A sample holder and a method for using such a holder in interferometric microscopy. The sample holder is designed such that the height of a sample chamber is similar or smaller than the coherence length of the illuminating light, said sample chamber having a floor and a roof defining therebetween an internal height of the sample chamber. The sample chamber further has a lower interface formed between an inner space of the sample chamber and the floor and an upper interface formed between the inner space of the sample chamber and the ceiling. The internal height is in a viewable area of the sample chamber designed such that light from the reflection from the chamber lower interface and light from the reflection from the chamber upper interface is sufficiently out of phase such that destructive interference of the two reflections is achieved.
G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
G01N 15/1404 - Manipulation du flux, p. ex. focalisation hydrodynamique
Method and system for characterizing submicron and/or nanoparticles by the use of subwavelength interferometric microscopy, the method comprising illuminating a sample comprising at least one particle and determining a first parameter indicative of scattering cross section of the at least one particle from a detected first portion of light and determining a second parameter indicative of scattering cross section of the at least one particle from a detected second portion of light.
G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
An interferometric microscope (200, 300) comprising: a sample holder (207) configured to hold a sample; a light source (201) arranged to illuminate the sample in the sample holder; an optical detector (210) arranged to capture images of light scattered by a feature of the sample; an optical system comprising a plurality of optical elements (202, 203, 204, 206) arranged to direct an illumination beam of light from the light source to the sample holder and to collect light reflected by the sample and by the sample holder to form an image beam directed to the detector; an optical component (212, 313) arranged in the path of the image beam and configured to divide the light in the image beam into a plurality of beam portions, wherein the beam portions are propagating along a common optical beam path, wherein the beam portions interfere at the detector; and a processing unit (211) configured to determine, from a plurality of images captured by the detector, a parameter indicative of the absolute value of the optical field of the light scattered by the feature
The invention relates to a method for optically characterizing dielectric particles such as virus or biological particles of submicrometre size, by e.g. holographic microscopy. In particular, the invention is directed to mixing dielectric particles with non-dielectric particles which when mixed will bind to the dielectric particle.
G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines
G01N 15/06 - Recherche de la concentration des suspensions de particules
G01N 15/075 - Recherche de la concentration des suspensions de particules par des moyens optiques
A sample holder and a system for using such a holder in interferometric microscopy. The sample holder is designed such that the height of a sample chamber (302) is similar or smaller than the coherence length of the illuminating light (304), said sample chamber (302) having a floor (301) and a roof defining therebetween an internal height of the sample chamber. The sample chamber further has a lower interface formed between an inner space of the sample chamber and the floor and an upper interface formed between the inner space of the sample chamber and the ceiling. The internal height is in a viewable area of the sample chamber designed such that light from the reflection from the chamber lower interface (305) and light from the reflection from the chamber upper interface (307) is sufficiently out of phase such that destructive interference of the two reflections is achieved.
G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
G01N 15/1404 - Manipulation du flux, p. ex. focalisation hydrodynamique
G01N 21/45 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant des méthodes interférométriquesRéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant les méthodes de Schlieren
G01N 21/51 - Dispersion, c.-à-d. réflexion diffuse dans un corps ou dans un fluide à l'intérieur d'un récipient, p. ex. dans une ampoule
Method and system for characterizing submicron and/or nanoparticles by the use of subwavelength interferometric microscopy, the method comprising illuminating a sample comprising at least one particle and determining a first parameter indicative of scattering cross section of the at least one particle from a detected first portion of light and determining a second parameter indicative of scattering cross section of the at least one particle from a detected second portion of light.
G01B 9/021 - Interféromètres utilisant des techniques holographiques
G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie
G01N 21/45 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant des méthodes interférométriquesRéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant les méthodes de Schlieren
G01B 21/18 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la profondeur
G03H 1/04 - Procédés ou appareils pour produire des hologrammes
7.
METHOD AND ARRANGEMENT FOR HOLOGRAPHIC NANOPARTICLE TRACKING ANALYSIS (H-NTA) IN A DIGITAL HOLOGRAPHIC MICROSCOPE
The invention relates to a digital holographic microscope, DHM. The DHM comprises a coherent light source (401, 501) for illuminating a sample in a sample holder in a first image plane (101,201,407, 507). The DHM further comprises a detector, e.g. a camera (412, 512), arranged to record images of the sample in the sample holder. The DHM further comprises means for dividing the base light beam into different portions and causing the different portions of the light beam to interfere with each other at the detector and a light beam guiding system for guiding a light beam to the sample and the detector. The DHM further comprises a light reducing arrangement for reducing the intensity of the light in the light beam directed to the sample. The light reducing arrangement includes first lens (102) for collimating the light in the first divided beam scattered by a particle (106) comprised in the sample and a spatial filter (108, 206, 413) arranged at or in the vicinity of the focal plane (103, 203) of said first lens (102) in order to reduce the intensity of the focused light passing through the sample located in the first image plane (101, 201, 307, 407). By this arrangement, the majority of unscattered light passing through the sample is filtered off and the majority of the light scattered by a particle (106) in the sample is guided via a light guiding system to the detector.
