Abrégé

s of a device under test (DUT) having an input port (at the minimum). The method involves connecting the input port of the DUT to a signal generator, subjecting the DUT to a large signal input test signal, and executing a first measurement of the incident wave and reflected wave at a DUT input reference plane. The method further involves subjecting the DUT to a perturbation signal combined with the large signal input test signal, and executing a second measurement of the incident wave and reflected wave at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.

Classes IPC  ?

• G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
• G01R 31/317 - Tests de circuits numériques
• G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie

Abrégé

S111111111 at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.

Classes IPC  ?

• G01R 27/32 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire dans des circuits comportant des constantes réparties

Abrégé

A method for measuring (and controlling) a characteristic performance parameter GS of a device under test (DUT) (10) having an input port (at the minimum). The method comprises connecting the input port of the DUT (10) to a signal generator (1), subjecting the DUT (10) to a large signal input test signal, and executing a first measurement a1', b1' of the incident wave a1 and reflected wave b1 at a DUT input reference plane. The method further comprises subjecting the DUT (10) to a perturbation signal combined with the large signal input test signal, and executing a second measurement a1", b1" of the incident wave a1 and reflected wave b1 at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.

Classes IPC  ?

• G01R 27/32 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire dans des circuits comportant des constantes réparties

Abrégé

Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to create predetermined reflection coefficients at reference planes of the device under test (1). Injection signal parameters as determined are converted into the injection signals at the source and load side by digital-to-analog conversion. The wideband analog-to-digital conversion block (3) is further arranged for analog-to-digital conversion of the intermediate frequency signals to obtain the actual measured reflection coefficient versus frequency functions with a first frequency resolution. The first frequency resolution applied in the analog-to-digital conversion is equal to or better than a second frequency resolution applied in the digital-to-analog conversion.

Classes IPC  ?

• G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire
• G01R 27/32 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire dans des circuits comportant des constantes réparties
• G01R 23/00 - Dispositions pour procéder aux mesures de fréquencesDispositions pour procéder à l'analyse de spectres de fréquences

Abrégé

Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to create predetermined reflection coefficients at reference planes of the device under test (1). Injection signal parameters as determined are converted into the injection signals at the source and load side by digital-to-analog conversion. The wideband analog-to-digital conversion block (3) is further arranged for analog-to-digital conversion of the intermediate frequency signals to obtain the actual measured reflection coefficient versus frequency functions with a first frequency resolution. The first frequency resolution applied in the analog-to-digital conversion is equal to or better than a second frequency resolution applied in the digital-to-analog conversion.

Classes IPC  ?

• G01R 27/32 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire dans des circuits comportant des constantes réparties
• G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux

Abrégé

Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to create predetermined reflection coefficients at reference planes of the device under test (1). Injection signal parameters as determined are converted into the injection signals at the source and load side by digital-to-analog conversion. The wideband analog-to-digital conversion block (3) is further arranged for analog-to-digital conversion of the intermediate frequency signals to obtain the actual measured reflection coefficientversus frequency functions with a first frequency resolution. The first frequency resolution applied in the analog-to-digital conversion is equal to or better than a second frequency resolution applied in the digital-to-analog conversion.

Classes IPC  ?

• G01R 27/32 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire dans des circuits comportant des constantes réparties
• G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux