Certain configurations of mass spectrometer components are described herein that comprise one or more mass spectrometer programmable elements. In some instances, the mass spectrometer programmable element can be configured as an electrode that can function independently of any underlying substrate or component. Ion guides, lenses, ion switches, mass analyzers and other components of a mass spectrometer are described which comprise one or more mass spectrometer programmable elements.
An inductively coupled plasma (ICP) torch includes: an injector defining an injector flow passage to receive a flow of a sample fluid; a plurality of tubes disposed about the injector and configured to receive and direct a flow of one or more torch gases; an induction device disposed about the plurality of tubes, the induction device configured to receive a radio-frequency electric current to inductively energize at least one of the one or more torch gases to produce a plasma proximate a distal end of the ICP torch; and a plasma steering system including a plurality of nozzles adjacent a distal end of the injector flow passage and configured to receive and direct a flow of steering fluid to impinge and redirect the flow of sample fluid and to thereby redirect an ionized sample resulting from the interaction of the sample fluid with the plasma.
An inductively coupled plasma (ICP) torch includes: an injector defining an injector flow passage to receive a flow of a sample fluid; a plurality of tubes disposed about the injector and configured to receive and direct a flow of one or more torch gases; an induction device disposed about the plurality of tubes, the induction device configured to receive a radio-frequency electric current to inductively energize at least one of the one or more torch gases to produce a plasma proximate a distal end of the ICP torch; and a plasma steering system including a plurality of nozzles adjacent a distal end of the injector flow passage and configured to receive and direct a flow of steering fluid to impinge and redirect the flow of sample fluid and to thereby redirect an ionized sample resulting from the interaction of the sample fluid with the plasma.
Certain configurations of a sampler cone and its use with a metal gasket to seal the sampler cone to a mass spectrometer interface are described. The sampler cone, interface or both may comprise one or more surface features. Coupling of the sampler cone to the interface can compress or crush the metal gasket to provide a seal between the sampler cone and the interface. For example, a crushing force provided by surface features of the sampler cone and interface can crush the gasket and provide a substantially fluid tight seal between the sampler cone and the interface.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
A nebulizer includes a gas transport conduit having a gas inlet for receiving a nebulizer gas and an outlet, the gas transport conduit defining a longitudinal axis along flow direction of the nebulizer gas; and an analyte supply conduit extending into the gas transport conduit along the longitudinal axis, the analyte supply conduit having at least one side aperture configured to emit analyte from the analyte supply conduit into the gas transport conduit in a direction off-axis from the longitudinal axis of the gas transport conduit.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
A nebulizer includes a gas transport conduit having a gas inlet for receiving a nebulizer gas and an outlet, the gas transport conduit defining a longitudinal axis along flow direction of the nebulizer gas; and an analyte supply conduit extending into the gas transport conduit along the longitudinal axis, the analyte supply conduit having at least one side aperture configured to emit analyte from the analyte supply conduit into the gas transport conduit in a direction off-axis from the longitudinal axis of the gas transport conduit.
An ion guide includes a plurality of curved electrodes arranged along a curved central axis. The plurality of electrodes define a curved ion guide region, with the curved ion guide region beginning at an ion entrance and ending at an ion exit. The ion guide includes an ion deflecting device configured to apply a radial DC electric field across the ion guide region and along the curved central axis. The ion guide region has a radius of curvature that varies along the curved central axis, and the radius of curvature is at a maximum at the ion entrance and decreases along the curved central axis toward the ion exit.
An ion guide includes a plurality of lenses arranged in series along a curved central axis. Each lens includes a body and a central opening, and the central openings of the plurality of disks define a curved ion guide region. The ion guide includes an ion deflector configured to apply a radial DC electric field across the ion guide region and along the curved central axis. The ion deflector includes at least one DC voltage source that is configured to apply a positive DC voltage to at least some of the plurality of lenses and a negative DC voltage to at least some of the plurality of lenses.
Provided are ion detectors and systems that may employ such ion detectors such as mass spectrometers and other instruments. The ion detectors include a deflector that serves to generate an electric field with designed shape and strength that causes the ions passing into the detector to move along a deflection path. By selectively deflecting the charged ions from an initial propagation axis, the deflector effectively removes unwanted neutral particles from the ion path and reduces background in the resulting spectra.
A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.
H05H 1/46 - Production du plasma utilisant des champs électromagnétiques appliqués, p.ex. de l'énergie à haute fréquence ou sous forme de micro-ondes
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
G01J 3/44 - Spectrométrie Raman; Spectrométrie par diffusion
A mass spectrometry apparatus includes an ion detector and a control circuit coupled to the ion detector. The ion detector includes a pulse counting stage and an analog stage configured to generate a pulse counting signal and an analog signal, respectively, responsive to incident ions. The a control circuit is configured to output the pulse counting signal in a pulse counting output mode and to output the analog signal in an analog output mode. The control circuit is configured to switch from the pulse counting output mode to the analog output mode responsive to the pulse counting signal exceeding a first threshold within a range of about 10 million counts per second to about 200 million counts per second. Related devices and operating methods are also discussed.
An ICP torch includes an injector tube defining an injector flow passage to receive a flow of a sample fluid, an intermediate tube disposed about the injector tube, a plasma tube disposed about the intermediate tube, and an induction coil disposed about the plasma tube. An auxiliary gas passage is defined between the injector tube and the intermediate tube to receive a flow of an auxiliary gas. A plasma gas passage is defined between the intermediate tube and the plasma tube to receive a flow of a plasma gas. The induction coil can produce a plasma proximate a torch distal end. The induction coil extends axially from a coil proximal end to a coil distal end proximate the torch distal end. The plasma tube includes an outlet opening proximate the torch distal end. The outlet opening is at least partially coincident with or axially inset from the coil distal end.
Certain configurations of plasma discharge chambers and plasma ionization sources comprising a plasma discharge chamber are described. In some examples, the discharge chamber comprises a conductive area and is configured to sustain a plasma discharge within the discharge chamber. In other examples, the discharge chamber comprises at least one inlet configured to receive a plasma gas and at least one outlet configured to provide ionized analyte from the discharge chamber. Systems and methods using the discharge chambers are also described.
Thermal management arrangements for analysis systems including a plasma source such as inductively-coupled-plasma are disclosed. An analysis system may include a plasma source configured to a plasma source configured to receive and ionize a sample to create an ionized sample, and an instrument such as a mass spectrometer or optical emission spectrometer configured to receive and analyze the ionized sample. A heat shield may be positioned between the plasma source and the instrument, and the heat shield may be constructed and arranged to direct heated gas and/or plasma from the plasma source away from the instrument. In some instances, the heated gas and/or plasma may be extracted from a chamber containing the plasma source.
F16L 59/02 - Forme ou configuration de matériaux isolants, avec ou sans revêtement formant un tout avec les matériaux isolants
G01N 21/71 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité thermiquement
Certain embodiments of ion interfaces are described that can provide higher sensitivities improved ion transmission and multiple operating modes. In some configurations, the ion interface may comprise a first element and a second element each of which can receive a non-zero voltage. In one configuration, the first element can be a hyperskimmer cone and the second element can be a cylindrical lens. Systems and methods using the interface are also described.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/06 - Dispositifs électronoptiques ou ionoptiques
Certain configurations are described herein of an instrument comprising a passive cooling device which includes, in part, a loop thermosyphon configured to thermally couple to a component of the instrument to be cooled. In some instances, the cooling device can cool a transistor, transistor pair, an interface or other components of the instrument.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/02 - Spectromètres pour particules ou tubes séparateurs de particules - Détails
H01J 49/36 - Spectromètres à radio-fréquence, p.ex. spectromètres du type Bennett; Spectromètres du type Redhead
A system and method of using the system for analyzing liquid samples obtain from viscous sources. The system includes a sample delivery system, a particle counter configured to receive a liquid sample from the liquid sample delivery system, a composition analyzer configured to receive the liquid sample from the particle counter, a feed system configured to draw the liquid sample through the particle counter and subsequently inject the liquid sample into the composition analyzer; and a processor to process and analyze data from the particle counter and composition analyzer.
G01N 15/14 - Recherche par des moyens électro-optiques
G01N 21/73 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité thermiquement en utilisant des brûleurs ou torches à plasma
18.
Variable discriminator threshold for ion detection
An example system includes an ion detector and a signal processing apparatus in communication with the ion detector. The ion detector is arranged to detect ions during operation of the system and to generate a signal pulse in response to the detection of an ion. The signal pulse has a peak amplitude related to at least one operational parameter of the system. The signal processing apparatus is configured to analyze signal pulses from the ion detector and determine information about the detected ions during operation of the system based on the signal pulses. The signal processing apparatus includes a discriminator circuit. The signal processing apparatus is programmed to vary a threshold of the discriminator circuit based on the at least one operational parameter of the system during operation of the system.
An example system includes an ion detector and a signal processing apparatus in communication with the ion detector. The ion detector is arranged to detect ions during operation of the system and to generate a signal pulse in response to the detection of an ion. The signal pulse has a peak amplitude related to at least one operational parameter of the system. The signal processing apparatus is configured to analyze signal pulses from the ion detector and determine information about the detected ions during operation of the system based on the signal pulses. The signal processing apparatus includes a discriminator circuit. The signal processing apparatus is programmed to vary a threshold of the discriminator circuit based on the at least one operational parameter of the system during operation of the system.
G01D 5/48 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens à base de radiation d'ondes ou de particules
G01T 1/15 - Instruments dans lesquels les impulsions engendrées par un détecteur de radiations sont intégrées, p.ex. par un circuit de pompe à diode
An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two-dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.
Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/16 - Sources d'ions; Canons à ions utilisant une ionisation de surface, p.ex. émission thermo-ionique ou photo-électrique
22.
Methods and systems for quantifying two or more analytes using mass spectrometry
Certain embodiments described herein are directed to methods and systems of detecting two or more analytes present in a single system such as a nanoparticle or nanostructure. In some examples, the methods and systems can estimate data gaps and fit intensity curves to obtained detection values so the amount of the two or more analytes present in the single system can be quantified.
H01J 49/00 - Spectromètres pour particules ou tubes séparateurs de particules
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
Certain configurations of devices are described herein that include DC multipoles that are effective to direct ions. In some instances, the devices include a first multipole configured to provide a DC electric field effective to direct first ions of an entering particle beam along a first exit trajectory that is substantially orthogonal to an entry trajectory of the particle beam. The devices may also include a second multipole configured to provide a DC electric field effective to direct the received first ions from the first multipole along a second exit trajectory that is substantially orthogonal to the first exit trajectory.
An ionizer includes a probe having multiple coaxially aligned conduits. The conduits may carry liquids, and nebulizing and heating gases at various flow rates and temperatures, for generation of ions from a liquid source. An outermost conduit defines an entrainment region that transports and entrains ions in a gas for a defined distance along the length of the conduits. In embodiments, various voltages may be applied to the multiple conduits to aid in ionization and to guide ions. Depending on the voltages applied to the multiple conduits and electrodes, the ionizer can act as an electrospray, APCI, or APPI source. Further, the ionizer may include a source of photons or a source of corona ionization. Formed ions may be provided to a downstream mass analyser.
Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.
A device for providing analyte to an analyzer is described. In some examples, the device comprises a substrate comprising a plurality of wells formed therein at predetermined locations. Each of the wells can be capable of containing an analyte without mixing with analytes in other of the wells. Each of the wells can also have a well exit to allow analyte to exit therefrom. A channel can be in flow communication with at least one of the well exits, and can guide analyte ions exiting therefrom to the mass analyzer. The wells may be filled prior to use in association with the mass analyzer. The substrate may be used as part of a fraction collector if desired.
H01J 49/26 - Spectromètres de masse ou tubes séparateurs de masse
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
27.
Devices and Methods to improve background equivalent concentrations of elemental species
Methods and systems that can use a gas comprising a nitrogen center that is introduced upstream of a plasma sustained in a torch are described. In some configurations, the gas comprising the nitrogen center can be introduced as a gas upstream of the plasma and through a sample introduction device. Mass spectrometers and optical emission systems that can use the gas comprising the nitrogen center are also described.
H05H 1/30 - Torches à plasma utilisant des champs électromagnétiques appliqués, p.ex. de l'énergie à haute fréquence ou sous forme de micro-ondes
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/16 - Sources d'ions; Canons à ions utilisant une ionisation de surface, p.ex. émission thermo-ionique ou photo-électrique
Certain configurations of devices are described herein that include a DC multipole that is effective to doubly bend the ions in an entering particle beam. In some instances, the devices include a first multipole configured to provide a DC electric field effective to direct first ions of an entering particle beam along a first internal trajectory at an angle different from the entry trajectory of the particle beam. The first multipole may also be configured to direct the ions in the first multipole along a second internal trajectory that is different than the angle of the first internal trajectory of the particle beam.
Systems and methods for use in introducing samples to an analytical instrument. The systems and methods are adaptable to process either a liquid sample or a gaseous sample, including samples containing particle contaminants, for subsequent analysis using an analytical instrument.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
Certain configurations of systems and methods that can detect inorganic ions and organic ions in a sample are described. In some configurations, the system may comprise one, two, three or more mass spectrometer cores. In some instances, the mass spectrometer cores can utilize common components such as gas controllers, processors, power supplies and vacuum pumps. In certain configurations, the systems can be designed to detect both inorganic and organic analytes comprising a mass from about three atomic mass units, four atomic mass units or five atomic mass units up to a mass of about two thousand atomic mass units.
