Imaging method using full-field interference microscopy of a three-dimensional scattering sample placed on an object arm of an interference device. The method comprises producing, by means of the interference device (200), a two-dimensional interferometric signal resulting from interference between a reference wave obtained by reflection of an incident light wave at a reflection surface (205) of a reference arm of the interference device (200), and an object wave obtained by backscattering of the incident light wave by a coherence slice of the sample (206) placed in the object arm of the interference device (200); acquiring (320), at a fixed step difference between the object arm and the reference arm, a raw interferometric image from the two-dimensional interferometric signal; calculating (330) a normalised image from the raw interferometric image and a reference image; calculating (340) a full-field OCT image of the coherence slice of the sample by elimination, in the normalised image, of low-frequency spatial fluctuations defined as a function of the width of the central peak of an autocorrelation function of the interferometric image.
The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206). Said system includes: - an interference device (200) including a reference arm on which a reflective surface (205) is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface (205) corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; - an acquisition device (208) suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and - a processing unit (220) configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.
09 - Appareils et instruments scientifiques et électriques
10 - Appareils et instruments médicaux
44 - Services médicaux, services vétérinaires, soins d'hygiène et de beauté; services d'agriculture, d'horticulture et de sylviculture.
Produits et services
Scientific apparatus and instruments; Optical apparatus and instruments; Imaging apparatus; Electronic imaging devices; Microscopes; Biological microscopes; Electron microscopes; Operating microscopes; Computer software; Apparatus and instruments for microscopy; Microscope bodies; microscope lamps; Prisms [for microscopes]; Reflectors [for microscopes]; Lens barrels (for microscopes); Microscope slides; Containers for microscope slides; Bases for operating microscopes. Medical instruments for use in connection with imaging apparatus; Medical imaging apparatus; Diagnostic imaging apparatus for medical use; Endoscopes; Endoscopes for medical use; Endoscopic apparatus for medical use. Medical imaging services.
4.
FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR IMAGING AN OBJECT
The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.
According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: - a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603), - a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624), optically conjugated with said focal plane of the microscope objective.
According to one aspect, the invention relates to a device (20) for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample (1) comprising an emission source (201) for emitting an incident wave with low temporal coherence, an imaging interferometer (200) of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror (205) and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms of the interferometer, a processing unit (206) for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths of the sample and means for varying the magnification of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values.
G02B 9/02 - Objectifs optiques caractérisés à la fois par le nombre de leurs composants et la façon dont ceux-ci sont disposés selon leur signe, c.-à-d. + ou — ayant uniquement un composant +
7.
METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY
The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
G01B 21/00 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative
G01N 21/45 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant des méthodes interférométriquesRéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant les méthodes de Schlieren
