p. ex. sondes AFM
  • G01Q 60/32 - Mode vibrant

4.

Variable density scanning

      
Numéro d'application 14755273
Numéro de brevet 09366693
Statut Délivré - en vigueur
Date de dépôt 2015-06-30
Date de la première publication 2015-12-31
Date d'octroi 2016-06-14
Propriétaire
  • Oxford Instruments PLC (Royaume‑Uni)
  • Oxford Instruments AFM Inc (USA)
Inventeur(s)
  • Proksch, Roger B
  • Callahan, Roger C

Abrégé

Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning probe microscopes, as well as profilometers and confocal optical microscopes. This allows the selective imaging of particular regions of a sample surface for accurate measurement of critical dimensions within a relatively small data acquisition time.

Classes IPC  ?

  • G01Q 10/00 - Dispositions pour le balayage ou le positionnement, c.-à-d. dispositions pour commander de manière active le mouvement ou la position de la sonde
  • G01Q 10/06 - Circuits ou algorithmes à cet effet

5.

Multiple frequency atomic force microscopy

      
Numéro d'application 13903152
Numéro de brevet 09069007
Statut Délivré - en vigueur
Date de dépôt 2013-05-28
Date de la première publication 2013-12-19
Date d'octroi 2015-06-30
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s) Proksch, Roger B.

Abrégé

An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described.

Classes IPC  ?

  • G01Q 60/24 - Microscopie à forces atomiques AFM [Atomic Force Microscopy] ou appareils à cet effet, p. ex. sondes AFM
  • G01Q 60/32 - Mode vibrant
  • B82Y 35/00 - Procédés ou appareils pour la mesure ou l’analyse des nanostructures

6.

Nanoindenter

      
Numéro d'application 13494526
Numéro de brevet 09063042
Statut Délivré - en vigueur
Date de dépôt 2012-06-12
Date de la première publication 2012-10-25
Date d'octroi 2015-06-23
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s)
  • Bonilla, Flavio Alejandro
  • Proksch, Roger
  • Cleveland, Jason
  • Sauter, Tim

Abrégé

A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.

Classes IPC  ?

  • G01Q 20/02 - Contrôle du mouvement ou de la position de la sonde par des moyens optiques
  • G01Q 60/36 - Mode statique
  • G01N 3/317 - Recherche des propriétés mécaniques des matériaux solides par application d'une contrainte mécanique en appliquant une force unique et brève engendrée par des moyens électromagnétiques
  • B82Y 35/00 - Procédés ou appareils pour la mesure ou l’analyse des nanostructures

7.

Variable density scanning

      
Numéro d'application 13104189
Numéro de brevet 08489356
Statut Délivré - en vigueur
Date de dépôt 2011-05-10
Date de la première publication 2011-09-08
Date d'octroi 2013-07-16
Propriétaire Oxford Instruments, PLC (Royaume‑Uni)
Inventeur(s)
  • Proksch, Roger B.
  • Callahan, Roger C.

Abrégé

Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning probe microscopes, as well as profilometers and confocal optical microscopes. This allows the selective imaging of particular regions of a sample surface for accurate measurement of critical dimensions within a relatively small data acquisition time.

Classes IPC  ?

  • G01R 13/00 - Dispositions pour la présentation de variables électriques ou de formes d'ondes
  • G01B 5/28 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer la rugosité ou l'irrégularité des surfaces

8.

Thermal measurements using multiple frequency atomic force microscopy

      
Numéro d'application 12925442
Numéro de brevet 08677809
Statut Délivré - en vigueur
Date de dépôt 2010-10-21
Date de la première publication 2011-06-23
Date d'octroi 2014-03-25
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s)
  • Proksch, Roger
  • Gannepalli, Anil

Abrégé

Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information from piezoelectric, polymer and other materials using contact resonance with multiple excitation signals are also described.

Classes IPC  ?

9.

Integrated micro actuator and IVDT for high precision position measurements

      
Numéro d'application 12587947
Numéro de brevet 08502525
Statut Délivré - en vigueur
Date de dépôt 2009-10-14
Date de la première publication 2010-08-26
Date d'octroi 2013-08-06
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s)
  • Proksch, Roger
  • Bocek, Dan
  • Cleveland, Jason
  • Longmire, Matthew
  • Klonowski, Matthew

Abrégé

A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.

Classes IPC  ?

  • G01B 7/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques électriques ou magnétiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés

10.

OiService

      
Numéro d'application 1040397
Statut Enregistrée
Date de dépôt 2010-02-09
Date d'enregistrement 2010-02-09
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ?
  • 35 - Publicité; Affaires commerciales
  • 37 - Services de construction; extraction minière; installation et réparation
  • 41 - Éducation, divertissements, activités sportives et culturelles

Produits et services

Customer service in the field of service contracts and agreements for the repair and maintenance of scientific and medical instruments and equipment including the provision of spare parts of scientific and medical instruments and equipment. Installation, repair and maintenance of scientific and medical instruments and equipment. Training services in the use of scientific and medical instruments and equipment.

11.

Multiple frequency atomic force microscopy

      
Numéro d'application 12582045
Numéro de brevet 08448501
Statut Délivré - en vigueur
Date de dépôt 2009-10-20
Date de la première publication 2010-02-18
Date d'octroi 2013-05-28
Propriétaire Oxford Instruments PLC (Royaume‑Uni)
Inventeur(s) Proksch, Roger B

Abrégé

An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described.

Classes IPC  ?

  • G01B 5/28 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer la rugosité ou l'irrégularité des surfaces
  • G01Q 10/00 - Dispositions pour le balayage ou le positionnement, c.-à-d. dispositions pour commander de manière active le mouvement ou la position de la sonde
  • G01Q 60/32 - Mode vibrant

12.

OISERVICE

      
Numéro de série 79083160
Statut Enregistrée
Date de dépôt 2010-02-09
Date d'enregistrement 2011-11-29
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ?
  • 35 - Publicité; Affaires commerciales
  • 37 - Services de construction; extraction minière; installation et réparation
  • 41 - Éducation, divertissements, activités sportives et culturelles

Produits et services

Customer service in the field of service contracts and agreements that provide for the repair, maintenance and provision of spare parts of scientific and medical instruments and equipment in the nature of in the nature of flexible plasma processing apparatus, flexible ion bean processing systems, high precision magnet cryogenic systems, electron detectors, electron microscope controllers, x-ray pulse processors, microanalysis apparatus, crystallographic analysis apparatus, laboratory cryostats, dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, x-ray fluorescence (XRF) spectrometers, low-field nuclear magnetic resonance (NMR) spectrometers, detector magnets, apparatus and instruments for use in electrocardiographs, benchtop NMR and low field MRI, cryogenic systems, etching deposition and growth, microanalysis, optical emission (OES) analysers, x-ray fluorescence (XRF), coating thickness analysers, dynamic nuclear polarization, low temperature and high magnetic field, MRI magnet support, superconducting wire, x-ray tubes, and computer hardware and software Installation, repair and maintenance of scientific and medical instruments and equipment in the nature of flexible plasma processing apparatus, flexible ion bean processing systems, high precision magnet cryogenic systems, electron detectors, electron microscope controllers, x-ray pulse processors, microanalysis apparatus, crystallographic analysis apparatus, laboratory cryostats, dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, x-ray fluorescence (XRF) spectrometers, low-field nuclear magnetic resonance (NMR) spectrometers, detector magnets, apparatus and instruments for use in electrocardiographs, benchtop NMR and low field MRI, cryogenic systems, etching deposition and growth, microanalysis, optical emission (OES) analysers, x-ray fluorescence (XRF), coating thickness analysers, dynamic nuclear polarization, low temperature and high magnetic field, MRI magnet support, superconducting wire, x-ray tubes Training services in the use of scientific and medical instruments and equipment in the nature of flexible plasma processing apparatus, flexible ion bean processing systems, high precision magnet cryogenic systems, electron detectors, electron microscope controllers, x-ray pulse processors, microanalysis apparatus, crystallographic analysis apparatus, laboratory cryostats, dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, x-ray fluorescence (XRF) spectrometers, low-field nuclear magnetic resonance (NMR) spectrometers, detector magnets, apparatus and instruments for use in electrocardiographs, benchtop NMR and low field MRI, cryogenic systems, etching deposition and growth, microanalysis, optical emission (OES) analysers, x-ray fluorescence (XRF), coating thickness analysers, dynamic nuclear polarization, low temperature and high magnetic field, MRI magnet support, superconducting wire, x-ray tubes, and computer hardware and software

13.

OiService

      
Numéro d'application 008683096
Statut Enregistrée
Date de dépôt 2009-11-12
Date d'enregistrement 2010-05-19
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ?
  • 35 - Publicité; Affaires commerciales
  • 37 - Services de construction; extraction minière; installation et réparation
  • 41 - Éducation, divertissements, activités sportives et culturelles

Produits et services

Customer service in the field of service contracts and agreements for the repair and maintenance of scientific and medical instruments and equipment; providing spare parts of scientific and medical instruments and equipment. Installation, repair and maintenance of scientific and medical instruments and equipment. Training services in the use of scientific and medical instruments and equipment.

14.

MAGNET SYSTEM FOR USE IN MAGNETIC RESONANCE IMAGING

      
Numéro d'application GB2008002182
Numéro de publication 2009/001084
Statut Délivré - en vigueur
Date de dépôt 2008-06-25
Date de publication 2008-12-31
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Inventeur(s)
  • Mcdougall, Ian, Leitch
  • Hanley, Peter

Abrégé

A magnet system is described for use in magnetic resonance imaging. In use the system generates a resultant magnetic field, within a working region, of sufficient homogeneity to enable magnetic resonance imaging to be performed. The system comprises a primary magnet comprising a pair of coils positioned upon a common axis passing through the centre of the working region, the coils being spaced symmetrically about an origin upon the common axis and having dimensions such that each coil is at or adjacent a nominal position at which the second order derivative of a corresponding magnetic field in the working region is substantially zero for a coil pair located symmetrically about the origin at such a position. A shielding magnet comprises a pair of coils positioned upon the common axis, the coils being spaced symmetrically about the origin and having dimensions such that each coil is at or adjacent a nominal position at which the second order derivative of a corresponding magnetic field in the working region is substantially zero for a coil pair located symmetrically about the origin at such a position, the shielding magnet being operative in use to reduce the resultant magnetic field at locations distal from the magnet system. A compensation magnet comprises at least one pair of coils positioned upon the common axis, the coils being spaced symmetrically about the origin and having dimensions such that each coil is at or adjacent a nominal position at which at least one even order derivative of a corresponding magnetic field having a magnitude of 6 or above, in the working region, is substantially zero for a coil pair located symmetrically about the origin at such a position.

Classes IPC  ?

  • G01R 33/3815 - Systèmes pour produire, homogénéiser ou stabiliser le champ magnétique directeur ou le champ magnétique à gradient utilisant des électro-aimants avec des bobines supraconductrices, p. ex. leurs alimentations
  • G01R 33/3875 - Compensation des inhomogénéités utilisant des ensembles de bobines de correction, p. ex. compensation active

15.