Certain configurations of plasma discharge chambers and plasma ionization sources comprising a plasma discharge chamber are described. In some examples, the discharge chamber comprises a conductive area and is configured to sustain a plasma discharge within the discharge chamber. In other examples, the discharge chamber comprises at least one inlet configured to receive a plasma gas and at least one outlet configured to provide ionized analyte from the discharge chamber. Systems and methods using the discharge chambers are also described.
Certain configurations of devices are described herein that include DC multipoles that are effective to direct ions. In some instances, the devices include a first multipole configured to provide a DC electric field effective to direct first ions of an entering particle beam along a first exit trajectory that is substantially orthogonal to an entry trajectory of the particle beam. The devices may also include a second multipole configured to provide a DC electric field effective to direct the received first ions from the first multipole along a second exit trajectory that is substantially orthogonal to the first exit trajectory.
Methods and systems of identifying two or more elements in a single individual particle are described. In some examples, an optical emission from each of an ionized first element and an ionized second element can simultaneously be detected to identify at least a first element in a particle from a plurality of particles using the optical emission from the ionized first element, and to identify at least a second element in the particle from the plurality of particles using the optical emission from the second ionized element. The identified first element and the identified second element can be used to identify a source of the particle from a plurality of particles.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/16 - Sources d'ions; Canons à ions utilisant une ionisation de surface, p.ex. émission thermo-ionique ou photo-électrique
Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.
Certain configurations of systems and methods that can detect inorganic ions and organic ions in a sample are described. In some configurations, the system may comprise one, two, three or more mass spectrometer cores. In some instances, the mass spectrometer cores can utilize common components such as gas controllers, processors, power supplies and vacuum pumps. In certain configurations, the systems can be designed to detect both inorganic and organic analytes comprising a mass from about three atomic mass units, four atomic mass units or five atomic mass units up to a mass of about two thousand atomic mass units.
Certain configurations of a stable capacitor are described which comprise electrodes produced from materials comprising a selected coefficient of thermal expansion to enhance stability. The electrodes can be spaced from each other through one of more dielectric layers or portions thereof. In some instances, the electrodes comprise integral materials and do not include any thin films. The capacitors can be used, for example, in feedback circuits, radio frequency generators and other devices used with mass filters and/or mass spectrometry devices.
Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/16 - Sources d'ions; Canons à ions utilisant une ionisation de surface, p.ex. émission thermo-ionique ou photo-électrique
Certain configurations of devices are described herein that include a DC multipole that is effective to doubly bend the ions in an entering particle beam. In some instances, the devices include a first multipole configured to provide a DC electric field effective to direct first ions of an entering particle beam along a first internal trajectory at an angle different from the entry trajectory of the particle beam. The first multipole may also be configured to direct the ions in the first multipole along a second internal trajectory that is different than the angle of the first internal trajectory of the particle beam.
A mass analyzer includes a desolvation chamber into which an upstream gas is injected to provide a counter-flow to said downstream flow in the chamber. The counter-flow may slow the downstream flow of solvated ionized particles in the chamber, while allowing lighter desolvated ions to travel toward an outlet aperture of the desolvation chamber.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/06 - Dispositifs électronoptiques ou ionoptiques
An ion source and method for providing ionized particles to a molecular/atomic analyser, such as a mass spectrometer, are disclosed. The ion source includes a vessel defining a channel; a gas inlet extending from the gas source into the channel, for introducing a gas flow into the channel; a sample inlet extending into the channel for introducing sample within the channel; and an ionizer to ionize the sample in the channel. The vessel is sufficiently sealed to allow the channel to be pressurized, at a pressure in excess of 100 Torr. At least one gas source maintains the pressure of the channel at a pressure in excess of 100 Torr and the pressure exterior to the channel at a pressure in excess of 0.1 Torr and provides a gas flow that sweeps across the ionizer to guide and entrain ions from the ionizer to the outlet.
H01J 49/26 - Spectromètres de masse ou tubes séparateurs de masse
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
43.
Concentrating mass spectrometer ion guide, spectrometer and method
CASE) applied to the casing, produce a voltage gradient between said casing and said axis that has a different magnitude at different positions along said axis.
An ion detector includes collision surfaces for converting both positively and negatively charged ions into emitted secondary electrons. Secondary electrons may be detected using an electron detector, than may, for example include an electron multiplier. Conveniently, secondary electrons (or electrons emitted by the multiplier) may be detected using an electron pulse counter.
G01N 23/00 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou
G21K 7/00 - Microscopes à rayons gamma ou à rayons X
46.
Concentrating mass spectrometer ion guide, spectrometer and method
H01J 49/42 - Spectromètres à stabilité de trajectoire, p.ex. monopôles, quadripôles, multipôles, farvitrons
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
brevets
