Abrégé

[Problem] To provide a stage capable of being easily energized, and the like. [Solution] This stage comprises: a stage body; a sample platform on which a sample is mounted; a cooling unit; and an electrode unit. The stage is characterized in that the stage body is provided with an attachment mounting device. Moreover, this stage, in a preferred embodiment, is characterized by including an attachment. Furthermore, the stage in the preferred embodiment is characterized in that the attachment is provided with a sample platform mounting device.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
• G01N 1/28 - Préparation d'échantillons pour l'analyse

Abrégé

[Problem] The purpose of the present invention is to provide a sample holder that enables various forms of observation. [Solution] A sample holder tip according to the present invention is characterized by comprising: a sample stage on which a sample and/or a sample grid is mounted; a slit part which is mounted to the sample stage and which can tilt the sample stage; a frame part which holds the sample stage; and a guide part which guides the frame part. Moreover, a preferred embodiment of the sample holder tip according to the present invention is characterized in that there are a plurality of the sample stages.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

[Problem] The purpose of the present invention is to provide a sample holder capable of being observed in various manners. [Solution] A sample holder tip according to the present invention includes a sample stage where a sample and/or a sample mesh is mounted, a fixing part for securing the sample and/or sample mesh to the sample stage, and a voltage application unit for applying voltage to the sample, and said sample holder tip is characterized in that the voltage application unit is mounted on the sample stage. Furthermore, a preferred embodiment of the sample holder tip according to the present invention is characterized in that the voltage application unit is integrated with the sample stage.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
• G01N 1/28 - Préparation d'échantillons pour l'analyse

Abrégé

[Problem] The objective of the present invention is to provide a sample holder that enables various observations. [Solution] A sample holder according to the present invention includes: a sample holder shaft part having a sample and/or sample mesh installation part; an outer cylinder part capable of storing the sample holder shaft part; a sample holder handle part installed on the opposite side of the sample holder shaft part to the sample and/or sample mesh installation part; a seal part; and a sample holder tip part. The seal part is present on the sample holder tip part and/or the outer cylinder part. Furthermore, when installed in an electron microscope, the sample holder has a support part for making at least an electrode or a flow passage pass through at a position further out from the center than the position of a goniometer stage of the electron microscope.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

[Problem] To provide a stage that can be transferred by vacuum or the like. [Solution] This stage is characterized by comprising a sample platform on which a sample is loaded, a shutter function whereby it is possible to separate the atmosphere inside and outside of the stage, and a seal section.　In addition, a preferred embodiment of the stage of the present invention is characterized by further comprising a first valve capable of automatic discharge. Furthermore, a preferred embodiment of the stage of the present invention is characterized by further comprising a second valve of which the opening/closing degree can be adjusted.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

A specimen holder includes a specimen shaft unit having a specimen and/or specimen mesh setting unit; an outer tubular unit capable of housing the specimen holder shaft unit; a cooling unit; and a thermoelectric element placed close to the cooling unit. In certain examples, the thermoelectric element may use at least one effect selected from the Peltier effect and the Thomson effect.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

[Problem] The present invention addresses the problem of providing a sample holder which makes it possible to rotate a sample while cooling the sample. [Solution] A sample holder according to the present invention is characterized by comprising: a sample holder shaft portion which has a sample and/or sample mesh placement portion; an outer cylinder portion which can accommodate the sample holder shaft portion; a cooling portion; and a thermoelectric element which is provided in the vicinity of the cooling portion. A preferable embodiment of the sample holder according to the present invention is characterized in that the thermoelectric element utilizes an effect selected from at least one of the Peltier effect and the Thomson effect.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

In at least one embodiment, a specimen holder includes a specimen holder shaft unit having a specimen and/or specimen mesh setting unit, an outer tubular unit capable of housing the specimen holder shaft unit, a thermal drift adjusting unit made of a material having a different thermal expansion coefficient from a thermal expansion coefficient of the specimen holder shaft unit and partially in contact with the specimen holder shaft unit, and a control mechanism which controls movement of the thermal drift adjusting unit toward a center direction of a specimen.

Classes IPC  ?

• G01N 23/20033 - Porte-échantillons ou leurs supports pourvus de moyens de commande de la température ou de chauffage
• H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions
• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

The purpose of the present invention is to provide a specimen holder having a structure capable of maintaining a seal surface regardless of a change of environment. A specimen holder according to the present invention is characterized by comprising a specimen holder axis part having a specimen and/or a specimen mesh setting part, an external cylinder part capable of housing the specimen holder axis part, and a seal part for sealing the specimen and/or the specimen mesh setting part from atmosphere wherein the seal part is set to a step part which is set to a portion of the external cylinder part. Further, in a referred embodiment of a specimen holder according to the present invention, it is characterized in that the seal part set to the step part is as a first seal part, further the specimen holder has a second seal part which exists in a tip part of the specimen holder and exists in a direction of a central axis of an electron microscope comparing to the specimen and/or the specimen mesh setting part.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
• H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions

Abrégé

In at least one embodiment, a specimen holder tip part comprises a specimen setting seat, a specimen mesh for mounting a specimen, a specimen holding part for holding the specimen mesh and a clamping part that clamps the specimen holding part.

Classes IPC  ?

• H01J 37/00 - Tubes à décharge pourvus de moyens permettant l'introduction d'objets ou d'un matériau à exposer à la décharge, p. ex. pour y subir un examen ou un traitement
• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
• H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions

Abrégé

The purpose of the present invention is to provide a specimen holder tip part with which specimens can be interchanged safely in an electron microscope. The specimen holder tip part is formed from: a specimen setting seat (6); a specimen mesh (3) for mounting a specimen; a specimen holding part (2) for holding the specimen mesh (3); and a clamping part (24) that clamps the specimen holding part (2).

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

The present disclosure significantly reduces the waiting time from inserting a specimen holder into an electron microscope until high quality data acquisition is possible. Characterizing the present disclosure, it is a specimen holder partly made of low thermal expansion material. The low thermal expansion material can be any of group 4, 5 or 6 in the periodic table of the elements.

Classes IPC  ?

• G21K 5/08 - Supports pour cibles ou pour objets à irradier

Abrégé

It is an object of the present invention to provide a significantly beneficial specimen holder which allows mounting one or more specimens, for example, a specimen to be examined and a standard adjustment specimen for aberration correction in one specimen holder at the same time, thereby observing each specimens. The present invention is a specimen holder having a specimen holder movement mechanism for driving the specimen holder, wherein the specimen holder movement mechanism makes it possible to move the specimen holder approximately along the longer side of the specimen holder. In a preferred embodiment of the specimen holder according to the present invention, the specimen holder is characterized in that the specimen holder movement mechanism makes it possible to vary an insertion depth of the specimen holder into a tube for holding the specimen holder, with no relation to another specimen holder movement mechanism set for driving the specimen holder approximately along the longer side of the specimen holder.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support

Abrégé

A sample holder according to the present invention is characterized in that the sample holder comprise a holder body, a sample retaining stage, a means capable for tilting the sample around an axis which is arranged in a direction perpendicular to a long side of the holder body, wherein the means has a mechanism capable for tilting the sample around the axis with no relation to the existence of a fulcrum retaining member at the said axis.

Classes IPC  ?

• H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support