MAGNETIC FIELD GENERATING SYSTEM FOR USE IN MRI

      
Numéro d'application GB2007004895
Numéro de publication 2008/075051
Statut Délivré - en vigueur
Date de dépôt 2007-12-19
Date de publication 2008-06-26
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Inventeur(s)
  • Mcdougall, Ian, Leitch
  • Hanley, Peter

Abrégé

A magnetic field generating system for use in magnetic resonance imaging comprises a first set of coils arranged upon a common axis for generating a magnetic field having a direction Z along the common axis. The radii of the first set of coils are substantially greater than their axial dimension. A second set of coils is arranged upon the common axis for generating a magnetic field having a direction Z along the common axis. The radii of the second set of coils are substantially greater than their axial dimension. A control system applies electric current within each of the coils of the first and second sets, such that for the first set, the magnetic field strength increases in a radial direction from the common axis. For the second set, the. magnetic field strength decreases in a radial direction from the common axis. The magnetic fields from the first and second sets combine to generate a working region of sufficient magnetic field homogeneity.

Classes IPC  ?

  • G01R 33/381 - Systèmes pour produire, homogénéiser ou stabiliser le champ magnétique directeur ou le champ magnétique à gradient utilisant des électro-aimants

16.

OXFORD INSTRUMENTS The Business of Science

      
Numéro d'application 005600184
Statut Enregistrée
Date de dépôt 2007-01-08
Date d'enregistrement 2008-04-24
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Flexible plasma processing apparatus for plasma etching and plasma deposition; flexible ion beam processing systems for ion beam etching and ion beam deposition; high precision magnet, cryogenic systems and associated electronic instrumentation for nuclear magnetic resonance, ion cyclotron resonance, magnetic resonance imaging and associated applications, other than for medical purposes; electron detector apparatus, electron microscope control apparatus; x-ray pulse processor instruments; microanalysis apparatus; crystallographic analysis apparatus; particle accelerators, particle accelerator accessories; laboratory cryostats; dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, metrology apparatus, scanning probe microscopy apparatus, all being scientific apparatus; electronic scientific apparatus, x-ray fluorescence (XRF), low field nuclear magnetic resonance (NMR) spectrometers; filter near infra-red (NIR) instruments; detector magnets; insertion devices; beamline components; monochromators; optics; cooling options. Apparatus and instruments for use in electrocardiographs; high precision magnet, cryogenic systems and associated electronic instrumentation for nuclear magnetic resonance, ion cyclotron resonance, magnetic resonance imaging and associated applications, all for medical purposes; x-ray pulse processor instruments; microanalysis apparatus for medical use. Scientific research, advisory services relating to scientific research, medical research, design of scientific and medical apparatus and instruments.

17.

MRI INVOLVING RELATIVE MOTION OF MAGNET ASSEMBLY AND SAMPLE

      
Numéro d'application GB2006001309
Numéro de publication 2006/117502
Statut Délivré - en vigueur
Date de dépôt 2006-04-10
Date de publication 2006-11-09
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Inventeur(s)
  • Mcdougall, Ian, Leitch
  • Hanley, Peter

Abrégé

Magnetic resonance apparatus is provided comprising a magnet having a first pair of coils arranged in a plane. The coils are operable in a counter- running manner when in use so as to generate a sensitive volume of magnetic field spaced apart from said plane. The magnetic field in the sensitive volume is arranged to have sufficient uniformity to enable magnetic resonance signals to be obtained from a target when located within the sensitive volume. The magnetic field direction Z is oriented to lie substantially parallel to the planes. The coils are arranged such that the sensitive volume is elongate in a direction X substantially parallel to the planes. A drive system is provided to cause relative movement between the magnet and the target so as to allow the sensitive volume to be moved with respect to the target.

Classes IPC  ?

  • G01R 33/38 - Systèmes pour produire, homogénéiser ou stabiliser le champ magnétique directeur ou le champ magnétique à gradient
  • G01R 33/563 - Amélioration ou correction de l'image, p. ex. par des techniques de soustraction ou d'établissement de moyenne de matériaux en mouvement, p. ex. angiographie à écoulement contrasté
  • G01R 33/3815 - Systèmes pour produire, homogénéiser ou stabiliser le champ magnétique directeur ou le champ magnétique à gradient utilisant des électro-aimants avec des bobines supraconductrices, p. ex. leurs alimentations

18.