G03H 1/00 - Procédés ou appareils holographiques utilisant la lumière, les infrarouges ou les ultraviolets pour obtenir des hologrammes ou pour en obtenir une imageLeurs détails spécifiques
G03H 1/04 - Procédés ou appareils pour produire des hologrammes
G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux
8.
METHOD AND ARRANGEMENT FOR OPTICAL DETECTION OF DIELECTRIC PARTICLES
The invention relates to a method for optically characterizing dielectric particles such as virus or biological particles of submicrometre size, by e.g. holographic microscopy. In particular, the invention is directed to mixing dielectric particles with non-dielectric particles which when mixed will bind to the dielectric particle.
The invention relates to a digital holographic microscope, DHM. The DHM comprises a coherent light source (401, 501) for illuminating a sample in a sample holder in a first image plane (101,201,407, 507). The DHM further comprises a detector, e.g. a camera (412, 512), arranged to record images of the sample in the sample holder. The DHM further comprises a first beam splitter (404, 511) for dividing the base light beam from the coherent light source (401, 501) into at least a first divided beam and a second divided beam and a light beam guiding system for guiding a light beam to the sample and reunite the first and second divided beam upstream the detector. The DHM further comprises a light reducing arrangement for reducing the intensity of the light in the first divided beam. The light reducing arrangement includes a first lens (102) for collimating the light in the first divided beam scattered by a particle (106) comprised in the sample and a spatial filter (108, 206, 413) arranged at or in the vicinity of the focal plane (103, 203) of said first lens (102) in order to reduce the intensity of the focused light passing through the sample located in the first image plane (101, 201, 307, 407). By this arrangement, the majority of unscattered light passing through the sample is filtered off and the majority of the light scattered by a particle (106) in the sample is guided via a light guiding system to reunite with the reference beam.
G03H 1/00 - Procédés ou appareils holographiques utilisant la lumière, les infrarouges ou les ultraviolets pour obtenir des hologrammes ou pour en obtenir une imageLeurs détails spécifiques
G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
10.
METHOD AND ARRANGEMENT FOR HOLOGRAPHIC NANOPARTICLE TRACKING ANALYSIS (H-NTA) IN A DIGITAL HOLOGRAPHIC MICROSCOPE
The invention relates to a digital holographic microscope, DHM. The DHM comprises a coherent light source (401, 501) for illuminating a sample in a sample holder in a first image plane (101,201,407, 507). The DHM further comprises a detector, e.g. a camera (412, 512), arranged to record images of the sample in the sample holder. The DHM further comprises means for dividing the base light beam into different portions and causing the different portions of the light beam to interfere with each other at the detector and a light beam guiding system for guiding a light beam to the sample and the detector. The DHM further comprises a light reducing arrangement for reducing the intensity of the light in the light beam directed to the sample. The light reducing arrangement includes a first lens (102) for collimating the light in the first divided beam scattered by a particle (106) comprised in the sample and a spatial filter (108, 206, 413) arranged at or in the vicinity of the focal plane (103, 203) of said first lens (102) in order to reduce the intensity of the focused light passing through the sample located in the first image plane (101, 201, 307, 407). By this arrangement, the majority of unscattered light passing through the sample is filtered off and the majority of the light scattered by a particle (106) in the sample is guided via a light guiding system to the detector.
G03H 1/04 - Procédés ou appareils pour produire des hologrammes
G03H 1/08 - Procédés ou appareils pour produire des hologrammes pour faire des hologrammes synthétiques
G03H 1/16 - Procédés ou appareils pour produire des hologrammes utilisant une transformation de Fourier
G01N 15/02 - Recherche de la dimension ou de la distribution des dimensions des particules
G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux
G03H 1/00 - Procédés ou appareils holographiques utilisant la lumière, les infrarouges ou les ultraviolets pour obtenir des hologrammes ou pour en obtenir une imageLeurs détails spécifiques
G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
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