OXFORD INSTRUMENTS

      
Numéro de série 75786124
Statut Enregistrée
Date de dépôt 1999-08-26
Date d'enregistrement 2002-07-30
Propriétaire Oxford Instruments plc (Royaume‑Uni)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

flexible plasma processing apparatus for plasma etching and plasma deposition; flexible ion beam processing systems for ion beam etching and ion beam deposition; high precision magnet, cryogenic systems composed of laboratory cryostats, dilution refrigerators, superconducting magnets and superconducting thin films and parts therefor for nuclear magnetic resonance, for ion cyclotron resonance, for magnetic resonance imaging and for associated applications, namely, elemental and compound analysis in life sciences, materials, characterization, condensed matter physics, scientific and industrial research, and sensors and detection, all for other than medical purposes; electron detectors, electron microscope controllers; x-ray pulse processors for other than medical purposes; microanalysis apparatus, namely, x-ray detector with analyzer, computer hardware and software therefor for other than medical purposes; crystallographic analysis apparatus, namely x-ray source, detector and multi-axis goniometer particle accelerators and parts therefor; laboratory cryostats; dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, namely, electron beam backscatter detector, computer hardware and software therefor; x-rays fluorescence (XRF) spectrometers, low-field nuclear magnetic resonance (NMR) spectrometers; detector magnets [ apparatus and instruments for use in electrocardiographs, namely, electrocardiogram (ECG), Electroencephalography (EEG), Electromyography (EMG), Evoked Potentials (EP), Intra Operative Monitoring (IOM), and sleep-disorder diagnosis (Sleep) Holter recording apparatus for use in cardiology and monitors for fetal heart detection; ] high precision magnet, cryogenic systems composed of vacuum chamber with cryogenically cooled sample stage, cooling apparatus based on mixed gas cycle to cool samples, wound superconducting wire to produce high magnetic fields, and thin films electronic devices and parts therefor, all for nuclear magnetic resonance, for ion cyclotron resonance, for magnetic resonance imaging and for associated applications, namely, medical diagnosis and elemental compound analysis in life sciences, all for medical purposes; x-ray pulse processors for medical purposes; microanalysis apparatus for medical use, namely, clinical analysis of tissues for diagnostic purposes

19.

OXFORD INSTRUMENTS

      
Numéro d'application 001225416
Statut Enregistrée
Date de dépôt 1999-06-25
Date d'enregistrement 2000-10-17
Propriétaire OXFORD INSTRUMENTS PLC (Royaume‑Uni)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

Flexible plasma processing apparatus for plasma etching and plasma deposition; flexible ion beam processing systems for ion beam etching and ion beam deposition; high precision magnet, cryogenic systems and associated electronic instrumentation for nuclear magnetic resonance, ion cyclotron resonance, magnetic resonance imaging and associated applications, other than for medical purposes; electron detector apparatus, electron microscope control apparatus; x-ray pulse processor instruments; microanalysis apparatus; crystallographic analysis apparatus; particle accelerators, particle accelerator accessories; laboratory cryostats; dilution refrigerators, superconducting magnets, superconducting thin films, electron microscopy apparatus, metrology apparatus, scanning probe microscopy apparatus, all being scientific apparatus; electronic scientific apparatus, x-ray fluorescence (XRF), low field nuclear magnetic resonance (NMR) spectrometers; filter near infra-red (NIR) instruments; detector magnets; insertion devices; beamline components; monochromators; optics; cooling options. Apparatus and instruments for use in electrocardiographs; high precision magnet, cryogenic systems and associated electronic instrumentation for nuclear magnetic resonance, ion cyclotron resonance, magnetic resonance imaging and associated applications, all for medical purposes; x-ray pulse processor instruments; microanalysis apparatus for medical use.